CN117806387B - Processing temperature regulation and control method based on data processing - Google Patents
Processing temperature regulation and control method based on data processing Download PDFInfo
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- CN117806387B CN117806387B CN202410225238.8A CN202410225238A CN117806387B CN 117806387 B CN117806387 B CN 117806387B CN 202410225238 A CN202410225238 A CN 202410225238A CN 117806387 B CN117806387 B CN 117806387B
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- 238000012545 processing Methods 0.000 title claims abstract description 138
- 238000000034 method Methods 0.000 title claims abstract description 42
- 239000004033 plastic Substances 0.000 claims abstract description 324
- 229920003023 plastic Polymers 0.000 claims abstract description 324
- 239000002245 particle Substances 0.000 claims abstract description 321
- 239000002985 plastic film Substances 0.000 claims abstract description 12
- 229920006255 plastic film Polymers 0.000 claims abstract description 12
- 230000001105 regulatory effect Effects 0.000 claims abstract description 12
- 230000001276 controlling effect Effects 0.000 claims abstract description 10
- 238000012797 qualification Methods 0.000 claims description 23
- 238000010438 heat treatment Methods 0.000 claims description 17
- 230000000007 visual effect Effects 0.000 claims description 14
- 238000003490 calendering Methods 0.000 claims description 8
- 238000007599 discharging Methods 0.000 claims description 8
- 239000011159 matrix material Substances 0.000 claims description 6
- 230000003044 adaptive effect Effects 0.000 claims description 5
- 238000010276 construction Methods 0.000 claims description 5
- 239000010408 film Substances 0.000 description 64
- 239000010409 thin film Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000005507 spraying Methods 0.000 description 4
- 229920000426 Microplastic Polymers 0.000 description 3
- 238000013480 data collection Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000670 limiting effect Effects 0.000 description 2
- -1 polyethylene Polymers 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000000071 blow moulding Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000007888 film coating Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
- Y02W30/00—Technologies for solid waste management
- Y02W30/50—Reuse, recycling or recovery technologies
- Y02W30/62—Plastics recycling; Rubber recycling
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Abstract
The invention relates to the technical field of film processing, in particular to a processing temperature regulating and controlling method based on data processing, which comprises the following steps: collecting plastic particle stacking image data placed on film processing equipment, constructing a plastic particle stacking model based on the plastic particle stacking image data, and analyzing plastic particle processing risks by using the plastic particle stacking model; the method comprises the steps of acquiring a plastic particle stacking image placed on film processing equipment, driving the film processing equipment to ram and heat plastic particles, judging the plastic particles processed by the film processing equipment in real time based on the acquisition of plastic particle image data used for processing the film, further identifying whether the plastic particle state processed by the film processing equipment is suitable for forming the film based on a judging result, finally regulating and controlling the film processing equipment according to the identifying result, and further configuring regulation and control logic, so that the plastic particle state processed by the film processing equipment in operation can be matched with the forming of the plastic film to a higher degree.
Description
Technical Field
The invention relates to the technical field of film processing, in particular to a processing temperature regulating and controlling method based on data processing.
Background
Plastic films are films made of polyvinyl chloride, polyethylene, polypropylene, polystyrene, and other resins for packaging and for use as a film coating. The common processing and forming methods of plastic films mainly comprise an extrusion method, a blow molding method, a calendaring method, a casting method and a stretching method.
In the film processing equipment for calendaring processing, in the operation process, plastic particles can not be completely melted due to uneven heating of the plastic particles for film processing, so that appearance and quality defects of processed finished products exist, and the use of subsequent films is affected.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a processing temperature regulating and controlling method based on data processing, which solves the technical problems in the background art.
In order to achieve the above purpose, the invention is realized by the following technical scheme:
a processing temperature regulation and control method based on data processing comprises the following steps:
collecting plastic particle stacking image data placed on film processing equipment, constructing a plastic particle stacking model based on the plastic particle stacking image data, and analyzing plastic particle processing risks by using the plastic particle stacking model;
Acquiring a plastic particle stacking image placed on the film processing equipment, driving the film processing equipment to tamp and heat plastic particles, acquiring the plastic particle image which is completely tamped and heated on the film processing equipment, and analyzing the difference between the plastic particle image and the plastic particle stacking image;
setting a temperature regulation logic of the film processing equipment, receiving a difference analysis result of the plastic particle image and the plastic particle stacking image, and carrying out adaptive regulation of the temperature of the film processing equipment by combining the difference analysis result and the temperature regulation logic of the film processing equipment.
Further, when the plastic particle stacking image data is collected, the collection view angle comprises: a front upper or lower visual angle, any two groups and more side visual angles, wherein when the side visual angle is used for collecting the plastic particle stacking image data, a straight line in the collecting direction of the side visual angle is parallel to the plastic particle stacking surface, and when the front upper or lower visual angle is used for collecting the plastic particle stacking image data, the straight line in the collecting direction of the front upper or lower visual angle is perpendicular to the plastic particle stacking surface;
the film processing equipment is integrated by a material-discharging station, a heating station and a calendaring station, wherein the material-discharging station is used for discharging plastic particles, the heating station is used for heating the plastic particles discharged by the material-discharging station, so that the plastic particles are melted, the calendaring station is used for ramming the melted plastic particles, and the melted plastic particles are pressed into plastic films with uniform thickness.
Further, in the plastic particle stacking image data collection stage, firstly, plastic particle stacking image data of a front upper or front lower view angle is collected, then, two groups of plastic particle stacking image data of any side view angle are collected, similarity of the two groups of plastic particle stacking image data of the side view angle is further analyzed, based on a similarity analysis result, whether collection of the plastic particle stacking image data of the side view angle is executed again is determined, and similarity analysis logic of the plastic particle stacking image data is expressed as follows:
Wherein: sim (a, b) is the similarity of the plastic particle stacked image data a and the plastic particle stacked image data b; n is a collection of element types in the plastic particle stacked image data; f a-q is the frequency of occurrence of the q-th element in the plastic particle stacked image data a; f b-q is the frequency of occurrence of the q-th element in the plastic particle stacked image data b; m is the number of cells of the histogram corresponding to the plastic particle stacking image data; ap is the number of pixels in the p-th cell of the histogram corresponding to the plastic particle stacking image data a; bp is the number of pixel points in a p-th cell of the histogram corresponding to the plastic particle stacking image data b; (a p,bp) represents the number of pixels intersected by ap and bp;
wherein, the f a-q and the f b-q take values to obey M, N is the width and height of the image; i (I, j) is the element I in the image at the (I, j) position; q (x, y) is the position (x, y) where the q element is located in the image.
Further, when 1 is more than or equal to sim (a, b) > 0.8, the collection of the plastic particle stacking image data is completed, otherwise, the collection of the plastic particle stacking image data is continuously executed, and when the collection of the plastic particle stacking image data is continuously executed, the number of the collected plastic particle stacking image data is as follows: the value is rounded further in the normal direction.
Further, after the plastic particle stacking image data is collected, the plastic particle stacking image data collected from the front upper view or the front lower view is configured with other groups of plastic particle stacking image data collected from the side view, and a plastic particle stacking model is constructed by applying each group of configured plastic particle stacking image data, wherein the plastic particle stacking model construction logic comprises:
Step1: extracting plastic particle stacking contour images in two groups of mutually configured plastic particle stacking image data, and rotating the center of the plastic particle stacking contour images from a right-up or right-down view angle to obtain a rotating contour image;
step2: capturing contour vertices in a plastic particle stacking contour image from a side view perspective;
Step3: constructing a triangle by the diameter of the rotated contour image and the position of the contour vertex in the plastic particle stacking contour image relative to the right-up or right-down viewing angle;
Step4: the middle point of the diameter of the rotation contour image is taken as a rotation center, so that the triangle rotates, and a three-dimensional model formed by the rotation track is recorded as a plastic particle stacking model.
Still further, the analysis logic of the plastic particle processing risk is expressed as:
Wherein: k is a plastic particle processing risk representation value; q is the number of constructed plastic particle stacking models; v 1 is the concave space volume of the plastic particle stacking image which is acquired for the first time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 2 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 2 nd time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 3 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 3 rd time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 4 is the volume of the concave space presented by the 4 th collected plastic particle stacking image from the side view angle corresponding to the top of the plastic particle stacking model.
Further, when the differential analysis of the plastic particle images and the plastic particle stacked images is executed, the applied plastic particle stacked images, namely, the plastic particle stacked image data with the acquisition view angle being the view angle right above or right below, are acquired, and when the plastic particle images are acquired, the acquisition view angle of the plastic particle stacked images applied during the differential analysis is based.
Further, the logic for analyzing the difference between the plastic particle image and the plastic particle stacking image is expressed as follows:
Wherein: diff (u, v) is the difference between the plastic particle image u and the plastic particle stacked image v; k is the number of pixels of the image in the x-axis direction in the plane; p (γ, τ, d, θ) is an element value corresponding to the γ -th row and τ -th column in the gradation co-occurrence matrix; gamma and tau are the rows and columns of the image; d is the variance of the corresponding element of the (tau) th row and the (tau) th column; θ is the generation direction of the gray level co-occurrence matrix; g is the number of image pixels in the plastic particle image and the plastic particle stacking image; p c and pc' are respectively the histogram data of the plastic particle image and the plastic particle stacking image;
wherein, Representing the inverse moment of the plastic particle image u,/>Representing the inverse moment of the stacked image v of plastic particles.
Still further, the thin film processing apparatus temperature regulation logic comprises: setting a qualification judgment threshold value, setting a temperature regulation proportion and setting a temperature regulation upper limit;
When the temperature regulation proportion is 0.5 and 1℃, the upper limit of temperature regulation is 5 ℃, and the difference between the plastic particle image and the plastic particle stacking image is not in a qualification judging threshold value, the film processing equipment further heats the plastic particles at the frequency of 0.5 ℃/5s, otherwise, the film processing equipment is ended to tamper and heat the plastic particles, and the film processing equipment is ended to tamper and heat the plastic particles, so that the film processing equipment is adaptive to regulate and control the temperature of the film processing equipment.
Further, the difference between the plastic particle image and the plastic particle stacking image is not in the qualification judgment threshold, and in the process of further heating the plastic particles by the film processing equipment at the frequency of 0.5 ℃/5s, diff (u, v) is obtained in real time based on a difference analysis logic of the plastic particle image and the plastic particle stacking image, the Diff (u, v) obtained in real time is synchronously applied and compared with the qualification judgment threshold, and after the Diff (u, v) is in the qualification judgment threshold, the tamping and heating operation of the plastic particles by the film processing equipment is finished;
wherein Diff (u, v) is corrected by applying the plastic grain processing risk representation value k when being compared with the qualification threshold, namely Diff (u, v) x k is compared with the qualification threshold.
Compared with the prior art, the technical proposal provided by the invention has the following advantages that
The beneficial effects are that:
1. The invention provides a processing temperature regulating and controlling method based on data processing, which can be used for judging plastic particles processed by film processing equipment in real time based on acquisition of plastic particle image data used for processing films in the execution process of the method, further identifying whether the plastic particle state processed by the film processing equipment is suitable for film forming based on a judging result, regulating and controlling the film processing equipment finally based on the identifying result, and further configuring regulating and controlling logic, so that the plastic particle state processed by the film processing equipment can be matched with the plastic film forming to a higher degree, and the qualification rate of film finished products produced by the film processing equipment is guaranteed.
2. In the execution process of the method, in the acquisition stage of plastic particle image data, appointed image acquisition logic is configured, a plastic particle stacking model is further constructed based on the acquired plastic particle image data, and then the plastic particle stacking model is used as a data reference to assist in judging the qualified state of plastic particles, so that the method is more accurate in judging the qualified state of the plastic particles, and further the method is further improved to enable the qualified rate of finished plastic films produced by the film processing equipment to be higher and the quality to be better under the condition that the film processing equipment is configured to operate.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It is evident that the drawings in the following description are only some embodiments of the present invention and that other drawings may be obtained from these drawings without inventive effort for a person of ordinary skill in the art.
FIG. 1 is a schematic flow chart of a processing temperature control method based on data processing;
FIG. 2 is a schematic diagram of the operation logic of the thin film processing apparatus when the method of the present invention is configured in the thin film processing apparatus, wherein (a) is a schematic diagram of the logic start phase; (b) a logic ending initial stage schematic diagram;
FIG. 3 is a schematic diagram showing the logic of the construction of the plastic particle stacking model in the present invention;
FIG. 4 is a schematic view of the plastic pellet stacking mold (1) constructed in FIG. 3 according to the present invention;
Fig. 5 is a schematic view of the plastic pellet stacking mold (2) constructed in fig. 3 in the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more clear, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It will be apparent that the described embodiments are some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention is further described below with reference to examples.
Example 1:
the processing temperature regulation and control method based on data processing in this embodiment, as shown in fig. 1, includes:
collecting plastic particle stacking image data placed on film processing equipment, constructing a plastic particle stacking model based on the plastic particle stacking image data, and analyzing plastic particle processing risks by using the plastic particle stacking model;
Acquiring a plastic particle stacking image placed on the film processing equipment, driving the film processing equipment to tamp and heat plastic particles, acquiring the plastic particle image which is completely tamped and heated on the film processing equipment, and analyzing the difference between the plastic particle image and the plastic particle stacking image;
Setting a temperature regulation logic of the film processing equipment, receiving a difference analysis result of the plastic particle image and the plastic particle stacking image, and carrying out adaptive regulation of the temperature of the film processing equipment by combining the difference analysis result and the temperature regulation logic of the film processing equipment;
After the plastic particle stacking image data is collected, the plastic particle stacking image data collected from the front upper view angle or the front lower view angle is configured with other groups of plastic particle stacking image data collected from the side view angle, a plastic particle stacking model is constructed by applying each group of configured plastic particle stacking image data, and the plastic particle stacking model construction logic comprises the following steps:
Step1: extracting plastic particle stacking contour images in two groups of mutually configured plastic particle stacking image data, and rotating the center of the plastic particle stacking contour images from a right-up or right-down view angle to obtain a rotating contour image;
step2: capturing contour vertices in a plastic particle stacking contour image from a side view perspective;
Step3: constructing a triangle by the diameter of the rotated contour image and the position of the contour vertex in the plastic particle stacking contour image relative to the right-up or right-down viewing angle;
Step4: taking the middle point of the diameter of the rotation contour image as a rotation center to enable the triangle to rotate, and recording a three-dimensional model of the rotation track as a plastic particle stacking model;
the analytical logic of the risk of processing plastic particles is expressed as:
Wherein: k is a plastic particle processing risk representation value; q is the number of constructed plastic particle stacking models; v 1 is the concave space volume of the plastic particle stacking image which is acquired for the first time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 2 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 2 nd time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 3 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 3 rd time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 4 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 4 th time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model;
the logic for the difference analysis between the plastic particle image and the plastic particle stack image is expressed as:
Wherein: diff (u, v) is the difference between the plastic particle image u and the plastic particle stacked image v; k is the number of pixels of the image in the x-axis direction in the plane; p (γ, τ, d, θ) is an element value corresponding to the γ -th row and τ -th column in the gradation co-occurrence matrix; gamma and tau are the rows and columns of the image; d is the variance of the corresponding element of the (tau) th row and the (tau) th column; θ is the generation direction of the gray level co-occurrence matrix; g is the number of image pixels in the plastic particle image and the plastic particle stacking image; p c and pc' are respectively the histogram data of the plastic particle image and the plastic particle stacking image;
wherein, Representing the inverse moment of the plastic particle image u,/>Representing the inverse moment of the plastic particle stacking image v; /(I)And the Pasteur coefficient factor value representing the plastic particle image and the plastic particle stacking image is used for representing the basic similarity of the plastic particle image and the plastic particle stacking image.
The film processing equipment temperature regulation logic comprises: setting a qualification judgment threshold value, setting a temperature regulation proportion and setting a temperature regulation upper limit;
when the temperature regulation proportion is 0.5 and 1 ℃ and the upper limit of temperature regulation is 5 ℃, and the difference between the plastic particle image and the plastic particle stacking image is not in a qualification judging threshold value, the film processing equipment further heats the plastic particles at the frequency of 0.5 ℃/5s, otherwise, the film processing equipment is ended to tamper and heat the plastic particles, and the plastic particles are further heated and the film processing equipment is ended to tamper and heat the plastic particles, so that the film processing equipment is adaptively regulated and controlled in temperature;
In the process that the difference between the plastic particle image and the plastic particle stacking image is not in a qualification judging threshold value, the film processing equipment obtains Diff (u, v) in real time based on a difference analysis logic of the plastic particle image and the plastic particle stacking image in the process of further heating the plastic particles at the frequency of 0.5 ℃/5s, the Diff (u, v) obtained in real time is synchronously applied to be compared with the qualification judging threshold value, and after the Diff (u, v) is in the qualification judging threshold value, the film processing equipment finishes the tamping and heating operation of the plastic particles;
wherein Diff (u, v) is corrected by applying the plastic grain processing risk representation value k when being compared with the qualification threshold, namely Diff (u, v) x k is compared with the qualification threshold.
In this embodiment, by collecting image data of plastic particles placed on the film processing equipment, a plastic particle stacking model is constructed, and further, the processing risk is analyzed based on the plastic particle stacking model, which can be regarded as that when the plastic particles are heated and melted on the film processing equipment in the plastic particle stacking state, the uniformity of heating is further based on basic operation logic of the film processing equipment, the image data collection is further performed on the plastic particles by the film processing equipment when the plastic particles are compacted and heated, further differential comparison objects are provided for the plastic particle stacking image, finally, data support is provided based on the differential comparison, the temperature regulation is performed on the film processing equipment, the plastic particle state used for producing plastic films by the film processing equipment is ensured to be safer, and stable security guarantee is provided for the preparation of plastic film finished products;
Referring now to FIG. 2, the logic for performing the method during operation of the thin film processing apparatus after the method is deployed in the thin film processing apparatus is further illustrated;
referring to fig. 3 and 4, further illustrating the operation logic of the film processing apparatus, two sets of plastic particle stacking models are finally obtained based on the arrow indication in fig. 3, and fig. 4 is an enlarged display of the two sets of plastic particle stacking models finally obtained in fig. 3, so as to further provide a visual logic understanding condition for the analysis logic of the plastic particle processing risk.
Example 2:
In the aspect of the specific implementation, on the basis of embodiment 1, this embodiment further specifically describes a processing temperature regulation method based on data processing in embodiment 1 with reference to fig. 1:
When image data is stacked to the plastic granules, gather the visual angle and include: when the plastic particle stacking image data under the front-up or front-down viewing angle and any two or more groups of side viewing angles are collected, the straight line of the collection direction of the side viewing angle is parallel to the plastic particle stacking surface, and when the plastic particle stacking image data under the front-up or front-down viewing angle is collected, the straight line of the collection direction of the front-up or front-down viewing angle is perpendicular to the plastic particle stacking surface;
The film processing equipment is integrated by a material-spraying station, a heating station and a calendaring station, wherein the material-spraying station is used for spraying plastic particles, the heating station is used for heating the plastic particles sprayed by the material-spraying station, so that the plastic particles are melted, the calendaring station is used for ramming the melted plastic particles, and the melted plastic particles are pressed into plastic films with uniform thickness.
By the arrangement, the operation logic of the film processing equipment and the acquisition logic of the plastic particle stacking image data are further limited.
As shown in fig. 1, in the stage of collecting plastic particle stacking image data, firstly, collecting plastic particle stacking image data of a front upper or front lower view angle, then collecting plastic particle stacking image data of two arbitrary side view angles, further analyzing similarity of the plastic particle stacking image data of the two arbitrary side view angles, and based on a similarity analysis result, deciding whether to execute collection of the plastic particle stacking image data of the side view angles again, wherein similarity analysis logic of the plastic particle stacking image data is expressed as follows:
Wherein: sim (a, b) is the similarity of the plastic particle stacked image data a and the plastic particle stacked image data b; n is a collection of element types in the plastic particle stacked image data; f a-q is the frequency of occurrence of the q-th element in the plastic particle stacked image data a; f b-q is the frequency of occurrence of the q-th element in the plastic particle stacked image data b; m is the number of cells of the histogram corresponding to the plastic particle stacking image data; ap is the number of pixels in the p-th cell of the histogram corresponding to the plastic particle stacking image data a; bp is the number of pixel points in a p-th cell of the histogram corresponding to the plastic particle stacking image data b; (a p,bp) represents the number of pixels intersected by ap and bp;
wherein, the f a-q and the f b-q take values to obey M, N is the width and height of the image; i (I, j) is the element I in the image at the (I, j) position; q (x, y) is the position (x, y) where the q element is located in the image;
1. and if the sum (a, b) is more than 0.8, the collection of the plastic particle stacking image data is completed, otherwise, the collection of the plastic particle stacking image data is continuously executed, and when the collection of the plastic particle stacking image data is continuously executed, the number of the collected plastic particle stacking image data is as follows: the value is rounded further in the normal direction.
The calculation of the formula further provides necessary acquisition logic support for acquiring the plastic particle stacking image data, and further limits the construction quantity of the plastic particle stacking model based on the acquisition of the plastic particle stacking image data, so that necessary logic data support is provided for analysis logic of plastic particle processing risks, stable calculation of the plastic particle processing risk performance values is ensured, calculation accuracy of the plastic particle processing risk performance values is further limited based on the logic support, finally, a limiting effect is brought to the accuracy of a final judging result of the method, the execution of the method can be matched with the operation of film processing equipment, and the method is more robust and efficient in application.
In summary, in the method in the foregoing embodiment, during execution, analysis data is provided based on collection of image data of plastic particles used for processing a film, and the plastic particles processed in real time by the film processing apparatus are determined, so that whether the plastic particle state processed by the film processing apparatus is suitable for forming a film is identified based on a determination result, and finally, the film processing apparatus is regulated and controlled according to the identification result, and further configuration of regulation logic is performed, so that the plastic particle state processed by the film processing apparatus in operation can be matched with forming of the plastic film to a higher degree, thereby guaranteeing the qualification rate of the film finished product produced by the film processing apparatus; in the execution process of the method, in the acquisition stage of plastic particle image data, designated image acquisition logic is configured, a plastic particle stacking model is further constructed based on the acquired plastic particle image data, the plastic particle stacking model is further used as a data reference, judgment of the qualified state of plastic particles is assisted, the method is ensured to be more accurate in judging the qualified state of the plastic particles, and furthermore, the method is further improved in the mode that the yield of finished plastic films produced by the film processing equipment is higher and the quality is better under the configuration of the operation state of the film processing equipment.
The above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (5)
1. The processing temperature regulation and control method based on data processing is characterized by comprising the following steps of:
collecting plastic particle stacking image data placed on film processing equipment, constructing a plastic particle stacking model based on the plastic particle stacking image data, and analyzing plastic particle processing risks by using the plastic particle stacking model;
Acquiring a plastic particle stacking image placed on the film processing equipment, driving the film processing equipment to tamp and heat plastic particles, acquiring the plastic particle image which is completely tamped and heated on the film processing equipment, and analyzing the difference between the plastic particle image and the plastic particle stacking image;
Setting a temperature regulation logic of the film processing equipment, receiving a difference analysis result of the plastic particle image and the plastic particle stacking image, and carrying out adaptive regulation of the temperature of the film processing equipment by combining the difference analysis result and the temperature regulation logic of the film processing equipment;
After the plastic particle stacking image data is collected, the plastic particle stacking image data collected from the front upper view angle or the front lower view angle is configured with other groups of plastic particle stacking image data collected from the side view angle, the plastic particle stacking image data configured in each group is applied to construct a plastic particle stacking model, and the plastic particle stacking model construction logic comprises the following steps:
Step1: extracting plastic particle stacking contour images in two groups of mutually configured plastic particle stacking image data, and rotating the center of the plastic particle stacking contour images from a right-up or right-down view angle to obtain a rotating contour image;
step2: capturing contour vertices in a plastic particle stacking contour image from a side view perspective;
Step3: constructing a triangle by the diameter of the rotated contour image and the position of the contour vertex in the plastic particle stacking contour image relative to the right-up or right-down viewing angle;
Step4: taking the middle point of the diameter of the rotation contour image as a rotation center to enable the triangle to rotate, and recording a three-dimensional model of the rotation track as a plastic particle stacking model;
The analysis logic of the plastic particle processing risk is expressed as:
Wherein: k is a plastic particle processing risk representation value; q is the number of constructed plastic particle stacking models; v 1 is the concave space volume of the plastic particle stacking image which is acquired for the first time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 2 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 2 nd time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 3 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 3 rd time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model; v 4 is the volume of a concave space which is formed by the plastic particle stacking image which is acquired for the 4 th time and is derived from the side view angle and corresponds to the top of the plastic particle stacking model;
when the differential analysis of the plastic particle images and the plastic particle stacking images is executed, the plastic particle stacking images are used, namely, plastic particle stacking image data with the viewing angle being the right upper or right lower viewing angle is acquired, and when the plastic particle images are acquired, the plastic particle stacking images are acquired based on the plastic particle stacking image acquisition viewing angle used during the differential analysis;
the logic for analyzing the difference between the plastic particle image and the plastic particle stacking image is expressed as follows:
Wherein: diff (u, v) is the difference between the plastic particle image u and the plastic particle stacked image v; k is the number of pixels of the image in the x-axis direction in the plane; p (γ, τ, d, θ) is an element value corresponding to the γ -th row and τ -th column in the gradation co-occurrence matrix; gamma and tau are the rows and columns of the image; θ is the generation direction of the gray level co-occurrence matrix; g is the number of image pixels in the plastic particle image and the plastic particle stacking image; p c and pc' are respectively the histogram data of the plastic particle image and the plastic particle stacking image;
wherein, Representing the inverse moment of the plastic particle image u,/>Representing the inverse moment of the plastic particle stacking image v;
the film processing equipment temperature regulation logic comprises: setting a qualification judgment threshold value, setting a temperature regulation proportion and setting a temperature regulation upper limit;
When the temperature regulation proportion is 0.5 and 1℃, the upper limit of temperature regulation is 5 ℃, and the difference between the plastic particle image and the plastic particle stacking image is not in a qualification judging threshold value, the film processing equipment further heats the plastic particles at the frequency of 0.5 ℃/5s, otherwise, the film processing equipment is ended to tamper and heat the plastic particles, and the film processing equipment is ended to tamper and heat the plastic particles, so that the film processing equipment is adaptive to regulate and control the temperature of the film processing equipment.
2. The method for regulating and controlling processing temperature based on data processing according to claim 1, wherein the collecting view angle comprises: a front upper or lower visual angle, any two groups and more side visual angles, wherein when the side visual angle is used for collecting the plastic particle stacking image data, a straight line in the collecting direction of the side visual angle is parallel to the plastic particle stacking surface, and when the front upper or lower visual angle is used for collecting the plastic particle stacking image data, the straight line in the collecting direction of the front upper or lower visual angle is perpendicular to the plastic particle stacking surface;
the film processing equipment is integrated by a material-discharging station, a heating station and a calendaring station, wherein the material-discharging station is used for discharging plastic particles, the heating station is used for heating the plastic particles discharged by the material-discharging station, so that the plastic particles are melted, the calendaring station is used for ramming the melted plastic particles, and the melted plastic particles are pressed into plastic films with uniform thickness.
3. The method for regulating and controlling processing temperature based on data processing according to claim 2, wherein in the stage of collecting plastic particle stacking image data, firstly, collecting plastic particle stacking image data of a front upper view or a front lower view, then collecting two groups of plastic particle stacking image data of any side view, further analyzing similarity of the two groups of plastic particle stacking image data of the side view, and based on a result of similarity analysis, deciding whether to execute collection of plastic particle stacking image data of the side view again, wherein similarity analysis logic of the plastic particle stacking image data is expressed as:
Wherein: sim (a, b) is the similarity of the plastic particle stacked image data a and the plastic particle stacked image data b; n is a collection of element types in the plastic particle stacked image data; f a-q is the frequency of occurrence of the q-th element in the plastic particle stacked image data a; f b-q is the frequency of occurrence of the q-th element in the plastic particle stacked image data b; m is the number of cells of the histogram corresponding to the plastic particle stacking image data; ap is the number of pixels in the p-th cell of the histogram corresponding to the plastic particle stacking image data a; b p is the number of pixels in the p-th cell of the histogram corresponding to the plastic particle stacking image data b; (a p,bp) represents the number of pixels intersected by ap and bp;
wherein, the f a-q and the f b-q take values to obey M, N is the width and height of the image; i (I, j) is the element I in the image at the (I, j) position; q (x, y) is the position (x, y) where the q element is located in the image.
4. The method for regulating and controlling processing temperature based on data processing according to claim 3, wherein when 1 is greater than or equal to sim (a, b) > 0.8, the collection of plastic particle stacking image data is completed, otherwise, the collection of plastic particle stacking image data is continuously executed, and when the collection of plastic particle stacking image data is continuously executed, the number of collected plastic particle stacking image data is as follows: the value is rounded further in the normal direction.
5. The processing temperature regulation and control method based on data processing according to claim 1, wherein the difference between the plastic particle image and the plastic particle stacked image is not in a qualification judgment threshold, and in the process of further heating the plastic particles by the film processing equipment at a frequency of 0.5 ℃/5s, diff (u, v) is obtained in real time based on a difference analysis logic of the plastic particle image and the plastic particle stacked image, and the Diff (u, v) obtained in real time is synchronously compared with the qualification judgment threshold, and after the Diff (u, v) is in the qualification judgment threshold, the compacting and heating operation of the plastic particles by the film processing equipment is finished;
wherein Diff (u, v) is corrected by applying the plastic grain processing risk representation value k when being compared with the qualification threshold, namely Diff (u, v) x k is compared with the qualification threshold.
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