CN117705304A - Vortex beam topology charge number measuring system, method, device, equipment and medium - Google Patents
Vortex beam topology charge number measuring system, method, device, equipment and medium Download PDFInfo
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Abstract
The invention discloses a vortex beam topological charge number measuring system, a method, a device, equipment and a medium, and relates to the field of optical measurement.
Description
Technical Field
The invention relates to the technical field of optical measurement, in particular to a vortex beam topology charge number measurement system, a vortex beam topology charge number measurement method, a vortex beam topology charge number measurement device, vortex beam topology charge number measurement equipment and vortex beam topology charge number measurement medium.
Background
Vortex light is a hollow beam with a helical wavefront structure and zero central intensity. Optical vortices have been applied in many different situations, such as optical trapping, optical communication, microscopic imaging, laser microcomputer, rotational speed detection, simulation of optical black holes, etc. In all of these applications, the topological charge of the vortex rotation plays a key role. At present, a complex optical device is needed for measurement, the measurement method is complex to operate, and the beam coherence is poor.
The foregoing is provided merely for the purpose of facilitating understanding of the technical solutions of the present invention and is not intended to represent an admission that the foregoing is prior art.
Disclosure of Invention
The invention mainly aims to provide a vortex beam topology charge number measuring system, a vortex beam topology charge number measuring method, a vortex beam topology charge number measuring device, vortex beam topology charge number measuring equipment and vortex beam topology charge number measuring medium, and aims to solve the technical problems that in the prior art, a complex optical device is needed for measurement, the measuring method is complex in operation and poor in beam coherence.
In order to achieve the above object, the present invention provides a vortex beam topology charge number measurement system, including: the device comprises a laser emission unit, a beam splitting plate, a first reflecting mirror, a second reflecting mirror and a measuring unit;
the laser emission unit is used for generating vortex beams and emitting the vortex beams to be detected to the beam splitting plate;
the beam splitter plate is used for splitting the vortex beam into reflection vortex rotation and transmission vortex rotation;
the reflection vortex light is reflected to the first reflector, and is transmitted to the first vortex light after being reflected to the semi-transparent and semi-reflective film of the light splitting plate through the first reflector;
the transmitted vortex light is transmitted to the second reflector, and is reflected to the semi-transparent and semi-reflective film of the light splitting plate through the second reflector, and then is reflected to be second vortex light;
the measuring unit is used for collecting a target interference image between the first vortex light and the second vortex light, analyzing the target interference image and determining the topological charge number of the vortex light; the vortex beam topology charge number measurement system further comprises: a compensation plate disposed between the beam splitter plate and the second mirror;
the compensating plate is used for compensating the optical path of the transmission vortex rotation transmitted by the light splitting plate and transmitting the compensated transmission vortex light to the semi-transparent and semi-reflective film of the light splitting plate.
Optionally, the laser emitting unit includes: a laser emitter, a collimating expander, a polarizer, a spatial light modulator, and a third mirror;
the laser transmitter is used for generating a fundamental mode Gaussian beam and transmitting the fundamental mode Gaussian beam to the collimation beam expander;
the collimation beam expander is used for expanding the Gaussian beam of the fundamental mode and then transmitting the Gaussian beam to the polaroid;
the polaroid is used for modulating the base mode Gaussian beam after beam expansion into the polarization direction of a liquid crystal plane of the spatial light modulator and transmitting the liquid crystal plane of the spatial light modulator;
the spatial light modulator is used for converting the base mode Gaussian beam after beam expansion into a vortex beam to be detected and reflecting the vortex beam to the third reflector;
the third reflector is used for reflecting the vortex light beams to the light splitting plate.
Optionally, the angle of incidence of the fundamental mode gaussian beam into the spatial light modulator is less than 15 degrees;
the distance between the first reflecting mirror and the spectroscope is a first distance, the distance between the second reflecting mirror and the spectroscope is a second distance, and the first distance is equal to the second distance.
Optionally, the vortex beam topology charge measurement system further comprises at least one adjusting nut, wherein the adjusting nut is arranged on the second reflecting mirror;
the adjusting nut is used for adjusting the mirror surface direction of the second reflecting mirror, and an included angle exists between the mirror surface direction of the second reflecting mirror and the vertical direction.
Optionally, the measurement unit comprises an imaging device;
the imaging device is used for collecting a target interference image generated by self-interference between the first vortex light and the second vortex light.
Optionally, the measurement unit further comprises an analysis device;
the analysis device is used for acquiring the target interference image acquired by the imaging device, analyzing interference fringe characteristics near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image, and determining the topological charge number of vortex light.
In addition, in order to achieve the above objective, the present invention further provides a vortex beam topology charge number measurement method, which is applied to the vortex beam topology charge number measurement system, and the vortex beam topology charge number measurement method includes:
constructing a measuring light path;
collecting a target interference image generated by self-interference between a first vortex light and a second vortex light in the measuring light path;
analyzing interference fringe features near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image to obtain fringe information of the phase singular points;
and determining the topological charge number of the vortex beam based on the stripe information.
In addition, in order to achieve the above object, the present invention also provides a vortex beam topology charge number measuring device, including:
the optical path construction module is used for constructing a measuring optical path;
the image acquisition module is used for acquiring a target interference image generated by self-interference between the first vortex light and the second vortex light in the measuring light path;
the image analysis module is used for analyzing interference fringe features near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image and acquiring fringe information of the phase singular points;
and the topological charge number measuring module is used for determining the topological charge number of the vortex beam based on the stripe information.
In addition, in order to achieve the above object, the present invention also proposes a vortex beam topology charge number measurement apparatus, including: a memory, a processor, and a vortex beam topology charge measurement program stored on the memory and executable on the processor, the vortex beam topology charge measurement program configured to implement the steps of the vortex beam topology charge measurement method as described above.
In addition, in order to achieve the above object, the present invention also proposes a storage medium having stored thereon a vortex beam topology charge number measurement program which, when executed by a processor, implements the steps of the vortex beam topology charge number measurement method as described above.
According to the invention, the vortex light beam to be measured is emitted to the light splitting plate through the laser emission unit, the light splitting plate splits the vortex light beam into the reflection vortex rotation and the transmission vortex rotation, the reflection vortex rotation is reflected to the first reflecting mirror, the reflection vortex light is transmitted to the first vortex rotation after being reflected to the semi-transparent and semi-reflective film of the light splitting plate through the first reflecting mirror, the optical path of the transmission vortex rotation is transmitted to the second reflecting mirror after being compensated for the first time through the compensating plate, the transmission vortex rotation is reflected to the second vortex rotation after reaching the semi-transparent and semi-reflective film of the light splitting plate after being reflected by the second reflecting mirror for the second time through the compensating plate, the measuring unit analyzes the target interference image of the two vortex rotation, and the topological charge number of the vortex light is determined, so that the problems of complex measuring operation and poor beam coherence are effectively avoided, and the method is simple to operate and quick to measure on the basis of ensuring the measuring accuracy.
Drawings
FIG. 1 is a schematic diagram of a first embodiment of a vortex beam topology charge measurement system of the present invention;
FIG. 2 is a schematic diagram of the optical path structure of the vortex beam topology charge number measurement system of the present invention;
FIG. 3 is a schematic structural diagram of a vortex beam topology charge measurement device of a hardware running environment according to an embodiment of the present invention;
FIG. 4 is a schematic flow chart of a first embodiment of a vortex beam topology charge number measurement method according to the present invention;
FIG. 5 is a schematic diagram showing the intensity distribution of vortex light after interference in a first embodiment of the vortex light beam topology charge number measurement method according to the present invention;
fig. 6 is a block diagram of a first embodiment of a vortex beam topology charge measurement apparatus according to the present invention.
Reference numerals illustrate:
| reference numerals | Name of the name | Reference numerals | Name of the name |
| 1 | Laser transmitter | 2 | Collimation beam expander |
| 3 | Polarizing plate | 4 | Spatial light modulator |
| 5 | Third reflecting mirror | 6 | Beam interference unit |
| 7 | First reflecting mirror | 8 | Light splitting plate |
| 9 | Compensation plate | 10 | Second reflecting mirror |
| 11 | Adjusting nut | 12 | Image forming apparatus |
| 13 | Analysis device |
The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The embodiment of the invention provides a vortex beam topology charge number measuring system, and referring to fig. 1, fig. 1 is a schematic structural diagram of a first embodiment of the vortex beam topology charge number measuring system.
The vortex beam topology charge number measurement system comprises: a laser emission unit, a beam splitter plate 8, a first reflecting mirror 7, a second reflecting mirror 10, and a measurement unit;
the laser emission unit is used for generating vortex beams and emitting the vortex beams to be detected to the beam splitting plate 8;
the beam splitter plate 8 is used for splitting the vortex beam into reflection vortex rotation and transmission vortex rotation;
the reflected vortex light is reflected to the first reflecting mirror 7, and after being reflected to the semi-transparent and semi-reflective film of the light splitting plate 8 by the first reflecting mirror 7, the reflected vortex light is transmitted as a first vortex light;
the transmitted vortex light is transmitted to the second reflecting mirror 10, and is reflected to the semi-transparent and semi-reflective film of the light splitting plate 8 by the second reflecting mirror 10, and then the transmitted vortex light is reflected to be second vortex light;
the measuring unit is used for collecting a target interference image between the first vortex light and the second vortex light, analyzing the target interference image and determining the topological charge number of the vortex light;
the vortex beam topology charge number measurement system further comprises: a compensation plate 9, the compensation plate 9 being arranged between the light-splitting plate 8 and the second mirror 10;
the compensation plate 9 is configured to compensate an optical path of the transmitted vortex light transmitted by the light-splitting plate 8, and transmit the compensated transmitted vortex light to the semi-transparent and semi-reflective film of the light-splitting plate.
The optical path of the transmitted vortex rotation is transmitted to the second reflector after being compensated for the first time by the compensation plate, and the transmitted vortex rotation is reflected to the second vortex rotation after reaching the semi-transparent and semi-reflective film of the light splitting plate after being compensated for the second time by the compensation plate by the second reflector.
It will be appreciated that vortex light is a hollow beam with a helical wavefront structure and zero central intensity. The wave vector of the vortex rotation rotates around the vortex center, resulting in the occurrence of orbital angular momentum of phase exp (im theta), where m is the topological charge number of the vortex rotation, determining the value of the orbital angular momentum of the photon Is about the planck constant. Vortex rotation can be artificially generated by different methods, such as geometrical optical model transformation method, spiral phase plate method, computer-generated hologram method, and space light modulationMethods of fabrication (SLM) and vortex metamaterial generation, and the like. Optical vortices have been applied in many different situations, such as optical trapping, optical communication, microscopic imaging, laser microcomputer, rotational speed detection, simulation of optical black holes, etc.
In the above application, the topological charge of the vortex light plays a key role, so the vortex light beam topological charge number measurement system provided by the embodiment measures the topological charge number of the vortex light beam by analyzing the topological charge number of the vortex light beam, so that the topological charge can be accurately measured, the operation is simple, the principle is simple, the operation is easy, the measurement is rapid, and no additional reference light beam is needed.
It should be noted that the laser emitting unit may include a laser, by which a fundamental mode gaussian beam is generated and emitted, and the laser may be a Helium-neon laser (Helium-neon gas laser). The measurement unit may comprise a collection device, which in some embodiments may be a CCD camera (Charge Coupled Device, CCD), and an analysis device 13.
It should be understood that the vortex beam topology charge number measuring system of the present embodiment includes a light path to be measured and a measuring unit, where the light path to be measured includes a laser emitting unit and a beam interference unit 6, where the beam interference unit 6 includes a beam splitter 8, a first reflecting mirror 7, a second reflecting mirror 10 and a measuring unit, and the beam unit accurately measures and analyzes the topology charge number of the vortex rotation by splitting and interfering the vortex beam emitted by the laser emitting unit and collecting and measuring the vortex beam by the measuring unit.
It can be understood that, in this embodiment, the laser beam is generated by the laser emission unit, and is converted into a vortex beam, the vortex beam is emitted to the beam splitter 8, the vortex beam is split into two reflection vortex rotations and transmission vortex rotations with equal intensity by the beam splitter 8, the reflection vortex beam is reflected by the first reflector 7 and returns to the semi-transparent and semi-reflective film of the beam splitter 8, and is transmitted to be used as the first vortex rotation; the transmitted vortex rotation is projected to the second reflecting mirror 10 and then reflected by the second reflecting mirror 10, and the transmitted vortex rotation reaches the semi-transparent and semi-reflective film of the light splitting plate 8 and is reflected to serve as second vortex rotation; the light intensity of the self-interference superposition of the first vortex light and the second vortex light enters the measuring unit for imaging, the light intensity is collected by the measuring unit, the collecting unit analyzes the target interference image, and the vortex rotation topological charge number is determined.
In a specific implementation, the acquisition unit can obtain the magnitude and sign of the eddy current topological charge number by analyzing the acquired interference intensity diagram.
Further, in order to effectively construct an optical path and accurately emit a vortex beam to the beam splitter 8 for beam splitting, referring to fig. 2, fig. 2 is a schematic diagram of a laser emitting unit including: a laser emitter 1, a collimating beam expander 2, a polarizer 3, a spatial light modulator 4 and a third mirror 5;
the laser transmitter 1 is used for generating a fundamental mode Gaussian beam and transmitting the fundamental mode Gaussian beam to the collimation beam expander 2;
the collimating and beam expander 2 is used for expanding the Gaussian beam of the fundamental mode and then transmitting the Gaussian beam to the polaroid 3;
the polaroid 3 is used for transmitting the expanded Gaussian beam to the spatial light modulator 4;
the spatial light modulator 4 is configured to convert the expanded gaussian beam of the fundamental mode into a vortex beam to be measured, and reflect the vortex beam to the third reflecting mirror 5;
the third reflecting mirror 5 is configured to reflect the vortex beam to the beam splitter 8.
It should be noted that the laser emitter 1 may be a Helium-neon laser (Helium-neon gas laser). And loading a phase diagram of eddy current on a liquid crystal face of the spatial light modulator, and modulating the Gaussian beam of the fundamental mode into eddy current to be detected.
It can be understood that the laser emitter 1 generates and emits a fundamental mode gaussian beam, and the emitted fundamental mode gaussian beam enters the spatial light modulator 4 through the polarizer 3 after being expanded by the collimation expander 2 to generate a vortex beam to be detected; the vortex beam reflected by the spatial light modulator 4 is reflected by the third mirror 5 and enters the spectroscopic plate 8.
Further, in order to ensure the accuracy of the optical path, the incident angle of the fundamental mode gaussian beam entering the spatial light modulator 4 is smaller than 15 degrees, so that the efficiency of converting the fundamental mode gaussian beam into the eddy current rotation to be measured is improved;
the distance between the first reflecting mirror 7 and the spectroscope is a first distance, the distance between the second reflecting mirror 10 and the spectroscope is a second distance, and the first distance is equal to the second distance.
The first vortex optical path is perpendicular to the first reflecting mirror 7, an included angle alpha exists between the second vortex optical path and the first vortex optical path, and the incident angle of the fundamental mode Gaussian beam entering the spatial light modulator 4 is smaller than 15 degrees; the distance between the first reflecting mirror 7 and the spectroscope is a first distance, the distance between the second reflecting mirror 10 and the spectroscope is a second distance, and the first distance is equal to the second distance, so that the accuracy of the optical paths of the first vortex rotation and the second vortex rotation is ensured, the imaging quality is ensured, and the measurement accuracy is improved.
Further, in order to accurately adjust the mirror surface direction of the second reflecting mirror 10, to ensure that the transmitted vortex rotation can be accurately transmitted to the second reflecting mirror 10, and thus accurately reflected to the semi-transparent and semi-transparent reflection of the beam splitter plate 8, the vortex beam topology charge measurement system further comprises at least one adjusting nut 11, and the adjusting nut 11 is arranged on the second reflecting mirror 10;
the adjusting nut 11 is configured to adjust a mirror surface direction of the second reflecting mirror 10, and an included angle exists between the mirror surface direction of the second reflecting mirror 10 and a vertical direction.
It should be noted that the adjusting nut 11 may be disposed at the back of the second reflecting mirror 10 (i.e., the back of the mirror surface), and by adjusting the adjusting nut 11, the mirror surface direction of the second reflecting mirror 10 may be adjusted so that the second reflecting mirror 10 forms an angle α with the vertical direction.
In some embodiments, three adjusting nuts 11 may be disposed on the back surface of the second reflecting mirror 10, so as to accurately adjust the mirror direction of the second reflecting mirror.
Further, in order to accurately adjust the transmitted vortex rotation, the vortex beam topology charge number measurement system further includes: a compensation plate 9, the compensation plate 9 being arranged between the light-splitting plate 8 and the second mirror 10;
the compensation plate 9 is configured to compensate the optical path of the transmitted vortex light transmitted by the light-splitting plate 8, and transmit the compensated transmitted vortex light to the semi-transparent and semi-reflective film 10 of the light-splitting plate, where the number of times of the reflected vortex light passing through the light-splitting plate is greater than that of the transmitted vortex light, so that the projected vortex light passes through the compensation plate twice, thereby eliminating the introduced extra optical path difference.
Further, in order to accurately acquire an interference image and accurately analyze and measure the eddy current topological charge number, the measuring unit includes an imaging device 12 and an analyzing device 13;
the imaging device 12 is used for acquiring a target interference image generated by self-interference between the first vortex light and the second vortex light;
the analysis device 13 is configured to acquire a target interference image acquired by the imaging device 12, and analyze interference fringe features near a phase singular point of the first vortex optical rotation and the second vortex optical rotation in the target interference image to determine a vortex light topological charge number.
It should be noted that the imaging device 12 may be a CCD camera (Charge Coupled Device, CCD). The analysis device 13 may be a vortex beam topology charge measuring device with data processing, network communication and program running functions, such as a computer, etc., or other apparatus or device capable of achieving the same or similar functions.
It can be understood that the analysis device 13 stores interference intensity diagrams with different topological charges, the self-interference of the first vortex rotation and the second vortex rotation generates interference fringes with light and dark alternately, and the centers (phase singular points) of the first vortex rotation and the second vortex rotation respectively generate fork fringes, the bifurcation number of each fork fringe is the size of the topological charges m, and the measurement of the size of the topological charges of the vortex rotation can be completed by counting the bifurcation number.
In a specific implementation, interference intensity diagrams with different topological charges are stored in the analysis device 13, the opening directions of the first vortex optical center fork-shaped stripes and the second vortex optical center fork-shaped stripes determine the signs of the topological charges, the opening of the left fork-shaped stripe is downward, the opening of the right fork-shaped stripe is upward, the topological charges are positive, and otherwise, the topological charges are negative, and the measurement of the signs of the vortex optical center fork-shaped stripes can be completed by observing the opening directions of the two fork-shaped stripes.
According to the embodiment, the laser emission unit emits vortex beams to be detected to the light splitting plate, the light splitting plate splits the vortex beams into reflection vortex rotation and transmission vortex rotation, the reflection vortex rotation is reflected to the first reflecting mirror, the reflection vortex light is transmitted to the first vortex rotation after being reflected to the semi-transparent and semi-reflective film of the light splitting plate through the first reflecting mirror, the optical path of the transmission vortex rotation is transmitted to the second reflecting mirror after being compensated for the first time by the compensating plate, the transmission vortex rotation is reflected to the second vortex rotation after reaching the semi-transparent and semi-reflective film of the light splitting plate after being reflected by the second reflecting mirror for the second time by the compensating plate, the measuring unit analyzes the target interference images of the two vortex rotation, and the topological charge number of the vortex light is determined, so that the problems of complex measuring operation and poor beam coherence are effectively avoided, and the measuring unit is simple to operate and quick on the basis of ensuring the measuring accuracy.
Referring to fig. 3, fig. 3 is a schematic structural diagram of a vortex beam topology load measurement device in a hardware running environment according to an embodiment of the present invention.
As shown in fig. 3, the vortex beam topology charge number measuring apparatus may include: a processor 1001, such as a central processing unit (Central Processing Unit, CPU), a communication bus 1002, a user interface 1003, a network interface 1004, a memory 1005. Wherein the communication bus 1002 is used to enable connected communication between these components. The user interface 1003 may include a Display, an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may further include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a Wireless interface (e.g., a Wireless-Fidelity (Wi-Fi) interface). The Memory 1005 may be a high-speed random access Memory (Random Access Memory, RAM) or a stable nonvolatile Memory (NVM), such as a disk Memory. The memory 1005 may also optionally be a storage device separate from the processor 1001 described above.
Those skilled in the art will appreciate that the configuration shown in fig. 3 is not limiting of the vortex beam topology charge measurement apparatus and may include more or fewer components than shown, or certain components in combination, or a different arrangement of components.
As shown in fig. 3, an operating system, a network communication module, a user interface module, and a vortex beam topology charge number measurement program may be included in a memory 1005 as one type of storage medium.
In the vortex beam topology charge number measurement device shown in fig. 3, the network interface 1004 is mainly used for data communication with a network server; the user interface 1003 is mainly used for data interaction with a user; the processor 1001 and the memory 1005 in the vortex beam topology charge number measuring device can be arranged in the vortex beam topology charge number measuring device, and the vortex beam topology charge number measuring device calls a vortex beam topology charge number measuring program stored in the memory 1005 through the processor 1001 and executes the vortex beam topology charge number measuring method provided by the embodiment of the invention.
The embodiment of the invention provides a vortex beam topology charge number measuring method, and referring to fig. 4, fig. 4 is a schematic flow chart of a first embodiment of the vortex beam topology charge number measuring method.
In this embodiment, the method for measuring the topological charge number of the vortex beam includes the following steps:
step S10: and constructing a measuring light path.
It should be understood that the main body of execution of the method of this embodiment may be a vortex beam topology load measuring device with data processing, network communication and program running functions, such as a computer, or other devices or apparatuses capable of implementing the same or similar functions, which are described herein by taking the above vortex beam topology load measuring device (hereinafter referred to as a measuring device) as an example.
It should be noted that, the optical path to be measured may be an optical path formed by a plurality of optical components, in this embodiment, the optical path to be measured refers to fig. 2, fig. 2 is a schematic structural diagram of the optical path to be measured, and a fundamental mode gaussian beam emitted by a laser emitter enters a spatial light modulator through a polarizing plate after being expanded by a collimation expander, so as to generate a vortex beam to be measured; then, the vortex light beam reflected by the spatial light modulator enters the light splitting plate after being reflected by the third reflecting mirror, the light beam is divided into two reflection vortex rotation and transmission vortex rotation with equal intensity by the light splitting plate, the reflection vortex rotation is reflected by the fixed first reflecting mirror and then returns to the semi-transparent and semi-reflective film of the light splitting plate, and the reflection vortex rotation is transmitted and then used as the first vortex rotation; the transmitted vortex rotation is reflected by the second reflector after being regulated after passing through the compensation plate, and the transmitted vortex rotation is reflected as second vortex rotation after reaching the semi-transparent and semi-reflective film of the light splitting plate through the compensation plate; the light intensity of the self-interference superposition of the first vortex light and the second vortex light enters the acquisition equipment for imaging, and a target interference image is acquired.
Step S20: and acquiring a target interference image generated by self-interference between the first vortex light and the second vortex light in the measuring light path.
It can be understood that interference intensity diagrams with different topological charges are stored in the measuring equipment, interference fringes with alternate brightness and darkness are generated by self-interference of the first vortex rotation and the second vortex rotation, fork-shaped fringes appear at the respective centers (phase singular points) of the first vortex rotation and the second vortex rotation, the bifurcation number of each fork-shaped fringe is the size of the topological charges m, and the measurement of the size of the topological charges of the vortex rotation can be completed by counting the bifurcation number.
Step S30: and analyzing interference fringe features near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image to acquire fringe information of the phase singular points.
In the specific implementation, interference intensity diagrams with different topological charges are stored in the analysis equipment, the opening directions of the first vortex optical center fork-shaped stripes and the second vortex optical center fork-shaped stripes determine the signs of the topological charges, the opening of the left fork-shaped stripe is downward, the opening of the right fork-shaped stripe is upward, the topological charges are positive, the topological charges are negative, and the measurement of the signs of the vortex optical center fork-shaped stripes can be completed by observing the opening directions of the two fork-shaped stripes.
As shown in fig. 5, fig. 5 is a schematic diagram of the light intensity distribution after interference of the first vortex light and the second vortex light, fork-shaped stripes appear at the respective centers (at the phase singular points) after interference of the two light beams, and the fork directions of the corresponding fork-shaped stripes are opposite when the topological charge number m takes positive integer and negative integer.
I.e. the left fork-shaped stripe opening is downward, the right fork-shaped stripe opening is upward, the topological charge number is positive, and vice versa; the measurement of the vortex light topology charge number symbol is realized by observing the opening directions of the two fork-shaped stripes.
Step S40: and determining the topological charge number of the vortex beam based on the stripe information.
It will be appreciated that the measurement device achieves a measurement of the magnitude of the topological charge of the vortex light by counting the number of prongs of the interference intensity pattern, wherein the number of prongs of each fork stripe is equal to the topological charge.
The method comprises the following steps:
the complex amplitude of the first eddy current is referred to as formula 1 below:
E OAM1 ＝A 1 exp(im 1 θ) equation 1
The complex amplitude of the second eddy current is referred to as formula 2 below:
E OAM2 ＝A 2 exp(im 2 θ' +ikrsinα) equation 2
Wherein A is 1 、A 2 And m 1 、m 2 The amplitudes and topological charges of the first eddy current and the second eddy current are respectively represented; θ and θ' are azimuth angles of the first vortex rotation and the second vortex rotation, k is a wave vector, and r is a radial distance on a cross section perpendicular to the propagation axis. The additional phase krsin alpha is derived from the tilt of the two beams relative to each other during propagation, obtained by projecting the tilt wave vector on the cross-section. When the first eddy current and the second eddy current are received by the image collecting apparatus, the interference pattern will be presented in a distribution form of total light intensity, from which an interference intensity pattern can be obtained, referring to the following formula 3:
(m 2 θ′-m 1 θ) is the phase difference caused by the helical phase difference of the first and second eddy currents of the two coherent eddy currents, read by the number and direction of the branches in the interferogram. Since the first vortex light and the second vortex light are self-coherent, the amplitudes and topological charges of the first vortex light and the second vortex light are the same, i.e. A 1 ＝A 2 ,m 1 ＝m 2 The intensity distribution is referred to as formula 4 below:
I＝2A 2 +2A 2 cos[m(θ′-θ)+krsinα]equation 4
The light intensity distribution after the interference of the first vortex light and the second vortex light is drawn by using the above method, as shown in fig. 5, the light intensity distribution is shown as 5, and the fork-shaped stripes appear in the center (at the phase singular point) after the interference of the two light beams. When the topological charge is an integer, generating an integer number of branches at the first vortex optical phase singular point and the second vortex optical phase singular point, wherein the branch number of each branch stripe is equal to the topological charge number, namely the branch number is equal to the topological charge number m; the measurement of the topological charge number of vortex light is realized by counting the bifurcation number of the interference intensity diagram.
It can be understood that in this embodiment, dislocation self-interference is performed by two paths of vortex light, the number of branches of the interference intensity diagram is counted to realize measurement of the topological charge number of the vortex light, and the opening directions of the two branches are observed to realize measurement of the topological charge number symbol of the vortex light.
In specific implementation, referring to fig. 5, fig. 5 is a vortex light interference intensity graph of different topological charges, and the measured topological charges of the measuring device take interference intensity graphs of different values (m= -2, -1, 2) consistent with the vortex light interference intensity graph of different topological charges obtained by simulation.
In the embodiment, a measuring light path is constructed, a target interference image generated by self-interference between a first vortex light and a second vortex light in the measuring light path is collected, interference fringe features near a phase singular point of the first vortex light and the second vortex light in the target interference image are analyzed, fringe information of the phase singular point is obtained, and the topological charge number of vortex light beams is determined based on the fringe information; in the embodiment, dislocation self-interference is performed through two paths of vortex light, the number of branches of an interference intensity diagram is counted to measure the topological charge number of the vortex light, and the opening directions of the two branches are observed to measure the topological charge number symbol of the vortex light.
In addition, the embodiment of the invention also provides a storage medium, wherein a vortex beam topological charge number measuring program is stored on the storage medium, and the vortex beam topological charge number measuring program realizes the steps of the vortex beam topological charge number measuring method when being executed by a processor.
Because the storage medium adopts all the technical solutions of all the embodiments, at least all the beneficial effects brought by the technical solutions of the embodiments are not described in detail herein.
Referring to fig. 5, fig. 5 is a block diagram of a first embodiment of a vortex beam topology charge measuring device according to the present invention.
As shown in fig. 5, the vortex beam topology charge number measuring device provided by the embodiment of the invention includes:
the optical path construction module 10 is used for constructing a measuring optical path;
the image acquisition module 20 is used for acquiring a target interference image generated by self-interference between the first vortex light and the second vortex light in the measuring light path;
an image analysis module 30, configured to analyze interference fringe features near a phase singular point of the first eddy current and the second eddy current in the target interference image, and obtain fringe information of the phase singular point;
a topological charge number measurement module 40 is configured to determine a vortex beam topological charge number based on the fringe information.
It should be noted that, the optical path to be measured may be an optical path formed by a plurality of optical components, in this embodiment, the optical path to be measured refers to fig. 2, fig. 2 is a schematic structural diagram of the optical path to be measured, and a fundamental mode gaussian beam emitted by a laser emitter enters a spatial light modulator through a polarizing plate after being expanded by a collimation expander, so as to generate a vortex beam to be measured; then, the vortex light beam reflected by the spatial light modulator enters the light splitting plate after being reflected by the third reflecting mirror, the light beam is divided into two reflection vortex rotation and transmission vortex rotation with equal intensity by the light splitting plate, the reflection vortex rotation is reflected by the fixed first reflecting mirror and then returns to the semi-transparent and semi-reflective film of the light splitting plate, and the reflection vortex rotation is transmitted and then used as the first vortex rotation; the transmitted vortex rotation is reflected by the second reflector after being regulated after passing through the compensation plate, and the transmitted vortex rotation is reflected as second vortex rotation after reaching the semi-transparent and semi-reflective film of the light splitting plate through the compensation plate; the light intensity of the self-interference superposition of the first vortex light and the second vortex light enters the acquisition equipment for imaging, and a target interference image is acquired.
It can be understood that interference intensity diagrams with different topological charges are stored in the measuring equipment, interference fringes with alternate brightness and darkness are generated by self-interference of the first vortex rotation and the second vortex rotation, fork-shaped fringes appear at the respective centers (phase singular points) of the first vortex rotation and the second vortex rotation, the bifurcation number of each fork-shaped fringe is the size of the topological charges m, and the measurement of the size of the topological charges of the vortex rotation can be completed by counting the bifurcation number.
In the specific implementation, interference intensity diagrams with different topological charges are stored in the analysis equipment, the opening directions of the first vortex optical center fork-shaped stripes and the second vortex optical center fork-shaped stripes determine the signs of the topological charges, the opening of the left fork-shaped stripe is downward, the opening of the right fork-shaped stripe is upward, the topological charges are positive, the topological charges are negative, and the measurement of the signs of the vortex optical center fork-shaped stripes can be completed by observing the opening directions of the two fork-shaped stripes.
As shown in fig. 5, fig. 5 is a schematic diagram of the light intensity distribution after interference of the first vortex light and the second vortex light, fork-shaped stripes appear at the respective centers (at the phase singular points) after interference of the two light beams, and the fork directions of the corresponding fork-shaped stripes are opposite when the topological charge number m takes positive integer and negative integer.
I.e. the left fork-shaped stripe opening is downward, the right fork-shaped stripe opening is upward, the topological charge number is positive, and vice versa; the measurement of the vortex light topology charge number symbol is realized by observing the opening directions of the two fork-shaped stripes.
It will be appreciated that the measurement device achieves a measurement of the magnitude of the topological charge of the vortex light by counting the number of prongs of the interference intensity pattern, wherein the number of prongs of each fork stripe is equal to the topological charge.
The method comprises the following steps:
the complex amplitude of the first eddy current is referred to as formula 1 below:
E OAM1 ＝A 1 exp(im 1 θ) equation 1
The complex amplitude of the second eddy current is referred to as formula 2 below:
E OAM2 ＝A 2 exp(im 2 θ' +ikrsinα) equation 2
Wherein A is 1 、A 2 And m 1 、m 2 The amplitudes and topological charges of the first eddy current and the second eddy current are respectively represented; θ and θ' are azimuth angles of the first vortex rotation and the second vortex rotation, k is a wave vector, and r is a radial distance on a cross section perpendicular to the propagation axis. The additional phase krsin alpha is derived from the tilt of the two beams relative to each other during propagation, obtained by projecting the tilt wave vector on the cross-section. When the first eddy current and the second eddy current are received by the image collecting apparatus, the interference pattern will be presented in a distribution form of total light intensity, from which an interference intensity pattern can be obtained, referring to the following formula 3:
(m 2 θ′-m 1 θ) is the phase difference caused by the helical phase difference of the first and second eddy currents of the two coherent eddy currents, read by the number and direction of the branches in the interferogram. Since the first vortex light and the second vortex light are self-coherent, the amplitudes and topological charges of the first vortex light and the second vortex light are the same, i.e. A 1 ＝A 2 ,m 1 ＝m 2 The intensity distribution is referred to as formula 4 below:
I＝2A 2 +2A 2 cos[m(θ′-θ)+krsinα]equation 4
The light intensity distribution after the interference of the first vortex light and the second vortex light is drawn by using the above method, as shown in fig. 5, the light intensity distribution is shown as 5, and the fork-shaped stripes appear in the center (at the phase singular point) after the interference of the two light beams. When the topological charge is an integer, generating an integer number of branches at the first vortex optical phase singular point and the second vortex optical phase singular point, wherein the branch number of each branch stripe is equal to the topological charge number, namely the branch number is equal to the topological charge number m; the measurement of the topological charge number of vortex light is realized by counting the bifurcation number of the interference intensity diagram.
It can be understood that in this embodiment, dislocation self-interference is performed by two paths of vortex light, the number of branches of the interference intensity diagram is counted to realize measurement of the topological charge number of the vortex light, and the opening directions of the two branches are observed to realize measurement of the topological charge number symbol of the vortex light.
In the embodiment, a measuring light path is constructed, a target interference image generated by self-interference between a first vortex light and a second vortex light in the measuring light path is collected, interference fringe features near a phase singular point of the first vortex light and the second vortex light in the target interference image are analyzed, fringe information of the phase singular point is obtained, and the topological charge number of vortex light beams is determined based on the fringe information; because dislocation self-interference is carried out through two paths of vortex light, the measurement of the topological charge number of the vortex light is realized by counting the bifurcation number of an interference intensity diagram, and the measurement of the topological charge number symbol of the vortex light is realized by observing the opening directions of the two bifurcation, the problems of complex measurement operation and poor beam coherence are effectively avoided, and the method is simple to operate and rapid to measure on the basis of ensuring accurate measurement.
It should be understood that the foregoing is illustrative only and is not limiting, and that in specific applications, those skilled in the art may set the invention as desired, and the invention is not limited thereto.
It should be noted that the above-described working procedure is merely illustrative, and does not limit the scope of the present invention, and in practical application, a person skilled in the art may select part or all of them according to actual needs to achieve the purpose of the embodiment, which is not limited herein.
In addition, technical details not described in detail in this embodiment may refer to the method for measuring the topological charge number of the vortex beam provided in any embodiment of the present invention, which is not described herein.
Furthermore, it should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.
The foregoing embodiment numbers of the present invention are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. Read Only Memory)/RAM, magnetic disk, optical disk) and including several instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present invention.
The foregoing description is only of the preferred embodiments of the present invention, and is not intended to limit the scope of the invention, but rather is intended to cover any equivalents of the structures or equivalent processes disclosed herein or in the alternative, which may be employed directly or indirectly in other related arts.
Claims (10)
1. A vortex beam topology charge measurement system, the vortex beam topology charge measurement system comprising: the device comprises a laser emission unit, a beam splitting plate, a first reflecting mirror, a second reflecting mirror and a measuring unit;
the laser emission unit is used for generating vortex beams and emitting the vortex beams to be detected to the beam splitting plate;
the beam splitter plate is used for splitting the vortex beam into reflection vortex rotation and transmission vortex rotation;
the reflection vortex light is reflected to the first reflector, and is transmitted to the first vortex light after being reflected to the semi-transparent and semi-reflective film of the light splitting plate through the first reflector;
the transmitted vortex light is transmitted to the second reflector, and is reflected to the semi-transparent and semi-reflective film of the light splitting plate through the second reflector, and then is reflected to be second vortex light;
the measuring unit is used for collecting a target interference image between the first vortex light and the second vortex light, analyzing the target interference image and determining the topological charge number of the vortex light;
the vortex beam topology charge number measurement system further comprises: a compensation plate disposed between the beam splitter plate and the second mirror;
the compensating plate is used for compensating the optical path of the transmission vortex rotation transmitted by the light splitting plate and transmitting the compensated transmission vortex light to the semi-transparent and semi-reflective film of the light splitting plate.
2. The vortex beam topology charge measurement system of claim 1, wherein said laser emitting unit comprises: a laser emitter, a collimating expander, a polarizer, a spatial light modulator, and a third mirror;
the laser transmitter is used for generating a fundamental mode Gaussian beam and transmitting the fundamental mode Gaussian beam to the collimation beam expander;
the collimation beam expander is used for expanding the Gaussian beam of the fundamental mode and then transmitting the Gaussian beam to the polaroid;
the polaroid is used for modulating the base mode Gaussian beam after beam expansion into the polarization direction of a liquid crystal plane of the spatial light modulator and transmitting the liquid crystal plane of the spatial light modulator;
the spatial light modulator is used for converting the base mode Gaussian beam after beam expansion into a vortex beam to be detected and reflecting the vortex beam to the third reflector;
the third reflector is used for reflecting the vortex light beams to the light splitting plate.
3. The vortex beam topology charge measurement system of claim 2, wherein an angle of incidence of said fundamental mode gaussian beam into a spatial light modulator is less than 15 degrees;
the distance between the first reflecting mirror and the spectroscope is a first distance, the distance between the second reflecting mirror and the spectroscope is a second distance, and the first distance is equal to the second distance.
4. The vortex beam topology charge measurement system of claim 1, further comprising at least one adjustment nut disposed on said second mirror;
the adjusting nut is used for adjusting the mirror surface direction of the second reflecting mirror, and an included angle exists between the mirror surface direction of the second reflecting mirror and the vertical direction.
5. The vortex beam topology charge measurement system of claim 1, wherein said measurement unit comprises an imaging device;
the imaging device is used for collecting a target interference image generated by self-interference between the first vortex light and the second vortex light.
6. The vortex beam topology charge measurement system of claim 5, wherein said measurement unit further comprises an analysis device;
the analysis device is used for acquiring the target interference image acquired by the imaging device, analyzing interference fringe characteristics near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image, and determining the topological charge number of vortex light.
7. The vortex beam topology charge number measuring method is characterized by being applied to the vortex beam topology charge number measuring system and comprising the following steps of:
constructing a measuring light path;
collecting a target interference image generated by self-interference between a first vortex light and a second vortex light in the measuring light path;
analyzing interference fringe features near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image to obtain fringe information of the phase singular points;
and determining the topological charge number of the vortex beam based on the stripe information.
8. A vortex beam topology charge number measuring device, characterized in that the vortex beam topology charge number measuring device comprises:
the optical path construction module is used for constructing a measuring optical path;
the image acquisition module is used for acquiring a target interference image generated by self-interference between the first vortex light and the second vortex light in the measuring light path;
the image analysis module is used for analyzing interference fringe features near the phase singular points of the first vortex rotation and the second vortex rotation in the target interference image and acquiring fringe information of the phase singular points;
and the topological charge number measuring module is used for determining the topological charge number of the vortex beam based on the stripe information.
9. A vortex beam topology charge measurement apparatus, the vortex beam topology charge measurement apparatus comprising: a memory, a processor, and a vortex beam topology charge measurement program stored on the memory and executable on the processor, the vortex beam topology charge measurement program configured to implement the vortex beam topology charge measurement method of any one of claims 1 to 7.
10. A storage medium having stored thereon a vortex beam topology charge measurement program which when executed by a processor implements the vortex beam topology charge measurement method of any of claims 1 to 7.
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