CN117995255A - Memory self-test dynamic grouping method and device - Google Patents
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Abstract
The invention discloses a memory self-test dynamic grouping method and a device, wherein the method comprises the following steps: obtaining access data of a current period of a memory in a resource to be tested, wherein the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with a test strategy; determining the current access frequency of the memory according to the access data; updating the grouping of the memory according to the current access frequency and the historical access frequency of the memory. The invention perfects the limitation of grouping the memories in the self-test process of the memories in the related technology by taking the access frequency of each memory to be tested in the test resource as the basis, effectively avoids that the test can only be carried out on all the memories according to the fixed test scheme, further provides a reasonable grouping scheme of the memories to be tested on the basis of dynamic grouping by taking the access frequency as the basis, finally improves the test efficiency and flexibility of the memories and saves the test time.
Description
Technical Field
The invention relates to the technical field of chip self-test, in particular to a memory self-test dynamic grouping method and device.
Background
Memory Build-in-self Test (MBIST) is a self-Test technique that is widely used in the integrated circuit arts and provides efficient and accurate testing and fault diagnosis capabilities during product manufacturing and maintenance. MBIST automatic grouping techniques are used in MBIST testing to divide test resources, such as memory, into multiple test groups to improve test efficiency and test coverage. The MBIST automatic grouping technology plays an important role in integrated circuit design, and aims to improve test parallelism and efficiency, reduce overall test time and meet the requirements of design specifications; and helps design engineers to balance between ensuring effective test coverage and reducing test time. As chip complexity increases, the development of MBIST automated grouping technology is also becoming increasingly important to address design and testing challenges.
Currently, MBIST automatic grouping techniques are typically implemented based on classical algorithms or heuristic algorithms. These methods utilize techniques such as graph theory, optimization algorithms, simulators, etc. to analyze and model the logic structure of the chip to find the optimal grouping scheme.
However, for the above classification method, after the grouping is completed, the grouping scheme cannot be changed any more, so that the classification method has a limitation, and thus the classification method cannot be well adapted to the memory test requirements of different application scenes.
Disclosure of Invention
The invention solves the problem of how to realize the rationality and flexibility of the self-test grouping of the memory.
In order to solve the above problems, the present invention provides a memory self-test dynamic grouping method, which includes:
Obtaining access data of a current period of a memory in a resource to be tested, wherein the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with a test strategy;
determining the current access frequency of the memory according to the access data;
And updating the grouping of the memory according to the current access frequency and the historical access frequency of the memory.
Optionally, in the memory self-test dynamic grouping method provided by the invention, the memory groups in the resource to be tested are divided according to the set access frequency interval.
Optionally, the method for self-testing dynamic grouping of memory provided by the present invention, wherein the determining the current access frequency of the memory according to the access data includes:
determining the sum of the write enabling times and the read enabling times of the memory in the current period;
and determining the quotient of the sum and the period as the current access frequency of the memory.
Optionally, the method for self-testing dynamic grouping of memories provided by the present invention, wherein the updating the grouping of the memories according to the current access frequency and the historical access frequency of the memories includes:
determining whether a group adjustment condition is met according to the current access frequency and the historical access frequency of the memory;
when the group adjustment condition is met, determining a target memory group of the memory;
The memory is allocated to the target memory group.
Optionally, in the memory self-test dynamic grouping method provided by the invention, the grouping adjustment condition includes a ratio of the current access frequency to the historical access frequency of the memory, a magnitude relation between the current access frequency of the memory and a current average value of current access frequencies and a historical average value of historical access frequencies of all memories in the resource to be tested, and an access frequency of each memory in the memory group where the memory is currently located.
Optionally, the memory self-test dynamic grouping method provided by the invention includes a first grouping condition and a second grouping condition, wherein the first grouping condition represents a condition to be met when the memory is allocated to a memory group with high access frequency, and the second grouping condition represents a condition to be met when the memory is allocated to a memory group with low access frequency.
Optionally, the method for self-testing dynamic grouping of a memory provided by the present invention, wherein determining whether the grouping condition is satisfied according to the current access frequency and the historical access frequency of the memory includes:
If the historical access frequency of the memory is the highest access frequency in the memory group, when the ratio of the current access frequency to the historical access frequency of the memory is greater than a set first threshold value, the memory is indicated to meet a first group adjustment condition;
Or the historical frequency of the memory is smaller than the historical average value, and the current access frequency of the memory is larger than the current average value, which indicates that the memory meets a first group adjustment condition;
If the historical access frequency of the memory to be tested is not the highest access frequency of the memory group, when the current access frequency of the memory is larger than the historical access frequency of all memories in the current memory group, the memory is indicated to meet a first group adjusting condition.
Optionally, the method for self-testing dynamic grouping of a memory provided by the present invention, wherein determining whether the grouping condition is satisfied according to the current access frequency and the historical access frequency of the memory includes:
if the historical access frequency of the memory is the lowest access frequency in the memory group, when the ratio of the historical access frequency of the memory to the current access frequency is greater than a set second threshold value, the memory is indicated to meet a second group adjustment condition;
Or the historical frequency of the memory is larger than the historical average value, and the current access frequency of the memory is smaller than the current average value, which indicates that the memory meets a second group adjustment condition;
If the historical access frequency of the memory to be tested is not the lowest access frequency of the memory group, when the current access frequency of the memory is lower than the historical access frequency of all memories in the current memory group, the memory meets a second group adjusting condition.
Optionally, the method for dynamically grouping the self-test memories provided by the invention includes:
And determining a target memory group meeting constraint conditions in the memory groups in the test resources according to the current access frequency and the test power of the memory.
Optionally, the memory self-test dynamic grouping method provided by the invention, the constraint condition at least includes:
The current access frequency of the memory is between the upper limit and the lower limit of the access frequency of the target memory group;
And the sum of the test power consumption of all memories in the target memory group and the test power consumption of the memories is smaller than a set test power consumption threshold.
In a second aspect, the present invention provides a memory self-test dynamic grouping apparatus, comprising:
The device comprises an acquisition module, a test module and a test module, wherein the acquisition module is used for acquiring access data of a current period of a memory in a resource to be tested, the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with the test strategies;
The computing module is used for determining the current access frequency of the memory according to the access data;
And the updating module is used for updating the grouping of the memory according to the current access frequency and the historical access frequency of the memory.
It can be understood that the memory self-test dynamic grouping method and device provided by the invention can be used for determining the access frequency of the current period of the memory to be tested according to the collected access data by collecting the access data of each memory in the test resource, and finally updating the memory grouping according to the access frequency of the memory to be tested, so that the dynamic automatic grouping of the memory resource in the self-test process is realized. The invention perfects the limitation of grouping the memories in the self-test process of the memories in the related technology by taking the access frequency of each memory to be tested in the test resource as the basis, effectively avoids the problem that all the memory groups can be tested only according to a fixed test scheme in the self-test, further provides a reasonable grouping scheme of the memories to be tested on the basis of dynamic grouping by taking the access frequency as the basis, finally improves the test efficiency and flexibility of the memories and saves the test time.
Drawings
FIG. 1 is a schematic diagram of a memory self-test dynamic packet architecture according to some embodiments of the present invention;
FIG. 2 is a flow chart of a method for dynamic grouping of memory self-tests according to some embodiments of the present invention;
FIG. 3 is a flow chart of a method for dynamic grouping of memory self-tests according to still other embodiments of the present invention;
FIG. 4 is a schematic diagram of a memory self-test dynamic grouping apparatus according to some embodiments of the present invention;
fig. 5 is a schematic structural diagram of a computer device according to an embodiment of the present invention.
Detailed Description
The invention is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be noted that, for convenience of description, only the portions related to the invention are shown in the drawings.
It should be noted that, without conflict, the embodiments of the present invention and features of the embodiments may be combined with each other. The invention will be described in detail below with reference to the drawings in connection with embodiments.
It can be understood that, in order to ensure normal use of the electronic device, a self-test circuit is integrated in the chip and a self-test program is stored in the chip, so that the self-test program is started in the actual running process of the electronic device, and test resources in the chip, such as a memory, are automatically tested.
It will be appreciated that in the automatic grouping of MBIST testing processes, to achieve a rational grouping of test resources, factors such as test time, test coverage, and power consumption of the memory may be combined with each test resource to provide an optimal test grouping scheme for the design engineer.
It will also be appreciated that the frequency of memory accesses may vary greatly during the actual application of the memory in the chip due to changes in the user's use. Such as portions of memory that are accessed at high frequencies, require more frequent testing to ensure their security and reliability; on the other hand, the frequency of the access to the part of the memory is low, and the test frequency of the part of the memory can be properly reduced, so that the test consumption time and the power consumption can be reduced.
In the invention, dynamic grouping in the memory self-test process is realized by combining the access frequency of the memory, and then the test plans of different memory groups are respectively adjusted, so that the memories with different access frequencies are configured with different test strategies, thereby realizing the flexibility of MBIST test, improving the test efficiency and saving the test time.
In order to provide a reasonable grouping scheme of the memories to be tested, and to perfect the limitation of the memory grouping in the memory self-test process in the related technology, the grouping scheme of the memories is formulated by grouping according to the access frequency by taking the access frequency of each memory to be tested in the test resource as the basis.
And when the test scheme is executed on the basis of grouping based on the access frequency, for example, the partial memory group accessed at high frequency can be tested for multiple times in one period, and the partial memory group accessed at low frequency can be tested for one time in a plurality of periods at intervals, so that effective test coverage rate and minimum test time are ensured, namely, by automatically making a test plan adapting to the access frequency, the test can be effectively prevented from being carried out on all memories only according to a fixed test scheme, and thus, the test time and power consumption can be reduced.
The memory self-test dynamic grouping method based on the access frequency can avoid the problems of overlong test time and overlarge power consumption, and realize the efficient test of the memory. The flexibility of the test plan can be automatically adjusted according to the access frequency of different memory groups, so that the test efficiency is improved and the resources are saved.
For a better understanding of the memory self-test packets provided by the present invention, the following is set forth in detail in the accompanying drawings.
Fig. 1 shows an architecture of a dynamic packet implementation of a memory self-test provided by the present invention, and as shown in fig. 1, the architecture may specifically include a feedback module, a calculation module, a dynamic allocation module, a controller, and a memory group to be tested, for example, a memory group divided into n groups, where the controller may be an MBIST controller, and may include m controllers. The feedback module, namely the acquisition module, can collect the read-write instruction of each memory in real time through the bus interface of the memory controller and transmit the read-write instruction to the calculation module for processing. The computing module can compute the access frequency of the memory according to the collected read-write instructions and transmit the access frequency to the dynamic allocation module for processing. The dynamic allocation module, that is, the update module, can dynamically adjust the grouping condition of the update memory according to the access frequency of the memory, and transmit grouping information to the MBIST controller. The MBIST controller can provide conditions for test plan formulation adapted to the frequency of access according to the grouping information provided by the dynamic allocation module, so as to realize the most efficient memory test.
It will be appreciated that the hardware circuits of the above modules in the present invention may be integrated on a chip to enable self-test grouping and self-testing of memory in an electronic device during actual operation of the chip. The chip may be a processing chip on an electronic device, which may be a computer device with data processing functions, such as a mobile phone, a computer, or an industrial device.
The test resource, i.e. the memory, in the present invention is the memory in the electronic device, which may be a Random Access Memory (RAM) or a Read Only Memory (ROM), etc., which is not limited in this invention.
It will be appreciated that in the embodiment of the present invention, when the test resources, i.e., memories, are grouped based on the access frequency, the memories are specifically the same type of memories, i.e., the RAMs are grouped according to the access frequency to the RAMs, or the ROMs are grouped according to the access frequency to the ROMs.
Fig. 2 is a flow chart of a memory self-test dynamic grouping method provided by the present invention, and as shown in fig. 2, the method specifically includes:
S110, access data of the current period of the memory in the resource to be tested is obtained, the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with the test strategies.
Specifically, in the memory self-test dynamic grouping method provided by the embodiment of the invention, firstly, the feedback module of the memory controller in the chip collects access data, such as a read-write instruction, of each memory in each memory group in the test resource in real time, and transmits the access data to the calculation module for processing.
That is, when the feedback module receives a read enabling instruction or a write enabling instruction of the bus to a certain memory, statistics can be performed on the read enabling instruction or the write enabling instruction, for example, the read-write times of the feedback module are increased by one. And the counted read-write times can be transmitted to the calculation module and initialized at each interval of time, namely the set acquisition period, so that the next acquisition period is entered, namely the accumulated read-write times are restarted.
The access data can be read-write instructions of the memory, i.e. the read-write instructions can be captured on the bus of the memory controller and transferred to the following modules by designing an effective mechanism.
For example, in an implementation, memory operations may be identified by parsing the bus protocol and converting it into a usable data structure.
It will be appreciated that in embodiments of the present invention, the resources to be tested involved may include at least one memory bank.
For example, in the initial state of the test resource, all memories to be tested may be set to two or more access frequency intervals according to a certain manner, for example, according to experience of access frequency, for example, multiple access frequency intervals from high to low are further in the execution process of the method, and then each memory is divided into multiple memory groups according to the set access frequency intervals. Or the initial grouping may be accomplished in other ways.
In the test process, the initial group is gradually and dynamically updated according to the respective access frequency along with the change of the access frequency of the user to each memory, so that each memory group grouped according to the access frequency corresponds to the respective test strategy.
It will also be appreciated that, because the frequency of actual operation of the circuit is very high, the time interval, i.e. the acquisition period, may be set according to the specific operating frequency, e.g. may be determined according to the main frequency of operation of the circuit. The invention is not limited in this regard.
When the method is implemented, the grouping condition of the memories can be updated in real time through the access frequency of each memory acquired in real time, so that flexible and dynamic grouping of the test resources is realized.
S120, determining the current access frequency of the memory according to the access data.
Specifically, after the computing module in the chip receives the access data of the memory, the access frequency of the memory can be calculated according to the access data, such as a read-write instruction. Namely, the read-write command sequence is analyzed to count the read-write frequency of the memory.
The access frequency data may include the number of reads and writes, the read-write interval time, the read-write duration, and the like.
The current access frequency is determined according to the access data, and the current access frequency can be calculated by the read-write times and the duration time, namely the current access frequency can be realized by the following steps:
s121, determining the sum of the write enabling times and the read enabling times of the memory in the current period.
S122, determining the quotient of the sum and the period as the current access frequency of the memory.
Specifically, a calculation module may be introduced to calculate the access frequency of the memory according to the collected read-write instructions. The calculation module can calculate the access frequency of the memory according to the read-write times in a period of time transmitted by the feedback module, and transmit the access frequency to the dynamic allocation module for processing.
The access frequency calculation formula is as follows:
Freq（i）=（Write+Read）/T
Where Freq (i) represents the frequency of access to a single memory, i represents the memory number, and T represents the duration of time for which the feedback module collects the number of reads and writes, i.e., the acquisition period. Write represents the sum of the Write enable times received by the memory during the acquisition period T, read represents the sum of the Read enable times received by the memory during the acquisition period T.
S130, updating the grouping of the memory according to the current access frequency and the historical access frequency of the memory.
Specifically, after the computing module determines the current access frequency corresponding to the current acquisition period of the memory, the dynamic allocation module of the controller of the chip in the electronic device may execute updating of the memory packet according to the current access frequency and the historical access frequency of the memory, that is, in the dynamic allocation module, the packet condition of the memory may be dynamically adjusted according to the calculated access frequency.
Optionally, as shown in fig. 3, in some embodiments of the present invention, when the electronic device dynamically allocates according to the current access frequency, the historical access frequency and the test power consumption of the memory, the method may specifically be implemented by:
s131, determining whether the group adjusting condition is met according to the current access frequency and the historical access frequency of the memory.
S132, when the group adjusting condition is met, determining a target memory group of the memory.
S133, the memory to be tested is allocated to the target memory group.
Specifically, the dynamic allocation module may compare the current access frequency with the historical access frequency in the actual use process of the memory, determine the obvious access frequency change condition, that is, determine whether the group adjustment condition is satisfied, further determine the target memory group after the group adjustment condition is satisfied, and finally transmit the determined target memory group, that is, the update information to the MBIST controller, so that the controller allocates the memory to the determined target memory group according to the update information.
The dynamic allocation module can adjust the grouping condition of the memory according to the access frequency and the test power consumption of the memory to be adjusted, namely the current access frequency, the historical access frequency and the test power consumption, so that the memory group result after final updating can consider the limitation of memory resources, the difference of the access frequency and the requirement of the test efficiency, and the optimal utilization of the memory resources and the maximum improvement of the test capability are expected.
It will be appreciated that in practice, the grouping condition may include a first grouping condition and a second grouping condition in order to enable flexible allocation of the memory.
The first group allocation condition represents a condition which needs to be met when the memory is allocated to a memory group corresponding to a higher access frequency; correspondingly, the second group allocation condition indicates a condition that needs to be met when the memory is allocated to the memory group corresponding to the low access frequency.
Optionally, in some embodiments, the grouping condition may include a ratio of the current access frequency and the historical access frequency of the memory, a magnitude relation between the current access frequency of the memory and a current average of current access frequencies and a historical average of historical access frequencies of all memories in the resource to be tested, and an access frequency of each memory in the memory group where the memory is currently located.
Correspondingly, the first grouping condition may be that the ratio of the current access frequency to the historical access frequency is greater than a first threshold, the historical access frequency of the memory is less than the average value of the historical access frequencies of all memories, and the current access frequency is greater than the average value and/or the current access frequency of all memories in which the memory is located is greater than the current access frequency of all memories in the group, that is, at least one of the three conditions is satisfied, that is, the first grouping condition is satisfied.
The second grouping condition may be that the ratio of the current access frequency to the historical access frequency is smaller than a second threshold, the historical access frequency of the memory is larger than the average value of the historical access frequencies of all memories, and the current access frequency is smaller than the average value, and/or the memory is larger than the current access frequency of all memories in the group, that is, at least one of the three conditions is satisfied, that is, the first grouping condition is satisfied.
The first threshold may be a multiple of the current access frequency relative to the historical access frequency, such as a 1-fold or more increase in the current access frequency of the memory as compared to the historical access frequency. The second threshold is a multiple of the current access frequency relative to the historical access frequency, e.g., the current access frequency of the memory is reduced by a factor of 1 or more compared to the historical access frequency. The first threshold and the second threshold may be determined according to practical situations, which is not limited in the present invention.
The first memory to be allocated may be a memory to be reallocated to a memory bank with a high access frequency, and the second memory to be allocated may be a memory to be reallocated to a memory bank with a low access frequency, so as to implement automatic dynamic adjustment, i.e. allocation to a packet with a higher or lower access frequency.
Correspondingly, in some embodiments, in S131, whether the group adjustment condition is satisfied is determined according to the current access frequency and the historical access frequency of the memory, which may be specifically determined according to the group adjustment condition, that is, the ratio of the current access frequency to the historical access frequency of the memory, the relationship between the current access frequency of the memory and the average value of the current access frequency and the average value of the historical access frequency of all memories in the test resource, and/or the access frequency of the group in which the memory is located.
For example, if the historical access frequency of the memory is the highest access frequency in the memory group, when the ratio of the current access frequency to the historical access frequency of the memory is greater than the set first threshold, it indicates that the memory meets the first group adjustment condition.
Or the historical frequency of the memory is smaller than the historical average value of all the historical access frequencies of the memory in the test resource, and the current access frequency of the memory is larger than the current average value of all the current access frequencies of the memory in the test resource, which indicates that the memory meets the first group adjusting condition.
If the historical access frequency of the memory to be tested is not the highest access frequency of the memory group, when the current access frequency of the memory is larger than the historical access frequency of all memories in the current memory group, the memory meets the first group adjusting condition.
For another example, for the set group adjustment condition, if the historical access frequency of the memory is the lowest access frequency in the memory group, when the ratio of the historical access frequency to the current access frequency of the memory is greater than the set second threshold, it indicates that the memory meets the second group adjustment condition.
Or the historical frequency of the memory is larger than the historical average value of the historical access frequency of all memories in the test resource, and the current access frequency of the memory is smaller than the current average value of the current access frequency of all memories in the test resource, which indicates that the memory meets the second group adjusting condition.
If the historical access frequency of the memory to be tested is not the lowest access frequency of the memory group, when the current access frequency of the memory is lower than the historical access frequency of all memories in the current memory group, the memory meets the second group adjusting condition.
It can be understood that, in the above manner, that is, through the current access frequency and the historical access frequency of each memory, the memory meeting the allocation condition in the test resource can be determined, that is, the memory group needing to be allocated to the high access frequency or the memory to be allocated to the low access frequency group is determined.
It will also be appreciated that when it is determined that the memory does not meet the first or second grouping condition described above, this indicates that the current access frequency of the memory is not significantly changed without requiring a re-grouping thereof.
Optionally, in the embodiment of the present invention, after determining that the memory meets the group allocation condition by the above manner, the memory may be determined by constraint conditions, that is, a target memory group of the memory to be allocated, and finally the memory to be allocated is allocated to the target memory group.
That is, in S132, when determining the target memory group, the target memory group may be determined according to the current access frequency of the memory, the target memory group satisfying the constraint condition.
Specifically, when the memory is determined to be the memory to be tuned, a target memory group meeting the constraint condition can be determined according to the current access frequency and the test power consumption of the memory, that is, the group meeting the memory to be tuned is searched according to the constraint condition.
The constraint condition indicates a condition that the target memory group needs to meet, and specifically may include that a current access frequency of the memory to be tested is located between an access frequency upper limit and an access frequency lower limit of the target memory group; and the sum of the test power consumption of all memories in the target memory group and the test power consumption of the memories is smaller than the set test power consumption threshold.
The constraint can be expressed as follows:
where Freq (i) represents the frequency of target memory i requiring reassignment, Representing the average access frequency of the newly allocated memory group G, power (i) represents the test Power consumption required by the target memory i, power (G) represents the sum of the test Power consumption of the memories in the newly allocated memory group G, and the set test Power consumption threshold may be the rated Power of the test circuit, that is Rated Power. If the above constraints are not met, then a re-search and allocation is performed.
Alternatively, in some embodiments of the present invention, when determining the target memory bank, a proximity rule may be adopted, and according to the changed access frequency, the memory bank closest to the memory bank according to the access frequency is searched for reassignment.
It will be appreciated that in some embodiments of the present invention, after a target memory bank is determined, bypass signal lines included in the dynamic allocation module may be utilized to effectively control the access path of the memory when allocating the pending bank memory to the determined target memory bank.
The bypass signal line can dynamically change the corresponding controller of each memory according to the access frequency of the memory. The memory whose actual access frequency varies is reconnected to a different MBIST controller to generate the most efficient memory test plan.
For partial memory groups with higher access frequency, the test plan tests the memories multiple times in one period to ensure the reliability of the memories. The test plan may take into account the appropriate increase in test times to improve test coverage.
For partial memory banks with lower access frequency, the test plan may extend the test time interval, e.g., test once at intervals of multiple cycles, due to their lower access frequency. This reduces the number of tests on this portion of the memory, thereby saving test time and power consumption.
In addition, in some embodiments of the present invention, in order to perfect the testing policy of the testing resource and ensure the comprehensiveness of the test, an emergency testing plan may be configured, that is, for the situation that the memory usage situation suddenly changes and cannot be regrouped, if the situation of the target memory group cannot be determined, the emergency testing plan may be adopted to adjust the testing policy.
For example, the number of tests of some memory groups can be directly increased or the nearby idle controllers can be called for testing through the dynamic allocation module so as to ensure the reliability of the memory.
It can be understood that, according to the memory self-test dynamic grouping method provided by the embodiment of the invention, the access frequency of the current period of the memory to be tested is determined according to the collected access data by collecting the access data of each memory in the test resource, and finally, the memory group is updated according to the access frequency of the memory to be tested, so that the dynamic automatic grouping of the memory resource in the self-test process is realized.
The memory self-test dynamic grouping method combines the access frequency of the memories, groups the memories according to the access frequency in the test resources, and prepares a grouping scheme of the memories according to the access frequency, and further provides a reasonable grouping scheme of the memories to be tested on the basis of the access frequency, so that limitation of grouping the memories in the memory self-test process in the related technology is perfected, when the test scheme is executed, for example, the part of the memories which can be accessed at high frequency in one period can be tested for multiple times, and the part of the memories which can be accessed at low frequency in one period can be tested for multiple periods can be tested for the part of the memories at intervals, so that effective test coverage and minimum test time can be ensured, namely, the test can be effectively prevented from being performed on all the memories only according to a fixed test scheme by automatically preparing a test plan, and thus the test time and power consumption can be reduced.
The memory self-test dynamic grouping method based on the access frequency can avoid the problems of overlong test time and overlarge power consumption and realize the efficient test of the memory. The flexibility of the test plan can be automatically adjusted according to the access frequency of different memory groups, so that the test efficiency is improved, resources are saved, the problems of overlong test time and overlarge power consumption are avoided, the efficient test of the memory is realized, the flexibility of the test plan can be automatically adjusted according to the access frequency of different memory groups, and finally the test efficiency is improved and the resources are saved.
On the other hand, as shown in fig. 4, the present invention further provides a memory self-test grouping apparatus, which includes:
An obtaining module 210, configured to obtain access data of a current period of a memory in a resource to be tested, where the resource to be tested includes at least one memory group, and the memory group includes at least one memory, and the memory group corresponds to a test policy one by one;
a calculation module 220, configured to determine a current access frequency of the memory according to the access data;
An updating module 230, configured to update the group of the memory according to the current access frequency and the historical access frequency of the memory.
Optionally, in the memory self-test grouping apparatus provided by the embodiment of the present invention, the memory groups in the resource to be tested are divided according to a set access frequency interval.
Optionally, in the memory self-test grouping device provided by the embodiment of the present invention, the calculation module is specifically configured to:
determining the sum of the write enabling times and the read enabling times of the memory in the current period;
and determining the quotient of the sum and the period as the current access frequency of the memory.
Optionally, the memory self-test grouping device provided by the embodiment of the present invention, the update module is specifically configured to:
determining whether a group adjustment condition is met according to the current access frequency and the historical access frequency of the memory;
when the group adjustment condition is met, determining a target memory group of the memory;
The memory is allocated to the target memory group.
Optionally, in the memory self-test grouping apparatus provided by the embodiment of the present invention, the grouping adjustment condition includes a ratio of the current access frequency to the historical access frequency of the memory, a magnitude relation between the current access frequency of the memory and a current average value of current access frequencies and a historical average value of historical access frequencies of all memories in the resource to be tested, and an access frequency of each memory in a memory group where the memory is currently located.
Optionally, in the memory self-test grouping apparatus provided by the embodiment of the present invention, the grouping conditions include a first grouping condition and a second grouping condition, where the first grouping condition indicates a condition that needs to be met when the memory is allocated to a memory group with a high access frequency, and the second grouping condition indicates a condition that needs to be met when the memory is allocated to a memory group with a low access frequency.
Optionally, the memory self-test grouping device provided by the embodiment of the present invention, the update module is specifically configured to:
If the historical access frequency of the memory is the highest access frequency in the memory group, when the ratio of the current access frequency to the historical access frequency of the memory is greater than a set first threshold value, the memory is indicated to meet a first group adjustment condition;
Or the historical frequency of the memory is smaller than the historical average value of the historical frequencies of all memories in the resource to be tested, and the current access frequency of the memory is larger than the current average value of the current access frequencies of all memories in the resource to be tested, which indicates that the memory meets a first group adjusting condition;
If the historical access frequency of the memory to be tested is not the highest access frequency of the memory group, when the current access frequency of the memory is larger than the historical access frequency of all memories in the current memory group, the memory is indicated to meet a first group adjusting condition.
Optionally, the memory self-test grouping device provided by the embodiment of the present invention, the update module is specifically configured to:
if the historical access frequency of the memory is the lowest access frequency in the memory group, when the ratio of the historical access frequency of the memory to the current access frequency is greater than a set second threshold value, the memory is indicated to meet a second group adjustment condition;
Or the historical frequency of the memory is larger than the historical average value of the historical access frequency of all memories in the resource to be tested, and the current access frequency of the memory is smaller than the current average value of the current access frequency of all memories in the resource to be tested, which indicates that the memory meets the second group adjusting condition;
If the historical access frequency of the memory to be tested is not the lowest access frequency of the memory group, when the current access frequency of the memory is lower than the historical access frequency of all memories in the current memory group, the memory meets a second group adjusting condition.
Optionally, the memory self-test grouping device provided by the embodiment of the present invention, the update module is specifically configured to:
And determining a target memory group meeting constraint conditions in the memory groups in the test resources according to the current access frequency and the test power of the memory.
Optionally, the memory self-test grouping apparatus provided by the embodiment of the present invention, where the constraint condition at least includes:
The current access frequency of the memory is between the upper limit and the lower limit of the access frequency of the target memory group;
And the sum of the test power consumption of all memories in the target memory group and the test power consumption of the memories is smaller than a set test power consumption threshold.
In another aspect, an embodiment of the present invention provides an electronic device, where the electronic device further includes a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the memory self-test automatic grouping method as described above when the program is executed by the processor.
Referring to fig. 5, fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
As shown in fig. 5, the electronic device includes a Central Processing Unit (CPU) 301 that can perform various appropriate actions and processes according to a program stored in a Read Only Memory (ROM) 302 or a program loaded from a storage section 308 into a Random Access Memory (RAM) 303. In the RAM303, various programs and data required for the operation of the electronic apparatus 300 are also stored. The CPU301, ROM302, and RAM303 are connected to each other through a bus 304. An input/output (I/O) interface 305 is also connected to bus 304. In some embodiments, the following components are connected to the I/O interface 305: an input section 306 including a keyboard, a mouse, and the like; an output portion 307 including a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), and the like, a speaker, and the like; a storage section 308 including a hard disk or the like; and a communication section 309 including a network interface card such as a LAN card, a modem, or the like. The communication section 309 performs communication processing via a network such as the internet. The drive 310 is also connected to the I/O interface 305 as needed. A removable medium 311 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is installed on the drive 310 as needed, so that a computer program read therefrom is installed into the storage section 308 as needed. In particular, according to embodiments of the present invention, the processes described above with reference to flowcharts may be implemented as computer software programs. For example, embodiments of the invention include a computer program product comprising a computer program embodied on a machine-readable medium, the computer program comprising program code for performing the method shown in the flowcharts. In such an embodiment, the computer program may be downloaded and installed from a network via the communication portion 309, and/or installed from the removable medium 311. The above-described functions defined in the electronic device of the present invention are performed when the computer program is executed by the Central Processing Unit (CPU) 301.
The computer readable medium shown in the present invention may be a computer readable signal medium or a computer readable storage medium, or any combination of the two. The computer readable storage medium can be, for example, but not limited to, an electronic device, apparatus, or device of electronic, magnetic, optical, electromagnetic, infrared, or semiconductor, or a combination of any of the foregoing. More specific examples of the computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this disclosure, a computer-readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution electronic device, apparatus, or device. In the present invention, however, the computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, with the computer-readable program code embodied therein. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution electronic device, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wire, fiber optic cable, radio Frequency (RF), and the like, or any suitable combination of the foregoing.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of electronic devices, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based electronic devices which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The units or modules involved in the embodiments of the present invention may be implemented in software or in hardware. The described units or modules may also be provided in a processor, for example, as: a processor, comprising: the device comprises an acquisition module, a calculation module and an updating module. The names of these units or modules do not in some cases limit the units or modules themselves, and for example, an update module may also be described as "a group for updating the memory according to the current access frequency and the historical access frequency of the memory".
As another aspect, the present invention also provides a computer-readable storage medium that may be contained in the electronic device described in the above embodiment; or may be present alone without being incorporated into the electronic device. The computer readable storage medium stores one or more computer programs that, when used by one or more processors, perform the memory self-test dynamic grouping method described in the present invention:
Obtaining access data of a current period of a memory in a resource to be tested, wherein the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with a test strategy;
determining the current access frequency of the memory according to the access data;
and updating the group of the memory according to the current access frequency and the historical access frequency of the memory.
In summary, the method and the device for self-testing dynamic grouping of the memory provided by the invention collect the access data of each memory in the test resource, further determine the access frequency of the current period of the memory to be tested according to the collected access data, and finally update the memory group according to the access frequency and the test mode of the memory to be tested, thereby realizing the dynamic automatic grouping of the memory resource in the self-testing process.
The memory self-test dynamic grouping provided by the invention is characterized in that the memory self-test dynamic grouping is carried out by taking the access frequency of each memory to be tested in the test resource as a basis, and a grouping scheme of the memory is formulated according to the access frequency, so that a reasonable grouping scheme of the memory to be tested is provided on the basis of the access frequency, the limitation of the memory grouping in the memory self-test process in the related technology is perfected, when the test scheme is executed, for example, a part of memory groups accessed at high frequency can be tested for multiple times in one period, and a part of memory groups accessed at low frequency can be tested for one time in a plurality of periods at intervals, so that effective test coverage rate and minimum test time are ensured, namely, by automatically formulating a test plan adapting to the access frequency, the test can be effectively prevented from being carried out on all memories only according to a fixed test scheme, and thus the test time and power consumption can be reduced.
The above description is only illustrative of the preferred embodiments of the present invention and of the principles of the technology employed. It will be appreciated by persons skilled in the art that the scope of the disclosure referred to in the present invention is not limited to the specific combinations of technical features described above, but also covers other technical features which may be formed by any combination of the technical features described above or their equivalents without departing from the spirit of the disclosure. Such as the above-mentioned features and the technical features disclosed in the present invention (but not limited to) having similar functions are replaced with each other.
Claims (10)
1. A memory self-test dynamic grouping method, characterized in that the memory self-test dynamic grouping method comprises:
Obtaining access data of a current period of a memory in a resource to be tested, wherein the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with a test strategy;
determining the current access frequency of the memory according to the access data;
And updating the grouping of the memory according to the current access frequency and the historical access frequency of the memory.
2. The method for dynamic grouping of memory self-tests according to claim 1, wherein the memory groups in the resource to be tested are partitioned according to a set access frequency interval.
3. The memory self-test dynamic grouping method of claim 2 wherein said determining a current access frequency of the memory from the access data comprises:
Determining the sum of the write enabling times and the read enabling times of the memory in the current period;
and determining the quotient of the sum and the period as the current access frequency of the memory.
4. A memory self-test dynamic grouping method as claimed in any one of claims 1-3 wherein said updating said memory grouping according to said current access frequency and historical access frequency of said memory comprises:
determining whether a group adjustment condition is met according to the current access frequency and the historical access frequency of the memory;
when the group adjustment condition is met, determining a target memory group of the memory;
The memory is allocated to the target memory group.
5. The method of claim 4, wherein the grouping condition includes a ratio of the current access frequency to the historical access frequency of the memory, a magnitude relationship between the current access frequency of the memory and a current average of current access frequencies and a historical average of historical access frequencies of all memories in the resource to be tested, and an access frequency of each memory in a memory group in which the memory is currently located.
6. The method of claim 5, wherein the group allocation conditions include a first group allocation condition and a second group allocation condition, the first group allocation condition indicating a condition to be satisfied when the memory is allocated to a memory group with a high access frequency, and the second group allocation condition indicating a condition to be satisfied when the memory is allocated to a memory group with a low access frequency.
7. The method of claim 6, wherein determining whether a grouping condition is satisfied based on a current access frequency and a historical access frequency of the memory comprises:
If the historical access frequency of the memory is the highest access frequency in the memory group, when the ratio of the current access frequency to the historical access frequency of the memory is greater than a set first threshold value, the memory is indicated to meet a first group adjustment condition;
Or the historical frequency of the memory is smaller than the historical average value, and the current access frequency of the memory is larger than the current average value, which indicates that the memory meets a first group adjustment condition;
If the historical access frequency of the memory to be tested is not the highest access frequency of the memory group, when the current access frequency of the memory is larger than the historical access frequency of all memories in the current memory group, the memory is indicated to meet a first group adjusting condition.
8. The method of claim 6, wherein determining whether a grouping condition is satisfied based on a current access frequency and a historical access frequency of the memory comprises:
if the historical access frequency of the memory is the lowest access frequency in the memory group, when the ratio of the historical access frequency of the memory to the current access frequency is greater than a set second threshold value, the memory is indicated to meet a second group adjustment condition;
Or the historical frequency of the memory is larger than the historical average value, and the current access frequency of the memory is smaller than the current average value, which indicates that the memory meets a second group adjustment condition;
If the historical access frequency of the memory to be tested is not the lowest access frequency of the memory group, when the current access frequency of the memory is lower than the historical access frequency of all memories in the current memory group, the memory meets a second group adjusting condition.
9. The memory self-test dynamic grouping method of claim 4 wherein said determining a target memory group of said memory comprises:
Determining a target memory group meeting constraint conditions in the memory groups in the test resources according to the current access frequency and the test power of the memory;
The constraint condition at least comprises:
The current access frequency of the memory is between the upper limit and the lower limit of the access frequency of the target memory group;
And the sum of the test power consumption of all memories in the target memory group and the test power consumption of the memories is smaller than a set test power consumption threshold.
10. A memory self-test dynamic grouping apparatus, comprising:
The device comprises an acquisition module, a test module and a test module, wherein the acquisition module is used for acquiring access data of a current period of a memory in a resource to be tested, the resource to be tested comprises at least one memory group, the memory group comprises at least one memory, and the memory groups are in one-to-one correspondence with the test strategies;
The computing module is used for determining the current access frequency of the memory according to the access data;
And the updating module is used for updating the grouping of the memory according to the current access frequency and the historical access frequency of the memory.
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