CN117825933A - Clamp for pin aging test - Google Patents

Clamp for pin aging test Download PDF

Info

Publication number
CN117825933A
CN117825933A CN202410198094.1A CN202410198094A CN117825933A CN 117825933 A CN117825933 A CN 117825933A CN 202410198094 A CN202410198094 A CN 202410198094A CN 117825933 A CN117825933 A CN 117825933A
Authority
CN
China
Prior art keywords
clamping mechanism
wiring
pin
limiting
fixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202410198094.1A
Other languages
Chinese (zh)
Inventor
杨剑兵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hangzhou Hongtuo Precision Machinery Manufacturing Co ltd
Original Assignee
Hangzhou Hongtuo Precision Machinery Manufacturing Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hangzhou Hongtuo Precision Machinery Manufacturing Co ltd filed Critical Hangzhou Hongtuo Precision Machinery Manufacturing Co ltd
Priority to CN202410198094.1A priority Critical patent/CN117825933A/en
Publication of CN117825933A publication Critical patent/CN117825933A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses a fixture for pin aging test, which comprises: a bottom plate; the first clamping mechanism is assembled on one side of the bottom plate and is provided with a first wiring part; the second clamping mechanism is assembled on the other side of the bottom plate and is provided with a second wiring part; the tested equipment is clamped between the first clamping mechanism and the second clamping mechanism and is provided with a wiring pin, so that the first wiring part and the second wiring part are communicated with the wiring pin. The invention can realize automatic clamping and wiring without manual work, improves wiring accuracy and safety, simultaneously integrates the wiring device and the clamp, reduces the occupation of equipment space and is beneficial to popularization.

Description

Clamp for pin aging test
Technical Field
The invention relates to the technical field of test fixtures, in particular to a fixture for pin aging test.
Background
Integrated circuit burn-in is an important element in ensuring the quality and reliability of integrated circuits. The traditional integrated circuit aging test method needs to put the test fixture into a closed space (aging furnace) and control the environmental temperature in the closed space so as to achieve the purpose of quickening the service life of the integrated circuit.
However, in the conventional test ageing process, manual wiring is required, and when the number of wires is too large, the manual wiring needs to consume more time, and problems such as poor wiring, short circuit of wiring and the like exist in the exposed guide, so that potential safety hazards can be caused. These problems not only affect the efficiency of the test, but may also lead to inaccurate test results, which present a risk to the production and application of the integrated circuit.
Disclosure of Invention
In order to overcome at least one of the above-mentioned drawbacks of the prior art, the present invention provides a fixture for pin burn-in testing. Can realize going artificial automatic centre gripping and wiring, improve wiring accuracy and security, with termination and anchor clamps integrated design simultaneously, reduce equipment space occupation, be favorable to promoting.
The invention adopts the technical proposal for solving the problems that:
a fixture for pin burn-in testing, comprising: a bottom plate; the first clamping mechanism is assembled on one side of the bottom plate and is provided with a first wiring part; the second clamping mechanism is assembled on the other side of the bottom plate and is provided with a second wiring part; the tested equipment is clamped between the first clamping mechanism and the second clamping mechanism and is provided with a wiring pin, so that the first wiring part and the second wiring part are communicated with the wiring pin.
By adopting the scheme, the problems that the manual wiring time is long, and the guide is exposed and potential safety hazards exist can be solved. The testing efficiency and the testing accuracy can be improved, the potential safety hazard is reduced, and the quality and the reliability of the integrated circuit are ensured.
Further, a driving apparatus is also included, the driving apparatus including: the first pushing motor is fixed on the bottom plate through a first assembly part, and the output end of the first pushing motor is connected with one side, far away from the second clamping mechanism, of the first clamping mechanism; the second pushing motor is fixed on the bottom plate through a second assembly part, and the output end of the second pushing motor is connected with one side, far away from the first clamping mechanism, of the second clamping mechanism.
By adopting the scheme, automatic test can be realized, and the test efficiency and accuracy are improved. The driving equipment can realize automatic clamping and loosening of the first clamping mechanism and the second clamping mechanism by controlling the output ends of the first pushing motor and the second pushing motor, so that manual intervention is reduced, and the testing efficiency and accuracy are improved.
Further, the first clamping mechanism and the second clamping mechanism each include: the clamping piece comprises a pushing groove and a wiring hole, the pushing groove is connected with the output end of the driving equipment, the wiring hole is provided with a plurality of wiring posts, and the wiring posts face to wiring pins of the tested equipment; and the limiting piece is arranged on one side of the wiring hole, which is far away from the tested equipment, and is used for limiting the wiring terminal.
Through adopting above-mentioned scheme, the locating part sets up in the wiring hole one side of keeping away from the equipment of being surveyed, can restrict the range of movement of terminal post to improve the stability and the reliability of wiring.
Further, be provided with spacing hole on the holder, be provided with stop device in the spacing hole, stop device includes: the fixing piece is connected with the bottom plate and is provided with a perforation; the limiting rod penetrates through the perforation and the limiting hole, so that the clamping piece slides along the limiting rod.
By adopting the scheme, the limiting device can limit the sliding range of the clamping piece, so that the accuracy and the reliability of the test are improved. Specifically, the fixing piece is connected with the bottom plate, can be fixed on the bottom plate, and the perforation can be used for the gag lever post to pass through, and wears to locate the gag lever post in perforation and spacing hole, can restrict the sliding range of clamping piece to make the clamping piece can not deviate from predetermined track when sliding, improve the accuracy and the reliability of test.
Further, the limiting rod of the limiting device is parallel to the driving direction of the driving device.
Through adopting above-mentioned scheme, parallel drive direction can also make the centre gripping wiring process more steady.
Further, a pressing device is arranged between the fixing piece of the first clamping mechanism and the fixing piece of the second clamping mechanism and used for pressing the tested equipment.
By adopting the scheme, the tested equipment can be prevented from moving or shaking in the testing process, so that the testing accuracy and reliability are improved.
Further, the compressing device includes: a pressing plate; the first connecting piece is connected between the pressing plate and the fixing piece of the first clamping mechanism; the second connecting piece is connected between the pressing plate and the fixing piece of the second clamping mechanism; the elastic device is arranged between the pressing plate and the tested equipment.
By adopting the scheme, the elastic device can provide a certain buffer effect, and damage to tested equipment in the testing process is avoided.
Further, the elastic device includes: the limit screw penetrates through the pressing plate and extends towards the tested equipment; and the spring is sleeved on the limit screw between the pressing plate and the tested equipment.
By adopting the scheme, certain buffering and damping effects can be provided to compress the tested equipment.
Further, the measured equipment is provided with a thermistor and a temperature measuring device, and the thermistor and the temperature measuring device are used for monitoring the measured equipment.
By adopting the scheme, the temperature change of the tested equipment can be monitored in real time, so that whether the tested equipment has abnormal conditions such as overheat or not can be found in time.
Furthermore, limiting plates are arranged between the tested device and the first clamping mechanism and between the tested device and the second clamping mechanism, and a plurality of pin grooves are formed in the limiting plates corresponding to the wiring pins.
By adopting the scheme, the limit plate has the advantage that the position and the arrangement mode of the wiring pins of the tested equipment can be limited, so that the accuracy and the reliability of the test are improved.
In summary, the fixture for pin burn-in test provided by the invention has the following technical effects:
1. the test efficiency is improved: the clamp can clamp a plurality of wiring pins and finish wiring without manually wiring one by one, so that the testing efficiency of the aging test is greatly improved;
2. the test accuracy is improved: the fixture can accurately control the connection position and the contact strength of each wiring pin, thereby ensuring the accuracy of a test result;
3. the test cost is reduced: the clamp can be reused without manual intervention, so that the test cost is reduced;
4. the test safety is improved: the clamp can effectively prevent the problems of short circuit and poor contact of wiring pins, thereby improving the testing safety.
Drawings
FIG. 1 is a schematic perspective view of an embodiment of the present invention;
FIG. 2 is a partially disassembled schematic illustration of an embodiment of the present invention;
fig. 3 is a schematic diagram of a connection pin structure of a tested device according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a base plate assembly structure according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a limiting device and a compressing device according to an embodiment of the invention.
Wherein the reference numerals have the following meanings: 1. A bottom plate; 11. a limiting plate; 111. a pin slot; 2. a first clamping mechanism; 21. a first wiring portion; 3. a second clamping mechanism; 31. a second wiring section; 32. a clamping member; 321. a pushing groove; 322. a wiring hole; 323. a limiting hole; 33. binding posts; 34. a limiting piece; 4. a device under test; 41. a wiring pin; 5. a driving device; 51. a first push motor; 52. a second push motor; 6. a limiting device; 61. a fixing member; 62. a limit rod; 7. a compacting device; 71. a pressing plate; 72. a first connector; 73. a second connector; 74. an elastic device; 741. a limit screw; 742. a spring; 8. a thermistor; 9. and temperature measuring equipment.
Detailed Description
For a better understanding and implementation, the technical solutions of the embodiments of the present invention will be clearly and completely described and discussed below in conjunction with the accompanying drawings, and it is apparent that what is described herein is only a part, but not all, of the examples of the present invention, and all other embodiments obtained by those skilled in the art without making any inventive effort based on the embodiments of the present invention are within the scope of protection of the present invention.
For the purpose of facilitating an understanding of the embodiments of the present invention, reference will now be made to the drawings, by way of example, of specific embodiments, and the various embodiments should not be construed to limit the embodiments of the invention.
In the description of the present invention, it should be noted that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, only for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the apparatus or elements to be referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
Embodiment 1 of the present invention is shown in fig. 1 to 5, and discloses a fixture for pin burn-in test, which comprises a base plate 1, a first clamping mechanism 2, a second clamping mechanism 3 and a tested device 4, wherein the first clamping mechanism 2 is assembled on one side of the base plate 1, the second clamping mechanism 3 is assembled on the other side of the base plate 1, the tested device 4 is clamped between the first clamping mechanism 2 and the second clamping mechanism 3, the first clamping mechanism 2 and the second clamping mechanism 3 each comprise a clamping piece 32, the side, facing the clamping piece 32 of the second clamping mechanism 3, of the clamping piece 32 of the first clamping mechanism 2 is a first wiring part 21, the side, facing the clamping piece 32 of the first clamping mechanism 2, of the clamping piece 32 of the second clamping mechanism 3 is a second wiring part 31, and the tested device 4 is provided with a wiring pin 41, so that the first wiring part 21 and the second wiring part 31 are communicated with the wiring pin 41. The problem that the manual wiring time is long one by one and the guiding is exposed to the outside and has potential safety hazard can be solved. The testing efficiency and the testing accuracy can be improved, the potential safety hazard is reduced, and the quality and the reliability of the integrated circuit are ensured. The clamping effect and wiring of the tested equipment 4 can be finished by manually controlling the first clamping mechanism 2 and the second clamping mechanism 3 to clamp, and the wiring flow is simplified.
In order to be more beneficial to automation, in some embodiments, a driving device 5 is additionally arranged, the driving device 5 comprises a first pushing motor 51 and a second pushing motor 52, the first pushing motor 51 is fixed on the bottom plate 1 through a first assembly part, an output end of the first pushing motor 51 is connected with one side, far away from the second clamping mechanism 3, of the first clamping mechanism 2, the second pushing motor 52 is fixed on the bottom plate 1 through a second assembly part, and an output end of the second pushing motor 52 is connected with one side, far away from the first clamping mechanism 2, of the second clamping mechanism 3, so that automatic testing can be realized, and testing efficiency and accuracy are improved. The driving device 5 can realize automatic clamping and loosening of the first clamping mechanism 2 and the second clamping mechanism 3 by controlling the output ends of the first pushing motor 51 and the second pushing motor 52, so that manual intervention is reduced, and the testing efficiency and accuracy are improved. In some embodiments, the first pushing motor 51 and the second pushing motor 52 may be replaced by pushing pins capable of automatically rebounding, and may also be replaced by telescopic motors, and in other embodiments, the driving device 5 is not specifically limited, and can complete the pushing effect.
In this embodiment 1, the clamping members 32 of the first clamping mechanism 2 and the second clamping mechanism 3 each include a pushing slot 321 located in the center and a wire connecting hole 322 located at two sides of the pushing slot 321, the pushing slot 321 is connected with the output end of the driving device 5, the wire connecting hole 322 is provided with a plurality of binding posts 33, the binding posts 33 face the wire connecting pins 41 of the tested device 4, so that two tested devices can be clamped between the first clamping mechanism 2 and the second clamping mechanism 3, the clamp cost is reduced, the first clamping mechanism 2 and the second clamping mechanism 3 are both provided with limiting members 34, the limiting members 34 are arranged at one side, away from the tested device 4, of the wire connecting hole 322 and are used for limiting the binding posts 33, when the first clamping mechanism 2 and the second clamping mechanism 3 are clamped, the binding posts 33 are prevented from being displaced, the limiting members 34 are arranged at one side, away from the tested device 4, of the wire connecting holes 33 can be limited, and the moving range of the binding posts 33 can be limited, so that the stability and the reliability of the wire connecting are improved.
In other embodiments, the device under test clamped by the first clamping mechanism 2 and the second clamping mechanism 3 may be one or more than two devices, which is not specifically limited in this embodiment.
In order to improve the stability of the clamping of the first clamping mechanism 2 and the second clamping mechanism 3, a limiting hole 323 is formed in the clamping piece 32, a limiting device 6 is arranged in the limiting hole 323, the limiting device 6 comprises a fixing piece 61 and a limiting rod 62, the fixing piece 61 is connected with the bottom plate 1, a through hole is formed in the fixing piece 61, the limiting rod 62 penetrates through the through hole and the limiting hole 323, so that the clamping piece 32 slides along the limiting rod 62, the limiting rod 62 of the limiting device 6 is parallel to the driving direction of the driving device 5, the parallel driving direction can enable the clamping wiring process to be stable, and the limiting device 6 can limit the sliding range of the clamping piece 32, so that the accuracy and the reliability of testing are improved. Specifically, the fixing member 61 is connected to the base plate 1, and can be fixed to the base plate 1, and the through hole can be penetrated by the limit rod 62, and the limit rod 62 penetrating through the through hole and the limit hole 323 can limit the sliding range of the clamping member 32, so that the clamping member 32 cannot deviate from a predetermined track when sliding, and the accuracy and reliability of the test are improved. In this embodiment 1, the fixing member 61 is in an inverted concave shape, the protruding portion is integrally connected or welded with the base plate 1, the recessed portion is used for avoiding the binding post 33, and the limiting holes 323 are provided with two limiting holes, which are respectively located on two sides of the fixing member 61, so that the stability of clamping connection is further improved, and dislocation clamping is avoided. In other embodiments, the number of the limiting holes 323 is not particularly limited, and may be increased or decreased according to practical situations.
In order to improve the clamping of the tested device 4 by the first clamping mechanism 2 and the second clamping mechanism 3, the tested device 4 slides longitudinally or is separated from the bottom plate 1 longitudinally, in this embodiment 1, a pressing device 7 is disposed between the fixing piece 61 of the first clamping mechanism 2 and the fixing piece 61 of the second clamping mechanism 3, so as to press the tested device 4, so that the tested device 4 can be prevented from moving or shaking during the testing process, and thus the testing accuracy and reliability are improved.
Specifically, the pressing device 7 includes a pressing plate 71, a first connecting member 72, a second connecting member 73, and an elastic device 74, where the first connecting member 72 is connected between the pressing plate 71 and the fixing member 61 of the first clamping mechanism 2, the second connecting member 73 is connected between the pressing plate 71 and the fixing member 61 of the second clamping mechanism 3, and the elastic device 74 is disposed between the pressing plate 71 and the tested device 4, and the elastic device 74 can provide a certain buffering effect to avoid damaging the tested device 4 in the testing process. Preferably, the first connecting piece 72 is fixedly connected with the pressing plate 71, the first connecting piece 72 is hinged with the fixing piece 61 of the first clamping mechanism 2, the second connecting piece 73 is fixedly connected with the pressing plate 71, and the second connecting piece 73 is in clamping connection or buckling connection with the fixing piece 61 of the second clamping mechanism 3, so that the tested device 4 can be conveniently and rapidly detached and installed, and the replacement efficiency is improved.
In this embodiment 1, the elastic device 74 includes a limit screw 741 and a spring 742, where the limit screw 741 is inserted through the pressure plate 71 and extends toward the tested device 4, and the spring 742 is sleeved on the limit screw 741 between the pressure plate 71 and the tested device 4, so as to provide a certain buffering and damping effect, so as to compress the tested device 4.
In some embodiments, the tested device 4 is provided with a thermistor 8 and a temperature measuring device 9, which are used for monitoring the tested device 4, so that the temperature change of the tested device 4 can be monitored in real time, and whether the tested device 4 has abnormal conditions such as overheating or not can be found in time.
In some embodiments, to further avoid shaking during the process that the device under test 4 is not held, a limiting plate 11 is disposed between the device under test 4 and the first clamping mechanism 2 and between the device under test 4 and the second clamping mechanism 3, a plurality of pin grooves 111 are disposed on the limiting plate 11 corresponding to the wire pins 41, and the benefit of disposing the limiting plate 11 is that the position and arrangement manner of the wire pins 41 of the device under test 4 can be limited, so that the accuracy and reliability of the test are improved.
During use, the clamping part between the second connecting piece 73 and the fixing piece 61 of the second clamping mechanism 3 is manually broken, the pressing plate 71 is rotated to be opened, then the tested device 4 is placed, then the closing pressing plate 71 is rotated to clamp the second connecting piece 73 with the fixing piece 61 of the second clamping mechanism 3, then the first pushing motor 51 and the second pushing motor 52 are adopted to automatically clamp, the effect that the binding post 33 is communicated with the wiring pin 41 of the tested device 4 is achieved, and preparation is made for subsequent aging tests.
In summary, the fixture for pin burn-in test provided by the invention has the following technical effects:
1. the test efficiency is improved: the clamp can clamp a plurality of wiring pins 41 and finish wiring at the same time without manually wiring one by one, so that the testing efficiency of the aging test is greatly improved;
2. the test accuracy is improved: the fixture can precisely control the connection position and the contact strength of each wiring pin 41, thereby ensuring the accuracy of the test result;
3. the test cost is reduced: the clamp can be reused without manual intervention, so that the test cost is reduced;
4. the test safety is improved: the clamp can effectively prevent the problems of short circuit and poor contact of the wiring pin 41, thereby improving the testing safety.
The technical means disclosed by the scheme of the invention is not limited to the technical means disclosed by the embodiment, and also comprises the technical scheme formed by any combination of the technical features. It should be noted that modifications and adaptations to the invention may occur to one skilled in the art without departing from the principles of the present invention and are intended to be within the scope of the present invention.

Claims (10)

1. The utility model provides a pin anchor clamps for ageing test which characterized in that includes:
a bottom plate (1);
a first clamping mechanism (2), wherein the first clamping mechanism (2) is assembled on one side of the bottom plate (1), and the first clamping mechanism (2) is provided with a first wiring part (21);
a second clamping mechanism (3), wherein the second clamping mechanism (3) is assembled on the other side of the bottom plate (1), and the second clamping mechanism (3) is provided with a second wiring part (31);
the device under test (4), the device under test (4) is held between first fixture (2) and second fixture (3), the device under test (4) has wiring pin (41) to make first wiring portion (21), second wiring portion (31) with wiring pin (41) intercommunication.
2. A fixture for pin burn-in testing according to claim 1, further comprising a driving device (5), said driving device (5) comprising:
the first pushing motor (51) is fixed on the bottom plate (1) through a first assembly part, and the output end of the first pushing motor (51) is connected with one side, far away from the second clamping mechanism (3), of the first clamping mechanism (2);
the second pushing motor (52), the second pushing motor (52) is fixed on the bottom plate (1) through the second assembly part, and the output end of the second pushing motor (52) is connected with one side, far away from the first clamping mechanism (2), of the second clamping mechanism (3).
3. A pin burn-in fixture according to claim 2, wherein the first clamping mechanism (2) and the second clamping mechanism (3) each comprise:
the clamping piece (32), the clamping piece (32) comprises a pushing groove (321) and a wiring hole (322), the pushing groove (321) is connected with the output end of the driving device (5), the wiring hole (322) is provided with a plurality of wiring posts (33), and the wiring posts (33) face to the wiring pins (41) of the tested device (4);
and the limiting piece (34) is arranged on one side, far away from the tested device (4), of the wiring hole (322) and is used for limiting the wiring post (33).
4. A pin burn-in fixture according to claim 3, wherein the holding member (32) is provided with a limiting hole (323), a limiting device (6) is provided in the limiting hole (323), and the limiting device (6) comprises:
the fixing piece (61), the fixing piece (61) is connected with the bottom plate (1), and a perforation is arranged on the fixing piece (61);
and the limiting rod (62) is arranged through the perforation and the limiting hole (323) in a penetrating mode, so that the clamping piece (32) slides along the limiting rod (62).
5. The fixture for pin burn-in testing according to claim 4, wherein the limit lever (62) of the limit device (6) is parallel to the driving direction of the driving apparatus (5).
6. The fixture for pin burn-in testing according to claim 4, wherein a pressing device (7) is arranged between the fixing member (61) of the first clamping mechanism (2) and the fixing member (61) of the second clamping mechanism (3) for pressing the tested device (4).
7. -a fixture for pin burn-in testing according to claim 6, characterized in that said pressing means (7) comprise:
a pressing plate (71);
a first connecting piece (72), wherein the first connecting piece (72) is connected between the pressing plate (71) and a fixing piece (61) of the first clamping mechanism (2);
a second connecting piece (73), wherein the second connecting piece (73) is connected between the pressing plate (71) and a fixing piece (61) of the second clamping mechanism (3);
and an elastic device (74), wherein the elastic device (74) is arranged between the pressing plate (71) and the tested equipment (4).
8. The fixture for pin burn-in testing of claim 7, wherein said resilient means (74) comprises:
the limit screw (741) penetrates through the pressing plate (71) and extends towards the tested device (4);
and the spring (742) is sleeved on a limit screw (741) between the pressing plate (71) and the tested device (4).
9. A pin burn-in fixture according to any one of claims 1-8, wherein the device under test (4) is provided with a thermistor (8) and a temperature measuring device (9) for monitoring the device under test (4).
10. The fixture for pin burn-in testing according to any one of claims 1 to 8, wherein limiting plates (11) are respectively arranged between the tested device (4) and the first clamping mechanism (2) and between the tested device (4) and the second clamping mechanism (3), and a plurality of pin grooves (111) are formed in the limiting plates (11) corresponding to the wiring pins (41).
CN202410198094.1A 2024-02-22 2024-02-22 Clamp for pin aging test Pending CN117825933A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202410198094.1A CN117825933A (en) 2024-02-22 2024-02-22 Clamp for pin aging test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202410198094.1A CN117825933A (en) 2024-02-22 2024-02-22 Clamp for pin aging test

Publications (1)

Publication Number Publication Date
CN117825933A true CN117825933A (en) 2024-04-05

Family

ID=90508211

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202410198094.1A Pending CN117825933A (en) 2024-02-22 2024-02-22 Clamp for pin aging test

Country Status (1)

Country Link
CN (1) CN117825933A (en)

Similar Documents

Publication Publication Date Title
CN210742312U (en) Radio frequency test fixture device
CN219676073U (en) Battery cell testing device
CN117825933A (en) Clamp for pin aging test
CN209979699U (en) Electricity core anchor clamps and electric core detection device
CN210401469U (en) Multi-channel test clip
CN216847595U (en) Battery sampling FPC subassembly leak welding detection device
CN114994526A (en) Intelligent comprehensive testing device for circuit breaker
CN210720678U (en) Storage battery internal resistance tester and test clamp thereof
CN209570622U (en) Cell degradation test fixture
CN210465608U (en) Electronic board detection tool
CN209432863U (en) A kind of electrolytic capacitor burn-in test special fixture
CN220473200U (en) Compression-resistant test fixture
CN116454759B (en) Wire lock of low-voltage distribution box
CN214845447U (en) Digital bridge device for cable detection
CN218331889U (en) Battery OCV testing arrangement
CN219162188U (en) Quick charge-discharge test fixture for square shell
CN216285390U (en) Circuit board test fixture
CN220120876U (en) High-compatibility battery cell test fixture
CN218068176U (en) Test tool for microcomputer protection device
CN217385791U (en) Plug cord detection tool
CN216816277U (en) Push-pull force test fixture
CN220399504U (en) Universal fixture device for performance test of soft-package battery
CN219065550U (en) Battery capacity-dividing test fixture
CN215894839U (en) PCBA board testing arrangement of automatically controlled executor of turbocharged
CN218601408U (en) A high-voltage insulation test frock for switching power supply

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination