CN117690777A - Multi-deflection branch ion guiding device and method based on electrostatic field and mass spectrometer - Google Patents
Multi-deflection branch ion guiding device and method based on electrostatic field and mass spectrometer Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 24
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Abstract
The invention discloses a multi-deflection branch ion guiding device and method based on an electrostatic field and a mass spectrometer, wherein the guiding device comprises a mass analyzer, an extraction lens assembly, a deflection branch ion guiding assembly, a linear ion trap assembly and a multipole rod transmission assembly, the deflection branch ion guiding assembly comprises a first hollow electrode, a second hollow electrode, a third hollow electrode and a fourth hollow electrode, the first hollow electrode is positioned at the rear end of the extraction lens assembly, the second hollow electrode is positioned at the front end of the linear ion trap assembly, the third hollow electrode and the mass analyzer are respectively arranged at the front end and the rear end of the multipole rod transmission assembly, the first hollow electrode, the second hollow electrode and the third hollow electrode are positioned at the same side of the fourth hollow electrode, and the first hollow electrode and the third hollow electrode are distributed at two sides of the second hollow electrode. The embodiment of the invention can realize multiple deflection modes simultaneously, remove non-ionic interference substances and improve the ion separation and qualitative accuracy.
Description
Technical Field
The invention relates to the technical field of mass spectrometers, in particular to a multi-deflection branch ion guiding device and method based on an electrostatic field and a mass spectrometer.
Background
At present, mass spectrometry instruments are widely applied to the fields of life sciences, medicine, environmental monitoring and the like, and the basic working principle is to ionize substances to be detected, so as to perform mass analysis according to the charge-mass ratio difference of ions in an electric field or a magnetic field. The traditional mass spectrometer mainly comprises an ion source, an ion optical system, a mass analyzer and a data analysis system. However, in the analysis process, non-ionic substances such as non-ionized neutral particles may appear, and these substances may have serious influence on the analysis result, thus reducing the accuracy and sensitivity of the analysis. It is therefore necessary to separate and purify the substances to be measured before they enter the mass spectrometer in order to remove these non-ionic substances.
To solve this problem, ion beam branching guide techniques are generally employed. The technology deflects, separates and focuses ions by introducing an electromagnetic field, thereby realizing the efficient separation of ions and non-ionic substances. The conventional ion beam branching and guiding technology is mainly based on an ion trap of a radio frequency field and derived products thereof, such as a C-trap and a bent guide rod of a Siemens fly, and the ion beam is branched 90 degrees to a target area by changing the orbit of ions in a linear ion trap or a quadrupole rod so as to carry out mass spectrometry. But is limited by the structure, and cannot realize more ion beam branching modes. In addition, as the movement path of the ions in the ion trap is limited by the radio frequency electrode, for some macromolecular ions, the movement track is complex, and long time is required to reach a stable state, so that the quality discrimination problem is formed.
Disclosure of Invention
The invention aims to provide a multi-deflection branch ion guiding device and method based on an electrostatic field and a mass spectrometer, which can realize multiple deflection modes simultaneously, remove non-ionic interfering substances and improve ion separation and qualitative accuracy.
To achieve the above object, a first aspect of the present invention discloses a multi-deflection branch ion guide device based on an electrostatic field, which includes a mass analyzer, an extraction lens assembly, a deflection branch ion guide assembly, a linear ion trap assembly, and a multipole rod transmission assembly, wherein the deflection branch ion guide assembly includes a first hollow electrode, a second hollow electrode, a third hollow electrode, and a fourth hollow electrode, the first hollow electrode is located at a rear end of the extraction lens assembly, the second hollow electrode is located at a front end of the linear ion trap assembly, the third hollow electrode and the mass analyzer are respectively disposed at front and rear ends of the multipole rod transmission assembly, the first hollow electrode, the second hollow electrode, and the third hollow electrode are located at the same side of the fourth hollow electrode, and the first hollow electrode and the third hollow electrode are distributed at two sides of the second hollow electrode.
As an optional implementation manner, in the first aspect of the embodiment of the present invention, the first hollow electrode, the second hollow electrode, and the third hollow electrode are an incident electrode, a branch electrode, and an exit electrode, respectively; or/and, the first hollow electrode, the second hollow electrode and the third hollow electrode are hollow ring electrodes, and the fourth hollow electrode is a hollow elliptical ring electrode; or/and, the second hollow electrode forms an included angle of 90 degrees with the fourth hollow electrode, or/and, the first hollow electrode forms an included angle of 45 degrees with the second hollow electrode, or/and, the third hollow electrode forms an included angle of 45 degrees with the second hollow electrode.
As an alternative implementation manner, in the first aspect of the embodiment of the present invention, voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode are adjusted to form a plurality of deflection electric fields for deflecting the ion beam.
A method for ion guiding by using the multi-deflection branch ion guiding device based on electrostatic field in the first aspect of the embodiment of the present invention, comprising the following steps:
adjusting voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode to enable the voltage parameters to be respectively in a first voltage, a first second voltage, a first third voltage and a first fourth voltage to form a first deflection electric field, enabling ion beams to enter the first hollow electrode under the action of the first deflection electric field after being focused by the extraction lens assembly, enabling the ion beams to enter the linear ion trap assembly to be subjected to first deflection and then be emitted from the second hollow electrode, and enabling the ion beams to enter the linear ion trap assembly to be subjected to multistage collision to generate MS/MS ion fragments;
when the multistage collision process is carried out, voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode are regulated to enable the voltage parameters to be respectively in a second first voltage, a second voltage, a second third voltage and a second fourth voltage, a second deflection electric field is formed, after an ion beam enters an extraction lens component to be focused, the ion beam enters the first hollow electrode under the action of the second deflection electric field to be subjected to second deflection and then is emitted from the third hollow electrode, and then the ion beam enters a mass analyzer to be subjected to full-scan measurement through a multipole rod transmission component;
after the full scan measurement is completed, the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode are regulated to be respectively in a third first voltage, a third second voltage, a third voltage and a third fourth voltage, a third deflection electric field is formed, ion fragments in the linear ion trap assembly are released, the ion fragments enter the second hollow electrode under the action of the third deflection electric field and then are subjected to third deflection and are ejected from the third hollow electrode, and then the ion fragments enter a mass analyzer through a multipole rod transmission assembly to carry out mass-charge ratio measurement.
In a second aspect of the present embodiment, adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode, and the fourth hollow electrode so that the voltage parameters are respectively at a first one-to-one voltage, a first two-to-one voltage, a first three-to-one voltage, and a first four-to-one voltage to form a first deflection electric field includes:
and adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode to ensure that the first third voltage is equal to the first fourth voltage, the first third voltage is larger than the first one-to-one voltage, and the first one-to-one voltage is larger than the first two voltages.
In a second aspect of the present embodiment, adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode, and the fourth hollow electrode so that the voltage parameters are respectively at the second first voltage, the second third voltage, and the second fourth voltage to form a second deflection electric field includes:
and adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode so that the second first voltage, the second voltage and the second third voltage are equal, and the second fourth voltage is far greater than the second first voltage.
In a second aspect of the present embodiment, adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode, and the fourth hollow electrode so that the voltage parameters thereof are respectively at a third first voltage, a third second voltage, a third voltage, and a third fourth voltage to form a third deflection electric field includes:
and adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode to ensure that the third first voltage is equal to the third fourth voltage, the third first voltage is larger than the third second voltage, and the third second voltage is larger than the third voltage.
In a second aspect of the present invention, an embodiment of a method for generating MS/MS ion fragments by multistage collisions into a linear ion trap assembly, comprising:
and (3) raising the electrode voltage of the end cover of the linear ion trap assembly through an electric control system, so that the linear ion trap assembly starts collision after forming a potential well.
As an alternative implementation manner, in the second aspect of the embodiment of the present invention, the releasing the ion fragments in the linear ion trap assembly includes:
and (3) pulling down the electrode voltage of the end cover of the linear ion trap assembly through an electric control system, so that ion fragments formed by multistage collision are released after the potential barrier of the linear ion trap assembly is lowered.
A mass spectrometer comprising a multi-deflection branched ion guide device based on an electrostatic field as described in the first aspect of the embodiments of the present invention.
Compared with the prior art, the embodiment of the invention has the beneficial effects that:
1. the embodiment of the invention can implement a first deflection mode and a second deflection mode by deflecting the branch ion guide component, thereby eliminating nonionic interference substances; the linear ion trap component is combined in the first deflection mode to perform multiple collisions so as to generate MS/MS fragments, so that MSMS research can be performed, and the accuracy of qualitative identification is improved; the second deflection mode is combined with the multipole rod transmission assembly and the mass analyzer to perform ion mass spectrometry, and a user can singly use the second deflection mode to perform full spectrum scanning analysis or use the first deflection mode (appointed mass-to-charge ratio ion fragmentation mode) to perform structure information measurement of specific ions according to the requirement;
2. the embodiment of the invention can realize branch deflection of two angles by using one deflection branch ion guide component, greatly reduces the volume required by repeated deflection, can realize ion branch guide by using an electrostatic field, and does not need the traditional complex radio frequency circuit design.
3. For the measurement of the large molecular weight, the static electric field can lead the large molecular weight to reach a stable motion state in a very short time, so that the quality discrimination effect of the traditional ion branch guide device can be eliminated.
Drawings
Fig. 1 is a schematic structural diagram of an electrostatic field-based multi-deflection branched ion guide device according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a SolidWorks modeling example of a deflected branch ion guide assembly according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of SIMION simulation results for a 45 deflection mode disclosed in an embodiment of the present invention;
FIG. 4 is a schematic diagram of SIMION simulation results for a 90 deflection mode disclosed in an embodiment of the present invention;
FIG. 5 is a flow chart of a method for multi-deflection branch ion guiding based on electrostatic field according to an embodiment of the present invention;
fig. 6 is a schematic diagram illustrating an ion beam flow direction under a first deflection electric field according to an embodiment of the present invention;
fig. 7 is a schematic diagram illustrating an ion beam flow direction under a second deflection electric field according to an embodiment of the present invention;
fig. 8 is a schematic diagram illustrating an ion beam flow direction under a third deflection electric field according to an embodiment of the present invention.
Wherein: 10. a mass analyzer; 20. an extraction lens assembly; 30. a deflection branch ion guide assembly; 31. a first hollow electrode; 32. a second hollow electrode; 33. a third hollow electrode; 34. a fourth hollow electrode; 40. a linear ion trap assembly; 50. a multipole rod transfer assembly.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and detailed description, wherein it is to be understood that, on the premise of no conflict, the following embodiments or technical features may be arbitrarily combined to form new embodiments. Materials and equipment used in this example are commercially available, except as specifically noted. Examples of such embodiments are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements throughout or elements having like or similar functionality. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application.
In the description of the present application, it should be understood that the terms "upper," "lower," "front," "rear," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, merely to facilitate description of the present application and simplify the description, and do not indicate or imply that the devices or elements being referred to must have a specific orientation, be configured and operated in a specific orientation, and are therefore not to be construed as limiting the present application. In the description of the present application, the meaning of "a plurality" is two or more, unless specifically stated otherwise.
In the description of the present application, it should be noted that, unless explicitly stated or limited otherwise, the terms "connected," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, or connected via an intermediary, or may be a connection between two elements or an interaction relationship between two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
The terms "comprises" and "comprising," along with any variations thereof, in the description and claims of the present application and in the foregoing figures, are intended to cover non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed or inherent to such process, method, article, or apparatus, but may include other steps or elements not expressly listed.
Example 1
Referring to fig. 1, an electrostatic field-based multi-deflection branch ion guide device includes a mass analyzer 10, an extraction lens assembly 20, a deflection branch ion guide assembly 30, a linear ion trap assembly 40, and a multipole rod transmission assembly 50, wherein the mass analyzer 10, the extraction lens assembly 20, the linear ion trap assembly 40, and the multipole rod transmission assembly 50 all adopt conventional structures, and specific structural features thereof will not be described herein.
The deflecting branch ion guide assembly 30 comprises a first hollow electrode 31, a second hollow electrode 32, a third hollow electrode 33 and a fourth hollow electrode 34, and is used for forming a deflecting electric field, so that on one hand, ions can deflect at a corresponding angle after passing through the deflecting electric field, on the other hand, non-ion interference substances in an ion beam can be removed, as charged particles such as ions deflect in the electric field distribution with deflection, but non-charged particles such as neutral particles or photons and the like are not controlled by the deflecting electric field, the ion beam enters the deflecting electric field through the first hollow electrode 31 after being focused by the extraction lens assembly 20, and for the non-charged particles, the non-charged particles fly out directly through the fourth hollow electrode 34 and cannot enter the second hollow electrode 32 or the third hollow electrode 33, so that the effect of removing the non-ion interference substances is realized.
The first hollow electrode 31 is an incident electrode which is matched with the extraction lens assembly 20, the first hollow electrode 31 can be mounted at the rear end of the extraction lens assembly 20, the second hollow electrode 32 is a branch electrode which is matched with the linear ion trap assembly 40, the second hollow electrode 32 can be mounted at the front end of the linear ion trap assembly 40 (the end cover side of the linear ion trap assembly 40), the third hollow electrode 33 is an emergent electrode which is matched with the mass analyzer 10 through the multipole rod transmission assembly 50, the third hollow electrode 33 can be mounted at the front end of the multipole rod transmission assembly 50, and the mass analyzer 10 is mounted at the rear end of the multipole rod transmission assembly 50.
In the preferred embodiment of the present invention, various deflection modes may be realized, and taking a 45 ° deflection mode (realized based on a 45 ° deflection electric field) and a 90 ° deflection mode (realized based on a 90 ° deflection electric field) as an example, the positions of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33, and the fourth hollow electrode 34 may be set as follows:
the first hollow electrode 31, the second hollow electrode 32 and the third hollow electrode 33 are disposed on the same side of the fourth hollow electrode 34, and the second hollow electrode 32 and the fourth hollow electrode 34 form an included angle (plane included angle) of 90 degrees, and meanwhile, the first hollow electrode 31 and the third hollow electrode 33 are symmetrically disposed on two sides of the second hollow electrode 32, and the first hollow electrode 31 and the third hollow electrode 33 form an included angle of 45 degrees with the second hollow electrode 32, wherein the included angle of 45 degrees can be regarded as an intersection point of center extension lines of the electrodes, so that the included angle formed by the center extension lines of the electrodes of the first hollow electrode 31 and the third hollow electrode 33 is 90 degrees.
The first hollow electrode 31, the second hollow electrode 32 and the third hollow electrode 33 are hollow circular ring electrodes, and the fourth hollow electrode 34 is a hollow elliptical ring electrode. By adjusting the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33, and the fourth hollow electrode 34, various deflection electric fields can be formed, and the formed electric fields play a role in deflecting the ion beam.
Fig. 2 is a SolidWorks modeling example of the deflecting branch ion guide assembly 30, and fig. 3-4 show SIMION simulation results of a 45 ° deflection mode and a 90 ° deflection mode, respectively, and by performing SIMION simulation on the SolidWorks modeling example, it can be seen that the ion motion trajectory meets the operation requirement.
The embodiment of the invention can realize the branch deflection of two angles by using one deflection branch ion guide component 30, greatly reduces the volume required by multiple deflection, and can realize the branch guide of ions by using an electrostatic field without the traditional complex radio frequency circuit design. And for the measurement of the large molecular weight, the static electric field can lead the large molecular weight to reach a stable motion state in a very short time, so that the quality discrimination effect of the traditional ion branch guide device can be eliminated.
Example two
Referring to fig. 5, a method for implementing multi-deflection branch ion guiding based on electrostatic field by adopting an embodiment of multi-deflection branch ion guiding device based on electrostatic field may include the following steps:
and S110, adjusting the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33 and the fourth hollow electrode 34 to respectively enable the voltage parameters to be in a first one-to-one voltage, a first two-voltage, a first three-voltage and a first four-voltage to form a first deflection electric field.
Referring to fig. 6, when forming the first deflection electric field, the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33 and the fourth hollow electrode 34 need to satisfy the following conditions: the first third voltage is equal to the first fourth voltage, and the first third voltage is larger than the first one-to-one voltage, and the first one-to-one voltage is larger than the first two-to-two voltage.
Under the condition of the voltage parameter, after the ion beam enters the extraction lens assembly 20 to be focused, the ion beam enters the first hollow electrode 31 under the action of a first deflection electric field to be deflected for the first time (45 DEG deflection here) and is emitted from the second hollow electrode 32, and then enters the linear ion trap assembly 40 to be collided in multiple stages, so that MS/MS ion fragments are generated.
After the ion beam enters the linear ion trap assembly 40, for example, the electrode voltage of the end cover of the linear ion trap assembly 40 can be raised by the electric control system at a preset time after the first deflection electric field is formed, so that the linear ion trap assembly 40 forms a potential well, and ions entering the linear ion trap assembly 40 start to collide, so that MS/MS ion fragments are generated.
And S120, during the multi-stage collision process, adjusting the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33 and the fourth hollow electrode 34 to enable the voltage parameters to be respectively in a second first voltage, a second voltage, a second third voltage and a second fourth voltage to form a second deflection electric field, and recording the second deflection electric field as a second deflection mode.
Referring to fig. 7, when forming the second deflection electric field, the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33 and the fourth hollow electrode 34 need to satisfy the following conditions: the second voltage, the second voltage and the second third voltage are equal, and the second fourth voltage is far greater than the second voltage.
After the ion beam enters the extraction lens assembly 20 and is focused, the ion beam enters the first hollow electrode 31 under the action of a second deflection electric field, is deflected by a second degree (here, deflected by 90 degrees) and is emitted from the third hollow electrode 33, and then enters the mass analyzer 10 through the multipole rod transmission assembly 50 for full-scan measurement.
In some other embodiments, the voltage parameter settings of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33, and the fourth hollow electrode 34 may also be set directly to default to the second deflection mode if only a full sweep measurement is required.
Mass to charge ratio determination of fragment ions can also be achieved by a combination of step S110 and step S130 if a specified mass to charge ratio ion fragmentation study is desired.
And S130, after the full scan measurement is completed, regulating the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33 and the fourth hollow electrode 34 to enable the voltage parameters to be respectively in a third first voltage, a third second voltage, a third voltage and a third fourth voltage to form a third deflection electric field.
Referring to fig. 8, when forming the third deflection electric field, the voltage parameters of the first hollow electrode 31, the second hollow electrode 32, the third hollow electrode 33 and the fourth hollow electrode 34 need to satisfy the following conditions: the third first voltage is equal to the third fourth voltage, the third first voltage is larger than the third second voltage, and the third second voltage is larger than the third voltage.
The electrode voltage of the end cover of the linear ion trap assembly 40 is lowered by an electric control system, so that ion fragments formed by multi-stage collision are released after the potential barrier of the linear ion trap assembly 40 is lowered, the ion fragments enter the second hollow electrode 32 under the action of a third deflection electric field to be deflected for the third time (45 DEG deflection here) and are ejected from the third hollow electrode 33, and then enter the mass analyzer 10 through the multipole rod transmission assembly 50 to carry out mass-charge ratio measurement of the fragment ions.
Example III
Embodiment three discloses a mass spectrometer, which comprises necessary devices such as a power supply system, an ignition system, a cooling system, a gas supply system, a sample injection system and the like, and further comprises the multi-deflection branch ion guiding device based on the electrostatic field of the embodiment one.
Finally, it should be noted that: the above embodiments are merely optional examples of the present invention, and are not intended to limit the scope of the present invention, and any insubstantial changes and substitutions made by those skilled in the art on the basis of the present invention are intended to fall within the scope of the present invention as claimed.
Claims (10)
1. The multi-deflection branch ion guide device based on the electrostatic field is characterized by comprising a mass analyzer, an extraction lens assembly, a deflection branch ion guide assembly, a linear ion trap assembly and a multipole rod transmission assembly, wherein the deflection branch ion guide assembly comprises a first hollow electrode, a second hollow electrode, a third hollow electrode and a fourth hollow electrode, the first hollow electrode is positioned at the rear end of the extraction lens assembly, the second hollow electrode is positioned at the front end of the linear ion trap assembly, the third hollow electrode and the mass analyzer are respectively arranged at the front end and the rear end of the multipole rod transmission assembly, the first hollow electrode, the second hollow electrode and the third hollow electrode are positioned at the same side of the fourth hollow electrode, and the first hollow electrode and the third hollow electrode are distributed at two sides of the second hollow electrode.
2. The electrostatic field based multi-deflection branched ion guiding device of claim 1, wherein said first hollow electrode, second hollow electrode and third hollow electrode are an entrance electrode, a branched electrode and an exit electrode, respectively; or/and, the first hollow electrode, the second hollow electrode and the third hollow electrode are hollow ring electrodes, and the fourth hollow electrode is a hollow elliptical ring electrode; or/and, the second hollow electrode forms an included angle of 90 degrees with the fourth hollow electrode, or/and, the first hollow electrode forms an included angle of 45 degrees with the second hollow electrode, or/and, the third hollow electrode forms an included angle of 45 degrees with the second hollow electrode.
3. The electrostatic field based multi-deflection branch ion guide of claim 1, wherein voltage parameters of the first, second, third and fourth hollow electrodes are adjusted to form a plurality of deflection electric fields for deflecting an ion beam.
4. A method of ion guiding using the electrostatic field based multi-deflection branched ion guiding device of any of claims 1-3, comprising the steps of:
adjusting voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode to enable the voltage parameters to be respectively in a first voltage, a first second voltage, a first third voltage and a first fourth voltage to form a first deflection electric field, enabling ion beams to enter the first hollow electrode under the action of the first deflection electric field after being focused by the extraction lens assembly, enabling the ion beams to enter the linear ion trap assembly to be subjected to first deflection and then be emitted from the second hollow electrode, and enabling the ion beams to enter the linear ion trap assembly to be subjected to multistage collision to generate MS/MS ion fragments;
when the multistage collision process is carried out, voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode are regulated to enable the voltage parameters to be respectively in a second first voltage, a second voltage, a second third voltage and a second fourth voltage, a second deflection electric field is formed, after an ion beam enters an extraction lens component to be focused, the ion beam enters the first hollow electrode under the action of the second deflection electric field to be subjected to second deflection and then is emitted from the third hollow electrode, and then the ion beam enters a mass analyzer to be subjected to full-scan measurement through a multipole rod transmission component;
after the full scan measurement is completed, the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode are regulated to be respectively in a third first voltage, a third second voltage, a third voltage and a third fourth voltage, a third deflection electric field is formed, ion fragments in the linear ion trap assembly are released, the ion fragments enter the second hollow electrode under the action of the third deflection electric field and then are subjected to third deflection and are ejected from the third hollow electrode, and then the ion fragments enter a mass analyzer through a multipole rod transmission assembly to carry out mass-charge ratio measurement.
5. The method of claim 4, wherein adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode, and the fourth hollow electrode to be at the first one-to-one voltage, the first two-to-one voltage, the first three-to-one voltage, and the first four-to-one voltage, respectively, forms the first deflection electric field, comprises:
and adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode to ensure that the first third voltage is equal to the first fourth voltage, the first third voltage is larger than the first one-to-one voltage, and the first one-to-one voltage is larger than the first two voltages.
6. The method of claim 4, wherein adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode, and the fourth hollow electrode to be at the second first voltage, the second voltage, the second third voltage, and the second fourth voltage, respectively, creates the second deflection electric field comprises:
and adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode so that the second first voltage, the second voltage and the second third voltage are equal, and the second fourth voltage is far greater than the second first voltage.
7. The method of claim 4, wherein adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode, and the fourth hollow electrode to be at the third first voltage, the third second voltage, the third voltage, and the third fourth voltage, respectively, forms a third deflection electric field, comprises:
and adjusting the voltage parameters of the first hollow electrode, the second hollow electrode, the third hollow electrode and the fourth hollow electrode to ensure that the third first voltage is equal to the third fourth voltage, the third first voltage is larger than the third second voltage, and the third second voltage is larger than the third voltage.
8. The method of claim 4, wherein entering the linear ion trap assembly performs a multi-stage collision, producing MS/MS ion fragments, comprising:
and (3) raising the electrode voltage of the end cover of the linear ion trap assembly through an electric control system, so that the linear ion trap assembly starts collision after forming a potential well.
9. The method of claim 4, wherein releasing ion fragments in the linear ion trap assembly comprises:
and (3) pulling down the electrode voltage of the end cover of the linear ion trap assembly through an electric control system, so that ion fragments formed by multistage collision are released after the potential barrier of the linear ion trap assembly is lowered.
10. A mass spectrometer comprising the electrostatic field based multi-deflection branch ion guide of any one of claims 1-3.
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2024
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