CN1185479C - Multiple-compound gas analyzer with cassette light path system - Google Patents

Multiple-compound gas analyzer with cassette light path system Download PDF

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Publication number
CN1185479C
CN1185479C CNB011177322A CN01117732A CN1185479C CN 1185479 C CN1185479 C CN 1185479C CN B011177322 A CNB011177322 A CN B011177322A CN 01117732 A CN01117732 A CN 01117732A CN 1185479 C CN1185479 C CN 1185479C
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light path
gas analyzer
gas
card
optical
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CN1384350A (en
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张世易
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ZHONGZHI OPTOELECTRONIC SCIENCE & TECHNOLOGY Co Ltd
Oriental System Technology Inc
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ZHONGZHI OPTOELECTRONIC SCIENCE & TECHNOLOGY Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

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  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • General Physics & Mathematics (AREA)
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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The present invention relates to a multiple-compound gas analyzer with a cassette type light path system, which comprises at least one cassette, wherein each cassette comprises a light source system, a light path system, an optical folding system and an infrared detection system; the light source system comprises an infrared light source and a light condensing paraboloidal mirror for providing input infrared parallel beams; the light path system comprises a cassette outer shell, an optical absorption cavity and a group of reflecting concave mirrors; the optical folding system comprises a beam splitter mirror and a deflector for leading infrared rays to the next cassette; the infrared detection system is a pair of wave band detectors and comprises a reference detector and an actual measurement detector, and each detector comprises a light filter and a sensor.

Description

Polyvoltine compound gas analyzer with card box light path system
Technical field
The present invention relates to a kind of polyvoltine compound gas (after this being called for short many gases or multiple gases) analyser, particularly a kind of simplification, and systematization and do not need any moving member can measure many gas analyzers of multiple gases simultaneously with card box (Cassette) light path system.
Background technology
Modern humans's living environment is because the healthy problems intensive and the air pollution effect mankind that industrialization, commercialization caused of population have caused that people from all walks of life note widely.How is air quality in the human habitat judged? how is the degree that air is polluted? is which is arranged in the air that is polluted the gas that is harmful to human body health? what do and these its content of gas that are harmful to human body health have? these problems depend on precision and reliable instrument measures.Because to the compulsory execution of air pollution policy, in the field that measures air quality, just there is requirement highly in government bodies to the pure gas of indoor air quality and automobile exhausting or the measuring instrument of multiple gases.It specifies the gas that needs to measure in respect of carbon dioxide (CO 2), hydrocarbon (HC) and carbon monoxide (CO) or the like.In many measuring instruments, the method that measures these gases has multiple, the most general with " non-dispersive formula infrared spectrum measures method " (after this abbreviating NDIR as, nondispersive infrared) at present.
NDIR utilizes gas (after this be called for short IR, infrared) the selectivity principle of absorption of spectrum, each gas has one or more different IR absorption characteristics in certain certain wavelengths scope basically to infrared ray.Corresponding to the gas of a certain specific wavelength, its absorption intensity to the IR light under a certain frequency is directly relevant with the concentration of this gas.This gas absorption principle is called Bi Er-Lan Bai law (Beer-Lambert Law).As shown in Figure 1, according to this law, a gas is to be directly proportional with the concentration and the optical path length of this gas to the absorption intensity of IR, nowadays
A=gas is to the absorption intensity (absorbance) of IR, is to get original incident light and light intensity ratio after absorbing, takes the logarithm and gets.
K=gas is to the absorption coefficient (absorption coefficient) of IR
The concentration of C=gas (concentration)
Total light path (light path) length of L=gas absorption IR institute warp then therebetween pass is
A=K×C×L
As shown in Figure 1, this gas is the relation of being in line to the absorption intensity of IR and the concentration of this gas ideally, but actual situation all has deviation and is nonlinear relationship, and, optical density (OD) (opticaldensity) is high more, the degree of its deviation is big more, and wherein optical density (OD) is meant the product (C * L) of concentration C and optical path length L.For reducing this deviate to improve the degree of accuracy (accuracy) of system measurements, the deviser of system need select the optimum value of an optical density (OD), that is, the gas higher to concentration (C) or absorbability is stronger, its light path need be selected the shorter one, otherwise, the gas lower to concentration or absorbability is more weak, its light path need be selected than the elder, therefore, if will design a gas analyzer can measure multiple gases simultaneously, then must be able to select to use multiple different optical path length, to prolong the measured dynamic range of instrument.
In addition, each specific gas can absorbing IR frequency range be necessarily.Therefore, all need a certain specific optical filter (filter) to filter and choose the IR of single characteristic frequency and then the variation that comes its light intensity of sensing (light intensity) with a sensor (sensor) corresponding to this frequency range.Also have optical filter and sensor are combined into a detecting device (detector) person.
First conventional art that the present invention quoted from is a multichannel air cavity (multi-channel gas sample chamber) of No. the 5th, 222,289, United States Patent (USP) as shown in Figure 2.As shown in Figure 2, this first conventional art be characterized as an oval tubular hollow light guiding pipe around contain a plurality of detecting devices (detector) 206,208 and 210 on 202, respectively be installed on a plurality of detecting device mouths (detector port) 212,214 and 216, and a detecting device 218 also is set on an end of light-emitting window.These detecting devices are to be used for measuring simultaneously multiple gases with corresponding aforesaid ultimate principle, that is the stronger gas of absorbability need select short light path, otherwise, need select long light path to the more weak gas of absorbability.
But this first conventional art in fact also can't get a desired effect, and it be the reasons are as follows:
Light pipe around on 202 set detecting device 206,208 and 210 its received IR shown in the arrow among Fig. 2, be the incident light that is the oblique angle, and its effect is best during because of the plane of incidence (incident surface) that is normally incident in detecting device, so be the correctness that the incident light at oblique angle can influence the output frequency of the optical filter (filter) that is arranged in the detecting device.
2. because incident light is the oblique angle, and the incident light intensity promptly weakens, so the letter of output/assorted ratio then reduces.
Second conventional art that the present invention quoted from is a polyvoltine compound gas analyzer (multiple component gas analyzer) of No. the 4th, 914,719, United States Patent (USP) as shown in Figure 3.As shown in Figure 3, this gas analyzer comprises 302, three 310,312,314,316, four optical filters of optical splitter (beam splitter) 304,306,308, four detecting devices (detector) (filter) 320,322,324,326 in an infrared light supply (infrared source) 300, one optical absorption chamber (optical absorption chamber) that can produce light beam.This light beam passes through this optical absorption chamber 302 and is imported into the optical splitter 304,306,308 of these consecutives, and then by 304,306,308 reflections of these optical splitters and respectively deflection (deffected) be directed on the detecting device (detector) 310,312,314, wherein one tunnel light beam that penetrates the optical splitter 304,306,308 of these consecutives is then squeezed in the detecting device 316 via optical filter 326.Again, each optical filter 320,322,324,326 is all respectively corresponding to a specific different frequency range.
But this second conventional art in fact also can't reach the effect that prolongs dynamic range, because the length of its light path only is the length in this unique optical absorption chamber 302, and can't select to use multiple different optical path length with the different gas concentration of arranging in pairs or groups.Its result's situation is exemplified below:
1. if the gas of higher concentration selects to use long optical path length, according to aforesaid Bi Er-Lan Bai law, gas will be quite high to the absorption intensity of IR, and this can cause gas that the absorption meeting of IR is more easily reached capacity, and makes that the light intensity that energy measures in the sensor is very faint.
2. if the gas of low concentration selects to use short optical path length, according to aforesaid Bi Er-Lan Bai law, gas will be quite low to the absorption intensity of IR, this can cause gas to the absorption of IR seldom, the intensity variation that makes sensor energy measure is limited, and then has reduced the detecting ability of this instrument.
3. by the resulting result of above two extreme examples be, the concentration range that gas analyzer institute energy measures just is restricted, that is light path was to be suitable for measuring high concentration gas person in short-term originally, is that stenosis is narrow so its energy measures the scope of light concentration gas.And be the person that is suitable for measuring the light concentration gas originally during optical path length, also be that stenosis is narrow so its energy measures the scope of high concentration gas.
The 3rd conventional art that the present invention quoted from is a gas analyzer (gas analyzer) of No. the 5th, 773,828, United States Patent (USP) shown in Fig. 4 (a).Be depicted as the 1st embodiment among more than ten embodiment of the 3rd conventional art as Fig. 4 (a), it is one " two gas analyzer " that this gas divides instrument, and wherein a length L 2 is about the nitrogen oxide (NO of 60mm x) " gas flow photometry absorbing cavity " 403 and one length L 1 is about the carbon dioxide (CO of 1mm 2) " gas flow photometry absorbing cavity " the 407th, the person of communicating via a gas passage 421.One to be arranged near the light source 401 optical filters 440 are devices as " penetrate and reflect ", are used for the specific wavelength of spectrum beam split (spectrally diffracting) IR.Infrared ray (IR) A that is sent by light source penetrates optical filter (band pass filter) 440 and becomes A2 with one certain wavelengths λ 2, is provided with a NO at this end xDetecting device 405, and become A1 from optical filter (band passfilter) 440 reflections with one certain wavelengths λ 1, be provided with a CO at this end 2Detecting device 409.Install two kinds of different gas NO according to this xAnd CO 2Can be by " the gas flow photometry absorbing cavity " 403,407 of two kinds of different length L2, L1 communicating being measured through a passage 421.
Fig. 4 (b) is depicted as the 4th embodiment among more than ten embodiment of the 3rd conventional art.Shown in Fig. 4 (b), another is arranged at " gas flow photometry absorbing cavity " 403 and NO xThe optical filter 444 that detecting device is 405 also is to be used for the specific wavelength of another IR of spectrum beam split with the device as " penetrate and reflect ".Infrared ray (IR) A2 that comes by penetrating optical filter 440 penetrates bandpass filter 444 and becomes A4 with one certain wavelengths λ 4, is provided with a NO at this end xDetecting device 405, and become A3 from optical filter 444 reflections with one certain wavelengths λ 3, be provided with a SO at this end 2Detector 412.For promoting SO 2Detector 412 measures SO 2The sensitivity of gas (sensitivity), in the present embodiment of the 3rd conventional art, except add an airway 425 make the circulation of gas more smooth and easy, increasing by a length again is " the gas flow photometry absorbing cavity " 423 of L3, makes to measure SO 2The light path of gas increases to L2+L3 by L2.
Be depicted as the 7th embodiment among tens embodiment of the 3rd conventional art as Fig. 4 (c).Shown in Fig. 4 (c), in order to increase the measurement of carbon monoxide (CO) gas, increasing by a length again is " gas flow photometry absorbing cavity " 477, one optical filters 442 of L4, and a CO detector 441.
Though but the 3rd conventional art can measure the suitable optical path length of concentration collocation of gas according to desire, has with the following part of not improving:
1. the circulation of the prolongation of light path and gas lacks systematic planning, so opening up of the extension of " gas flow photometry absorbing cavity " and airway seems and branch forth that in disorder no chapter not only takes up space, and the distribution of gas is difficult for evenly.
2. the fixed ratio of beam split and can't flexible adjustment can decay so light path prolongs its light intensity of back.
Summary of the invention
Do not improve part at above three kinds of conventional arts, one of purpose of the present invention is providing a card box light path system that systems organization arranged, the concentration that can measure gas according to desire systematically in addition stack arrange in pairs or groups suitable optical path length to improve the sensitivity that gas measures, its not only structure closely (compact) and shape are uniform, can save big quantity space, be easy to miniaturization and become portable type, and be easy to make and can reduce cost.
Another object of the present invention is in the conductance gas optical absorption chamber that an integration card box is provided, each the set a plurality of gas port in card casket card casket two sides that sees through stack make gas effectively, unimpeded equably.
Another purpose of the present invention can be regulated half hollow type beam splitter of beam split ratio effectively in an optical fold system is provided.The beam split of penetrating component changes in the present invention and adopts the hollow space that the mode of directly passing through is directly passed through beam splitter in the conventional art, reduce the attenuation rate of light intensity widely, the ratio of its beam split is then temporarily transferred the ratio of whole its hollow space and reflecting part and is reached, the adjustment of borrowing the beam split ratio remains in the reasonable range its light intensity after beam split to regulate each card box optical absorption chamber.
For achieving the above object, it contains at least one card casket (cassette) to the invention provides a kind of polyvoltine compound gas analyzer with card box (cassette type) light path system, and each this card casket comprises a light-source system, a light path system, an optical fold system and an infrared detection system.Light-source system comprises the optically focused paraboloidal mirror (reflector) that an infrared light sources and is used to provide input infrared ray parallel beam.Light path system comprises a card casket, one optical absorption chamber (absorption chamber) and one group of reflective concave surface mirror (concave mirror), wherein this card casket is provided with a gas port group that contains a plurality of gas ports (aperture), staggered being disposed at relatively on the surface of this card casket, and around each gas port group by O-shape ring encirclement with usefulness as sealing gas between the card casket of stack layer by layer, the gaseous compound to be measured that these gas port groups are used for feeding evenly distributedly, and this card casket is provided with input ultrared air intake opening (inlet) and exports ultrared exhausr port (outlet), and this light absorption chamber is to be used for guiding gaseous compound to be measured and to provide gaseous compound to contact and prolong the space of light path (light path) with infrared ray, and all coat the highly reflective plated film at the inwall in this optical absorption chamber, this group reflective concave surface mirror is the staggered both sides that are disposed at this optical absorption chamber relatively again, is used for doing ultrared guiding, prolong light path and provide output ultrared parallel beam.Optical fold system (optical folding system), comprise a beam splitter (beam splitter) and and be used for guiding the deflector (deflector) of infrared ray to next card casket, wherein the highly reflective plated film is all coated on the surface of the light path process of this beam splitter and this deflector.It is divided into mirror portion and hollow space to this beam splitter for half hollow type beam splitter, and the ratio that both distribute with this is regulated the beam split ratio.Infrared detection system (infrared detecting system), be to be a two waveband detecting device (dual channel detector), comprise a reference detector (reference detector) and an actual measurement detecting device (measuring detector), wherein each detecting device contains an optical filter (filter) and a sensor (sensor), and the optical filter in this reference detector and the optical filter of actual measurement in the detecting device respectively induction frequencies near but the infrared ray of different frequency, so both are different optical filters, but the sensor in this reference detector is then identical with the sensor in the actual measurement detecting device.
Above-mentioned and other purpose of the present invention, advantage and characteristic are worked as by the detailed description of following preferred embodiment can be clearer.
Description of drawings
Fig. 1 represents according to Bi Er-Lan Bai law (Beer-Lambert Law) graph of relation of a gas to ultrared absorption intensity and this gas concentration of describing.
Fig. 2 is by being quoted from United States Patent (USP) the 5th, 222 in first conventional art, the structure of No. 389 multi-pass air cavity and ultrared propagation synoptic diagram.
Fig. 3 is by being quoted from United States Patent (USP) the 4th, 914 in second conventional art, the structure of a polyvoltine compound gas analyzer of No. 719 and ultrared propagation synoptic diagram.
Fig. 4 (a), 4 (b), 4 (c) represent the structural representation of 3 kinds of embodiment in the gas analyzer of No. the 5th, 773,828, the 3rd United States Patent (USP) that conventional art is quoted from respectively.
Fig. 5 is the stereographic map with card box light path system (cassette type light path system) " polyvoltine compound gas analyzer module " of the present invention.
Fig. 6 (a) is the stereographic map of the structure of gas analyzer of the present invention.
Fig. 6 (b) is the structure of gas analyzer of the present invention inside and the stereographic map of functional operation thereof.
Fig. 7 (a), 7 (b), 7 (c) are the cartridge structure stereographic map of gas analyzer of the present invention inside.
Fig. 8 (a), 8 (b) respectively represent the upper and lower of cartridge structure of gas analyzer of the present invention inside and the structural plan figure of light path thereof.
Fig. 9 is the effect synoptic diagram of the optical fold system of gas analyzer of the present invention inside.
Figure 10 is the effect synoptic diagram of the two waveband detecting device of the infrared detection system of gas analyzer of the present invention inside.
Figure 11 is the effect synoptic diagram of the signal processing system of gas analyzer of the present invention inside.
Label declaration
Around the 202 hollow light guiding pipes
206,208,210,218 detecting devices
212,214,216 detecting device mouths
300 infrared light supplies
302 optical absorption chambeies
304,306,308 optical splitters
310,312,314,316 detecting devices
320,322,324,326 optical filters
401 light sources
403,407 gas flow photometry absorbing cavities
405,409,412,441 detecting devices
421,425 airtubes
440,442,444 optical filters
477 gas flow photometry absorbing cavities
500 polyvoltine compound gas analyzer modules
520 preprocessing systems
522 air intake openings
524 sampling probes
526 filtrators
528 pumps
532 air guide ports
580 data processing systems
600 gas analyzer bodies
610 shells
612 chassis
614 loam cakes
616 locking members
618 substrates
620 light-source systems
622 infrared light sources
624 optically focused paraboloidal mirrors
630 light path systems
640 card casket shells
641 first
642 second
643 first sides
644 second sides
645 the 3rd sides
646 the 4th sides
647 gas port groups
648 screw hubs
650 optical absorption chambeies
652O-shape ring
653 first sections
654 second sections
655 ultrared imports
656 ultrared outlets
660 reflective concave surface mirror groups
662 first concave mirrors
664 second concave mirrors
666 the 3rd concave mirrors
670 optical fold systems
671 beam splitters
677 deflectors
680 infrared detection systems
682 reference detectors
684 actual measurement detecting devices
700 signal processing systems
704 amplifiers
706 analog/digital converters (A/D convertor)
708 microprocessors
802 erasable removing and formula ROM (read-only memory) able to programme (EEPROM)
804 display device
806 pulses
808 change-over switches
902 thermistor(-ter)s
904 thermoelectric elements 1
906 thermoelectric elements 2
The 908 common ground utmost points
Embodiment
As shown in Figure 5, a kind of polyvoltine compound gas analyzer module (multi-gas component analyzer module) 500 with card box light path system (cassette type light path system) comprises a preprocessing system (pretreatment system) 520, one gas analyzer body 600, signal processing system (signal processing system) 700 and one data processing system (data processingsystem) 580.
Preprocessing system 520 comprises an air intake opening (gas inlet) 522, one sampling probe (samplingprobe) 524, a filtrator (filter) 526, a pump (pump) 528 and an air guide port (vent) 532.Preprocessing system 520 is to borrow pump 528 to feed the gas that desire measures, and with sampling probe 524 to its take a sample (sampling), adjust its temperature and humidity, and the particle that will be suspended in the gas that desire measures is filtered with filtrator 526, and air guide port (vent) the 532nd is used for balancing Atmospheric pressure person.
Shown in Fig. 6 (a), gas analyzer body 600 is to be used for the gas that comes via this preprocessing system 520 is analyzed.This gas analyzer body 600 comprises a shell (housing) 610, a light-source system 620, a light path system (light path system) 630, one optical fold system (opticalfolding system) 670 (not showing among Fig. 6 (a)) and an infrared detection system (infrared detectingsystem) 680 (not shown).Shell 610 comprises a chassis (chassis) 612, a loam cake 614, a locking member 616 and a substrate (substrate) 618.
Shown in Fig. 6 (b), light-source system 620 comprises the optically focused paraboloidal mirror (reflector) 624 that an infrared light sources 622 and is used to provide input infrared ray (infrared ray) parallel beam.
Shown in Fig. 7 (a), 7 (b) and 7 (c), light path system (light path system) 630 comprises a card casket shell 640, an optical absorption chamber (absorption chamber) 650 and one groups of reflective concave surface mirrors (concavemirror) 660, and this card casket 640 comprises one first 641, second 642,1 first sides 643, one second side 644, one the 3rd side 645 and one the 4th side 646.Wherein this card casket shell 640 respectively is provided with staggered being disposed at relatively on these first 641 and second 642 of gas port group 647 that contain a plurality of gas ports (aperture), and around each gas port group 647 652 encirclements of O-shape ring with usefulness as sealing gas between the card casket of stack layer by layer, these gas port groups 647 gaseous compound to be measured that conductor is gone into that is used for evenly distributing, wherein this first side 643 has one first section 653 and 1 second section 654 again, and this first section 653 place of this first side 643 is provided with the ultrared import of input (inlet) 655, and be provided with the ultrared outlet of output (outlet) 656 at this second section 654 place of this first side 643, and this optical absorption chamber 650 is to be used for guiding gaseous compound to be measured and to provide gaseous compound to contact and prolong the space of light path (light path) with infrared ray, and in this first side 643, second side 644, the 3rd side 645, each is provided with the screw hub (screwboss) 648 of some locking usefulness with the outside of the 4th side 646, and the inwall in this optical absorption chamber 650 is all coated the highly reflective plated film.
Shown in Fig. 8 (a), 8 (b), this group reflective concave surface mirror 660 comprises one first concave mirror 662, one second concave mirror 664, with one the 3rd concave mirror 666, staggered first side 643 and second side 644 that is disposed at this card casket 640 relatively is used for doing ultrared guiding and prolongs light path and provide and export the infrared ray parallel beam.
As shown in Figure 9, optical fold system 670 comprises a beam splitter (beam splitter) 671 and and is used for guiding infrared ray by the deflector (deflector) 677 of a card casket to next card casket, wherein the light path of this beam splitter 671 and this deflector 677 the surface of process all coat the highly reflective plated film.Beam splitter 671 is the beam splitter of half hollow type, and some is the reflecting surface mirror for hollow bulb another part for its minute surface, and the beam split ratio of this beam splitter is according to the ratio of the area of the area of this hollow bulb and reflecting surface mirror and decide.
As shown in figure 10, infrared detection system 680, be to be a two waveband detecting device (dual channeldetector), comprise a reference detector (reference detector) 682 and one actual measurement detecting device (measuring detector) 684, wherein each detecting device contains an optical filter (filter) (not shown) and a sensor (sensor) (not shown), and the optical filter in this reference detector and the optical filter of actual measurement in the detecting device respectively induction frequencies near but the infrared ray of different frequency, so both are different optical filters, but the sensor in this reference detector 682 is then identical with the sensor in the actual measurement detecting device 684.
As shown in figure 11, signal processing system (signal processing systern) 700 comprises and is used for the Port Multiplier (multiplexer) 702 of switch detector signal, be used for the amplifier (amplifier) 704 of amplifying signal, be used for analog signal conversion is become the analog/digital converter (A/Dconverter) 706 of digital signal, be used for assigned tasks and set the microprocessor (microprocessor) 708 of working environment, be used for " erasable remove and formula ROM (read-only memory) able to programme " (EEPROM) 802 of storage parameter, be used for communication system (communication system) (not shown) of the data that transmits, be used for supplying power system (the power supply system) (not shown) that related system power is used, with the display device that is used to refer to functional status and display result (display apparatus) 804.
As shown in Figure 5, data processing system 580, be used for the data of sending here by signal processing system 700 analyzed, computing and demonstrate its result.
Now the action principle with the polyvoltine compound gas analyzer of card box light path system of the present invention is described as follows:
As shown in Figure 5, gas is imported the processing that needs before the gas analyzer via preprocessing system 500.At first, sampling probe 524 is also borrowed the startup of pump 528 with gas sample and by air intake opening 522 gas is imported.Then gas via filtrator 526 with the impurity such as suspended particulates in the filtering gas, and through Temperature Treatment to remove the moisture in the gas.Then shown in Fig. 7 (a), 7 (b), 7 (c), the gas of handling through preprocessing system 500 is blocked in the optical absorption chamber 650 of casket 640 by the blowhole importing that is arranged on first 641 of card casket shell 640, be provided with the O-annular 652 that is used for sealing gas sampled around the blowhole, the unpurified gas around making can not invaded.Set gas port group 647 is used for gas communication in each card casket 640 on second 642 of card casket shell 640, and gas port group 647 is behind second layer card casket shell 640, it is to be provided with so that the gas in each optical absorption chamber 650 of the card casket shell 640 of each layer evenly distributes in interconnected mode on first 641 and second 642, and gas is derived by the venthole that is arranged on second 642 of last one deck card casket shell 640 at last.Gas port group 647 can be arranged at the position on first 641 and second 642 of any card casket shell 640 of not hindering light path.
Secondly, as Fig. 8 (a) and shown in Figure 9, light beam is injected beam splitter 671 by light source 622 behind the optically focused of optically focused paraboloidal mirror 624.A part of then light beam is through the hollow space 672 of beam splitter 671 and detected by the detecting device of ground floor, and another part light beam reflexes to deflector 677 through the face mirror part 674 of beam splitter 671, and then incide the card casket 640 of the second layer via the reflection of deflector 677, each layer after the order class is pushed into according to this.And in each layer card casket, light beam all order via first concave mirror 662, second concave mirror 664, and the reflection of the 3rd concave mirror 666.
Again as shown in figure 11, the input of light-source system 620 (see figure 6) mid-infrared lights be the control via microprocessor 708 one pulse (pulse) 806 is provided and borrow one switch switch 808 provide a dark background light that cuts off (off) position do standard with and the bright light of connecting (on) position compare, make the accuracy of gas analyzer be unlikely to be subjected to the influence of varying environment light.In addition, be used for the Port Multiplier (multiplexer) the 702nd of switch detector signal, be used for switching and select the common ground plate (common) 908 that is used for the thermistor(-ter) (Thermistor) 902 of measuring temperature, the thermoelectric element 1 (Thermopile one) 904 that is used for measuring light intensity and thermoelectric element 2 (Thermopiletwo) 906 and is used for the measurement circuit deviate.
The optical path length of each card casket is all identical and be certain value in the polyvoltine compound gas analyzer of card box light path system of the present invention, and the analyser that is used for measuring a certain gaseous compound is the number that decides required composite card casket according to the optical path length of its required collocation.
The material of this highly reflective plated film in the polyvoltine compound gas analyzer of card box light path system of the present invention (highly reflective coating) is gold (gold) or zinc impregnation selenium (ZnSe) glass.
The material of this beam splitter and this deflector is ABS resin or PC resin in the polyvoltine compound gas analyzer of card box light path system of the present invention.
The specific embodiment that is proposed in the detailed description of preferred embodiment is only in order to be easy to illustrate technology contents of the present invention, and be not with narrow sense of the present invention be limited to this embodiment, all many variations that situation is done enforcement according to spirit of the present invention and following claim scope all belongs to scope of the present invention.

Claims (18)

1. the polyvoltine compound gas analyzer with card box light path system contains at least one card casket, and each this card casket comprises:
One light-source system comprises the optically focused paraboloidal mirror that an infrared light sources and is used to provide input infrared ray parallel beam;
One light path system, comprise a card casket shell, one optical absorption chamber and one group of reflective concave surface mirror, this card casket shell comprises one first, one second, one first side, one second side, one the 3rd side, with one the 4th side, wherein this card casket shell respectively is provided with a pore group that contains a plurality of pores, staggered being disposed at relatively on this first and second, and around each pore group an O type ring encirclement with usefulness as sealing gas between the card casket of stack layer by layer, the gaseous compound to be measured that these a plurality of pore groups are used for feeding evenly distributedly, wherein this first side has one first section and one second section again, and this first section of this first side locates to be provided with the ultrared air intake opening of input, and locate to be provided with the ultrared exhausr port of output this second section of this first side, and this optical absorption chamber is to be used for guiding gaseous compound to be measured and to provide gaseous compound to contact and prolong the space of light path with infrared ray, and in this first side, second side, the 3rd side, with the outside of the 4th side the screw hub of some locking usefulness is set respectively, and the inwall in this optical absorption chamber is all coated the highly reflective plated film, this group reflective concave surface mirror comprises one first concave mirror again, one second concave mirror, with one the 3rd concave mirror, staggered first side and second side that is disposed at this optical absorption chamber relatively is used for doing ultrared guiding, prolong light path and provide output ultrared parallel beam;
One optical fold system comprises a beam splitter and and is used for guiding ultrared deflector, and wherein the highly reflective plated film is all coated on the surface of the light path process of this beam splitter and this deflector; And
One infrared detection system, be to be a two waveband detecting device, comprise a reference detector and an actual measurement detecting device, wherein each this detecting device contains an optical filter and a sensor, and the optical filter in this reference detector and the optical filter of this actual measurement in the detecting device approaching but infrared ray of different frequency of induction frequencies respectively, so both are different optical filters, but this sensor in this sensor in this reference detector and this actual measurement detecting device is then identical.
2. the polyvoltine compound gas analyzer with card box light path system as claimed in claim 1, it is characterized in that the beam splitter of this beam splitter for half hollow type, some is the reflecting surface mirror for hollow bulb another part for its minute surface, and the beam split ratio of this beam splitter is according to the ratio of the area of the area of this hollow bulb and reflecting surface mirror and decide.
3. the polyvoltine compound gas analyzer with card box light path system as claimed in claim 1, it is characterized in that the optical path length of this each card casket is all identical and be certain value, and the analyser that is used for measuring each gaseous compound is the number that decides the required composite card casket of gas analyzer according to the optical path length of the required coupling of this gas.
4. the polyvoltine compound gas analyzer with card box light path system as claimed in claim 3 is characterized in that comprising a plurality of card caskets.
5. the polyvoltine compound gas analyzer with card box light path system as claimed in claim 3, it is characterized in that only comprising a card casket, so become one " pure gas analyser " and be used for measuring a pure gas with card box light path system, and the size of this card casket to be optical path length according to the required coupling of this gas decide.
6. as claim 1 or 5 described polyvoltine compound gas analyzers with card box light path system, the material that it is characterized in that this highly reflective plated film is for being made of a kind of in the group gold, silver and aluminium.
7. the polyvoltine compound gas analyzer with card box light path system as claimed in claim 1, the material that it is characterized in that this highly reflective plated film are zinc impregnation selenium (ZnSe) glass.
8. a kind of in the group that is constituted by ABS resin or PC resin of the polyvoltine compound gas analyzer with card box light path system as claimed in claim 1, the material that it is characterized in that this beam splitter and this deflector.
9. as claim 1 or 5 described polyvoltine compound gas analyzers with card box light path system, the configuration that it is characterized in that this pore group is for avoiding hindering any position of light path.
10. the polyvoltine compound gas analyzer module with card box light path system comprises:
One preprocessing system comprises an air intake opening, a sampling probe, a filtrator and a pump, is used for sucking the gas that desire measures, and it is taken a sample, adjusts its temperature and humidity, and the particle that will be suspended in the gas that desire measures is filtered;
One gas analyzer body is used for the gas after handling via this preprocessing system is analyzed, and this gas analyzer body comprises:
One signal processing system, comprise the simulation multiplexer that is used for switching reference detector and actual measurement detecting device, be used for the amplifier of amplifying signal, be used for analog signal conversion is become the A/D converter of digital signal, be used for allocating task, set working environment, and the central processing system of operating part mathematical operation, be used for the storer of data on file, be used for the communication system of the data that transmits, and the display device that is used to refer to functional status and display result, and
One data processing system is used for the data of being sent here by signal processing system is analyzed, computing, and demonstrate its result;
And this gas analyzer body more contains at least one card casket, and each this card casket comprises:
One light-source system comprises the optically focused paraboloidal mirror that an infrared light sources and is used to provide input infrared ray parallel beam;
One light path system, comprise a card casket shell, one optical absorption chamber and one group of reflective concave surface mirror, this card casket shell comprises one first, one second, one first side, one second side, one the 3rd side, with one the 4th side, wherein this shell respectively is provided with a pore group that contains a plurality of pores, staggered being disposed at relatively on this first and second, and around each pore group an O-type ring encirclement with usefulness as sealing gas between the card casket of stack layer by layer, these pore groups are used for the gaseous compound to be measured that evenly distributes and feed, wherein this first side has one first section and one second section again, and this first section of this first side locates to be provided with the ultrared air intake opening of input, and locate to be provided with the ultrared exhausr port of output this second section of this first side, and this optical absorption chamber is to be used for guiding gaseous compound to be measured and to provide gaseous compound to contact and prolong the space of light path with infrared ray, and in this first side, second side, the 3rd side, with the outside of the 4th side the screw hub of some locking usefulness is set respectively, and the inwall in this optical absorption chamber is all coated the highly reflective plated film, this group reflective concave surface mirror comprises one first concave mirror again, one second concave mirror, with one the 3rd concave mirror, staggered first side and second side that is disposed at this optical absorption chamber relatively is used for doing ultrared guiding, prolong light path and output infrared ray parallel beam is provided;
One optical fold system comprises a beam splitter and and is used for guiding ultrared deflector, and wherein the highly reflective plated film is all coated on the surface of the light path process of this beam splitter and this deflector; And
One infrared detection system, it is a two waveband detecting device, comprise a reference detector and an actual measurement detecting device, wherein each detecting device contains an optical filter and a sensor, and the optical filter in this reference detector and the optical filter of actual measurement in the detecting device respectively induction frequencies near but the infrared ray of different frequency, so both are different optical filters, but the sensor in this reference detector is then identical with the sensor in the actual measurement detecting device;
11. the polyvoltine compound gas analyzer module with card box light path system as claimed in claim 10, it is characterized in that the optical path length of this each card casket is all identical and be certain value, and the analyser that is used for measuring each gaseous compound is the number that decides the required composite card casket of gas analyzer module according to the optical path length of its required coupling.
12. the polyvoltine compound gas analyzer module with card box light path system as claimed in claim 11 is characterized in that comprising a plurality of card caskets.
13. the polyvoltine compound gas analyzer module with card box light path system as claimed in claim 11, it is characterized in that only comprising a card casket, so become one " pure gas analyser module " and be used for measuring a pure gas with card box light path system, and the size of this card casket to be optical path length according to the required coupling of this gas decide.
14. as claim 10 or 13 described polyvoltine compound gas analyzer modules with card box light path system, the material that it is characterized in that this highly reflective plated film is for being made of a kind of in the group gold, silver and aluminium.
15. as claim 10 or 13 described polyvoltine compound gas analyzer modules with card box light path system, the configuration that it is characterized in that this gas group is any position that can avoid hindering light path.
16. the polyvoltine compound gas analyzer module with card box light path system as claimed in claim 10, it is characterized in that the beam splitter of this beam splitter for half hollow type, some is the reflecting surface mirror for hollow bulb another part for its minute surface, and the beam split ratio of this beam splitter is according to the ratio of the area of the area of this hollow bulb and reflecting surface mirror and decide.
17. the polyvoltine compound gas analyzer module with card box light path system as claimed in claim 10, the material that it is characterized in that this highly reflective plated film is zinc impregnation selenium (ZnSe) glass.
18. the polyvoltine compound gas analyzer module with card box light path system as claimed in claim 10, the material that it is characterized in that this beam splitter and this deflector is for being made of a kind of in the group ABS resin or PC resin.
CNB011177322A 2001-04-30 2001-04-30 Multiple-compound gas analyzer with cassette light path system Expired - Fee Related CN1185479C (en)

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SE543427C2 (en) 2019-06-25 2021-02-16 Senseair Ab Multi-channel gas sensor
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