CN118191464A - Automatic testing method and system for field intensity environments with different frequencies in darkroom environment - Google Patents
Automatic testing method and system for field intensity environments with different frequencies in darkroom environment Download PDFInfo
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- CN118191464A CN118191464A CN202410290428.8A CN202410290428A CN118191464A CN 118191464 A CN118191464 A CN 118191464A CN 202410290428 A CN202410290428 A CN 202410290428A CN 118191464 A CN118191464 A CN 118191464A
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Abstract
The invention provides a method and a system for automatically testing field intensity environments with different frequencies in a darkroom environment, wherein the method comprises the following steps: configuring test instruments, and setting a connection mode and a limit range value of each test instrument; hardware setting: adding a test frequency band, and screening out a configurable test instrument through the test frequency band; configuring a hardware setting, and adding a test frequency range according to a test frequency band configured by hardware; loading and starting a test task, gradually increasing output power in each test frequency band according to a preset test flow, automatically switching the test frequency bands when the range of the test frequency bands is reached, and repeating the test flow of gradually increasing the output power; and recording test data and generating a test data report and a test result report. The automatic test procedure of the present invention has significant advantages in terms of time costs and labor costs. The test device not only can improve the test efficiency and shorten the test time, but also can reduce the error of manual operation and improve the test accuracy.
Description
Technical Field
The invention relates to the technical field of testing, in particular to an automatic testing method and system for field intensity environments with different frequencies in darkroom environments.
Background
With the wide application of electronic devices in daily life and work, the influence of magnetic fields on the performance of electronic devices is becoming more and more interesting. And in the darkroom environment, the strong magnetic environments with different frequencies are tested, so that the influence of the magnetic field on the performance of the electronic equipment can be deeply known, and a basis is provided for the design and optimization of the electronic equipment.
However, the existing test method generally requires manual operation, has low test efficiency, and is difficult to ensure test accuracy. Therefore, the development of a method capable of automatically testing strong magnetic environments with different frequencies in darkroom environments has important practical significance.
Disclosure of Invention
The invention aims to provide an automatic testing method and system for field intensity environments with different frequencies in darkroom environments, so as to solve the problems.
The invention provides an automatic testing method for field intensity environments with different frequencies in a darkroom environment, which comprises the following steps:
s100, configuring test instruments, and setting a connection mode and a limit range value of each test instrument;
S200, hardware setting: adding a test frequency band, screening a configurable test instrument through the test frequency band, adding the screened test instrument to a corresponding instrument point in a test line, and setting a line loss value of the test line, a bias value of a power meter and a measurement mode of an antenna;
S300, configuring a hardware setting, adding test frequency ranges according to test frequency bands configured by the hardware, and configuring a frequency point stepping mode and a step value of each test frequency range and the waiting time of each frequency point after testing; meanwhile, setting a field intensity range reached by a current frequency point, a modulation mode of a signal and a direction of antenna polarization;
S400, loading and starting a test task, gradually increasing output power in each test frequency band according to a preset test flow, automatically switching the test frequency band when reaching the range of the test frequency band, and repeating the test flow of gradually increasing the output power;
S500, recording test data and generating a test data report and a test result report.
Further, in step S100, the connection manner includes VISA, serial port, TCP or UDP.
Further, in step S100, the limit range value includes:
The power amplifier needs to configure the working frequency range, and the maximum value and the minimum value of the output power;
the power meter needs to set the number of channels used and the maximum power value;
the field intensity meter needs to set the channel number and the maximum detection value.
Further, in step S200, the line loss value is configured as a fixed value or the line loss value at different frequencies is obtained through an uploading table.
Further, step S400 includes the following sub-steps:
S401, controlling a test instrument to run and acquiring actual field intensity;
s402, checking whether the actual field intensity reaches the expected field intensity:
If so, switching the frequency point information and continuing the test of the next frequency point;
if not, gradually increasing the output power and repeatedly checking until the actual field intensity reaches the expected field intensity;
s403, switching to the next test frequency point, and judging whether the current frequency point exceeds the test frequency band range:
if not, repeating the steps S401 to S402;
if so, checking whether the polarization direction of the antenna needs to be changed: if the parameters need to be changed, modifying the parameters and retesting; if the test frequency band does not need to be changed, checking whether the test frequency band is remained; if yes, resetting parameters and starting testing of a new test frequency band; if not, the current test task is completed.
Further, the test procedure in step S401 includes:
After receiving a control command of a computer, a signal source transmits a modulation signal of appointed frequency points and amplitude information;
After the forward power meter and the reverse power meter receive the computer control command, measuring the signal power value according to a required mode, and reporting the power data back to the computer; the forward power meter is used for measuring the forward power value of the matrix switch, and the reverse power meter is used for measuring the reverse power value of the matrix switch;
after receiving the control command of the computer, the matrix switch sends the signal of the signal source to the corresponding power amplifier;
after receiving a control command of a computer, the power amplifier receives a signal of a signal source and amplifies the power;
after receiving a computer control command, the antenna frame rotates the angle to a set angle;
and after receiving the control command of the computer, the field intensity meter reports the detected actual field intensity back to the computer.
Further, in step S402, the step-up output power includes:
finding out an actual field intensity corresponding to the output power, and then estimating the maximum field intensity according to the actual field intensity;
If the estimated maximum field intensity exceeds the index field intensity range, calculating how much power needs to be output through two frequency points so that the corresponding actual field intensity reaches the expected field intensity;
If the maximum field strength does not reach the index field strength range, using the maximum power for testing, and if the actual field strength corresponding to the maximum power reaches the expected field strength, continuing the testing of the next frequency point; if the actual field intensity corresponding to the maximum power does not reach the expected field intensity, recording the current frequency point, and continuing the test of the next frequency point; if no suitable power is found yet, the power is trimmed back by calculating the step value based on the true value until the desired field strength is reached.
The invention also provides an automatic testing system for different frequency field intensity environments in darkroom environment, comprising:
A computer;
a switch connected to the computer;
and a signal source, a power meter, a matrix switch, a power amplifier, an antenna frame, an antenna, a field intensity meter, a switch and a computer connected with the switch; the signal source, the matrix switch, the power amplifier and the antenna are connected in sequence; the power meter is connected with the matrix switch; the antenna is arranged on the antenna frame; the field intensity meter is arranged in the to-be-detected area.
Further, the antenna frame is used for supporting the antenna and controlling the antenna to perform pitching motion and polarization motion.
Further, the power meter comprises a forward power meter and a reverse power meter.
In summary, due to the adoption of the technical scheme, the beneficial effects of the invention are as follows:
By utilizing the automatic test method, only one operator is required to set the connection of the test instrument, and the expected field intensity and the test frequency band are set. Then, the test system can automatically record current parameter data of all test instruments when each test frequency band reaches the expected intensity according to the prefabricated template task, and store the parameter data. The process is fully automatic, manual intervention is not needed, and the efficiency and accuracy of the test are greatly improved. Thus, the automated test procedure of the present invention provides significant advantages in terms of time costs and labor costs over traditional manual test procedures. The test device not only can improve the test efficiency and shorten the test time, but also can reduce the error of manual operation and improve the test accuracy.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following description will briefly describe the drawings in the embodiments, it being understood that the following drawings only illustrate some embodiments of the present invention and should not be considered as limiting the scope, and that other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of an automatic test system for different frequency field intensity environments in a darkroom environment according to an embodiment of the present invention.
Fig. 2 is a schematic diagram illustrating rotation of an antenna frame according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of data interaction in an embodiment of the present invention.
FIG. 4 is a schematic diagram of test case configuration in an embodiment of the present invention.
FIG. 5 is a schematic diagram of an automatic test flow in an embodiment of the invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Examples
As shown in fig. 1, this embodiment proposes an automatic testing system for field strength environments with different frequencies in a darkroom environment, including:
A computer;
a switch connected to the computer;
And a signal source, a power meter, a matrix switch (radio frequency switch), a power amplifier, an antenna frame, an antenna, a field intensity meter, a switch and a computer connected with the switch; the signal source, the matrix switch, the power amplifier and the antenna are connected in sequence; the power meter is connected with the matrix switch; the antenna is arranged on the antenna frame; the field intensity meter is arranged in the to-be-detected area.
The working principle of each test instrument is as follows:
and the signal source is used for generating signals required by the test and controlling the emission of the signals.
The power meter comprises a forward power meter and a reverse power meter and is used for recording the forward power and the reverse power of the signal, so that parameters such as the gain of the power and the like are calculated.
And the matrix switch is used for transmitting signals of different frequency points to different power amplifiers.
And the power amplifier is used for amplifying the signal sent by the signal source so as to meet the signal strength required by the test.
And the antenna frame is used for supporting the antenna and controlling the antenna to perform pitching motion and polarization motion so as to simulate magnetic field environments with different angles and polarizations.
And the antenna is used for sending out the signal amplified by the power amplifier to form a magnetic field.
And the field intensity meter is used for detecting the electric field intensity generated by the signal sent by the antenna so as to evaluate the magnetic field intensity.
And the switch is used for connecting all the test instruments through a network cable to ensure the stable and efficient transmission of the line.
And the computer is used as a core of the whole test system and used for reading the test data of the measuring instrument in real time, completing the automatic test and generating an automatic test result. The computer controls the whole testing flow through a software program, and the whole testing flow is from the starting of a signal source to the reading of data of a field intensity meter and then to the generation and analysis of a final result.
As shown in FIG. 2, through computer remote control, the antenna frame can realize the adjustment of pitching angle and autogyration, controls the antenna to carry out pitching motion and polarization motion for the antenna can adapt to different test demands, has improved the flexibility and the accuracy of test. Meanwhile, by controlling the movement of the antenna frame, magnetic field environments with different angles and directions can be simulated, more comprehensive data coverage is provided for automatic test, the design has remarkable advantages in the field of test, is beneficial to improving the test efficiency and accuracy, reduces the manual operation cost, and has important application value.
As shown in fig. 3, during testing, the signal source, the matrix switch, the forward power meter, the reverse power meter, the power amplifier, the antenna frame and the field intensity meter are in information interaction with the computer through the switch.
After receiving a control command of a computer, a signal source transmits a modulation signal of appointed frequency points and amplitude information;
After the forward power meter and the reverse power meter receive the computer control command, measuring the signal power value according to a required mode, and reporting the power data back to the computer; the forward power meter is used for measuring the forward power value of the matrix switch, and the reverse power meter is used for measuring the reverse power value of the matrix switch;
after receiving the control command of the computer, the matrix switch sends the signal of the signal source to the corresponding power amplifier;
After receiving a control command of a computer, a power amplifier (needing to set a frequency point and an attenuation value in advance) receives a signal of a signal source and amplifies power;
after receiving a computer control command, the antenna frame rotates the angle to a set angle;
and after receiving the control command of the computer, the field intensity meter reports the detected actual field intensity back to the computer.
As shown in fig. 4 and 5, the test method of the automatic test system based on the field intensity environments with different frequencies in the darkroom environment comprises the following steps:
S100, configuring test instruments, and setting a connection mode and a limit range value of each test instrument; the connection mode comprises VISA, serial port, TCP or UDP. The limit range value includes: the power amplifier needs to configure the working frequency range, and the maximum value and the minimum value of the output power; the power meter needs to set the number of channels used and the maximum power value; the field intensity meter needs to set the number of channels, the maximum detection value, and the like.
S200, hardware setting: adding a test frequency band, screening a configurable test instrument through the test frequency band, adding the screened test instrument to a corresponding instrument point in a test line, and setting a line loss value of the test line, a bias value of a power meter and a measurement mode (comprising a field intensity measurement shaft, a measurement mode and the like) of an antenna. The line loss value is configured as a fixed value or obtained at different frequencies through an uploading table. The hardware setting ensures that the test system can accurately measure the required parameters.
S300, configuring a hardware setting, adding test frequency ranges according to test frequency bands configured by the hardware, and configuring frequency point stepping modes (supporting various stepping modes such as LOG, DEC_LIN, LIN and the like) and step values of each test frequency range, and waiting time after each frequency point is tested; meanwhile, the field intensity range reached by the current frequency point, the modulation mode of the signal and the direction (vertical, horizontal or vertical and horizontal) of the antenna polarization are set, and the configuration ensures that the test system can accurately measure the required parameters and generate an accurate test report;
S400, loading and starting a test task, gradually increasing output power in each test frequency band according to a preset test flow, automatically switching the test frequency band when reaching the range of the test frequency band, and repeating the test flow of gradually increasing the output power; specifically:
s401, controlling a test instrument to run and acquiring actual field intensity, referring to FIG. 3, which is not described herein;
s402, checking whether the actual field intensity reaches the expected field intensity:
If so, switching the frequency point information and continuing the test of the next frequency point;
If not, gradually increasing the output power and repeatedly checking until the actual field intensity reaches the expected field intensity; the step-up of the output power includes:
finding out an actual field intensity corresponding to the output power, and then estimating the maximum field intensity according to the actual field intensity;
If the estimated maximum field intensity exceeds the index field intensity range, calculating how much power needs to be output through two frequency points so that the corresponding actual field intensity reaches the expected field intensity;
If the maximum field strength does not reach the index field strength range, using the maximum power for testing, and if the actual field strength corresponding to the maximum power reaches the expected field strength, continuing the testing of the next frequency point; if the actual field intensity corresponding to the maximum power does not reach the expected field intensity, recording the current frequency point, and continuing the test of the next frequency point; if no suitable power is found yet, the power is trimmed back by calculating the step value based on the true value until the desired field strength is reached.
S403, switching to the next test frequency point, and judging whether the current frequency point exceeds the test frequency band range:
if not, repeating the steps S401 to S402;
if so, checking whether the polarization direction of the antenna needs to be changed: if the parameters need to be changed, modifying the parameters and retesting; if the test frequency band does not need to be changed, checking whether the test frequency band is remained; if yes, resetting parameters and starting testing of a new test frequency band; if not, the current test task is completed.
S500, recording test data and generating a test data report and a test result report. In the whole test process, the test system automatically records key test data and generates a detailed test data report and a test result report after the test is finished. Wherein, the test data report can be generated according to the field intensity detection result and the date and time in the test data.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. The automatic testing method for the field intensity environments with different frequencies in the darkroom environment is characterized by comprising the following steps:
s100, configuring test instruments, and setting a connection mode and a limit range value of each test instrument;
S200, hardware setting: adding a test frequency band, screening a configurable test instrument through the test frequency band, adding the screened test instrument to a corresponding instrument point in a test line, and setting a line loss value of the test line, a bias value of a power meter and a measurement mode of an antenna;
S300, configuring a hardware setting, adding test frequency ranges according to test frequency bands configured by the hardware, and configuring a frequency point stepping mode and a step value of each test frequency range and the waiting time of each frequency point after testing; meanwhile, setting a field intensity range reached by a current frequency point, a modulation mode of a signal and a direction of antenna polarization;
S400, loading and starting a test task, gradually increasing output power in each test frequency band according to a preset test flow, automatically switching the test frequency band when reaching the range of the test frequency band, and repeating the test flow of gradually increasing the output power;
S500, recording test data and generating a test data report and a test result report.
2. The method according to claim 1, wherein in step S100, the connection mode includes VISA, serial port, TCP or UDP.
3. The method according to claim 1, wherein in step S100, the limiting range value includes:
The power amplifier needs to configure the working frequency range, and the maximum value and the minimum value of the output power;
the power meter needs to set the number of channels used and the maximum power value;
the field intensity meter needs to set the channel number and the maximum detection value.
4. The automatic testing method for field strength environments with different frequencies in darkroom environment according to claim 1, wherein in step S200, the line loss value is configured as a fixed value or the line loss value with different frequencies is obtained through an uploading table.
5. The method for automatically testing the field strength environment of different frequencies in the darkroom environment according to claim 1, wherein the step S400 comprises the following sub-steps:
S401, controlling a test instrument to run and acquiring actual field intensity;
s402, checking whether the actual field intensity reaches the expected field intensity:
If so, switching the frequency point information and continuing the test of the next frequency point;
if not, gradually increasing the output power and repeatedly checking until the actual field intensity reaches the expected field intensity;
s403, switching to the next test frequency point, and judging whether the current frequency point exceeds the test frequency band range:
if not, repeating the steps S401 to S402;
if so, checking whether the polarization direction of the antenna needs to be changed: if the parameters need to be changed, modifying the parameters and retesting; if the test frequency band does not need to be changed, checking whether the test frequency band is remained; if yes, resetting parameters and starting testing of a new test frequency band; if not, the current test task is completed.
6. The method for automatically testing the field strength environment of different frequencies in the darkroom environment according to claim 5, wherein the testing procedure in the step S401 comprises:
After receiving a control command of a computer, a signal source transmits a modulation signal of appointed frequency points and amplitude information;
After the forward power meter and the reverse power meter receive the computer control command, measuring the signal power value according to a required mode, and reporting the power data back to the computer; the forward power meter is used for measuring the forward power value of the matrix switch, and the reverse power meter is used for measuring the reverse power value of the matrix switch;
after receiving the control command of the computer, the matrix switch sends the signal of the signal source to the corresponding power amplifier;
after receiving a control command of a computer, the power amplifier receives a signal of a signal source and amplifies the power;
after receiving a computer control command, the antenna frame rotates the angle to a set angle;
and after receiving the control command of the computer, the field intensity meter reports the detected actual field intensity back to the computer.
7. The method according to claim 5, wherein in step S402, the step-up of the output power includes:
finding out an actual field intensity corresponding to the output power, and then estimating the maximum field intensity according to the actual field intensity;
If the estimated maximum field intensity exceeds the index field intensity range, calculating how much power needs to be output through two frequency points so that the corresponding actual field intensity reaches the expected field intensity;
If the maximum field strength does not reach the index field strength range, using the maximum power for testing, and if the actual field strength corresponding to the maximum power reaches the expected field strength, continuing the testing of the next frequency point; if the actual field intensity corresponding to the maximum power does not reach the expected field intensity, recording the current frequency point, and continuing the test of the next frequency point; if no suitable power is found yet, the power is trimmed back by calculating the step value based on the true value until the desired field strength is reached.
8. An automatic testing system for field strength environments with different frequencies in darkroom environment, comprising:
A computer;
a switch connected to the computer;
and a signal source, a power meter, a matrix switch, a power amplifier, an antenna frame, an antenna, a field intensity meter, a switch and a computer connected with the switch; the signal source, the matrix switch, the power amplifier and the antenna are connected in sequence; the power meter is connected with the matrix switch; the antenna is arranged on the antenna frame; the field intensity meter is arranged in the to-be-detected area.
9. The system of claim 8, wherein the antenna mount is configured to support the antenna and control the antenna to perform pitching and polarizing motions.
10. The system for automatically testing different frequency field strength environments in a darkroom environment according to claim 8, wherein said power meter comprises a forward power meter and a reverse power meter.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202410290428.8A CN118191464A (en) | 2024-03-14 | 2024-03-14 | Automatic testing method and system for field intensity environments with different frequencies in darkroom environment |
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| CN202410290428.8A CN118191464A (en) | 2024-03-14 | 2024-03-14 | Automatic testing method and system for field intensity environments with different frequencies in darkroom environment |
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