CN117652696A - Comprehensive test bench comparison test method and device, electronic equipment and storage medium - Google Patents
Comprehensive test bench comparison test method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
The disclosure relates to a comprehensive test bench comparison test method, a comprehensive test bench comparison test device, electronic equipment and a storage medium. Wherein the method comprises the following steps: calibrating the comprehensive test bench based on a preset calibration standard; based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values; and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value. The method and the system can reduce the number of manual measurement per calibration, reduce the influence of abnormal data and manual data input on the evaluation result, and comprehensively evaluate each comprehensive test bench through En values and errors.
Description
Technical Field
The disclosure relates to the field of cigarette testing equipment testing, in particular to a comprehensive test bench comparison testing method, a comprehensive test bench comparison testing device, electronic equipment and a storage medium.
Background
The physical properties of cigarettes and filter sticks are measured by mainly adopting comprehensive test tables for detection and statistical analysis (mean value, standard deviation, maximum value, minimum value, CPK and the like), and the stability of quality indexes of the comprehensive test tables is different due to the differences of equipment manufacturers, equipment models, standard stick accuracy, subjective errors and the like. The factory faces to smoke inspection in the south of the cloud, cross inspection of groups, factory inspection of a technical supervision department, process supervision inspection of a process quality department and workshop process control inspection, wherein the technical supervision department is compared with a technical center of the smoke in the south of the cloud, the process quality department is compared with the technical supervision department, a wrapping workshop is compared with the process quality department by taking measured data of physical properties of cigarettes and filter sticks in the technical supervision department, the process quality department are taken as external statistical data sources, and basic data of rewards of various special items in the wrapping workshop, such as absolute deviation of physical indexes, standard rewards of comprehensive scores of working procedures, accurate control of processes and the like.
Therefore, the indication errors of the comprehensive test table of the wrapping workshop and the comprehensive test tables of the process quality department and the technical supervision department are guaranteed to meet the control standard, the guiding of the comprehensive test table of the workshop to calibrate is an important duty of process quality management personnel, and the contradiction phenomenon that workshop detection data are normal and spot detection data are abnormal is avoided.
In the prior art, at present, a method for comparing a cigarette and filter rod measuring tool with a method for comparing a tracing rod measuring tool is mainly adopted in a factory, the measuring tool comparison method needs a technical supervision department to verify stability of the cigarette and the filter rod, then the cigarette and the filter rod are distributed to a process quality department for comparison, if errors of detection units (quality, suction resistance (pressure drop), circumference and the like) are within a specified control standard, a workshop is compared with the process quality department, otherwise, the process quality department needs to be calibrated again until the control index requirement is met. Because the stability of the measuring tool has randomness and even abnormal values occur occasionally, the measuring result is influenced, and only each comprehensive test bench can be evaluated to meet the control standard and cannot be guided to conduct micro-calibration on the comprehensive test bench. According to the tracing rod measuring tool comparison method, 15 rods of a high rod and a low rod are respectively measured in sequence according to different marks on each rod, and whether the control standard is met is judged through the range. The stability and indication error fluctuation condition of each comprehensive test bench can be clearly analyzed through comparison of the traceability measuring tool, but each rod is expensive, 30 times of measurement are needed each time, and if a certain rod is continuously abnormal, the comparison is likely to influence the test evaluation.
Accordingly, there is a need for one or more approaches to address the above-described problems.
It should be noted that the information disclosed in the above background section is only for enhancing understanding of the background of the present disclosure and thus may include information that does not constitute prior art known to those of ordinary skill in the art.
Disclosure of Invention
It is an object of the present disclosure to provide an integrated test bench alignment test method, apparatus, electronic device, and storage medium, which overcome, at least in part, one or more of the problems due to the limitations and disadvantages of the related art.
According to one aspect of the present disclosure, there is provided a comprehensive test bench comparison test method, including:
calibrating the comprehensive test bench based on a preset calibration standard;
based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values;
and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.
In an exemplary embodiment of the present disclosure, the method further comprises:
and (3) in a standard temperature and humidity environment, after balancing for a preset time period, respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values.
In an exemplary embodiment of the present disclosure, the method further comprises:
in a standard temperature and humidity environment, after balancing for a preset period of time, respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench to generate measurement data;
and judging the abnormal value based on the Grabbs criterion and eliminating the abnormal value.
In an exemplary embodiment of the present disclosure, the method further comprises:
and carrying out outlier judgment based on the Grabbs criterion, removing outliers, carrying out outlier judgment again, and if outliers still exist, carrying out recalibration on the comprehensive test table.
In an exemplary embodiment of the present disclosure, the method further comprises:
the technical supervision department carries out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench respectively, generates measurement data and eliminates abnormal values;
and (3) respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench in the process quality department and the wrapping workshop, generating measurement data and eliminating abnormal values.
In an exemplary embodiment of the present disclosure, the method further comprises:
and calculating an En value based on preset parameters and measured data of the high rod tracing rod and the low rod tracing rod, wherein the En value is as follows:
wherein: x is X Comparison The mean of the measured values of the individual test items of the test-bed involved in the comparison,
X tracing rod The tracing bar determines the mean value of the individual test items,
U tracing rod The trace-out wand expands the uncertainty,
U comparison -contrast spread uncertainty.
In an exemplary embodiment of the present disclosure, the method further comprises:
if the comprehensive test bench I and En I are not less than 1.0, checking maintenance, adjusting and retesting in time;
if the comprehensive test bench is not more than 0.5-En-is not more than 1.0, the test average value is within the comparison control requirement with the reference value of the upper department, and the test result error is judged to meet the control requirement;
if the integrated test bench I < En I <0.5, the integrated test bench is calibrated with the trace-source bar average.
In one aspect of the present disclosure, there is provided an integrated test stand alignment test device comprising:
the test bench calibration module is used for calibrating the comprehensive test bench based on a preset calibration standard;
the measurement data generation module is used for respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values;
and the comparison test module is used for calculating an En value based on preset parameters and measurement data of the high-rod tracing rod and the low-rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.
In one aspect of the present disclosure, there is provided an electronic device comprising:
a processor; and
a memory having stored thereon computer readable instructions which, when executed by the processor, implement a method according to any of the above.
In one aspect of the present disclosure, a computer readable storage medium is provided, on which a computer program is stored, which when executed by a processor, implements a method according to any of the above.
An integrated test stand comparison test method in an exemplary embodiment of the present disclosure includes: calibrating the comprehensive test bench based on a preset calibration standard; based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values; and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value. The method and the system can reduce the number of manual measurement per calibration, reduce the influence of abnormal data and manual data input on the evaluation result, and comprehensively evaluate each comprehensive test bench through En values and errors.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The above and other features and advantages of the present disclosure will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings.
FIG. 1 illustrates a flow chart of a comprehensive test bench alignment test method according to an exemplary embodiment of the present disclosure;
FIG. 2 illustrates a logic flow diagram of a comprehensive test bench alignment test method according to an exemplary embodiment of the present disclosure;
FIG. 3 illustrates a schematic block diagram of an integrated test bench alignment test device according to an exemplary embodiment of the disclosure;
FIG. 4 schematically illustrates a block diagram of an electronic device according to an exemplary embodiment of the present disclosure;
fig. 5 schematically illustrates a schematic diagram of a computer-readable storage medium according to an exemplary embodiment of the present disclosure.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. However, the exemplary embodiments can be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar parts, and thus a repetitive description thereof will be omitted.
Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the disclosure. One skilled in the relevant art will recognize, however, that the disclosed aspects may be practiced without one or more of the specific details, or with other methods, components, materials, devices, steps, etc. In other instances, well-known structures, methods, devices, implementations, materials, or operations are not shown or described in detail to avoid obscuring aspects of the disclosure.
The block diagrams depicted in the figures are merely functional entities and do not necessarily correspond to physically separate entities. That is, these functional entities may be implemented in software, or in one or more software-hardened modules, or in different networks and/or processor devices and/or microcontroller devices.
In this exemplary embodiment, a comprehensive test bench comparison test method is provided first; referring to fig. 1, the test bench alignment test method may include the steps of:
step S110, calibrating the comprehensive test bench based on a preset calibration standard;
step S120, respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values;
and step S130, calculating an En value based on preset parameters and measurement data of the high-rod tracing rod and the low-rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.
An integrated test stand comparison test method in an exemplary embodiment of the present disclosure includes: calibrating the comprehensive test bench based on a preset calibration standard; based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values; and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value. The method and the system can reduce the number of manual measurement per calibration, reduce the influence of abnormal data and manual data input on the evaluation result, and comprehensively evaluate each comprehensive test bench through En values and errors.
Next, a test method for the integrated test bench comparison in the present exemplary embodiment will be further described.
Embodiment one:
in step S110, calibration may be performed on the integrated test bench based on a preset calibration standard.
In step S120, repeated measurement of the high-rod tracing rod and the low-rod tracing rod for a preset number of times may be performed based on the calibrated comprehensive test bench, so as to generate measurement data and reject abnormal values.
In an embodiment of the present example, the method further comprises:
and (3) in a standard temperature and humidity environment, after balancing for a preset time period, respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values.
In an embodiment of the present example, the method further comprises:
in a standard temperature and humidity environment, after balancing for a preset period of time, respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench to generate measurement data;
and judging the abnormal value based on the Grabbs criterion and eliminating the abnormal value.
In an embodiment of the present example, the method further comprises:
and carrying out outlier judgment based on the Grabbs criterion, removing outliers, carrying out outlier judgment again, and if outliers still exist, carrying out recalibration on the comprehensive test table.
In an embodiment of the present example, the method further comprises:
the technical supervision department carries out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench respectively, generates measurement data and eliminates abnormal values;
and (3) respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench in the process quality department and the wrapping workshop, generating measurement data and eliminating abnormal values.
In step S130, an En value may be calculated based on preset parameters and measurement data of the high-rod tracing rod and the low-rod tracing rod, and a comparison test may be performed on the comprehensive test bench based on the En value.
In an embodiment of the present example, the method further comprises:
and calculating an En value based on preset parameters and measured data of the high rod tracing rod and the low rod tracing rod, wherein the En value is as follows:
wherein: x is X Comparison The mean of the measured values of the individual test items of the test-bed involved in the comparison,
X tracing rod The tracing bar determines the mean value of the individual test items,
U tracing rod The trace-out wand expands the uncertainty,
U comparison -contrast spread uncertainty.
In an embodiment of the present example, the method further comprises:
if the comprehensive test bench I and En I are not less than 1.0, checking maintenance, adjusting and retesting in time;
if the comprehensive test bench is not more than 0.5-En-is not more than 1.0, the test average value is within the comparison control requirement with the reference value of the upper department, and the test result error is judged to meet the control requirement;
if the integrated test bench I < En I <0.5, the integrated test bench is calibrated with the trace-source bar average.
Embodiment two:
in the embodiment of the present example, as shown in fig. 2, the comprehensive test bench comparison test method of the present disclosure mainly includes a tracing bar, a standard library, test data of each comprehensive test bench, and a statistical analysis platform, where the tracing bar is a tested monitoring comparison bar, and includes 15 high bars and 15 low bars, the standard library is test result statistical data of 15 bars, the test data of the comprehensive test bench is distinguished according to a specific IP interface number, and each group of comparison data is numbered: department (department) +traceability bar comparison + comprehensive test number + test time, after the test is finished, the department can actively upload data to a statistical analysis platform, the statistical analysis platform calculates and analyzes the data of each test bench and the data of a standard library, and draws machine comparison data: average, maximum, small mouth.
In the embodiment of the present example, a standard library is established: after the comparison detection of each quarter technical supervision department and the cloud south China center tobacco technology center accords with the control standard, the standard library data are updated every half year: according to the cigarette specification (medium, regular) classification (high rod, low rod), according to rod number formation: and measuring each of the high rod and the low rod for 6 times one by one, judging whether abnormal values exist or not by using a Grabbs criterion, and if the maximum difference meets the stability requirement, counting the average value of each item as a reference value, the maximum difference value and the standard deviation if the related index meets the requirement, and sequencing according to the maximum difference value of each item after 180 times of measurement, wherein the smaller the maximum difference value is, the more front, and the better the stability is. And then calculating the test items of each tracing rod according to a weighted formula: poor absorption resistance 1+ poor quality
* The weighted results are ranked by 0.2+ circle range 0.5+ length range 0.2+ total ventilation 02, with lower scores being ranked higher.
In the present exemplary embodiment, the logic flow comprises:
1. comprehensive test bench calibration: the department and workshop comprehensive test board calibrates the comprehensive test board by using the calibration standard parts (standard bars) of the comprehensive test boards, and enters a comparison link after the calibration control requirement of the comprehensive test board is met, otherwise, the comprehensive test board needs to be recalibrated.
2. And (3) comparison test:
a. the technical supervision department selects a certain high-stick and low-stick tracing stick, balances (15-20) the sticks in a standard temperature and humidity environment, selects the filter stick number and the repeated measurement times (generally 5 times) of the comprehensive test bench, after the measurement is finished, the comprehensive test bench transmits data to statistical analysis and evaluation through an MES data acquisition program, the comprehensive test bench firstly carries out abnormal value judgment G (a, n) (annotation: graibus criterion), if abnormal values exist, the abnormal single values are removed, the second round of abnormal value judgment is carried out, if the second round of abnormal values do not exist, whether comparison control requirements are met is calculated, if the second round of abnormal values still exist, the comparison test of the comprehensive test bench of the technical supervision department is terminated, and a recalibration link is carried out.
b. After the technical supervision department meets the comparison control requirement, the comprehensive test bench of the process quality department and the rolling workshop is carried out according to the same steps as the technical supervision department.
c. The statistical analysis platform measures the items according to the measuring sequence of the test data of departments and rolling up rooms to form a line graph, and the deleted abnormal single value data reserves the measuring sequence.
By statistical analysis of En values (95% confidence requirement):
wherein: x is X Comparison The mean of the measured values of the individual test items of the test-bed involved in the comparison,
X tracing rod The tracing bar determines the mean value of the individual test items,
U tracing rod The trace-out wand expands the uncertainty,
U comparison -contrast spread uncertainty.
If the comprehensive test bench I and En I are not less than 1.0, checking maintenance, adjusting and retesting in time;
if the comprehensive test bench is not more than 0.5-En-is not more than 1.0, the test average value is within the comparison control requirement with the reference value of the upper department, and the test result error is judged to meet the control requirement;
if the integrated test bench I < En I <0.5, the integrated test bench is calibrated with the trace-source bar average.
In the embodiment of the example, the comprehensive test bench is used for comparison test, so that the number of times of testing the tracing rod and the probability of participation in evaluation of abnormal constant values possibly influencing the measurement result are reduced, the stability of a certain comprehensive test bench can be quantitatively analyzed, the tracing rod is formed for all comprehensive test benches instead of a technical supervision department-process quality department-workshop, and the increase of uncertainty in the standard transmission process is reduced.
It should be noted that although the steps of the methods of the present disclosure are illustrated in the accompanying drawings in a particular order, this does not require or imply that the steps must be performed in that particular order or that all of the illustrated steps be performed in order to achieve desirable results. Additionally or alternatively, certain steps may be omitted, multiple steps combined into one step to perform, and/or one step decomposed into multiple steps to perform, etc.
In addition, in the present exemplary embodiment, a comprehensive test bench comparison test device is also provided. Referring to fig. 3, the test bench alignment test device 400 may include: a test station calibration module 410, a measurement data generation module 420, and an alignment test module 430. Wherein:
the test bench calibration module 410 is configured to calibrate the comprehensive test bench based on a preset calibration standard;
the measurement data generating module 420 is configured to perform repeated measurement for a high-rod tracing rod and a low-rod tracing rod for a preset number of times based on the calibrated comprehensive test bench, generate measurement data, and reject abnormal values;
and the comparison test module 430 is configured to calculate an En value based on preset parameters and measurement data of the high-rod tracing rod and the low-rod tracing rod, and perform comparison test on the comprehensive test bench based on the En value.
The specific details of the test bench comparison test device module in each of the above description are described in detail in a corresponding test bench comparison test method, and therefore will not be described herein.
It should be noted that although in the above detailed description a number of modules or units of an integrated test bench alignment test apparatus 400 are mentioned, this division is not mandatory. Indeed, the features and functionality of two or more modules or units described above may be embodied in one module or unit in accordance with embodiments of the present disclosure. Conversely, the features and functions of one module or unit described above may be further divided into a plurality of modules or units to be embodied.
In addition, in an exemplary embodiment of the present disclosure, an electronic device capable of implementing the above method is also provided.
Those skilled in the art will appreciate that the various aspects of the invention may be implemented as a system, method, or program product. Accordingly, aspects of the invention may be embodied in the following forms, namely: an entirely hardware embodiment, an entirely software embodiment (including firmware, micro-code, etc.) or an embodiment combining hardware and software aspects may be referred to herein as a "circuit," module "or" system.
An electronic device 500 according to such an embodiment of the invention is described below with reference to fig. 4. The electronic device 500 shown in fig. 4 is merely an example, and should not be construed as limiting the functionality and scope of use of embodiments of the present invention.
As shown in fig. 4, the electronic device 500 is embodied in the form of a general purpose computing device. The components of electronic device 500 may include, but are not limited to: the at least one processing unit 510, the at least one memory unit 520, a bus 530 connecting the different system components (including the memory unit 520 and the processing unit 510), and a display unit 540.
Wherein the storage unit stores program code that is executable by the processing unit 510 such that the processing unit 510 performs steps according to various exemplary embodiments of the present invention described in the above-mentioned "exemplary methods" section of the present specification. For example, the processing unit 510 may perform steps S110 to S130 as shown in fig. 1.
The storage unit 520 may include readable media in the form of volatile storage units, such as Random Access Memory (RAM) 5201 and/or cache memory unit 5202, and may further include Read Only Memory (ROM) 5203.
The storage unit 520 may also include a program/utility 5204 having a set (at least one) of program modules 5205, such program modules 5205 including, but not limited to: an operating system, one or more application programs, other program modules, and program data, each or some combination of which may include an implementation of a network environment.
Bus 530 may be one or more of several types of bus structures including a memory unit bus or memory unit controller, a peripheral bus, an accelerated graphics port, a processing unit, or a local bus using any of a variety of bus architectures.
The electronic device 500 may also communicate with one or more external devices 570 (e.g., keyboard, pointing device, bluetooth device, etc.), with one or more devices that enable a user to interact with the electronic device 500, and/or with any device (e.g., router, modem, etc.) that enables the electronic device 500 to communicate with one or more other computing devices. Such communication may occur through an input/output (I/O) interface 550. Also, electronic device 500 may communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN), and/or a public network, such as the Internet, through network adapter 560. As shown, network adapter 560 communicates with other modules of electronic device 500 over bus 530. It should be appreciated that although not shown, other hardware and/or software modules may be used in connection with electronic device 500, including, but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, data backup storage systems, and the like.
From the above description of embodiments, those skilled in the art will readily appreciate that the example embodiments described herein may be implemented in software, or in combination with the necessary hardware. Thus, the technical solution according to the embodiments of the present disclosure may be embodied in the form of a software product, which may be stored in a non-volatile storage medium (may be a CD-ROM, a U-disk, a mobile hard disk, etc.) or on a network, and includes several instructions to cause a computing device (may be a personal computer, a server, a terminal device, or a network device, etc.) to perform the method according to the embodiments of the present disclosure.
In an exemplary embodiment of the present disclosure, a computer-readable storage medium having stored thereon a program product capable of implementing the method described above in the present specification is also provided. In some possible embodiments, the various aspects of the invention may also be implemented in the form of a program product comprising program code for causing a terminal device to carry out the steps according to the various exemplary embodiments of the invention as described in the "exemplary methods" section of this specification, when said program product is run on the terminal device.
Referring to fig. 5, a program product 600 for implementing the above-described method according to an embodiment of the present invention is described, which may employ a portable compact disc read only memory (CD-ROM) and include program code, and may be run on a terminal device, such as a personal computer. However, the program product of the present invention is not limited thereto, and in this document, a readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium can be, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: an electrical connection having one or more wires, a portable disk, a hard disk, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
The computer readable signal medium may include a data signal propagated in baseband or as part of a carrier wave with readable program code embodied therein. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A readable signal medium may also be any readable medium that is not a readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Program code for carrying out operations of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, C++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device, partly on a remote computing device, or entirely on the remote computing device or server. In the case of remote computing devices, the remote computing device may be connected to the user computing device through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computing device (e.g., connected via the Internet using an Internet service provider).
Furthermore, the above-described drawings are only schematic illustrations of processes included in the method according to the exemplary embodiment of the present invention, and are not intended to be limiting. It will be readily appreciated that the processes shown in the above figures do not indicate or limit the temporal order of these processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, for example, among a plurality of modules.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any adaptations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It is to be understood that the present disclosure is not limited to the precise arrangements and instrumentalities shown in the drawings, and that various modifications and changes may be effected without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (10)
1. The comprehensive test bench comparison test method is characterized by comprising the following steps:
calibrating the comprehensive test bench based on a preset calibration standard;
based on the calibrated comprehensive test bench, respectively carrying out repeated measurement of preset times on the high-rod tracing rod and the low-rod tracing rod, generating measurement data and eliminating abnormal values;
and calculating an En value based on preset parameters and measurement data of the high rod tracing rod and the low rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.
2. The integrated test bench alignment test method of claim 1, wherein the method further comprises:
and (3) in a standard temperature and humidity environment, after balancing for a preset time period, respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values.
3. The integrated test bench alignment test method of claim 2, wherein the method further comprises:
in a standard temperature and humidity environment, after balancing for a preset period of time, respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench to generate measurement data;
and judging the abnormal value based on the Grabbs criterion and eliminating the abnormal value.
4. The integrated test bench alignment test method of claim 3, wherein the method further comprises:
and carrying out outlier judgment based on the Grabbs criterion, removing outliers, carrying out outlier judgment again, and if outliers still exist, carrying out recalibration on the comprehensive test table.
5. The integrated test bench alignment test method of claim 2, wherein the method further comprises:
the technical supervision department carries out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench respectively, generates measurement data and eliminates abnormal values;
and (3) respectively carrying out repeated measurement on the high-rod tracing rod and the low-rod tracing rod for preset times based on the calibrated comprehensive test bench in the process quality department and the wrapping workshop, generating measurement data and eliminating abnormal values.
6. The integrated test bench alignment test method of claim 1, wherein the method further comprises:
and calculating an En value based on preset parameters and measured data of the high rod tracing rod and the low rod tracing rod, wherein the En value is as follows:
wherein: x is X Comparison The mean of the measured values of the individual test items of the test-bed involved in the comparison,
X tracing rod The tracing bar determines the mean value of the individual test items,
U tracing rod The trace-out wand expands the uncertainty,
U comparison -contrast spread uncertainty.
7. The integrated test bench alignment test method of claim 6, wherein the method further comprises:
if the comprehensive test bench I and En I are not less than 1.0, checking maintenance, adjusting and retesting in time;
if the comprehensive test bench is not more than 0.5-En-is not more than 1.0, the test average value is within the comparison control requirement with the reference value of the upper department, and the test result error is judged to meet the control requirement;
if the integrated test bench I < En I <0.5, the integrated test bench is calibrated with the trace-source bar average.
8. An integrated test stand comparison test device, the device comprising:
the test bench calibration module is used for calibrating the comprehensive test bench based on a preset calibration standard;
the measurement data generation module is used for respectively carrying out repeated measurement for preset times on the high-rod tracing rod and the low-rod tracing rod based on the calibrated comprehensive test bench, generating measurement data and eliminating abnormal values;
and the comparison test module is used for calculating an En value based on preset parameters and measurement data of the high-rod tracing rod and the low-rod tracing rod, and comparing and testing the comprehensive test bench based on the En value.
9. An electronic device, comprising
A processor; and
a memory having stored thereon computer readable instructions which, when executed by the processor, implement the method according to any of claims 1 to 7.
10. A computer-readable storage medium, characterized in that a computer program is stored thereon, which computer program, when being executed by a processor, implements the method according to any of claims 1 to 7.
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