CN117991142A - AC-DC power supply test method and system for laser - Google Patents
AC-DC power supply test method and system for laser Download PDFInfo
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- 238000011056 performance test Methods 0.000 claims description 18
- 230000005855 radiation Effects 0.000 claims description 14
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
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- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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Abstract
The application discloses an AC-DC power supply testing method and system of a laser. The method comprises the following steps: acquiring the ambient temperature, the relative humidity and the liquid cooling temperature of a liquid cooling plate of an AC-DC power supply; if the ambient temperature, the relative humidity and the liquid cooling temperature all meet the respective setting conditions, generating a first instruction for carrying out black box test on the AC-DC power supply so as to obtain a first test result of the AC-DC power supply; if the first test result meets a preset first condition, generating a second instruction for performing white box test on the AC-DC power supply to obtain a second test result of the AC-DC power supply; and if the second test result meets a preset second condition, generating a test record of the AC-DC power supply passing the power supply test. The application realizes the testing flow for forming normalization of the AC-DC power supply of the laser, avoids the condition of missing test in the testing process, and further improves the testing efficiency and reliability of the AC-DC power supply of the laser.
Description
Technical Field
The application relates to the technical field of laser testing, in particular to an AC-DC power supply testing method and system of a laser.
Background
With the development of technology, lasers are continuously updated and upgraded, the power and performance of the lasers are gradually improved, an AC-DC power supply is used as a part of the laser power supply, the index requirements of the AC-DC power supply are higher and higher, and the test projects of the AC-DC power supply are more and more. Because the standard instruction requirement of the AC-DC power supply test of the existing laser is not uniform, technicians cannot normally test the AC-DC power supply of the laser, the test efficiency is low, and moreover, the test process is easy to generate missed test projects, so that the reliability of the tested AC-DC power supply is poor.
Disclosure of Invention
Aiming at the defects of the prior art, the application provides a method and a system for testing an AC-DC power supply of a laser, and aims to solve the technical problems of low testing efficiency and poor reliability of the AC-DC power supply of the laser in the prior art.
To solve the above problems, in a first aspect, the present application provides a method for testing AC-DC power of a laser, including:
Acquiring the ambient temperature, the relative humidity and the liquid cooling temperature of a liquid cooling plate of an AC-DC power supply; the liquid cooling plate is used for carrying out liquid cooling on the AC-DC power supply;
If the ambient temperature, the relative humidity and the liquid cooling temperature all meet respective setting conditions, generating a first instruction for performing black box test on the AC-DC power supply to obtain a first test result of the AC-DC power supply;
if the first test result meets a preset first condition, generating a second instruction for performing white box test on the AC-DC power supply to obtain a second test result of the AC-DC power supply;
and if the second test result meets a preset second condition, generating a test record of the AC-DC power supply passing the power supply test.
In a second aspect, the application also provides an AC-DC power supply test system of the laser, which comprises a central control platform, a power supply programmable power supply, an electronic load instrument and a liquid cooling plate;
The power supply program-controlled power supply is used for supplying power to the AC-DC power supply, the electronic load instrument is used for simulating the load of the AC-DC power supply, the liquid cooling plate is used for carrying out liquid cooling on the AC-DC power supply, and the central control platform is used for executing the AC-DC power supply testing method of the laser device in the first aspect.
According to the AC-DC power supply testing method of the laser, after the ambient temperature, the relative humidity and the liquid cooling temperature of the liquid cooling plate of the AC-DC power supply meet respective setting conditions, a first instruction for performing black box testing on the AC-DC power supply is generated to obtain a first testing result, after the first testing result meets a preset first condition, a second instruction for performing white box testing on the AC-DC power supply is generated to obtain a second testing result, after the second testing result meets a preset second condition, a testing record of the AC-DC power supply passing through the power supply testing is generated, and therefore a testing procedure of forming normalization on the AC-DC power supply of the laser is achieved, the condition of missing testing in the AC-DC power supply testing process of the laser is avoided, the testing efficiency of the AC-DC power supply of the laser is further improved, meanwhile, the testing environment is close to the practical application environment of the AC-DC power supply of the laser, and the reliability and the accuracy of the AC-DC power supply of the laser passing through the testing are improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic block diagram of an AC-DC power supply test system for a laser according to an embodiment of the present application.
FIG. 2 is a schematic flow chart of a testing method of an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a first sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a second sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 5 is a schematic diagram of a third sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 6 is a schematic diagram of a fourth sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 7 is a schematic diagram of a fifth sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 8 is a schematic diagram of a sixth sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
FIG. 9 is a schematic diagram of a seventh sub-flowchart of a method for testing an AC-DC power supply of a laser according to an embodiment of the present application;
fig. 10 is a schematic diagram of an eighth sub-flowchart of a method for testing AC-DC power of a laser according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
It should be understood that the terms "comprises" and "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
The embodiment of the application provides an AC-DC power supply test method and system for a laser.
For ease of understanding, a description will be given of the AC-DC power supply 15 testing system of the laser, and the AC-DC power supply testing method of the laser will be described in detail on the basis of the system.
Referring to fig. 1, fig. 1 is a schematic block diagram of an AC-DC power supply testing system 10 for a laser according to an embodiment of the present application. The system comprises a central control platform 11, a power supply program-controlled power supply 12, an electronic load instrument 13 and a liquid cooling plate 14; the power supply programmable power supply 12 is used for supplying power to the AC-DC power supply 15, the electronic load instrument 13 is used for simulating the load of the AC-DC power supply 15, the liquid cooling plate 14 is used for carrying out liquid cooling on the AC-DC power supply 15, and the central control platform 11 is used for executing an AC-DC power supply test method of the laser.
Specifically, referring to fig. 2, fig. 2 is a flow chart of a method for testing AC-DC power of a laser according to an embodiment of the present application.
As shown in fig. 2, a method for testing AC-DC power of a laser includes steps S110, S120, S130, and S140.
S110, acquiring the ambient temperature, the relative humidity and the liquid cooling temperature of a liquid cooling plate of the AC-DC power supply; the liquid cooling plate is used for carrying out liquid cooling on the AC-DC power supply.
In this embodiment, the liquid cooling temperature is the initial temperature of the liquid cooling plate for performing liquid cooling on the AC-DC power supply 15, before the AC-DC power supply 15 of the laser is tested, it is required to determine in advance whether the ambient temperature where the AC-DC power supply 15 is located, the relative moderate temperature, and the liquid cooling temperature of the liquid cooling plate for performing liquid cooling on the AC-DC power supply 15 meet the respective set conditions, that is, whether the ambient temperature is between 10 ℃ and 40 ℃, the relative humidity is between 30% and 70%, and the liquid cooling temperature is between 25±1 ℃, so that the final test result of the AC-DC power supply 15 is more matched with the actual result, and the accuracy of the test of the AC-DC power supply 15 is ensured.
And S120, if the ambient temperature, the relative humidity and the liquid cooling temperature all meet respective setting conditions, generating a first instruction for performing black box test on the AC-DC power supply so as to obtain a first test result of the AC-DC power supply.
In this embodiment, the first instruction is instruction information generated by the central control platform 11 under the condition that the environmental temperature, the relative humidity and the liquid cooling temperature of the liquid cooling plate where the AC-DC power supply 15 is located are determined to be consistent with respective setting conditions, after the central control platform 11 is determined to generate the first instruction, a tester can perform a black box test on the AC-DC power supply 15, and after the black box test is completed, the AC-DC power supply 15 can obtain a first test result of the AC-DC power supply 15.
Wherein the black box test is also called a functional test, a data driven test or a functional test based on a demand specification. Specifically, the test engineer regards the object of the black box test as a black box, and can check whether the function of the program accords with the function specification of the product only according to the specification of the product requirement without considering the logic structure and the internal characteristic of the product, the test engineer does not need to solve the internal structure of the product, the end user of the product is completely simulated to use the product, and whether the product meets the requirement of the user is checked. Therefore, the black box testing method can better and truly inspect the functional requirement realization condition of the product from the user perspective.
In other inventive embodiments, as shown in fig. 3, step S120 includes steps S121, S122, S123, and S124.
S121, generating the performance test instruction to acquire the performance test result;
S122, if the performance test result meets a preset third condition, generating the case test instruction to acquire the case test result;
S123, if the case test result meets a preset fourth condition, generating the first safety regulation test instruction to acquire the first safety regulation test result;
S124, if the first safety regulation test result meets a preset fifth condition, generating the first EMC test instruction to acquire the first EMC test result; the first EMC test result comprises an electric fast transient pulse group immunity, a surge impact immunity, a conductive emission test result and a conductive immunity test result.
Specifically, the first instruction includes a performance test instruction, a case test instruction, a first security test instruction, and a first EMC test instruction, and the first test result includes a performance test result, a case test result, a first security test result, and a first EMC test result. The performance test is used for testing the general performance of the AC-DC power supply 15, the case test is used for testing the specific application scenario of the AC-DC power supply 15, and the first safety test and the first EMC (Electro Magnetic Compatibility ) test are mainly used for testing whether the safety performance of the AC-DC power supply 15 after leaving the factory meets the performance provided by the supplier. Meanwhile, after the performance test is performed on the AC-DC power supply 15, the case test is also required to be performed on the AC-DC power supply 15, which is mainly used for determining whether the practical application of the AC-DC power supply 15 meets the standard while determining that the general performance of the AC-DC power supply 15 meets the standard, so that the accuracy of the test result of the AC-DC power supply 15 is ensured.
In this embodiment, the first EMC test includes an electrical fast transient burst immunity test, a surge impact immunity test, a conducted emission test, and a conducted immunity test. The electric fast transient pulse group immunity test is to set the highest test voltage +/-4000V at the input port, the repetition frequency is 5000Hz and 100kHz, and the power supply after the test is completed meets the B type judgment standard in IEC 61000; the surge impact immunity test requires positive and negative polarities for 1 time per minute, positive and negative voltages for 5 times respectively, voltages of 2000V to 4000V are sequentially applied to each phase, the phases are 0 degrees, 90 degrees, 180 degrees and 270 degrees respectively, and after the test is finished, a power supply sample is free from any functional damage and meets class B judgment standards in IEC 61000; the conduction emission test is carried out according to the specification and the requirement of A-class products in the standard of radio disturbance limit value and measurement method of GB 9254-2008 information technology equipment; the conductive disturbance rejection test is tested in a test grade 3 in the standard of GB/T17626.6-2008 electromagnetic compatibility test and measurement technology radio frequency field induced conductive disturbance rejection, namely the frequency sweep range is 150 kHz-80 MHz, the level of 10Vrms, the disturbance signal is a 1kHz sine wave amplitude modulation signal, the modulation degree is 80% radio frequency signal, the power supply sample has no functional damage after the test is finished, and the class A judgment standard in IEC 61000 is met.
In other inventive embodiments, as shown in fig. 4, step S121 includes steps S1211 and S1212.
S1211, generating the first characteristic test instruction to acquire a full-load test result of the AC-DC power supply; the full-load test result comprises rated input voltage, rated output voltage and rated output current;
s1212, if the full load test result meets a preset sixth condition, generating the protection test instruction to obtain a protection test result of the AC-DC power supply; the protection test result comprises an input overvoltage and undervoltage test result and an output short circuit test result.
In this embodiment, the performance test instruction includes a first characteristic test instruction and a protection test instruction. The first characteristic test mainly tests the rated voltage and current of the AC-DC power supply 15, specifically measures the rated input voltage range, the rated output current and the rated voltage of the AC-DC power supply 15 in the full load state, and then determines whether the AC-DC power supply 15 meets the standard by judging the rated input voltage range, the rated output current and the rated output voltage.
The protection test is mainly to test whether the AC-DC power supply 15 can be protected in an overvoltage and undervoltage state. The protection test comprises input overvoltage and undervoltage protection, output overvoltage protection and output overcurrent protection. Specifically, the input overvoltage and undervoltage protection test is to regulate the input voltage until the power supply is started for protection, and the fault needs to be recovered by itself after the normal voltage is recovered; wherein the overvoltage point and the undervoltage point of the power supply input are required to be within respective preset ranges; the output overvoltage protection test specifically comprises the steps of providing voltage to an output end through a power supply until the voltage is protected, recording the protection voltage, and keeping the power supply locked after the protection voltage is recovered to be normal, wherein an overvoltage point of the output of the power supply is required to be within a preset range; the output overcurrent protection test specifically comprises the steps of supplying current to an output end through a power supply until protection is performed, recording the protection current, and keeping the power supply locked after the protection current is recovered to be normal, wherein an overcurrent point output by the power supply is required to be within a preset range; and the output short circuit test is to short-circuit the output end, the power supply needs to be started for protection, and the power supply is kept locked after the power supply is recovered to be normal.
In addition, when the protection test is performed on the AC-DC power supply 15, the response time of the protection function of the AC-DC power supply 15 is also required to be obtained, and whether the protection function of the AC-DC power supply 15 is complete is further determined by judging whether the response time is less than the preset time.
In other inventive embodiments, steps S1201, S1202 and S1203 are further included after step S1211, as shown in fig. 5.
S1201, if the full-load test result meets a preset sixth condition, acquiring setting information of the oscilloscope required by the AC-DC power supply;
s1202, generating the second characteristic test instruction according to the setting information to obtain a ripple test result of the AC-DC power supply; wherein the ripple test result comprises a full-load ripple voltage of the AC-DC power supply.
S1203, if the ripple test result meets a preset seventh condition, generating the third characteristic test instruction to obtain a dynamic response test result of the AC-DC power supply; wherein the dynamic response test result includes an overshoot voltage and a dip voltage.
In the present embodiment, in order to secure the reliability of the AC-DC power supply 15, the performance test instructions further include a second characteristic test instruction and a third characteristic test instruction. The second characteristic test is mainly used for testing whether the ripple voltage output by the AC-DC power supply 15 in different load states meets the requirement or not, and the third characteristic test is mainly used for testing the dynamic response effect of the AC-DC power supply 15 in a preset load state.
Specifically, the setting information of the oscilloscope includes whether the oscilloscope is set to AC coupling and whether the broadband display is 20MHz, if yes, a second characteristic test instruction is generated to inform a tester to test the AC-DC power supply 15 under no-load, half-load and full-load conditions, and a voltage probe is used to obtain a peak-peak value of the output voltage, namely the ripple voltage.
The dynamic response test specifically includes that during power jump output (change within a range of 10% -90%), the load of the AC-DC power supply 15 is adjusted to 7A/mu s, the frequency is 5 Hz-5 kHz, the duty ratio is adjusted to 10% -90%, the output voltage is tested, AC coupling of an oscilloscope is selected to obtain overshoot/dip voltage, then whether the voltage overshoot/dip exceeds 5V, the duration exceeds 20ms and protection is not triggered is judged, and whether the dynamic response test of the AC-DC power supply 15 meets requirements is determined.
In other inventive embodiments, as shown in fig. 6, step S122 includes steps S1221, S1222, and S1223.
S1221, generating the power-on test instruction to acquire the delay time of the AC-DC power supply for generating rated output voltage in a full load state;
s1222, if the delay time is lower than a first threshold value, generating the first discharge test instruction to obtain a first discharge time of the AC-DC power supply discharge;
S1223, if the first discharging time is lower than a second threshold, generating the second discharging test instruction to obtain a second discharging time of the AC-DC power supply in a preset load state.
In this embodiment, the case test instruction includes a power-on test instruction, a first discharge test instruction, and a second discharge test instruction. The power-on test is mainly used for testing the interface signal time sequence of the AC-DC power supply 15, that is, the time required from the start level of the AC-DC power supply 15 in the full load state to the output of the rated output voltage, that is, the delay time, and after the delay time meets the requirement, a first discharge test instruction for performing a first discharge test on the AC-DC power supply 15 is generated to obtain the first discharge time of the discharge of the AC-DC power supply 15. After the central control platform 11 sends the first discharging test instruction, the tester needs to set the AC-DC power supply 15 to an idle state. And when the first discharge time is lower than the second threshold value, generating the second discharge test instruction to inform the tester to test the second discharge time of the AC-DC power supply 15 in the preset load state. The preset load may be a 1A load. In addition, in the case test process of the AC-DC power supply 15, the AC-DC power supply 15CAN is connected with an upper computer used by a company laser, and related data information is read, so as to determine whether the CAN communication of the AC-DC power supply 15 is normal.
In other inventive embodiments, as shown in fig. 7, step S123 includes steps S1231, S1232, and S1233.
S1231, generating the insulation resistance test instruction to obtain the insulation resistance of the AC-DC power supply at a preset first voltage in a preset first time;
S1232, generating the first insulation strength test instruction to obtain the first insulation strength of the AC-DC power supply under a preset second voltage in the preset second time; wherein the second voltage is higher than the first voltage;
S1233, generating the second insulation strength test instruction to acquire a second insulation strength of the AC-DC power supply in the preset third time under a preset third voltage; wherein the third voltage is higher than the second voltage.
In this embodiment, the first safety test instruction includes an insulation resistance test instruction, a first insulation strength test instruction, and a second insulation strength test instruction. The insulation resistance test is to set the DC of the insulation resistance tester to 500V, test the insulation resistance of the input pair shell, the input pair output and the output pair shell respectively, and test the insulation resistance for 60s, so as to obtain whether the insulation resistance of the AC-DC power supply 15 is more than 100MΩ to determine whether the AC-DC power supply 15 meets the requirements; the first insulation strength is that the DC of the voltage withstand tester is set to 710V, the insulation strength of the output to the shell is tested, the test time is 60s, and whether the AC-DC power supply 15 meets the standard is judged by judging whether the leakage current of the input to the shell and the input to the output is not more than 30 mA; the second insulation strength test is to set the AC of the voltage withstand tester to 1500V, test the insulation strength of the input to the casing and the input to the output respectively, test the insulation strength for 60s, and judge whether the AC-DC power supply 15 meets the standard by judging whether the leakage current of the output to the casing is not more than 10 mA.
S130, if the first test result meets a preset first condition, generating a second instruction for performing white box test on the AC-DC power supply to obtain a second test result of the AC-DC power supply.
In this embodiment, the second instruction is instruction information generated by the central control platform 11 after determining that the black box test of the AC-DC power supply 15 meets the standard, and after determining that the central control platform 11 generates the second instruction, a tester can perform a white box test on the AC-DC power supply 15, and after completing the white box test, the AC-DC power supply 15 can obtain a second test result of the AC-DC power supply 15.
The white box test is also called a structure test, a transparent box test, a logic driving test or a code-based test. Specifically, the logic path in the product is subjected to coverage test by checking the logic structure inside the product. And checking points are set at different positions of the product, and the state of the product is checked to determine whether the actual running state of the product is consistent with the expected state.
In other inventive embodiments, as shown in fig. 8, step S130 includes steps S131, S132, S133, and S134.
S131, generating the second security testing instruction to acquire a second security testing result; the second safety regulation test result comprises an anti-electric strength and a grounding resistance value;
S132, if the electric resistance strength meets a preset eighth condition and the grounding resistance value is lower than a preset resistance value, generating the second EMC test instruction to acquire the second EMC test result; the second EMC test result comprises a terminal radiation disturbance value and radiation immunity;
S133, if the terminal radiation disturbance value is lower than a third threshold value and the radiation disturbance rejection is higher than a second threshold value, generating the reliability test instruction to acquire the reliability test result;
And S134, if the reliability test result meets a preset ninth condition, generating the power grid adaptability test instruction to acquire the power grid adaptability test result.
In this embodiment, in order to further ensure the reliability of the AC-DC power supply 15, the present application further needs to perform a second security test on the AC-DC power supply 15, that is, a second security test, specifically, an immunity test and a ground resistance test on the AC-DC power supply 15, and after the immunity and the ground resistance of the AC-DC power supply 15 reach standards, the AC-DC power supply 15 needs to perform an EMC test, that is, a second EMC test, specifically, a terminal radiation disturbance test and a radiation immunity test on the AC-DC power supply 15. Further reliability testing of the AC-DC power supply 15 is required after the second safety testing and the second EMC testing of the AC-DC power supply 15 are completed. In addition, after the AC-DC power supply 15 is subjected to the reliability test, the grid adaptability of the AC-DC power supply 15 needs to be tested.
Specifically, the second instruction includes a second safety regulation test instruction, a second EMC test instruction, a reliability test instruction, and a grid adaptability test instruction, and the second test result includes a second safety regulation test result, a second EMC test result, a reliability test result, and a grid adaptability test result.
The test voltage is set to 2000V (AC), the leakage current of the input to the output, the input to the PE, and the output to the PE is tested respectively, the test time is 60s, then the test voltage is set to 2000V (DC), the leakage current of the output to the PE and the input to the output is tested respectively, the test time is 60, and finally whether the leakage current of the two times is not more than 20mA is judged to judge whether the AC-DC power supply 15 reaches the standard; the grounding resistance is the resistance between the furthest part of the test sample housing and the power input end PE, namely the grounding resistance, according to the related regulation requirements in the reference standard GB 4943-2001, the test current is 40A, the test time is 2min, and then whether the grounding resistance is not more than 0.1 omega is judged to determine whether the AC-DC power supply 15 meets the requirements.
The terminal radiation disturbance test is carried out according to the radio disturbance limit value and the measurement method of GB 9254-2008 information technology equipment or IEC 61000-6-4:2019, wherein the Class a is specified and required, namely, the required test frequency is 30M-1 GHz, the test antenna needs to be tested in the vertical and horizontal directions, the height of 1M-4M is smaller than the limit value, and then whether the AC-DC power supply 15 meets the standard is judged according to the requirement that whether the radiation disturbance limit value of the Class a ITE at the measured distance R (such as 10M) meets the standard; the radiation immunity test is carried out according to the specification and requirements of Class A in standard GB/T17626.3-2006 electromagnetic compatibility test and measurement technique radio frequency electromagnetic field radiation immunity test or IEC 61000-4-3:2013, the test requires 80MHz-1GHz,10V/m level, 1kHz sine wave amplitude modulation (80% amplitude modulation), the power supply has no functional damage after the test is finished, and Class A judgment standard in IEC 61000 is satisfied to judge whether the AC-DC power supply 15 meets the standard.
In addition, after the second EMC test is completed, a physical reliability test such as a mechanical type reliability test, a climate reliability test, etc. is also required for the AC-DC power supply 15. Regarding the power grid adaptability test, the AC-DC power supply 15 is subjected to IEC standard waveform test, self-contained waveform test, input waveform tailing test, input voltage resonance multiplication test, input voltage waveform burr test, input voltage dip and interruption test, input power grid frequency jump test, and input with larger direct current component test.
In other inventive embodiments, as shown in fig. 9, step S133 includes steps S1331 and S1332.
S1331, generating the mechanical test instruction to obtain a mechanical test result of the AC-DC power supply under a first preset standard; wherein the mechanical test results comprise vibration test results and drop test results;
S1332, generating the climate test instruction to obtain a climate test result of the AC-DC power supply under a second preset standard; the climate test results comprise a high-low temperature test result, a constant damp-heat test result, an alternating damp-heat test result and a temperature cycle test result.
In this embodiment, the reliability test instructions include a mechanical test instruction and a climate test instruction, and the reliability test results include a mechanical test result and a climate test result.
The mechanical test comprises a packaging vibration test and a packaging drop test, wherein the packaging vibration test is carried out according to the standard requirement of a C.7 expressway truck vibration environment diagram C.1 in GJB 150.16A-2009, the test time is 0.5 h/axis, and the packaging appearance structure is judged to be abnormal after the test is finished; the package drop test is to select a corresponding drop height, perform a corner triangular six-sided drop test on the sample, specifically refer to standard ISTA 1A, determine that the appearance structure of the power supply is not abnormal after the test is completed, and the power supply can be started normally without oscillation, the input/output voltage and the input/output current meet the requirements of the specification, and the power supply panel indicator light displays normally and communicates normally.
In addition, the climate test includes a high-low temperature operation test, a constant damp-heat operation test, an alternating damp-heat storage test, a temperature cycle storage test, and a low-temperature start-up test. The high-low temperature working test is to put a test sample into a set incubator, the sample is in a full-load working state on water cooling and kept for 24 hours, the high-temperature working incubator is set to be 50 ℃, and the water cooling machine is set to be at the temperature: the low-temperature working temperature box is set to be minus 10 ℃, the temperature of the water cooler is set to be the lowest temperature of the water cooler, but not lower than 10 ℃, then the appearance structure is judged to be abnormal, the power supply can be started normally, the oscillation is avoided, the input/output voltage and the input/output current meet the specification requirements, the power supply panel indicator lamp displays normally, and the communication is normal.
The constant wet and hot working test is to put a test sample into a set incubator, the sample is fully loaded on water cooling and kept for 48 hours, the constant wet and hot working incubator is set to 50 ℃,93% RH, the water cooling machine is set to 30 ℃, then the appearance structure is judged to be abnormal, the power supply can be started normally, no oscillation exists, the input/output voltage and the input/output current meet the specification requirements, the power panel indicator lamp is displayed normally, and the communication is normal.
The alternating damp-heat storage test is to store a sample in an environment with the relative humidity of 93% RH at 25 ℃ for 2 hours, then set the temperature to be 1 ℃/min, store the sample in an environment with the relative humidity of 93% RH at 40 ℃ for 2 hours, repeatedly circulate for 5 times, then test the sample after the sample is kept in the environment with the normal temperature and the normal humidity for 2 hours, then judge that the appearance structure is not abnormal, the power supply can be normally started, and has no oscillation, the input/output voltage and the input/output current meet the specification requirements, the power supply panel indicator light displays normally, and the communication is normal.
The temperature cycle storage test is to store a sample in an environment of-25 ℃ for 4 hours, then set the temperature to be 1 ℃/min, store the sample in the environment of 60 ℃ for 4 hours, and after the repeated cycle is carried out for 5 times, the sample is kept in the environment of normal temperature and normal humidity for 2 hours, then test is carried out, then the appearance structure is judged to be abnormal, the power supply can be started normally and has no oscillation, the input/output voltage and the input/output current meet the specification requirements, the power supply panel indicator lamp is displayed normally, and the communication is normal.
The low-temperature start test is to store the sample in the environment of-25 ℃ for 2 hours, take out the sample for test, then judge that the appearance structure is not abnormal, the power supply can be started normally without oscillation, the input/output voltage and the input/output current meet the specification requirements, the power supply panel indicator lamp displays normally, and the communication is normal.
In other embodiments of the invention, as shown in fig. 10, steps S1301 and S1302 are further included after step S133.
S1301, generating the thermal test instruction to obtain a thermal test result of the AC-DC power supply under a third preset standard;
s1302, generating the electric stress test instruction to obtain an electric stress test result of the AC-DC power supply under a fourth preset standard.
In this embodiment, the second instructions further include a thermal test instruction and an electrical stress test instruction. The heat test is that firstly rated input, full load, high temperature (50 ℃) environment, cooling water temperature 30 ℃ condition carries on 120 minutes of copying machine, then high pressure input, full load, high temperature (50 ℃) environment, cooling water temperature 30 ℃ condition carries on 120 minutes of copying machine, then low pressure input, full load, high temperature (50 ℃) environment, cooling water temperature 30 ℃ condition carries on 120 minutes of copying machine, finally judges the product can normally run, does not trigger any alarm, the key device temperature meets the corresponding specification requirement, and 80% derating allowance can be provided; the electrical stress test is that rated input, full load/no load is carried out for more than 15 minutes, then on-off and operation test is carried out, then high voltage input, full load/no load is carried out, operation is carried out for more than 15 minutes, then on-off and operation test is carried out, then low voltage input, full load/no load is carried out, operation is carried out for more than 15 minutes, then on-off and operation test is carried out, wherein the power switch device is required to be driven for stress test, working conditions comprise but not limited to upper and lower limits of input and output, input and output are dynamic, the VI waveform of the key element in steady state and transient state is recorded, the instant power consumption of the power device is calculated by utilizing an oscilloscope multiplication function, finally the voltage and current stress of the key element in steady state and transient state is within the specification range and has sufficient design margin, the steady state power consumption of the key element is within the specification range and the transient power consumption is converted into the specification range of the device, the power switch device has sufficient design margin, the driving waveform and the minimum dead time meet the design requirement, and the driving rising edge/falling edge vibration does not influence the normal operation of the product. The key devices include, but are not limited to, diodes, triodes, power MOS transistors, inductors, electrolytic capacitors, transformers, power supply interfaces of processing chips, and the like.
It should be noted that, the electrical stress test is mainly performed on the key devices of the product, and the key devices have a certain derating margin.
And S140, if the second test result meets a preset second condition, generating a test record of the AC-DC power supply passing the power supply test.
Specifically, after the AC-DC power supply 15 is tested, if the AC-DC power supply 15 meets the requirements, a test record of the AC-DC power supply 15 passing the power supply test can be directly generated, and a subsequent operator can directly obtain the test information of the AC-DC power supply 15 through the record.
According to the AC-DC power supply testing method of the laser, after the ambient temperature, the relative humidity and the liquid cooling temperature of the liquid cooling plate of the AC-DC power supply 15 meet respective setting conditions, a first instruction for performing black box testing on the AC-DC power supply 15 is generated to obtain a first testing result, after the first testing result meets a preset first condition, a second instruction for performing white box testing on the AC-DC power supply 15 is generated to obtain a second testing result, after the second testing result meets a preset second condition, a testing record of the AC-DC power supply 15 passing through the power supply testing is generated, so that a testing flow for forming standardization on the AC-DC power supply 15 of the laser is realized, the condition of missing testing in the testing process of the AC-DC power supply 15 of the laser is avoided, and the testing efficiency and reliability of the AC-DC power supply 15 of the laser are further improved.
While the application has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the application. Therefore, the protection scope of the application is subject to the protection scope of the claims.
Claims (10)
1. A method for testing an AC-DC power supply of a laser, comprising:
Acquiring the ambient temperature, the relative humidity and the liquid cooling temperature of a liquid cooling plate of an AC-DC power supply; the liquid cooling plate is used for carrying out liquid cooling on the AC-DC power supply;
If the ambient temperature, the relative humidity and the liquid cooling temperature all meet respective setting conditions, generating a first instruction for performing black box test on the AC-DC power supply to obtain a first test result of the AC-DC power supply;
if the first test result meets a preset first condition, generating a second instruction for performing white box test on the AC-DC power supply to obtain a second test result of the AC-DC power supply;
and if the second test result meets a preset second condition, generating a test record of the AC-DC power supply passing the power supply test.
2. The method of claim 1, wherein the first instructions comprise a performance test instruction, a case test instruction, a first security test instruction, and a first EMC test instruction, and the first test results comprise a performance test result, a case test result, a first security test result, and a first EMC test result;
wherein the generating a first instruction for performing a black box test on the AC-DC power supply to obtain a first test result of the AC-DC power supply includes:
Generating the performance test instruction to obtain the performance test result;
If the performance test result meets a preset third condition, generating the case test instruction to acquire the case test result;
if the case test result meets a preset fourth condition, generating the first safety regulation test instruction to acquire the first safety regulation test result;
If the first safety regulation test result meets a preset fifth condition, generating the first EMC test instruction to acquire the first EMC test result; the first EMC test result comprises an electric fast transient pulse group immunity, a surge impact immunity, a conductive emission test result and a conductive immunity test result.
3. The method of claim 2, wherein the performance test instructions comprise a first characteristic test instruction and a protection test instruction;
Wherein the generating the performance test instruction to obtain the performance test result includes:
Generating the first characteristic test instruction to obtain a full-load test result of the AC-DC power supply; the full-load test result comprises rated input voltage, rated output voltage and rated output current;
if the full-load test result meets a preset sixth condition, generating the protection test instruction to acquire a protection test result of the AC-DC power supply; the protection test result comprises an input overvoltage and undervoltage test result and an output short circuit test result.
4. The method of claim 3, wherein the performance test instructions further comprise a second characteristic test instruction and a third characteristic test instruction;
wherein after the generating the first characteristic test instruction to obtain a full-load test result of the AC-DC power supply, the method further includes:
If the full-load test result meets a preset sixth condition, acquiring setting information of the oscilloscope required by the AC-DC power supply;
Generating the second characteristic test instruction according to the setting information to obtain a ripple test result of the AC-DC power supply; the ripple test result comprises full-load ripple voltage of an AC-DC power supply;
If the ripple test result meets a preset seventh condition, generating the third characteristic test instruction to acquire a dynamic response test result of the AC-DC power supply; wherein the dynamic response test result includes an overshoot voltage and a dip voltage.
5. The method of claim 2, wherein the case test instructions include a power-on test instruction, a first discharge test instruction, and a second discharge test instruction;
Wherein the generating the case test instruction to obtain the case test result includes:
Generating the power-on instruction to acquire the delay time of the AC-DC power supply for generating rated output voltage in a full-load state;
If the delay time is lower than a first threshold value, generating the first discharge test instruction to obtain a first discharge time of the AC-DC power supply discharge;
and if the first discharge time is lower than a second threshold value, generating the second discharge test instruction to acquire the second discharge time of the AC-DC power supply in a preset load state.
6. The method of claim 2, wherein the first safety test instruction comprises an insulation resistance test instruction, a first insulation strength test instruction, and a second insulation strength test instruction;
The generating the first security testing instruction to obtain the first security testing result includes:
Generating the insulation resistance test instruction to obtain the insulation resistance of the AC-DC power supply under a preset first voltage in a preset first time;
Generating the first insulation strength test instruction to obtain a first insulation strength of the AC-DC power supply at a preset second voltage within the preset second time; wherein the second voltage is higher than the first voltage;
Generating the second insulation strength test instruction to acquire a second insulation strength of the AC-DC power supply in the preset third time under a preset third voltage; wherein the third voltage is higher than the second voltage.
7. The method of claim 1, wherein the second instructions comprise a second safety compliance test instruction, a second EMC test instruction, a reliability test instruction, and a grid adaptability test instruction, and the second test results comprise a second safety compliance test result, a second EMC test result, a reliability test result, and a grid adaptability test result;
Wherein the generating a second instruction for performing a white box test on the AC-DC power supply to obtain a second test result of the AC-DC power supply includes:
Generating the second safety regulation test instruction to acquire a second safety regulation test result; the second safety regulation test result comprises an anti-electric strength and a grounding resistance value;
If the electric resistance strength meets a preset eighth condition and the grounding resistance value is lower than a preset resistance value, generating the second EMC test instruction to acquire a second EMC test result; the second EMC test result comprises a terminal radiation disturbance value and radiation immunity;
If the terminal radiation disturbance value is lower than a third threshold value and the radiation immunity is higher than a second threshold value, generating the reliability test instruction to acquire the reliability test result;
And if the reliability test result meets a preset ninth condition, generating the power grid adaptability test instruction to acquire the power grid adaptability test result.
8. The method of claim 7, wherein the reliability test instructions comprise a mechanical test instruction and a climate test instruction, and wherein the reliability test results comprise a mechanical test result and a climate test result;
Wherein the generating the reliability test instruction to obtain the reliability test result includes:
generating the mechanical test instruction to obtain a mechanical test result of the AC-DC power supply under a first preset standard; wherein the mechanical test results comprise vibration test results and drop test results;
Generating the climate test instruction to obtain a climate test result of the AC-DC power supply under a second preset standard; the climate test results comprise a high-low temperature test result, a constant damp-heat test result, an alternating damp-heat test result and a temperature cycle test result.
9. The method of claim 7, wherein the second instructions further comprise a thermal test instruction and an electrical stress test instruction;
wherein after the generating the reliability test instruction to obtain the reliability test result, the method further includes:
generating the thermal test instruction to obtain a thermal test result of the AC-DC power supply under a third preset standard;
And generating the electric stress test instruction to obtain an electric stress test result of the AC-DC power supply under a fourth preset standard.
10. The AC-DC power supply testing system of the laser is characterized by comprising a central control platform, a power supply programmable power supply, an electronic load instrument and a liquid cooling plate;
the power supply program-controlled power supply is used for supplying power to the AC-DC power supply, the electronic load instrument is used for simulating the load of the AC-DC power supply, the liquid cooling plate is used for carrying out liquid cooling on the AC-DC power supply, and the central control platform is used for executing the AC-DC power supply testing method of the laser device according to any one of claims 1-9.
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