CN118150999A - System and method for testing true type of burning-out short circuit of conductor contact of switching equipment - Google Patents
System and method for testing true type of burning-out short circuit of conductor contact of switching equipment Download PDFInfo
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- CN118150999A CN118150999A CN202410573316.3A CN202410573316A CN118150999A CN 118150999 A CN118150999 A CN 118150999A CN 202410573316 A CN202410573316 A CN 202410573316A CN 118150999 A CN118150999 A CN 118150999A
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- 238000012360 testing method Methods 0.000 title claims abstract description 126
- 239000004020 conductor Substances 0.000 title claims abstract description 74
- 238000000034 method Methods 0.000 title claims description 17
- 238000012544 monitoring process Methods 0.000 claims abstract description 75
- 239000002184 metal Substances 0.000 claims abstract description 52
- 238000002844 melting Methods 0.000 claims abstract description 32
- 230000008018 melting Effects 0.000 claims abstract description 32
- 238000004088 simulation Methods 0.000 claims abstract description 16
- 230000009471 action Effects 0.000 claims abstract description 10
- 238000010998 test method Methods 0.000 claims abstract description 9
- 238000002156 mixing Methods 0.000 claims description 11
- 230000003068 static effect Effects 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 6
- 239000012212 insulator Substances 0.000 claims description 5
- 239000003990 capacitor Substances 0.000 claims description 4
- 238000005192 partition Methods 0.000 claims description 4
- 125000006850 spacer group Chemical group 0.000 claims description 4
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- 238000010586 diagram Methods 0.000 description 7
- 238000012423 maintenance Methods 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 3
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- 241000722921 Tulipa gesneriana Species 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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Abstract
The application provides a burning-out short circuit true test system and a test method of a conductor contact of a switch device, which relate to the technical field of power device fault diagnosis, wherein the system comprises: true test platform, true test loop and protection monitoring system, the true test platform is filled with/An adjustable resistance contact is arranged in the isolating switch gas chamber of the binary gas and is used for providing contact resistance for a true test platform, and a voltage loop and a current loop in the true test loop are respectively used for providing rated voltage and load current for the true test platform; the protection monitoring system is used for monitoring the contact temperature of the adjustable resistance contact and the highest shell temperature of the metal shell of the switching equipment under the action of rated voltage when different preset load currents, and carrying out early warning of the burning short circuit of the adjustable resistance contact based on the preset load currents, the contact temperature and the highest shell temperature. The application can realize/The conductor contact burning and melting short circuit simulation and short circuit fault recurrence of the binary gas switching equipment.
Description
Technical Field
The application relates to the technical field of power equipment fault diagnosis, in particular to a burning-out short circuit true test system and a burning-out short circuit true test method for a conductor contact of a switch device.
Background
The power equipment actively advances to environment-friendly equipment, and the most mature means at present is to make the original pureGas exchange into/>//>Binary gas with a mixing ratio of 3:7 (+ -1%)/>The usage amount of the water-based paint is greatly reduced, and the environmental protection effect is very obvious. In particular to a totally-enclosed gas-insulated switchgear (Gas Insulated Substation, GIS), wherein the insulating gas of other gas chambers except the gas chamber of a circuit breaker is totally used/>//>Binary gas is substituted. GIS has been widely used in power systems, and among newly built substations, the vast majority is GIS combined electrical apparatus substation. At first, the metal enclosed combined electrical appliance becomes the first choice equipment for transformer substation construction by virtue of low failure rate, small maintenance amount, long maintenance period and the like. In practice, however, the main conductor of the enclosed busbar has a plurality of contact connections due to the longer length, and the safety operation of the device is directly affected by the contact quality of the contacts.
//>The large-scale use of binary gas combined electrical appliances brings a plurality of challenges to operation and maintenance, and various failure mechanisms and processing modes generated by the operation of the binary gas combined electrical appliances are changed. Operational experience has shown that the failure rate of the combined electrical apparatus is not low due to production process or field installation conditions, among which insulation flashover and contact failure are the most prevalent. Once the combined electrical appliance fails, great trouble and loss are brought to the fault processing, the maintenance period is long, the power supply is affected, secondary faults can be derived if the fault is processed improperly, and the processing difficulty is increased. If a certain 252kV GIS bus conductor is in poor contact, the contact is overheated to melt metal, and finally three-phase short circuit is caused. According to statistics, about 2-3 contact failure accidents occur in the contacts of the high-voltage combined electrical appliance each year. The reasons for poor contact are many, such as loose contact springs, active contact jamming, operating mechanism transmission system jamming, etc.
The main reason for the failure is that the contact is in poor contact, so that the contact temperature is too high, the metal is melted at high temperature, and finally a short-circuit accident is formed.//>Insulated switchgear and purity >The high-voltage switch equipment is different and has own unique operating conditions: firstly, the insulating medium is changed from the original pure/>Becomes/>//>A binary gas; and the pressure of the air chamber is changed, and the air pressure is changed to be 1.33 times of the original air pressure. This will result in a hybrid insulating medium that differs in terms of insulating ability, heat transfer characteristics, etc.
Currently, for filling with//>The fault mechanism of the binary gas switching equipment, which is caused by overheat and melting of the contact, is not clear, and a simulation platform and a test method for simulating the contact melting short-circuit fault are not provided. Therefore, how to design a true test system and formulate a set of test methods, simulate/>//>The insulated switchgear conductor contact fuse short-circuit fault process and overheat fault diagnosis are key problems to be solved at present.
Disclosure of Invention
In view of the above, the application provides a system and a method for testing a fuse short circuit of a conductor contact of a switchgear, which can be charged with//>The conductor contact burning-out short circuit true test of the binary gas switching equipment provides a technical solution.
To achieve the above object, a first aspect of the present application provides a burn-in short true test system for a conductor contact of a switchgear, the switchgear being charged with//>Binary gas switchgear,/> //>In binary gas/>And/>The real test system for the burning and short circuit of the conductor contact of the switch equipment comprises: true test platform, true test loop and protection monitoring system, true test platform includes switchgear metal casing, deploys in switchgear metal casing and fills/>//>The device comprises a binary gas isolating switch air chamber, wherein an adjustable resistance contact is arranged in the isolating switch air chamber and used for providing a preset contact resistance for a true test platform, and a true test loop comprises a voltage loop and a current loop;
The voltage loop and the current loop are respectively connected with the real test platform, the voltage loop is used for providing rated voltage for the real test platform, and the current loop is used for providing load current for the real test platform;
The protection monitoring system is connected with the true test platform, the voltage loop and the current loop, is used for monitoring the contact temperature of the adjustable resistance contact and the shell highest temperature of the metal shell of the switching equipment under the action of rated voltage, and calculating a target relation between the contact temperature and the shell temperature rise as well as the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to the different preset load currents, and carrying out power failure treatment and burning short-circuit early warning when the adjustable resistance contact is judged to be overheated based on the target relation;
The protection monitoring system is also used for dynamically adjusting the load current value of the current loop to enable the contact temperature to reach the contact metal melting temperature under the preset contact resistance, and performing the burning short circuit simulation of the adjustable resistance contact under the contact metal melting temperature.
The second aspect of the application provides a test method, which is applied to a protection monitoring system in a fuse short circuit true test system of a conductor contact of a switch device, and comprises the following steps:
Under the action of rated voltage, monitoring the contact temperature of the adjustable resistance contact at different preset load currents and the highest temperature of the metal shell of the switching equipment;
calculating a target relational expression of the contact temperature, the shell temperature rise and the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to different preset load currents;
and based on the target relation, when the overheat of the adjustable resistance contact is judged, carrying out power failure treatment and burning short-circuit early warning.
The application provides a true type test system for a fuse short circuit of a conductor contact of a switch device. An isolating switch air chamber can be arranged in the true test platform, and the isolating switch air chamber is simulated to be filled//>The binary gas, the adjustable resistance contact is arranged in the isolating switch gas chamber, and the adjustable resistance contact can be used for providing preset contact resistance for the true test platform; the voltage loop and the current loop in the true test loop respectively provide rated voltage and load current for the true test platform; the protection monitoring system is used for monitoring the contact temperature of the adjustable resistance contact and the shell highest temperature of the metal shell of the switching equipment under the action of rated voltage, calculating target relation between the contact temperature and the shell temperature rise as well as between the contact temperature and the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to the different preset load currents, and carrying out burning short-circuit early warning of the adjustable resistance contact based on the target relation. In addition, the protection monitoring system is also used for dynamically adjusting the load current value of the current loop to enable the contact temperature to reach the contact metal melting temperature under the preset contact resistance, and performing the burning short circuit simulation of the adjustable resistance contact under the contact metal melting temperature. The technical proposal of the application can simulate/>//>The process of the insulated switchgear conductor contact burning and melting short circuit fault is clear/>//>A thermal conduction mechanism of an insulated switchgear conductor contact, a overheat fault diagnosis criterion, a overheat burning short-circuit fault mechanism and the like. Can simulate/>//>The actual working conditions of voltage and current of the insulated switching equipment during operation truly reflect the complete process of contact melting short circuit, help operation and maintenance personnel analyze fault reasons, formulate effective fault diagnosis and measures for preventing heating short circuit, reduce the fault rate of the equipment and promote/>//>The reliability of the insulated high-voltage switch equipment ensures the safe and stable operation of the equipment.
The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present invention more readily apparent.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a system structure of a real test system for a fuse short circuit of a conductor contact of a switchgear according to an embodiment of the present application;
Fig. 2 is an assembly diagram of an adjustable resistance contact according to an embodiment of the present application;
Fig. 3 is a top view of a contact finger according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a platform structure of a true test platform according to an embodiment of the present application;
FIG. 5 is a schematic wiring diagram of a true test loop according to an embodiment of the present application;
Fig. 6 is a schematic system structure diagram of a protection monitoring system according to an embodiment of the present application;
FIG. 7 is a schematic diagram illustrating an example of a preset temperature test point according to an embodiment of the present application;
FIG. 8 is a schematic diagram of a relationship between contact temperature and housing temperature rise, load current according to an embodiment of the present application;
Fig. 9 shows a schematic flow chart of a test method according to an embodiment of the present invention.
In the figure:
100-true test platform, 101-contact finger fastening spring, 102-contact finger, 103-contact shielding case, 104-conductor moving contact, 105-conductor static contact, 106-voltage loading terminal, 107-current loading terminal, 108-switchgear metal shell, 109-supporting insulator, 110-adjustable resistance contact, 111-insulating partition board, 112-barometer, 113-handhole cover, 114-conductor, 115-loop ammeter;
200-true test loop, 201-voltage loop, 202-current loop;
300-protection monitoring system, 301-temperature monitoring module, 302-voltage monitoring module, 303-current monitoring module.
Detailed Description
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
The invention will be described in detail hereinafter with reference to the drawings in conjunction with embodiments. It should be noted that, without conflict, the embodiments of the present invention and features of the embodiments may be combined with each other.
A burn-in short true test system for switchgear conductor contacts according to some embodiments of the invention is described below in connection with fig. 1-8.
The embodiment of the invention provides a burning-out short circuit true test system for a conductor contact of a switching device, wherein the switching device is filled with//>Binary gas switchgear,/> //>In binary gas/>And/>Mixing is performed according to a preset mixing ratio. The preset mixing ratio may be any one of mixing ratios of 2:8, 3:7, 4:6, 5:5, and the like, and the setting of the mixing ratio may be specifically performed according to an actual application scenario, which is not specifically limited herein. In the following example steps of the present disclosure, to/>AndThe present application is described with reference to the preset mixing ratio of 3:7, but the present application is not limited thereto.
As shown in fig. 1, the true test system for the burning short circuit of the conductor contact of the switch device comprises: the true test platform 100, the true test loop 200, and the protection monitoring system 300, the true test platform 100 including a switchgear metal housing 108, a load being disposed within the switchgear metal housing 108//>The binary gas isolating switch air chamber is internally provided with an adjustable resistance contact 110, wherein the adjustable resistance contact 110 is used for providing a preset contact resistance for the true test platform 100, and the preset contact resistance is used for simulating the contact resistance of a conductor contact on the true mixed gas switching device. The true test loop 200 includes a voltage loop 201 and a current loop 202; the voltage loop 201 and the current loop 202 are respectively connected with the true test platform 100, the voltage loop 201 is used for providing rated voltage for the true test platform 100, and the current loop 202 is used for providing load current for the true test platform 100; the protection monitoring system 300 is connected with the real test platform 100, the voltage loop 201 and the current loop 202, a loop ammeter 115 can be connected between the protection monitoring system 300 and the current loop 202, and the protection monitoring system 300 is used for measuring the load current corresponding to the current loop 202 through the loop ammeter 115. Specifically, the protection monitoring system 300 is configured to monitor the contact temperature of the adjustable resistor contact 110 and the highest temperature of the metal shell 108 of the switchgear when the current loop 202 provides different preset load currents under the action of the rated voltage provided by the voltage loop 201, calculate a target relation between the contact temperature and the shell temperature rise as well as between the contact temperature and the load current under the preset contact resistance based on the preset load currents and the contact temperature and the highest temperature of the shell corresponding to the different preset load currents respectively, and perform power failure processing and early warning of a fuse short circuit when the adjustable resistor contact 110 is determined to be overheated based on the target relation.
For example, when calculating the target relation between the contact temperature and the shell temperature rise and the load current under the preset contact resistance:
Firstly, the load current in the real test platform 100 can be increased to a preset load current I 1 through the current loop 202, the temperature change of the contact resistance is observed, and when the resistance temperature is not changed stably, the contact temperature T 1, the shell maximum temperature T 1 and the environment temperature T 0 are recorded. There is a functional relationship that the contact temperature is a binary function of the load current, the shell temperature rise, f (t 1)=F(T1-T0,I1);
Then, the load current in the real test platform 100 can be increased to the preset load current I 2 through the current loop 202, the temperature change of the contact resistance is observed, and when the resistance temperature is not changed and is stable, the contact temperature T 2, the shell maximum temperature T 2 and the environment temperature T 0 are recorded. A set of functional relationships for the contact temperatures, f (t 2)=F(T2-T0,I2), is obtained. And by analogy, obtaining a series of relations between contact temperature, shell temperature rise and load current, and f (t n)=F(Tn-T0,In). From this series of data, a cluster of contact temperatures can be plotted against housing temperature rise, load current as shown in fig. 8. By curve fitting technology, the target relation of the contact temperature T and the shell temperature rise delta T (delta T=T n-T0) and the load current I, namely F (T) =F (delta T, I), is obtained.
The preset load current I 1, the preset load current I 2, and the preset load current I n are different load current values, and may be set to any value under the rated load current, and specific values may be set according to actual application scenarios, which are not specifically limited herein.
After the target relation is obtained by fitting, if the current load current I is known, the overheat temperature of the contact can be obtained by the temperature rise of the metal shell. When the overheat temperature reaches a certain preset temperature value, such as 50 ℃, it can be considered that there is a defect of poor contact inside, and then the early warning of the burn-out short of the adjustable resistance contact 110 can be performed, and the early warning of the burn-out short is used for indicating a preventive measure of heating short before the burn-out short, such as performing power-off treatment on the switching device. The burning short-circuit warning mode may include, but is not limited to, one or more of a plurality of warning modes including sound warning, vibration warning, short message warning, light warning, audio warning, etc., which are not limited in detail herein.
In a specific application scenario, the protection monitoring system 300 may be further configured to dynamically adjust the load current value of the current loop 202 to make the contact temperature reach the contact metal melting temperature under the preset contact resistance, and perform the melting short circuit simulation of the adjustable resistance contact 110 under the contact metal melting temperature, so as to implement the recurrence of the contact overheat melting fault. Specifically, when the burn-out short circuit simulation is performed, the contact resistance of the adjustable resistance contact can be adjusted to a resistance value before the fault, the output current of the current loop is slowly increased, the change of the contact temperature is observed at any time, the output current of the current loop is increased to a load current value before the fault, and the contact temperature is observed. At the moment, the temperature of the contact can be gradually increased, when the temperature of the contact reaches the metal melting temperature of the contact, the metal solution of the contact drops downwards, and a burning and short circuit true test system of the conductor contact of the switch equipment can generate short circuit and protect tripping.
As shown in fig. 2 and 3, the adjustable resistance contact 110 includes: the contact finger fastening springs 101, N contact fingers 102, a contact shielding cover 103, a conductor moving contact 104 and a conductor static contact 105; the number of the finger fastening springs 101 may be at least one, and in the present application, the adjustable resistance contact 110 includes 4 finger fastening springs 101 as an example, but the technical solution of the present application is described, but the present application is not limited thereto. At least one finger securing spring 101 is used to encircle the N fingers 102, securing the N fingers 102 into a ring-shaped tulip contact. It will be appreciated that the finger fastening spring 101 may be configured as other fastening means, not specifically limited herein. The quincuncial contact is fixed between the conductor moving contact 104 and the conductor fixed contact 105, and the contact shielding cover 103 is used for shielding the quincuncial contact at the periphery; the adjustable resistive contact 110 is used for adjusting the contact resistance provided by the adjustable resistive contact 110 by increasing or decreasing the number of contact fingers. Specifically, after the conductor moving contact 104 is inserted into the tulip contact, the contact resistance between each contact finger 102 and the conductor moving contact 104 is R, and then the parallel connection value of the contact resistances between all contact fingers 102 and the conductor moving contact 104 is the total resistance, i.e. R Total (S) =r/N. After k (k=1, 2,3 … … N) contact fingers are reduced, the contact resistance is increased to R k =r/(N-k), so that simulation of poor contact defects under each preset contact resistance can be realized. The contact resistance may be a real-time resistance value provided by the adjustable resistance contact 110 under the condition that the number of the contact fingers is changed, the preset contact resistance is a specific resistance value to be subjected to the simulation of the contact defect, and the preset contact resistance may be specifically any one of a plurality of contact resistances in a corresponding resistance adjustment range of the adjustable resistance contact 110.
The true test platform 100 is used as a defect simulation test platform and can simulate filling//>And (3) a binary gas switching device, which performs true simulation of the burning and short circuit of the conductor contact. Accordingly, as shown in fig. 4, the true test platform 100 further includes: a conductor 114, two insulating spacers 111, and a handhole cover 113; conductor 114 is used to form a fill within switchgear metal enclosure 108//>The first gas chamber of the binary gas, which may be specifically a complete gas chamber on the true test platform 100; two insulating spacers 111 are used to isolate the first air chamber into three second air chambers, which are filled independently of each other/>//>Binary gas, and barometers 112 are respectively arranged, wherein the barometers 112 are used for displaying the gas pressure in the second air chamber; the adjustable resistance contact 110 is located in a disconnecting switch air chamber between two insulating partition plates 111, a hand hole cover 113 is arranged above the disconnecting switch air chamber, an operating mechanism is arranged on the side face of the disconnecting switch air chamber, the operating mechanism is used for driving the conductor moving contact 104 to move left and right, switching-on and switching-off operation of the adjustable resistance contact 110 is achieved, and the protection monitoring system 300 is connected below the disconnecting switch air chamber. The hand hole cover 113 is used to facilitate opening, and by increasing or decreasing the number of contact fingers 102 in the adjustable resistive contact 110, the size of the preset contact resistance provided by the adjustable resistive contact 110 is adjusted. By isolating the first air chamber into three second air chambers with the insulating partition 111, the switch air chamber can be isolated by opening the hand hole cover 113//>When the binary gas is dispersed, the other two second air chambers are filled//>The binary gas is not affected, and the original gas concentration and gas pressure are still maintained. After the resistance of the adjustable resistive contact 110 is adjusted, the handhole cover 113 may be covered. Further, a loop resistance tester may be connected to both ends of the conductor 114, and the contact resistance value of the adjustable resistance contact 110 at this time may be measured by the loop resistance tester and recorded. Recharging/>, the isolator chamber with a barometer 112 provided on the isolator chamber//>Binary gas. In the process of adjusting the resistance of the adjustable resistance contact 110, only the isolating switch air chamber needs to be recycled and inflated, and the gas of two adjacent air chambers is not influenced, so that the true test efficiency of the burning short circuit can be improved. And corresponding barometers 112 are respectively configured for different air chambers, so that personalized dynamic adjustment of air pressure in different air chambers can be realized.
Accordingly, as shown in fig. 4, the true test platform 100 further includes: a voltage loading terminal 106, a current loading terminal 107, and a support insulator 109; the voltage loading terminal 106 is arranged on the metal shell 108 of the switch equipment and is used for being connected with the voltage loop 201; the current loading terminal 107 is arranged at two ends of the conductor 114 and is used for being connected with a current loop 202; a support insulator 109 is provided at the bottom of the switchgear metal housing 108 for supporting the true test platform 100. In a specific application scenario, voltage and current combined loading can be realized by arranging the real test platform 100, arranging the voltage loading terminal 106 for connecting the voltage loop 201 and the current loading terminal 107 for connecting the current loop 202 on the real test platform 100 and detachably connecting the voltage loop 201 and the current loop 202, so that the actual operation condition of the switching equipment can be truly simulated, and the reproduction of the contact overheat melting short circuit fault can be realized.
For the present embodiment, as shown in fig. 5, the voltage loop 201 includes: two switches QF3, two protection switches QF4, a voltage regulator T2, a voltmeter V3, and voltage dividing capacitors C1 and C2; the first ends of the two protection switches QF4 are connected into an alternating current power supply, the second ends of the two protection switches QF4 are connected with a voltmeter V3 in parallel, the voltmeter V3 is connected to the primary side of a voltage regulator T2 in parallel, the secondary side of the voltage regulator T2 is connected with a voltage divider formed by voltage dividing capacitors C1 and C2 in parallel, the two ends of the voltage divider are connected with the first ends of the two switches QF3 in parallel, and the second ends of the two switches QF3 are connected with a voltage loading terminal of a true test platform; wherein the protection switch QF4 is used for tripping when a short circuit or an electric shock occurs to protect the voltage loop 201; the voltage regulator T2 is used for increasing 220V alternating voltage provided by the alternating current power supply to rated voltage required by the true test platform; the voltmeter V3 is used for monitoring the voltage of the primary side of the voltage regulator T2 in real time; the voltage divider is used for converting the voltage value of the secondary side of the voltage regulator T2, and the switch QF3 is used for controlling the on-off of the voltage loop 201.
For the present embodiment, as shown in fig. 5, the current loop 202 includes: two protection switches QF1, two switches QF2, a voltage regulator T1, a voltmeter V2 and a current transformer CT; the first ends of the two protection switches QF1 are connected with an alternating current power supply, the second ends of the two protection switches QF1 are connected with the primary side of the voltage regulator T1, the voltmeter V1 is connected with the secondary side of the voltage regulator T1 and the primary side of the current transformer CT in parallel, the secondary side of the current transformer CT is connected with the voltmeter V2 in parallel, the first ends of the two switches QF2 are connected with the voltmeter V2 in parallel, and the second ends of the two switches QF2 are connected with a current loading terminal of the true test platform; wherein the protection switch QF1 is used for tripping when a short circuit occurs so as to protect the current loop 202; the voltage regulator T1 is used for increasing 220V alternating voltage provided by the alternating current power supply to rated voltage required by the true test platform; the voltmeter V1 is used for monitoring the voltage of the primary side of the current transformer CT in real time; the voltmeter V2 is used for monitoring the voltage of the secondary side of the current transformer CT in real time, the current transformer CT is used for proportionally converting high-load current into low-load current, and the switch QF2 is used for controlling on-off of the current loop 202.
For the present embodiment, as shown in fig. 6, the protection monitoring system 300 includes a temperature monitoring module 301, a voltage monitoring module 302, and a current monitoring module 303; the temperature monitoring module 301 is connected with a preset temperature test point on the metal shell 108 of the switch device and the adjustable resistance contact 110, and is used for monitoring the highest shell temperature of the metal shell 108 of the switch device, monitoring the temperature value of the preset temperature test point, determining the contact temperature of the adjustable resistance contact based on the temperature value, and displaying the highest shell temperature and the contact temperature on a display page; as shown in fig. 7, the preset temperature test points include, but are not limited to: the contact position of the contact finger and the conductor moving contact (temperature test point 1), the contact position of the contact finger and the conductor static contact (temperature test point 2), the contact finger position (temperature test point 3) and the conductor static contact position (temperature test point 4). When determining the contact temperature of the adjustable resistance contact based on the temperature value, the arithmetic average value of the temperature test points 1, 2,3 and 4 can be determined as the contact temperature of the adjustable resistance contact; the voltage monitoring module 302 is connected with the voltage loop 201, and specifically can be connected with the secondary side of the voltage regulator T2 in the voltage loop 201, and is used for monitoring the rated voltage in real time and displaying the rated voltage on a display page; the current monitoring module 303 is connected to the current loop 202, and specifically can be connected to a secondary side of the current transformer CT in the current loop 202, and is configured to monitor the load current provided by the current loop in real time, and display the load current on a display page. Wherein, the temperature monitoring module 301 may include any optional temperature monitoring device, such as an infrared imager, etc.; voltage monitoring module 302 may include any optional voltage monitoring device, such as a voltmeter; any optional current monitoring device, such as an ammeter, may be included in current monitoring module 303.
The burning-out short circuit true test system of the conductor contact of the switch equipment provided by the embodiment can simulate//>The process of the insulated switchgear conductor contact burning and melting short circuit fault is clear/>//>A thermal conduction mechanism of an insulated switchgear conductor contact, a overheat fault diagnosis criterion, a overheat burning short-circuit fault mechanism and the like. Can simulate/>//>The actual working conditions of voltage and current of the insulated switching equipment during operation truly reflect the complete process of contact melting short circuit, help operation and maintenance personnel analyze fault reasons, formulate effective fault diagnosis and measures for preventing heating short circuit, reduce the fault rate of the equipment and promote/>//>The reliability of the insulated high-voltage switch equipment ensures the safe and stable operation of the equipment.
Based on the above-mentioned real test system for the fuse short circuit of the conductor contact of the switch device, the test method provided by the invention can be applied to the protection monitoring system in the real test system for the fuse short circuit of the conductor contact of the switch device, see fig. 9, and can comprise the following steps:
step 410, monitoring contact temperature of the adjustable resistance contact and the highest temperature of the metal shell of the switching equipment under the action of rated voltage when different preset load currents.
In a specific application scenario, a voltage loop can be utilized to provide continuous and stable rated voltage for a true test platform, a current loop can be utilized to provide different preset load currents for the true test platform, and a protection monitoring system can be used for adjusting the contact temperature of a resistance contact and the highest temperature of a shell of a metal shell of a switching device when different preset load currents are monitored by a temperature monitoring module under the action of the rated voltage.
When the contact temperature of the adjustable resistance contact is monitored, a temperature monitoring module can be used for monitoring a temperature value of a preset temperature test point, and the contact temperature of the adjustable resistance contact is determined based on the temperature value. Preset temperature test points include, but are not limited to: the contact position of the contact finger and the conductor moving contact (temperature test point 1), the contact position of the contact finger and the conductor static contact (temperature test point 2), the contact finger position (temperature test point 3) and the conductor static contact position (temperature test point 4). In determining the contact temperature of the adjustable resistance contact based on the temperature value, the arithmetic average of the temperature test points 1,2, 3,4 may be determined as the contact temperature of the adjustable resistance contact.
And step 420, calculating a target relation between the contact temperature and the shell temperature rise as well as the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to different preset load currents.
For the embodiment of the disclosure, when calculating the target relational expression of the contact temperature, the shell temperature rise and the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to different preset load currents:
Firstly, the load current in the true test platform can be increased to any one preset load current I 1 through a current loop, the change of the resistance temperature of the contact is observed, and when the resistance temperature is not changed stably, the contact temperature T 1, the highest temperature T 1 of the shell and the ambient temperature T 0 are recorded. There is a functional relationship that the contact temperature is a binary function of the load current, the shell temperature rise, f (t 1)=F(T1-T0,I1);
Then, the load current in the true test platform can be increased to another preset load current I 2 through the current loop, the temperature change of the contact resistance is observed, and when the resistance temperature is not changed stably, the contact temperature T 2, the shell highest temperature T 2 and the environment temperature T 0 are recorded. A set of functional relationships for the contact temperatures, f (t 2)=F(T2-T0,I2), is obtained. And by analogy, obtaining a series of relations between contact temperature, shell temperature rise and load current, and f (t n)=F(Tn-T0,In). From this series of data, a cluster of contact temperatures can be plotted against housing temperature rise, load current as shown in fig. 8. The target relation between the contact temperature T and the shell temperature rise delta T (delta T=T n-T0) and the load current I, namely F (T) =F (delta T, I), is obtained through curve fitting and interpolation technology.
The preset load current I 1, the preset load current I 2, and the preset load current I n are different load current values, and may be set to any value under the rated load current, and specific values may be set according to actual application scenarios, which are not specifically limited herein.
Accordingly, for embodiments of the present disclosure, the embodiment steps may include: the control current loop updates the real-time load current to any one of a plurality of preset load currents; aiming at any one preset load current of a plurality of preset load currents, when the contact temperature of the adjustable resistance contact is not changed any more, recording the contact temperature, the environment temperature and the shell highest temperature corresponding to the preset load current, and calculating an initial functional relation between the contact temperature, the load current and the shell temperature under the preset contact resistance based on the preset load current, the contact temperature, the environment temperature and the shell highest temperature; acquiring a plurality of initial function relation formulas corresponding to a plurality of preset load currents; fitting a plurality of initial functional relation formulas to obtain a target relation formula of contact temperature and shell temperature rise and load current under the preset contact resistance.
The corresponding target relation is determined for each preset contact resistance, so that when the follow-up contact is subjected to overheat overhaul and fuse short-circuit early warning, the real-time calculation and prediction of the contact temperature can be directly carried out according to the real-time contact resistance of the adjustable resistance contact and the corresponding target relation of the real-time contact resistance, and the prevention measures of heating short-circuit are carried out before fuse short-circuit in time, so that short-circuit accidents are avoided.
And 430, performing power failure processing and burning short-circuit early warning when the adjustable resistance contact is judged to be overheated based on the target relational expression.
After the target relation is obtained by fitting, if the current load current I is known, the overheat temperature of the contact can be obtained by the temperature rise of the metal shell. When the overheat temperature reaches a certain preset temperature value, such as 50 ℃, it can be considered that there is a defect of poor contact inside, and then the early warning of the burn-out short of the adjustable resistance contact 110 can be performed, and the early warning of the burn-out short is used for indicating a preventive measure of heating short before the burn-out short, such as performing power-off treatment on the switching device. The burning short-circuit warning mode may include, but is not limited to, one or more of a plurality of warning modes including sound warning, vibration warning, short message warning, light warning, audio warning, etc., which are not limited in detail herein.
As a preferred manner, the embodiment steps may further include: and dynamically adjusting the load current value of the current loop to enable the contact temperature to reach the contact metal melting temperature under the preset contact resistance, and performing the burning short circuit simulation of the adjustable resistance contact under the contact metal melting temperature. Specifically, when the burn-out short circuit simulation is performed, the contact resistance of the adjustable resistance contact can be adjusted to a resistance value before the fault, the output current of the current loop is slowly increased, the change of the contact temperature is observed at any time, the output current of the current loop is increased to a load current value before the fault, and the contact temperature is observed. At the moment, the temperature of the contact can be gradually increased, when the temperature of the contact reaches the metal melting temperature of the contact, the metal solution of the contact drops downwards, and a burning and short circuit true test system of the conductor contact of the switch equipment can generate short circuit and protect tripping.
In a specific application scene, when the contact melting short circuit process simulation is carried out by the melting short circuit true test system of the conductor contact of the switch equipment, the using method and the steps are as follows:
S1: and adjusting the contact resistance of the adjustable resistance contact. Specifically, the operating mechanism can be used for controlling the adjustable resistance contact to be in a switching-off state, the hand hole cover 113 is opened, the adjustable resistance contact 110 is adjusted to a certain resistance value R k, the hand hole cover 113 is covered, and the fastening bolt is fastened with corresponding moment. And then the operating mechanism is used for controlling the adjustable resistance contact to be in a closing state. A loop resistance tester is connected to both ends of the conductor 114, and the actual value of the contact resistance of the adjustable resistance contact 110 is measured by the loop resistance tester And recorded. And then the loop resistance tester can be disassembled. In judging the resistance value R k and the actual value/>, of the contact resistanceWhen the resistance deviation is smaller than the preset threshold, the following steps are continuously executed.
S2: and (5) vacuumizing. Connecting a vacuumizing device pipeline to a valve port of the barometer 112, vacuumizing to a first preset pressure (below 133Pa for example) and continuously vacuumizing, stopping pumping for a second preset time (30 min for example) after maintaining the first preset time (30 min for example) for vacuumizing, recording the vacuum degree (A), separating for a third preset time (5 h for example) for reading the vacuum degree (B), and stopping vacuumizing if the values (B) - (A) are smaller than the preset threshold (133 Pa for example).
S3: filling in//>Binary gas,/> //>In binary gas/>And/>Mixing is performed according to a predetermined mixing ratio, which may be, for example, 3:7 (+ -1%), and the inflation pressure is a second predetermined pressure level (e.g., 0.5 MPa).
S4: according to the circuit principle shown in fig. 1, a true test loop and a protection monitoring system are connected with a true test platform.
S5: and confirming that all the switches are turned off, and the gear of the voltage regulator is 0. And (3) closing a protection switch QF4 and a switch QF3, slowly adjusting the voltage regulator T2, and reading the voltage value of the secondary side of the voltage regulator T2 to the rated phase voltage Ue by utilizing a voltage monitoring module in the protection monitoring system.
S6: and (3) closing a protection switch QF1, slowly adjusting a voltage regulator T1, and reading the current value of the secondary side of the current transformer CT by using a current monitoring module in the protection monitoring system.
S7: the load current in the true test platform is increased to any one preset load current I 1 through the current loop, the temperature change of the contact resistance is observed, and when the resistance temperature is not changed stably any more, the contact temperature T 1, the shell highest temperature T 1 and the environment temperature T 0 are recorded. There is a functional relationship that the contact temperature is a binary function of the load current, the shell temperature rise, f (t 1)=F(T1-T0,I1);
S8: and (3) increasing the load current in the true test platform to another preset load current I 2 through a current loop, observing the temperature change of the contact resistance, and recording the contact temperature T 2, the shell highest temperature T 2 and the environment temperature T 0 after the resistance temperature is not changed stably. A set of functional relationships for the contact temperatures, f (t 2)=F(T2-T0,I2), is obtained. And by analogy, obtaining a series of relations between contact temperature, shell temperature rise and load current, and f (t n)=F(Tn-T0,In). From this series of data, a cluster of contact temperatures can be plotted against housing temperature rise, load current as shown in fig. 8. By curve fitting technology, the target relation between the contact temperature T and the shell temperature rise delta T (delta T=T n-T0) and the load current I, namely F (T) =F (delta T, I), is obtained.
If the current I is known, the overheat temperature of the contact can be obtained. When the temperature reaches a certain value, such as 50 ℃, the contact defect exists in the adjustable resistance contact, and power failure treatment equipment is needed.
S9: the method for recovering the overheat melting faults of the contact comprises the following steps: and adjusting the contact resistance to the resistance value before failure. And slowly increasing the output current of the current loop, observing the change of the contact temperature at any time, increasing the output current of the current loop to a load current value before failure, and observing the contact temperature. At the moment, the temperature of the contact can be gradually increased, when the temperature of the contact reaches the metal melting temperature of the contact, the metal solution of the contact drops downwards, and a burning and short circuit true test system of the conductor contact of the switch equipment can generate short circuit and protect tripping.
The embodiment of the invention has the following beneficial effects: setting a disconnecting switch air chamber in the true test platform, and simulating filling in the disconnecting switch air chamber//>The binary gas, the adjustable resistance contact is arranged in the isolating switch gas chamber, and the adjustable resistance contact can be used for providing preset contact resistance for the true test platform; the voltage loop and the current loop in the true test loop respectively provide rated voltage and load current for the true test platform; the protection monitoring system is used for monitoring the contact temperature of the adjustable resistance contact and the shell highest temperature of the metal shell of the switching equipment under the action of rated voltage, calculating target relation between the contact temperature and the shell temperature rise as well as between the contact temperature and the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to the different preset load currents, and carrying out burning short-circuit early warning of the adjustable resistance contact based on the target relation. In addition, the protection monitoring system is also used for dynamically adjusting the load current value of the current loop to enable the contact temperature to reach the contact metal melting temperature under the preset contact resistance, and performing the burning short circuit simulation of the adjustable resistance contact under the contact metal melting temperature. The technical proposal of the application can simulate/>//>The process of the insulated switchgear conductor contact burning and melting short circuit fault is clear/>//>A thermal conduction mechanism of an insulated switchgear conductor contact, a overheat fault diagnosis method, a overheat burning short-circuit fault mechanism and the like. Can simulate/>//>The actual working conditions of voltage and current of the insulated switching equipment during operation truly reflect the complete process of contact melting short circuit, help operation and maintenance personnel analyze fault reasons, formulate effective fault diagnosis and measures for preventing heating short circuit, reduce the fault rate of the equipment and promote/>//>The reliability of the insulated high-voltage switch equipment ensures the safe and stable operation of the equipment.
While the present invention has been described with reference to the exemplary embodiments, it should be understood that the present invention is not limited to the above-described exemplary embodiments. It will be apparent to those skilled in the art that the above-described exemplary embodiments may be modified without departing from the scope and spirit of the present disclosure. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
Claims (10)
1. A burning-out short circuit true test system of a switch device conductor contact is characterized in that the switch device is filled with//>Binary gas switching device, said/>//>In binary gas/>And/>Mixing according to a preset mixing ratio, wherein the burning-out short circuit true test system of the conductor contact of the switch equipment comprises: the test system comprises a true test platform, a true test loop and a protection monitoring system, wherein the true test platform comprises a metal shell of a switch device, and a charge/>, which is deployed in the metal shell of the switch device//>The device comprises a binary gas isolating switch air chamber, wherein an adjustable resistance contact is arranged in the isolating switch air chamber and used for providing a preset contact resistance for the true test platform, and the true test loop comprises a voltage loop and a current loop;
The voltage loop and the current loop are respectively connected with the real test platform, the voltage loop is used for providing rated voltage for the real test platform, and the current loop is used for providing load current for the real test platform;
the protection monitoring system is connected with the true test platform, the voltage loop and the current loop, is used for monitoring the contact temperature of the adjustable resistor contact and the shell highest temperature of the metal shell of the switching equipment under the action of the rated voltage, and is used for calculating a target relation between the contact temperature and the shell temperature and between the contact temperature and the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to the different preset load currents, and carrying out power failure processing and fuse short-circuit early warning when judging that the adjustable resistor contact is overheated based on the target relation;
The protection monitoring system is also used for dynamically adjusting the load current value of the current loop to enable the contact temperature to reach the contact metal melting temperature under the preset contact resistance, and performing the burning short circuit simulation of the adjustable resistance contact under the contact metal melting temperature.
2. The true burn-in short test system for a switchgear conductor contact of claim 1 wherein said adjustable resistance contact comprises: the contact finger fastening spring, N contact fingers, a contact shielding cover, a conductor moving contact and a conductor static contact;
the contact finger fastening springs are used for fastening N contact fingers into annular plum blossom contacts;
the plum blossom contact is fixed between the conductor moving contact and the conductor fixed contact, and the contact shielding cover is used for shielding the plum blossom contact at the periphery;
the adjustable resistance contact is used for adjusting the contact resistance provided by the adjustable resistance contact by increasing or decreasing the number of the contact fingers.
3. The true test system for a fuse and short circuit of a switchgear conductor contact of claim 1, wherein the true test platform further comprises: a conductor, two insulating spacers, and a handhole cover;
The conductor is used for filling the inside of the metal shell of the switch equipment //>A first chamber of binary gas;
Two of the insulating spacers are used for isolating the first air chamber into three second air chambers, and the three second air chambers are filled independently of each other //>Binary gas, and barometers are respectively arranged, and are used for displaying the gas pressure in the second air chamber;
The adjustable resistance contact is positioned in an isolating switch air chamber between the two insulating partition boards, a hand hole cover is arranged above the isolating switch air chamber, and the lower part of the isolating switch air chamber is connected with the protection monitoring system.
4. A fused short circuit true test system for a switchgear conductor contact according to claim 3, wherein said true test platform further comprises: a voltage loading terminal, a current loading terminal, and a support insulator;
the voltage loading terminal is arranged on the metal shell of the switching equipment and is used for being connected with the voltage loop;
the current loading terminals are arranged at two ends of the conductor and are used for being connected with the current loop;
The support insulator is arranged at the bottom of the metal shell of the switching equipment and is used for supporting the true test platform.
5. The switchgear conductor contact's fuse-less true test system of claim 4 wherein the voltage loop comprises: two switches QF3, two protection switches QF4, a voltage regulator T2, a voltmeter V3, and voltage dividing capacitors C1 and C2;
The first ends of the two protection switches QF4 are connected into an alternating current power supply, the second ends of the two protection switches QF4 are connected with the voltmeter V3 in parallel, the voltmeter V3 is connected to the primary side of the voltage regulator T2 in parallel, the secondary side of the voltage regulator T2 is connected with a voltage divider formed by voltage dividing capacitors C1 and C2 in parallel, the two ends of the voltage divider are connected with the first ends of the two switches QF3 in parallel, and the second ends of the two switches QF3 are connected with a voltage loading terminal of the true test platform;
Wherein the protection switch QF4 is used for tripping when a short circuit or an electric shock condition occurs so as to protect the voltage loop; the voltage regulator T2 is used for increasing 220V alternating voltage provided by the alternating current power supply to rated voltage required by the true test platform; the voltmeter V3 is used for monitoring the voltage of the primary side of the voltage regulator T2 in real time; the voltage divider is used for converting the voltage value of the secondary side of the voltage regulator T2, and the switch QF3 is used for controlling the on-off of the voltage loop.
6. The switchgear conductor contact's fuse-less true test system of claim 4 wherein the current loop comprises: two protection switches QF1, two switches QF2, a voltage regulator T1, a voltmeter V2 and a current transformer CT;
the first ends of the two protection switches QF1 are connected with an alternating current power supply, the second ends of the two protection switches QF1 are connected with the primary side of the voltage regulator T1, the voltmeter V1 is connected with the secondary side of the voltage regulator T1 and the primary side of the current transformer CT in parallel, the secondary side of the current transformer CT is connected with the voltmeter V2 in parallel, the first ends of the two protection switches QF2 are connected with the voltmeter V2 in parallel, and the second ends of the two protection switches QF2 are connected with a current loading terminal of the true test platform;
Wherein the protection switch QF1 is used for tripping when a short circuit occurs so as to protect the current loop; the voltage regulator T1 is used for increasing 220V alternating voltage provided by the alternating current power supply to rated voltage required by the true test platform; the voltmeter V1 is used for monitoring the voltage of the primary side of the current transformer CT in real time; the voltmeter V2 is used for monitoring the voltage of the secondary side of the current transformer CT in real time, the current transformer CT is used for converting high-load current into low-load current in proportion, and the switch QF2 is used for controlling on-off of the current loop.
7. The true test system for a fuse and short circuit of a switchgear conductor contact of claim 2 wherein the protection monitoring system comprises a temperature monitoring module, a voltage monitoring module, and a current monitoring module;
The temperature monitoring module is connected with the metal shell of the switch equipment and a preset temperature test point on the adjustable resistor contact and is used for monitoring the highest temperature of the shell of the metal shell of the switch equipment, monitoring the temperature value of the preset temperature test point, determining the contact temperature of the adjustable resistor contact based on the temperature value and displaying the highest temperature of the shell and the contact temperature on a display page;
Wherein, the preset temperature test point at least comprises: the contact position of the contact finger and the conductor moving contact, the contact position of the contact finger and the conductor static contact, the contact finger position and the conductor static contact position;
The voltage monitoring module is connected with the voltage loop and is used for monitoring the rated voltage in real time and displaying the rated voltage on a display page;
the current monitoring module is connected with the current loop and is used for monitoring the load current provided by the current loop in real time and displaying the load current on a display page.
8. A test method for a protection monitoring system in a fuse short circuit true test system for a switchgear conductor contact, the method comprising:
Under the action of rated voltage, monitoring the contact temperature of the adjustable resistance contact at different preset load currents and the highest temperature of the metal shell of the switching equipment;
Calculating a target relation between the contact temperature and the shell temperature rise as well as the load current under a preset contact resistance based on the preset load current and the contact temperature and the shell highest temperature respectively corresponding to different preset load currents;
And based on the target relation, when the overheat of the adjustable resistance contact is judged, carrying out power failure treatment and burning short-circuit early warning.
9. The test method according to claim 8, wherein the calculating the target relation between the contact temperature and the shell temperature rise, and the load current under the preset contact resistance based on the preset load current and the contact temperature and the shell maximum temperature respectively corresponding to the different preset load currents includes:
the control current loop updates the real-time load current to any one of a plurality of preset load currents;
Recording the contact temperature, the environment temperature and the shell highest temperature corresponding to the preset load current when the contact temperature of the adjustable resistance contact is not changed any more aiming at any one of the preset load currents, and calculating an initial functional relation between the contact temperature, the load current and the shell temperature under the preset contact resistance based on the preset load current, the contact temperature, the environment temperature and the shell highest temperature;
acquiring a plurality of initial functional relation formulas corresponding to a plurality of preset load currents;
fitting a plurality of initial functional relation formulas to obtain a target relation formula of contact temperature, shell temperature rise and load current under the preset contact resistance.
10. The assay method of claim 9, wherein the method further comprises:
And dynamically adjusting the load current value of the current loop to enable the contact temperature to reach the contact metal melting temperature under the preset contact resistance, and performing the burning short circuit simulation of the adjustable resistance contact under the contact metal melting temperature.
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| CN202410573316.3A CN118150999B (en) | 2024-05-10 | 2024-05-10 | System and method for testing true type of burning-out short circuit of conductor contact of switching equipment |
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| CN108181000A (en) * | 2018-01-02 | 2018-06-19 | 国网上海市电力公司 | A kind of contact of breaker detection method for temperature rise based on GIS housing thermometrics |
| CN209640457U (en) * | 2019-01-02 | 2019-11-15 | 国网吉林省电力有限公司电力科学研究院 | A kind of true type GIS overheating malfunction monitoring experimental provision |
| CN111665457A (en) * | 2020-05-30 | 2020-09-15 | 国网上海市电力公司 | GIS bus contact defect experiment simulation device and method |
| CN115808255A (en) * | 2022-12-02 | 2023-03-17 | 国网辽宁省电力有限公司电力科学研究院 | Early warning system and method for overheating of contacts in embedded high-voltage combined electrical appliance |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108181000A (en) * | 2018-01-02 | 2018-06-19 | 国网上海市电力公司 | A kind of contact of breaker detection method for temperature rise based on GIS housing thermometrics |
| CN209640457U (en) * | 2019-01-02 | 2019-11-15 | 国网吉林省电力有限公司电力科学研究院 | A kind of true type GIS overheating malfunction monitoring experimental provision |
| CN111665457A (en) * | 2020-05-30 | 2020-09-15 | 国网上海市电力公司 | GIS bus contact defect experiment simulation device and method |
| CN115808255A (en) * | 2022-12-02 | 2023-03-17 | 国网辽宁省电力有限公司电力科学研究院 | Early warning system and method for overheating of contacts in embedded high-voltage combined electrical appliance |
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