CN118259141A

CN118259141A - Receiving card testing method, testing tool, system and readable storage medium

Info

Publication number: CN118259141A
Application number: CN202410649615.0A
Authority: CN
Inventors: 樊光辉; 雷冯
Original assignee: Xian Novastar Electronic Technology Co Ltd
Current assignee: Xian Novastar Electronic Technology Co Ltd
Filing date: 2024-05-24
Publication date: 2024-06-28

Abstract

The application is suitable for the technical field of display and provides a receiving card testing method, a testing tool, a system and a readable storage medium. The receiving card is provided with N data output interfaces, the testing tool comprises N acquisition interfaces for being in butt joint with the data output interfaces, and N is an integer greater than or equal to 3; the receiving card testing method comprises the following steps: acquiring signal data of each data signal pin in the N data output interfaces through the acquisition interface in the process of controlling the display screen to display the test image by the receiving card; comparing the signal data of the same data signal pin among different data output interfaces to obtain the reference data of each data signal pin; and determining whether the data output interface and/or the receiving card has faults or not according to the comparison result between the signal data of each data signal pin and the reference data. The embodiment of the application can improve the convenience and the testing efficiency of the test of the receiving card and is convenient for testing the batchability.

Description

Receiving card testing method, testing tool, system and readable storage medium

Technical Field

The application belongs to the technical field of display, and particularly relates to a receiving card testing method, a testing tool, a system and a readable storage medium.

Background

The receiving card is a core device in a light-emitting diode (LED) display system, and is used for controlling the LED display screen to display a preset picture based on data from an upstream. Some known receiving cards transmit data signals and control signals to a downstream driving chip and a decoding chip through a high-density interface; when the carrying capacity of the receiving card is greater than the processing capacity of a group of driving chips and decoding chips, a plurality of high-density interfaces are often arranged for the receiving card, and each high-density interface is matched with a group of driving chips and decoding chips to light a local area.

In order to ensure that the LED display screen displays content or effects are normal, it is often necessary to test the receiving card at the factory. In some known methods, waveform data of each pin is obtained, and then the waveform data is compared with preset reference data, and whether the pin is normal or not is judged according to a comparison result. However, the labor intensity of the test is huge due to the reasons of more high-density interfaces on the receiving card, more pins in each high-density interface, the need of testing each pin under a plurality of gray scales, and the like.

Disclosure of Invention

The embodiment of the application provides a receiving card testing method, a testing tool, a system and a readable storage medium, which can improve the convenience of receiving card testing and facilitate batch testing.

The first aspect of the embodiment of the application provides a receiving card testing method, which is used for a receiving card testing system comprising a testing tool, wherein the receiving card is provided with N data output interfaces, and each data output interface comprises one or more data signal pins; the test fixture comprises N acquisition interfaces for being in butt joint with the data output interfaces, wherein the acquisition interfaces are used for acquiring signal data of the data signal pins in the data output interfaces, and N is an integer greater than or equal to 3; the receiving card testing method comprises the following steps: acquiring signal data of each data signal pin in N data output interfaces through the acquisition interface in the process that the receiving card controls the display screen to display a test image; comparing the signal data of the same data signal pin among different data output interfaces to obtain the reference data of each data signal pin, wherein the reference data of each data signal pin is the signal data with highest frequency of the data signal pin among N data output interfaces; and determining whether the data output interface and/or the receiving card has faults or not according to the comparison result between the signal data of each data signal pin and the reference data.

In some implementations of the first aspect, the determining whether the data output interface and/or the receiving card has a fault according to a comparison result between the signal data of each of the data signal pins and the reference data includes: comparing the signal data of each data signal pin with the corresponding reference data to obtain the data signal deviation amount of each data signal pin; and determining whether the data output interface and/or the receiving card has faults or not according to the data signal deviation amount and a preset first tolerance value.

In some implementations of the first aspect, the data signal offset includes an offset of each of the data signal pins within each frame when the receiving card controls the display screen to display a plurality of frames of the test image; the first tolerance value comprises a frame content limit value and a data frame tolerance value; the determining whether the data output interface and/or the receiving card has a fault according to the data signal deviation amount and a preset first tolerance value comprises the following steps: for each data signal pin, determining a total frame number with a deviation greater than the frame content limit; and if the total frame number corresponding to any one of the data signal pins is greater than the data frame tolerance value, determining that the data output interface and/or the receiving card has faults.

In some embodiments of the first aspect, the comparing the signal data of each data signal pin with the corresponding reference data to obtain a data signal offset of each data signal pin includes: determining the pulse number of each data signal pin according to the signal data of each data signal pin; determining the reference pulse number of each data signal pin according to the reference data of each data signal pin; and subtracting the pulse number of each data signal pin from the corresponding reference pulse number to obtain the data signal deviation amount of each data signal pin.

In some implementations of the first aspect, each of the data output interfaces includes one or more target signal pins; the target signal pin is a decoding signal pin or a control signal pin; the acquisition interface is also used for acquiring signal data of each target signal pin in each data output interface; the receiving card testing method further comprises the following steps: acquiring signal data of each target signal pin in N data output interfaces through the acquisition interface in the process that the receiving card controls the display screen to display the test image; and determining whether the data output interface and/or the receiving card has faults or not according to the signal data of each target signal pin and a preset second tolerance value.

In some implementations of the first aspect, the second tolerance value includes an upper limit value and a lower limit value; the determining whether the data output interface and/or the receiving card has a fault according to the signal data of each target signal pin and a preset second tolerance value comprises the following steps: determining the pulse number of the target signal pins according to the signal data of each target signal pin; and if the pulse number of any one of the target signal pins is larger than the upper limit value or smaller than the lower limit value, determining that the data output interface and/or the receiving card has faults.

In some implementations of the first aspect, the method for testing a receiver card further includes: acquiring an image switching frequency, wherein the image switching frequency is used for controlling the display screen to switch and display among a plurality of test images; and sending the image switching frequency to the receiving card.

In some embodiments of the first aspect, a plurality of the test images include a plurality of images therein, the images of different species differing in at least one of color, gray scale, pattern, and gray scale.

In some implementations of the first aspect, the method for testing a receiver card further includes: determining the number of times of screen blacking of the display screen in the process of displaying a plurality of test images according to the signal data of each data signal pin; and if the number of the black screen times is larger than a preset black screen tolerance, determining that the data output interface and/or the receiving card has faults.

In some implementations of the first aspect, the acquiring, by the acquisition interface, signal data of each of the data signal pins in the N data output interfaces includes: acquiring a preset sampling frame rate and sampling duration; and controlling the acquisition interface to detect the sampling duration of the signal data of each data signal pin according to the sampling frame rate.

A second aspect of the embodiment of the present application provides a receiving card testing device, configured to be used in a receiving card testing system including a testing tool, where the receiving card has N data output interfaces, and each data output interface includes one or more data signal pins; the test fixture comprises N acquisition interfaces for being in butt joint with the data output interfaces, wherein the acquisition interfaces are used for acquiring signal data of the data signal pins in the data output interfaces, and N is an integer greater than or equal to 3; the receiving card testing device comprises: the acquisition unit is used for acquiring signal data of each data signal pin in the N data output interfaces through the acquisition interface in the process of controlling the display screen to display the test image by the receiving card; the determining unit is used for comparing the signal data of the same data signal pin among different data output interfaces to obtain the reference data of each data signal pin, wherein the reference data of each data signal pin is the signal data with highest occurrence frequency of the data signal pin among N data output interfaces; and the test unit is used for determining whether the data output interface and/or the receiving card has faults or not according to the comparison result between the signal data of each data signal pin and the reference data.

A third aspect of the embodiment of the present application provides a test fixture, including a memory, a processor, and a computer program stored in the memory and capable of running on the processor, where the processor implements the steps of the method for testing a receiving card according to any one of the first aspect when executing the computer program.

The fourth aspect of the embodiment of the application provides a receiving card testing system, which comprises a testing tool and an upper computer in communication connection with the testing tool; the receiving card is provided with N data output interfaces, and each data output interface comprises one or more data signal pins; the test fixture comprises N acquisition interfaces for being in butt joint with the data output interfaces, wherein the acquisition interfaces are used for acquiring signal data of the data signal pins in the data output interfaces, and N is an integer greater than or equal to 3; the upper computer is used for controlling the test tool; the test fixture is used for realizing the steps of the receiving card test method according to the first aspect.

A fifth aspect of an embodiment of the present application provides a computer-readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method for testing a receiver card according to any one of the first aspects.

A sixth aspect of the embodiments of the present application provides a computer program product, which when run on a test fixture, causes the test fixture to perform the steps of the method for testing a receiver card described in the first aspect.

In the embodiment of the application, in the process of controlling the display screen to display the test image by the receiving card, the signal data of each data signal pin in the N data output interfaces are acquired through the acquisition interface, the signal data of the same data signal pin among different data output interfaces are compared to obtain the reference data of each data signal pin, the reference data of each data signal pin is the signal data with highest frequency of the data signal pin among the N data output interfaces, and then whether the data output interfaces and/or the receiving card have faults is determined according to the comparison result of the signal data of each data signal pin and the reference data, the test waveforms of each pin on each data output interface are not required to be acquired one by one, and the test waveforms are also not required to be compared with the preset reference waveforms, so that the convenience and the test efficiency of the test of the receiving card are improved, and the test of batch property is facilitated.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a test system for a receiving card according to an embodiment of the present application;

FIG. 2 is a schematic diagram of a receiver card according to an embodiment of the present application;

Fig. 3 is a schematic implementation flow chart of a method for testing a receiving card according to an embodiment of the present application;

FIG. 4 is a first schematic diagram of a software interface provided by an embodiment of the present application;

Fig. 5 is a schematic diagram of a specific implementation flow of controlling a receiving card to punch a chart according to an embodiment of the present application;

FIG. 6 is a schematic diagram of a first implementation flowchart for determining whether a data output interface and/or a receiving card has a fault according to an embodiment of the present application;

FIG. 7 is a schematic diagram of a second implementation flowchart for determining whether a data output interface and/or a receiving card has a fault according to an embodiment of the present application;

FIG. 8 is a schematic diagram of a third implementation flowchart for determining whether a data output interface and/or a receiving card has a fault according to an embodiment of the present application;

FIG. 9 is a second schematic diagram of a software interface provided by an embodiment of the present application;

Fig. 10 is a schematic structural diagram of a receiving card testing device according to an embodiment of the present application;

Fig. 11 is a schematic structural diagram of a test fixture according to an embodiment of the present application.

Detailed Description

The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application. All other embodiments, which can be made by a person skilled in the art without any inventive effort, are intended to be protected by the present application based on the embodiments of the present application.

It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

In the description of the present specification and the appended claims, the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and are not to be construed as indicating or implying relative importance.

Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.

In view of this, the application provides a method for testing a receiving card, which can save the process of presetting reference data for each data signal pin, thereby improving the convenience of testing the receiving card and facilitating the batch test in the production environment.

In order to illustrate the technical scheme of the application, the following description is made by specific examples.

Referring to fig. 1, fig. 1 illustrates a receiving card testing system 10 according to an embodiment of the application. The receive card test system 10 may be used to perform fault testing of the data output interface and/or the receive card.

As shown in fig. 2, the receiving card 20 has a receiving card circuit 21 and N data output interfaces 22.N is an integer greater than or equal to 3, and is exemplified by 8 in fig. 2. Each data output interface 22 includes one or more pins 221. In an embodiment of the present application, pin 221 of each data output interface 22 may include one or more data signal pins. Also, in some embodiments, pin 221 of each data output interface 22 may also include one or more decode signal pins, one or more control signal pins. Illustratively, the data signal pins may be 6, R1, G1, B1, R2, G2, B2 pins, respectively. The control signal pins may be 3, namely Clock signal (Dot Clock, dclk), latch signal (Latch, lat) and Enable signal (Output Enable, OE) pins. The number of decoding signal pins can be 5 and is A, B, C, D, E pins respectively.

Specifically, the data output interface may be used to connect with a display screen, and transmit a desired signal to the display screen. The data output interface can be a simple cow mouth or other types of transmission interfaces, and the application is not limited in this way. The data signal pin in the data output interface may be used to transmit a data signal to be displayed by the display screen, for example, may be referred to as R, G, B signal pin. It will be appreciated that the number of data signal pins within a single data output interface may be one or more, and that when there are multiple data signal pins, the number of single data signal pins may be one or more. For example, there may be multiple sets of R, G, B signal interfaces within a single data output interface, denoted as R1, G1, B1, R2, G2, B2, … ….

The receiver card test system 10 may include a test fixture 101 and a host computer 102 communicatively coupled to the test fixture 101.

The upper computer 102 may be used to control the test tool 101, and transmit related data or instructions to the test tool 101 to implement the test of the receiving card.

The test fixture 101 may include N acquisition interfaces for interfacing with the data output interfaces, where the acquisition interfaces may be used to obtain signal data from each data signal pin in each data output interface. The test tool 101 may be used for executing the test method for the receiving card provided by the present application under the control of the host computer 102 to test the data output interface and/or the receiving card.

It should be noted that the receiving card testing system 10 may further include other components besides the testing tool 101 and the host computer 102 shown in fig. 1. For example, the aforementioned receiver card and display screen may be part of receiver card test system 10. For another example, the receiver card testing system 10 may also include components such as a transmitter card, a splice wall, and the like. The application is not limited in this regard.

Fig. 3 is a schematic flow chart of an implementation of a method for testing a receiving card according to an embodiment of the present application, where the method may be applied to the receiving card testing system 10. Specifically, the method for testing the receiving card can be implemented by the test tool 101 alone or by a combination of the test tool 101 and the host computer 102, which is not a limitation of the present application.

Specifically, the method for testing a receiving card may include the following steps S301 to S303.

Step S301, in the process of controlling the display screen to display the test image by the receiving card, acquiring signal data of each data signal pin in the N data output interfaces through the acquisition interface.

In the embodiment of the application, in order to test the receiving card, the display screen is controlled to be lightened by the receiving card so as to detect the validity of the function of the receiving card. The test image is an image for lighting the display screen, and the content of the image can be selected according to actual requirements, so that the application is not limited. In some embodiments of the present application, the receiving card may perform mapping under the control of the host computer 102 to control the display screen to display the test image. After the drawing starts, the upper computer 102 can control the test tool 101 to start collecting data. The test fixture 101 obtains data of the N data output interfaces through the N acquisition interfaces in a one-to-one correspondence, and signal data of each data signal pin is included in the data of each data output interface.

Step S302, comparing the signal data of the same data signal pin among different data output interfaces to obtain the reference data of each data signal pin.

In an embodiment of the application, the data signal pins between different data output interfaces are identical. In order to obtain the reference data, the signal data of the same data signal pin between different data output interfaces can be compared. The reference data of each data signal pin is the signal data of the data signal pin with the highest frequency between the N data output interfaces. The reference data of each data signal pin is a standard for comparison with the data of the corresponding data signal pin.

For example, each data output interface includes six data signal pins R1, G1, B1, R2, G2, B2. And comparing the signal data of R1 among the data output interfaces. Assuming that three Data output interfaces exist, the signal Data of the first Data output interface R1 is Data1, the signal Data of the second Data output interface R1 is Data1, and the signal Data of the third Data output interface R1 is Data2, since Data1 occurs most frequently, data1 will be the reference Data of R1.

Step S303, determining whether a data output interface and/or a receiving card has a fault or not according to the comparison result between the signal data of each data signal pin and the reference data.

In the embodiment of the application, the signal data of each data signal pin can be compared with the corresponding reference data to obtain the comparison result of each data signal pin. For example, for each data output interface, the signal data of R1 may be compared with the reference data of R1, and the signal data of R2 may be compared with the reference data of R2. And then, according to the comparison result of the pins of each data signal, determining whether the data output interface and/or the receiving card has faults. Specifically, in some embodiments of the present application, if the deviation between the signal data of each data signal pin and the corresponding reference data is within the allowable error range, it may be determined that there is no fault in the data output interface and/or the receiving card, otherwise, it may be determined that there is a fault in the data output interface and/or the receiving card.

Based on the comparison between the same data signal pins in each data output interface, the data output interface in which the abnormal data signal pin is located can be further considered to be abnormal, and the receiving card can be further determined to be abnormal. In practical use, the user may select that the specific determination result is that the specific data output interface is abnormal or the receiving card is abnormal, which is not particularly limited in this embodiment.

In the embodiment of the application, in the process of controlling the display screen to display the test image by the receiving card, the signal data of each data signal pin in the N data output interfaces are acquired through the acquisition interface, the signal data of the same data signal pin among different data output interfaces are compared to obtain the reference data of each data signal pin, the reference data of each data signal pin is the signal data with highest frequency of the data signal pin among the N data output interfaces, and then whether the data output interfaces and/or the receiving card have faults is determined according to the comparison result of the signal data of each data signal pin and the reference data, the test waveforms of each pin on each data output interface are not required to be acquired one by one, and the test waveforms are also not required to be compared with the preset reference waveforms, so that the convenience and the test efficiency of the receiving card test are facilitated, and the batch test is facilitated.

It can be understood that the manufacturing process of the receiving card is relatively mature, and the probability of defects or faults of each data output interface and each pin produced is low, but in order to ensure the final display quality, the data output interfaces and each pin have to be tested one by one, which is time-consuming, labor-consuming and low in efficiency, and the cost is indirectly increased. Based on the foregoing, the embodiment of the present application adopts "minority-compliant majority" judgment logic, defaults that pins with the same or close to the same data are normal pins, and output data thereof are normal data, while a minority of pins which are different or have a larger difference are judged to be abnormal data, and the pins thereof are abnormal pins, in which case the number of data output interfaces on the receiving card should not be less than 3. Because the probability of flaw or fault pins is low, the test method of the embodiment of the application is still very reliable, and the reliability of the test result is considered while the test efficiency is greatly improved.

For example, referring to FIG. 4, the receiving card under test has a total of 7 data output interfaces numbered 1-7, each of which includes R1, G1, B1, R2, G2, B2 6 data signal pins. Because the G2 pin in the data output interface with the number of 6 has larger signal difference with the G2 pin in the other 6 data output interfaces, the fault is judged according to the principle of 'minority compliance majority'; and signals of other 5 data signal pins in the 7 data output interfaces are close to or identical to each other, and the pins are judged to be normal. According to the inventive concept, it is determined that the data output interface test numbered 6 is failed, is a failed data output interface, or that the entire receiving card is failed.

In some embodiments of the present application, as shown in fig. 5, the receiving card testing method may further include steps S501 to S502.

In step S501, an image switching frequency is acquired.

The image switching frequency can be used for controlling the display screen to switch and display among a plurality of test images. The obtaining mode of the image switching frequency can be selected according to actual situations, and in some embodiments of the present application, the upper computer 102 may send the image switching frequency input by the user in the software interface to the test fixture 101, or send the image switching frequency set by default to the test fixture 101.

Step S502, the image switching frequency is transmitted to the receiving card.

In some embodiments of the present application, after obtaining the image switching frequency, the test tool 101 may send the image switching frequency to the receiving card, so that the receiving card controls the display screen to switch between the plurality of test images according to the image switching frequency.

In order to facilitate testing of the functional condition of the receiving card under different working conditions, in some embodiments of the present application, multiple images may be included in multiple test images, where at least one of the colors, gray scales, patterns, and gray scales are different between the different images.

Wherein the colors may include, but are not limited to, red, blue, green. The pattern may include, but is not limited to, solid colors, stripes, gradations. The gray scale may be between 0 and 255. The gray levels may include, but are not limited to, gray level 64, 128, 258.

By way of example, the test image may include, but is not limited to: test image 1, pure red image, gray 128; test image 2, a pure green image, gray 128; test image 3, pure blue image, gray 128; a test image 4, an image composed of red stripes and white stripes, a gray scale 64; a test image 5 consisting of a green area and a white area, with a gray scale of 128; a test image 6 composed of a blue area and a white area, and a gradation 192; the test image 7 consists of white transverse stripes and white left oblique stripes, and the gray scale is 32; the test image 8 consists of white vertical stripes and white right oblique stripes, and has a gray level 224; test image 9, gradation image of gradation 192 to 256, gradation level 256; test image 10, gradation image of gradation 0 to 64, gradation level 256; test image 11, gradation image of gradation 0 to 256, gradation level 64. The receiving card can display the images in the above example in sequence within 4s according to the image switching frequency. Therefore, the full display range test of different gray scales, different patterns, different colors and different gray scale levels can be met, and the reliability of the test result is higher.

In some embodiments of the present application, acquiring signal data of each data signal pin in the N data output interfaces through the acquisition interface may include: acquiring a preset sampling frame rate and sampling time length, and controlling an acquisition interface to detect the sampling time length of signal data of each data signal pin according to the sampling frame rate.

For example, the acquisition interface may detect the signal data of each data signal pin for 2s at a frequency of once every 0.01 s. In this way, the sampling of the signal data can be performed according to the actual sampling requirements for the signal data.

In some embodiments of the present application, as shown in fig. 6, determining whether a data output interface and/or a receiving card has a fault according to a comparison result between signal data and reference data of each data signal pin may include steps S601 to S602.

In step S601, the signal data of each data signal pin is compared with the corresponding reference data to obtain the data signal deviation of each data signal pin.

Specifically, the signal data of each data signal pin may be compared with corresponding reference data in one or more dimensions. The dimensions of the alignment may include, but are not limited to: pulse condition, data content and data volume.

In some embodiments of the present application, the number of pulses of each data signal pin may be determined according to signal data of each data signal pin, and the number of reference pulses of each data signal pin may be determined according to reference data of each data signal pin. Then, the pulse number of each data signal pin is subtracted from the corresponding reference pulse number to obtain the data signal deviation amount of each data signal pin.

Thus, the signal data of each data signal pin can be compared with the corresponding reference data from the dimension of the pulse number, and the data signal deviation amount of each data signal pin can be obtained.

Step S602, determining whether a data output interface and/or a receiving card has a fault according to the data signal deviation amount and a preset first tolerance value.

The first tolerance value is the maximum allowable data deviation between the signal data of the data signal pin and the reference data. According to the data signal deviation and a preset first tolerance value, if the data signal deviation exceeds the first tolerance value, determining that a fault exists in the data output interface and/or the receiving card, wherein a data signal pin with the data signal deviation exceeding the first tolerance value is positioned in the data output interface with the fault. Otherwise, it may be determined that there is no failure of the data output interface and/or the receiving card.

In some embodiments of the present application, the data signal offset may include an offset of a respective data signal pin within each frame when the receiving card controls the display screen to display a plurality of test images.

Specifically, the receiving card can control the display screen to switch and display among a plurality of test images according to the image switching frequency, and in the process of switching and displaying, the acquisition interface detects the sampling time length of the signal data of each data signal pin according to the sampling frame rate. And acquiring the signal data once, and comparing the signal data with corresponding reference data to obtain the data signal deviation of each data signal pin in the frame.

Accordingly, the first tolerance value may include a frame content tolerance value and a data frame tolerance value. The frame content limit value indicates the allowable deviation amount of the single frame data signal, and the data frame tolerance value indicates the number of frames in the multi-frame data signal for which deviation is allowable.

At this time, determining whether the data output interface and/or the receiving card has a fault according to the data signal deviation amount and the preset first tolerance value may include: for each data signal pin, determining the total frame number with the deviation larger than the frame content limit value, and if the total frame number corresponding to any data signal pin is larger than the data frame content limit value, determining that the data output interface and/or the receiving card has faults. Wherein, the data signal pin with total frame number larger than the data frame tolerance value is positioned in the data output interface with fault.

If the total frame number corresponding to each data signal pin is smaller than or equal to the data frame tolerance value, determining that no fault exists in the data output interface and/or the receiving card.

For example, assuming that the frame content limit value is 1 and the data frame tolerance value is 2, the signal data of the 10-frame data signal pins R, G, B are collected in total in the above manner, and the signal data are compared with the reference data to obtain the deviation amounts of 10 frames of the data signal pins R, G, B. Within the 10 frames, if the total frame number of the data signal pin R deviation amount greater than the frame content limit value 1 is 0, the total frame number of the data signal pin G deviation amount greater than the frame content limit value 1 is 0, the total frame number of the data signal pin B deviation amount greater than the frame content limit value 1 is 1, and since the total frame number corresponding to the data signal pin R, G, B is less than or equal to the data frame tolerance value 2, it is determined that there is no malfunction of the data output interface and/or the receiving card. If the total frame number of the data signal pin R with the deviation larger than the frame content limit value 1 is 0, the total frame number of the data signal pin G with the deviation larger than the frame content limit value 1 is 0, and the total frame number of the data signal pin B with the deviation larger than the frame content limit value 1 is 3, the data transmission interface where the data signal pin B with the total frame number of 3 is located can be determined to have faults because the total frame number corresponding to the data signal pin B is larger than the data frame tolerance value 2, and the receiving card can also be determined to have faults.

In the embodiment of the application, the frame content limit value and the data frame tolerance value are set, so that the continuously collected multi-frame signal data can be analyzed to obtain the result of whether the data output interface and/or the receiving card has faults, and compared with the comparison of only single frame data, the detection result has higher reliability. And moreover, reference data do not need to be preset for the data signal pins, so that convenience in testing of the receiving card is improved, and batch testing is facilitated.

In some embodiments of the present application, each data output interface of the receiving card may include one or more target signal pins, which may be either decode signal pins or control signal pins.

The decoding signal pin is a pin for transmitting decoding signals, and may include, but is not limited to, A, B, C, D, E pins. The control signal pin is a pin for transmitting a control signal and may include, but is not limited to, a latch signal LAT pin, a clock signal Dclk pin, and an enable signal OE pin.

Accordingly, the receive card test system 10 may also test the target signal pins. Specifically, the acquisition interface may be further configured to acquire signal data of each target signal pin in each data output interface. As shown in fig. 7, the process of testing the target signal pin may include the following steps S701 to S702.

In step S701, in the process of controlling the display screen to display the test image by the receiving card, signal data of each target signal pin in the N data output interfaces are acquired through the acquisition interface.

Specifically, the receiving card may perform mapping under the control of the host computer 102 to control the display screen to display the test image. After the drawing starts, the upper computer 102 can control the test tool 101 to start collecting data. The test fixture 101 obtains data of the N data output interfaces through the N acquisition interfaces in a one-to-one correspondence, and signal data of each target signal pin is included in the data of each data output interface. The signal data of the target signal pin and the signal data of the data signal pin can be synchronously or asynchronously collected, and the application is not limited in this regard.

Step S702, determining whether the data output interface and/or the receiving card has a fault according to the signal data of each target signal pin and a preset second tolerance value.

Specifically, the second tolerance value may refer to a theoretical data range of the signal data of the target signal pin. When the signal data of the target signal pin exceeds a preset second tolerance value, the data output interface and/or the receiving card can be determined to have faults, otherwise, the data output interface and/or the receiving card can be determined to have no faults.

Specifically, in some embodiments of the present application, the second tolerance value may include an upper limit value and a lower limit value. At this time, determining whether the data output interface and/or the receiving card has a fault according to the signal data of each target signal pin and the preset second tolerance value may include: and determining the pulse number of the target signal pins according to the signal data of each target signal pin. If the pulse number of any one target signal pin is larger than the upper limit value or smaller than the lower limit value, determining that the data output interface and/or the receiving card has faults. The target signal pins with the pulse number larger than the upper limit value or smaller than the lower limit value are positioned in the data output interface with faults.

If the pulse number of each target signal pin is smaller than or equal to the upper limit value and larger than or equal to the lower limit value, determining that no fault exists in the data output interface and/or the receiving card.

Taking the clock signal Dclk pin as an example, the upper and lower values may be 98370 and 98366, respectively. If the number of pulses derived from the signal data of the Dclk pin is 98368, it may be determined that there is no fault in the data output interface and/or the receiving card. If the pulse number obtained according to the signal data of the Dclk pin is 98380, the data output interface where the Dclk pin with the pulse number of 98380 is located can be determined to have faults, and the receiving card can also be determined to have faults.

In other embodiments of the present application, the second tolerance value may include a target frame number tolerance value, an upper limit value, and a lower limit value. The signal data of each target signal pin can comprise signal data in each frame when the receiving card controls the display screen to display a plurality of frames of test images.

At this time, determining whether the data output interface and/or the receiving card has a fault according to the signal data of each target signal pin and the preset second tolerance value may include: and determining the pulse number of the target signal pins in each frame according to the signal data of each target signal pin. For each target signal pin, a total number of frames with the number of pulses greater than an upper limit value or less than a lower limit value is determined. If the total frame number is greater than the target frame number tolerance value, determining that the data output interface and/or the receiving card have faults. If the total frame number is smaller than or equal to the target frame number tolerance value, determining that no fault exists in the data output interface and/or the receiving card. Wherein, the target signal pin with the total frame number larger than the target frame number tolerance value is positioned in the data output interface with faults.

For example, assume that the target frame number tolerance value is 2. If the total frame number of the Dclk pin with the pulse number larger than the upper limit value or smaller than the lower limit value is 3, determining that the data output interface and/or the receiving card has faults. If the total frame number of the Dclk pin with the pulse number larger than the upper limit value or smaller than the lower limit value is 1, determining that no fault exists in the data output interface and/or the receiving card.

Therefore, the continuously collected multi-frame signal data can be analyzed to obtain the result of whether the receiving card has faults or not, and compared with the comparison of single-frame data, the detection result has higher reliability.

In other embodiments of the present application, as shown in fig. 8, the method for testing a receiving card may further include the following steps S801 to S802.

Step S801, according to the signal data of each data signal pin, determining the number of times of black screen of the display screen in the process of displaying a plurality of test images.

Specifically, by continuously collecting signal data, in each time signal data is collected, if the signal data of each data signal pin is 0, it can be confirmed that a black screen appears once. And counting the signal data of each frame to obtain the number of times of the screen blacking in the process of displaying a plurality of test images.

Step S802, if the number of times of the black screen is larger than a preset black screen tolerance, determining that a fault exists in the data output interface and/or the receiving card.

In the embodiment of the application, if the number of times of the black screen is smaller than or equal to the preset black screen tolerance, the receiving card can normally control the display screen to display, and then the data output interface and/or the receiving card can be determined to have no fault. If the number of times of the black screen is larger than the preset black screen tolerance, which indicates that the control function of the receiving card on the display screen is problematic, it can be determined that the data output interface connected with the display screen has a fault and/or the receiving card has a fault.

Considering that the process of controlling the display screen to display the test image can have a plurality of patterning modes, each patterning mode can set a corresponding black screen tolerance. According to the current pattern drawing mode, if the number of times of the black screen is larger than the black screen tolerance corresponding to the current pattern drawing mode, the fault of the data output interface and/or the receiving card can be determined.

The patterning manner may include, but is not limited to: drawing method 1: the buttons configured on the test tool 101 control the display screen to display test images and pattern drawing mode 2: the upper computer 102 controls the display screen to display the test image.

For example, the pattern 1 may set the corresponding black margin to 10, and the pattern 2 may set the corresponding black margin to 1. Assuming that the number of black screens is 3, if the current mapping mode is mapping mode 1, the number of black screens is smaller than the black screen tolerance 10 corresponding to the mapping mode 1, and it can be determined that the data output interface and/or the receiving card has no fault. If the current pattern drawing mode is pattern drawing mode 2, the number of times of the black screen is larger than the black screen tolerance 1 corresponding to the pattern drawing mode 2, and the data output interface and/or the receiving card can be determined to have faults.

In some embodiments, the above-described testing of the data signal pins, the decode signal pins, the control signal pins, and the black screen times may be integrated into the testing software of the host computer 102.

FIG. 9 shows a schematic of an interface of test software within which a user may input test parameters. The test parameters include, but are not limited to, the aforementioned first tolerance value, second tolerance value, image switching frequency, sampling duration, and black screen tolerance.

Specifically, in fig. 9, a control 91 is used to input frame content limits and data frame limits. For each data signal pin, the deviation of the number of pulses in each frame and the number of reference pulses can be determined, then the total frame number of which the deviation is larger than the frame content limit value is determined, and if the total frame number corresponding to any one data signal pin is larger than the data frame content limit value, the data output interface and/or the receiving card are determined to have faults. If the total frame number corresponding to each data signal pin is smaller than or equal to the data frame tolerance value, determining that no fault exists in the data output interface and/or the receiving card.

Controls within region 92 are used to input the upper and lower values of the control signal pins. Controls within region 93 are used to input the upper and lower values of the decode signal pins. Control 94 is used to input a target frame number tolerance value. For each target signal pin, the pulse number of the target signal pin in each frame can be determined according to the signal data of each target signal pin. For each target signal pin, a total number of frames with the number of pulses greater than an upper limit value or less than a lower limit value is determined. If the total frame number is greater than the target frame number tolerance value, determining that the data output interface and/or the receiving card have faults. If the total frame number is smaller than or equal to the target frame number tolerance value, determining that no fault exists in the data output interface and/or the receiving card.

Control 95 may be used to input a black screen margin value, which may be divided into a key black screen margin (corresponding to pattern 1 described above) and a data black screen margin (corresponding to pattern 2 described above). According to the current pattern drawing mode, if the number of times of the black screen is larger than the black screen tolerance corresponding to the current pattern drawing mode, the fault of the data output interface and/or the receiving card can be determined.

After obtaining the result of whether the data output interface and/or the receiving card has a fault, as shown in fig. 4, the upper computer 102 may display the result in the interface. For example, a failure of the data output interface and/or the receiving card may be indicated by "Fail" in the area 41, and a failure of the data output interface and/or the receiving card may be indicated by "OK".

In some embodiments of the present application, if the receiving card has a fault, the test tool 101 may further determine a fault pin according to the foregoing signal data, and the upper computer 102 displays information of the fault pin in the interface. The display mode can be as follows: marking with preset patterns or preset colors or prompting with text information.

For example, the columns in region 42 represent different data output interfaces and the columns represent different pins in the data output interfaces. For the data signal pin G2 of the data output interface with the number of 6, if the deviation between the number of pulses and the number of reference pulses is greater than the first tolerance value, the data signal pin G2 can be marked with a specific color, so as to distinguish the data signal pin from a normal pin, and assist a worker in locating a fault pin.

It should be noted that, for simplicity of description, the foregoing method embodiments are all described as a series of acts, but it should be understood by those skilled in the art that the present application is not limited by the order of acts described, as some steps may occur in other orders in accordance with the application.

Fig. 10 is a schematic structural diagram of a receiving card testing device 1000 according to an embodiment of the present application, where the receiving card testing device 1000 is configured on a testing tool 101.

Specifically, the receiving card testing apparatus 1000 may include:

the acquisition unit 1001 is configured to acquire signal data of each data signal pin in the N data output interfaces through the acquisition interface in a process that the receiving card controls the display screen to display a test image;

A determining unit 1002, configured to compare signal data of the same data signal pin between different data output interfaces to obtain reference data of each data signal pin, where the reference data of each data signal pin is signal data with highest occurrence frequency of the data signal pin between N data output interfaces;

And the test unit 1003 is configured to determine whether the data output interface and/or the receiving card has a fault according to a comparison result between the signal data of each data signal pin and the reference data.

In some embodiments of the application, the test unit 1003 may be configured to: comparing the signal data of each data signal pin with the corresponding reference data to obtain the data signal deviation amount of each data signal pin; and determining whether the data output interface and/or the receiving card has faults or not according to the data signal deviation amount and a preset first tolerance value.

In some embodiments of the present application, the data signal offset may include an offset of each data signal pin in each frame when the receiving card controls the display screen to display a plurality of frames of test images; the first tolerance value may include a frame content tolerance value and a data frame tolerance value; the test unit 1003 may be configured to: for each data signal pin, determining a total frame number with a deviation greater than the frame content limit; and if the total frame number corresponding to any one of the data signal pins is greater than the data frame tolerance value, determining that the data output interface and/or the receiving card has faults.

In some embodiments of the application, the test unit 1003 may be configured to: determining the pulse number of each data signal pin according to the signal data of each data signal pin; determining the reference pulse number of each data signal pin according to the reference data of each data signal pin; and subtracting the pulse number of each data signal pin from the corresponding reference pulse number to obtain the data signal deviation amount of each data signal pin.

In some embodiments of the application, the test unit 1003 may be configured to: acquiring signal data of each target signal pin in N data output interfaces through the acquisition interface in the process that the receiving card controls the display screen to display the test image; and determining whether the data output interface and/or the receiving card has faults or not according to the signal data of each target signal pin and a preset second tolerance value.

In some embodiments of the application, the second tolerance value may include an upper value and a lower value; the test unit 1003 may be configured to: determining the pulse number of the target signal pins according to the signal data of each target signal pin; and if the pulse number of any one of the target signal pins is larger than the upper limit value or smaller than the lower limit value, determining that the data output interface and/or the receiving card has faults.

In some embodiments of the present application, the receiving card testing apparatus 1000 may include a mapping unit for: acquiring an image switching frequency, wherein the image switching frequency is used for controlling the display screen to switch and display among a plurality of test images; and sending the image switching frequency to the receiving card.

In some embodiments of the present application, a plurality of images may be included within the plurality of test images, the at least one of color, gray scale, pattern, and gray scale being different between the different images.

In some embodiments of the application, the test unit 1003 may be configured to: determining the number of times of screen blacking of the display screen in the process of displaying a plurality of test images according to the signal data of each data signal pin; and if the number of the black screen times is larger than a preset black screen tolerance, determining that the data output interface and/or the receiving card has faults.

In some embodiments of the application, the acquisition unit 1001 may be configured to: acquiring a preset sampling frame rate and sampling duration; and controlling the acquisition interface to detect the sampling duration of the signal data of each data signal pin according to the sampling frame rate.

It should be noted that, for convenience and brevity of description, the specific working process of the receiving card testing apparatus 1000 may refer to the corresponding process of the method described in fig. 2 to 9, and will not be described herein again.

Fig. 11 is a schematic diagram of a test tool according to an embodiment of the present application. Specifically, the test fixture 101 may include: a processor 1010, a memory 1011, and a computer program 1012, such as a receive card test program, stored in the memory 1011 and executable on the processor 1010. The processor 1010 implements the steps of the above-described embodiments of the method for testing a receiving card when executing the computer program 1012, for example, steps S301 to S303 shown in fig. 3. Or the processor 1010, when executing the computer program 1012, performs the functions of the modules/units in the above-described device embodiments, for example, the functions of the acquisition unit 1001, the determination unit 1002, and the test unit 1003 shown in fig. 10.

The computer program may be partitioned into one or more modules/units that are stored in the memory 1011 and executed by the processor 1010 to accomplish the present application. The one or more modules/units may be a series of computer program instruction segments capable of performing a specific function for describing the execution of the computer program in the test fixture.

The test fixture may include, but is not limited to, a processor 1010, a memory 1011. It will be appreciated by those skilled in the art that fig. 11 is merely an example of a test fixture and is not meant to be limiting, and that more or fewer components than shown may be included, or certain components may be combined, or different components may be included, for example, the test fixture may further include input and output devices, network access devices, buses, etc.

The Processor 1010 may be a central processing unit (Central Processing Unit, CPU), or other general purpose Processor, digital signal Processor (DIGITAL SIGNAL Processor, DSP), application SPECIFIC INTEGRATED Circuit (ASIC), off-the-shelf programmable gate array or other programmable logic device, discrete gate or transistor logic device, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 1011 may be an internal storage unit of the test fixture, such as a hard disk or a memory of the test fixture. The memory 1011 may also be an external storage device of the test fixture, such as a plug-in hard disk, a smart memory card (SMART MEDIA CARD, SMC), a Secure Digital (SD) card, a flash memory card (FLASH CARD) or the like, which are provided on the test fixture. Further, the memory 1011 may also include both an internal memory unit and an external memory device of the test fixture. The memory 1011 is used for storing the computer program and other programs and data required by the test fixture. The memory 1011 may also be used to temporarily store data that has been output or is to be output.

It should be noted that, for convenience and brevity of description, the structure of the test tool may refer to a specific description of the structure in the method embodiment, which is not described herein again.

It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.

In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.

Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus/test fixture and method may be implemented in other manners. For example, the apparatus/test fixture embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical function division, and there may be additional divisions in actual implementation, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.

The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in the embodiments of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.

The integrated modules/units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiment, or may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth. It should be noted that the computer readable medium contains content that can be appropriately scaled according to the requirements of jurisdictions in which such content is subject to legislation and patent practice, such as in certain jurisdictions in which such content is subject to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.

The above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.

Claims

1. The receiving card testing method is characterized by comprising a receiving card testing system of a testing tool, wherein the receiving card is provided with N data output interfaces, and each data output interface comprises one or more data signal pins; the test fixture comprises N acquisition interfaces for being in butt joint with the data output interfaces, wherein the acquisition interfaces are used for acquiring signal data of the data signal pins in the data output interfaces, and N is an integer greater than or equal to 3;

the receiving card testing method comprises the following steps:

Acquiring signal data of each data signal pin in N data output interfaces through the acquisition interface in the process that the receiving card controls the display screen to display a test image;

Comparing the signal data of the same data signal pin among different data output interfaces to obtain the reference data of each data signal pin, wherein the reference data of each data signal pin is the signal data with highest frequency of the data signal pin among N data output interfaces;

and determining whether the data output interface and/or the receiving card has faults or not according to the comparison result between the signal data of each data signal pin and the reference data.

2. The method for testing a receiving card according to claim 1, wherein said determining whether the data output interface and/or the receiving card has a fault based on a comparison result between signal data of each of the data signal pins and the reference data comprises:

Comparing the signal data of each data signal pin with the corresponding reference data to obtain the data signal deviation amount of each data signal pin;

and determining whether the data output interface and/or the receiving card has faults or not according to the data signal deviation amount and a preset first tolerance value.

3. The method of claim 2, wherein the data signal offset includes an offset of each of the data signal pins in each frame when the receiving card controls the display screen to display a plurality of frames of the test image; the first tolerance value comprises a frame content limit value and a data frame tolerance value;

the determining whether the data output interface and/or the receiving card has a fault according to the data signal deviation amount and a preset first tolerance value comprises the following steps:

For each data signal pin, determining a total frame number with a deviation greater than the frame content limit;

and if the total frame number corresponding to any one of the data signal pins is greater than the data frame tolerance value, determining that the data output interface and/or the receiving card has faults.

4. The method for testing a receiver card according to claim 2, wherein said comparing the signal data of each of said data signal pins with the corresponding reference data to obtain the data signal deviation amount of each of said data signal pins, comprises:

Determining the pulse number of each data signal pin according to the signal data of each data signal pin;

Determining the reference pulse number of each data signal pin according to the reference data of each data signal pin;

And subtracting the pulse number of each data signal pin from the corresponding reference pulse number to obtain the data signal deviation amount of each data signal pin.

5. The method of claim 1, wherein each of the data output interfaces includes one or more target signal pins; the target signal pin is a decoding signal pin or a control signal pin; the acquisition interface is also used for acquiring signal data of each target signal pin in each data output interface;

The receiving card testing method further comprises the following steps:

Acquiring signal data of each target signal pin in N data output interfaces through the acquisition interface in the process that the receiving card controls the display screen to display the test image;

and determining whether the data output interface and/or the receiving card has faults or not according to the signal data of each target signal pin and a preset second tolerance value.

6. The method of claim 5, wherein the second margin value includes an upper limit value and a lower limit value;

The determining whether the data output interface and/or the receiving card has a fault according to the signal data of each target signal pin and a preset second tolerance value comprises the following steps:

Determining the pulse number of the target signal pins according to the signal data of each target signal pin;

and if the pulse number of any one of the target signal pins is larger than the upper limit value or smaller than the lower limit value, determining that the data output interface and/or the receiving card has faults.

7. The method for testing a receiver card according to any one of claims 1 to 6, further comprising:

Acquiring an image switching frequency, wherein the image switching frequency is used for controlling the display screen to switch and display among a plurality of test images;

And sending the image switching frequency to the receiving card.

8. The method of claim 7, wherein the plurality of test images comprise a plurality of images, and wherein at least one of color, gray scale, pattern, and gray scale is different between the different images.

9. The method of receiver card testing of claim 7, wherein the method of receiver card testing further comprises:

Determining the number of times of screen blacking of the display screen in the process of displaying a plurality of test images according to the signal data of each data signal pin;

and if the number of the black screen times is larger than a preset black screen tolerance, determining that the receiving card has faults.

10. The method for testing a receiver card according to any one of claims 1 to 6, wherein said acquiring signal data of each of the N data signal pins through the acquisition interface includes:

acquiring a preset sampling frame rate and sampling duration;

and controlling the acquisition interface to detect the sampling duration of the signal data of each data signal pin according to the sampling frame rate.

11. A test fixture comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, performs the steps of the method of testing a receiver card as claimed in any one of claims 1 to 10.

12. The receiving card testing system is characterized by comprising a testing tool and an upper computer in communication connection with the testing tool; the receiving card is provided with N data output interfaces, and each data output interface comprises one or more data signal pins; the test fixture comprises N acquisition interfaces for being in butt joint with the data output interfaces, wherein the acquisition interfaces are used for acquiring signal data of the data signal pins in the data output interfaces, and N is an integer greater than or equal to 3;

the upper computer is used for controlling the test tool;

the test fixture is used for implementing the steps of the receiving card test method according to any one of claims 1 to 10.

13. A computer readable storage medium storing a computer program, wherein the computer program when executed by a processor implements the steps of the method for testing a receiver card according to any one of claims 1 to 10.