CN117971627A - Server host power-off test analysis system based on data analysis - Google Patents

Server host power-off test analysis system based on data analysis Download PDF

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Publication number
CN117971627A
CN117971627A CN202410366475.6A CN202410366475A CN117971627A CN 117971627 A CN117971627 A CN 117971627A CN 202410366475 A CN202410366475 A CN 202410366475A CN 117971627 A CN117971627 A CN 117971627A
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power
test
interval
host
computer host
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罗五旗
陈建伟
钟锦红
黄佑海
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Shenzhen Lingdechuang Technology Co ltd
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Shenzhen Lingdechuang Technology Co ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

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Abstract

The invention belongs to the field of power-off test, relates to a data analysis technology, and is used for solving the problem that the power-off performance of a computer host cannot be integrally and comprehensively evaluated according to power-off test data in the prior art, in particular to a server host power-off test analysis system based on data analysis, which comprises a test analysis platform, wherein the test analysis platform is in communication connection with a power-off control module, a test analysis module, a test evaluation module and a storage module; the power-off control module is used for setting power-off parameters for the computer host through the server host, wherein the power-off parameters comprise power-off execution i and interval values i, the power-off execution i is a power-off execution process of a power supply circuit of the computer host in a test period, and the interval values i are time intervals from the power-off execution i to the power-off execution i+1; the invention can set the power-off parameters for the computer host through the server host, and provide a standardized and customized test environment for the computer host.

Description

Server host power-off test analysis system based on data analysis
Technical Field
The invention belongs to the field of outage testing, relates to a data analysis technology, and particularly relates to a server host outage testing analysis system based on data analysis.
Background
The server host power-off test analysis system is a tool for evaluating the performance and stability of the computer host under the power-off condition, and the server host is used for simulating the unexpected power-off condition of the computer host so as to evaluate the recovery capability of the computer host under the power-off condition.
The server host power-off test analysis system in the prior art cannot carry out overall and comprehensive evaluation on the power-off performance of the computer host according to test data, and also cannot carry out abnormal characteristic analysis on the computer host with unqualified power-off test, so that the difficulty in troubleshooting of the influence links of power-off abnormality is high.
The application provides a solution to the technical problem.
Disclosure of Invention
The invention aims to provide a server host power-off test analysis system based on data analysis, which is used for solving the problem that the power-off performance of a computer host cannot be integrally and comprehensively evaluated according to power-off test data in the prior art;
the technical problems to be solved by the invention are as follows: how to provide a server host power-off test analysis system based on data analysis, which can carry out overall and comprehensive evaluation on the power-off performance of a computer host according to power-off test data.
The aim of the invention can be achieved by the following technical scheme:
The server host power-off test analysis system based on data analysis comprises a test analysis platform, wherein the test analysis platform is in communication connection with a power-off control module, a test analysis module, a test evaluation module and a storage module;
The power-off control module is used for setting power-off parameters for the computer host through the server host, wherein the power-off parameters comprise power-off execution i and interval values i, the power-off execution i is a power-off execution process of a power supply circuit of the computer host in a test period, the interval values i are time intervals from the power-off execution i to the power-off execution i+1, and i=1, 2, …, n and n are positive integers;
The test analysis module is used for carrying out test analysis on the restarting performance of the computer host after the power supply line of the computer host is cut off: generating a test period, switching on a power supply circuit of a computer host at the beginning time of the test period, marking the power-off execution times n as L1, marking the interval value i as L2, and performing test analysis including fixed test, interval test and stable test;
And the test evaluation module is used for evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host.
As a preferred embodiment of the present invention, the specific procedure of the fixture test includes: performing power-off execution i after L3 seconds, restarting the host computer after the power-off execution i is finished, and acquiring restarting data CQi and occupation data ZYi of the computer, wherein the restarting data CQi is the restarting time of the computer, and the occupation data ZYi is the maximum CPU occupation rate in the restarting process of the computer; the performance coefficient XNi of the computer in the power-off execution i is obtained by carrying out numerical calculation on the restarting data CQi and the occupied data ZYi; acquiring performance coefficients XNi of the computer host in all power-off execution i at the end time of the test period, and summing and averaging to obtain a fixed coefficient of the computer host; and marking the computer host as a fixed qualified object or a fixed abnormal object through the fixed coefficient.
As a preferred embodiment of the invention, the specific process of marking the computer host as a fixed qualified object or a fixed abnormal object comprises the following steps: the fixed threshold value is obtained through the storage module, and the fixed coefficient is compared with the fixed threshold value: if the fixed coefficient is smaller than the fixed threshold, judging that the fixed test result of the computer host meets the requirement, and marking the corresponding computer host as a fixed qualified object; if the fixed coefficient is greater than or equal to the fixed threshold, determining that the fixed test result of the computer host does not meet the requirement, and marking the corresponding computer host as a fixed abnormal object.
As a preferred embodiment of the present invention, the specific process of the interval test includes: the power supply circuit of the computer host is connected at the beginning time of the next test period, the power-off execution times n are marked as L1, the interval value i is marked as L2-i t1, the power-off execution i is carried out after L3 seconds, the computer host is restarted and the performance coefficient XNi of the computer host is obtained again after the power-off execution i is finished, the performance coefficients XNi of the computer host in all the power-off execution i are obtained at the ending time of the test period, the interval coefficient is obtained by summing and averaging, and the computer host is marked as an interval qualified object or an interval abnormal object through the interval coefficient.
As a preferred embodiment of the invention, the specific process of marking the computer host as a spacing qualified object or a spacing abnormal object comprises the following steps: the interval threshold is obtained through the storage module, and the interval coefficient is compared with the interval threshold: if the interval coefficient is smaller than the interval threshold value, judging that the interval test result of the host computer meets the requirement, and marking the corresponding host computer as an interval qualified object; if the interval coefficient is greater than or equal to the interval threshold, judging that the interval test result of the computer host does not meet the requirement, and marking the corresponding computer host as an interval abnormal object.
As a preferred embodiment of the present invention, the specific process of the stability test comprises: the method comprises the steps of switching on a power supply circuit of a computer host at the beginning time of a next test period, marking the power-off execution times n as 2x L1, marking an interval value i as L2, performing power-off execution i after L3 seconds, restarting the computer host after the power-off execution i is finished, re-acquiring the performance coefficient XNi of the computer host, acquiring the performance coefficients XNi of the computer host in all the power-off execution i at the ending time of the test period, summing and averaging to obtain the stability coefficient of the computer host, and marking the computer host as a stable qualified object or a stable abnormal object through the stability coefficient.
As a preferred embodiment of the invention, the specific process of marking the computer host as a stable qualified object or a stable abnormal object comprises the following steps: the stability threshold is obtained through the storage module, and the stability coefficient is compared with the stability threshold: if the stability coefficient is smaller than the stability threshold, judging that the stability test result of the computer host meets the requirement, and marking the corresponding computer host as a stable qualified object; if the stability coefficient is greater than or equal to the stability threshold, determining that the stability test result of the computer host does not meet the requirement, and marking the corresponding computer host as a stability abnormal object.
As a preferred implementation mode of the invention, the specific process of evaluating and analyzing the power-off performance of the computer host by the test evaluation module comprises the following steps: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, and carrying out numerical calculation on the fixed data GD, the interval data JG and the stable data WD to obtain an evaluation coefficient PJ for power-off test of a server host, wherein beta 1, beta 2 and beta 3 are proportionality coefficients, and beta 1 > beta 2 > beta 3 > 1; the evaluation threshold PJmax is obtained through the storage module, the evaluation coefficient PJ is compared with the evaluation threshold PJmax, and whether the test result of the server host meets the requirement is judged according to the comparison result.
As a preferred embodiment of the present invention, the specific process of comparing the evaluation coefficient PJ with the evaluation threshold PJmax includes: if the evaluation coefficient PJ is smaller than the evaluation threshold PJmax, judging that the power-off test result of the server host meets the requirement; if the evaluation coefficient PJ is larger than or equal to the evaluation threshold PJmax, judging that the power-off test result of the server host does not meet the requirement, and comprehensively analyzing the measured data: marking the computer hosts which are marked as the fixed qualified objects, the interval qualified objects and the stable qualified objects at the same time as normal objects, marking the ratio of the number of the normal objects to the number of the computer hosts as normal coefficients, acquiring a normal threshold value through a storage module, and comparing the normal coefficients with the normal threshold value: if the normal coefficient is smaller than the normal threshold, generating a process optimization signal and sending the process optimization signal to a test analysis platform, and after receiving the process optimization signal, the test analysis platform sends the process optimization signal to a mobile phone terminal of a manager; if the normal coefficient is greater than or equal to the normal threshold, generating a raw material monitoring signal and sending the raw material monitoring signal to a test analysis platform, and sending the raw material monitoring signal to a mobile phone terminal of a manager after the test analysis platform receives the raw material monitoring signal.
As a preferred embodiment of the invention, the working method of the server host power-off test analysis system based on data analysis comprises the following steps:
Step one: the method comprises the steps that a server host is used for carrying out power-off parameter setting on a computer host, wherein the power-off parameter comprises power-off execution i and an interval value i, the power-off execution i is a cutting-off execution process of a power supply circuit of the computer host in a test period, and the interval value i is a time interval from the power-off execution i to the power-off execution i+1;
Step two: generating a test period, sequentially fixing test, interval test and stability test in the continuous test period respectively, and sequentially marking the fixed abnormal object, the interval abnormal object and the stability abnormal object;
Step three: evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, performing numerical calculation to obtain an evaluation coefficient PJ, and judging whether the power-off test result of the server host meets the requirement or not through the evaluation coefficient PJ.
The invention has the following beneficial effects:
1. The power-off control module can set power-off parameters for the computer host through the server host, and then power-off test is carried out on the computer host according to the set basic data, so that a standardized and customized test environment is provided for the computer host;
2. The restarting performance of the computer host can be tested and analyzed after the power supply line of the computer host is cut off through the test analysis module, and the power-off performance of the computer host under different test environments is respectively evaluated through the processes of fixed test, interval test, stable test and the like, so that the accuracy and the comprehensiveness of the power-off test result are improved;
The test evaluation module can evaluate and analyze the power-off performance of the computer host through the result of the power-off test analysis of the server host, comprehensively analyze and calculate the test results of the fixed test, the interval test and the stable test to obtain an evaluation coefficient, feed back the overall test result through the evaluation coefficient, comprehensively analyze when the overall test result is not ideal, generate a processing decision signal through the overall analysis result, and improve the exception handling efficiency.
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In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a system block diagram of a first embodiment of the present invention;
fig. 2 is a flowchart of a method according to a second embodiment of the invention.
Detailed Description
The technical solutions of the present invention will be clearly and completely described in connection with the embodiments, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
As shown in FIG. 1, the server host power-off test analysis system based on data analysis comprises a test analysis platform, wherein the test analysis platform is in communication connection with a power-off control module, a test analysis module, a test evaluation module and a storage module.
The power-off control module is used for setting power-off parameters for the computer host through the server host, wherein the power-off parameters comprise power-off execution i and interval values i, the power-off execution i is a power-off execution process of a power supply circuit of the computer host in a test period, and the interval values i are time intervals from the power-off execution i to the power-off execution i+1; the power-off parameter setting is carried out for the computer host through the server host, then the power-off test is carried out for the computer host according to the set basic data, and a standardized and customized test environment is provided for the computer host.
The test analysis module is used for carrying out test analysis on the restarting performance of the computer host after the power supply line of the computer host is cut off: generating a test period, switching on a power supply circuit of a computer host at the beginning time of the test period, marking the power-off execution times n as L1, marking the interval value i as L2, and performing test analysis processes including a fixed test, an interval test and a stable test, wherein the specific process of the fixed test includes: performing power-off execution i after L3 seconds, restarting the host computer after the power-off execution i is finished, and acquiring restarting data CQi and occupation data ZYi of the computer, wherein the restarting data CQi is the restarting time of the computer, and the occupation data ZYi is the maximum CPU occupation rate in the restarting process of the computer; obtaining a performance coefficient XNi of the computer in the power-off execution i through a formula XNi =α1cqi+α2zyi×100, wherein α1 and α2 are both proportional coefficients, and α1 > α2 > 1; acquiring performance coefficients XNi of the computer host in all power-off execution i at the end time of the test period, and summing and averaging to obtain a fixed coefficient of the computer host; the fixed threshold value is obtained through the storage module, and the fixed coefficient is compared with the fixed threshold value: if the fixed coefficient is smaller than the fixed threshold, judging that the fixed test result of the computer host meets the requirement, and marking the corresponding computer host as a fixed qualified object; if the fixed coefficient is greater than or equal to the fixed threshold, determining that the fixed test result of the computer host does not meet the requirement, and marking the corresponding computer host as a fixed abnormal object.
The specific process of interval test comprises the following steps: the method comprises the steps of switching on a power supply circuit of a computer host at the beginning moment of a next test period, marking the power-off execution times n as L1, marking an interval value i as L2-i t1, performing power-off execution i after L3 seconds, restarting the computer host after the power-off execution i is finished, re-acquiring the performance coefficient XNi of the computer host, acquiring the performance coefficients XNi of the computer host in all the power-off execution i at the ending moment of the test period, summing and averaging to obtain an interval coefficient, acquiring an interval threshold value through a storage module, and comparing the interval coefficient with the interval threshold value: if the interval coefficient is smaller than the interval threshold value, judging that the interval test result of the host computer meets the requirement, and marking the corresponding host computer as an interval qualified object; if the interval coefficient is greater than or equal to the interval threshold, judging that the interval test result of the computer host does not meet the requirement, and marking the corresponding computer host as an interval abnormal object.
The specific process of the stability test comprises the following steps: the method comprises the steps of switching on a power supply circuit of a computer host at the beginning time of a next test period, marking the power-off execution times n as 2 x L1, marking an interval value i as L2, performing power-off execution i after L3 seconds, restarting the computer host after the power-off execution i is finished, re-acquiring the performance coefficient XNi of the computer host, acquiring the performance coefficients XNi of the computer host in all the power-off execution i at the ending time of the test period, summing and averaging to obtain a stability coefficient of the computer host, acquiring a stability threshold value through a storage module, and comparing the stability coefficient with the stability threshold value: if the stability coefficient is smaller than the stability threshold, judging that the stability test result of the computer host meets the requirement, and marking the corresponding computer host as a stable qualified object; if the stability coefficient is greater than or equal to the stability threshold, determining that the stability test result of the computer host does not meet the requirement, and marking the corresponding computer host as a stability abnormal object.
After the power supply line of the computer host is cut off, the restarting performance of the computer host is tested and analyzed, and the power-off performance of the computer host under different test environments is respectively evaluated through the processes of fixed test, interval test, stable test and the like, so that the accuracy and the comprehensiveness of the power-off test result are improved.
The test evaluation module is used for evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, and obtaining an evaluation coefficient PJ of a power-off test of a server host through a formula PJ=β1xGD+β2xJG+β3xWD, wherein β1, β2 and β3 are proportionality coefficients, and β1 > β2 > β3 > 1; the evaluation threshold PJmax is obtained by the storage module, and the evaluation coefficient PJ is compared with the evaluation threshold PJmax: if the evaluation coefficient PJ is smaller than the evaluation threshold PJmax, judging that the power-off test result of the server host meets the requirement; if the evaluation coefficient PJ is larger than or equal to the evaluation threshold PJmax, judging that the power-off test result of the server host does not meet the requirement, and comprehensively analyzing the measured data: marking the computer hosts which are marked as the fixed qualified objects, the interval qualified objects and the stable qualified objects at the same time as normal objects, marking the ratio of the number of the normal objects to the number of the computer hosts as normal coefficients, acquiring a normal threshold value through a storage module, and comparing the normal coefficients with the normal threshold value: if the normal coefficient is smaller than the normal threshold, generating a process optimization signal and sending the process optimization signal to a test analysis platform, and after receiving the process optimization signal, the test analysis platform sends the process optimization signal to a mobile phone terminal of a manager; if the normal coefficient is greater than or equal to the normal threshold value, generating a raw material monitoring signal and sending the raw material monitoring signal to a test analysis platform, and sending the raw material monitoring signal to a mobile phone terminal of a manager after the test analysis platform receives the raw material monitoring signal; and (3) evaluating and analyzing the power-off performance of the computer host through the result of the power-off test analysis of the server host, comprehensively analyzing and calculating the test results of the fixed test, the interval test and the stable test to obtain an evaluation coefficient, feeding back the overall test result through the evaluation coefficient, comprehensively analyzing when the overall test result is not ideal, generating a processing decision signal through the overall analysis result, and improving the exception handling efficiency.
Example two
As shown in fig. 2, a server host power-off test analysis method based on data analysis includes the following steps:
Step one: the method comprises the steps that a server host is used for carrying out power-off parameter setting on a computer host, wherein the power-off parameter comprises power-off execution i and an interval value i, the power-off execution i is a cutting-off execution process of a power supply circuit of the computer host in a test period, and the interval value i is a time interval from the power-off execution i to the power-off execution i+1;
Step two: generating a test period, sequentially fixing test, interval test and stability test in the continuous test period respectively, and sequentially marking the fixed abnormal object, the interval abnormal object and the stability abnormal object;
Step three: evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, performing numerical calculation to obtain an evaluation coefficient PJ, and judging whether the power-off test result of the server host meets the requirement or not through the evaluation coefficient PJ.
When the server host power-off test analysis system based on data analysis works, the server host is used for carrying out power-off parameter setting on the computer host, wherein the power-off parameter comprises power-off execution i and an interval value i, the power-off execution i is the power-off execution process of a power supply circuit of the computer host in a test period, and the interval value i is the time interval from the power-off execution i to the power-off execution i+1; generating a test period, sequentially fixing test, interval test and stability test in the continuous test period respectively, and sequentially marking the fixed abnormal object, the interval abnormal object and the stability abnormal object; evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, performing numerical calculation to obtain an evaluation coefficient PJ, and judging whether the power-off test result of the server host meets the requirement or not through the evaluation coefficient PJ.
The foregoing is merely illustrative of the structures of this invention and various modifications, additions and substitutions for those skilled in the art can be made to the described embodiments without departing from the scope of the invention or from the scope of the invention as defined in the accompanying claims.
The formulas are all formulas obtained by collecting a large amount of data for software simulation and selecting a formula close to a true value, and coefficients in the formulas are set by a person skilled in the art according to actual conditions; such as: the formula pj=β1×gd+β2×jg+β3×wd; collecting a plurality of groups of sample data by a person skilled in the art and setting a corresponding evaluation coefficient for each group of sample data; substituting the set evaluation coefficient and the acquired sample data into a formula, forming a ternary one-time equation set by any three formulas, screening the calculated coefficient, and taking an average value to obtain values of beta 1, beta 2 and beta 3 of 4.35, 2.52 and 2.16 respectively;
The size of the coefficient is a specific numerical value obtained by quantizing each parameter, so that the subsequent comparison is convenient, and the size of the coefficient depends on the number of sample data and the corresponding evaluation coefficient is preliminarily set for each group of sample data by a person skilled in the art; as long as the proportional relation between the parameter and the quantized value is not affected, for example, the evaluation coefficient is proportional to the value of the fixed data.
In the description of the present specification, the descriptions of the terms "one embodiment," "example," "specific example," and the like, mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The preferred embodiments of the invention disclosed above are intended only to assist in the explanation of the invention. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise form disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention. The invention is limited only by the claims and the full scope and equivalents thereof.

Claims (10)

1. The server host power-off test analysis system based on data analysis is characterized by comprising a test analysis platform, wherein the test analysis platform is in communication connection with a power-off control module, a test analysis module, a test evaluation module and a storage module;
The power-off control module is used for setting power-off parameters for the computer host through the server host, wherein the power-off parameters comprise power-off execution i and interval values i, the power-off execution i is a power-off execution process of a power supply circuit of the computer host in a test period, the interval values i are time intervals from the power-off execution i to the power-off execution i+1, and i=1, 2, …, n and n are positive integers;
The test analysis module is used for carrying out test analysis on the restarting performance of the computer host after the power supply line of the computer host is cut off: generating a test period, switching on a power supply circuit of a computer host at the beginning time of the test period, marking the power-off execution times n as L1, marking the interval value i as L2, and performing test analysis including fixed test, interval test and stable test;
And the test evaluation module is used for evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host.
2. The server host power down test analysis system based on data analysis of claim 1, wherein the specific process of the fixed test comprises: performing power-off execution i after L3 seconds, restarting the host computer after the power-off execution i is finished, and acquiring restarting data CQi and occupation data ZYi of the computer, wherein the restarting data CQi is the restarting time of the computer, and the occupation data ZYi is the maximum CPU occupation rate in the restarting process of the computer; the performance coefficient XNi of the computer in the power-off execution i is obtained by carrying out numerical calculation on the restarting data CQi and the occupied data ZYi; acquiring performance coefficients XNi of the computer host in all power-off execution i at the end time of the test period, and summing and averaging to obtain a fixed coefficient of the computer host; and marking the computer host as a fixed qualified object or a fixed abnormal object through the fixed coefficient.
3. The system of claim 2, wherein the marking the computer host as a stationary qualified object or a stationary abnormal object comprises: the fixed threshold value is obtained through the storage module, and the fixed coefficient is compared with the fixed threshold value: if the fixed coefficient is smaller than the fixed threshold, judging that the fixed test result of the computer host meets the requirement, and marking the corresponding computer host as a fixed qualified object; if the fixed coefficient is greater than or equal to the fixed threshold, determining that the fixed test result of the computer host does not meet the requirement, and marking the corresponding computer host as a fixed abnormal object.
4. A server host power down test analysis system based on data analysis according to claim 3, wherein the specific process of interval testing comprises: the power supply circuit of the computer host is connected at the beginning time of the next test period, the power-off execution times n are marked as L1, the interval value i is marked as L2-i t1, the power-off execution i is carried out after L3 seconds, the computer host is restarted and the performance coefficient XNi of the computer host is obtained again after the power-off execution i is finished, the performance coefficients XNi of the computer host in all the power-off execution i are obtained at the ending time of the test period, the interval coefficient is obtained by summing and averaging, and the computer host is marked as an interval qualified object or an interval abnormal object through the interval coefficient.
5. The system of claim 4, wherein the marking the computer as a space qualified object or a space abnormal object comprises: the interval threshold is obtained through the storage module, and the interval coefficient is compared with the interval threshold: if the interval coefficient is smaller than the interval threshold value, judging that the interval test result of the host computer meets the requirement, and marking the corresponding host computer as an interval qualified object; if the interval coefficient is greater than or equal to the interval threshold, judging that the interval test result of the computer host does not meet the requirement, and marking the corresponding computer host as an interval abnormal object.
6. The server host power down test analysis system based on data analysis of claim 5, wherein the specific process of stabilizing the test comprises: the method comprises the steps of switching on a power supply circuit of a computer host at the beginning time of a next test period, marking the power-off execution times n as 2 x L1, marking an interval value i as L2, performing power-off execution i after L3 seconds, restarting the computer host after the power-off execution i is finished, re-acquiring the performance coefficient XNi of the computer host, acquiring the performance coefficients XNi of the computer host in all the power-off execution i at the ending time of the test period, summing and averaging to obtain the stability coefficient of the computer host, and marking the computer host as a stable qualified object or a stable abnormal object through the stability coefficient.
7. The system of claim 6, wherein the marking the computer as a stable qualified object or a stable abnormal object comprises: the stability threshold is obtained through the storage module, and the stability coefficient is compared with the stability threshold: if the stability coefficient is smaller than the stability threshold, judging that the stability test result of the computer host meets the requirement, and marking the corresponding computer host as a stable qualified object; if the stability coefficient is greater than or equal to the stability threshold, determining that the stability test result of the computer host does not meet the requirement, and marking the corresponding computer host as a stability abnormal object.
8. The server host power-down test analysis system based on data analysis according to claim 7, wherein the specific process of the test evaluation module for evaluating and analyzing the power-down performance of the computer host comprises: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, and carrying out numerical calculation on the fixed data GD, the interval data JG and the stable data WD to obtain an evaluation coefficient PJ for power-off test of a server host, wherein beta 1, beta 2 and beta 3 are proportionality coefficients, and beta 1 > beta 2 > beta 3 > 1; the evaluation threshold PJmax is obtained through the storage module, the evaluation coefficient PJ is compared with the evaluation threshold PJmax, and whether the test result of the server host meets the requirement is judged according to the comparison result.
9. The server host power down test analysis system based on data analysis of claim 8, wherein the specific process of comparing the evaluation coefficient PJ with the evaluation threshold PJmax comprises: if the evaluation coefficient PJ is smaller than the evaluation threshold PJmax, judging that the power-off test result of the server host meets the requirement; if the evaluation coefficient PJ is larger than or equal to the evaluation threshold PJmax, judging that the power-off test result of the server host does not meet the requirement, and comprehensively analyzing the measured data: marking the computer hosts which are marked as the fixed qualified objects, the interval qualified objects and the stable qualified objects at the same time as normal objects, marking the ratio of the number of the normal objects to the number of the computer hosts as normal coefficients, acquiring a normal threshold value through a storage module, and comparing the normal coefficients with the normal threshold value: if the normal coefficient is smaller than the normal threshold, generating a process optimization signal and sending the process optimization signal to a test analysis platform, and after receiving the process optimization signal, the test analysis platform sends the process optimization signal to a mobile phone terminal of a manager; if the normal coefficient is greater than or equal to the normal threshold, generating a raw material monitoring signal and sending the raw material monitoring signal to a test analysis platform, and sending the raw material monitoring signal to a mobile phone terminal of a manager after the test analysis platform receives the raw material monitoring signal.
10. A server host power down test analysis system based on data analysis according to any one of claims 1-9, wherein the working method of the server host power down test analysis system based on data analysis comprises the steps of:
Step one: the method comprises the steps that a server host is used for carrying out power-off parameter setting on a computer host, wherein the power-off parameter comprises power-off execution i and an interval value i, the power-off execution i is a cutting-off execution process of a power supply circuit of the computer host in a test period, and the interval value i is a time interval from the power-off execution i to the power-off execution i+1;
Step two: generating a test period, sequentially fixing test, interval test and stability test in the continuous test period respectively, and sequentially marking the fixed abnormal object, the interval abnormal object and the stability abnormal object;
Step three: evaluating and analyzing the power-off performance of the computer host according to the result of the power-off test analysis of the server host: marking the marking times of the fixed abnormal object, the interval abnormal object and the stable abnormal object as fixed data GD, interval data JG and stable data WD respectively, performing numerical calculation to obtain an evaluation coefficient PJ, and judging whether the power-off test result of the server host meets the requirement or not through the evaluation coefficient PJ.
CN202410366475.6A 2024-03-28 2024-03-28 Server host power-off test analysis system based on data analysis Pending CN117971627A (en)

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US20200088789A1 (en) * 2018-09-13 2020-03-19 Advantest Corporation Apparatus, method, and storage medium
WO2022217484A1 (en) * 2021-04-14 2022-10-20 深圳元戎启行科技有限公司 Method and apparatus for testing vehicle-mounted sensor system, and computer device
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