CN118425747A - Test and measurement instrument with custom jitter compensation - Google Patents
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Abstract
A test and measurement instrument comprising: one or more ports allowing the instrument to be connected to a DUT; a memory; a user interface including a display for displaying waveform signals received from the DUT and controls allowing a user to select settings of the instrument; and one or more processors configured to execute code that causes the one or more processors to: receiving a signal from the DUT having a plurality of signal levels and a plurality of jitter thresholds; and adjusting each measurement of the signal from the DUT using the jitter compensation value for each jitter threshold to produce a final measurement. A method includes receiving a waveform signal from a Device Under Test (DUT) having a plurality of signal levels and a plurality of jitter thresholds; and adjusting the measurement of each level of the signal using the jitter compensation value for each level to produce a final measurement.
Description
Cross Reference to Related Applications
The present disclosure claims the benefit of U.S. provisional application No. 63/442,733 entitled "TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION," filed on 1/2/2023, the disclosure of which is incorporated herein by reference in its entirety.
Technical Field
The present disclosure relates to test and measurement instruments, and more particularly to test and measurement instruments that compensate for various amounts of instrument noise-induced jitter.
Background
An instrument such as an oscilloscope that measures jitter and noise of a signal can compensate for the effects of voltage noise in the instrument for these measurements. Such instrument noise may include random and deterministic components, but is typically dominated by gaussian random noise. Such noise is often characterized by its standard deviation, sometimes after deterministic noise is removed by well-known methods. Hereafter, RN (random noise) refers to the standard deviation of the noise, whether deterministic noise is excluded or not. A non-return to zero (NRZ) signal (with one jitter threshold) requires only a single value of oscilloscope noise to compensate for the jitter measurement. A multi-level signal, such as 4-level phase amplitude modulation (PAM 4), has several jitter thresholds.
Current methods use a single value of oscilloscope noise to compensate for jitter values. Common ways to calculate this value may include picking up the noise value at the center of the voltage range (such as 0V), or by calculating an average noise value using multiple points along the voltage range. Such simple forms of jitter compensation may cause problems such as under-compensation, over-compensation, or both. When under-compensation occurs, the instrument may report a large jitter value that may not meet specified requirements. Overcompensation attempts to remove more noise than is present on the edges. This may lead to a negative jitter in the report, a situation that is not possible. In all cases, existing methods of determining jitter may reduce the accuracy and reliability of the measurement.
Embodiments of the present disclosure address these and other limitations of conventional instruments.
Drawings
Fig. 1 illustrates how the composite jitter is formed by horizontal and vertical components.
Fig. 2 illustrates how vertical noise is converted into jitter due to the conversion rate.
Fig. 3 illustrates noise trends plotted as noise versus voltage offset.
Fig. 4 shows two plots, one illustrating the aligned rising edges on the PAM4 signal and the other illustrating the random noise at each voltage shown in the first plot.
Fig. 5 shows an embodiment of a test and measurement device.
Detailed Description
Embodiments according to the present disclosure propose a more accurate method to compensate for noise-induced jitter on waveforms with multiple jitter thresholds, such as PAM4 (pulse amplitude modulation 4) signals. Characterizing noise along all voltage levels of the test and measurement instrument used to measure the waveform provides a better understanding of how much noise is added to each edge of the waveform. This approach compensates for the precise amount of noise added when analyzing jitter on each individual edge type. This process provides higher jitter measurement accuracy, helping to avoid overcompensation and undercompensation. Specifically, the process determines a unique sigma (noise) value for each jitter threshold of a signal having multiple jitter thresholds.
The embodiments begin by examining the effects of oscilloscope-inherent (mostly random) noise that undesirably increases the overall apparent random jitter of the acquisition edge of a signal having multiple signal levels and multiple jitter thresholds. The term "jitter threshold" refers to the midpoint between two signal levels of a waveform, also referred to as the Voltage Threshold (VT). Because of the behavior of the acquisition system, the process can recognize this knowledge of the instrument's inherent noise as a function of voltage level and use it to determine a particular jitter compensation. Statistical compensation correctly handles the effect of varying noise on each edge jitter. This results in a more accurate measurement of the jitter of the signal.
As shown in fig. 1, the compound jitter on the edges of the data typically includes a "summation" of horizontally and vertically induced components, where the subscripts h and v represent the respective root causes. This "summation" may not be a simple algebraic 1. In the case where these components are uncorrelated gaussian random variables, they must be summed in the sense of rms (root mean square):
Equation (1):
where each RJ represents the standard deviation (sigma) of the component.
Although RJ (v) may appear less important than RJ (h) because its root cause is noise, they all have an effect on the resulting signal, i.e., they all reduce the eye width over the eye pattern. RJ Composite must report on the data table as RJ or jitter specification through the system.
The process then generates a model that relates how a given amount of vertical noise is mathematically related to the observed jitter produced. In fig. 2, consider a waveform edge with a given slew rate, at least through a threshold region, and a given vertical noise amplitude:
by observation, the relationship of the numerical value of RJ (v) to the root cause is as follows:
equation (2) RJ (v) = RN/slew rate
Noise on the instrument is typically measured in terms of the standard deviation of the input signal without the source attached. The process may use voltage offset or position settings to move the signal trace across all voltage levels so that multiple such noise measurements may be made. In one embodiment, input to the instrument is terminated and noise of the instrument is measured. Alternatively, an external low noise voltage source (rather than an internal offset or similar function) may be used to characterize the trend of noise versus voltage. Characterization may also be accomplished by inputting an AC signal into the instrument. If the characterizing signal is AC, some post-processing means that selects the relevant part of the signal is used, e.g. time gating on the flat part of the square wave, frequency domain separation, a certain amount of filtering, or other noise characteristics that are suitable for the input. The resulting data may be presented as a plot of noise versus voltage offset, as shown in fig. 3. The measured noise trend may vary over the digitized voltage range. This trend may be symmetrical or asymmetrical around the center of the voltage range (shown at 0 in fig. 3).
The instrument may store the plot as the noise profile of the instrument. Determining the jitter compensation value for each jitter threshold may include accessing the distribution. The noise profile may be specific to a particular setting of the instrument controls at the time of noise measurement.
These embodiments are applicable to any signal having two or more jitter thresholds. Consider a PAM4 signal, which has 12 types of edges. PAM4 symbols are represented by the set 0,1,2, 3. The signal voltage levels representing these symbols are { V0, V1, V2, V3}, respectively. The decision threshold voltage between any two signal levels is typically represented by the average or midpoint of the two levels, referred to herein as the jitter threshold or voltage threshold, as shown by VT 1、VT2、VT3、VT4 in fig. 4. See, for example, ieee802.3bs. The transition or edge between the two levels is where both horizontal jitter and vertical noise induced jitter are injected into the signal. The rising edges are of 6 types in total, as shown in table 1. The edge type represents the transition from the initial signal level to the final signal level.
TABLE 1
In an ideal case where the spacing between all symbol levels is the same, edge tags 3 and 4 will have the same threshold voltage (VT 3＝VT4). It is also desirable that the slew rates of edge tags 1,4, and 6 will be the same (s1=s4=s6) because they are all single signal level transitions, and the slew rates of edge tags 2 and 5 will also be the same (s2=s5) because they are dual signal level transitions. In practice, these values may be different. For the sake of simplicity of explanation, it is assumed that the falling edge is the same as the rising edge described in table 1 and shares the same threshold.
The left plot on fig. 4 shows six aligned rising edges on the PAM4 signal. The dispersion of the edges is caused by a combination of horizontal jitter and vertical noise. The characteristics of each edge are described in table 1. The right plot on fig. 4 shows the noise distribution of the oscilloscope, which is a rotated version of fig. 3. The set of noise values is obtained before any signal is measured and is later referenced during post-processing.
The voltage threshold on the waveform plot in fig. 4 has been extended to the noise trend plot. These locations mark the RNs at each voltage for measurement equipment reasons. For this example, an asymmetric noise trend is shown to demonstrate a unique RN value for each voltage threshold. The noise + jitter dispersion is exaggerated to show the effect of oscilloscope noise on each edge. Each edge is assumed to have approximately the same amount of horizontal jitter RJ (h). This illustrates how edges such as 0→1 and 2→3 can have more noise converted to jitter than edges of 1→2.
Since noise varies across the voltage range, it would be less accurate to use a single noise estimate to determine its contribution to the total jitter (RJ composite) on each edge. Instead, a more accurate approach is to identify thresholds for all edges in any given signal and determine the noise at each voltage offset corresponding to the respective threshold. Based on this, equation (2) can be modified to the following equation, where for PAM4 signal, i= {1,2,3,4,5,6}:
Equation (3): RJ (RJ) i(v)＝RNi/Si
Further, equation (1) may be modified as follows:
Equation (4):
The individual RJ (h) with each edge of the edge tag i can be calculated by using the measured edge specific values of equations 4, RJ Composite and the calculated value of RJ (v):
Equation (5):
The information about the vertically induced jitter component and the horizontal jitter may be combined in various ways to obtain the total random jitter amount in the signal. In addition, these elements allow for adjustment of the measurement results obtained with the test and measurement instrument to improve its accuracy. The above-described processes may be implemented in one or more processors of a test and measurement instrument. Fig. 5 shows an embodiment of a test and measurement instrument.
Fig. 5 illustrates an embodiment of a test structure for a Device Under Test (DUT). The test structure includes a test and measurement instrument 10, such as an oscilloscope. The test and measurement instrument 10 receives signals from the DUT24 through an instrument probe 26. The probe will send a signal, typically an electrical signal, but the signal may also be an optical signal, to the test and measurement instrument through one or more ports 13. Two ports may be used for differential signaling and one port for single channel signaling. The signal is sampled and digitized into a waveform by the instrument. For example, if the test and measurement instrument 10 comprises a sampling oscilloscope, the Clock Recovery Unit (CRU) 18 may recover the clock signal from the data signal. Software clock recovery may be used on a real-time oscilloscope.
The test and measurement instrument has one or more processors represented by processor 12, memory 20, and user interface 16. The memory may store executable instructions in the form of code that, when executed by the processor, cause the processor to perform tasks. The memory may also allow for storing one or more noise profiles of the instrument, as will be discussed in more detail later.
The user interface 16 of the test and measurement instrument allows a user to interact with the instrument 10, such as entering settings, configuring tests, and the like. The user interface may include a display and controls to allow a user to select settings of the instrument and view the generated waveforms. The test and measurement instrument may also include a reference equalizer and analysis module 14. One or more processors may execute code to implement the methods of the embodiments.
As described above, embodiments according to the present disclosure provide a more accurate method to compensate for noise-induced jitter. By characterizing noise at multiple voltage levels, a better understanding of how much noise is added to each edge in the waveform is obtained. Analyzing the jitter on each individual edge type allows compensation for the precise amount of noise added at the corresponding threshold. This also means that using a single value of oscilloscope noise is not optimal, as it will typically be the correct value at most for only one of the multiple thresholds. The improved method allows a more accurate knowledge of the amount of jitter present on each edge.
Aspects of the disclosure may operate on specially created hardware, firmware, digital signal processors, or on specially programmed general-purpose computers including processors operating according to programmed instructions. The term "controller" or "processor" as used herein is intended to include microprocessors, microcomputers, application Specific Integrated Circuits (ASICs), and special purpose hardware controllers. One or more aspects of the present disclosure can be embodied in computer-usable data and computer-executable instructions, such as in one or more program modules, executed by one or more computers (including monitoring modules) or other devices. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types when executed by a processor in a computer or other device. The computer-executable instructions may be stored on a non-transitory computer-readable medium such as a hard disk, an optical disk, a removable storage medium, a solid state memory, a Random Access Memory (RAM), and the like. As will be appreciated by one of skill in the art, the functionality of the program modules may be combined or distributed as desired in various aspects. In addition, the functions may be embodied in whole or in part in firmware or hardware equivalents (such as integrated circuits, FPGAs, and the like). Particular data structures may be used to more effectively implement one or more aspects of the present disclosure, and such data structures are contemplated within the scope of computer-executable instructions and computer-usable data described herein.
In some cases, the disclosed aspects may be implemented in hardware, firmware, software, or any combination thereof. The disclosed aspects may also be implemented as instructions carried by or stored on one or more non-transitory computer-readable media, the instructions being readable and executable by one or more processors. Such instructions may be referred to as a computer program product. As discussed herein, computer-readable media refers to any medium that can be accessed by a computing device. By way of example, and not limitation, computer readable media may comprise computer storage media and communication media.
Computer storage media refers to any medium that can be used to store computer readable information. By way of example, and not limitation, computer storage media may include RAM, ROM, electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital Video Disk (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, and any other volatile or non-volatile, removable or non-removable media implemented in any technology. Computer storage media does not include signals themselves and the transitory forms of signal transmission.
Communication media refers to any medium that can be used for the communication of computer readable information. By way of example, and not limitation, communication media may include coaxial cables, fiber optic cables, air, or any other medium suitable for the communication of electrical, optical, radio Frequency (RF), infrared, acoustic, or other types of signals.
Example
Illustrative examples of the disclosed technology are provided below. Embodiments of the techniques may include one or more of the examples described below, as well as any combination thereof.
Example 1 is a test and measurement instrument, comprising: one or more ports allowing the instrument to be connected to a DUT; a memory; a user interface including a display that allows display of waveform signals received from the DUT and controls that allow a user to select settings of the instrument; and one or more processors configured to execute code that causes the one or more processors to: receiving a signal from the DUT having a plurality of signal levels and a plurality of jitter thresholds; and adjusting each measurement of the signal from the DUT using the jitter compensation value for each jitter threshold to produce a final measurement.
Example 2 is the test and measurement instrument of example 1, wherein the one or more processors are further configured to execute code to cause the one or more processors to determine a jitter compensation value for each jitter threshold of the signal.
Example 3 is the test and measurement instrument of example 2, wherein the code that causes the one or more processors to determine a jitter compensation value for each jitter threshold comprises code that causes the one or more processors to: identifying a voltage value for each jitter threshold; and determining noise at each jitter threshold.
Example 4 is the test and measurement instrument of example 2, wherein the code that causes the one or more processors to determine a jitter compensation value for each jitter threshold of the signal comprises code that causes the one or more processors to: configuring the instrument to generate a static offset voltage at a voltage level or to receive an external signal; measuring noise at the voltage level; and repeating the configuring and measuring to collect noise measurements at a plurality of voltage levels.
Example 5 is the test and measurement instrument of example 4, wherein the one or more processors are further configured to save the noise measurement as a noise profile of the test and measurement instrument.
Example 6 is the test and measurement instrument of example 4, wherein the code that causes the one or more processors to determine the jitter compensation value comprises code for: the noise measurements are converted into vertically induced jitter component values for each voltage level.
Example 7 is the test and measurement instrument of example 6, wherein the code that causes the one or more processors to convert the noise measurements into vertically-induced jitter component values for each voltage level comprises code for: the one or more processors are caused to divide the noise measurement for each voltage level by the slew rate of the signal.
Example 8 is the test and measurement instrument of any one of examples 1 to 7, wherein the jitter compensation value for each voltage level is specific to a particular set of control settings of the instrument.
Example 9 is the test and measurement instrument of any one of examples 1 to 8, wherein the code that causes the one or more processors to determine the jitter compensation value comprises code to: the one or more processors are caused to access the saved noise profile of the test and measurement instrument.
Example 10 is a method, comprising: receiving, at a test and measurement instrument, a waveform signal from a Device Under Test (DUT) having a plurality of signal levels and a plurality of jitter thresholds; and adjusting the measurement of each level of the waveform signal from the DUT using the jitter compensation value for each level to produce a final measurement.
Example 11 is the method of example 10, further comprising determining a jitter compensation value for each of the plurality of levels.
Example 12 is the method of example 11, wherein determining the jitter compensation value for each level comprises: identifying a voltage value for each jitter threshold; and determining noise at each jitter threshold.
Example 13 is the method of example 12, wherein determining a jitter compensation value for each level of the signal comprises: configuring the test and measurement instrument to generate a static offset voltage at a voltage level or to receive an external signal; measuring noise at the voltage level; and repeating the configuring and measuring to collect noise measurements at a plurality of voltage levels.
Example 14 is the method of example 13, further comprising saving the noise measurement as a noise profile of the test and measurement instrument.
Example 15 is the method of example 11, wherein determining the jitter compensation value comprises converting the noise measurement result into a vertically induced jitter component value for each level.
Example 16 is the method of example 15, wherein converting the noise measurement to a vertically induced jitter component value for each level comprises dividing the noise measurement for each level by a slew rate of the waveform signal.
Example 17 is the method of example 11, wherein determining the jitter compensation value comprises accessing a saved noise profile of the test and measurement instrument.
Example 18 is the method of any one of examples 10 to 17, wherein the jitter compensation value for each level is based on a particular set of control settings of the test and measurement instrument.
In addition, the written description references specific features. It should be understood that the disclosure in this specification includes all possible combinations of those particular features. When a particular feature is disclosed in the context of a particular aspect or example, that feature may also be used in the context of other aspects and examples, to the extent possible.
Furthermore, when a method having two or more defined steps or operations is referred to in the present application, the defined steps or operations may be performed in any order or simultaneously unless the context excludes those possibilities.
All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the steps of any method or process so disclosed, may be combined in any combination, except combinations where at least some of such features and/or steps are mutually exclusive. Each feature disclosed in the specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Although specific examples of the invention have been illustrated and described herein for purposes of description, it will be appreciated that various modifications may be made without deviating from the spirit and scope of the invention. Accordingly, the invention should not be limited except as by the appended claims.
Claims (18)
1. A test and measurement instrument comprising:
one or more ports allowing the instrument to be connected to a DUT;
a memory;
A user interface including a display that allows display of waveform signals received from the DUT and controls that allow a user to select settings of the instrument; and
One or more processors configured to execute code that causes the one or more processors to:
Receiving a signal from the DUT having a plurality of signal levels and a plurality of jitter thresholds; and
Each measurement of the signal from the DUT is adjusted using the jitter compensation value for each jitter threshold to produce a final measurement.
2. The test and measurement instrument of claim 1, wherein the one or more processors are further configured to execute code to cause the one or more processors to determine a jitter compensation value for each jitter threshold of the signal.
3. The test and measurement instrument of claim 2, wherein the code that causes the one or more processors to determine a jitter compensation value for each jitter threshold comprises code that causes the one or more processors to:
Identifying a voltage value for each jitter threshold; and
Noise at each jitter threshold is determined.
4. The test and measurement instrument of claim 2, wherein the code that causes the one or more processors to determine a jitter compensation value for each jitter threshold of the signal comprises code that causes the one or more processors to:
configuring the instrument to generate a static offset voltage at a voltage level or to receive an external signal;
measuring noise at the voltage level; and
The configuration and measurement is repeated to collect noise measurements at multiple voltage levels.
5. The test and measurement instrument of claim 4, wherein the one or more processors are further configured to save the noise measurement as a noise profile of the test and measurement instrument.
6. The test and measurement instrument of claim 4, wherein the code that causes the one or more processors to determine the jitter compensation value comprises code for: the noise measurements are converted into vertically induced jitter component values for each voltage level.
7. The test and measurement instrument of claim 6, wherein the code that causes the one or more processors to convert the noise measurements into vertically-induced jitter component values for each voltage level comprises code for: the one or more processors are caused to divide the noise measurement for each voltage level by the slew rate of the signal.
8. The test and measurement instrument of claim 1, wherein the jitter compensation value for each voltage level is specific to a particular set of control settings of the instrument.
9. The test and measurement instrument of claim 1, wherein the code that causes the one or more processors to determine the jitter compensation value comprises code for: the one or more processors are caused to access the saved noise profile of the test and measurement instrument.
10. A method, comprising:
Receiving, at a test and measurement instrument, a waveform signal from a Device Under Test (DUT) having a plurality of signal levels and a plurality of jitter thresholds; and
The measurement of each level of the waveform signal from the DUT is adjusted using the jitter compensation value for each level to produce a final measurement.
11. The method of claim 10, further comprising: a jitter compensation value is determined for each of the plurality of levels.
12. The method of claim 11, wherein determining a jitter compensation value for each level comprises:
identifying a voltage value for each jitter threshold; and
Noise at each jitter threshold is determined.
13. The method of claim 12, wherein determining a jitter compensation value for each level of the signal comprises:
Configuring the test and measurement instrument to generate a static offset voltage at a voltage level or to receive an external signal;
measuring noise at the voltage level; and
The configuration and measurement is repeated to collect noise measurements at multiple voltage levels.
14. The method of claim 13, further comprising saving the noise measurement as a noise profile of the test and measurement instrument.
15. The method of claim 11, wherein determining the jitter compensation value comprises converting the noise measurement into a vertically induced jitter component value for each level.
16. The method of claim 15, wherein converting the noise measurements to vertically induced jitter component values for each level comprises dividing the noise measurements for each level by a slew rate of the waveform signal.
17. The method of claim 11, wherein determining a jitter compensation value comprises accessing a saved noise profile of the test and measurement instrument.
18. The method of claim 1, wherein the jitter compensation value for each level is based on a particular set of control settings of the test and measurement instrument.
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