CN118132452A - Remote test system - Google Patents
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- G—PHYSICS
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
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- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
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Abstract
The application relates to the technical field of remote testing, in particular to a remote testing system. The cloud platform comprises industrial control equipment, a cloud platform and at least one test device; the industrial control equipment is arranged in a preset distance range of the position of the equipment to be tested: each test device is provided with a first processing module; the industrial control equipment is provided with a second processing module; the first processing module sends the target test instruction to a cloud platform; the second processing module responds to the first receiving of a target test instruction issued by the cloud platform, and a target virtual machine is built; testing each target test object according to the target virtual machine and each target test instruction, and generating a corresponding target test feedback picture; and returning the target test feedback picture to the corresponding test equipment through the cloud platform. The application realizes reasonable allocation of test resources, saves test time, avoids potential safety hazard caused by data leakage, and maintains data safety.
Description
Technical Field
The application relates to the field of remote testing, in particular to a remote testing system.
Background
When the attack test or other tests are carried out on the equipment to be tested such as vehicles or certain intelligent furniture, the software and the hardware of the equipment to be tested are directly connected with the testing equipment to carry out the targeted test, namely, a tester is required to test the equipment nearby the equipment to be tested, and the testing equipment has corresponding limiting conditions on the site and the testing distance. In some special cases, if the tester is inconvenient to perform near field test, the virtual machine is selected to perform remote test, and when the virtual machine is used to perform remote test, the virtual machine is directly controlled to connect with a component of the device to be tested to perform test, so that when a plurality of testers remotely access the same virtual machine at the same time, a resource competition problem may be caused to affect the test precision and the test efficiency, and in summary, a remote test method capable of reasonably distributing test resources and improving the test efficiency is needed.
Disclosure of Invention
The technical problems to be solved by the application are as follows: how to reasonably allocate test resources and improve test efficiency during remote test.
In view of the above technical problems, according to a first aspect of the present application, there is provided a remote test system, including an industrial control device, a cloud platform, and at least one test device; the industrial control equipment is arranged in a preset distance range of the position of the equipment to be tested: each test device is provided with a first processing module; the industrial control equipment is provided with a second processing module.
The first processing module is used for executing the following steps:
S110, sending the target test instruction to the cloud platform.
The second processing module is used for executing the following steps:
S210, a target virtual machine is established in response to the first receiving of a target test instruction issued by the cloud platform; each target test instruction is provided with a corresponding target test object; the target test object comprises a virtual object and a non-virtual object; the virtual object is obtained by carrying out virtualization on the corresponding virtual object according to the Docker virtualization technology; the virtual object is connected with the virtual machine; the same virtualized real object can generate a plurality of corresponding virtual objects at the same time; the non-virtual object is a real object which cannot be virtualized; and the non-virtual object is connected with the industrial control equipment.
S220, testing each target test object according to the target virtual machine and each target test instruction, and generating a corresponding target test feedback picture.
S230, returning the target test feedback picture to the corresponding test equipment through the cloud platform.
The application has at least the following beneficial effects:
According to the remote test generation method provided by the application, according to the actual properties of the components in the device to be tested, the virtual objects are obtained by virtualizing part of the components which can be virtualized through a lightweight Docker virtualization technology, and the part of the components which can be virtualized can simultaneously generate a plurality of virtual objects, namely, a plurality of test devices are supported to simultaneously test. For parts which are frequently interacted with other parts or are difficult to virtualize due to too complex interfaces, the parts are connected with a virtual machine to realize the test of non-virtual objects, in the embodiment, the virtualization of parts is performed according to the actual properties of the parts in the equipment to be tested instead of all the virtualization, so that the test accuracy is ensured, and on the other hand, the virtual objects can simultaneously support multi-terminal test, so that the reasonable allocation of test resources is realized, and the test time is saved.
And after the test result is generated, the test result is returned to the corresponding test equipment in the form of a target test feedback picture, and the test equipment acquires the test result according to the target test feedback picture. And the data corresponding to the target test feedback picture and other test data are stored in the industrial control equipment, so that potential safety hazards caused by data leakage are avoided. Data security is maintained.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a block diagram of a remote test system according to one embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to fall within the scope of the application.
As shown in fig. 1, a remote test system is provided according to an embodiment of the present application, where the remote test system includes an industrial control device, a cloud platform, and at least one test device; the industrial control equipment is arranged in a preset distance range of the position of the equipment to be tested: each test device is provided with a first processing module; the industrial control equipment is provided with a second processing module.
In this embodiment, as an example, the industrial control device may be a wind control sandbox, which is disposed in a preset distance range of a location where the device to be tested is located, and the device to be tested may be an internet of things device such as a vehicle, a home appliance, and the like. The cloud platform is used as an information transmission medium and receives a target test instruction sent by each test device; and issuing each target test instruction to the industrial control equipment according to a preset rule.
The first processing module is used for executing the following steps:
S110, sending the target test instruction to the cloud platform.
Specifically, each target test instruction has a corresponding test object, here, as an example: the test object is a piece of hardware of the device under test.
The second processing module is used for executing the following steps:
S210, a target virtual machine is established in response to the first receiving of a target test instruction issued by the cloud platform; each target test instruction is provided with a corresponding target test object; the target test object comprises a virtual object and a non-virtual object; the virtual object is obtained by carrying out virtualization on the corresponding virtual object according to the Docker virtualization technology; the virtual object is connected with the virtual machine; the same virtualized real object can generate a plurality of corresponding virtual objects at the same time; the non-virtual object is a real object which cannot be virtualized; and the non-virtual object is connected with the industrial control equipment.
Specifically, when the second processing module of the industrial control device receives the target test instruction issued by the cloud platform, a target virtual machine is built in the industrial control device, various tools are integrated in the target virtual machine, and links (USB, bluetooth, wifi, protocols and the like) connected with the target test object are integrated in the target virtual machine. At this time, for the test device, the target virtual machine is displayed in the form of a web page on the test device; each test device is provided with a corresponding tester, and the tester controls the virtual machine in the industrial control device by operating the webpage on the test device.
In addition, the target test object comprises a virtual object and a non-virtual object, wherein the virtual object is obtained by virtualizing a corresponding virtualizable real object according to a Docker virtualization technology. It should be noted that, the interaction between the internal parts of the device to be tested and other parts is frequent, or the interface is too complex, so that it is difficult to implement the virtualization of the parts, because in this embodiment, the parts are used as non-virtual objects, i.e. the parts are connected with the virtual machine by themselves, so as to implement the test of the non-virtual objects; on the contrary, for the components with fewer interfaces and lower interaction frequency, the corresponding virtualized real objects are virtualized based on the lightweight Docker virtualization technology in the embodiment, the Docker virtualization technology has a corresponding operation environment, hardware in the industrial control equipment can be directly called for processing, the pod is operated in the Docker container, the virtualization of part of the components is realized, the operation is simple, the volume is small, one pod can be operated in a plurality of Docker containers at the same time, namely in the embodiment, a plurality of corresponding virtualized objects can be generated for the same virtualized real object at the same time, and further for the same virtualized real object, the simultaneous test of a plurality of test devices can be supported, and each test device corresponds to the virtual object operated in one Docker. And for non-virtual objects, only one test device can be supported for testing at a time.
In another embodiment, real objects may also be virtualized using kvm, qemu host virtualization, and lxc user space virtualization techniques.
In this embodiment, according to the actual properties of the components in the device to be tested, the part of the components that can be virtualized is virtualized by a lightweight dock virtualization technology to obtain the virtual object, and the part of the components that can be virtualized can generate multiple virtual objects at the same time, that is, support multiple test devices to test at the same time. For parts which are frequently interacted with other parts or are difficult to virtualize due to too complex interfaces, the parts are connected with a virtual machine to realize the test of non-virtual objects, in the embodiment, the virtualization of parts is performed according to the actual properties of the parts in the equipment to be tested instead of all the virtualization, so that the test accuracy is ensured, and on the other hand, the virtual objects can simultaneously support multi-terminal test, so that the reasonable allocation of test resources is realized, and the test time is saved.
S220, testing each target test object according to the target virtual machine and each target test instruction, and generating a corresponding target test feedback picture.
S230, returning the target test feedback picture to the corresponding test equipment through the cloud platform.
Specifically, after the test result is generated, the test result is returned to the corresponding test equipment in the form of a target test feedback picture, and the test equipment acquires the test result according to the target test feedback picture. And the data corresponding to the target test feedback picture and other test data are stored in the industrial control equipment, so that potential safety hazards caused by data leakage are avoided. Data security is maintained.
In an exemplary embodiment of the present application, the industrial control device further includes a security detection module, where the security detection module is configured to perform security detection on each target test instruction.
Specifically, the application sets up the security detection module in the industrial control equipment, is used for carrying on security detection to the data and tool that each goal test instruction corresponds to.
In an exemplary embodiment of the present application, data corresponding to the target test feedback frame is stored in the industrial control device.
In an exemplary embodiment of the present application, a plurality of virtual machines may be simultaneously built in the industrial control device.
Specifically, one virtual machine may have a plurality of ports, and if necessary, a plurality of virtual machines may be built in the industrial control device to perform simultaneous operation.
In an exemplary embodiment of the present application, the cloud platform is provided with a temporary list of critical test instructions; the temporary key test instruction list is used for storing a test equipment priority list corresponding to each key test instruction; the key test instruction is that the corresponding target test object is a non-virtual object, and the corresponding test equipment to be tested is at least two target test instructions; each test device corresponds to a tester.
Specifically, only one test device can be supported for testing at a time due to the non-virtual object. Therefore, if there are multiple test devices to test the same target test task, that is, to test the same non-virtual object, the test needs to be sequentially performed. At this time, the cloud platform determines its corresponding test sequence. A key test instruction temporary storage list is arranged in the cloud platform; the temporary key test instruction list is used for storing a test equipment priority list corresponding to each key test instruction; the key test instructions are at least two target test instructions, wherein the corresponding target test objects are non-virtual objects, and the corresponding test equipment to be tested is at least two target test instructions. For a non-virtual object to be tested by a plurality of testing devices at the same time, the priority of the testing devices corresponding to the non-virtual object is required to be determined, and then the testing sequence is determined according to the priority of each corresponding testing device. In this embodiment, the higher the priority of the test apparatus, the more advanced the test.
Specifically, the determination of the priority of the test equipment is as follows:
the cloud platform is further provided with a third processing module, and the third processing module is used for executing the following steps:
S310, responding to the key test instruction uploaded by any test equipment, and acquiring each key skill corresponding to the key test instruction.
Specifically, each target test instruction has its corresponding required skill, that is, the skill required to complete the target test instruction, as an example: the skills may include: network and protocol skills, operating system skills, security tool use skills, code audit skills, and the like.
S320, obtaining skill requirement information corresponding to each completed historical test instruction of a tester corresponding to the test equipment so as to obtain a historical test instruction matrix Z; z meets the following requirements:
Wherein i=1, 2, n; n is the number of preset skills; j=1, 2, m; m is the number of the history test instructions completed by the corresponding testers of the test equipment; z ji is the requirement information of the ith preset skill corresponding to the jth completed historical test instruction of the tester corresponding to the test equipment; z ji =0 or Z ji =1;
specifically, skill requirement information corresponding to each completed historical test instruction of the tester corresponding to the test equipment is obtained. Here, the preset skills may be each preset skill included in the preset skill library. In one embodiment, Z ji =0 indicates that the j-th completed historical test instruction of the tester corresponding to the test device does not require the i-th preset skill to be applied; z ji = 1 indicates that the j-th completed historical test instruction of the tester corresponding to the test apparatus requires the i-th preset skill to be applied. According to Z, the skill requirement condition corresponding to each completed historical test instruction of the tester corresponding to the test equipment can be obtained.
S330, obtaining a historical instruction score D 1,D2,...,Dj,...,Dm corresponding to each completed historical test instruction of the tester corresponding to the test equipment so as to obtain a scoring matrix ZD; d j is the score of the history instruction corresponding to the j-th completed history test instruction of the tester corresponding to the test equipment; wherein ZD meets the following requirements:
Wherein ZD ji is a skill score for the preset skill corresponding to Z ji; ZD ji=Zji×Dj;
Specifically, when the tester corresponding to the test equipment completes each historical test instruction, each historical test instruction has a corresponding score. Here, the higher the score of a certain historical test instruction, the higher the proficiency of the corresponding tester of the test equipment for the preset skill corresponding to the historical test instruction with the higher score may be or may be more proficient; and obtaining a scoring matrix according to the scoring of the historical instructions corresponding to each historical test instruction.
S340, obtaining a sub-priority list P= (P 1,P2,...,Px,...,Py) of each preset skill identical to the key skill according to the score of each skill corresponding to the preset skill identical to the key skill in the ZD; x=1, 2,/y; y is less than or equal to n; y is the number of preset skills in Z, which correspond to the same key skills; p x is the sub-priority of the x-th preset skill in Z, which corresponds to the same key skill; p x=（Σj=1 mZDjx)/m.
Specifically, selecting each skill score corresponding to the preset skill identical to each key skill from ZD, and further obtaining the sub-priority of each preset skill identical to the key skill. Here, the larger P x, the higher the proficiency of the tester with respect to the preset skills, or the more proficient the tester may be, and the higher the frequency of use in the historical test instructions may be.
S350, according to P, obtaining the priority Y of the test equipment for the key test instruction; y meets the following conditions:
Y=Σx=1 yPx。
S360, determining the issuing sequence of the target test instruction corresponding to the test equipment according to the Y.
Specifically, the sub-priorities corresponding to the preset skills with the same key skills are summed to obtain the priority of the testing equipment for the key testing instruction. I.e., the higher the priority of the test equipment for a critical test instruction, the more proficient or possibly proficiency the test equipment may be in explaining the majority of skill required by the test personnel corresponding to the critical test instruction. In this embodiment, the larger Y is, the earlier the target test instruction of the test device corresponding to Y is issued to the industrial control device, so as to test the corresponding non-virtual object. Therefore, if there are multiple test devices to test the same target test task, that is, to test the same non-virtual object, the test needs to be sequentially performed. Therefore, the proficiency or proficiency of each preset skill of the tester is evaluated according to the skill requirement condition corresponding to each completed historical test task of the tester corresponding to each test device and the historical instruction score of each completed historical test task. And then according to each key skill corresponding to the key test instruction, acquiring the corresponding skill sub-priority in the ZD, and finally summing to obtain the test equipment priority for the key test instruction. According to the method and the system, the priority of the test target test task of each test device is comprehensively calculated according to the proficiency or proficiency of the corresponding tester of each test device for each key skill. The method and the device have the advantages that the tester with higher skill or proficiency degree for the target test task can test preferentially, the problem of the equipment to be tested can be found in advance, and the whole test process can be carried out orderly.
In an exemplary embodiment of the present application, the step S330 may be replaced with:
S370, obtaining a historical instruction score D 1,D2,...,Dj,...,Dm corresponding to each completed historical test instruction; to obtain a scoring matrix ZD; d j is the historical instruction score corresponding to the j-th completed historical test instruction of the tester corresponding to the test equipment; wherein ZD meets the following requirements:
Wherein ZD ji is a skill score for the preset skill corresponding to Z ji; ZD ji=Zji×Dj×Aji;Aji is the required proportional value of the preset skill corresponding to Z ji; a ji is obtained according to a preset demand proportion mapping table; the preset demand proportion mapping table comprises a demand degree proportion value of each preset skill relative to each test instruction.
Specifically, since the importance degree of each test instruction and each skill may be different, that is, the demand proportion of each test instruction to each skill may be different, when ZD is determined, the demand proportion value of each test instruction to each skill is taken into consideration, so that the demand difference of any two test instructions to the skill can be reflected, and the corresponding score is more accurate.
In an exemplary embodiment of the present application, after step S340, the method further includes:
S380, if P x is smaller than or equal to a preset sub-priority threshold, acquiring an associated preset skill list PG x=(PGx1,PGx2,...,PGxp,...,PGxf(x) corresponding to P x according to a preset associated skill mapping table; p=1, 2, f (x); wherein f (x) is the number of associated preset skills corresponding to P x; PG xp is the P-th associated preset skill corresponding to P x; the preset associated skill mapping table comprises each preset skill and each associated preset skill corresponding to the preset skill.
Specifically, if P x is less than or equal to the preset sub-priority threshold, it is indicated that the current key test instruction corresponds to the key skill P x, the tester corresponding to the test device uses or uses very low frequency or occupies very low demand level proportion value in each historical test instruction, and in order to be able to determine the sub-priorities of the key skills, the corresponding associated skill is obtained, because the skills and skills may have an association relationship, and the knowledge system and operation flow may be partially intercommunicated, thereby determining the corresponding sub-priority according to the associated skill.
S390, obtaining the associated preset skill sub-priority list PGA x=(PGAx1,PGAx2,...,PGAxp,...,PGAxf(x) according to PG x and ZD).
S3100, if P x 0＞Px, replacing P x with P x 0;Px 0 meets the following conditions: p x 0=（Σp=1 f(x)PGAxp)/f (x); and jumps to step S350.
Specifically, the average value of the sub-priorities of each associated skill of the key skills corresponding to the P x is obtained, if the average value is larger than the P x, the replacement is performed, and the sub-priorities of the P x obtained by the method are more accurate.
Embodiments of the present application also provide a computer program product comprising program code for causing an electronic device to carry out the steps of the method according to the various exemplary embodiments of the application described in the present specification when the program product is run on the electronic device.
Furthermore, although the steps of the methods in the present disclosure are depicted in a particular order in the drawings, this does not require or imply that the steps must be performed in that particular order, or that all illustrated steps be performed, to achieve desirable results. Additionally or alternatively, certain steps may be omitted, multiple steps combined into one step to perform, and/or one step decomposed into multiple steps to perform, etc.
From the above description of embodiments, those skilled in the art will readily appreciate that the example embodiments described herein may be implemented in software, or may be implemented in software in combination with the necessary hardware. Thus, the technical solution according to the embodiments of the present disclosure may be embodied in the form of a software product, which may be stored in a non-volatile storage medium (may be a CD-ROM, a U-disk, a mobile hard disk, etc.) or on a network, including several instructions to cause a computing device (may be a personal computer, a server, a mobile terminal, or a network device, etc.) to perform the method according to the embodiments of the present disclosure.
In an exemplary embodiment of the present disclosure, an electronic device capable of implementing the above method is also provided.
Those skilled in the art will appreciate that the various aspects of the application may be implemented as a system, method, or program product. Accordingly, aspects of the application may be embodied in the following forms, namely: an entirely hardware embodiment, an entirely software embodiment (including firmware, micro-code, etc.) or an embodiment combining hardware and software aspects may be referred to herein as a "circuit," module "or" system.
An electronic device according to this embodiment of the application. The electronic device is merely an example, and should not impose any limitations on the functionality and scope of use of embodiments of the present application.
The electronic device is in the form of a general purpose computing device. Components of an electronic device may include, but are not limited to: the at least one processor, the at least one memory, and a bus connecting the various system components, including the memory and the processor.
Wherein the memory stores program code that is executable by the processor to cause the processor to perform steps according to various exemplary embodiments of the present application described in the above section of the exemplary method of this specification.
The storage may include readable media in the form of volatile storage, such as Random Access Memory (RAM) and/or cache memory, and may further include Read Only Memory (ROM).
The storage may also include a program/utility having a set (at least one) of program modules including, but not limited to: an operating system, one or more application programs, other program modules, and program data, each or some combination of which may include an implementation of a network environment.
The bus may be one or more of several types of bus structures including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus architectures.
The electronic device may also communicate with one or more external devices (e.g., keyboard, pointing device, bluetooth device, etc.), with one or more devices that enable a user to interact with the electronic device, and/or with any device (e.g., router, modem, etc.) that enables the electronic device to communicate with one or more other computing devices. Such communication may be through an input/output (I/O) interface. And, the electronic device may also communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN), and/or a public network, such as the Internet, through a network adapter. As shown, the network adapter communicates with other modules of the electronic device over a bus. It should be appreciated that although not shown, other hardware and/or software modules may be used in connection with an electronic device, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID systems, tape drives, data backup storage systems, and the like.
From the above description of embodiments, those skilled in the art will readily appreciate that the example embodiments described herein may be implemented in software, or may be implemented in software in combination with the necessary hardware. Thus, the technical solution according to the embodiments of the present disclosure may be embodied in the form of a software product, which may be stored in a non-volatile storage medium (may be a CD-ROM, a U-disk, a mobile hard disk, etc.) or on a network, including several instructions to cause a computing device (may be a personal computer, a server, a terminal device, or a network device, etc.) to perform the method according to the embodiments of the present disclosure.
In an exemplary embodiment of the present disclosure, a computer-readable storage medium having stored thereon a program product capable of implementing the method described above in the present specification is also provided. In some possible embodiments, the aspects of the application may also be implemented in the form of a program product comprising program code for causing a terminal device to carry out the steps according to the various exemplary embodiments of the application as described in the "exemplary method" section of this specification, when the program product is run on the terminal device.
The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium can be, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: an electrical connection having one or more wires, a portable disk, a hard disk, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
The computer readable signal medium may include a data signal propagated in baseband or as part of a carrier wave with readable program code embodied therein. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A readable signal medium may also be any readable medium that is not a readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Program code for carrying out operations of the present application may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, C++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device, partly on a remote computing device, or entirely on the remote computing device or server. In the case of remote computing devices, the remote computing device may be connected to the user computing device through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computing device (e.g., connected via the Internet using an Internet service provider).
Furthermore, the above-described drawings are only schematic illustrations of processes included in the method according to the exemplary embodiment of the present application, and are not intended to be limiting. It will be readily appreciated that the processes shown in the above figures do not indicate or limit the temporal order of these processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, for example, among a plurality of modules.
It should be noted that although in the above detailed description several modules or units of a device for action execution are mentioned, such a division is not mandatory. Indeed, the features and functionality of two or more modules or units described above may be embodied in one module or unit in accordance with embodiments of the present disclosure. Conversely, the features and functions of one module or unit described above may be further divided into a plurality of modules or units to be embodied.
The present application is not limited to the above embodiments, and any changes or substitutions that can be easily understood by those skilled in the art within the technical scope of the present application are intended to be included in the scope of the present application. Therefore, the protection scope of the application is subject to the protection scope of the claims.
Claims (7)
1. The remote test system is characterized by comprising industrial control equipment, a cloud platform and at least one test device; the industrial control equipment is arranged in a preset distance range of the position of the equipment to be tested; each test device is provided with a first processing module; the industrial control equipment is provided with a second processing module;
the first processing module is used for executing the following steps:
s110, sending a target test instruction to the cloud platform;
The second processing module is used for executing the following steps:
S210, a target virtual machine is established in response to the first receiving of a target test instruction issued by the cloud platform; each target test instruction is provided with a corresponding target test object; the target test object comprises a virtual object and a non-virtual object; the virtual object is obtained by carrying out virtualization on the corresponding virtual object according to the Docker virtualization technology; the virtual object is connected with the virtual machine; the same virtualized real object can generate a plurality of corresponding virtual objects at the same time; the non-virtual object is a real object which cannot be virtualized; the non-virtual object is connected with the industrial control equipment;
S220, testing each target test object according to the target virtual machine and each target test instruction, and generating a corresponding target test feedback picture;
s230, returning the target test feedback picture to the corresponding test equipment through the cloud platform.
2. The remote test system of claim 1, further comprising a security detection module within the industrial control device, the security detection module configured to perform security detection on each target test instruction.
3. The remote test system of claim 1, wherein a plurality of virtual machines are built simultaneously within the industrial control device.
4. The remote test system of claim 1, wherein the data corresponding to the target test feedback picture is stored in the industrial control device.
5. The remote test system of claim 1, wherein the cloud platform is provided with a temporary list of critical test instructions; the temporary key test instruction list is used for storing a test equipment priority list corresponding to each key test instruction; the key test instruction is that the corresponding target test object is a non-virtual object, and the corresponding test equipment to be tested is at least two target test instructions; each test device corresponds to one tester; the cloud platform is further provided with a third processing module, and the third processing module is used for executing the following steps:
s310, responding to a key test instruction uploaded by any test equipment, and acquiring each key skill corresponding to the key test instruction;
S320, obtaining skill requirement information corresponding to each completed historical test instruction of a tester corresponding to the test equipment so as to obtain a historical test instruction matrix Z; z meets the following requirements:
，
Wherein i=1, 2, n; n is the number of preset skills; j=1, 2, m; m is the number of the history test instructions completed by the corresponding testers of the test equipment; z ji is the requirement information of the ith preset skill corresponding to the jth completed historical test instruction of the tester corresponding to the test equipment; z ji =0 or Z ji =1;
S330, obtaining a historical instruction score D 1,D2,...,Dj,...,Dm corresponding to each completed historical test instruction of the tester corresponding to the test equipment so as to obtain a scoring matrix ZD; d j is the score of the history instruction corresponding to the j-th completed history test instruction of the tester corresponding to the test equipment; wherein ZD meets the following requirements:
，
Wherein ZD ji is a skill score for the preset skill corresponding to Z ji; ZD ji=Zji×Dj;
S340, obtaining a sub-priority list P= (P 1,P2,...,Px,...,Py) of each preset skill identical to the key skill according to the score of each skill corresponding to the preset skill identical to the key skill in the ZD; x=1, 2,/y; y is less than or equal to n; y is the number of preset skills in Z, which correspond to the same key skills; p x is the sub-priority of the x-th preset skill in Z, which corresponds to the same key skill; p x=（Σj=1 mZDjx)/m;
S350, according to P, obtaining the priority Y of the test equipment for the key test instruction; y meets the following conditions:
Y=Σx=1 yPx；
S360, determining the issuing sequence of the target test instruction corresponding to the test equipment according to the Y.
6. The remote testing system of claim 5, wherein Z ji = 0 indicates that the j-th completed historical test instruction of the tester corresponding to the test device does not require application of the i-th preset skill; z ji = 1 indicates that the j-th completed historical test instruction of the tester corresponding to the test apparatus requires the i-th preset skill to be applied.
7. The remote test system of claim 5, wherein S330 is replaced with:
S370, obtaining a historical instruction score D 1,D2,...,Dj,...,Dm corresponding to each completed historical test instruction; to obtain a scoring matrix ZD; d j is the historical instruction score corresponding to the j-th completed historical test instruction of the tester corresponding to the test equipment; wherein ZD meets the following requirements:
，
Wherein ZD ji is a skill score for the preset skill corresponding to Z ji; ZD ji=Zji×Dj×Aji;Aji is the required proportional value of the preset skill corresponding to Z ji; a ji is obtained according to a preset demand proportion mapping table; the preset demand proportion mapping table comprises a demand degree proportion value of each preset skill relative to each test instruction.
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