CN117739865A - Verticality measuring method and device - Google Patents
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- CN117739865A CN117739865A CN202311835005.1A CN202311835005A CN117739865A CN 117739865 A CN117739865 A CN 117739865A CN 202311835005 A CN202311835005 A CN 202311835005A CN 117739865 A CN117739865 A CN 117739865A
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Abstract
The invention discloses a verticality measuring method and device. The method for measuring the perpendicularity of the pitching axis and the azimuth axis of the turntable to be measured comprises the following steps: adjusting the angles of the first autocollimator and the reflecting mirror on the turntable to be tested, enabling the first autocollimator to be self-aligned with the reflecting mirror, and enabling the mirror surface of the reflecting mirror to be perpendicular to the pitching axis of the turntable to be tested; rotating an azimuth axis of the turntable to be tested, and adjusting the angle of the flat crystal to enable the first autocollimator to be self-aligned with the flat crystal; adjusting the angle of the second autocollimator to enable the second autocollimator to be self-aligned with the flat crystal; rotating the pitching shaft when the azimuth shaft is positioned at different positions, and recording the measurement imaging position of the light spot on the scale reticle after each rotation; and calculating the verticality of a pitching axis and an azimuth axis of the turntable to be tested. By constructing a test environment, the measurement imaging positions generated by the turntable at different positions are recorded, so that the parallel of the emergent light beam and the axis of the pitching axis in the recording process is ensured, and the measurement accuracy is improved.
Description
Technical Field
The invention relates to the technical field of optical instrument detection, in particular to a verticality measuring method and device.
Background
The photoelectric tracking system can quickly find the target and lock the identified target, so that accurate tracking is realized. With the development of technology, the photoelectric tracking equipment is widely applied to various engineering technical fields such as aviation investigation communication, ground laser equipment, industrial monitoring devices and the like. The photoelectric tracking system can be used as a mounting table-board of equipment to drive the optical load to perform azimuth and pitching motions, so as to realize the searching, capturing and tracking of the target. The direction and pitch axis perpendicularity of the turntable directly affect the pointing accuracy of the optical load, so that the axis perpendicularity of the turntable needs to be measured.
The existing measuring method generally uses an autocollimator and a reflecting mirror, the autocollimator is placed at one end of a turntable, collimated light beams are emitted to the turntable, and the autocollimator is matched with the reflecting mirror at the other end of the autocollimator to verify the reflected light spot positions, so that verticality is measured.
However, in the process of implementing the technical scheme of the invention in the embodiment of the application, the inventor of the application finds that at least the following technical problems exist in the above technology: the conventional measuring method only measures verticality through the cooperation of one autocollimator and one reflecting mirror, so that the deviation of a measuring result is large and cannot be verified, and the accuracy of the measuring result cannot be ensured.
Disclosure of Invention
In view of the above problems, the embodiment of the invention solves the technical problem of lower accuracy of a measurement result caused by single measurement equipment in the prior art by providing the verticality measurement method and the verticality measurement device, and achieves the technical effect of ensuring the accuracy of the measurement result.
The embodiment of the application provides a verticality measuring method and device.
In a first aspect, the present invention provides a method for measuring verticality between a pitch axis and an azimuth axis of a turntable to be measured, including the steps of:
the method for measuring the perpendicularity of the pitching axis and the azimuth axis of the turntable to be measured comprises the following steps:
resetting an azimuth axis of the turntable to be tested, adjusting angles of a first autocollimator and a reflecting mirror on the turntable to be tested, enabling the first autocollimator to be self-aligned with the reflecting mirror, enabling a mirror surface of the reflecting mirror to be perpendicular to a pitching axis of the turntable to be tested, and enabling the first autocollimator to comprise a scale division plate for recording positions of light spots;
resetting a pitching axis of the turntable to be detected, rotating an azimuth axis of the turntable to be detected, and adjusting the angle of the flat crystal to enable the first autocollimator to be self-aligned with the flat crystal;
adjusting the angle of a second autocollimator so that the second autocollimator is self-aligned with the flat crystal;
rotating the pitching shaft when the azimuth shaft is positioned at different positions, and recording the measurement imaging position of the light spot on the scale reticle after each rotation;
and calculating the perpendicularity of the pitching axis and the azimuth axis of the turntable to be measured according to the measurement imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale division plate.
Further, resetting the azimuth axis of the turntable to be measured, adjusting the angles of the first autocollimator and the reflecting mirror on the turntable to be measured, enabling the first autocollimator to be self-aligned with the reflecting mirror, enabling the mirror surface of the reflecting mirror to be perpendicular to the pitching axis of the turntable to be measured, and comprising:
the turntable to be tested is in threaded connection with an adjusting bracket and is placed on an optical platform, the turntable to be tested is placed between the first autocollimator and the second autocollimator, and the reflecting mirror is placed on the adjusting bracket;
the angle of the reflecting mirror is adjusted, so that the reflecting mirror surface of the reflecting mirror is perpendicular to the pitching axis of the turntable to be tested;
and locking an azimuth axis of the turntable to be detected, rotating a pitching axis of the turntable to be detected, and adjusting the angle of the first autocollimator to enable the original light spot of the first autocollimator to coincide with the light spot passing through the reflecting mirror.
Further, resetting the pitch axis of the turntable to be measured, rotating the azimuth axis of the turntable to be measured, adjusting the angle of the flat crystal to enable the first autocollimator to be self-aligned with the flat crystal, and the method comprises the following steps:
resetting the pitching shaft of the turntable to be tested;
the azimuth axis is rotated by 90 degrees, and the collimated light beam emitted by the first autocollimator is reflected to the first autocollimator through the flat crystal;
and adjusting the angle of the flat crystal so that the primary light spot of the first autocollimator coincides with the light spot passing through the flat crystal.
Further, adjusting the angle of the second autocollimator so that the second autocollimator is self-aligned with the flat crystal, comprising:
and the angle of the second autocollimator is adjusted, so that a primary light spot of the second autocollimator coincides with a light spot after the primary light spot passes through the plane crystal, and an emergent light beam of the second autocollimator is close to the pitching axis and parallel to an emergent light beam of the first autocollimator.
Further, rotating the pitch axis when the azimuth axis is at different positions, recording a measured imaging position of the light spot on the scale reticle after each rotation, including:
resetting the azimuth axis of the turntable to be tested, rotating the pitching axis for eight times sequentially at an angle of 45 degrees, and recording the measurement imaging position of the light spot on the scale reticle after each rotation;
and rotating the azimuth axis system by 180 degrees, sequentially rotating the pitching axis by 45 degrees for eight times, and recording the measurement imaging position of the light spot on the scale reticle after each rotation.
Further, according to the measurement imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale reticle, calculating the perpendicularity between the pitching axis and the azimuth axis of the turntable to be measured comprises:
taking the horizontal rightward direction of the scale reticle as the X direction, recording sixteen rotations, wherein the measured imaging positions of the light spots on the scale reticle are respectively theta 1 、θ 2 、θ 3 、θ 4 、θ 5 、θ 6 、θ 7 、θ 8 、θ′ 1 、θ′ 2 、θ′ 3 、θ′ 4 、θ′ 5 、θ′ 6 、θ′ 7 、θ′ 8 ；
According to the formulaCalculating the verticality between the pitching axis and the azimuth axis of the turntable to be tested;
wherein V is i Indicating that the azimuth axis and the pitch axis are at θ i And theta i+4 Is perpendicular to the relative position of the frame.
In a second aspect, the present invention also provides a perpendicularity measuring apparatus for measuring perpendicularity between a pitch axis and an azimuth axis of a turntable to be measured according to a perpendicularity measuring method, the perpendicularity measuring apparatus comprising:
the first autocollimator and the second autocollimator are oppositely arranged at two sides of the turntable to be tested and are both arranged on an optical platform, and the optical platform comprises an objective light pipe component and a micrometer eyepiece component, wherein the objective light pipe component emits a collimated light beam, and an imaging reticle is arranged in the micrometer eyepiece component;
the adjusting bracket is in threaded connection with the turntable to be tested;
a reflecting mirror placed on the adjustment bracket;
the azimuth frame is parallel to an azimuth axis of the turntable to be tested and is screwed on the turntable to be tested;
and the flat crystal is placed on the optical platform and is positioned between the turntable to be tested and the second autocollimator.
Further, the reflecting mirror is a double-sided reflecting mirror.
Further, the flat crystals are parallel flat crystals.
One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:
1) The angle between the first autocollimator, the second autocollimator and the reflecting mirror is adjusted to ensure that the collimated light beams emitted by the first autocollimator and the first autocollimator are parallel to the pitching axis so as to record the measurement imaging positions generated by the turntable at different positions, thereby judging the perpendicularity between the pitching axis and the azimuth axis of the turntable to be measured, ensuring that the emergent light beams are parallel to the pitching axis in the recording process, and improving the measurement accuracy.
2) When the pitch axis is rotated eight times with the azimuth axis at 0 degrees and 180 degrees, respectively, at least sixteen spot positions can be obtained, and an approximate circle and a center of a circle formed by the spot can be determined by the at least sixteen spot positions. The rotation angle of the fairy can be adopted for each rotation, and the rotation angles can be different. In addition, the more the rotation times, the more the spot positions are obtained, and thus the more accurate the center of the approximate circle formed by the spot. And therefore, the perpendicularity between the azimuth axis and the pitching axis obtained through calculation is more accurate.
Drawings
FIG. 1 is a flow chart of a method for measuring verticality according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a verticality measurement device according to an embodiment of the present invention;
FIG. 3 is a flow chart of a method for adjusting a first autocollimator and a mirror according to an embodiment of the present invention;
FIG. 4 is a flowchart of a method for adjusting an angle of an amorphous silicon wafer according to an embodiment of the present invention;
FIG. 5 is a flow chart of a method for adjusting a second auto-collimator according to an embodiment of the present invention;
FIG. 6 is a flowchart of a method for recording measurement imaging positions according to an embodiment of the present invention;
FIG. 7 is a flowchart of a method for calculating perpendicularity between a pitch axis and an azimuth axis according to an embodiment of the present invention;
Detailed Description
The invention is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present invention are shown in the drawings.
Fig. 1 is a flowchart of a method for measuring verticality provided by an embodiment of the present invention, and fig. 2 is a schematic structural diagram of a device for measuring verticality provided by an embodiment of the present invention, and referring to fig. 1 and fig. 2, the method for measuring verticality between a pitch axis 3 and an azimuth axis of a turntable to be measured specifically includes:
s110, resetting the azimuth axis of the turntable to be tested, adjusting the angles of the first autocollimator 1 and the reflecting mirror 2 on the turntable to be tested, enabling the first autocollimator 1 to be self-aligned with the reflecting mirror 2, enabling the mirror surface of the reflecting mirror 2 to be perpendicular to the pitching axis 3 of the turntable to be tested, wherein the first autocollimator 1 comprises a scale division plate used for recording the positions of light spots.
The working principle of the auto-collimator is that the object lens light pipe component is utilized to emit a collimated light beam, the collimated light beam forms a reflected light beam on the reflecting surface, and the light spot position of the reflected light beam on the scale reticle in the micrometer eyepiece component is detected to determine the levelness of the reflecting surface. Specifically, the first autocollimator 1 focuses on the scale reticle through the micrometer eyepiece part to form a light spot, and if the light spot coincides with the origin of the scale reticle, the mirror surface level of the reflecting mirror 2 is described; if the light spot deviates from the origin of the dividing line of the scale, it is indicated that the mirror surface of the reflecting mirror 2 has a plane inclination angle, so that the mirror surface of the reflecting mirror 2 is perpendicular to the pitching axis 3 of the turntable to be measured by adjusting the angle of the reflecting mirror 2, and the first autocollimator 1 is self-aligned with the reflecting mirror 2 by adjusting the angle of the first autocollimator 1, so that the collimated light beam emitted by the first autocollimator 1 is ensured to be parallel to the pitching axis 4.
S120, resetting a pitching axis 3 of the turntable to be tested, rotating an azimuth axis of the turntable to be tested, and adjusting the angle of the flat crystal 6 to enable the first autocollimator 1 to be self-aligned with the flat crystal 6.
In the implementation, firstly, resetting the pitching axis 3 of the turntable to be detected, enabling the pitching axis 3 to be at a 0-degree position, then rotating the azimuth axis by 90 degrees, enabling the straight collimated light beam emitted by the objective light pipe component of the first autocollimator 1 to form a reflected light beam through the flat crystal 6, and detecting the light spot position of the reflected light beam on the scale division plate in the micrometer eyepiece component to determine the levelness of the reflecting surface of the flat crystal 6. Specifically, the first auto-collimator 1 focuses on the scale reticle through the micrometer eyepiece to form a light spot, if the light spot coincides with the origin of the scale reticle, the mirror surface level of the flat crystal 6 is described, in this embodiment, the angle of the first auto-collimator 1 is already adjusted, and by adjusting the flat crystal 6, the mirror surface level of the flat crystal 6 is ensured, so that the angle of the second auto-collimator 7 is adjusted subsequently.
And S130, adjusting the angle of the second autocollimator 7 so that the second autocollimator 7 is self-aligned with the flat crystal 6.
In the implementation, the straight alignment beam emitted by the objective lens light pipe component of the second autocollimator 7 forms a reflected beam through the flat crystal 6, and the second autocollimator 7 is adjusted to enable the second autocollimator 7 to be self-aligned with the flat crystal 6, so that the measurement imaging position after the turntable to be measured rotates is recorded conveniently, and the accuracy of the measurement imaging position is ensured.
And S140, rotating the pitching shaft 3 when the azimuth shaft is at different positions, and recording the measurement imaging position of the light spot on the scale reticle after each rotation.
S150, calculating the perpendicularity of the pitching axis 3 and the azimuth axis of the turntable to be measured according to the measured imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale division plate.
In the implementation, when the azimuth axis is in different angles, the measurement imaging position generated by the pitching axis 3 is transmitted, and the perpendicularity between the pitching axis 3 and the azimuth axis of the turntable to be measured is calculated through the measurement imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale reticle.
According to the technical scheme in the embodiment of the application, the first autocollimator 1, the second autocollimator 7, the reflecting mirror 2 and the plane crystal 6 are adjusted to ensure that the collimated light beams emitted by the first autocollimator 1 and the first autocollimator 1 are parallel to the pitching axis 4 so as to record the measurement imaging positions of the turntable at different positions, so that the perpendicularity of the pitching axis 3 and the azimuth axis of the turntable to be measured is judged, the emergent light beams are parallel to the pitching axis 4 in the recording process, and the measurement accuracy is improved.
In some embodiments, as shown in fig. 3, resetting the azimuth axis of the turntable to be measured, adjusting the angles of the first autocollimator 1 and the mirror 2 on the turntable to be measured, aligning the first autocollimator 1 with the mirror 2, and making the mirror surface of the mirror 2 perpendicular to the pitch axis 3 of the turntable to be measured, includes:
s111, a turntable to be tested is in threaded connection with an adjusting bracket and is placed on an optical platform, the turntable to be tested is placed between a first autocollimator 1 and a second autocollimator 7, and a reflecting mirror 2 is placed on the adjusting bracket;
s112, adjusting the angle of the reflecting mirror 2 to enable the reflecting mirror 2 surface of the reflecting mirror 2 to be perpendicular to the pitching axis 3 of the turntable to be tested;
s113, locking an azimuth axis of the turntable to be detected, rotating a pitching axis 3 of the turntable to be detected, and adjusting the angle of the first autocollimator 1 to enable the original light spot of the first autocollimator 1 to coincide with the light spot passing through the reflecting mirror 2.
In the implementation, first the turntable to be measured is in screw connection with the adjusting bracket, the turntable to be measured is placed on the optical platform and is positioned between the first autocollimator 1 and the second autocollimator 7, the reflecting mirror 2 is placed on the adjusting bracket, and the angle of the reflecting mirror 2 can be adjusted by adjusting the adjusting bracket.
Next, S112 is performed, the angle of the mirror 2 is adjusted so that the mirror surface of the mirror 2 is perpendicular to the pitch axis 3 of the turntable to be measured, so that S113 is performed.
And finally, executing S113, locking the azimuth axis of the turntable to be tested, rotating the pitching axis 3 and the first autocollimator 1 to enable the collimated light beam emitted by the first autocollimator 1 to coincide with the light beam reflected by the reflecting mirror 2, and enabling the original light spot of the first autocollimator 1 to coincide with the light spot after passing through the reflecting mirror 2.
Because the adjusting bracket is in threaded connection with the turntable to be measured, when the pitching shaft 3 rotates on the basis of the threaded connection, the light spots reflected by the reflecting mirror 2 can draw circles (approximate circles) on the scale reticle.
According to the technical scheme in the embodiment of the application, the reflector 2 rotates along with the pitching axis 3 by rotating the pitching axis 3, and the emergent light beam of the first autocollimator 1 is ensured to coincide with the reflected light beam passing through the reflector 2 by rotating the first autocollimator 1, so that the subsequent measurement accuracy is ensured.
In some embodiments, as shown in fig. 4, resetting the pitch axis 3 of the turntable to be measured, rotating the azimuth axis of the turntable to be measured, and adjusting the angle of the flat crystal 6 to align the first autocollimator 1 with the flat crystal 6, includes:
s121, resetting the pitching axis 3 of the turntable to be tested.
S122, rotating the azimuth axis by 90 degrees, and reflecting the collimated light beam emitted by the first autocollimator 1 to the first autocollimator 1 through the flat crystal 6.
And S123, adjusting the angle of the flat crystal 6 to enable the original light spot of the first autocollimator 1 to coincide with the light spot after passing through the flat crystal 6.
In practice, the first autocollimator is self-aligned with the flat crystal 6 by adjusting the flat crystal 6, and the purpose is to build a test environment, so that the positions and angles of the first autocollimator 1, the reflecting mirror 2 and the flat crystal 6 all meet the test environment. Specifically, S121 is executed first, the pitch axis 3 is reset, the pitch axis 3 of the turntable to be measured is adjusted to 0 degree, then S122 is executed, the azimuth axis is rotated by 90 degrees, at this time, the collimated light beam emitted from the first autocollimator 1 is reflected onto the scale reticle of the first autocollimator 1 through the plano crystal 6, and the angle of the plano crystal 6 is adjusted by executing S123, so that the original light spot of the first autocollimator 1 coincides with the light spot after passing through the plano crystal 6.
In some embodiments, as shown in fig. 5, the angle of the second autocollimator 7 is adjusted such that the second autocollimator 7 is self-aligned with the flat crystal 6, including:
s131, through adjusting the angle of the second autocollimator 7, the primary light spot of the second autocollimator 7 is overlapped with the light spot after the flat crystal 6, and the emergent light beam of the second autocollimator 7 is close to the pitch axis 3 and parallel to the emergent light beam of the first autocollimator 1.
In practice, the angle of the second autocollimator 7 is adjusted so that the primary spot of the second autocollimator 7 coincides with the spot after passing through the flat crystal 6, in which case the outgoing beam of the second autocollimator 7 is close to the pitch axis 3 and parallel to the outgoing beam of the first autocollimator 1. By adjusting the angles of the first autocollimator 1, the second autocollimator 7, the reflecting mirror 2 and the flat crystal 6, a test environment is built, at this time, the collimated light beams emitted by the first autocollimator 1 and the second autocollimator 7 are parallel to the pitching axis 3 of the turntable to be tested, and the mirror surface of the reflecting mirror 2, the flat crystal 6 and the plane are perpendicular to the pitching axis 3.
In some embodiments, as shown in fig. 6, turning the pitch axis 3 with the azimuth axis in different positions, recording the measured imaging position of the spot on the scale reticle after each rotation, includes:
s141, resetting the azimuth axis of the turntable to be tested, sequentially rotating the pitching axis for 3 times at an angle of 45 degrees, and recording the measurement imaging position of the light spot on the scale reticle after each rotation.
S142, rotating the azimuth axis by 180 degrees, sequentially rotating the pitching axis by 45 degrees for 3 times, and recording the measurement imaging position of the light spot on the scale reticle after each rotation.
In some embodiments, as shown in fig. 7, calculating the perpendicularity between the pitch axis 3 and the azimuth axis of the turntable to be measured according to the measured imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale reticle includes:
s151, taking the horizontal right direction of the scale division plate as the X direction, recording that the measured imaging positions of the light spots on the scale division plate after sixteen rotations are respectively theta 1 、θ 2 、θ 3 、θ 4 、θ 5 、θ 6 、θ 7 、θ 8 、θ′ 1 、θ′ 2 、θ′ 3 、θ′ 4 、θ′ 5 、θ′ 6 、θ′ 7 、θ′ 8 。
S152, calculating the verticality between a pitching axis 3 and an azimuth axis of the turntable to be tested according to a formula; here, the perpendicularity of the azimuth axis and the pitch axis 3 at the relative positions thereof is shown.
In practice, when the pitch axis 3 is rotated eight times with the azimuth axis at 0 degrees and 180 degrees, respectively, at least sixteen spot positions can be obtained, from which the approximate circle formed by the spot and the center of the circle can be determined. The rotation angle of the fairy can be adopted for each rotation, and the rotation angles can be different. In addition, the more the rotation times, the more the spot positions are obtained, and thus the more accurate the center of the approximate circle formed by the spot. The calculated verticality of the azimuth axis to the pitch axis 3 is thus more accurate.
Example two
Referring to fig. 2, the present invention provides a verticality measuring device for measuring verticality between a pitch axis 3 and an azimuth axis of a turntable to be measured according to a verticality measuring method, the verticality measuring device includes: the first autocollimator 1 and the second autocollimator 7 are oppositely arranged at two sides of the turntable to be tested and are both arranged on an optical platform, and the first autocollimator 1 and the second autocollimator 7 comprise an objective light pipe component and a micrometer eyepiece component, the objective light pipe component emits collimated light beams, and an imaging reticle is arranged in the micrometer eyepiece component. The adjusting bracket is in threaded connection with the turntable to be tested. And the reflector 2 is arranged on the adjusting bracket, and the reflector 2 is a double-sided reflector 2. The azimuth frame 5 is parallel to the azimuth axis of the turntable to be tested, and the azimuth frame 5 is screwed on the turntable to be tested. And the flat crystal 6 is placed on the optical platform and positioned between the turntable to be tested and the second autocollimator 7, and the flat crystal 6 is parallel flat crystal.
Note that the above is only a preferred embodiment of the present invention and the technical principle applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, and that various obvious changes, rearrangements, combinations, and substitutions can be made by those skilled in the art without departing from the scope of the invention. Therefore, while the invention has been described in connection with the above embodiments, the invention is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the invention, which is set forth in the following claims.
Claims (9)
1. The verticality measuring method is characterized by being used for measuring the verticality between a pitching axis and an azimuth axis of a turntable to be measured and comprises the following steps:
resetting an azimuth axis of the turntable to be tested, adjusting angles of a first autocollimator and a reflecting mirror on the turntable to be tested, enabling the first autocollimator to be self-aligned with the reflecting mirror, enabling a mirror surface of the reflecting mirror to be perpendicular to a pitching axis of the turntable to be tested, and enabling the first autocollimator to comprise a scale division plate for recording positions of light spots;
resetting a pitching axis of the turntable to be detected, rotating an azimuth axis of the turntable to be detected, and adjusting the angle of the flat crystal to enable the first autocollimator to be self-aligned with the flat crystal;
adjusting the angle of a second autocollimator so that the second autocollimator is self-aligned with the flat crystal;
rotating the pitching shaft when the azimuth shaft is positioned at different positions, and recording the measurement imaging position of the light spot on the scale reticle after each rotation;
and calculating the perpendicularity of the pitching axis and the azimuth axis of the turntable to be measured according to the measurement imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale division plate.
2. The method of claim 1, wherein resetting the azimuth axis of the turntable to be measured, adjusting the angle of a first autocollimator and a mirror on the turntable to be measured, aligning the first autocollimator with the mirror, and aligning the mirror surface of the mirror perpendicular to the pitch axis of the turntable to be measured, comprises:
the turntable to be tested is in threaded connection with an adjusting bracket and is placed on an optical platform, the turntable to be tested is placed between the first autocollimator and the second autocollimator, and the reflecting mirror is placed on the adjusting bracket;
the angle of the reflecting mirror is adjusted, so that the reflecting mirror surface of the reflecting mirror is perpendicular to the pitching axis of the turntable to be tested;
and locking an azimuth axis of the turntable to be detected, rotating a pitching axis of the turntable to be detected, and adjusting the angle of the first autocollimator to enable the original light spot of the first autocollimator to coincide with the light spot passing through the reflecting mirror.
3. The method of claim 2, wherein resetting the pitch axis of the turntable to be measured, rotating the azimuth axis of the turntable to be measured, adjusting the angle of the planar crystal, aligning the first autocollimator with the planar crystal, comprises:
resetting the pitching shaft of the turntable to be tested;
the azimuth axis is rotated by 90 degrees, and the collimated light beam emitted by the first autocollimator is reflected to the first autocollimator through the flat crystal;
and adjusting the angle of the flat crystal so that the primary light spot of the first autocollimator coincides with the light spot passing through the flat crystal.
4. A method according to claim 3, wherein adjusting the angle of the second autocollimator such that the second autocollimator is self-aligned with the flat crystal comprises:
and the angle of the second autocollimator is adjusted, so that a primary light spot of the second autocollimator coincides with a light spot after the primary light spot passes through the plane crystal, and an emergent light beam of the second autocollimator is close to the pitching axis and parallel to an emergent light beam of the first autocollimator.
5. The method of claim 4, wherein rotating the pitch axis while the azimuth axis is in different positions, recording a measured imaging position of the spot on the scale reticle after each rotation, comprises:
resetting the azimuth axis of the turntable to be tested, rotating the pitching axis for eight times sequentially at an angle of 45 degrees, and recording the measurement imaging position of the light spot on the scale reticle after each rotation;
and rotating the azimuth axis system by 180 degrees, sequentially rotating the pitching axis by 45 degrees for eight times, and recording the measurement imaging position of the light spot on the scale reticle after each rotation.
6. The method of claim 5, wherein calculating the perpendicularity of the pitch axis and the azimuth axis of the turntable to be measured according to the measured imaging position and the conversion relation between the unit distance and the plane inclination angle on the scale reticle comprises:
taking the horizontal rightward direction of the scale reticle as the X direction, recording sixteen rotations, wherein the measured imaging positions of the light spots on the scale reticle are respectively theta 1 、θ 2 、θ 3 、θ 4 、θ 5 、θ 6 、θ 7 、θ 8 、θ′ 1 、θ′ 2 、θ′ 3 、θ′ 4 、θ′ 5 、θ′ 6 、θ′ 7 、θ′ 8 ；
According to the formulaCalculating the verticality between the pitching axis and the azimuth axis of the turntable to be tested;
wherein V is i Indicating that the azimuth axis and the pitch axis are at θ i And theta i+4 Is perpendicular to the relative position of the frame.
7. A perpendicularity measuring apparatus for measuring perpendicularity of a pitch axis and an azimuth axis of a turntable to be measured according to the perpendicularity measuring method according to any one of claims 1 to 6, the perpendicularity measuring apparatus comprising:
the first autocollimator and the second autocollimator are oppositely arranged at two sides of the turntable to be tested and are both arranged on an optical platform, and the optical platform comprises an objective light pipe component and a micrometer eyepiece component, wherein the objective light pipe component emits a collimated light beam, and an imaging reticle is arranged in the micrometer eyepiece component;
the adjusting bracket is in threaded connection with the turntable to be tested;
a reflecting mirror placed on the adjustment bracket;
the azimuth frame is parallel to an azimuth axis of the turntable to be tested and is screwed on the turntable to be tested;
and the flat crystal is placed on the optical platform and is positioned between the turntable to be tested and the second autocollimator.
8. The apparatus of claim 7, wherein the mirror is a double-sided mirror.
9. The apparatus of claim 7 or 8, wherein the flat crystals are parallel flat crystals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311835005.1A CN117739865A (en) | 2023-12-27 | 2023-12-27 | Verticality measuring method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311835005.1A CN117739865A (en) | 2023-12-27 | 2023-12-27 | Verticality measuring method and device |
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