CN118209837A - Circuit board burning test equipment - Google Patents

Abstract

The invention relates to the technical field of circuit board testing, in particular to circuit board burning testing equipment, which comprises a burning testing cabinet and a circuit board loading access device, wherein the circuit board loading access device comprises a loading access jig, the loading access jig is provided with an upper positioning plate and a lower positioning plate, and a probe assembly is arranged on the upper positioning plate; the circuit board loading access device comprises a lower positioning carrier plate and an upper positioning carrier plate, wherein the upper positioning carrier plate is arranged above the lower positioning carrier plate, the lower positioning carrier plate is arranged on the lower positioning carrier plate, the upper positioning carrier plate is arranged on the upper positioning carrier plate, a first rotating shaft is arranged between the upper positioning carrier plate and the lower positioning carrier plate, and a carrier plate locking mechanism is arranged between the upper positioning carrier plate and the lower positioning carrier plate. The accurate alignment matching of the upper positioning plate and the lower positioning plate is realized through the loading plate locking mechanism, the synchronous butt joint of all probes on the probe assembly and the detected circuit board is ensured through the arrangement of the linear driving mechanism, and poor contact of part of probes is effectively avoided.

Description

Circuit board burning test equipment

Technical Field

The invention relates to the technical field of circuit board testing, in particular to circuit board burning testing equipment.

Background

Burn-in testing of circuit boards is an important process for ensuring that microcontrollers or Integrated Circuits (ICs) on the circuit boards have been properly programmed and function properly. The following is a basic step of the burn-in test of the circuit board.

1. Selecting an appropriate programmer/writer: the appropriate programmer/writer is selected according to the type of microcontroller or integrated circuit.

2. Connection hardware: the programmer/writer is connected to the circuit board properly. This typically involves connecting an interface (e.g., USB, SPI, JTAG, etc.) of the programmer with a corresponding interface on the circuit board.

3. Loading a program: the program to be burned into the microcontroller or integrated circuit is loaded into the programmer. This may be done by copying the program directly into the programmer's memory, or by on-line transmission.

4. Starting burning: the programmer/writer is activated to begin programming the program into the microcontroller or integrated circuit on the circuit board.

5. Test procedure: after the burn-in is completed, the microcontroller or integrated circuit is tested for proper function by various methods. This may include observing the output of the circuit board, checking signals using a logic analyzer or oscilloscope, manually entering test commands, and the like.

6. Debugging: if any problem is found during the test, debugging is required to find the source of the problem and fix the error in the program.

7. Repeating test and debugging: after the problem is repaired, the test and debug process is repeated to ensure that the problem has been solved and that the microcontroller or integrated circuit is functioning properly.

8. Recording and reporting: after the burn-in and testing is completed, all results are recorded and reports are generated so that other personnel can know the testing process and results.

In the connection hardware link, it is necessary to ensure that the programmer/writer is connected to the circuit board accurately, i.e., the stability of the connection between the probe assembly and the circuit board is ensured.

The probe assembly is used to communicate with a microcontroller or integrated circuit on the circuit board during the burn-in process. The following is the main functions of the probe assembly in the circuit board burning device:

1. communication interface: the probe assembly is used as a communication interface for connecting the programmer/writer and the circuit board, and can realize high-speed and stable signal transmission. The method establishes reliable physical connection by closely contacting with a target chip on the circuit board so as to ensure accurate transmission of data in the burning process.

2. And (3) signal transmission: during the burn-in process, the probe assembly transmits the data in the programmer to a microcontroller or integrated circuit on the circuit board. At the same time, it is also responsible for reading data from the target chip and returning it to the programmer for verification or further processing.

3. Accurate alignment: probes in the probe assembly need to be precisely aligned with pins of the target chip during the burning process to ensure accurate transmission of data. The probe assembly typically has a high precision positioning system that can quickly and accurately locate and make intimate contact with the target chip.

4. Adapting to different packages: different microcontrollers or integrated circuits may have different packaging formats (e.g., QFN, BGA, etc.), and the probe assembly needs to be able to accommodate these different packages to ensure reliable contact with the target chip.

5. Withstand repeated use: in the process of repeated burning, the probe needs to bear repeated insertion and extraction and friction, so that the stability of the structure and the signal transmission performance of the probe is maintained.

In summary, the probe assembly in the circuit board burning device plays a crucial role in ensuring the accuracy and reliability of the burning process, and it is necessary to ensure that the probe assembly and the circuit board are in a good connection state before the burning test is performed.

Therefore, the present invention is directed to a burn-in test system that can accurately position a circuit board under test and ensure stable docking of a probe assembly to the circuit board.

In addition, heat dissipation is an important factor to be considered in the circuit board burn-in test process. Since the micro controller or integrated circuit on the circuit board generates heat during the burning process, if the heat cannot be effectively dissipated and controlled, the device may overheat, performance may be reduced or even damaged.

Therefore, the invention also provides a technical scheme for solving the heat dissipation in the circuit board burning test process.

Disclosure of Invention

In order to solve the problems in the prior art, the invention provides a circuit board burning test device, which comprises a burning test cabinet and a circuit board loading access device; the burning test cabinet is used for performing program burning, program testing, program debugging, test process recording and test report generation on the detected circuit board; the circuit board loading access device is used for fixing the detected circuit board and realizing communication connection between the circuit board and the burning test cabinet; the circuit board loading access device is provided with a probe assembly in communication connection with the detected circuit board, and the probe assembly is in communication connection with the burning test cabinet through a cable; the circuit board loading access device comprises a loading access jig, wherein the loading access jig is provided with an upper positioning plate and a lower positioning plate, and the probe assembly is arranged on the upper positioning plate; the circuit board loading access device comprises a lower positioning carrier plate and an upper positioning carrier plate, wherein the upper positioning carrier plate is arranged above the lower positioning carrier plate, the lower positioning carrier plate is arranged on the lower positioning carrier plate, the upper positioning carrier plate is arranged on the upper positioning carrier plate, a first rotating shaft is arranged between the upper positioning carrier plate and the lower positioning carrier plate, and a carrier plate locking mechanism is arranged between the upper positioning carrier plate and the lower positioning carrier plate.

As a further improvement of the invention, the upper positioning carrier plate is provided with a linear driving mechanism for driving the upper positioning plate to move towards the lower positioning plate along a direction perpendicular to the upper positioning carrier plate.

As a further improvement of the invention, the line driving mechanism comprises a linear driver arranged on the upper carrier plate, the driving direction of the linear driver is vertical to the upper positioning carrier plate, the output end of the linear driver is provided with a mounting plate arranged between the upper positioning carrier plate and the lower positioning carrier plate, the mounting plate is parallel to the upper positioning carrier plate, and the upper positioning plate is arranged on the mounting plate.

As a further improvement of the invention, the mounting plate is also provided with a recognition device, the mounting plate and the upper positioning plate are respectively provided with a window, and when the upper positioning plate and the lower positioning plate are matched in place, the recognition device recognizes the designated area on the tested circuit board and judges whether the loaded circuit board is correct or not.

As a further development of the invention, the carrier plate locking mechanism comprises a support member fixedly mounted on the lower positioning carrier plate, the support member having a support end extending upwardly to the positioning carrier plate.

As a further improvement of the invention, the carrier plate locking mechanism also comprises a locking piece, the locking piece is rotationally connected with the upper positioning carrier plate, the tail end of the locking piece is provided with a hook, and the supporting piece is provided with a hook groove matched with the hook.

As a further improvement of the invention, two supporting pieces are arranged on the lower positioning carrier plate, two locking pieces are arranged on the upper positioning carrier plate, and a rear pull rod is connected between the two locking pieces.

As a further improvement of the invention, the carrier plate locking mechanism also comprises a safety lock device, the safety lock device comprises lock rods arranged on two sides of the mounting plate or two sides of the lower locating plate, a lock shaft is arranged on the lock piece, the front end of the lock rod is provided with a lock hole with a downward leaning opening, and when the upper locating plate and the lower locating plate are matched in place, the lock hole hooks the lock shaft from top to bottom.

As a further improvement of the invention, the circuit board loading access device further comprises an electric cabinet, the loading access jig is arranged at the top of the electric cabinet, a control component and a power supply component are arranged in the electric cabinet, a controller is arranged at the top of the electric cabinet, the power supply component is connected with the control component and supplies power to the control component, and the controller and the loading access jig are electrically connected with the control component.

Compared with the prior art, the invention has the beneficial effects that: the accurate alignment matching of the upper positioning plate and the lower positioning plate is realized through the loading plate locking mechanism, the synchronous butt joint of all probes on the probe assembly and the detected circuit board is ensured through the arrangement of the linear driving mechanism, and poor contact of part of probes is effectively avoided.

Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.

Drawings

Fig. 1 is a schematic structural diagram of a circuit board burn-in test apparatus according to the present invention.

Fig. 2 is a schematic perspective view of a circuit board loading access device in the circuit board burn-in test apparatus according to the present invention.

Fig. 3 is a schematic perspective view of a circuit board burn-in test apparatus according to the present invention in a fully opened state of a loading access jig.

Fig. 4 is a schematic perspective view of a circuit board burn-in test apparatus of the present invention in a closed state when the insertion jig is installed to remove the protective cover and the side wall plate.

Fig. 5 is a schematic diagram of the circuit board burning test device according to the present invention in a state in which the upper positioning carrier plate is matched with the lower positioning carrier plate and the upper positioning plate is matched with the lower positioning plate.

Fig. 6 is a schematic diagram showing an opening state of an upper positioning carrier in a circuit board burning test device according to the present invention.

Fig. 7 is a schematic diagram of a second state of the opening operation of the upper positioning carrier in the circuit board burning test equipment according to the present invention.

The reference numerals in the figures are: 1. a burning test cabinet; 2. the circuit board is loaded with an access device; 3. an electrical cabinet; 3a, a controller; 4. a lower positioning plate; 4a, a photoelectric sensor; 5. an upper positioning plate; 6. positioning a carrier plate; 6a, locking piece; 6a1, a hook; 6a2, a lock shaft; 6b, a shaft seat; 7. positioning a carrier plate; 7a, a support; 7a1, a support end; 7a2, a hook groove; 7c, a bracket; 8. a linear driver; 9. a mounting plate; 10. an identification device; 11. a lock lever; 12. a first gas spring; 13. a pull rod; 14. a heat dissipation assembly; 15. a circuit board.

Detailed Description

The invention will be further described in detail with reference to the drawings and the detailed description below, in order to further understand the features and technical means of the invention and the specific objects and functions achieved.

Referring to fig. 1 to 3, a circuit board burn-in test apparatus includes a burn-in test cabinet 1 and a circuit board loading access device 2, wherein the circuit board loading access device 2 is used for fixing a circuit board 15 to be tested and realizing communication connection between the circuit board 15 and the burn-in test cabinet 1. Specifically, the circuit board loading access device 2 is provided with a probe assembly in communication connection with the circuit board 15 to be tested, and the probe assembly is in communication connection with the burn-in test cabinet 1 through a cable. The burn-in test cabinet 1 is used for performing program burn-in, program test, program debug, test process record and test report generation on the detected circuit board 15.

The circuit board loading access device 2 comprises a loading access jig, wherein the loading access jig is provided with a lower locating plate 4 for bearing a tested circuit board 15 and an upper locating plate 5 probe assembly for pressing the tested circuit board 15 from top to bottom, the upper locating plate 5 is arranged on the upper locating plate 5, and after the upper locating plate 5 is matched with the lower locating plate 4 to accurately locate the tested circuit board 15, the probes on the probe assembly are connected with a communication interface and chip pins on the tested circuit board 15.

In order to ensure that the burn-in test is performed after the circuit board under test 15 has been precisely positioned (the contact of the probes is well ensured in the case of precise positioning), the lower positioning plate 4 is provided with at least one group of photosensors 4a, and when the upper positioning plate 5 and the lower positioning plate 4 are mated in place, the upper positioning plate 5 disconnects the signal connection between the group of photosensors 4 a. The group of photoelectric sensors 4a includes a transmitting end and a receiving end, more specifically, when the upper positioning plate 5 is not moved to the precise position matched with the lower positioning plate 4, the light beam emitted by the transmitting end is received by the receiving end, the group of photoelectric sensors 4a is in a signal conducting state, the circuit board 15 to be tested in the state is in a state of not being allowed to be electrified, when the upper positioning plate 5 is moved to the precise position matched with the lower positioning plate 4, the upper positioning plate 5 blocks the signal between the transmitting end and the receiving end, the group of photoelectric sensors 4a is in a signal disconnecting state, and the circuit board 15 to be tested in the state is in an operation electrified state.

In order to facilitate the cooperation of the upper positioning plate 5 and the lower positioning plate 4, in the prior art, most of the schemes of fixing the lower positioning plate 4 and rotating the upper positioning plate 5 are adopted, as disclosed in the chinese patent publication No. CN213938454U, a general circuit board 15 program burning and testing device and a virus detector circuit board 15 burning tester disclosed in the chinese patent publication No. CN215866974U, all adopt to install the lower positioning plate 4 on a downloading plate, install the upper positioning plate 5 on the uploading plate again, set up a rotation axis between the uploading plate and the downloading plate, realize the cooperation of the upper positioning plate 5 and the lower positioning plate 4 relative to the downloading plate by winding the rotation axis on the uploading plate, realize the positioning of the tested circuit board 15, and set up a locking mechanism between the uploading plate and the downloading plate, realize the locking between the upper positioning plate 5 and the lower positioning plate 4. The prior art scheme of the rotational arrangement of the upper positioning plate 5 has the disadvantage that all probes in the probe assembly are not simultaneously in contact with the circuit board 15 under test, which is liable to cause poor contact of individual probes.

As shown in fig. 3, the circuit board loading access device 2 includes a lower positioning carrier plate 7 and an upper positioning carrier plate 6, the upper positioning carrier plate is disposed above the lower positioning carrier plate 7, the lower positioning carrier plate 4 is mounted on the lower positioning carrier plate 7, the upper positioning carrier plate 5 is mounted on the upper positioning carrier plate 6, a first rotation shaft is disposed between the upper positioning carrier plate 6 and the lower positioning carrier plate 7, a carrier plate locking mechanism is disposed between the upper positioning carrier plate 6 and the lower positioning carrier plate 7, and the carrier plate locking mechanism is used for ensuring that the upper positioning carrier plate 6 rotates around the first rotation shaft to a limit position of the lower positioning carrier plate 7, and the limit position is that the upper positioning carrier plate 6 is parallel to the lower positioning carrier plate 7.

Referring to fig. 4, a linear driving mechanism for driving the upper positioning plate 5 to move toward the lower positioning plate 4 along a direction perpendicular to the upper positioning plate 6 is mounted on the upper positioning plate 6. When the upper positioning carrier plate 6 moves to be parallel to the lower positioning carrier plate 7 and is locked by the carrier plate locking mechanism, the linear driving mechanism drives the upper positioning plate 5 to be matched with the lower positioning plate 4, and the upper positioning plate 5 moves linearly relative to the lower positioning plate 4 in the matching process, so that all probes in the probe assembly are ensured to synchronously contact with the circuit board 15, and the occurrence of poor contact of individual probes is avoided.

Referring to fig. 5, the linear driving mechanism includes a linear driver 8 mounted on an upper carrier plate, the carrier plate 6 is vertically positioned in a driving direction of the linear driver 8, a mounting plate 9 disposed between the upper positioning carrier plate 6 and a lower positioning carrier plate 7 is mounted at an output end of the linear driver 8, the mounting plate 9 is disposed parallel to the upper positioning carrier plate 6, and the upper positioning plate 5 is mounted on the mounting plate 9. More specifically, the linear actuator 8 may be a cylinder, an electric cylinder, or other actuation element capable of actuation.

A shield that can be opened and closed by rotation is mounted above the upper positioning carrier plate 6.

Further, in order to avoid that an operator loads the wrong circuit board 15 on the lower positioning board 4 during the burning test operation of the circuit board 15, referring to fig. 4 and 5, the mounting board 9 is further provided with a recognition device 10, windows are arranged on the mounting board 9 and the upper positioning board 5, and when the upper positioning board 5 and the lower positioning board 4 are matched in place, the recognition device 10 recognizes a designated area on the tested circuit board 15, and determines whether the loaded circuit board 15 is correct, that is, whether the loaded circuit board 15 is suitable for the probe assembly, so that damage to the probe on the probe assembly or damage to the circuit board 15 caused by loading the wrong circuit board 15 is avoided. When the recognition result of the recognition means 10 is "compatible", the linear drive is operated to drive the movement of the mounting plate 9. The recognition device 10 is used for recognizing a bar code or a two-dimensional code on the circuit board 15, and it should be noted that, under normal conditions, the lower positioning board 4 is provided with a positioning column matched with a positioning hole on the tested circuit board 15, and the purpose of the matching of the positioning hole and the positioning column is to prevent misplacement of the circuit board 15. However, in actual cases, there are cases where there are some circuit structures in the column circuit boards 15 that are different, but the appearance shape is the same and the positioning hole positions are the same, and in this case, it is necessary to perform recognition by the recognition device 10.

As shown in fig. 4 to 7, the carrier plate locking mechanism includes a supporting member 7a, the supporting member 7a is fixedly mounted on the lower positioning carrier plate 7, the supporting member 7a has a supporting end 7a1 extending upward to the upper positioning carrier plate 6, when the lower positioning carrier plate 7 rotates to be parallel to the lower positioning carrier plate 7, the lower surface of the upper positioning carrier plate 6 contacts with the supporting end 7a1, and the accuracy of the absolute position of the upper positioning carrier plate 6 relative to the lower positioning carrier plate 7 after rotating in place is achieved.

As shown in fig. 4 to 7, the carrier plate locking mechanism further comprises a locking piece 6a, the locking piece 6a is rotatably connected with the upper positioning carrier plate 6, a hook 6a1 is arranged at the tail end of the locking piece 6a, a hook groove 7a2 matched with the hook 6a1 is arranged on the supporting piece 7a, and when the lower positioning carrier plate 7 rotates to be parallel to the lower positioning carrier plate 7, the hook 6a1 at the tail end of the locking piece 6a is matched with the hook groove 7a2 on the supporting piece 7a, so that the position between the upper positioning carrier plate 6 and the lower positioning carrier plate 7 is locked.

More specifically, referring to fig. 4, two supporting members 7a are disposed on the lower positioning carrier plate 7, two locking members 6a are disposed on the upper positioning carrier plate 6, a rear pull rod 13 is connected between the two locking members 6a, a torsion spring is disposed at the rotary connection position of the locking members 6a and the upper positioning carrier plate 6, the two locking members 6a are driven to rotate relative to the upper fixed carrier plate by pulling the pull rod 13, so that the hook 6a1 is separated from the hook groove 7a2, unlocking between the upper positioning carrier plate 6 and the lower positioning carrier plate 7 is achieved, and after the pull rod 13 is released, the locking members 6a can be restored to a state perpendicular to the upper positioning carrier plate 6 under the action of the torsion spring.

Referring to fig. 4 and 7, the upper positioning carrier plate 6 and the lower positioning carrier plate 7 are rectangular plates, for the purpose of describing aspects, two sides parallel to each other on the lower positioning carrier plate 7 are defined as a first side and a second side, two sides parallel to each other on the upper positioning carrier plate 6 are defined as a third side and a fourth side, two brackets 7c are installed at the edge of the lower positioning carrier plate 7 near the first side, a shaft seat 6b is installed at a convenient place of the upper positioning carrier plate 6 near the third side, and the shaft seat 6b is in rotary connection with the brackets 7c, and the rotation shaft of the shaft seat 6b forms the first rotation shaft.

Two supporting pieces 7a are provided on the lower positioning carrier plate 7 near the second side, and two locking pieces 6a are provided on the upper positioning carrier plate 6 near the fourth side.

In the prior art, the matching of the upper and lower plates and the matching of the probe assembly and the circuit board 15 are synchronous, i.e. the probe assembly and the circuit board 15 are matched in place while the upper and lower plates are matched in place. This synchronous mating is such that when a malfunction is performed, the disconnection between the circuit board 15 and the probe assembly, which are being in the burn-in test state, may cause the circuit board 15 to burn out, severely causing the burner to be damaged.

In order to avoid the occurrence of the above situation, referring to fig. 5-7, the carrier plate locking mechanism further comprises a safety lock device, the safety lock device comprises lock rods 11 installed on two sides of the mounting plate 9 or two sides of the lower positioning plate 4, the lock shaft 6a2 is installed on the locking piece 6a, the front end of the lock rod 11 is provided with a lock hole with a downward leaning opening, and when the upper positioning plate 5 and the lower positioning plate 4 are matched in place, the lock hole hooks the lock shaft 6a2 from top to bottom.

Only when the linear driver 8 drives the upper positioning plate 5 to be separated from the lower positioning plate 4 so that the lock hole is separated from the lock shaft 6a2, the pull rod 13 is pulled to drive the locking piece 6a to rotate, so that the separation of the locking piece 6a and the supporting piece 7a is released. Finally, the front and back actions of separating the probe assembly and the upper positioning plate 5 are realized.

In order to realize the convenience of the rotation opening of the upper positioning carrier plate 6, a first gas spring 12 is arranged between the upper positioning carrier plate 6 and the lower positioning carrier plate 7, one end of the first gas spring 12 is connected with the lower positioning carrier plate 7, and the other end of the first gas spring 12 is connected with the upper positioning carrier plate 6. The first gas springs 12 may be provided in two.

Heating of the circuit board 15 during the burn-in test is a common problem and may be caused by a number of factors.

The power consumption is excessive: as the task performed by the circuit board 15 becomes more complex, the required current and voltage increases, thereby causing the circuit board 15 to generate more heat. At this time, the circuit board 15 is easily disabled by overheating without corresponding heat dissipation measures.

The heat dissipation design is not enough: the heat dissipation design of the circuit board 15 may be insufficient to effectively dissipate heat from the circuit board 15. This may be due to unreasonable size or design of the heat sink, or insufficient thermal conductivity of the heat sink material.

The ambient temperature is too high: if the ambient temperature of the circuit board 15 is too high, heat may also be generated in the circuit board 15. In this case, additional heat dissipation measures, such as the use of fans or heat sinks, etc., are required to reduce the operating temperature of the circuit board 15.

Based on the above-mentioned heat generation problem during the burning test of the circuit board 15, the present invention uses the reduction of the environmental temperature as a starting point, specifically, referring to fig. 2, the upper positioning carrier board 6 is provided with two side panels, the two side panels are perpendicular to the locking first rotation axis, when the upper positioning carrier board 6 rotates to be parallel to the lower positioning carrier board 7, the upper positioning carrier board 6, the lower positioning carrier board 7 and the two side panels define an area forming a working area, the working area has a first open side facing one side of the pull rod 13 and a second open side facing one side of the first rotation axis, and the lower end of the upper positioning component is provided with a heat dissipation component 14 corresponding to the first open side and the second open side respectively. The working area, namely the environment for burning test of the circuit board 15, effectively improves the heat dissipation effect in the working area through the heat dissipation components 14 arranged on the first open side and the second open side. Ensuring the smooth proceeding of the burning test process.

Referring to fig. 1 and 2, the circuit board loading access device 2 further includes an electrical cabinet 3, the loading access jig is mounted at the top of the electrical cabinet 3, a control component and a power component are arranged in the electrical cabinet 3, the top of the electrical cabinet 3 is provided with a controller 3a, the power component is connected with the control component and supplies power to the control component, and the controller 3a and the loading access jig are electrically connected with the control component.

The electrical cabinet 3 provides independent power and control for the load access jig. The controller 3a is provided with a start button, an emergency stop button and an indicator lamp, when the upper positioning carrier plate 6 and the lower positioning carrier plate 7 are matched in place, the linear driver 8 is controlled to act through the operation of the start button to drive the upper positioning plate 5 to move downwards in place, signals of the photoelectric sensor 4a are blocked, the indicator lamp lights a green light, the probe assembly and the circuit board 15 are connected in place, and at the moment, the burning test cabinet 1 can be operated to conduct burning test. If faults occur in the burning test process, the indicator lights are turned on to be red, and the like, the emergency stop button is operated to control the linear driver 8 to act so as to drive the upper positioning plate 5 to move upwards, so that the probe assembly is disconnected with the circuit board 15. The probe assembly is firstly connected with the control assembly in a communication way through a cable, and the control assembly is connected with the burning test cabinet 1 in a communication way through the cable.

The foregoing examples merely illustrate one or more embodiments of the invention, which are described in greater detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of the invention should be assessed as that of the appended claims.

Claims (9)

1. A circuit board burn-in test apparatus, comprising;

The burning test cabinet (1) is used for performing program burning, program testing, program debugging, test process recording and test report generation on the detected circuit board (15);

The circuit board loading access device (2) is used for fixing the detected circuit board (15) and realizing communication connection between the circuit board (15) and the burning test cabinet (1); the circuit board loading access device (2) is provided with a probe assembly in communication connection with the detected circuit board (15), and the probe assembly is in communication connection with the burning test cabinet (1) through a cable; the circuit board loading access device (2) comprises a loading access jig, wherein the loading access jig is provided with an upper positioning plate (5) and a lower positioning plate (4), and the probe assembly is arranged on the upper positioning plate (5);

The circuit board loading access device (2) comprises a lower positioning carrier plate (7) and an upper positioning carrier plate (6), wherein the upper positioning carrier plate is arranged above the lower positioning carrier plate (7), the lower positioning carrier plate (4) is installed on the lower positioning carrier plate (7), the upper positioning carrier plate (5) is installed on the upper positioning carrier plate (6), a first rotating shaft is arranged between the upper positioning carrier plate (6) and the lower positioning carrier plate (7), and a carrier plate locking mechanism is arranged between the upper positioning carrier plate (6) and the lower positioning carrier plate (7).

2. A circuit board burning test apparatus according to claim 1, wherein the upper positioning carrier plate (6) is provided with a linear driving mechanism for driving the upper positioning plate (5) to move toward the lower positioning plate (4) along a direction perpendicular to the upper positioning carrier plate (6).

3. A circuit board burning test apparatus according to claim 2, characterized in that the linear driving mechanism comprises a linear driver (8) mounted on the upper carrier plate, the carrier plate (6) is positioned vertically in the driving direction of the linear driver (8), the output end of the linear driver (8) is mounted with a mounting plate (9) disposed between the upper positioning carrier plate (6) and the lower positioning carrier plate (7), the mounting plate (9) is disposed parallel to the upper positioning carrier plate (6), and the upper positioning plate (5) is mounted on the mounting plate (9).

4. A circuit board burning test apparatus according to claim 3, characterized in that the mounting plate (9) is further provided with identification means (10), the mounting plate (9) and the upper positioning plate (5) are provided with windows, and when the upper positioning plate (5) and the lower positioning plate (4) are fitted in place, the identification means (10) identifies a designated area on the circuit board (15) to be tested, and the loaded circuit board (15) is judged to be correct.

5. A circuit board burn-in test apparatus according to claim 1, wherein the carrier locking mechanism comprises a support member (7 a), the support member (7 a) being fixedly mounted on the lower positioning carrier (7), the support member (7 a) having a support end (7 a 1) extending upwardly to the positioning carrier (6).

6. The circuit board burning test equipment according to claim 5, wherein the carrier plate locking mechanism further comprises a locking piece (6 a), the locking piece (6 a) is rotatably connected with the upper positioning carrier plate (6), a hook (6 a 1) is arranged at the tail end of the locking piece (6 a), and a hook groove (7 a 2) matched with the hook (6 a 1) is arranged on the supporting piece (7 a).

7. The circuit board burning test device according to claim 6, wherein two supporting members (7 a) are arranged on the lower positioning carrier plate (7), two locking members (6 a) are arranged on the upper positioning carrier plate (6), and a rear pull rod (13) is connected between the two locking members (6 a).

8. The circuit board burning test equipment according to claim 6, wherein the carrier plate locking mechanism further comprises a safety lock device, the safety lock device comprises lock rods (11) arranged on two sides of the mounting plate (9) or two sides of the lower positioning plate (4), the lock shaft (6 a 2) is arranged on the locking piece (6 a), the front end of the lock rod (11) is provided with a lock hole with a downward leaning opening, and when the upper positioning plate (5) and the lower positioning plate (4) are matched in place, the lock hole hooks the lock shaft (6 a 2) from top to bottom.

9. The circuit board burning test device according to claim 1, wherein the circuit board loading access device (2) further comprises an electrical cabinet (3), the loading access jig is mounted on the top of the electrical cabinet (3), a control component and a power supply component are arranged in the electrical cabinet (3), the controller (3 a) is arranged on the top of the electrical cabinet (3), the power supply component is connected with the control component and supplies power to the control component, and the controller (3 a) and the loading access jig are electrically connected with the control component.