CN118328832A - Full-bridge strain gauge and resistance adjusting method thereof - Google Patents
Full-bridge strain gauge and resistance adjusting method thereof Download PDFInfo
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Abstract
The application discloses a full-bridge strain gauge and a resistance adjusting method thereof, comprising four sensitive grids and four bonding pads; four sensitive grids form a Wheatstone full-bridge structure, the four sensitive grids are respectively R1, R2, R3 and R4, a bonding pad is connected between every two sensitive grids through an edge grid, the four bonding pads are respectively a bonding pad A, a bonding pad B, a bonding pad C and a bonding pad D, the bonding pad A is connected with R1 and R4, the bonding pad B is connected with R1 and R2, the bonding pad C is connected with R2 and R3, the bonding pad D is connected with R3 and R4, the bonding pad AC is a strain gauge input end, and the bonding pad BD is a strain gauge output end; each sensitive gate comprises a main gate, an adjusting gate and a short-circuit resistor, the main gate is connected with a plurality of adjusting gates in series, and a plurality of short-circuit resistors are connected on the adjusting gates in parallel. According to the application, zero influence quantity of the single sensitive gate on the resistance zero of the strain gauge of the full bridge sheet can be realized through deduction of the zero relation of the resistance of the single sensitive gate on the resistance of the strain gauge of the full bridge sheet, and the optimal combination of resistance adjustment can be realized rapidly during resistance adjustment.
Description
Technical Field
The invention belongs to the field of strain gauges, and relates to a full-bridge strain gauge and a resistance adjusting method thereof.
Background
The strain gauge is widely applied to the weighing apparatus industry and the consumer electronics industry as a transducer capable of converting strain on engineering components into resistance change, the strain gauge is mainly formed by processes such as foil plate preparation, photoetching, corrosion, resistance adjustment and the like, and as the structural differences exist between the technical defects such as photoetching, corrosion and the like and the structural structures of the foil plates of the strain gauge, the uniformity and consistency of sensitive grids of the strain gauge cannot be ensured after the foil plates of the strain gauge are corroded, and therefore, a certain difference exists between the strain gauge resistance after corrosion and the nominal resistance of the strain gauge, generally, the corrosion resistance is about 80% -90% of the nominal resistance, and therefore, in order to ensure that the strain gauge resistance meets the precision requirement, the strain gauge resistance needs to be adjusted to the nominal resistance.
Because the resistance adjustment is realized mainly by reducing the cross section of the sensitive grid due to the structural reason of the current strain gauge, the adjustment resistance and the removal amount of the sensitive grid are not calculated due to the adoption of a follow-up comparison method (namely resistance adjustment and resistance acquisition) in the adjustment process, so that the resistance is scrapped due to overlarge adjustment deviation in the resistance adjustment of the strain gauge, and the high-precision control cannot be realized; in addition, the full-bridge strain gauge is provided with 4 sensitive grids, and the cross section area of each grid cannot be ensured to be uniform in the resistance adjustment process, so that the strain gauge resistance is scattered excessively, and when zero adjustment is carried out, a certain grid is independently processed, and further the uniformity difference of the sensitive grids is excessively large. The strain gauge after resistance adjustment has higher requirements on a circuit used by a customer, the resistance and zero dispersion degree are larger, the resistance range is generally 10% -15%, the accurate control cannot be realized, the processing capacity of the strain gauge resistance and the zero process is difficult to reach CPK1.33, and the CPK can only be close to 0.6.
Disclosure of Invention
The invention aims to overcome the defects of poor resistance adjustment precision and high defects in the prior art, and provides a full-bridge strain gauge and a resistance adjustment method thereof, which are used for improving the resistance adjustment efficiency, improving the resistance adjustment precision and ensuring that the sectional area of each grid is uniform.
In order to achieve the purpose, the invention is realized by adopting the following technical scheme:
a full bridge strain gauge includes four sensitive gates and four bonding pads;
Four sensitive grids form a Wheatstone full-bridge structure, the four sensitive grids are respectively R1, R2, R3 and R4, a bonding pad is connected between every two sensitive grids through an edge grid, the four bonding pads are respectively a bonding pad A, a bonding pad B, a bonding pad C and a bonding pad D, the bonding pad A is connected with R1 and R4, the bonding pad B is connected with R1 and R2, the bonding pad C is connected with R2 and R3, the bonding pad D is connected with R3 and R4, the bonding pad AC is a strain gauge input end, and the bonding pad BD is a strain gauge output end;
each sensitive gate comprises a main gate, an adjusting gate and a short-circuit resistor, the main gate is connected with a plurality of adjusting gates in series, and a plurality of short-circuit resistors are connected on the adjusting gates in parallel.
Preferably, the main gate resistance value accounts for 65% -85% of the nominal resistance, and the adjusting gate resistance value accounts for 2% -20% of the nominal resistance.
Preferably, an insulating substrate is arranged below the sensitive grids and the bonding pads, four sensitive grids and four bonding pads are arranged on the top surface of the insulating substrate, two sensitive grids are positioned on the upper edge of the insulating substrate, the other two sensitive grids are positioned on the lower edge of the insulating substrate, and four bonding pads are positioned between the upper sensitive grid and the lower sensitive grid side by side.
Further, the insulating substrate is provided with a shape-modifying frame and MARK points; the shape-modifying frame is positioned at four end points of the insulating substrate; MARK points are located on both sides of the bonding pad and the upper and lower sensitive gates.
The resistance adjusting method of the full-bridge strain gauge comprises the following steps:
measuring a pad AC resistance Re, a pad BD resistance Rs, a pad AB resistance R AB, a pad BC resistance R BC, a pad CD resistance R CD, a pad DA resistance R DA, and measuring a strain gauge zero position;
calculating resistance values of sensitive gates R1, R2, R3 and R4 according to the resistance values;
Judging whether Re and Rs belong to a resistance adjustment range or not according to the zero position receiving range of the strain gauge receiving resistance range Rb+/-a%, and performing a resistance adjustment process when the strain gauge meets Re and Rs epsilon (Rx-Ry) omega, and discarding resistance adjustment if not, wherein Rx is the lower limit of the strain gauge resistance and Ry is the upper limit of the strain gauge resistance;
if the zero position is more than 0 and more than b, R1 and R3 are required to be adjusted, if R1 is more than R3, R3 is adjusted, otherwise R1 is adjusted;
If the zero position is less than 0 and less than-b, R2 and R4 are required to be adjusted, if R2 is more than R4, R4 is adjusted, otherwise R2 is adjusted;
When the zero adjustment meets the range of 0+/-b, determining Re and Rs epsilon Rb+/-a, stopping adjusting resistance if the zero adjustment meets the range, and synchronously adjusting the same unregulated adjusting grids in R1, R2, R3 and R4 if the zero adjustment does not meet the range.
Preferably, rx=rb (1-a%) -RT, RT is the regulation gate resistance.
Preferably, the adjustment value Rt when adjusting the resistance of R1 or R3 is:
the adjustment value Rt when adjusting the R2 or R4 resistance is:
preferably, the strain gauge input resistance Re has the following relation:
The relation of the gauge output resistance Rs is:
The relationship of R AB is:
The relationship of R BC is:
The relationship of R CD is:
the relationship of R DA is:
Input voltage V 0 is connected to the strain gauge pad A, C, voltage DeltaV is output at the point of the measurement pad B, D, and the relation is as follows:
The strain gauge zero position is collected at the same time at the strain gauge pad A, B, C, D, and the relation is as follows:
Assuming R 1＝R2＝R3＝R4＝R0, derive:
Re＝Rs＝R0
△V＝0
Zero Blance＝0mV/V
The resistance values of R1, R2, R3 and R4 are deduced from the above-mentioned simultaneous relations.
Preferably, when the same unregulated regulation gates in R1, R2, R3 and R4 are synchronously regulated, the amplification value of the regulation gate is infinitely close to |Rb-Re|.
Preferably, if Re, rs ε (Rx Ry) Ω are not met, the strain gauge is marked as reject.
Compared with the prior art, the invention has the following beneficial effects:
According to the full-bridge strain gauge, through the design of the short-circuit resistor, only the adjusting grid can be adjusted, the resistance adjusting efficiency is greatly improved, the main grid is not influenced, the cross section area of the sensitive grid is not changed, and the influence of the resistance adjusting on the sensitive grid is reduced. The range of the full bridge resistance can be controlled within +/-0.1% -1% by selectively adjusting the resistance of the adjusting grid, and the strain gauge resistance and zero dispersion CPK are more than 1.33.
Furthermore, the zero position relation deduction of the single sensitive gate resistance to the resistance of the full-bridge strain gauge can realize the zero position influence quantity of the single sensitive gate to the resistance of the strain gauge, and the optimal combination of resistance adjustment can be realized quickly when the resistance adjustment is realized.
Drawings
FIG. 1 is a schematic diagram of a full bridge wafer strain gauge of the present invention;
FIG. 2 is a schematic diagram of a strain gauge Wheatstone bridge access in accordance with the present invention;
FIG. 3 is a flow chart of a full bridge strain gauge resistance adjustment method of the present invention;
Fig. 4 is a schematic diagram of the full-bridge strain gauge of the present invention after resistance adjustment.
Wherein: 1-main grid, 2-adjusting grid, 3-short circuit resistor, 4-insulating substrate, 5-side grid, 6-bonding pad, 7-MARK point, 8-shape-modified frame and 9-sealing layer.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention; all other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that the words "front", "rear", "left", "right", "upper" and "lower" used in the following description refer to directions in the drawings, and the words "inner" and "outer" refer to directions toward or away from, respectively, the geometric center of a particular component.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.
As shown in fig. 1 and 2, the full bridge strain gauge according to the present invention comprises four sensitive gates and four pads 6.
Four sensitive grids form a Wheatstone full bridge structure, the four sensitive grids are respectively R1, R2, R3 and R4, a bonding pad 6 is connected between every two sensitive grids through an edge grid 5, the four bonding pads 6 are respectively bonding pad A, bonding pad B, bonding pad C and bonding pad D, which are called A, B, C and D for short, the bonding pad A is connected with R1 and R4, the bonding pad B is connected with R1 and R2, the bonding pad C is connected with R2 and R3, the bonding pad D is connected with R3 and R4, the bonding pad AC is a strain gauge input end, and the bonding pad BD is a strain gauge output end.
Four sensitive grids and four bonding pads 6 are all arranged on the top surface of the insulating substrate 4, two sensitive grids are arranged on the upper edge of the insulating substrate 4, the other two sensitive grids are arranged on the lower edge of the insulating substrate 4, and the four bonding pads 6 are arranged between the upper sensitive grid and the lower sensitive grid side by side.
Single sensitive gate structure and patent number: CN116105590a, patent name: the sensitive grid structure in the strain gauge resistance-regulating structure and the design method is the same, a part of the regulation grid 2 is designed in the sensitive grid, so that each grid resistance of the strain gauge can be conveniently controlled in a certain range through a physical/chemical resistance-regulating method after corrosion, CPK of each strain gauge resistance and zero position is more than 1.33, each sensitive grid comprises a main grid 1, the regulation grid 2 and a short circuit resistance 3, the main grid 1 is connected with a plurality of regulation grids 2 in series, and a plurality of short circuit resistances 3 are connected on the regulation grid 2 in parallel; the resistance value of the main grid 1 accounts for 65-85% of the nominal resistance (Rb); the resistors in the adjusting grid 2 are distributed by adopting an equal ratio/equal difference array design method, the amplifying resistance of the adjusting grid is calculated precisely, the resistance value of the adjusting grid 2 can account for 2% -20% of the nominal resistance, a plurality of short-circuit resistors 3 are connected into the strain gauge sensitive grid in a short-circuit mode, the more the number of the short-circuit resistors 3 is, the higher the adjusting precision is, and when the resistors are adjusted, the short-circuit resistors 3 are cut, so that the resistor amplifying adjustment is realized.
The insulating substrate 4 is provided with a shape-modifying frame 8 and MARK points 7; the shape-modified frame 8 is positioned at four end points of the insulating substrate 4; MARK points 7 are positioned on two sides of the bonding pad 6 and the upper and lower sensitive grids; both the modified border 8 and the MARK point 7 can be used as reference points.
The inter-pad AC resistance is the strain gauge input resistance Re, the inter-pad BD resistance is the strain gauge output resistance Rs, the inter-pad AB resistance is R AB, the inter-pad BC resistance is R BC, the inter-pad CD resistance is R CD, and the inter-pad DA resistance is R DA.
The invention also discloses a resistance adjusting method of the full-bridge strain gauge, which comprises the following specific processes:
a) The strain gauge pad A, C resistance Re, pad B, D resistance Rs, pad A, B resistance R AB, pad B, C resistance R BC, pad C, D resistance R CD, pad D, A resistance R DA were measured, and the strain gauge null (Zero blank) was measured.
The resistance between bonding pads AC is determined as strain gauge input resistance Re, and the relation is as follows:
The resistance between pads BD is determined as a strain gauge output resistance Rs, and the relation is:
The resistance between pads AB is determined to be R AB, and the relation is as follows:
the resistance between the bonding pads BC is determined to be R BC, and the relation is as follows:
the inter-pad CD resistance is determined to be R CD, which is related to:
The inter-pad DA resistor is determined to be R DA, and the relation is as follows:
Input voltage V 0 is connected to the strain gauge pad A, C, voltage DeltaV is output at the point of the measurement pad B, D, and the relation is as follows:
strain gauge Zero bits (Zero blank) are collected simultaneously at strain gauge pads A, B, C, D in mV/V, with the relationship:
Assuming R 1＝R2＝R3＝R4＝R0, it can be deduced that:
Re＝Rs＝R0
△V＝0
Zero Blance＝0mV/V
b) The resistance values of R1, R2, R3 and R4 are deduced from the above-mentioned simultaneous relations.
C) If the strain gauge receives a resistance range rb±a%, the Zero (Zero blank) receiving range is 0±b, where Rb is the nominal resistance, a% is the resistance allowable error value, and b is the Zero allowable error value.
D) Judging whether Re and Rs belong to a resistance adjustment range, and if the measured strain gauge meets Re and Rs epsilon (Rx-Ry) omega, performing a resistance adjustment process, wherein Rx is the lower limit of strain gauge resistance reception (namely: rb (1-a%) -RT, where RT is the tuning gate 2 resistance, ry is the gauge resistance upper limit, and if not, the tuning is discarded and the gauge is marked as reject.
1) And (3) carrying out Zero adjustment on the strain gauge by judging the resistance magnitude relation of R1, R2, R3 and R4, namely judging the positive and negative relation of R 2R4-R1R3 by utilizing Zero Blance.
2) If the zero position is more than 0 and is larger than the zero position control upper limit value, namely b, R1 and R3 are required to be adjusted, and if R1 is more than R3, R3 is adjusted, wherein the adjusting value is Rt, and the same is true.
3) If the zero position is less than 0 and less than the zero position control lower limit value, namely-b, R2 and R4 are required to be adjusted, if R2 is more than R4, R4 is adjusted, wherein the adjusting value is Rt, and the same is true;
4) When the zero adjustment meets the range of 0+/-b, re and Rs epsilon Rb+/-a%, stopping adjusting resistance if the zero adjustment meets the range, and adjusting the common unregulated adjusting grids 2 in the four sensitive grids by judging whether the same adjusting grids 2 are arranged in the R1, the R2, the R3 and the R4 and synchronously adjusting the same, wherein the selecting of the adjusting grids 2 can be selectively adjusted according to the relation between Re, rs and the R1, the R2, the R3 and the R4, so that the dispersity CPK of the resistor is more than 1.33, namely the amplified value of the adjusting grid 2 is infinitely close to |Rb-Re|, the common unregulated adjusting grids 2 in the four sensitive grids are adjusted, and the adjusted resistance values of the four sensitive grids are the same.
When the resistor is regulated in the process, the corresponding short-circuit resistor 3is cut according to the regulating value, so that the resistor is amplified and regulated.
According to the full-bridge strain gauge resistance regulating device, through the design of the short circuit resistor 3, the resistance regulating efficiency is greatly improved by only regulating the regulating grid 2, the influence on the main grid 1 is avoided, the cross section area of the sensitive grid is not changed, the influence of the resistance regulating on the sensitive grid is reduced, in addition, the zero influence quantity of the single sensitive grid on the strain gauge resistance zero position of the full-bridge sheet can be realized by deducing the zero position relation of the single sensitive grid on the strain gauge resistance of the full-bridge sheet, the optimal resistance regulating combination is realized quickly, the full-bridge resistance range can be controlled within +/-0.1% -1% by selectively regulating the regulating grid 2, and the strain gauge resistance and the zero position dispersion CPK are more than 1.33.
Embodiment one: 1000 omega full-bridge strain gauge for consumer electronics
As shown in FIG. 1, a strain gauge for consumer electronics is designed, the nominal resistance is 1000 omega, the receiving resistance range is 1000+/-1%, and the zero receiving control range is +/-0.38 mV/V;
a) 1/4 bridge sensitive gate design:
1) The resistance of the 1/4 bridge sensitive grid is designed to be 70-75% of nominal resistance, wherein the resistance of the main grid 1 accounts for 88-97%, namely 670-720 omega, the resistance of the adjusting grid 2 accounts for 3-12%, namely the resistance is about 20-80 omega, and 10 adjusting grids 2 are designed.
2) The first-gear resistance RZ of the adjusting grid 2 accounts for 1% -4% of the nominal resistance, and m is taken for exponential scaling, namely m (n-1) is RZ, and the specific table is shown in table 1; the theoretical adjustment precision of the resistor reaches 0.01%, the minimum gear is 0.08-0.3 omega, and the cumulative adjustment resistance value reaches about 22.37-74.54 omega, which is shown in table 1.
Table 1 full bridge 1000 omega strain gauge gear design
B) Full-bridge sensitive gate design: and mirroring the 1/4 bridge sensitive gate up and down by using the center line of the bonding pad 6 to obtain a 1/2 bridge sensitive gate, and forming a full bridge strain gauge by the 1/2 bridge according to the spacing of the 4 bonding pads 6 of the strain gauge in a bilateral symmetry manner.
C) As shown in fig. 3, the resistance adjustment method for the strain gauge is as follows:
1) The resistance adjusting device collects resistance values of Re, rs and R AB、RBC、RCD、RDA and Zero (Zero Blance);
2) The computer calculates R1, R2, R3 and R4 according to the analysis core of the acquired data, judges Re and Rs epsilon (990-RT-1010) omega, and adjusts resistance if the R1, R2, R3 and R4 meet the requirements and marks the R1, R2, R3 and R4 as waste products;
3) Judging the positive and negative values of Zero Blance; when Zero blanking is more than 0 and is more than 0.38mV/V, R1 and R3 are subjected to resistance adjustment, if R1 is more than R3, R3 is subjected to resistance adjustment, otherwise R1 is subjected to resistance adjustment, at the moment, a gear is selected according to the relation between the adjusting grid 2 and Zero position change to be zeroed, the sizes of R1 and R3 are compared at any time, and when Zero blanking is E (-0.38) mV/V, resistance adjustment is stopped.
4) R2 and R4 are regulated when Zero blanking is less than 0 and less than-0.38 mV/V, R4 is regulated when R2 is more than R4, R2 is regulated otherwise, at the moment, a gear is selected to be zeroed according to the relation between the regulating grid 2 and Zero position change, the sizes of R2 and R4 are compared at any time, and when Zero blanking is E (-0.38) mV/V, the regulation is stopped.
5) Re and Rs are acquired after zero adjustment of the strain gauge, re and Rs epsilon (990-1010) omega are judged, and resistance adjustment is stopped if the Re and Rs epsilon (990-1010) omega are satisfied, and the adjustment of the same gear/combined gear of R1, R2, R3 and R4 is not satisfied, so that the adjustment resistance value of each grid modulation is ensured to be consistent by simultaneously adjusting the same gear/combined gear, and the amplified resistance value after adjustment is ensured to satisfy Re and Rs epsilon (990-1010) omega.
And then the device moves according to the parameters such as the preset interval and the like, and resistance adjustment is carried out on the next strain gauge or the strain gauge of the next matrix unit. The above process is repeated, and the resistance value of each strain gauge can be adjusted to the target resistance, as shown in fig. 4.
FIG. 4 shows that by using the design and the resistance adjustment method, the resistance can be controlled between 1000+ -5Ω, see Table 2, the zero position can be controlled at+ -0.1 mV/mA, see Table 3, and the rest properties can be seen in Table 4 by covering the sealing layer 9 on the area outside the solder pad 6 by the full bridge 1000Ω strain gauge after the resistance adjustment sealing layer.
Table 2 full bridge 1000 Ω strain gauge dispersion
Table 3 zero dispersion of 1000 omega strain gauge of full bridge
Table 4 full bridge 1000 Ω ohm resistance performance test
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
It is to be understood that the above description is intended to be illustrative, and not restrictive. Many embodiments and many applications other than the examples provided will be apparent to those of skill in the art upon reading the above description. The scope of the present teachings should, therefore, be determined not with reference to the above description, but instead should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled. The disclosures of all articles and references, including patent applications and publications, are incorporated herein by reference for the purpose of completeness. The omission of any aspect of the subject matter disclosed herein in the preceding claims is not intended to forego such subject matter, nor should the applicant not be considered to be a part of the disclosed subject matter.
Claims (10)
1. A full bridge strain gauge, characterized by comprising four sensitive gates and four pads (6);
Four sensitive grids form a Wheatstone full-bridge structure, the four sensitive grids are respectively R1, R2, R3 and R4, a bonding pad (6) is connected between every two sensitive grids through an edge grid (5), the four bonding pads (6) are respectively a bonding pad A, a bonding pad B, a bonding pad C and a bonding pad D, the bonding pad A is connected with R1 and R4, the bonding pad B is connected with R1 and R2, the bonding pad C is connected with R2 and R3, the bonding pad D is connected with R3 and R4, the bonding pad AC is a strain gauge input end, and the bonding pad BD is a strain gauge output end;
each sensitive gate comprises a main gate (1), an adjusting gate (2) and a short-circuit resistor (3), the main gate (1) is connected with a plurality of adjusting gates (2) in series, and a plurality of short-circuit resistors (3) are connected on the adjusting gates (2) in parallel.
2. A full bridge strain gauge according to claim 1, wherein the main gate (1) resistance value is 65-85% of the nominal resistance and the adjustment gate (2) resistance value is 2-20% of the nominal resistance.
3. The full-bridge strain gauge according to claim 1, characterized in that an insulating substrate (4) is arranged below the sensitive grids and the bonding pads (6), four sensitive grids and four bonding pads (6) are arranged on the top surface of the insulating substrate (4), two sensitive grids are positioned on the upper edge of the insulating substrate (4), the other two sensitive grids are positioned on the lower edge of the insulating substrate (4), and four bonding pads (6) are positioned between the upper and lower sensitive grids side by side.
4. A full bridge strain gauge according to claim 3, characterized in that the insulating substrate (4) is provided with a trimming frame (8) and MARK points (7); the shape-modifying frame (8) is positioned at four end points of the insulating substrate (4); MARK points (7) are positioned on two sides of the bonding pad (6) and the upper and lower sensitive grids.
5. A resistance adjusting method based on the full-bridge strain gauge as claimed in any one of claims 1 to 4, comprising the following steps:
measuring a pad AC resistance Re, a pad BD resistance Rs, a pad AB resistance R AB, a pad BC resistance R BC, a pad CD resistance R CD, a pad DA resistance R DA, and measuring a strain gauge zero position;
calculating resistance values of sensitive gates R1, R2, R3 and R4 according to the resistance values;
Judging whether Re and Rs belong to a resistance adjustment range or not according to the zero position receiving range of the strain gauge receiving resistance range Rb+/-a%, and performing a resistance adjustment process when the strain gauge meets Re and Rs epsilon (Rx-Ry) omega, and discarding resistance adjustment if not, wherein Rx is the lower limit of the strain gauge resistance and Ry is the upper limit of the strain gauge resistance;
if the zero position is more than 0 and more than b, R1 and R3 are required to be adjusted, if R1 is more than R3, R3 is adjusted, otherwise R1 is adjusted;
If the zero position is less than 0 and less than-b, R2 and R4 are required to be adjusted, if R2 is more than R4, R4 is adjusted, otherwise R2 is adjusted;
When the zero adjustment meets the range of 0+/-b, re and Rs epsilon Rb+/-a are judged, the resistance adjustment is stopped if the zero adjustment meets the range, and the same unregulated adjusting grid (2) in R1, R2, R3 and R4 is synchronously adjusted if the zero adjustment does not meet the range.
6. The full bridge strain gage resistance adjustment method of claim 5, wherein Rx = Rb (1-a%) -RT, RT is the adjustment gate (2) resistance.
7. The method of claim 5, wherein the adjustment value Rt for adjusting the resistance of R1 or R3 is:
the adjustment value Rt when adjusting the R2 or R4 resistance is:
8. The full-bridge strain gage resistance adjustment method according to claim 5, wherein the strain gage input resistance Re is expressed as:
The relation of the gauge output resistance Rs is:
The relationship of R AB is:
The relationship of R BC is:
The relationship of R CD is:
the relationship of R DA is:
Input voltage V 0 is connected to the strain gauge pad A, C, voltage DeltaV is output at the point of the measurement pad B, D, and the relation is as follows:
The strain gauge zero position is collected at the same time at the strain gauge pad A, B, C, D, and the relation is as follows:
Assuming R 1＝R2＝R3＝R4＝R0, derive:
Re＝Rs＝R0
△V＝0
Zero Blance＝0mV/V
The resistance values of R1, R2, R3 and R4 are deduced from the above-mentioned simultaneous relations.
9. The full-bridge strain gauge resistance adjusting method according to claim 5, wherein when the same unregulated adjusting gate (2) among R1, R2, R3, R4 is synchronously adjusted, the amplification value of the adjusting gate (2) is made to approach |rb-re| infinitely.
10. The method of claim 5, wherein if Re, rs e (Rx-Ry) Ω are not satisfied, the strain gauge is marked as reject.
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN118328832A true CN118328832A (en) | 2024-07-12 |
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