CN117741267A - Low-cost electromagnetic radiation analysis device and method - Google Patents
Low-cost electromagnetic radiation analysis device and method Download PDFInfo
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Abstract
The invention relates to the field of near field scanning technology and electromagnetic radiation analysis, in particular to a low-cost electromagnetic radiation analysis device and a low-cost electromagnetic radiation analysis method.
Description
Technical Field
The present invention relates to the field of near field scanning technology, and more particularly, to a low cost electromagnetic radiation analysis apparatus and method.
Background
With the rapid development of the front-edge application fields such as 5G communication, intelligent driving, smart phones, high-performance computing and the like, the integration level of circuits is higher and higher, the internal clock frequency and the conversion rate are higher and higher, and the problem of electromagnetic interference (EMI) is also more serious, so that the electromagnetic interference can even cause that an electronic product cannot work normally according to the expectations, and research and development are blocked, thereby influencing the time to market of the product.
The existing near field scanning system utilizes an electric field probe and a magnetic field probe to point-by-point detect electromagnetic fields radiated by devices such as a wireless communication terminal, an integrated circuit, automobile electronics, a chip, a display and the like and products of the whole machine to obtain relative values or absolute values of electric fields and magnetic fields of corresponding test areas so as to analyze electromagnetic radiation interference conditions, can rapidly locate and analyze interference sources on the to-be-tested piece, becomes a powerful tool for electromagnetic interference rectification, has lower equipment configuration and construction cost, and the current EMI near field scanning already becomes a part of international IEC 61967 standard, but corresponds to the EMC authentication regulation requirements of the products, the electromagnetic waves can be completed in an anechoic chamber, and the construction of professional EMC test sites and the purchase of measuring instruments can be completely configured only by a large amount of time, so that a plurality of enterprise units do not have own EMC authentication test laboratories, and the related test rectification of the products can only be carried out by special laboratory units, and the test often needs high test expense and long test period.
The first prior art is: the invention provides an electromagnetic field near field scanning device and a scanning method in the prior patent CN201410178227.5, wherein the scanning device has a simple structure, realizes accurate acquisition of electromagnetic field near field data of an object to be detected through a probe, realizes accurate control of the position of the probe through coordination work of a space moving platform and a computer, accurately monitors the distance between the probe and the object to be detected through a microscopic camera device, and can accurately obtain an electromagnetic field near field scanning result of the object to be detected;
drawbacks of the first prior art: only the near field scan density and accuracy were improved and no data comparison analysis was performed in conjunction with anechoic chamber testing.
And the second prior art is as follows: the prior patent CN202310549847.4 proposes a detection method for acquiring a conductive coupling path based on active learning near field scanning, the method comprising: the method comprises the steps of setting up a near-field scanning detection platform, placing a circuit board to be detected in a microwave darkroom, detecting the circuit board to be detected right above the circuit board to be detected by using the near-field scanning detection platform, obtaining a detection result by using a near-field scanning method based on active learning, obtaining a current near-field distribution diagram on the circuit board to be detected in continuous time according to the detection result, and realizing detection of a conductive coupling path.
Drawbacks of the second prior art: the near field scanning is utilized to actively learn the computer, so that the computer can analyze electromagnetic interference on the circuit board more quickly, but does not combine anechoic chamber data for comparison and analysis.
Disclosure of Invention
The invention provides a low-cost electromagnetic radiation analysis device and a low-cost electromagnetic radiation analysis method for overcoming the problems that the EMC authentication test described in the prior art requires high test expense and long test period.
The present invention aims to solve the above technical problems at least to some extent.
In order to solve the technical problems, the technical scheme of the invention is as follows:
the utility model provides a low-cost electromagnetic radiation analysis device carries out electromagnetic radiation analysis to the circuit board that awaits measuring, includes near field probe, spectrum analyzer, preamplifier, transmission control module and shielding case, places electromagnetic radiation analysis device in the shielding incasement, transmission control module drives near field probe and removes at circuit board surface area that awaits measuring, and the data that near field probe obtained is passed through after the preamplifier amplifies the spectrum analyzer obtains the electromagnetic radiation intensity of each unit in the circuit board surface area that awaits measuring.
Further, the electromagnetic radiation analysis device further comprises an upper computer and a singlechip control circuit, wherein the upper computer is used for controlling the singlechip control circuit to move the transmission module, and the upper computer is used for detecting measurement data obtained by the spectrum analyzer.
Further, the transmission control module comprises a transmission motor and a mechanical arm, the single chip microcomputer control circuit is connected with the transmission motor, the upper computer controls the single chip microcomputer control circuit to control the transmission motor and the mechanical arm to work, the transmission motor is connected with the mechanical arm, and the transmission motor drives the mechanical arm to move in the surface area of the circuit board to be tested.
A low-cost electromagnetic radiation analysis method, which is applied to a low-cost electromagnetic radiation analysis device, comprising the following steps:
s1: obtaining historical far field test data of a circuit board to be tested;
s2: detecting the circuit board to be detected through a near-field probe, and scanning by using the spectrum analyzer to obtain a sweep frequency curve of the circuit board to be detected, so as to obtain near-field test data;
s3: obtaining a comparison rule by analyzing the near-field test data and the historical far-field test data;
s4: analyzing the sweep frequency curve by using the comparison rule to judge whether an over-standard frequency point exists, and if the over-standard frequency point exists, determining the position of an interference source region of the over-standard frequency point; if no standard exceeding frequency point exists, the step S6 is entered;
s5: implementing interference source circuit optimization measures on the interference source region of the out-of-standard frequency point, and returning to the step S2;
s6: and ending the near field test to finish electromagnetic radiation analysis.
Further, in step S1, the step of obtaining the test data of the historical far field of the circuit board to be tested includes configuring the test data of the historical far field of the circuit board to be tested in an upper computer for waiting comparison.
Further, in step S2, the scanning with the spectrum analyzer to obtain a sweep frequency curve includes: setting up the working environment of the circuit board to be tested, adjusting the scanning frequency range of the spectrum analyzer, and obtaining the sweep frequency curve by scanning the circuit board to be tested.
Further, in step S2, the detecting the circuit board to be detected by the near-field probe and scanning to obtain a sweep frequency curve by using a spectrum analyzer includes: and moving the near-field probe on the surface area of the circuit board to be measured, and sequentially measuring each area.
Further, the factors include near field probes, transmission cables, spectrum analyzers, preamplifiers, circuit boards to be tested, means of data post-processing, and test environment.
Further characterized in that the interferer circuit optimization measure includes determining factors that produce differences in the near-field and far-field test data, and calibrating the factors, including:
when the gain parameter of the near-field probe is different from the gain parameter of the standard logarithmic antenna, respectively metering and calibrating the gain parameter of the near-field probe and the gain parameter of the standard logarithmic antenna;
when the transmission cable in the near-field measurement system is different from the transmission cable of the standard darkroom system, measuring and calibrating factors of the transmission cable and the transmission cable of the standard darkroom system respectively, and eliminating the difference of the transmission cables of the two measurement systems;
when the measurement state of the circuit board to be measured is inconsistent or the working state is unstable, the standard signal generator can be adopted to measure and compare the circuit board to be measured, so that the unstable factors of the circuit board to be measured are eliminated;
when the measurement of a spectrum analyzer used in near-field measurement and a receiver used in a standard darkroom are different, respectively calibrating the spectrum analyzer and the receiver of the standard darkroom or simultaneously measuring by using the spectrum analyzer or the receiver, thereby improving the measurement consistency;
when the pre-amplifier used in the near field measurement is different from the pre-amplifier used in the standard darkroom in different types or parameters, the pre-amplifier in the near field measurement and the pre-amplifier in the standard darkroom are respectively subjected to measurement calibration or the same pre-amplifier is used;
when the electromagnetic field level measured by the near field and the measured data of the darkroom are different, adopting a data post-processing mode to carry out fitting analysis on the electromagnetic field level measured by the near field and the measured data of the darkroom, and analyzing the difference of electromagnetic environments and measurement results of the near field measurement and the darkroom measurement through a large amount of data;
when the conventional environment of near field measurement and the darkroom environment have great difference, the near field measurement environment is modified, and a simple shielding environment is constructed or external environment noise is removed for measurement.
Further, in step S6, when the test data meets the preset standard, the near field test is ended, including: and when the result of the far field test obtained by the near field test data through the comparison rule meets the preset standard, ending the near field test.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that:
the invention combines the low-cost high-efficiency method of near-field scanning technology with the high-cost low-efficiency method of EMC authentication test of corresponding products, optimizes and perfects the method, obtains the approximate relation between the anechoic chamber test data and the near-field scanning test data by performing a large amount of comparison and fitting, combines the actual electromagnetic interference problem positioning and the correction optimization knowledge of the actual circuit of the product to form the reliable low-cost near-field scanning analysis problem positioning and correction reverse derivation anechoic chamber test result, and the product is formally tested in the anechoic chamber after implementing the interference source circuit optimization measures, thereby saving the cost and improving the research and development efficiency.
Drawings
FIG. 1 is a schematic diagram of a low cost electromagnetic radiation analysis apparatus according to the present invention;
FIG. 2 is a schematic diagram of a low-cost electromagnetic radiation analysis apparatus according to the present embodiment;
FIG. 3 is a schematic diagram of an electromagnetic radiation analysis apparatus according to the present embodiment;
FIG. 4 is a flow chart of a low cost electromagnetic radiation analysis method according to the present invention;
FIG. 5 is a flow chart of a low cost electromagnetic radiation analysis method according to the present embodiment;
FIG. 6 is a diagram of 30MHz-300MHz spectrum far field measurement data of the comb signal generator in a standard 3 meter anechoic chamber according to the present embodiment;
fig. 7 is a diagram of 30MHz-300MHz spectrum measurement data of the comb signal generator according to the present embodiment under a near field measurement device;
FIG. 8 is a diagram showing the far field measurement data of the comb signal generator of the present embodiment in a standard 3 m anechoic chamber at 300MHz-1000MHz frequency spectrum;
fig. 9 is a diagram showing 300MHz-1000MHz spectrum measurement data of the comb signal generator according to the present embodiment under a near field measurement device;
fig. 10 is a radiation pattern of a comb signal generator board according to the present embodiment.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the present patent;
for the purpose of better illustrating the embodiments, certain elements of the drawings may be omitted, enlarged or reduced and do not represent the actual product dimensions;
it will be appreciated by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical scheme of the invention is further described below with reference to the accompanying drawings and examples.
Example 1
The utility model provides a low-cost electromagnetic radiation analysis device carries out electromagnetic radiation analysis to the circuit board that awaits measuring, as shown in fig. 1, includes near field probe, spectrum analyzer, preamplifier, transmission control module and shielded cell, places electromagnetic radiation analysis device in the shielded cell, transmission control module drives near field probe and removes at circuit board surface area that awaits measuring, and the data that near field probe obtained is passed through after the preamplifier amplifies the spectrum analyzer obtains the electromagnetic radiation intensity of each unit in the circuit board surface area that awaits measuring.
The user can control the spectrometer to set the measurement parameters and monitor the measurement data through the upper computer, and can control the singlechip control circuit, place the electromagnetic radiation analysis device in the small shielding box, determine the test area, transform the relative position of the near-field probe and the circuit board to be tested, and the near-field probe is connected with the spectrum analyzer through the preamplifier, and transmit the acquired data to the spectrum analyzer to obtain the electromagnetic radiation intensity of each unit in the surface area of the circuit board to be tested.
Example 2
The present embodiment continues to disclose the following on the basis of embodiment 1:
the electromagnetic radiation analysis device also comprises an upper computer and a singlechip control circuit, wherein the upper computer controls the transmission control module through the singlechip control circuit, and the upper computer detects measurement data obtained by the spectrum analyzer.
In the specific implementation process, as shown in fig. 2 and 3, a user detects an object to be detected through a mechanical arm connected with a near-field probe, data detected by the near-field probe is amplified by a preamplifier and then input into a spectrum analyzer, the spectrum analyzer scans to obtain a sweep frequency curve, and the sweep frequency curve is transmitted to an upper computer.
The transmission control module comprises a transmission motor and a mechanical arm, the single chip microcomputer control circuit is connected with the transmission motor, the upper computer controls the single chip microcomputer control circuit to control the transmission motor and the mechanical arm to work, the transmission motor is connected with the mechanical arm, and the transmission motor drives the mechanical arm to move in the surface area of the circuit board to be tested.
The user can control the spectrometer to set measurement parameters and monitor measurement data through the upper computer, and can control the singlechip control circuit to operate the three-dimensional mobile bracket, the relative positions of the near-field probe and the measured object are changed through the transmission motor, and the near-field probe is connected with the spectrum analyzer through the preamplifier, so that the acquired data are transmitted to the preamplifier and then transmitted to the spectrum analyzer.
Example 3
This example continues to disclose the following on the basis of examples 1 and 2:
as shown in fig. 4, the electromagnetic radiation analysis method is applied to a low-cost electromagnetic radiation analysis device, and the electromagnetic radiation analysis method comprises the following steps:
s1: obtaining historical far field test data of a circuit board to be tested;
s2: detecting the circuit board to be detected through a near-field probe, and scanning by using the spectrum analyzer to obtain a sweep frequency curve of the circuit board to be detected, so as to obtain near-field test data;
s3: obtaining a comparison rule by analyzing the near-field test data and the historical far-field test data;
s4: analyzing the sweep frequency curve by using the comparison rule to judge whether an over-standard frequency point exists, and if the over-standard frequency point exists, determining the position of an interference source region of the over-standard frequency point; if no standard exceeding frequency point exists, the step S6 is entered;
s5: implementing interference source circuit optimization measures on the interference source region of the out-of-standard frequency point, and returning to the step S2;
s6: and ending the near field test to finish electromagnetic radiation analysis.
In the specific implementation process, as shown in fig. 5, step one: collecting far-field radiation test data of products which do not pass far-field tests, and configuring and comparing with an upper computer;
step two: starting near field test, placing a product to be tested in a small shielding box, and determining a test area;
step three: setting up a working environment of a product to be tested, adjusting a scanning frequency range of a spectrum analyzer and setting parameters of the spectrum analyzer;
step four: respectively moving an electromagnetic field probe in a circuit board surface area of a product to be detected, and sequentially measuring each circuit unit to obtain the radiation electromagnetic field intensity of each unit area in the circuit board surface area;
step five: analyzing and positioning an interference source through the test data, screening out the amplitude of the exceeding frequency point and comparing with far-field test data;
step six: implementing interference source circuit optimization measures on products which do not pass far-field tests;
step seven: performing near field test again, observing whether an over-standard frequency point exists or not, and ending the near field test if the over-standard frequency point does not exist;
step eight: performing far field test on the product subjected to the near field test in the step eight;
step nine: if the far field test is not met, implementing interference source circuit optimization measures again on the product;
step ten: and D, performing far-field test on the product in the step nine, and ending the far-field test if the far-field test passes.
The interference source position corresponding to the out-of-standard frequency point is quickly found by combining near field measurement, fitting comparison can be carried out on far field data and near field data through a large amount of test data, and a corresponding rule between the near field test data and the far field test data is found, so that the function of replacing far field test by near field test in the approximate direction can be formed, the test cost is greatly saved, and the product research and development efficiency is improved.
In step S1, the step of obtaining the test data of the historical far field of the circuit board to be tested includes configuring the test data of the historical far field of the circuit board to be tested in an upper computer for waiting comparison.
In step S2, the scanning with the spectrum analyzer to obtain a sweep frequency curve includes: setting up the working environment of the circuit board to be tested, adjusting the scanning frequency range of the spectrum analyzer, and obtaining the sweep frequency curve by scanning the circuit board to be tested.
In step S2, the detecting the circuit board to be detected by the near-field probe and scanning to obtain a sweep frequency curve by using a spectrum analyzer includes: and moving the near-field probe on the surface area of the circuit board to be measured, and sequentially measuring each area.
The factors include a near field probe, a transmission cable, a spectrum analyzer, a preamplifier, a circuit board to be tested, a mode of data post-processing and a test environment.
The interference source circuit optimization measure comprises determining factors generating differences in test data of a near field and a far field, and calibrating the factors, wherein the factors comprise:
when the gain parameter of the near-field probe is different from the gain parameter of the standard logarithmic antenna, respectively metering and calibrating the gain parameter of the near-field probe and the gain parameter of the standard logarithmic antenna;
when the transmission cable in the near-field measurement system is different from the transmission cable of the standard darkroom system, measuring and calibrating factors of the transmission cable and the transmission cable of the standard darkroom system respectively, and eliminating the difference of the transmission cables of the two measurement systems;
when the measurement state of the circuit board to be measured is inconsistent or the working state is unstable, the standard signal generator can be adopted to measure and compare the circuit board to be measured, so that the unstable factors of the circuit board to be measured are eliminated;
when the measurement of a spectrum analyzer used in near-field measurement and a receiver used in a standard darkroom are different, respectively calibrating the spectrum analyzer and the receiver of the standard darkroom or simultaneously measuring by using the spectrum analyzer or the receiver, thereby improving the measurement consistency;
when the pre-amplifier used in the near field measurement is different from the pre-amplifier used in the standard darkroom in different types or parameters, the pre-amplifier in the near field measurement and the pre-amplifier in the standard darkroom are respectively subjected to measurement calibration or the same pre-amplifier is used;
when the electromagnetic field level measured by the near field and the measured data of the darkroom are different, adopting a data post-processing mode to carry out fitting analysis on the electromagnetic field level measured by the near field and the measured data of the darkroom, and analyzing the difference of electromagnetic environments and measurement results of the near field measurement and the darkroom measurement through a large amount of data;
when the conventional environment of near field measurement and the darkroom environment have great difference, the near field measurement environment is modified, and a simple shielding environment is constructed or external environment noise is removed for measurement.
In step S6, the ending the near field test, completing electromagnetic radiation analysis, includes: and when the result of the far field test obtained by the near field test data through the comparison rule meets the preset standard, ending the near field test.
Example 4
This example continues to disclose the following on the basis of examples 1, 2 and 3:
in a specific implementation process, as shown in fig. 6, performing far field test on a circuit board to be tested includes: the comb signal generator uses 30MHz-300MHz frequency spectrum measuring data of standard 3 m method in anechoic chamber, the horizontal line represents standard limit value, the vertical line represents product measuring frequency spectrum diagram, the point connected with the broken line is the standard point judged by computer, and the amplitude and frequency of a certain frequency point can be displayed.
As shown in fig. 7, performing near field testing on a circuit board to be tested using a near field probe includes: the comb signal generator is used for 30MHz-300MHz spectrum measurement data under the near field measurement device.
As shown in fig. 8, performing far field testing on a circuit board to be tested includes: the comb signal generator measures data in the 300MHz-1000MHz spectrum in a standard 3 meter anechoic chamber,
as shown in fig. 9, performing near field testing on a circuit board to be tested using a near field probe includes: 300MHz-1000MHz frequency spectrum measurement data of comb signal generator under near field measurement device
By comparing fig. 8 and fig. 9, a computer is used for fitting a large amount of data, and the data difference rule of two different measurement modes is simulated, so that the data of far field measurement in a standard anechoic chamber is deduced through low-cost near field measurement, as shown in fig. 10, visual two-dimensional images can be obtained by carrying out data processing on different amplitudes of different points in the near field test, and the position of an interference source region of an out-of-standard frequency point can be rapidly and accurately positioned.
The same or similar reference numerals correspond to the same or similar components;
the terms describing the positional relationship in the drawings are merely illustrative, and are not to be construed as limiting the present patent;
it is to be understood that the above examples of the present invention are provided by way of illustration only and not by way of limitation of the embodiments of the present invention. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the invention are desired to be protected by the following claims.
Claims (10)
1. The low-cost electromagnetic radiation analysis device is characterized by comprising a near-field probe, a spectrum analyzer, a preamplifier, a transmission control module and a shielding box, wherein the electromagnetic radiation analysis device is placed in the shielding box, the transmission control module drives the near-field probe to move in the surface area of the circuit board to be tested, and data acquired by the near-field probe are amplified by the preamplifier and then are input into the spectrum analyzer, so that the electromagnetic radiation intensity of each unit in the surface area of the circuit board to be tested is obtained.
2. The low-cost electromagnetic radiation analysis device according to claim 1, further comprising an upper computer and a single-chip microcomputer control circuit, wherein the upper computer controls the transmission control module through the single-chip microcomputer control circuit, and the upper computer detects measurement data obtained by the spectrum analyzer.
3. The low-cost electromagnetic radiation analysis device according to claim 2, wherein the transmission control module comprises a transmission motor and a mechanical arm, the single-chip microcomputer control circuit is connected with the transmission motor, the upper computer controls the single-chip microcomputer control circuit to control the transmission motor and the mechanical arm to work, the transmission motor is connected with the mechanical arm, and the transmission motor drives the mechanical arm to move in the surface area of the circuit board to be tested.
4. A low-cost electromagnetic radiation analysis method, characterized in that the electromagnetic radiation analysis method is applied to a low-cost electromagnetic radiation analysis apparatus as claimed in any one of claims 1 to 3, the electromagnetic radiation analysis method comprising the steps of:
s1: obtaining historical far field test data of a circuit board to be tested;
s2: detecting the circuit board to be detected through a near-field probe, and scanning by using the spectrum analyzer to obtain a sweep frequency curve of the circuit board to be detected, so as to obtain near-field test data;
s3: obtaining a comparison rule by analyzing the near-field test data and the historical far-field test data;
s4: analyzing the sweep frequency curve by using the comparison rule to judge whether an over-standard frequency point exists, and if the over-standard frequency point exists, determining the position of an interference source region of the over-standard frequency point; if no standard exceeding frequency point exists, the step S6 is entered;
s5: implementing interference source circuit optimization measures on the interference source region of the out-of-standard frequency point, and returning to the step S2;
s6: and ending the near field test to finish electromagnetic radiation analysis.
5. The method for analyzing electromagnetic radiation according to claim 4, wherein in step S1, the step of obtaining the test data of the historical far field of the circuit board to be tested includes configuring the test data of the historical far field of the circuit board to be tested in a host computer for waiting comparison.
6. The method of claim 4, wherein in step S2, the scanning with the spectrum analyzer to obtain the sweep curve comprises: setting up the working environment of the circuit board to be tested, adjusting the scanning frequency range of the spectrum analyzer, and obtaining the sweep frequency curve by scanning the circuit board to be tested.
7. The method according to claim 4, wherein in step S2, the detecting the circuit board to be tested by the near field probe and scanning to obtain the sweep frequency curve by using the spectrum analyzer comprises: and moving the near-field probe on the surface area of the circuit board to be measured, and sequentially measuring each area.
8. The method of claim 4, wherein the source circuit optimization includes determining factors that produce differences in near field and far field test data, the factors including near field probes, transmission cables, spectrum analyzers, preamplifiers, circuit boards under test, means of data post processing, and test environment.
9. A method of low cost electromagnetic radiation analysis according to claim 8, wherein calibrating the factors that produce the differences comprises:
when the gain parameter of the near-field probe is different from the gain parameter of the standard logarithmic antenna, respectively metering and calibrating the gain parameter of the near-field probe and the gain parameter of the standard logarithmic antenna;
when the transmission cable in the near-field measurement system is different from the transmission cable of the standard darkroom system, measuring and calibrating factors of the transmission cable and the transmission cable of the standard darkroom system respectively, and eliminating the difference of the transmission cables of the two measurement systems;
when the measurement state of the circuit board to be measured is inconsistent or the working state is unstable, the standard signal generator can be adopted to measure and compare the circuit board to be measured, so that the unstable factors of the circuit board to be measured are eliminated;
when the measurement of a spectrum analyzer used in near-field measurement and a receiver used in a standard darkroom are different, respectively calibrating the spectrum analyzer and the receiver of the standard darkroom or simultaneously measuring by using the spectrum analyzer or the receiver, thereby improving the measurement consistency;
when the pre-amplifier used in the near field measurement is different from the pre-amplifier used in the standard darkroom in different types or parameters, the pre-amplifier in the near field measurement and the pre-amplifier in the standard darkroom are respectively subjected to measurement calibration or the same pre-amplifier is used;
when the electromagnetic field level measured by the near field and the measured data of the darkroom are different, adopting a data post-processing mode to carry out fitting analysis on the electromagnetic field level measured by the near field and the measured data of the darkroom, and analyzing the difference of electromagnetic environments and measurement results of the near field measurement and the darkroom measurement through a large amount of data;
when the conventional environment of near field measurement and the darkroom environment have great difference, the near field measurement environment is modified, and a simple shielding environment is constructed or external environment noise is removed for measurement.
10. The method according to claim 4, wherein in step S6, the ending the near field test, completing the electromagnetic radiation analysis, comprises: and when the result of the far field test obtained by the near field test data through the comparison rule meets the preset standard, ending the near field test.
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| CN202311779549.0A CN117741267A (en) | 2023-12-20 | 2023-12-20 | Low-cost electromagnetic radiation analysis device and method |
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| CN202311779549.0A CN117741267A (en) | 2023-12-20 | 2023-12-20 | Low-cost electromagnetic radiation analysis device and method |
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