CN117806889A - Touch control testing system and touch control testing method based on capacitance matrix plate - Google Patents

Touch control testing system and touch control testing method based on capacitance matrix plate Download PDF

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Publication number
CN117806889A
CN117806889A CN202311872303.8A CN202311872303A CN117806889A CN 117806889 A CN117806889 A CN 117806889A CN 202311872303 A CN202311872303 A CN 202311872303A CN 117806889 A CN117806889 A CN 117806889A
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Prior art keywords
test
target
output terminal
input
touch
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刘刚
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Zhongshan Suntech Intelligent Technology Co ltd
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Zhongshan Suntech Intelligent Technology Co ltd
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Priority to CN202311872303.8A priority Critical patent/CN117806889A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2247—Verification or detection of system hardware configuration
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Position Input By Displaying (AREA)

Abstract

The embodiment of the invention provides a touch control testing system and a touch control testing method based on a capacitance matrix plate, wherein the touch control testing system comprises the following components: the intelligent terminal, the jig, the measured plate and the capacitance matrix plate; the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitance matrix plate through a connector; the tested board comprises a plurality of groups of scanning signal groups, the capacitance matrix board comprises a plurality of groups of input and output terminal groups, and each scanning signal group is connected with each input and output terminal group in a one-to-one correspondence manner; the input and output terminal groups comprise input terminals and output terminals, and the input terminals are connected with the output terminals in a one-to-one correspondence manner; test capacitors are arranged in parallel between the input terminals and the output terminals. According to the embodiment of the invention, the touch control test can be performed on the tested plate by using the capacitance matrix plate, so that the touch control test cost can be effectively reduced.

Description

Touch control testing system and touch control testing method based on capacitance matrix plate
Technical Field
The invention relates to the technical field of touch screens, in particular to a touch testing system and a touch testing method based on a capacitive matrix plate.
Background
Along with the continuous development of science and technology, the role played by the touch display screen in society is more and more important, and the touch display screen brings great convenience to people in various other fields, namely the industrial field and the commercial field, and the integrated information output and input brought by the touch display screen, so that the equipment does not need various physical keyboards, buttons and the like any more, and smooth operation can be realized only by slightly using fingers, so that the equipment becomes more and more intelligent and humanized.
Most of the existing touch display screens are capacitive display screens, the basic principle of the existing touch display screens can be simply understood as that similar capacitive matrixes of the milbema are distributed under the screen, a main control chip of the touch display screen can scan the capacitive matrixes, when a finger touches a certain point, the capacitance of the point can change due to static electricity of the finger, and the main control chip can detect the change of the capacitance of the point according to line scanning and column scanning so as to position and operate the point. Therefore, the main control chip is the core and key of the touch technology, and the main control chip directly influences the performance and quality of the whole display screen.
The rapid popularization of touch display screens brings a great deal of requirements for testing touch functions, and how to rapidly test the touch functions of the display screens, so that the improvement of the testing efficiency becomes more important. The existing touch display test is basically to assemble a main board (including a main control chip) and a display screen into a whole machine and then test the whole machine, namely, to perform row-column scanning, if the capacitance values of all points are within the specification range, the touch test is considered to pass, but two defects exist in the situation: 1. the whole machine is assembled to perform the test, so that other materials except the main board are required to be prepared in advance, and the cost of the tested materials is increased; 2. if the touch test is not passed and the main control chip is found to be abnormal, the main control chip needs to be disassembled and replaced, so that the cost of the test time is increased; 3. the testing process is complex, and the process control cost is increased.
Therefore, the conventional touch test method has a problem of high test cost.
Disclosure of Invention
The embodiment of the invention provides a touch control testing system and a touch control testing method based on a capacitance matrix plate, which aim to solve the problem that the existing touch control testing mode has high testing cost.
In a first aspect, embodiments of the present invention disclose a touch test system based on a capacitive matrix plate, the touch test system comprising: the intelligent terminal, the jig, the measured plate and the capacitance matrix plate; the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitance matrix plate through a connector;
the tested board comprises a plurality of groups of scanning signal groups, the capacitance matrix board comprises a plurality of groups of input and output terminal groups, and each scanning signal group is connected with each input and output terminal group in a one-to-one correspondence manner;
the input and output terminal groups comprise input terminals and output terminals, and the input terminals are connected with the output terminals in a one-to-one correspondence manner;
test capacitors are arranged in parallel between the input terminals and the output terminals.
Further, a plurality of signal pin groups are arranged on the connector;
the signal pin groups comprise first signal pins and second signal pins;
the first signal pins and the second signal pins are arranged between the connector and the grounding end.
In a second aspect, the embodiment of the invention also discloses a touch test method based on a capacitive matrix board, which is applied to the touch test system based on the capacitive matrix board in the first aspect, wherein the touch test system is applied to a controller of an intelligent terminal, the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested board, and the tested board is electrically connected with the capacitive matrix board through a connector; the method comprises the following steps:
the controller of the intelligent terminal sends a touch test instruction to the jig so that
The jig sequentially tests the input and output terminal groups according to the received touch control test instruction to obtain a plurality of target test results corresponding to the input and output terminal groups; and is combined with
Integrating each target test result to obtain a test result;
and sending the test result to the intelligent terminal.
The embodiment of the invention provides a touch control testing system and a touch control testing method based on a capacitance matrix plate, wherein the touch control testing system comprises the following components: the intelligent terminal, the jig, the measured plate and the capacitance matrix plate; the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitance matrix plate through a connector; the tested board comprises a plurality of groups of scanning signal groups, the capacitance matrix board comprises a plurality of groups of input and output terminal groups, and each scanning signal group is connected with each input and output terminal group in a one-to-one correspondence manner; the input and output terminal groups comprise input terminals and output terminals, and the input terminals are connected with the output terminals in a one-to-one correspondence manner; test capacitors are arranged in parallel between the input terminals and the output terminals. According to the embodiment of the invention, the touch control test can be performed on the tested plate by using the capacitance matrix plate, so that the touch control test cost can be effectively reduced.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a first portion of a capacitive matrix plate based touch test system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a second portion of a capacitive matrix plate based touch test system according to an embodiment of the present invention;
fig. 3 is a schematic flow chart of a touch testing method based on a capacitive matrix plate according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be understood that the terms "comprises" and "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
An embodiment of the present invention provides a touch test system based on a capacitive matrix plate, as shown in fig. 1 and 2, including: the intelligent terminal, the jig, the measured plate and the capacitance matrix plate; the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitance matrix plate through a connector J1; the tested board comprises a plurality of groups of scanning signal groups, the capacitance matrix board comprises a plurality of groups of input and output terminal groups, and each scanning signal group is connected with each input and output terminal group in a one-to-one correspondence manner; the input and output terminal groups comprise input terminals and output terminals, and the input terminals are connected with the output terminals in a one-to-one correspondence manner; test capacitors are arranged in parallel between the input terminals and the output terminals.
In this embodiment, the touch test system includes: the intelligent terminal, the jig, the measured plate and the capacitance matrix plate; the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitance matrix plate through a connector J1; the intelligent terminal can be electronic equipment such as a tablet personal computer, a notebook computer and a desktop computer, the jig is used for testing a main control chip of the tested board, the tested board can be a PCBA board (Printed Circuit Board +assembly, circuit board), and the tested board comprises the main control chip; the detected board is a circuit board in the touch display screen, and the main control chip is the core and key of the touch technology. The tested board comprises a plurality of groups of scanning signal groups, the capacitance matrix board comprises a plurality of groups of input and output terminal groups, and each scanning signal group is connected with each input and output terminal group in a one-to-one correspondence manner; the input and output terminal groups comprise input terminals and output terminals; as shown in fig. 1, the first input/output terminal group includes a first input terminal rx_0 and a first output terminal tx_0; the input terminals are connected with the output terminals in a one-to-one correspondence manner; test capacitors are arranged in parallel between the input terminal and the output terminal; the capacitance values of the test capacitors are 1 picofarad or 1.5 picofarads.
In one embodiment, as shown in fig. 1, the connector is provided with a plurality of signal pin groups; the signal pin groups comprise first signal pins and second signal pins; the first signal pins and the second signal pins are arranged between the connector and the grounding end.
In this embodiment, the connector is provided with a plurality of signal pin groups; the signal pin groups comprise first signal pins and second signal pins; the first signal pin and the second signal pin are arranged between the connector and the grounding end so as to ensure the stable operation of the touch control testing system.
The embodiment of the invention also provides a touch control testing method based on the capacitance matrix board, which is applied to the touch control testing system based on the capacitance matrix board, wherein the touch control testing system is applied to a controller of an intelligent terminal, and the intelligent terminal can be electronic equipment such as a tablet personal computer, a notebook computer, a desktop computer and the like; the intelligent terminal can be electrically connected with the jig through a first connecting wire, and the first connecting wire can be a power wire; the jig can be electrically connected with the tested board through a second connecting wire, and the second connecting wire can be a flexible flat cable; the measured board is electrically connected with the capacitance matrix board through a connector.
Fig. 3 is a schematic flow chart of a touch testing method based on a capacitive matrix plate according to an embodiment of the present invention. As shown in fig. 3, the method includes the following steps S110 to S140.
S110, the controller of the intelligent terminal sends a touch test instruction to the jig.
In this embodiment, a user may operate on a user interface of the intelligent terminal to send a touch test instruction to the fixture; further, the controller of the intelligent terminal may send a touch test instruction to the jig at regular time.
And S120, the jig sequentially tests the input and output terminal groups according to the received touch control test instruction to obtain a plurality of target test results corresponding to the input and output terminal groups.
In this embodiment, the jig sequentially tests each input and output terminal group according to the received touch test instruction to obtain a plurality of target test results corresponding to each input and output terminal group, and if each target test result is that the test is passed, it indicates that the main control chip of the tested board can normally implement the touch function.
In one embodiment, step S120 includes:
the jig acquires a target input/output terminal group; the target input/output terminal group comprises a target input terminal, a target test capacitor and a target output terminal; testing the target input/output terminal group to obtain a target test result; judging whether a next input/output terminal group exists or not; and if the next input/output terminal group exists, taking the next input/output terminal group as a target input/output terminal group, and returning to execute the step of testing the target input/output terminal group to obtain a target test result.
In this embodiment, the jig acquires a target input-output terminal group; the target input/output terminal group comprises a target input terminal, a target test capacitor and a target output terminal; testing the target input/output terminal group to obtain a target test result; judging whether a next input/output terminal group exists or not; if the next input/output terminal group exists, taking the next input/output terminal group as a target input/output terminal group, and returning to execute the step of testing the target input/output terminal group to obtain a target test result; if the next input/output terminal group does not exist, judging whether each target test result is test passing or not so as to judge whether the main control chip of the tested board can normally realize the touch function or not.
In one embodiment, step S120 includes:
the jig sends a target test instruction to a main control chip of the tested board according to the target input/output terminal group; the main control chip sends a test start instruction to the target output terminal according to the received target test instruction; the target output terminal sends a first test signal to the target input terminal according to the received test start instruction; the target output terminal analyzes the received first test signal to obtain a second test signal; and the main control chip judges the first test signal and the second test signal according to a preset judgment strategy to obtain a target test result.
In this embodiment, the jig sends a target test instruction to a main control chip of the board to be tested according to the target input/output terminal set; the main control chip sends a test start instruction to the target output terminal according to the received target test instruction; the target output terminal sends a first test signal to the target input terminal according to the received test start instruction; the target output terminal analyzes the received first test signal to obtain a second test signal; and the main control chip judges the first test signal and the second test signal according to a preset judgment strategy to obtain a target test result. According to the embodiment of the invention, the touch function test of the main control chip of the tested board can be realized by using the capacitance matrix board without assembling a whole machine, and the labor/time cost can be effectively reduced.
In one embodiment, step S120 includes:
performing amplitude judgment on the first test signal and the second test signal according to an amplitude judgment rule in the judgment strategy to obtain a first test result; frequency judgment is carried out on the first test signal and the second test signal according to a frequency judgment rule in the judgment strategy, so that a second test result is obtained; and combining the first test result with the second test result to obtain a corresponding target test result.
In this embodiment, according to an amplitude value judgment rule in the judgment policy, amplitude values of the first test signal and the second test signal are judged to obtain a first test result; frequency judgment is carried out on the first test signal and the second test signal according to a frequency judgment rule in the judgment strategy, so that a second test result is obtained; and combining the first test result with the second test result to obtain a corresponding target test result. Furthermore, the phase judgment can be performed on the first test signal and the second test signal according to the phase judgment rule in the judgment strategy, so as to obtain a third test result.
In one embodiment, step S120 includes:
acquiring a first amplitude value according to the first test signal; acquiring a second amplitude value according to the second test signal; comparing the first amplitude value with the second amplitude value to obtain a first comparison result; and judging whether the first comparison result is in the amplitude range of the amplitude judgment rule or not to obtain a first test result of whether the first comparison result passes the test or not.
In this embodiment, a first amplitude is obtained according to the first test signal; acquiring a second amplitude value according to the second test signal; comparing the first amplitude value with the second amplitude value to obtain a first comparison result; and judging whether the first comparison result is in the amplitude range of the amplitude judgment rule or not to obtain a first test result of whether the first comparison result passes the test or not. If the first comparison result is not in the amplitude range of the amplitude judgment rule, a first test result which passes through the non-test is obtained; if a first test result which passes the non-test is obtained, the main control chip can not normally realize the touch control function.
In one embodiment, step S120 includes:
acquiring a first frequency according to the first test signal; acquiring a second frequency according to the second test signal; comparing the first frequency with the second frequency to obtain a second comparison result; and judging whether the second comparison result is in the frequency range of the judgment strategy or not, and obtaining a second test result of whether the test passes or not.
In this embodiment, a first frequency is obtained according to the first test signal; acquiring a second frequency according to the second test signal; comparing the first frequency with the second frequency to obtain a second comparison result; and judging whether the second comparison result is in the frequency range of the judgment strategy or not, and obtaining a second test result of whether the test passes or not. If the second test result is not in the frequency range of the judgment strategy, obtaining a second test result which passes through the non-test; if a second test result which passes the non-test is obtained, the main control chip can not normally realize the touch control function.
In one embodiment, step S120 includes:
and if the first target test result and the second target test result are both the test passing results, obtaining the target test result of the test passing results.
In this embodiment, if the first target test result and the second target test result are both the test passing results, a target test result of the test passing results is obtained. And if the first target test result or the second target test result is that the test fails, obtaining a target test result that the test fails.
S130, integrating each target test result to obtain a test result.
In this embodiment, if the target test result is that the test fails, it indicates that the main control chip of the tested board cannot normally implement the touch function, so as to obtain a test result that the test fails.
In one embodiment, step S130 includes:
judging whether each target test result is passing or not; and if the target test results are all the test passing results, obtaining the test passing results.
In this embodiment, whether each target test result is a test passing is determined; if the target test results are all the test results, the main control chip of the tested board can normally realize the touch function, so that the test results of the test passing can be obtained.
And S140, sending the test result to the intelligent terminal.
In this embodiment, the test result is sent to the intelligent terminal, and the user can check the test result through the intelligent terminal, and screen out the tested board with abnormality according to the test result.
The present invention is not limited to the above embodiments, and various equivalent modifications and substitutions can be easily made by those skilled in the art within the technical scope of the present invention, and these modifications and substitutions are intended to be included in the scope of the present invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.

Claims (10)

1. A touch testing system based on a capacitive matrix plate, the touch testing system comprising: the intelligent terminal, the jig, the measured plate and the capacitance matrix plate; the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitance matrix plate through a connector;
the tested board comprises a plurality of groups of scanning signal groups, the capacitance matrix board comprises a plurality of groups of input and output terminal groups, and each scanning signal group is connected with each input and output terminal group in a one-to-one correspondence manner;
the input and output terminal groups comprise input terminals and output terminals, and the input terminals are connected with the output terminals in a one-to-one correspondence manner;
test capacitors are arranged in parallel between the input terminals and the output terminals.
2. The capacitive matrix plate based touch test system of claim 1, wherein a plurality of signal pin sets are provided on the connector;
the signal pin groups comprise first signal pins and second signal pins;
the first signal pins and the second signal pins are arranged between the connector and the grounding end.
3. A touch testing method based on a capacitive matrix plate, applied to the touch testing system based on a capacitive matrix plate according to any one of claims 1-2, wherein the touch testing system is applied to a controller of an intelligent terminal, the intelligent terminal is electrically connected with the jig, the jig is electrically connected with the tested plate, and the tested plate is electrically connected with the capacitive matrix plate through a connector; the method comprises the following steps:
the controller of the intelligent terminal sends a touch test instruction to the jig so that
The jig sequentially tests the input and output terminal groups according to the received touch control test instruction to obtain a plurality of target test results corresponding to the input and output terminal groups; and is combined with
Integrating each target test result to obtain a test result;
and sending the test result to the intelligent terminal.
4. The touch testing method based on the capacitive matrix plate according to claim 3, wherein the testing device sequentially tests each of the input/output terminal groups according to the received touch testing command to obtain a plurality of target test results corresponding to each of the input/output terminal groups, and comprises:
the jig acquires a target input/output terminal group; the target input/output terminal group comprises a target input terminal, a target test capacitor and a target output terminal;
testing the target input/output terminal group to obtain a target test result;
judging whether a next input/output terminal group exists or not;
and if the next input/output terminal group exists, taking the next input/output terminal group as a target input/output terminal group, and returning to execute the step of testing the target input/output terminal group to obtain a target test result.
5. The touch test method based on the capacitive matrix plate according to claim 4, wherein the testing the target input/output terminal group to obtain a target test result comprises:
the jig sends a target test instruction to a main control chip of the tested board according to the target input/output terminal group;
the main control chip sends a test start instruction to the target output terminal according to the received target test instruction;
the target output terminal sends a first test signal to the target input terminal according to the received test start instruction;
the target output terminal analyzes the received first test signal to obtain a second test signal;
and the main control chip judges the first test signal and the second test signal according to a preset judgment strategy to obtain a target test result.
6. The touch test method based on the capacitive matrix panel according to claim 5, wherein the main control chip judges the first test signal and the second test signal according to a preset judgment policy to obtain a target test result, and the method comprises:
performing amplitude judgment on the first test signal and the second test signal according to an amplitude judgment rule in the judgment strategy to obtain a first test result;
frequency judgment is carried out on the first test signal and the second test signal according to a frequency judgment rule in the judgment strategy, so that a second test result is obtained;
and combining the first test result with the second test result to obtain a corresponding target test result.
7. The touch test method based on the capacitive matrix panel according to claim 6, wherein the performing amplitude judgment on the first test signal and the second test signal according to the amplitude judgment rule in the judgment policy to obtain a first test result includes:
acquiring a first amplitude value according to the first test signal;
acquiring a second amplitude value according to the second test signal;
comparing the first amplitude value with the second amplitude value to obtain a first comparison result;
and judging whether the first comparison result is in the amplitude range of the amplitude judgment rule or not to obtain a first test result of whether the first comparison result passes the test or not.
8. The touch test method based on a capacitive matrix panel according to claim 6, wherein performing frequency judgment on the first test signal and the second test signal according to a frequency judgment rule in the judgment policy to obtain a second test result comprises:
acquiring a first frequency according to the first test signal;
acquiring a second frequency according to the second test signal;
comparing the first frequency with the second frequency to obtain a second comparison result;
and judging whether the second comparison result is in the frequency range of the judgment strategy or not, and obtaining a second test result of whether the test passes or not.
9. The capacitive matrix plate based touch test method of claim 8, wherein combining the first test result with the second test result results in a corresponding target test result comprises:
and if the first target test result and the second target test result are both the test passing results, obtaining the target test result of the test passing results.
10. The touch test method of claim 9, wherein integrating each of the target test results to obtain a test result comprises:
judging whether each target test result is passing or not;
and if the target test results are all the test passing results, obtaining the test passing results.
CN202311872303.8A 2023-12-29 2023-12-29 Touch control testing system and touch control testing method based on capacitance matrix plate Pending CN117806889A (en)

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CN202311872303.8A CN117806889A (en) 2023-12-29 2023-12-29 Touch control testing system and touch control testing method based on capacitance matrix plate

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Application Number Priority Date Filing Date Title
CN202311872303.8A CN117806889A (en) 2023-12-29 2023-12-29 Touch control testing system and touch control testing method based on capacitance matrix plate

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Publication Number Publication Date
CN117806889A true CN117806889A (en) 2024-04-02

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