CN117971581A

CN117971581A - Equipment testing method and device, electronic equipment and storage medium

Info

Publication number: CN117971581A
Application number: CN202410154379.5A
Authority: CN
Inventors: 王朝翔
Original assignee: Eve Energy Co Ltd
Current assignee: Eve Energy Co Ltd
Priority date: 2024-02-02
Filing date: 2024-02-02
Publication date: 2024-05-03

Abstract

The embodiment of the invention discloses a device testing method, a device, electronic equipment and a storage medium. The method comprises the following steps: acquiring test requirement information of equipment to be tested, and generating an automatic control script based on the test requirement information; generating a device control instruction by executing the automation control script, wherein the device control instruction comprises a device control parameter; the equipment control instruction is sent to the equipment to be tested, and a control response result of the equipment to be tested is obtained; and generating a device test report aiming at the device to be tested based on the device control parameters and the control response result. According to the technical scheme, the automatic hardware test of the hardware equipment can be conveniently realized, the test cost is reduced, the test accuracy is improved, and the hardware test efficiency is improved.

Description

Equipment testing method and device, electronic equipment and storage medium

Technical Field

The embodiment of the invention relates to the technical field of computers, in particular to a device testing method and device, electronic equipment and a storage medium.

Background

In the prior art, for testing hardware devices, a professional tester is usually required to spend a lot of time to use software, for example, labVIEW manually writes control scripts, so that the testing cost of the hardware devices is higher. Furthermore, because the script is written by the manual operation software, the script is easy to have the condition of writing errors, so that the test accuracy of the hardware equipment is lower and the test efficiency is poorer.

Disclosure of Invention

The invention provides a device testing method, a device, an electronic device and a storage medium, which are used for realizing more convenient automatic hardware testing of hardware devices, so that the testing cost is reduced, the testing accuracy is improved, and the hardware testing efficiency is improved.

According to an aspect of the present invention, there is provided a device testing method, the method comprising:

Acquiring test requirement information of equipment to be tested, and generating an automatic control script based on the test requirement information;

Generating a device control instruction by executing the automation control script, wherein the device control instruction comprises a device control parameter;

the equipment control instruction is sent to the equipment to be tested, and a control response result of the equipment to be tested is obtained;

and generating a device test report aiming at the device to be tested based on the device control parameters and the control response result.

Optionally, the obtaining the test requirement information of the device to be tested includes: establishing HTTP communication connection with a device demand management system of the device to be tested; and based on the HTTP communication connection, acquiring the test requirement information of the device to be tested from the device requirement management system.

Optionally, the obtaining, from the device requirement management system, the test requirement information of the device under test includes: and acquiring the test requirement information of the device to be tested from the device requirement management system by calling a custom requirement information acquisition script.

Optionally, the generating an automation control script based on the test requirement information includes: matching a target test interface corresponding to the test requirement information from a plurality of preset test interfaces, wherein the preset test interfaces are interfaces generated after a test method is packaged; and generating an automation control script based on the test requirement information and the target test interface, wherein the automation control script comprises a script generated based on LabVIEW and/or a script generated based on Python.

Optionally, the device under test includes a plurality of hardware under test, and the device control instruction includes at least one hardware control instruction corresponding to the hardware under test.

Optionally, the sending the device control instruction to the device to be tested, and receiving a control response result sent by the device to be tested, includes: determining target hardware corresponding to the hardware control instruction in a plurality of hardware to be tested aiming at each hardware control instruction, sending the hardware control instruction to the target hardware, and acquiring a control feedback result of the target hardware, wherein the hardware control instruction comprises hardware control parameters; the generating a device test report for the device under test based on the device control parameters and the control response result includes: determining a hardware control instruction corresponding to the hardware to be tested according to each hardware to be tested, and generating a hardware test result aiming at the hardware to be tested based on a hardware control parameter in the hardware control instruction and a control feedback result corresponding to the hardware control parameter; and summarizing the hardware test results to obtain a device test report aiming at the device to be tested.

Optionally, the automation control script includes a hardware control script corresponding to each piece of hardware to be tested.

According to another aspect of the present invention, there is provided a device testing apparatus. The device comprises:

the control script generation module is used for acquiring the test requirement information of the equipment to be tested and generating an automatic control script based on the test requirement information;

A control script execution module for generating device control instructions by executing the automated control script, wherein the device control instructions comprise device control parameters;

The control result receiving module is used for sending the equipment control instruction to the equipment to be tested and obtaining a control response result of the equipment to be tested;

and the test report generation module is used for generating a device test report aiming at the device to be tested based on the device control parameters and the control response result.

According to another aspect of the present invention, there is provided an electronic apparatus including:

At least one processor; and

A memory communicatively coupled to the at least one processor; wherein,

The memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the device testing method of any one of the embodiments of the present invention.

According to another aspect of the present invention, there is provided a computer readable storage medium storing computer instructions for causing a processor to execute a device testing method according to any one of the embodiments of the present invention.

According to the technical scheme provided by the embodiment of the invention, the accuracy of the control script can be improved by acquiring the test requirement information of the equipment to be tested and generating the automatic control script based on the test requirement information. Generating device control instructions by executing the automation control script, wherein the device control instructions comprise device control parameters. And sending the equipment control instruction to the equipment to be tested so as to adjust the equipment to be tested based on the control parameter. And after the equipment to be tested is controlled, a control response result of the equipment to be tested is obtained. And generating a device test report aiming at the device to be tested based on the device control parameters and the control response result. The technical scheme of the embodiment of the invention solves the technical problems of higher test cost, lower accuracy and poorer test efficiency in the existing hardware test, realizes the automatic hardware test of hardware equipment conveniently, reduces the test cost, improves the test accuracy and improves the hardware test efficiency.

It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the invention or to delineate the scope of the invention. Other features of the present invention will become apparent from the description that follows.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic flow chart of a device testing method according to a first embodiment of the present invention;

Fig. 2 is a schematic structural diagram of a device testing apparatus according to a second embodiment of the present invention;

Fig. 3 is a schematic structural diagram of an electronic device according to a third embodiment of the present invention.

Detailed Description

In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.

It is noted that the terms "comprises" and "comprising," and any variations thereof, in the description and claims of the present invention and in the foregoing figures, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed or inherent to such process, method, article, or apparatus.

It will be appreciated that the data (including but not limited to the data itself, the acquisition or use of the data) involved in the present technical solution should comply with the corresponding legal regulations and the requirements of the relevant regulations.

Example 1

Fig. 1 is a schematic flow chart of a device testing method according to a first embodiment of the present invention, where the method may be applied to a case of testing a hardware device, and the method may be performed by a device testing apparatus, where the device testing apparatus may be implemented in a form of hardware and/or software, and the device testing apparatus may be configured in an electronic device such as a computer or a server.

As shown in fig. 1, the method of the present embodiment includes:

S110, acquiring test requirement information of the device to be tested, and generating an automatic control script based on the test requirement information.

The device under test may be understood as a device that needs to be tested. In the embodiment of the invention, the device to be tested can comprise at least one hardware device to be tested, namely hardware to be tested. For example, the hardware to be tested may be at least one model of battery simulator, a bi-directional charging power supply, or at least one CAN communication device, etc. The test requirement information may be understood as requirement information for testing the device under test. In the embodiment of the invention, an automation control script can be understood as a device for testing a device to be tested. The number of automation control scripts may be one, two, or more than two. In practical applications, the number of automated test control scripts is typically multiple. In an embodiment of the present invention, the automation control script may include a hardware control script corresponding to each of the hardware under test. A hardware control script may be understood as a script for controlling hardware under test in a device under test. The correspondence between hardware to be tested and the hardware control script may be one-to-one or one-to-many. In the embodiment of the invention, the hardware control script can comprise a hardware identifier of the hardware to be tested. The hardware identification may be used to distinguish between different hardware under test.

In the embodiment of the present invention, the obtaining the test requirement information of the device to be tested may include: establishing HTTP communication connection with a device demand management system of the device to be tested; and based on the HTTP communication connection, acquiring the test requirement information of the device to be tested from the device requirement management system. The device requirement management system may be understood as a system for receiving requirement information input by a user for a device to be tested and managing the requirement information. In the embodiment of the invention, the HTTP communication connection is established with the equipment requirement management system, so that the test requirement information of the equipment to be tested is obtained from the equipment requirement management system through the HTTP communication connection. Among other things, an HTTP communication connection can be understood as a communication connection established based on the hypertext transfer protocol (Hypertext Transfer Protocol, HTTP).

In the embodiment of the present invention, the obtaining, from the device requirement management system, the test requirement information of the device under test may include: and acquiring the test requirement information of the device to be tested from the device requirement management system by calling a custom requirement information acquisition script. The custom requirement information obtaining script may be understood as a script that is predefined and is used to obtain test requirement information of the device to be tested from the device requirement management system. In the embodiment of the present invention, the computer programming language of the custom demand information acquisition script is set according to the actual demand, which is not specifically limited herein. Specifically, a script for acquiring test requirement information of the device to be tested from the device requirement management system, namely a custom requirement information acquisition script, is predefined. And then the custom demand information acquisition script can be loaded. After loading is completed, the custom demand information acquisition script can be executed, so that the test demand information of the device to be tested can be acquired from the device demand management system.

In an embodiment of the present invention, the generating an automation control script based on the test requirement information may include: matching a target test interface corresponding to the test requirement information from a plurality of preset test interfaces; and generating an automatic control script based on the test requirement information and the target test interface. The preset test interface may be an interface generated after the test method is packaged. The test method may be understood as a method predefined for performing the test. The target test interface may be understood as a target test interface corresponding to the test requirement information among the plurality of preset test interfaces. The automation control script may include a script generated based on LabVIEW and/or a script generated based on Python.

Specifically, after the test requirement information is determined, a test interface corresponding to the test requirement information, that is, a target test interface, may be matched from a plurality of preset test interfaces. After determining the target test interface, the test requirement information may be passed to the target test interface. After the transfer is completed, an automation control script may be obtained. In the embodiment of the invention, the automatic control script aiming at the equipment to be tested can be conveniently, quickly and accurately generated by transmitting the test requirement information to the target test interface, so that the manual writing of the control script is avoided, and the test efficiency and accuracy can be improved.

S120, generating equipment control instructions by executing the automatic control script, wherein the equipment control instructions comprise equipment control parameters.

The device control command may be understood as a command for controlling the device to be tested. The device control instructions may include device control parameters. The number of device control instructions may be one, two or more. The device control parameters may be understood as parameters for controlling the device under test. For example, the control command to be tested may adjust the device voltage to be tested to 5 volts, and the device control parameter to be 5 volts. In the embodiment of the present invention, the correspondence between the device control instruction and the device control parameter may be one-to-one or one-to-many. That is, a device control instruction may include one or more device control parameters.

Specifically, after the automation control script is generated, the device control instruction may be generated by executing the automation control script. In the embodiment of the invention, when the number of the automation control scripts is a plurality of automation control scripts, the execution sequence of each automation control script can be determined. Thus, each automation control script can be sequentially executed according to the execution sequence, so as to generate corresponding equipment control instructions.

S130, sending the equipment control instruction to the equipment to be tested, and obtaining a control response result of the equipment to be tested.

The control response result can be understood as a response result generated by the device to be tested based on the device control instruction. The correspondence between the device control instructions and the control response results may be one-to-one.

Specifically, after generating the device control instruction, the device control instruction may be sent to the device to be tested. Therefore, the device to be tested can be controlled based on the device control parameters in the control instruction, so that the device to be tested generates a control response result corresponding to the device control parameters. After the device to be tested generates a control response result, the control response result can be read; or may receive a control response result fed back by the device under test.

And S140, generating a device test report aiming at the device to be tested based on the device control parameters and the control response result.

Wherein the device test report may be a test report generated based on the device control parameters and the control response results. The format of the device test report may be set according to actual requirements, for example, pdf format or word format.

Specifically, after receiving a control response result sent by the device to be tested, a device control instruction corresponding to the control response result may be determined. Therefore, the device test report aiming at the device to be tested can be generated based on the device control parameters in the device control instruction and the control response result.

In the embodiment of the invention, the device to be tested may include a plurality of hardware to be tested, and the device control instruction may include at least one hardware control instruction corresponding to the hardware to be tested. Hardware control instructions may be understood as instructions for controlling the hardware to be tested. The hardware control instructions may include a hardware identification of the hardware under test. The hardware control instructions may include hardware control parameters. The hardware control parameter may be understood as a parameter for controlling the hardware to be tested.

By way of example, the device under test may include hardware 1, hardware 2, and hardware 3. The device control instructions may include hardware control instructions corresponding to hardware 1, hardware 2, or hardware 3; or the device control instructions may include hardware control instructions corresponding to hardware 1 and device control instructions corresponding to hardware 2; or the device control instructions may include hardware control instructions corresponding to hardware 2 and device control instructions corresponding to hardware 3; or the device control instructions may include hardware control instructions corresponding to hardware 1 and device control instructions corresponding to hardware 3; or the device control instructions may include hardware control instructions corresponding to hardware 1, hardware 2, and hardware 3, respectively.

Based on this, the sending the device control instruction to the device to be tested and obtaining the control response result of the device to be tested may include: and determining target hardware corresponding to the hardware control instruction in a plurality of hardware to be tested according to each hardware control instruction, sending the hardware control instruction to the target hardware, and acquiring a control feedback result of the target hardware. The target hardware may be understood as the hardware corresponding to the hardware control instruction in the plurality of hardware to be tested. The control feedback result may be understood as a feedback result generated by the target hardware for the hardware control instruction.

Specifically, for each hardware control instruction, the hardware control instruction is analyzed, so that a hardware identifier in the hardware control instruction can be obtained, the hardware to be detected corresponding to the hardware identifier is determined to be the target hardware corresponding to the hardware control instruction, namely, the target hardware corresponding to the hardware control instruction is determined from a plurality of pieces of hardware to be detected. After determining the target hardware corresponding to the hardware control instruction, the hardware control instruction may be sent to the target hardware. Therefore, the target hardware can be controlled based on the hardware control parameters in the hardware control instruction, so that the target hardware generates a control feedback result corresponding to the hardware control parameters. After the target hardware generates a control feedback result, the control feedback result of the target hardware can be obtained; or may receive a control feedback result of the target hardware feedback.

In the embodiment of the present invention, the sending the hardware control instruction to the target hardware may specifically be determining a hardware communication protocol with the target hardware, and sending the hardware control instruction to the target hardware according to the hardware communication protocol. Among other things, a hardware communication protocol may be understood as a protocol that communicates with the target hardware, such as transmission control protocol/interconnect protocol (Transmission Control Protocol/Internet Protocol, TCP/IP), user datagram protocol (User Datagram Protocol, UDP), etc. In the embodiment of the invention, the hardware communication protocols of the hardware to be tested in the equipment to be tested can be the same or different.

Correspondingly, the generating the device test report for the device under test based on the device control parameter and the control response result may include: for each piece of hardware to be tested, a hardware control instruction corresponding to the piece of hardware to be tested can be determined. Therefore, a hardware test result aiming at the hardware to be tested can be generated based on the hardware control parameters in the hardware control instruction and the control feedback results corresponding to the hardware control parameters. And further, summarizing the hardware test results to obtain a device test report for the device to be tested. The hardware test result may be a test result generated based on a hardware control parameter in the hardware control instruction and a control feedback result corresponding to the hardware control parameter.

According to the technical scheme provided by the embodiment of the invention, the accuracy of the control script can be improved by acquiring the test requirement information of the equipment to be tested and generating the automatic control script based on the test requirement information. Generating device control instructions by executing the automation control script, wherein the device control instructions comprise device control parameters. And sending the equipment control instruction to the equipment to be tested so as to adjust the equipment to be tested based on the control parameter. And after the equipment to be tested is controlled, receiving a control response result sent by the equipment to be tested. And generating a device test report aiming at the device to be tested based on the device control parameters and the control response result. The technical scheme of the embodiment of the invention solves the technical problems of higher test cost, lower accuracy and poorer test efficiency in the existing hardware test, realizes the automatic hardware test of hardware equipment conveniently, reduces the test cost, improves the test accuracy and improves the hardware test efficiency.

Example two

Fig. 2 is a schematic structural diagram of a device testing apparatus according to a second embodiment of the present invention. As shown in fig. 2, the apparatus includes: a control script generation module 210, a control script execution module 220, a control result reception module 230, and a test report generation module 240.

The control script generation module 210 is configured to obtain test requirement information of a device to be tested, and generate an automatic control script based on the test requirement information; a control script execution module 220 configured to generate a device control instruction by executing the automation control script, where the device control instruction includes a device control parameter; a control result receiving module 230, configured to send the device control instruction to the device to be tested, and obtain a control response result of the device to be tested; and the test report generating module 240 is configured to generate a device test report for the device under test based on the device control parameter and the control response result.

According to the technical scheme, the test requirement information of the equipment to be tested is obtained through the control script generation module, and an automatic control script is generated based on the test requirement information; generating equipment control instructions by executing the automatic control script through a control script execution module, wherein the equipment control instructions comprise equipment control parameters; the device control instruction is sent to the device to be tested through a control result receiving module, and a control response result of the device to be tested is obtained; and generating a device test report for the device to be tested based on the device control parameters and the control response result through a test report generation module. The technical scheme of the embodiment of the invention solves the technical problems of higher test cost, lower accuracy and poorer test efficiency in the existing hardware test, realizes the automatic hardware test of hardware equipment conveniently, reduces the test cost, improves the test accuracy and improves the hardware test efficiency.

Optionally, a control script generating module 210 is configured to establish an HTTP communication connection with a device requirement management system of the device under test; and based on the HTTP communication connection, acquiring the test requirement information of the device to be tested from the device requirement management system.

Optionally, the control script generating module 210 is configured to obtain the test requirement information of the device under test from the device requirement management system by calling a custom requirement information obtaining script.

The control script generating module 210 is configured to match a target test interface corresponding to the test requirement information from a plurality of preset test interfaces, where the preset test interfaces are interfaces generated after a test method is packaged; and generating an automation control script based on the test requirement information and the target test interface, wherein the automation control script comprises a script generated based on LabVIEW and/or a script generated based on Python.

Optionally, a control result receiving module 230, configured to determine, for each hardware control instruction, a target hardware corresponding to the hardware control instruction in a plurality of to-be-tested hardware, send the hardware control instruction to the target hardware, and receive a control feedback result sent by the target hardware, where the hardware control instruction includes a hardware control parameter;

Correspondingly, a test report generating module 240, configured to determine, for each piece of hardware to be tested, a hardware control instruction corresponding to the piece of hardware to be tested, and generate a hardware test result for the piece of hardware to be tested based on a hardware control parameter in the hardware control instruction and a control feedback result corresponding to the hardware control parameter; and summarizing the hardware test results to obtain a device test report aiming at the device to be tested.

The device testing device provided by the embodiment of the invention can execute the device testing method provided by any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the execution method.

It should be noted that, each unit and module included in the device testing apparatus are only divided according to the functional logic, but not limited to the above division, so long as the corresponding functions can be implemented; in addition, the specific names of the functional units are also only for distinguishing from each other, and are not used to limit the protection scope of the embodiments of the present invention.

Example III

Fig. 3 shows a schematic diagram of the structure of an electronic device 10 that may be used to implement an embodiment of the invention. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. Electronic equipment may also represent various forms of mobile devices, such as personal digital processing, cellular telephones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.

As shown in fig. 3, the electronic device 10 includes at least one processor 11, and a memory, such as a Read Only Memory (ROM) 12, a Random Access Memory (RAM) 13, etc., communicatively connected to the at least one processor 11, in which the memory stores a computer program executable by the at least one processor, and the processor 11 may perform various appropriate actions and processes according to the computer program stored in the Read Only Memory (ROM) 12 or the computer program loaded from the storage unit 18 into the Random Access Memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 may also be stored. The processor 11, the ROM 12 and the RAM 13 are connected to each other via a bus 14. An input/output (I/O) interface 15 is also connected to bus 14.

Various components in the electronic device 10 are connected to the I/O interface 15, including: an input unit 16 such as a keyboard, a mouse, etc.; an output unit 17 such as various types of displays, speakers, and the like; a storage unit 18 such as a magnetic disk, an optical disk, or the like; and a communication unit 19 such as a network card, modem, wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information/data with other devices via a computer network, such as the internet, and/or various telecommunication networks.

The processor 11 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various processors running machine learning model algorithms, digital Signal Processors (DSPs), and any suitable processor, controller, microcontroller, etc. The processor 11 performs the various methods and processes described above, such as the device testing method.

In some embodiments, the device testing method may be implemented as a computer program tangibly embodied on a computer-readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program may be loaded and/or installed onto the electronic device 10 via the ROM 12 and/or the communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the device testing method described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the device testing method in any other suitable way (e.g., by means of firmware).

Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuit systems, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application specific standard devices (ASSPs), systems On Chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs, the one or more computer programs may be executed and/or interpreted on a programmable system including at least one programmable processor, which may be a special purpose or general-purpose programmable processor, that may receive data and instructions from, and transmit data and instructions to, a storage system, at least one input device, and at least one output device.

A computer program for carrying out methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions/acts specified in the flowchart and/or block diagram block or blocks to be implemented. The computer program may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.

In the context of the present invention, a computer-readable storage medium may be a tangible medium that can contain, or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer readable storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, the computer readable storage medium may be a machine readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) through which a user can provide input to the electronic device. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic input, speech input, or tactile input.

The systems and techniques described here can be implemented in a computing system that includes a background component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such background, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), blockchain networks, and the internet.

The computing system may include clients and servers. The client and server are typically remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also called a cloud computing server or a cloud host, and is a host device in a cloud computing service system, so that the defects of high management difficulty and weak service expansibility in the traditional physical hosts and VPS service are overcome.

It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps described in the present invention may be performed in parallel, sequentially, or in a different order, so long as the desired results of the technical solution of the present invention are achieved, and the present invention is not limited herein.

The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.

Claims

1. A method of device testing, comprising:

2. The method of claim 1, wherein the obtaining test requirement information of the device under test comprises:

Establishing HTTP communication connection with a device demand management system of the device to be tested;

And based on the HTTP communication connection, acquiring the test requirement information of the device to be tested from the device requirement management system.

3. The method of claim 2, wherein the obtaining, from the device requirement management system, the test requirement information for the device under test comprises:

And acquiring the test requirement information of the device to be tested from the device requirement management system by calling a custom requirement information acquisition script.

4. The method of claim 1, wherein the generating an automation control script based on the test requirement information comprises:

Matching a target test interface corresponding to the test requirement information from a plurality of preset test interfaces, wherein the preset test interfaces are interfaces generated after a test method is packaged;

And generating an automation control script based on the test requirement information and the target test interface, wherein the automation control script comprises a script generated based on LabVIEW and/or a script generated based on Python.

5. The method of claim 1 or 2, wherein the device under test comprises a plurality of hardware under test, and the device control instructions comprise at least one hardware control instruction corresponding to the hardware under test.

6. The method of claim 5, wherein the sending the device control command to the device under test and obtaining the control response result of the device under test comprises:

determining target hardware corresponding to the hardware control instruction in a plurality of hardware to be tested aiming at each hardware control instruction, sending the hardware control instruction to the target hardware, and acquiring a control feedback result of the target hardware, wherein the hardware control instruction comprises hardware control parameters;

The generating a device test report for the device under test based on the device control parameters and the control response result includes:

Determining a hardware control instruction corresponding to the hardware to be tested according to each hardware to be tested, and generating a hardware test result aiming at the hardware to be tested based on a hardware control parameter in the hardware control instruction and a control feedback result corresponding to the hardware control parameter;

And summarizing the hardware test results to obtain a device test report aiming at the device to be tested.

7. The method of claim 6, wherein the automation control script comprises a hardware control script corresponding to each of the hardware under test.

8. A device testing apparatus, comprising:

9. An electronic device, the electronic device comprising:

At least one processor; and

A memory communicatively coupled to the at least one processor; wherein,

The memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the device testing method of any one of claims 1-7.

10. A computer readable storage medium storing computer instructions for causing a processor to perform the device testing method of any one of claims 1-7.