CN117909150A - Equipment testing method and device, terminal equipment and storage medium - Google Patents
Equipment testing method and device, terminal equipment and storage medium Download PDFInfo
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Abstract
The application is applicable to the technical field of computers, and provides a device testing method, a device, terminal equipment and a storage medium, wherein the method comprises the following steps: acquiring test requirement information of equipment to be tested; according to the test requirement information, determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested; generating test configuration data of the device to be tested according to the configuration information and the protocol format; and testing the equipment to be tested according to the test configuration data. Compared with the prior art, the method can flexibly generate the test configuration data matched with the equipment to be tested according to the test requirement information of the different equipment to be tested, so that the test of the different equipment to be tested is realized, the application range is enlarged, and the test success rate of the equipment to be tested is improved.
Description
Technical Field
The present application belongs to the field of computer technology, and in particular, relates to a device testing method, a device, a terminal device, and a storage medium.
Background
Along with the intelligent transformation of traditional household appliances manufacturers, the traditional household appliances can have networking functions, voice control functions and the like. At present, an intelligent module with an intelligent function is externally connected to the traditional household electrical appliance, and the intelligent module is a scheme for realizing the intelligent function for the traditional household electrical appliance. When providing intelligent function for traditional tame electric installation, intelligent module needs to carry out serial communication with tame electric installation. Therefore, it is necessary to test each function of each home appliance.
However, in the prior art, because different home appliance manufacturers are usually different serial port communication protocols, the existing equipment testing method is difficult to meet actual requirements, the application range is small, and the success rate of testing equipment is reduced.
Disclosure of Invention
The embodiment of the application provides a device testing method, a device, terminal equipment and a storage medium, which not only expand the application range, but also improve the success rate of testing the device to be tested.
In a first aspect, an embodiment of the present application provides a device testing method, including:
Acquiring test requirement information of equipment to be tested;
Determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested according to the test requirement information;
generating test configuration data of the equipment to be tested according to the configuration information and the protocol format;
And testing the equipment to be tested according to the test configuration data.
Optionally, the test requirement information includes attribute information of the device to be tested and protocol information set by the device to be tested; the determining, according to the test requirement information, configuration information of an object model corresponding to the device to be tested and a protocol format matched with the device to be tested includes:
determining the configuration information according to the attribute information;
And determining the protocol format according to the protocol information.
Optionally, the attribute information includes a name and a function of the device to be tested, and the configuration information includes an identifier, an attribute name, a data type and a value range; the determining the configuration information according to the attribute information includes:
determining the identification and the attribute name according to the name;
and determining the data type and the value range according to the function.
Optionally, the generating test configuration data of the device under test according to the configuration information and the protocol format includes:
And generating the test configuration data conforming to the protocol format according to the attribute name and the value range.
Optionally, the testing the device under test according to the test configuration data includes:
determining a first function to be tested of the device to be tested according to a first test instruction aiming at the device to be tested;
selecting first data information corresponding to the first function to be tested from the test configuration data, and sending the first data information to a user terminal;
Receiving a detection result sent by the user terminal;
and if the detection result is that the first data information is correctly displayed, determining that the first function to be detected passes the test.
Optionally, the testing the device under test according to the test configuration data includes:
receiving a second test instruction sent by a user terminal; the second test instruction carries a second function to be tested of the device to be tested;
analyzing the second test instruction according to the test configuration data to obtain an analysis result;
And if the analysis result is matched with the second function to be tested, determining that the second function to be tested passes the test.
Optionally, after the analyzing the second test instruction according to the test configuration data to obtain an analysis result, the method further includes:
generating second data information corresponding to the analysis result;
And sending the second data information to the user terminal.
In a second aspect, an embodiment of the present application provides an apparatus testing device, including:
The acquisition unit is used for acquiring the test requirement information of the equipment to be tested;
the first determining unit is used for determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested according to the test requirement information;
The first generation unit is used for generating test configuration data of the equipment to be tested according to the configuration information and the protocol format;
And the first test unit is used for testing the equipment to be tested according to the test configuration data.
In a third aspect, an embodiment of the present application provides a terminal device, including: a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the device testing method according to any one of the first aspects when executing the computer program.
In a fourth aspect, embodiments of the present application provide a computer readable storage medium storing a computer program which, when executed by a processor, implements a device testing method as in any one of the first aspects above.
In a fifth aspect, an embodiment of the present application provides a computer program product, which, when run on a terminal device, enables the terminal device to perform the device testing method according to any one of the first aspects above.
Compared with the prior art, the embodiment of the application has the beneficial effects that:
According to the equipment testing method provided by the embodiment of the application, the testing requirement information of the equipment to be tested is obtained; according to the test requirement information, determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested; generating test configuration data of the device to be tested according to the configuration information and the protocol format; and testing the equipment to be tested according to the test configuration data. Compared with the prior art, the method can flexibly generate the test configuration data matched with the equipment to be tested according to the test requirement information of the different equipment to be tested, so that the test of the different equipment to be tested is realized, the application range is enlarged, and the test success rate of the equipment to be tested is improved.
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In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of an implementation of a device testing method according to an embodiment of the present application;
FIG. 2 is a flow chart of an implementation of a device testing method according to another embodiment of the present application;
FIG. 3 is a flow chart of an implementation of a device testing method according to a further embodiment of the present application;
FIG. 4 is a flow chart of an implementation of a device testing method provided by a further embodiment of the present application;
FIG. 5 is a schematic diagram of a device testing apparatus according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of a terminal device according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
As used in the present description and the appended claims, the term "if" may be interpreted as "when..once" or "in response to a determination" or "in response to detection" depending on the context. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".
Furthermore, the terms "first," "second," "third," and the like in the description of the present specification and in the appended claims, are used for distinguishing between descriptions and not necessarily for indicating or implying a relative importance.
Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.
Referring to fig. 1, fig. 1 is a flowchart illustrating an implementation of a device testing method according to an embodiment of the application. In the embodiment of the application, the execution main body of the equipment testing method is terminal equipment. Wherein the terminal device includes, but is not limited to: notebook, desktop, computer, and other electronic devices.
As shown in fig. 1, the device testing method provided in an embodiment of the present application may include S101 to S104, which are described in detail below:
In S101, test requirement information of a device under test is acquired.
In practical application, when a related person needs to test a certain device, a device test request can be sent to a terminal device.
In the embodiment of the present application, the terminal device may detect that the device test request is: a preset operation for the terminal device is detected. The preset operation may be set according to actual needs, and is not limited herein. The preset operation may be, for example, clicking on a preset control on the terminal device. Based on the above, when the terminal equipment detects that the preset control of the terminal equipment is clicked, the detection of the preset operation for the terminal equipment, namely the detection of the equipment test request, is described.
After detecting the equipment test request, the terminal equipment can acquire the test requirement information of the equipment to be tested.
In one implementation manner of the embodiment of the application, the terminal device can acquire the test requirement information of the device to be tested in real time through a server connected with the terminal device in a wireless communication manner. The server may be a desktop circuit or a computer, or may be a cloud server.
In another implementation manner of the embodiment of the present application, the terminal device may obtain, in advance, the test requirement information of each device and store the test requirement information in its own memory. When the equipment test request is detected, the terminal equipment can acquire the test requirement information corresponding to the equipment to be tested from the memory according to the equipment to be tested carried by the equipment test request.
It should be noted that the test requirement information includes, but is not limited to, attribute information of the device under test and protocol information set by the device under test.
Wherein the attribute information of the device under test includes, but is not limited to, the name and function of the device under test.
The protocol information set by the device under test refers to a communication protocol format suitable for the device under test.
In S102, according to the test requirement information, configuration information of an object model corresponding to the device to be tested and a protocol format matched with the device to be tested are determined.
In practical application, the object model refers to a digital representation of an entity (such as a sensor, a home appliance, a building, a factory, etc.) in a physical space at the cloud, and three dimensions of attribute, service and event describe what the entity can do and what information can be provided to the outside respectively.
In the embodiment of the application, the terminal equipment can firstly determine the configurable attribute point of the object model corresponding to the equipment to be tested and the configurable attribute point (namely the protocol format) of the protocol data frame matched with the equipment to be tested according to the acquired protocol information in the test requirement information of the equipment to be tested.
And then, the terminal equipment can continue to configure the configurable attribute points of the object model and the configurable attribute points of the protocol data frame according to the test requirement information, so that the configuration information of the object model and the protocol format matched with the equipment to be tested are obtained.
Specifically, in one embodiment of the present application, the terminal device may execute step S102 through steps S201 to S202 as shown in fig. 2, as follows:
in S201, the configuration information is determined according to the attribute information.
In this embodiment, the terminal device may configure the configurable attribute points of the object model according to the attribute information in the test requirement information, so as to obtain configuration information of the object model.
In one embodiment of the present application, the attribute information of the device under test includes, but is not limited to, the name and the function of the device under test, and the configuration information of the object model includes, but is not limited to, the identifier, the attribute name, the data type and the value range, so that the terminal device can obtain the configuration information of the object model according to the following steps, which are described in detail as follows:
determining the identification and the attribute name according to the name;
and determining the data type and the value range according to the function.
In this embodiment, the terminal device may determine the identifier and the attribute name in the configuration information according to the name in the attribute information.
For example, assuming that the name of the device to be tested is a power switch, the identifier in the configuration information of the object model corresponding to the power switch is: power, attribute name: and a power switch.
In this embodiment, the terminal device may determine the data type and the value range in the configuration information of the object model according to the function in the attribute information of the device to be tested.
It should be noted that the data types include, but are not limited to: integer type, single precision floating point type, double precision floating point type, boolean type, and enumeration type.
The value range is used for representing the adjusting range corresponding to the function of the device to be tested. For example, assuming that the device to be tested is a power switch, its function is to control on and off of the power, the adjustment range of the function is "on" and "off", and therefore, the value range is: the value "1" for "on" and the value "0" for "off".
In this embodiment, integer type is generally used for functions such as a timing switch; floating point is commonly used for functions such as temperature acquisition; boolean types are commonly used for functions such as power switches; enumeration: typically for functions such as mode adjustment.
For example, assuming that the name of the device to be tested is a power switch and the function of the device to be tested is to control the on and off of a power supply, the data types in the configuration information of the object model corresponding to the power switch are as follows: boolean (Boolean) ranges from "1-on" to "0-off".
In S202, the protocol format is determined according to the protocol information.
It should be noted that, the protocol formats include a reporting protocol format and a transmitting protocol format. The reporting protocol format is used for sending a reporting configuration file to a user terminal in communication connection with the terminal equipment, and the issuing protocol format is used for generating a corresponding issuing analysis file according to a test instruction sent by the user terminal so that the terminal equipment can execute related operations according to the issuing analysis file. The user terminal includes, but is not limited to, mobile terminals, notebooks, desktop computers and other devices.
Both the reporting protocol format and the issuing protocol format include, but are not limited to: the frame head, version number, command word, data bit length, data, check bit and frame end are each composed of one field.
It should be noted that each field includes, but is not limited to: field ID, data type, length, and value.
Wherein the data types in each field include, but are not limited to: hex, hash, object, dpObject, bit and a complete.
In this embodiment, hex is 16-system data, which is generally used for example, a frame header, a frame tail, a command word, etc., and is fixed after value configuration.
Hash is key value pair data, which is only used for data bit, and key name, key name length and key value (associated mapping with object model) can be configured, and the key value length can meet the requirement of the protocol format.
Object is Object data, which is only used for data bits, and Object attributes (mapped in association with Object model) can be configured to meet the requirements of such protocol formats.
DpObject is data point Object data, which is only used for data bits, and contains 4 configurable parameters, namely data point, data point length, function point length, object data (i.e. Object, and Object model are associated and mapped). Each parameter can be configured with the length and the value of the current parameter to meet the requirements of the protocol format.
Bit is Bit data, only used for data bits, and can be used for respectively carrying out Bit 0-Bit 7 value (carrying out association mapping with object model) so as to meet the requirements of the protocol format.
The Tuple is Tuple data, is used only for check bits, and can configure a check algorithm and a check field range.
In this embodiment, the terminal device may set the field ID, the data type, the length, and the value in the fields according to the protocol information set by the device to be tested, so as to obtain a protocol format matched with the device to be tested.
In some possible embodiments, the terminal device may determine the value in the field corresponding to the data in the protocol format according to the configuration information of the object model.
In S103, test configuration data of the device under test is generated according to the configuration information and the protocol format.
It should be noted that the test configuration data includes, but is not limited to: reporting the configuration file and issuing the analysis file. The reporting configuration file is used for being sent to the user terminal, and the issuing analysis file is used for analyzing the test instruction sent by the user terminal by the terminal equipment.
In the embodiment of the application, the protocol format includes but is not limited to: the terminal equipment can generate a reporting configuration file according to the configuration information of the object model and the reporting protocol format, and the terminal equipment can generate a issuing analysis file according to the configuration information of the object model and the issuing protocol format.
In one embodiment of the present application, in conjunction with S201, the terminal device may generate test configuration data conforming to the protocol format according to the attribute name and the value range in the configuration information of the object model.
It should be noted that, in this embodiment, the test configuration data includes test data corresponding to each value in the above-mentioned value range.
Exemplary, assume that a range of values includes, but is not limited to: 0 (corresponding to wind speed 1), 1 (corresponding to wind speed 2), 2 (corresponding to wind speed 3), 3 (corresponding to wind speed 4), the test configuration data includes, but is not limited to, test data of each of wind speed 1, wind speed 2, wind speed 3, and wind speed 4.
In S104, according to the test configuration data, the device under test is tested.
In the embodiment of the application, after the terminal equipment obtains the test configuration data, the test configuration data can be imported into a serial port tool arranged on the terminal equipment and connected with a serial port matched with the equipment to be tested, so that the equipment to be tested can be tested.
In one embodiment of the present application, the terminal device may specifically execute step S104 through steps S301 to S304 shown in fig. 3, which is described in detail as follows:
In S301, a first function to be tested of the device to be tested is determined according to a first test instruction for the device to be tested.
In S302, first data information corresponding to the first function to be tested is selected from the test configuration data, and the first data information is sent to a user terminal.
In S303, a detection result sent by the user terminal is received.
In S304, if the detection result is that the first data information is correctly displayed, it is determined that the first to-be-detected functional test passes.
In this embodiment, after obtaining the test configuration data, the terminal device may output and display the test configuration data.
It should be noted that, each piece of test data in the test configuration data is a value corresponding to a certain function in the device to be tested.
Based on this, in this embodiment, the user may click on any piece of the test data, that is, send the first test instruction to the terminal device.
After detecting the first test instruction, the terminal device can determine a first function to be tested for the device to be tested according to the first test instruction. And then, the terminal equipment can select first data information corresponding to the first function to be tested from the report configuration file in the test configuration data, and send the first data information to the user terminal.
It should be noted that, the user terminal is in wireless communication connection with the device to be tested, that is, the user can monitor the working state of the device to be tested and control the device to be tested in real time through the user terminal.
After receiving the first data information, the user terminal can detect whether the first data information is correctly displayed.
In one embodiment of the present application, when the user terminal detects that the first data information is displayed correctly, it may determine that the detection result is that the first data is displayed correctly.
In another embodiment of the present application, when the user terminal detects that the first data information is not displayed correctly, it may determine that the detection result is that the first data is displayed incorrectly.
After that, the user terminal may transmit the detection result to the terminal device.
The terminal device may receive the detection result sent by the user terminal.
In this embodiment, when the terminal device detects that the detection result is not displayed correctly, it indicates that the user terminal has displayed the first data information correctly, so that the terminal device may determine that the first function to be detected passes the test.
When the terminal equipment detects that the detection result is not displayed correctly, the user terminal is indicated that the first data information is not displayed correctly, so that the terminal equipment can determine that the first function to be detected is not passed.
In another embodiment of the present application, the terminal device may specifically further execute step S104 through steps S401 to S403 as shown in fig. 4, which is described in detail below:
In S401, receiving a second test instruction sent by the user terminal; the second test instruction carries a second function to be tested of the device to be tested.
In S402, the second test instruction is parsed according to the test configuration data, to obtain a parsing result.
In S403, if the analysis result is matched with the second function to be tested, it is determined that the second function to be tested passes the test.
In this embodiment, the terminal device may receive a second test instruction sent by the user terminal, analyze the second test instruction according to the issued analysis file in the test configuration data, so as to obtain an analysis result, and display the analysis result. The analysis result is used for describing functions to be executed by the device to be tested.
And then, the terminal equipment can compare the analysis result with a second function to be tested carried by a second test instruction.
In this embodiment, when the terminal device detects that the analysis result is matched with the second function to be tested carried by the second test instruction, it is indicated that the terminal device successfully analyzes the second test instruction, so that the terminal device can determine that the second function to be tested passes the test.
When the terminal equipment detects that the analysis result is not matched with the second function to be tested carried by the second test instruction, the terminal equipment indicates that the analysis of the second test instruction by the terminal equipment fails, so that the terminal equipment can determine that the second function to be tested is not passed.
The above can be seen that, according to the device testing method provided by the embodiment of the application, the testing requirement information of the device to be tested is obtained; according to the test requirement information, determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested; generating test configuration data of the device to be tested according to the configuration information and the protocol format; and testing the equipment to be tested according to the test configuration data. Compared with the prior art, the method can flexibly generate the test configuration data matched with the equipment to be tested according to the test requirement information of the different equipment to be tested, so that the test of the different equipment to be tested is realized, the application range is enlarged, and the test success rate of the equipment to be tested is improved.
In one embodiment of the present application, after S402, the terminal device may further perform the following steps, which are described in detail below:
generating second data information corresponding to the analysis result;
And sending the second data information to the user terminal.
In this embodiment, the terminal device may select second data information corresponding to the analysis result from the report configuration file in the test configuration data, and send the second data information to the user terminal, so as to implement an automatic reply function for the user terminal.
It should be understood that the sequence number of each step in the foregoing embodiment does not mean that the execution sequence of each process should be determined by the function and the internal logic, and should not limit the implementation process of the embodiment of the present application.
Corresponding to a device testing method described in the foregoing embodiments, fig. 5 shows a schematic structural diagram of a device testing apparatus provided in an embodiment of the present application, and for convenience of explanation, only the portions relevant to the embodiment of the present application are shown. Referring to fig. 5, the device testing apparatus 500 includes: an acquisition unit 51, a first determination unit 52, a first generation unit 53, and a first test unit 54. Wherein:
The acquiring unit 51 is configured to acquire test requirement information of a device under test.
The first determining unit 52 is configured to determine, according to the test requirement information, configuration information of an object model corresponding to the device under test and a protocol format matched with the device under test.
The first generating unit 53 is configured to generate test configuration data of the device under test according to the configuration information and the protocol format.
The first test unit 54 is configured to test the device under test according to the test configuration data.
In one embodiment of the present application, the test requirement information includes attribute information of the device under test and protocol information set by the device under test; the first determination unit 52 specifically includes: a second determination unit and a third determination unit. Wherein:
the second determining unit is used for determining the configuration information according to the attribute information.
And the third determining unit is used for determining the protocol format according to the protocol information.
In one embodiment of the present application, the attribute information includes a name and a function of the device to be tested, and the configuration information includes an identifier, an attribute name, a data type and a value range; the second determining unit specifically includes: a fourth determination unit and a fifth determination unit. Wherein:
And the fourth determining unit is used for determining the identification and the attribute name according to the name.
And the fifth determining unit is used for determining the data type and the value range according to the function.
In one embodiment of the present application, the first generating unit 53 specifically includes: and a second generation unit.
And the second generating unit is used for generating the test configuration data conforming to the protocol format according to the attribute name and the value range.
In one embodiment of the present application, the first test unit 54 specifically includes: the device comprises a sixth determining unit, a selecting unit, a first receiving unit and a seventh determining unit. Wherein:
The sixth determining unit is configured to determine a first function to be tested of the device to be tested according to a first test instruction for the device to be tested.
The selecting unit is used for selecting first data information corresponding to the first function to be tested from the test configuration data and sending the first data information to the user terminal.
The first receiving unit is used for receiving the detection result sent by the user terminal.
And the seventh determining unit is used for determining that the first to-be-tested functional test passes if the detection result is that the first data information is correctly displayed.
In one embodiment of the present application, the first test unit 54 specifically includes: the device comprises a second receiving unit, an analyzing unit and an eighth determining unit. Wherein:
the second receiving unit is used for receiving a second test instruction sent by the user terminal; the second test instruction carries a second function to be tested of the device to be tested.
And the analysis unit is used for analyzing the second test instruction according to the test configuration data to obtain an analysis result.
And the eighth determining unit is used for determining that the second function to be tested passes the test if the analysis result is matched with the second function to be tested.
In one embodiment of the present application, the device testing apparatus 500 further comprises: and a third generation unit and a transmission unit. Wherein:
The third generation unit is used for generating second data information corresponding to the analysis result.
And the sending unit is used for sending the second data information to the user terminal.
It should be noted that, because the content of information interaction and execution process between the above devices/units is based on the same concept as the method embodiment of the present application, specific functions and technical effects thereof may be referred to in the method embodiment section, and will not be described herein.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
Fig. 6 is a schematic structural diagram of a terminal device according to an embodiment of the present application. As shown in fig. 6, the terminal device 6 of this embodiment includes: at least one processor 60 (only one shown in fig. 6), a memory 61, and a computer program 62 stored in the memory 61 and executable on the at least one processor 60, the processor 60 implementing the steps in any of the various device testing method embodiments described above when executing the computer program 62.
The terminal device may include, but is not limited to, a processor 60, a memory 61. It will be appreciated by those skilled in the art that fig. 6 is merely an example of the terminal device 6 and is not meant to be limiting as to the terminal device 6, and may include more or fewer components than shown, or may combine certain components, or different components, such as may also include input-output devices, network access devices, etc.
The processor 60 may be a central processing unit (Central Processing Unit, CPU), the processor 60 may also be other general purpose processors, digital signal processors (DIGITAL SIGNAL processors, DSP), application SPECIFIC INTEGRATED Circuit (ASIC), off-the-shelf programmable gate array (field-programmable GATE ARRAY, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 61 may in some embodiments be an internal storage unit of the terminal device 6, such as a memory of the terminal device 6. The memory 61 may in other embodiments also be an external storage device of the terminal device 6, such as a plug-in hard disk provided on the terminal device 6, a smart memory card (SMART MEDIA CARD, SMC), a Secure Digital (SD) card, a flash memory card (FLASH CARD) or the like. Further, the memory 61 may also include both an internal storage unit and an external storage device of the terminal device 6. The memory 61 is used for storing an operating system, application programs, boot loader (BootLoader), data, other programs, etc., such as program codes of the computer program. The memory 61 may also be used for temporarily storing data that has been output or is to be output.
Embodiments of the present application also provide a computer readable storage medium storing a computer program which, when executed by a processor, implements steps for implementing the various method embodiments described above.
Embodiments of the present application provide a computer program product enabling a terminal device to carry out the steps of the method embodiments described above when the computer program product is run on the terminal device.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above-described embodiments, and may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and the computer program may implement the steps of the method embodiments described above when executed by a processor. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a terminal device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM, random Access Memory), an electrical carrier signal, a telecommunications signal, and a software distribution medium. Such as a U-disk, removable hard disk, magnetic or optical disk, etc. In some jurisdictions, computer readable media may not be electrical carrier signals and telecommunications signals in accordance with legislation and patent practice.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
The above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (10)
1. A method of device testing, comprising:
Acquiring test requirement information of equipment to be tested;
Determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested according to the test requirement information;
generating test configuration data of the equipment to be tested according to the configuration information and the protocol format;
And testing the equipment to be tested according to the test configuration data.
2. The apparatus test method according to claim 1, wherein the test requirement information includes attribute information of the apparatus under test and protocol information set by the apparatus under test; the determining, according to the test requirement information, configuration information of an object model corresponding to the device to be tested and a protocol format matched with the device to be tested includes:
determining the configuration information according to the attribute information;
And determining the protocol format according to the protocol information.
3. The device testing method of claim 2, wherein the attribute information includes names and functions of the devices under test, and the configuration information includes identifications, attribute names, data types, and value ranges; the determining the configuration information according to the attribute information includes:
determining the identification and the attribute name according to the name;
and determining the data type and the value range according to the function.
4. The device testing method of claim 3, wherein generating test configuration data of the device under test according to the configuration information and the protocol format comprises:
And generating the test configuration data conforming to the protocol format according to the attribute name and the value range.
5. The device testing method of claim 4, wherein the testing the device under test according to the test configuration data comprises:
determining a first function to be tested of the device to be tested according to a first test instruction aiming at the device to be tested;
selecting first data information corresponding to the first function to be tested from the test configuration data, and sending the first data information to a user terminal;
Receiving a detection result sent by the user terminal;
and if the detection result is that the first data information is correctly displayed, determining that the first function to be detected passes the test.
6. The device testing method of claim 4, wherein the testing the device under test according to the test configuration data comprises:
receiving a second test instruction sent by a user terminal; the second test instruction carries a second function to be tested of the device to be tested;
analyzing the second test instruction according to the test configuration data to obtain an analysis result;
And if the analysis result is matched with the second function to be tested, determining that the second function to be tested passes the test.
7. The device testing method of claim 6, further comprising, after said parsing said second test instruction according to said test configuration data to obtain a parsing result:
generating second data information corresponding to the analysis result;
And sending the second data information to the user terminal.
8. A device testing apparatus, comprising:
The acquisition unit is used for acquiring the test requirement information of the equipment to be tested;
the first determining unit is used for determining configuration information of an object model corresponding to the equipment to be tested and a protocol format matched with the equipment to be tested according to the test requirement information;
The first generation unit is used for generating test configuration data of the equipment to be tested according to the configuration information and the protocol format;
And the first test unit is used for testing the equipment to be tested according to the test configuration data.
9. A terminal device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the device testing method according to any of claims 1 to 7 when executing the computer program.
10. A computer readable storage medium storing a computer program, characterized in that the computer program, when executed by a processor, implements the device testing method according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311821094.4A CN117909150A (en) | 2023-12-27 | 2023-12-27 | Equipment testing method and device, terminal equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311821094.4A CN117909150A (en) | 2023-12-27 | 2023-12-27 | Equipment testing method and device, terminal equipment and storage medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117909150A true CN117909150A (en) | 2024-04-19 |
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|---|---|---|---|
| CN202311821094.4A Pending CN117909150A (en) | 2023-12-27 | 2023-12-27 | Equipment testing method and device, terminal equipment and storage medium |
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| Country | Link |
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| CN (1) | CN117909150A (en) |
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