CN117705727A - Anisotropic second harmonic detection device - Google Patents
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Abstract
The embodiment of the application provides an anisotropic second harmonic detection device, which comprises: the device comprises a first light polarization shifting component, a semi-reflection semi-transparent prism, a second light polarization shifting component, a microscope objective and a detection component; the first light polarization shifting component is used for converting incident light into first linearly polarized light which is emitted towards the half-reflecting prism; the second light polarization shifting component is used for converting the first linearly polarized light into second linearly polarized light which is emitted towards the side part of the microscope objective; the micro objective lens is used for focusing the second linearly polarized light to the surface of the sample and emitting a second harmonic signal formed by reflection to the second light polarization shifting component; the second optical polarization shifting component is also used for converting the second harmonic signal into S and P polarized light splitting amounts; the semi-reflection semi-transparent prism is used for transmitting the first linearly polarized light to the second light polarization shifting component and reflecting the S and P polarized light splitting quantities to the detection component. The present application can detect the out-of-plane component of the nonlinear polarization rate tensor by obliquely incident light into the sample.
Description
Technical Field
The application relates to the technical field of laser measurement, in particular to an anisotropic second harmonic detection device.
Background
In the related art, the second harmonic characterization technique utilizes the nonlinear response of the sample to incident light to generate a second harmonic signal, thereby yielding the out-of-plane component of the nonlinear polarizability tensor.
For the out-of-plane component of the nonlinear polarization tensor of the small sample, the phenomenon that the small sample is removed from the irradiation area of the excitation light easily occurs in the process of rotating the small sample when the small sample is measured by a method of rotating the small sample, while the excitation light can only vertically irradiate the sample by rotating the polarization direction of the excitation light under the condition of keeping the small sample, and the obtained spectrum can only distinguish the lattice asymmetry in the plane of the sample and cannot measure the out-of-plane component of the nonlinear polarization tensor of the small sample.
Disclosure of Invention
The present application aims to solve at least one of the technical problems existing in the related art. To this end, the present application proposes an anisotropic second harmonic detection device aimed at measuring the out-of-plane component of the nonlinear polarizability tensor of a small sample.
In a first aspect, an embodiment of the present application provides an anisotropic second harmonic detection apparatus, including: the device comprises a first light polarization shifting component, a semi-reflection semi-transparent prism, a second light polarization shifting component, a microscope objective and a detection component; the first light polarization shifting component is used for converting incident light into first linearly polarized light which is emitted towards a first position of the half-reflecting half-transmitting prism; the half-reflection half-transmission prism is used for transmitting the first linearly polarized light to the second light polarization shifting component; the second light polarization shifting component is used for converting the first linearly polarized light into second linearly polarized light which is emitted towards a second position of the microscope objective, wherein the second position is a side position of the microscope objective; the microscope objective is used for focusing the second linearly polarized light to the surface of a sample and emitting a second harmonic signal formed by reflecting the second linearly polarized light of the sample to the second light polarization shifting assembly; the second light polarization shifting component is further used for converting the second harmonic signal into S-polarization light splitting quantity which is emitted towards a third position of the half-reflecting half-transmitting prism and into P-polarization light splitting quantity which is emitted towards a fourth position of the half-reflecting half-transmitting prism; the half-reflection half-transmission prism is also used for reflecting the S polarized light splitting quantity and the P polarized light splitting quantity to the detection assembly.
According to some embodiments of the present application, the first optical polarization shifting assembly includes a first beam shifter and a first waveplate.
According to some embodiments of the present application, the incident light is circularly polarized light, and the first light polarization shifting assembly further comprises a first polarizer.
According to some embodiments of the application, the first polarizer is a rotatable structure.
According to some embodiments of the present application, the first beam shifter and the first wave plate are both rotatable structures.
According to some embodiments of the present application, a third wave plate is disposed in the incident direction of the first polarizer, and the third wave plate is used for converting third linearly polarized light emitted by the laser light source into the circularly polarized light.
According to some embodiments of the present application, the polarization direction of the first linearly polarized light is S polarization direction or P polarization direction; the second light polarization shifting assembly comprises a second light beam shifter and a second wave plate; the first linearly polarized light is converted into S polarized light or P polarized light which is emitted towards the lateral position of the microscope objective lens through the second light beam shifter and the second wave plate; the second harmonic signal is converted into an S-polarized light splitting quantity which is emitted towards the third position of the half-reflecting half-transmitting prism through the second beam shifter and the second wave plate, and is converted into a P-polarized light splitting quantity which is emitted towards the fourth position of the half-reflecting half-transmitting prism.
According to some embodiments of the present application, the incidence direction of the detection assembly is provided with a rotatable second polarizer for allowing only the S-polarized light split to be incident to the detection assembly or only the P-polarized light split to be incident to the detection assembly.
According to some embodiments of the application, the incidence direction of the detection assembly is provided with a filter.
According to some embodiments of the present application, the incidence direction of the detection assembly is provided with a lens.
According to the technical scheme of the embodiment of the application, the method has at least the following beneficial effects: the embodiment of the application comprises a first light polarization shifting component, a half-reflection half-transmission prism, a second light polarization shifting component, a micro objective and a detection component; the first light polarization shifting component is used for converting incident light into first linearly polarized light which is emitted towards a first position of the half-reflecting prism; the semi-reflection semi-transparent prism is used for transmitting the first linearly polarized light to the second light polarization shifting component; the second light polarization shifting component is used for converting the first linearly polarized light into second linearly polarized light which is emitted towards a second position of the microscope objective, wherein the second position is a side position of the microscope objective; the micro objective lens is used for focusing the second linearly polarized light to the surface of the sample and emitting a second harmonic signal formed by reflecting the second linearly polarized light of the sample to the second light polarization shifting assembly; the second light polarization shifting component is also used for converting the second harmonic signal into S-polarized light splitting quantity which is emitted towards the third position of the half-reflecting prism and into P-polarized light splitting quantity which is emitted towards the fourth position of the half-reflecting prism; the semi-reflection semi-transparent prism is also used for reflecting the S polarized light splitting quantity and the P polarized light splitting quantity to the detection assembly. According to the embodiment of the application, the translation of the incident light can be realized through the first light polarization shifting component or the second light polarization shifting component, the incident light can be obliquely incident into the sample by combining the microscope objective, so that the reflected second harmonic signal is obtained, and the out-of-plane component of the nonlinear polarization rate tensor of the sample is obtained.
Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.
Drawings
The accompanying drawings are included to provide a further understanding of the technical aspects of the present application, and are incorporated in and constitute a part of this specification, illustrate the technical aspects of the present application and together with the examples of the present application, and not constitute a limitation of the technical aspects of the present application.
FIG. 1 is a schematic structural diagram of an anisotropic second harmonic detection apparatus according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of an anisotropic second harmonic detection apparatus according to another embodiment of the present application;
FIG. 3 is a schematic diagram showing the path and polarization direction of incident light during rotation of the first light polarization shifting assembly according to one embodiment of the present disclosure;
fig. 4 is a schematic diagram of a path and a polarization direction of incident light during synchronous rotation of the second light polarization shifting component according to an embodiment of the present application.
Detailed Description
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application.
In the description of the present application, it should be understood that references to orientation descriptions, such as directions of up, down, front, back, left, right, etc., are based on the orientation or positional relationship shown in the drawings, are merely for convenience of describing the present application and simplifying the description, and do not indicate or imply that the apparatus or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.
In the description of the present application, the meaning of a number is one or more, the meaning of a number is two or more, greater than, less than, exceeding, etc. are understood to not include the present number, and the meaning of a number above, below, within, etc. are understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present application, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present application can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical solution.
In the related art, the second harmonic characterization technique utilizes the nonlinear response of the sample to incident light to generate a second harmonic signal, thereby yielding the out-of-plane component of the nonlinear polarizability tensor.
For the out-of-plane component of the nonlinear polarization tensor of the small sample, the phenomenon that the small sample is removed from the irradiation area of the excitation light easily occurs in the process of rotating the small sample when the small sample is measured by a method of rotating the small sample, while the excitation light can only vertically irradiate the sample by rotating the polarization direction of the excitation light under the condition of keeping the small sample, and the obtained spectrum can only distinguish the lattice asymmetry in the plane of the sample and cannot measure the out-of-plane component of the nonlinear polarization tensor of the small sample.
Based on the above situation, the application proposes an anisotropic second harmonic detection device aimed at measuring the out-of-plane component of the nonlinear polarization tensor of a small sample.
Various embodiments of the multi-water system of the present application are further described below with reference to the accompanying drawings.
As shown in fig. 1, fig. 1 is a schematic structural diagram of an anisotropic second harmonic detection apparatus according to an embodiment of the present application.
In an embodiment, the anisotropic second harmonic detection apparatus of the present application includes, but is not limited to, a first light polarization shift assembly 100, a half-reflecting prism 200, a second light polarization shift assembly 300, a micro objective lens 400, and a detection assembly 500, wherein the first light polarization shift assembly 100 is configured to convert incident light into first linearly polarized light exiting toward a first position of the half-reflecting prism 200; the half reflecting half transmitting prism 200 is used for transmitting the first linearly polarized light to the second light polarization shifting assembly 300; the second light polarization shifting assembly 300 is configured to convert the first linearly polarized light into a second linearly polarized light that exits toward a second position of the microscope objective 400, where the second position is a lateral position of the microscope objective 400; the micro objective 400 is used for focusing the second linearly polarized light to the surface of the sample 600 and emitting the second harmonic signal formed by reflecting the second linearly polarized light of the sample 600 to the second optical polarization shifting assembly 300; the second optical polarization shift assembly 300 is further configured to convert the second harmonic signal into an S-polarized light component that exits toward the third position of the half-reflecting prism 200 and into a P-polarized light component that exits toward the fourth position of the half-reflecting prism 200; the half reflecting and half transmitting prism 200 is also used for reflecting the S-polarized beam splitting amount and the P-polarized beam splitting amount to the detecting assembly 500.
It should be noted that, first, the incident light passing through the first light polarization shift assembly 100 is converted into first linearly polarized light exiting toward the first position of the half mirror 200; secondly, the first linearly polarized light is transmitted to the second light polarization shift assembly 300 through the half reflecting half transmitting prism 200; again, the first linearly polarized light is converted into second linearly polarized light by the second light polarization shifting assembly 300, and the second linearly polarized light exits toward a second position of the microscope objective 400, wherein the second position is a lateral position of the microscope objective 400; from time to time, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and after the second linearly polarized light is focused on the sample 600, the second linearly polarized light is reflected to form a second harmonic signal; finally, the second harmonic signal passes through the micro objective lens 400 and exits to the second optical polarization shift assembly 300; in addition, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shift assembly 300, and the S-polarized light splitting amount is emitted toward the third position of the half mirror 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half mirror 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, in the embodiment of the present application, the first optical polarization shifting component 100 or the second optical polarization shifting component 300 can translate the incident light, and the incident light can be obliquely incident into the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the split linear polarization tensor of the sample 600.
Specifically, the first light polarization shift assembly 100 includes a first beam shifter 110 and a first wave plate 120.
The first beam shifter 110 is configured to emit the incident light toward the fifth position of the first wave plate 120, and the first wave plate 120 is configured to convert the incident light into the first linearly polarized light emitted toward the first position of the half mirror 200, where the fifth position of the first wave plate 120 is on the same horizontal line as the first position of the half mirror 200.
As shown in fig. 1, the incident light is selected to be P polarized light, and first, the P polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the P polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the S polarization direction; again, the first linearly polarized light is transmitted to the second light polarization shift assembly 300 through the half reflecting half transmitting prism 200; from time to time, the first linearly polarized light is converted into second linearly polarized light by the second light polarization shifting assembly 300, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the S polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, the embodiment of the application can translate the incident light through the first optical polarization shifting component 100, and can implement that the incident light obliquely enters the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the branching polarization rate tensor of the sample 600.
It should be noted that, when the incident light is P polarized light, the P polarized light is emitted toward the fifth position of the first wave plate 120 through the first beam shifter 110, wherein the fifth position is a lateral position of the first wave plate 120, and the fifth position of the first wave plate 120 and the first position of the half mirror 200 are on the same horizontal line, so the first position is a lateral position of the half mirror 200; wherein the fifth position may be a position 2.7mm lateral to the first waveplate 120.
When the incident light is selected as the S polarized light, the S polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the S polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the P polarization direction; again, the first linearly polarized light is transmitted to the second light polarization shift assembly 300 through the half reflecting half transmitting prism 200; from time to time, the P polarized light is converted into second linearly polarized light by the second light polarization shifting component 300, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the P polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, the embodiment of the application can translate the incident light through the second optical polarization shifting component 300, and can implement that the incident light obliquely enters the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the branching polarization rate tensor of the sample 600.
When the incident light is S polarized light, the S polarized light is emitted toward the fifth position of the first wave plate 120 through the first beam shifter 110, wherein the fifth position is the middle position of the first wave plate 120, and the fifth position of the first wave plate 120 and the first position of the half mirror 200 are on the same horizontal line, so the first position is the middle position of the half mirror 200.
Fig. 2 is a schematic structural diagram of an anisotropic second harmonic detection apparatus according to another embodiment of the present application, as shown in fig. 2.
In one embodiment, when the incident light is circularly polarized light, the first light polarization shifting assembly 100 further includes a first polarizer 130.
The first polarizing plate 130 is used to convert circularly polarized light into S-polarized light or P-polarized light toward the first beam shifter 110.
The first polarizing plate 130 is rotatable, and by rotating the first polarizing plate 130, circularly polarized light is converted into S polarized light toward the first beam shifter 110, or circularly polarized light is converted into P polarized light toward the first beam shifter 110.
As shown in fig. 2, the linearly polarized light into which circularly polarized light is converted by the first polarizing plate 130 is selected as P polarized light.
When the incident light is circularly polarized light, the circularly polarized light is converted into P-polarized light toward the first beam shifter 110 by rotating the first polarizing plate 130; then, the P-polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the P polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the S polarization direction; again, the first linearly polarized light is transmitted to the second light polarization shift assembly 300 through the half reflecting half transmitting prism 200; from time to time, the first linearly polarized light is converted into second linearly polarized light by the second light polarization shifting assembly 300, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the S polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, the embodiment of the application can translate the incident light through the first optical polarization shifting component 100, and can implement that the incident light obliquely enters the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the branching polarization rate tensor of the sample 600.
It should be noted that, when the circularly polarized light is converted into P polarized light, the P polarized light is emitted toward the fifth position of the first wave plate 120 through the first beam shifter 110, wherein the fifth position is a side position of the first wave plate 120, and the fifth position of the first wave plate 120 and the first position of the half mirror 200 are on the same horizontal line, so the first position is a side position of the half mirror 200; wherein the fifth position may be a position 2.7mm lateral to the first waveplate 120.
In one embodiment, when the incident light is circularly polarized light, the circularly polarized light is converted into S polarized light toward the first beam shifter 110 by rotating the first polarizing plate 130; then, the S-polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the S polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the P polarization direction; again, the first linearly polarized light is transmitted to the second light polarization shift assembly 300 through the half reflecting half transmitting prism 200; from time to time, the P polarized light is converted into second linearly polarized light by the second light polarization shifting component 300, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the P polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, the embodiment of the application can translate the incident light through the second optical polarization shifting component 300, and can implement that the incident light obliquely enters the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the branching polarization rate tensor of the sample 600.
When the circularly polarized light is converted into the S polarized light, the S polarized light is emitted toward the fifth position of the first wave plate 120 through the first beam shifter 110, wherein the fifth position is the middle position of the first wave plate 120, and the fifth position of the first wave plate 120 and the first position of the half mirror 200 are on the same horizontal line, so the first position is the middle position of the half mirror 200.
It should be noted that, regarding the first beam shifter 110 and the first wave plate 120 described above, both have a rotatable structure.
Fig. 3 is a schematic diagram of a path and a polarization direction of incident light during rotation of the first light polarization shifting device according to an embodiment of the present application.
When the incident light is P-polarized light, the path of the incident light is a circle with a radius of 2.7mm during the rotation of the first light polarization shift assembly 100, and the polarization direction of the incident light is always tangential to the circle, so that the first light polarization shift assembly 100 can spatially rotate around the center point and obtain S-polarized light.
Specifically, as shown in fig. 2, when the incident light is circularly polarized light, a third wave plate 700 is disposed in the incident direction of the first polarizing plate 130, wherein the third wave plate 700 is used to convert the third linearly polarized light emitted from the laser light source into circularly polarized light.
The third linearly polarized light is incident on the third wave plate 700 at an angle of 45 degrees from the fast axis of the third wave plate 700 in the polarization direction, so that the polarization state of the third linearly polarized light is converted from linearly polarized light to circularly polarized light.
Specifically, as shown in fig. 1 and 2, the second light polarization shifting assembly 300 includes a second beam shifter 310 and a second wave plate 320.
After the first linearly polarized light passes through the second beam shifter 310 and the second wave plate 320, the first linearly polarized light is converted into S-polarized light or P-polarized light that is emitted toward a side position of the microscope objective lens 400.
It should be noted that, the fast axis of the second wave plate 320 and the polarization direction of the incident light may be set to 0 degrees or may be set to 45 degrees; when the fast axis of the second wave plate 320 and the polarization direction of the incident light are set to 0 degrees, the polarization direction of the first linearly polarized light passing through the second wave plate 320 is not changed; when the fast axis of the second wave plate 320 is set to 45 degrees to the polarization direction of the incident light, the polarization direction of the second linearly polarized light passing through the second wave plate 320 is changed. Therefore, by setting the fast axis of the second wave plate 320 and the polarization direction of the incident light, oblique incidence excitation of P-polarized light and S-polarized light in the same anisotropic second harmonic detection device can be achieved, and thus the out-of-plane component of the nonlinear polarization ratio tensor can be detected.
It can be understood that when the fast axis of the second wave plate 320 is set to 0 degrees with respect to the polarization direction of the incident light and the polarization direction of the first linear polarization is the P polarization direction, the first linear polarization is converted into the P polarization exiting toward the side position of the microscope objective lens 400 through the second beam shifter 310 and the second wave plate 320; when the fast axis of the second wave plate 320 is set to 0 degrees with the polarization direction of the incident light and the polarization direction of the first linear polarized light is the S polarization direction, the first linear polarized light is converted into S polarized light exiting toward the side position of the micro objective lens 400 by the second beam shifter 310 and the second wave plate 320; when the fast axis of the second wave plate 320 is set to 45 degrees with the polarization direction of the incident light and the polarization direction of the first linear polarization is the P polarization direction, the first linear polarization is converted into S polarization exiting toward the side position of the micro objective lens 400 by the second beam shifter 310 and the second wave plate 320; when the fast axis of the second wave plate 320 is set to 45 degrees to the polarization direction of the incident light and the polarization direction of the first linear polarized light is the S polarization direction, the first linear polarized light is converted into P polarized light exiting toward the side position of the micro objective lens 400 by the second beam shifter 310 and the second wave plate 320.
In one embodiment, when the fast axis of the second wave plate 320 and the polarization direction of the incident light are set to 45 degrees and the incident light is circularly polarized light, the circularly polarized light is converted into P-polarized light toward the first beam shifter 110 by rotating the first polarizing plate 130; then, the P-polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the P polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the S polarization direction; again, the first linearly polarized light is transmitted to the second beam shifter 310 and the second wave plate 320 through the half reflecting half transmitting prism 200; from time to time, the first linearly polarized light is converted into second linearly polarized light by the second wave plate 320, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the P polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, in the embodiment of the present application, the translation of the incident light can be achieved through the first optical polarization shifting component 100, and the incident light can be obliquely incident into the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the split linear polarization tensor of the sample 600; in addition, in the embodiment of the present application, the angle between the fast axis direction of the second wave plate 320 and the polarization direction of the incident light can be set, so that the polarization direction of the first linear polarized light is changed, and further the second linear polarized light is obtained.
In one embodiment, when the fast axis of the second wave plate 320 and the polarization direction of the incident light are set to 0 degrees and the incident light is circularly polarized light, the circularly polarized light is converted into P-polarized light toward the first beam shifter 110 by rotating the first polarizing plate 130; then, the P-polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the P polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the S polarization direction; again, the first linearly polarized light is transmitted to the second beam shifter 310 and the second wave plate 320 through the half reflecting half transmitting prism 200; from time to time, the first linearly polarized light is converted into second linearly polarized light by the second wave plate 320, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the S polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, in the embodiment of the present application, the translation of the incident light can be achieved through the first optical polarization shifting component 100, and the incident light can be obliquely incident into the sample 600 by combining with the micro objective lens 400, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the split linear polarization tensor of the sample 600; in addition, in the embodiment of the present application, the angle between the fast axis direction of the second wave plate 320 and the polarization direction of the incident light can be set, so that the polarization direction of the first linear polarized light is changed, and further the second linear polarized light is obtained.
In one embodiment, when the fast axis of the second wave plate 320 and the polarization direction of the incident light are set to 45 degrees and the incident light is circularly polarized light, the circularly polarized light is converted into S polarized light toward the first beam shifter 110 by rotating the first polarizing plate 130; then, the S-polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the S polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the P polarization direction; again, the first linearly polarized light is transmitted to the second beam shifter 310 and the second wave plate 320 through the half reflecting half transmitting prism 200; from time to time, the first linearly polarized light is converted into second linearly polarized light by the second wave plate 320, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the S polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, in the embodiment of the present application, the second optical polarization shifting component 300 is capable of translating the incident light, and in combination with the micro-objective 400, the incident light can be obliquely incident into the sample 600, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the split linear polarization tensor of the sample 600; in addition, in the embodiment of the present application, the angle between the fast axis direction of the second wave plate 320 and the polarization direction of the incident light can be set, so that the polarization direction of the first linear polarized light is changed, and further the second linear polarized light is obtained.
In one embodiment, when the fast axis of the second wave plate 320 and the polarization direction of the incident light are set to 0 degrees and the incident light is circularly polarized light, the circularly polarized light is converted into S polarized light toward the first beam shifter 110 by rotating the first polarizing plate 130; then, the S-polarized light passes through the first beam shifter 110 and exits toward the fifth position of the first wave plate 120; next, the first wave plate 120 converts the P polarized light into a first linearly polarized light emitted toward the first position of the half reflecting prism 200, wherein the polarization direction of the first linearly polarized light is the P polarization direction; again, the first linearly polarized light is transmitted to the second beam shifter 310 and the second wave plate 320 through the half reflecting half transmitting prism 200; from time to time, the first linearly polarized light is converted into second linearly polarized light by the second wave plate 320, and the second linearly polarized light is emitted towards a second position of the microscope objective 400, wherein the polarization direction of the second linearly polarized light is the P polarization direction, and the second position is a side position of the microscope objective 400; finally, the second linearly polarized light is focused on the surface of the sample 600 through the micro objective lens 400, and the second linearly polarized light is reflected to form a second harmonic signal after being focused on the sample 600; in addition, the second harmonic signal will exit to the second optical polarization shift assembly 300 through the micro objective lens 400; moreover, the second harmonic signal is converted into S-polarized light splitting amount and P-polarized light splitting amount by the second optical polarization shifting unit 300, and the S-polarized light splitting amount is emitted toward the third position of the half-reflecting half-transmitting prism 200, and the P-polarized light splitting amount is emitted toward the fourth position of the half-reflecting half-transmitting prism 200; in addition, the S-polarized light splitting amount and the P-polarized light splitting amount are reflected into the detecting assembly 500 by the half mirror 200. Therefore, in the embodiment of the present application, the second optical polarization shifting component 300 is capable of translating the incident light, and in combination with the micro-objective 400, the incident light can be obliquely incident into the sample 600, so as to obtain the reflected second harmonic signal, and further obtain the out-of-plane component of the split linear polarization tensor of the sample 600; in addition, in the embodiment of the present application, the angle between the fast axis direction of the second wave plate 320 and the polarization direction of the incident light can be set, so that the polarization direction of the first linear polarized light is changed, and further the second linear polarized light is obtained.
After passing through the second beam shifter 310 and the second wave plate 320, the second harmonic signal is converted into an S-polarized light beam exiting toward the third position of the half mirror 200, and into a P-polarized light beam exiting toward the fourth position of the half mirror 200.
It should be noted that, when the second harmonic signal passes through the second wave plate 320, the second harmonic signal with the polarization direction being the P polarization direction will be converted into the S polarization split amount, and the second harmonic signal with the polarization direction being the S polarization direction will be converted into the P polarization split amount; then, after the S-polarized light beam passes through the second beam shifter 310, the S-polarized light beam is emitted toward the third position of the half mirror 200, and when the P-polarized light beam passes through the second beam shifter, the P-polarized light beam is laterally moved by 2.7mm and emitted toward the fourth position of the half mirror 200.
The third position is a side position of the half mirror 200, and the fourth position is a middle position of the half mirror.
It should be noted that the second polarization shifting component 300 is a rotatable structure.
It should be noted that, by rotating the first polarization shifting assembly 100 and the second polarization shifting assembly 300 synchronously, measurement of the second harmonic signal of the sample in each direction of the sample can be achieved.
Fig. 4 is a schematic diagram of a path and a polarization direction of incident light in a synchronous rotation process of the second light polarization shifting component according to an embodiment of the present application.
It should be noted that, when the incident light is P-polarized light and the fast axis of the second wave plate 320 is set at 45 degrees to the polarization direction of the incident light, the path of the incident light is a circle with a radius of 2.7mm during the rotation of the second light polarization shifting assembly 300, and the polarization direction of the incident light is always perpendicular to the circle, so that the second light polarization shifting assembly 300 can rotate around the center point in space, and the P-polarized light is obtained.
Specifically, as shown in fig. 1 and 2, the incident direction of the detection assembly 500 is provided with a rotatable second polarizer 800, where the second polarizer 800 is used to allow only S-polarized light beam to be incident on the detection assembly 500, or only P-polarized light beam to be incident on the detection assembly 500.
It should be noted that by rotating the second polarizer 800, it may be used to allow the S-polarized beam to be incident on the detection module 500, or by rotating the second polarizer 800, it may be used to allow the S-polarized beam to be incident on the detection module 500.
Specifically, the optical filter 900 is disposed in the incident direction of the detection module 500.
It should be noted that, since the reflected second linearly polarized light and the S-polarized light and the P-polarized light can be collected by the detecting assembly 500, the reflected second linearly polarized light is filtered out by providing the filter 900 in the incident direction of the detecting assembly 500.
It will be appreciated that after the second linearly polarized light is obliquely incident on the surface of the sample 600, a reflected second harmonic signal is obtained and reflected to the detection assembly 500, wherein the reflected second linearly polarized light may be entrained during reflection of the second harmonic signal to the detection assembly 500.
Specifically, a lens 1000 is provided in the incident direction of the probe assembly 500.
The lens 1000 is used to focus the S-polarized light component and the P-polarized light component into the detection assembly 500, so that the detection assembly 500 collects the S-polarized light component and the P-polarized light component.
It should be noted that, regarding the first wave plate 120, a 1/2 wave plate may be used, or two 1/4 wave plates may be used, which is not particularly limited in the embodiments of the present application.
It should be noted that, regarding the second wave plate 320, a 1/2 wave plate may be used, or two 1/4 wave plates may be used, which is not particularly limited in the embodiments of the present application.
Note that, the third wave plate 700 may be one 1/4 wave plate or two 1/8 wave plates, which is not particularly limited in the embodiments of the present application.
While the preferred embodiments of the present application have been described in detail, the present application is not limited to the above embodiments, and various equivalent modifications and substitutions can be made by those skilled in the art without departing from the spirit and scope of the present application, and these equivalent modifications and substitutions are intended to be included in the scope of the present application as defined in the appended claims.
Claims (10)
1. An anisotropic second harmonic detection apparatus, comprising: the device comprises a first light polarization shifting component, a semi-reflection semi-transparent prism, a second light polarization shifting component, a microscope objective and a detection component;
the first light polarization shifting component is used for converting incident light into first linearly polarized light which is emitted towards a first position of the half-reflecting half-transmitting prism;
the half-reflection half-transmission prism is used for transmitting the first linearly polarized light to the second light polarization shifting component;
the second light polarization shifting component is used for converting the first linearly polarized light into second linearly polarized light which is emitted towards a second position of the microscope objective, wherein the second position is a side position of the microscope objective;
the microscope objective is used for focusing the second linearly polarized light to the surface of a sample and emitting a second harmonic signal formed by reflecting the second linearly polarized light of the sample to the second light polarization shifting assembly;
the second light polarization shifting component is further used for converting the second harmonic signal into S-polarization light splitting quantity which is emitted towards a third position of the half-reflecting half-transmitting prism and into P-polarization light splitting quantity which is emitted towards a fourth position of the half-reflecting half-transmitting prism;
the half-reflection half-transmission prism is also used for reflecting the S polarized light splitting quantity and the P polarized light splitting quantity to the detection assembly.
2. The anisotropic second harmonic detection apparatus of claim 1, wherein the first optical polarization shift assembly comprises a first beam shifter and a first waveplate.
3. The anisotropic second harmonic detection apparatus of claim 2, wherein the incident light is circularly polarized light, and the first light polarization shift assembly further comprises a first polarizer.
4. An anisotropic second harmonic detection apparatus as in claim 3 wherein the first polarizer is a rotatable structure.
5. An anisotropic second harmonic detection apparatus according to claim 2, wherein the first beam shifter and the first wave plate are both rotatable structures.
6. An anisotropic second harmonic detection apparatus according to claim 3, wherein a third wave plate is provided in the incident direction of the first polarizing plate, the third wave plate being for converting third linearly polarized light emitted from the laser light source into the circularly polarized light.
7. The anisotropic second harmonic detection apparatus according to any of claims 1 to 6, wherein the polarization direction of the first linearly polarized light is S-polarization direction or P-polarization direction;
the second light polarization shifting assembly comprises a second light beam shifter and a second wave plate;
the first linearly polarized light is converted into S polarized light or P polarized light which is emitted towards the lateral position of the microscope objective lens through the second light beam shifter and the second wave plate;
the second harmonic signal is converted into an S-polarized light splitting quantity which is emitted towards the third position of the half-reflecting half-transmitting prism through the second beam shifter and the second wave plate, and is converted into a P-polarized light splitting quantity which is emitted towards the fourth position of the half-reflecting half-transmitting prism.
8. An anisotropic second harmonic detection apparatus according to claim 1, wherein the detection assembly is provided with a rotatable second polarizer for allowing only the S-polarized light split to be incident on the detection assembly or allowing only the P-polarized light split to be incident on the detection assembly.
9. An anisotropic second harmonic detection apparatus according to claim 1, wherein the detection assembly is provided with a filter in the direction of incidence.
10. An anisotropic second harmonic detection apparatus according to claim 1, wherein the detection assembly is provided with a lens in the direction of incidence.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311545026.XA CN117705727A (en) | 2023-11-17 | 2023-11-17 | Anisotropic second harmonic detection device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311545026.XA CN117705727A (en) | 2023-11-17 | 2023-11-17 | Anisotropic second harmonic detection device |
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| CN117705727A true CN117705727A (en) | 2024-03-15 |
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| CN202311545026.XA Pending CN117705727A (en) | 2023-11-17 | 2023-11-17 | Anisotropic second harmonic detection device |
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