CN117590218A - Test circuit and working method thereof - Google Patents
Test circuit and working method thereof Download PDFInfo
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- CN117590218A CN117590218A CN202311573163.4A CN202311573163A CN117590218A CN 117590218 A CN117590218 A CN 117590218A CN 202311573163 A CN202311573163 A CN 202311573163A CN 117590218 A CN117590218 A CN 117590218A
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- 238000000034 method Methods 0.000 title claims abstract description 26
- 238000001514 detection method Methods 0.000 claims abstract description 46
- 230000002159 abnormal effect Effects 0.000 claims description 40
- 238000005070 sampling Methods 0.000 claims description 19
- 238000010586 diagram Methods 0.000 description 11
- 230000005856 abnormality Effects 0.000 description 4
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
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Abstract
A test circuit and a working method of the test circuit, the test circuit comprises: a low voltage switching circuit module; a low voltage switch including a first end and a second end, the first end and the second end being coupled with the low voltage switch circuit module, respectively; a detection module including a third end coupled to the first end and a fourth end coupled to the second end; the first end and the second end are respectively coupled with the voltage comparison module, and the voltage comparison module outputs a first signal which is used for judging the opening and closing states of the switch. The accuracy and the reliability of the detection of the test circuit are improved.
Description
Technical Field
The present invention relates to the field of circuits, and in particular, to a test circuit and a working method of the test circuit.
Background
The low-voltage switch is generally applied to a circuit below a safety voltage of 36V, and the on and off of the circuit are realized by operating the on and off of the low-voltage switch.
In order to realize the requirements of low cost and wide application, most low-voltage switches are not provided with feedback contacts, so that after a switch closing or opening signal is given, whether the actual action of the switch is correct or not can be directly checked without feedback quantity, and whether the switch is damaged or not can not be rapidly judged, thereby complicating the positioning problem and solving the problem.
Therefore, it is necessary to solve the problem that the state of the switch cannot be accurately determined.
Disclosure of Invention
The invention provides a test circuit and a working method of the test circuit, which are used for effectively solving the problem that the state of a switch cannot be accurately judged.
In order to solve the above technical problems, the technical solution of the present invention provides a test circuit, including: a low voltage switching circuit module; a low voltage switch including a first end and a second end, the first end and the second end being coupled with the low voltage switch circuit module, respectively; a detection module including a third end coupled to the first end and a fourth end coupled to the second end; the first end and the second end are respectively coupled with the voltage comparison module, and the voltage comparison module outputs a first signal which is used for judging the opening and closing states of the switch.
Optionally, the voltage comparison module includes: the voltage sampling loop is coupled with the first end and the second end of the low-voltage switch respectively and is used for acquiring the voltages of the first end and the second end; and the voltage upper limit and lower limit comparator circuit is coupled with the voltage sampling circuit, and the first signal is output by the voltage upper limit and lower limit comparator circuit.
Optionally, the detection module includes: the first power supply end comprises a first positive electrode and a first negative electrode; a main circuit coupled to the first positive electrode, the main circuit including a first resistor; the main circuit is coupled with the first node, and two ends of the first resistor are respectively coupled with the first positive electrode and the first node; the first branch circuit is coupled with the first node and comprises a second resistor, two ends of the second resistor are respectively coupled with the first node and the first end of the low-voltage switch, and the first branch circuit is the third end; the second branch circuit is coupled with the first node and comprises a third resistor, two ends of the third resistor are respectively coupled with the first node and the second end of the low-voltage switch, and the second branch circuit is the fourth end.
Optionally, the detection module further includes: the first comparator outputs a second signal, the first comparator comprises a second positive electrode and a second negative electrode, the second positive electrode is coupled with the first node, the second negative electrode is coupled with a reference voltage providing end, and the reference voltage providing end is used for providing a reference voltage so that the first comparator outputs the second signal.
Optionally, the detection module further includes: a second node, two ends of the third resistor are coupled with the first node and the second node respectively, and the second node is coupled with a second end of the low-voltage switch; and the first negative electrode is coupled with the grounding end, and the second node is coupled with the grounding end.
Optionally, the main circuit further includes: and two ends of the first diode are respectively coupled with the first resistor and the first node.
Optionally, the first branch further includes: and two ends of the second diode are respectively coupled with the first node and the second resistor.
Optionally, the second branch further includes: and two ends of the third diode are respectively coupled with the first node and the third resistor.
Optionally, the resistance value of the first resistor is larger than the resistance value of the second resistor; the resistance value of the third resistor is larger than that of the second resistor.
Optionally, the low-voltage switch includes: low voltage relay, low voltage contactor, low voltage power device or low voltage manual switch.
Correspondingly, the technical scheme of the invention also provides a working method of the test circuit, which comprises the following steps: providing a test circuit; acquiring a feedback signal of the low-voltage switch, wherein the feedback signal comprises a closing signal or an opening signal; acquiring a first signal according to a voltage comparison module; and acquiring a normal or abnormal result of the low-voltage switch according to the feedback signal and the first signal.
Optionally, the first signal includes a low level signal or a high level signal.
Optionally, according to the feedback signal and the first signal, obtaining a result of the low-voltage switch being normal or abnormal includes: when the feedback signal of the low-voltage switch is a closing signal, if the first signal is a low-level signal, the low-voltage switch is judged to be in a closing state, and the feedback signal of the low-voltage switch is consistent with the feedback signal of the low-voltage switch, and the low-voltage switch is normal.
Optionally, according to the feedback signal and the first signal, obtaining a result of the low-voltage switch being normal or abnormal includes: when the feedback signal of the low-voltage switch is an off signal, if the first signal is a high-level signal, the low-voltage switch is judged to be in an off state, and is consistent with the feedback signal of the low-voltage switch, and the low-voltage switch is normal.
Optionally, the method further comprises: acquiring a second signal according to the detection module, wherein the second signal comprises a low-level signal or a high-level signal; and acquiring a normal or abnormal result of the low-voltage switch according to the feedback signal, the first signal and the second signal.
Optionally, according to the feedback signal, the second signal and the first signal, obtaining a result of the low-voltage switch being normal or abnormal includes: when the feedback signal of the low-voltage switch is a closing signal, if the second signal is a low-level signal and the first signal is a low-level signal, judging that the low-voltage switch is in a closing state and is consistent with the feedback signal of the low-voltage switch, and the low-voltage switch is normal; and if at least one of the second signal and the first signal is a high-level signal, judging that the low-voltage switch is abnormal.
Optionally, according to the feedback signal, the second signal and the first signal, obtaining a result of the low-voltage switch being normal or abnormal includes: when the feedback signal of the low-voltage switch is an off signal, if the first signal is a high-level signal, judging that the low-voltage switch is in an off state, and keeping consistent with the feedback signal of the low-voltage switch, wherein the low-voltage switch is normal; and if the first signal is a low-level signal, judging that the low-voltage switch is abnormal.
Optionally, if the second signal is not output, it is determined that the first power supply terminal is abnormal.
Compared with the prior art, the technical scheme of the invention has the following beneficial effects:
according to the test circuit, the voltage comparison modules are added at the two ends of the low-voltage switch, the voltage comparison modules can acquire the voltage conditions at the two ends of the low-voltage switch and output the first signal, the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained according to the second signal, the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged.
Further, the detection module further comprises a first comparator, the first comparator outputs a second signal, and the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained according to the first signal and the second signal, so that the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged; in addition, the second signal may also determine whether an abnormality occurs in the first power supply terminal.
According to the working method of the test circuit, the voltage comparison modules at the two ends of the low-voltage switch of the test circuit can obtain the voltage conditions at the two ends of the low-voltage switch and output the first signal, and the feedback signals of the low-voltage switch are combined, so that the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained, the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged.
Further, the detection module further comprises a first comparator, the first comparator outputs a second signal, and the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained according to the first signal and the second signal and by combining a feedback signal of the low-voltage switch, so that the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged; in addition, the second signal may also determine whether an abnormality occurs in the first power supply terminal.
Drawings
FIG. 1 is a schematic diagram of a test circuit in one embodiment;
FIGS. 2-5 are schematic diagrams of a test circuit according to an embodiment of the invention;
FIG. 6 is a schematic diagram of a test circuit according to another embodiment of the invention;
FIGS. 7-9 are schematic diagrams of the workflow of a test circuit in an embodiment of the invention;
fig. 10 to 12 are schematic diagrams of the operation flow of the test circuit according to another embodiment of the present invention.
Detailed Description
As described in the background art, it is necessary to solve the problem that the state of the switch cannot be accurately determined. The analysis will now be described with reference to specific examples.
FIG. 1 is a schematic diagram of a test circuit in one embodiment.
Referring to fig. 1, the test circuit includes: a low voltage switching circuit module; a low voltage switch LVS, the low voltage switch LVS including a first end a and a second end B, the first end a and the second end B being coupled with the low voltage switch circuit module, respectively; a detection module, the detection module comprising: a power supply end DC including a first positive electrode and a first negative electrode; a first resistor R1 coupled to the first positive electrode; a first diode D1 coupled to the first resistor R1; a first node C, two ends of the first diode D1 are coupled to the first resistor R1 and the first node C, respectively; a first branch coupled to the first node C, the first branch including a second diode D2 and a second resistor R2, two ends of the second diode D2 being coupled to the first node C and the second resistor R2, respectively, and two ends of the second resistor R2 being coupled to the second diode D2 and the first end a of the switch, respectively; a second branch coupled to the first node C, the second branch including a third diode D3 and a third resistor R3, both ends of the third diode D3 being coupled to the first node C and the third resistor R3, respectively; a second node D, two ends of the third resistor R3 are coupled to the third diode D3 and the second node D, respectively, and the second node D is coupled to the second end B of the switch; a comparator COMP coupled to the first node C, the comparator COMP including a second positive electrode coupled to the first node C and a second negative electrode coupled to a reference voltage supply terminal Vref 1 for providing a reference voltage to enable the comparator COMP to output a signal Sign; and the first negative electrode is coupled with the ground terminal G, and the second node D is coupled with the ground terminal G.
In the test circuit, the low-voltage switch circuit module is a circuit where the low-voltage switch LVS is located, for example, a battery cell of a battery, the voltage of the battery cell is below 36V safety voltage, the battery cell comprises a lithium battery cell, a solid-state battery cell, a lead-acid battery cell and the like, the test circuits applied to the battery cells in laboratory tests and factory tests all have low-voltage switches, the low-voltage switches are connected between the battery cells and equipment, and the connection and disconnection of the battery cells and the equipment are realized by operating the connection and disconnection of the low-voltage switch LVS. The detection module in the test circuit is used for detecting and judging the real closing state or the real opening state of the low-voltage switch LVS.
The low voltage switch LVS without its own feedback contact cannot directly obtain the actual state of the switch when applied, so one approach is to select a device with a feedback contact when the switch is selected, which makes the selection of the type narrow, the selection of the type difficult, the cost increases, and the effective circuit may not have suitable switching devices. Another approach is not to judge the switch state, but the position is not well determined when a problem occurs, which is more likely to lead to the problem being amplified. In order to meet the requirements of low cost and wide application, most low-voltage switches LVS are not provided with feedback contacts, so that after a switch closing or opening signal is given, whether the actual action of the switch is correct or not can be directly checked without feedback quantity, and whether the switch is damaged or not can not be rapidly judged, thereby complicating the positioning problem and solving the problem.
With continued reference to fig. 1, when the low-voltage switch LVS is turned on, the switch state may be accurately detected, but when the low-voltage switch LVS is turned off, there is a case where the low-voltage switch LVS is originally turned off, but is erroneously detected as being turned on. Therefore, the application range of the circuit is narrow, many circuits cannot be applied, and the voltage at two ends of the tested low-voltage switch LVS and the condition of the low-voltage switch circuit module are required to be much, otherwise, the condition of false detection can occur in a large probability, and therefore the circuit has a large limitation.
Specifically, first, when the low voltage switch LVS is turned off, it is required that the voltage of the first terminal a of the low voltage switch LVS must be higher than the voltage of the second terminal B, and if the voltage of the second terminal B is higher than the voltage of the first terminal a, a loop is formed through the second terminal B, the second node D, the power source terminal DC, the first resistor R1, the first diode D1, the second diode D2, the second resistor R2, and the first terminal a, wherein the first terminal a to the second terminal B are formed through the low voltage switch circuit module. Even if the low-voltage switch LVS is in an open state, the detection is in a closed state with a high probability, and false detection occurs.
Secondly, when the low voltage switch LVS is turned off, the voltage of the first terminal a of the low voltage switch LVS is required to be higher than the voltage of the power supply terminal DC, otherwise, a loop is formed by the first positive electrode of the power supply terminal DC, the first resistor R1, the first diode D1, the second diode D2, the second resistor R2, the first terminal a, the second terminal B, and the first negative electrode of the power supply terminal DC, wherein the first terminal a to the second terminal B also form a path through the low voltage switch circuit module. In this case, there is a high probability that the low-voltage switch LVS is originally in an open state, but is erroneously detected as being in a closed state.
In order to solve the problems, the technical scheme of the invention provides a test circuit and a working method of the test circuit, wherein voltage comparison modules are added at two ends of a low-voltage switch, the voltage comparison modules can acquire the voltage conditions at two ends of the low-voltage switch and output a first signal, the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained according to a second signal, the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged.
In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments accompanied with figures are described in detail below.
Fig. 2 to 5 are schematic diagrams of a test circuit according to an embodiment of the invention.
Referring to fig. 2, the test circuit includes: a low voltage switching circuit module; a low voltage switch LVS, the low voltage switch LVS including a first end a and a second end B, the first end a and the second end B being coupled with the low voltage switch circuit module, respectively; a detection module comprising a third end coupled to the first end a and a fourth end coupled to the second end B to Sign2; and the voltage comparison module is respectively coupled with the first end A and the second end B, and outputs a first signal Sign1, and the second signal Sign2 and the first signal Sign1 are used for judging the opening and closing states of the switch.
The low voltage switch LVS illustrated in fig. 2 is in an off state.
With continued reference to fig. 2 in conjunction with fig. 4, in this embodiment, the voltage comparison module includes: the voltage sampling circuit is coupled with a first end A and a second end B of the low-voltage switch LVS respectively, and is used for acquiring the voltages of the first end A and the second end B and acquiring the voltage difference of the voltages of the first end A and the second end B; and the voltage upper and lower limit comparator circuit is coupled with the voltage sampling circuit, and the first signal Sign1 is output by the voltage upper and lower limit comparator circuit.
The voltage sampling loop detects the voltages of the first end A and the second end B of the low-voltage switch LVS in real time, and sends the detected voltage difference between the voltage signal of the first end A and the voltage signal of the second end B into the voltage upper-lower limit comparator loop.
The upper and lower voltage limit comparator circuit sets the upper and lower voltage limit values of the two ends of the detected low-voltage switch LVS, wherein the upper and lower voltage limit values are preset values, the upper voltage limit value is a positive voltage, and the lower voltage limit value is a negative voltage. The voltage difference between the voltage signal of the first end A and the voltage difference between the second end B detected by the voltage sampling circuit are sent to a voltage upper limit comparator circuit and a voltage lower limit comparator circuit, the voltage difference between the first end A and the second end B comprises a positive value and a negative value according to the actual connection condition of the low-voltage switch circuit module and the low-voltage switch LVS, and the first signal Sign1 is output according to the result of whether the voltage difference is within the range of the voltage upper limit and the voltage lower limit.
In this embodiment, the detection module includes: a first power supply terminal DC1, the first power supply terminal DC1 including a first positive electrode and a first negative electrode; a main circuit coupled to the first positive electrode, the main circuit including a first resistor R1; a first node C, the main circuit is coupled to the first node C, and two ends of the first resistor R1 are respectively coupled to the first positive electrode and the first node C; the first branch circuit is coupled with the first node C, the first branch circuit comprises a second resistor R2, two ends of the second resistor R2 are respectively coupled with the first node C and a first end A of the low-voltage switch LVS, and the first branch circuit is the third end; the second branch is coupled to the first node C, and includes a third resistor R3, where two ends of the third resistor R3 are respectively coupled to the first node C and the second end B of the low-voltage switch LVS, and the second branch is the fourth end.
In this embodiment, the detection module further includes: the first comparator COMP 1 includes a second positive electrode and a second negative electrode, the second positive electrode is coupled to the first node C, the second negative electrode is coupled to a reference voltage supply terminal Vref 1, and the reference voltage supply terminal Vref 1 is configured to supply a reference voltage, so that the first comparator COMP 1 outputs the second signal Sign2.
In this embodiment, the value of the reference voltage is a preset value, where the preset value is a value between two obtained voltage values at the first node C when the low-voltage switch LVS is turned on and off.
The second signal Sign2 includes a low level signal or a high level signal.
In this embodiment, the low level signal is: the voltage value of the first node C obtained by the first comparator COMP 1 is smaller than the reference voltage; the high level signal is: the voltage value of the first node C obtained by the first comparator COMP 1 is greater than the reference voltage.
In other embodiments, the definition of the low level signal and the high level signal can be interchanged or redefined as desired.
The first signal Sign1 includes a low level signal or a high level signal.
In this embodiment, the low level signal is: the voltage difference between the first end A and the second end B acquired by the voltage upper and lower limit comparator circuit is within the range of voltage upper and lower limit values; the high level signal is: the voltage difference between the first end A and the second end B acquired by the voltage upper and lower limit comparator circuit is out of the range of the voltage upper and lower limit values.
In other embodiments, the definition of the low level signal and the high level signal can be interchanged or redefined as desired.
In other embodiments, the detection module can exclude the first comparator COMP 1.
In this embodiment, the detection module further includes: a second node D, two ends of the third resistor R3 are coupled to the first node C and the second node D, respectively, and the second node D is coupled to the second end B of the low voltage switch LVS; and the first negative electrode is coupled with the ground terminal G, and the second node D is coupled with the ground terminal G.
In this embodiment, the main circuit further includes: and two ends of the first diode D1 are respectively coupled with the first resistor R1 and the first node C.
The first diode D1 is configured to enable a forward current flowing through the first resistor R1 to the first node C to pass through the first diode D1 in a unidirectional manner, and a reverse withstand voltage of the first diode D1 is greater than a voltage of the low-voltage switch circuit module, so that a situation that a power supply burns out due to the fact that a current flows in a reverse direction to the first power supply terminal DC1 is avoided.
In other embodiments, the main circuit can exclude the first diode.
In this embodiment, the first branch further includes: and two ends of the second diode D2 are coupled with the first node C and the second resistor R2, respectively.
The second diode D2 is configured to enable forward current flowing through the first node C to the second resistor R2 to pass through the second diode D2 in a unidirectional manner, and a reverse withstand voltage of the second diode D2 is greater than a voltage of the low-voltage switch circuit module, so that a situation that current flows in a reverse direction to the first power supply terminal DC1 to cause power supply burning loss is avoided.
In other embodiments, the first leg can exclude the second diode.
In this embodiment, the second branch further includes: and a third diode D3, two ends of the third diode D3 are coupled to the first node C and the third resistor R3, respectively.
The third diode D3 is configured to enable the forward current flowing through the first node C to the third resistor R3 to pass through the third diode D3 in a unidirectional manner, and the reverse withstand voltage of the third diode D3 is greater than the voltage of the low-voltage switch circuit module, so that the situation that the power supply burns out due to the reverse current flowing through the first power supply terminal DC1 is avoided.
In other embodiments, the second leg can exclude the third diode.
In this embodiment, the resistance of the first resistor R1 is greater than the resistance of the second resistor R2; the resistance value of the third resistor R3 is larger than the resistance value of the second resistor R2.
In this embodiment, the ratio of the resistance value of the first resistor R1 to the resistance value of the second resistor R2 is greater than 10; so that the resistance of the first resistor R1 is much larger than the resistance of the second resistor R2.
In this embodiment, the ratio of the resistance value of the third resistor R3 to the resistance value of the second resistor R2 is greater than 10; so that the resistance of the third resistor R3 is much larger than the resistance of the second resistor R2.
In this embodiment, the ratio of the resistance value of the first resistor R1 to the resistance value of the third resistor R3 ranges from 0.9 to 1.1; so that the resistance of the first resistor R1 is substantially equal to the resistance of the third resistor R3.
In this embodiment, the voltage of the first power supply terminal DC1 is set to 5V, the reference voltage supply terminal Vref 1 provides the reference voltage 1.5V, the resistance of the first resistor R1 is 1K ohms, the resistance of the second resistor R2 is 100 ohms, and the resistance of the third resistor R3 is 1K ohms. In other embodiments, the resistances of the first resistor, the second resistor and the third resistor are adjusted according to the voltage of the first power supply terminal.
In other embodiments, the resistance values of the first resistor, the second resistor and the third resistor may be set according to the requirements.
The low voltage switch LVS includes: low voltage relay, low voltage contactor, low voltage power device or low voltage manual switch.
Referring to fig. 3, fig. 3 is an equivalent circuit of the low-voltage switch LVS when closed, and at this time, the circuit of the low-voltage switch circuit module is shorted.
Referring to fig. 4, fig. 4 is a schematic diagram of a voltage comparison module in the test circuit of fig. 2 and 3, where the voltage comparison module includes: a voltage sampling loop coupled to the first and second terminals a and B of the low voltage switch LVS, respectively; a voltage upper and lower limit comparator loop, the voltage upper and lower limit comparator loop comprising: the second comparator COMP 2 and the third comparator COMP 3, where the second comparator COMP 2 includes a third positive electrode and a third negative electrode, the third positive electrode is coupled to the lower limit value providing terminal Vref2, and the third negative electrode is coupled to the voltage sampling loop; the third comparator COMP 3 includes a fourth positive electrode and a fourth negative electrode, where the fourth positive electrode is coupled to the third negative electrode and the voltage sampling circuit, and the fourth negative electrode is coupled to the upper limit value providing terminal Vref 3.
In this embodiment, the voltage comparison module further includes: a fourth diode D4, the fourth diode D4 allowing the forward voltage signal output from the second comparator COMP 2 to pass; a fifth diode D5, the fifth diode D5 allowing the forward voltage signal outputted from the fifth diode D5 to pass.
The working principle of the voltage comparison module comprises the following steps: the voltage difference between the first end a and the second end B, which is obtained by connecting the third negative electrode of the second comparator COMP 2 to the voltage sampling circuit, is compared with the lower limit voltage connected to the third positive electrode of the second comparator COMP 2, if the voltage difference is greater than the lower limit voltage, the voltage difference between the third positive electrode and the third negative electrode is negative, the negative voltage signal is cut off at the fourth diode D4, and the second comparator COMP 2 outputs a low level signal; if the voltage difference is smaller than the lower limit voltage, the voltage difference between the third positive electrode and the third negative electrode is a positive value, and the positive voltage signal passes through the fourth diode D4, and the second comparator COMP 2 outputs a high level signal.
The voltage difference between the first end a and the second end B, which is obtained by the voltage sampling circuit and connected to the fourth positive electrode of the third comparator COMP 3, is compared with the upper limit voltage connected to the fourth negative electrode of the third comparator COMP 3, if the voltage difference is smaller than the upper limit voltage, the voltage difference between the fourth positive electrode and the fourth negative electrode is negative, the negative voltage signal is cut off at the fifth diode D5, and the third comparator COMP 3 outputs a low-level signal; if the voltage difference is greater than the upper limit voltage, the voltage difference between the fourth positive electrode and the fourth negative electrode is positive, the positive voltage signal passes through the fifth diode D5, and the third comparator COMP 3 outputs a high level signal.
When the second comparator COMP 2 and the third comparator COMP 3 output low level signals at the same time, the first signal Sign1 output by the voltage upper and lower limit comparator circuit is a low level signal. When at least one of the second comparator COMP 2 and the third comparator COMP 3 outputs a high level signal, the first signal Sign1 output by the upper and lower voltage limit comparator circuit is a high level signal.
The low-voltage switch circuit module includes: and the voltage of the low-voltage switch circuit module is below 36V safety voltage.
Referring to fig. 5, fig. 5 schematically illustrates a control circuit of a control system, the control circuit comprising: a second power supply terminal DC2, the second power supply terminal DC2 including a fifth positive electrode and a fifth negative electrode; the two ends of the fourth resistor R4 are respectively coupled with the first end A and the fifth positive electrode; and a fifth resistor R5, wherein one end of the fifth resistor R5 is coupled with the first end a and the fourth resistor R4, and the other end of the fifth resistor R5 is coupled with the second end B and the fifth cathode.
The test circuit is characterized in that voltage comparison modules are added at two ends of the low-voltage switch, the voltage comparison modules can acquire voltage conditions at two ends of the low-voltage switch and output first signals, the detection module further comprises a first comparator, the first comparator outputs second signals, and the first signals output by the detection module are combined to accurately obtain real closing and opening states of the low-voltage switch and whether the switch is abnormal or not according to the first signals and the second signals, so that the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged; in addition, the second signal may also determine whether an abnormality occurs in the first power supply terminal.
FIG. 6 is a schematic diagram of a test circuit according to another embodiment of the invention.
Referring to fig. 6, the test circuit in fig. 6 is different from the test circuit in fig. 2 in that the detection module in the test circuit in fig. 6 does not include the first comparator COMP 1, and other structures of the test circuit in fig. 6 are described with reference to fig. 2 and are not repeated herein.
In this embodiment, the detection module does not output the second signal, and the detection module functions to provide a voltage.
In this embodiment, the resistance values of the first resistor R1, the second resistor R2, and the third resistor R3 are set arbitrarily according to the requirement.
The voltage comparison module is added at the two ends of the low-voltage switch, and can acquire the voltage conditions at the two ends of the low-voltage switch and output a first signal, so that the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained according to a second signal, the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged.
Fig. 7-9 are schematic diagrams of the operation of the test circuit according to an embodiment of the invention.
Referring to fig. 9, the working method of the test circuit includes:
Step S11: providing a test circuit as described in fig. 2 or fig. 3;
step S12: acquiring a feedback signal of the low-voltage switch, wherein the feedback signal comprises a closing signal or an opening signal;
step S13: acquiring a second signal according to the detection module;
step S14: acquiring a first signal according to a voltage comparison module;
step S15: and acquiring a normal or abnormal result of the low-voltage switch according to the feedback signal, the second signal and the first signal.
The working method of the test circuit comprises the steps that the voltage comparison module at two ends of the low-voltage switch of the test circuit can obtain the voltage conditions at two ends of the low-voltage switch and output a first signal, the detection module further comprises a first comparator, the first comparator outputs a second signal, and the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained by combining the feedback signals of the low-voltage switch according to the first signal and the second signal, so that the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged; in addition, the second signal may also determine whether an abnormality occurs in the first power supply terminal.
The second signal includes a low level signal or a high level signal, and the first signal includes a low level signal or a high level signal.
In this embodiment, if the second signal is not output, it is determined that the first power supply terminal is abnormal.
The feedback signal of the low-voltage switch LVS is a state signal fed back by the low-voltage switch LVS in real time, and the feedback signal comprises a closing signal or an opening signal.
Referring to fig. 7 in conjunction with fig. 8, when the feedback signal of the low voltage switch is a close signal, the working method of the test circuit includes:
step S21: the feedback signal of the low-voltage switch is a closing signal.
Step S22: and judging whether the second signal is a low-level signal or not.
If the second signal is not output, the first power supply end is indicated to be abnormal; and if the second signal is a high-level signal, judging that the low-voltage switch is abnormal.
Step S23: it is determined whether the first signal is a low level signal.
If the second signal is a low-level signal and the first signal is a low-level signal, judging that the low-voltage switch is in a closed state and is consistent with a feedback signal of the low-voltage switch, wherein the low-voltage switch is normal; and if the first signal is a high-level signal, judging that the low-voltage switch is abnormal.
With continued reference to fig. 8 in conjunction with fig. 3 and 4, the test circuit of fig. 3 is shown with the low voltage switch LVS closed and the low voltage switch circuit module shorted.
At this time, the first diode D1, the second diode D2, and the third diode D3 are all turned on. The current of the first power supply terminal DC1 reaches the first node C through the first resistor R1 and the first diode D1, and then reaches the ground terminal G from two branches of the second diode D2, the second resistor R2, the third diode D3 and the third resistor R3, respectively. The second resistor R2 and the third resistor R3 are connected in parallel and then connected in series with the first resistor R1. Because the resistance of the second resistor R2 is far smaller than that of the first resistor R1 and the third resistor R3, the resistance of the second resistor R2 and the third resistor R3 connected in parallel is also far smaller than that of the first resistor R1, and therefore the voltage of the first node C is far smaller than the voltage of the first power supply end DC1 by 0.5 times, and is close to the voltage of the ground end G. In this state, the voltage of the first node C is lower than the reference voltage, and the second signal Sign2 of the output of the first comparator COMP 1 is a low level signal.
At this time, since the low voltage switch LVS is in the closed state, the voltages at the first end a and the second end B of the low voltage switch LVS are both 0V, so that the voltages at the first end a and the second end B detected by the voltage sampling circuit are also 0V, and the voltage difference between the first end a and the second end B is 0V. In the upper and lower voltage limit comparator circuit, the lower limit value providing terminal Vref2 provides a lower limit voltage of-0.5V, the upper limit value providing terminal Vref3 provides an upper limit voltage of 0.5V, and the voltage difference between the first terminal a and the second terminal B is 0V, and the output first signal Sign1 is a low level signal in the range of the upper limit voltage and the lower limit voltage.
When the voltage difference between the first end A and the second end B obtained by the voltage upper limit comparator circuit is within the range of the voltage upper limit and the voltage lower limit, the output first signal Sign1 is a low-level signal. Specifically, the voltage difference between the first end a and the second end B is 0V, the third negative electrode of the second comparator COMP 2 is connected to a voltage of 0V, and compared with the lower limit voltage-0.5V connected to the third positive electrode of the second comparator COMP 2, 0V is greater than-0.5V, the voltage difference between the third positive electrode and the third negative electrode is a negative value, the negative voltage signal is cut off at the fourth diode D4, so that the second comparator COMP 2 outputs a low level signal; the voltage difference between the first end a and the second end B is 0V, the fourth positive electrode of the third comparator COMP 3 is connected to a voltage of 0V, the voltage difference is compared with the upper limit voltage of 0.5V connected to the fourth negative electrode of the third comparator COMP 3, the voltage difference between the fourth positive electrode and the fourth negative electrode is less than 0.5V, the negative voltage signal is cut off at the fifth diode D5, and the third comparator COMP 3 outputs a low level signal. The second comparator COMP 2 and the third comparator COMP 3 output low-level signals at the same time, and at this time, the first signal Sign1 output by the voltage upper and lower limit comparator circuit is a low-level signal.
The upper and lower limit values of the voltage can be adjusted according to actual use conditions.
In this embodiment, the voltage drops of the first diode D1, the second diode D2, and the third diode D3 are negligible.
Referring to fig. 7 in conjunction with fig. 9, when the feedback signal of the low voltage switch is an off signal, the working method of the test circuit includes:
step S31: the feedback signal of the low-voltage switch is an off signal.
Step S32: and judging whether the second signal is an explicit low-level signal or a high-level signal.
If the second signal is not output, the first power supply end is indicated to be abnormal; if the second signal is a definite low-level signal or high-level signal, the switch can be judged to be normal or abnormal continuously according to the first signal.
Step S33: it is determined whether the first signal is a high level signal.
If the first signal is a high-level signal, judging that the low-voltage switch is in an off state no matter the second signal is a low-level signal or a high-level signal, and keeping consistent with a feedback signal of the low-voltage switch, wherein the low-voltage switch is normal; and if the first signal is a low-level signal, judging that the low-voltage switch is abnormal.
With continued reference to fig. 9 in conjunction with fig. 2 and 4, the test circuit of fig. 2, the low voltage switch LVS is turned off.
The low-voltage switch LVS is in an off state, and the second diode D2 is turned off when the potential of the first terminal a is higher than the potential of the second terminal B and the voltage of the first terminal a is higher than the voltage of the first power supply terminal DC 1. The current of the first power supply terminal DC1 reaches the ground terminal G through the first resistor R1, the first diode D1, the third diode D3, and the third resistor R3 to form a loop. The first diode D1 is turned on with the third diode D3, and the diode conduction voltage drop is ignored, at this time, the voltage of the first node C is the series voltage of the first resistor R1 and the third resistor R3, and the voltage of the first power supply terminal DC1 is divided by the third resistor R3, and the resistance values of the first resistor R1 and the third resistor R3 are close to each other, so that the voltage of the first node C is close to 0.5 times the voltage of the first power supply terminal DC 1. The voltage of the first node C in this state is higher than the reference voltage, and the second signal Sign2 of the output of the first comparator COMP 1 is a high level signal.
It should be noted that, whether the potential of the first terminal a is higher than the potential of the second terminal B, the potential of the second terminal B is higher than the potential of the first terminal a, or the voltage of the first terminal a is lower than the voltage of the first power supply terminal DC1, the voltage of the first terminal a is higher than the voltage of the first power supply terminal DC1, the voltage sampling circuit will detect the voltage values of the first terminal a and the second terminal B in real time, and transmit the voltage difference between the first terminal a and the second terminal B to the voltage upper limit comparator circuit. The voltage upper and lower limit comparator circuit sets the voltage upper and lower limit value of the first comparator, so that the detected voltage difference value between the first end A and the second end B of the low-voltage switch LVS exceeds the voltage upper and lower limit range, and the output first signal Sign1 is a high-level signal.
When the voltage difference between the first end A and the second end B obtained by the voltage upper limit and lower limit comparator circuit is out of the range of the voltage upper limit and lower limit, the output first signal Sign1 is a high level signal. Specifically, assuming that the voltage difference between the first terminal a and the second terminal B is 1.1V, the third negative electrode of the second comparator COMP 2 is connected to a voltage of 1.1V, and compared with the lower limit voltage-0.5V connected to the third positive electrode of the second comparator COMP 2, 1.1V is greater than-0.5V, the voltage difference between the third positive electrode and the third negative electrode is a negative value, the negative voltage signal is cut off at the fourth diode D4, and therefore the second comparator COMP 2 outputs a low level signal; the voltage difference between the first end a and the second end B is 1.1V, the fourth positive electrode of the third comparator COMP 3 is connected to a voltage of 1.1V, the voltage difference is greater than 0.5V compared with the upper limit voltage 0.5V connected to the fourth negative electrode of the third comparator COMP 3, the voltage difference between the fourth positive electrode and the fourth negative electrode is a positive value, a positive voltage signal passes through the fifth diode D5, and the third comparator COMP 3 outputs a high level signal. When at least one of the second comparator COMP 2 and the third comparator COMP 3 outputs a high level signal, the first signal Sign1 output by the upper and lower voltage limit comparator circuit is a high level signal.
Therefore, when the low voltage switch LVS is turned off, the second signal Sign2 is either a low level signal or a high level signal, and if the first signal Sign1 is a high level signal, the state of the low voltage switch LVS is represented as an off state.
The test circuit accurately judges the closing and opening states of the tested low-voltage switch LVS under the condition that the voltages of the first end A and the second end B are not limited when the tested low-voltage switch LVS is opened. The test circuit has the advantages of low cost, simple and reliable implementation method, high detection accuracy and wide application range.
The voltage comparison module and the detection module complement each other. If the first power supply terminal DC1 is not powered, or the detection module is not present, the test circuit only tests the low-voltage switch LVS alone, and at this time, no matter whether the low-voltage switch LVS is turned on or turned off, the voltage sampling loop samples the voltage of the first terminal a and the voltage of the second terminal B with 0V, and the first signal Sign1 output by the voltage upper-lower limit comparator loop is a low-level signal, so that the real state of the detected low-voltage switch LVS cannot be judged. The detection module of the test circuit in this case serves to provide a voltage and a reliable judgment.
Meanwhile, the first comparator COMP 1 and the second signal Sign2 may be used as a redundancy detection circuit when the voltage sampling circuit and the voltage upper and lower limit comparator circuit are abnormal. Whether the first power supply end DC1 of the test circuit is abnormal or not can be judged through the output condition of the first comparator COMP 1, and if the first power supply end DC1 is normal, the output second signal Sign2 is in a definite high level or a definite low level; if the first power supply DC1 is abnormally disappeared, the second signal Sign2 is in a no-signal state.
Fig. 10 to 12 are schematic diagrams of the operation flow of the test circuit according to another embodiment of the present invention.
Referring to fig. 10, the working method of the test circuit includes:
step S41: providing a test circuit as described in fig. 6;
step S42: acquiring a feedback signal of the low-voltage switch, wherein the feedback signal comprises a closing signal or an opening signal;
step S43: acquiring a first signal according to a voltage comparison module;
step S44: and acquiring a normal or abnormal result of the low-voltage switch according to the feedback signal and the first signal.
According to the working method of the test circuit, the voltage comparison modules at two ends of the low-voltage switch of the test circuit can obtain the voltage conditions at two ends of the low-voltage switch and output the first signal, and the feedback signals of the low-voltage switch are combined, so that the real closing and opening states of the low-voltage switch and whether the switch is abnormal or not can be accurately obtained, the detection accuracy and reliability are improved, and the application range of the test circuit is enlarged.
The first signal includes a low level signal or a high level signal. The feedback signal of the low-voltage switch LVS is a state signal fed back by the low-voltage switch LVS in real time, and the feedback signal comprises a closing signal or an opening signal.
With reference to fig. 10 in conjunction with fig. 11, when the feedback signal of the low-voltage switch is a close signal, the working method of the test circuit includes:
step S51: the feedback signal of the low-voltage switch is a closing signal.
Step S52: and judging whether the first signal is a low-level signal or not.
If the first signal is a low-level signal, judging that the low-voltage switch is in a closed state, and keeping consistent with a feedback signal of the low-voltage switch, wherein the low-voltage switch is normal; and if the first signal is a high-level signal, judging that the low-voltage switch is abnormal.
With continued reference to fig. 11 in conjunction with fig. 6, the test circuit of fig. 6 is such that the low voltage switch circuit module is shorted out when the low voltage switch LVS is closed.
At this time, the voltage of the first end a and the second end B of the low-voltage switch LVS is 0V because the low-voltage switch LVS is in the closed state, so that the voltage of the first end a and the second end B detected by the voltage sampling circuit is also 0V, and the upper and lower voltage limits of the two ends of the detected low-voltage switch LVS are respectively 0.5V and-0.5V. When the voltage difference between the first end A and the second end B acquired by the voltage upper and lower limit comparator circuit is within the voltage upper and lower limit value range, the output first signal Sign1 is a low-level signal, and when the voltage difference between the first end A and the second end B acquired by the voltage upper and lower limit comparator circuit is outside the voltage upper and lower limit value range, the output first signal Sign1 is a high-level signal. The voltage difference between the first terminal a and the second terminal B is 0V, and 0V is in the range of 0.5V and-0.5V, so the output first signal Sign1 is a low level signal.
The upper and lower limit values of the voltage can be adjusted according to actual use conditions.
In this embodiment, the voltage drops of the first diode D1, the second diode D2, and the third diode D3 are negligible.
With reference to fig. 10 in conjunction with fig. 12, when the feedback signal of the low-voltage switch is an off signal, the working method of the test circuit includes:
step S61: the feedback signal of the low-voltage switch is an off signal.
Step S62: it is determined whether the first signal is a high level signal.
If the first signal is a high-level signal, judging that the low-voltage switch is in an off state, and keeping consistent with a feedback signal of the low-voltage switch, wherein the low-voltage switch is normal; and if the first signal is a low-level signal, judging that the low-voltage switch is abnormal.
Referring to fig. 12 in conjunction with fig. 6, when the low-voltage switch LVS is turned off, the voltage sampling circuit detects the voltage values of the first terminal a and the second terminal B in real time, and transmits the voltage difference between the first terminal a and the second terminal B to the voltage upper and lower limit comparator circuit. The voltage upper and lower limit comparator circuit sets the voltage upper and lower limit value of the first comparator, so that the detected voltage difference value between the first end A and the second end B of the low-voltage switch LVS exceeds the voltage upper and lower limit range, and the output first signal Sign1 is a high-level signal.
Although the present invention is disclosed above, the present invention is not limited thereto. Various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the invention, and the scope of the invention should be assessed accordingly to that of the appended claims.
Claims (18)
1. A test circuit, comprising:
a low voltage switching circuit module;
a low voltage switch including a first end and a second end, the first end and the second end being coupled with the low voltage switch circuit module, respectively;
a detection module including a third end coupled to the first end and a fourth end coupled to the second end;
the first end and the second end are respectively coupled with the voltage comparison module, and the voltage comparison module outputs a first signal which is used for judging the opening and closing states of the switch.
2. The test circuit of claim 1, wherein the voltage comparison module comprises: the voltage sampling loop is coupled with the first end and the second end of the low-voltage switch respectively and is used for acquiring the voltages of the first end and the second end; and the voltage upper limit and lower limit comparator circuit is coupled with the voltage sampling circuit, and the first signal is output by the voltage upper limit and lower limit comparator circuit.
3. The test circuit of claim 1, wherein the detection module comprises: the first power supply end comprises a first positive electrode and a first negative electrode; a main circuit coupled to the first positive electrode, the main circuit including a first resistor; the main circuit is coupled with the first node, and two ends of the first resistor are respectively coupled with the first positive electrode and the first node; the first branch circuit is coupled with the first node and comprises a second resistor, two ends of the second resistor are respectively coupled with the first node and the first end of the low-voltage switch, and the first branch circuit is the third end; the second branch circuit is coupled with the first node and comprises a third resistor, two ends of the third resistor are respectively coupled with the first node and the second end of the low-voltage switch, and the second branch circuit is the fourth end.
4. The test circuit of claim 3, wherein the detection module further comprises: the first comparator outputs a second signal, the first comparator comprises a second positive electrode and a second negative electrode, the second positive electrode is coupled with the first node, the second negative electrode is coupled with a reference voltage providing end, and the reference voltage providing end is used for providing a reference voltage so that the first comparator outputs the second signal.
5. The test circuit of claim 3, wherein the detection module further comprises: a second node, two ends of the third resistor are coupled with the first node and the second node respectively, and the second node is coupled with a second end of the low-voltage switch; and the first negative electrode is coupled with the grounding end, and the second node is coupled with the grounding end.
6. The test circuit of claim 3, wherein the main circuit further comprises: and two ends of the first diode are respectively coupled with the first resistor and the first node.
7. The test circuit of claim 3, wherein the first leg further comprises: and two ends of the second diode are respectively coupled with the first node and the second resistor.
8. The test circuit of claim 3, wherein the second leg further comprises: and two ends of the third diode are respectively coupled with the first node and the third resistor.
9. The test circuit of claim 3, wherein the first resistor has a resistance greater than a resistance of the second resistor; the resistance value of the third resistor is larger than that of the second resistor.
10. The test circuit of claim 1, wherein the low voltage switch comprises: low voltage relay, low voltage contactor, low voltage power device or low voltage manual switch.
11. A method of operating a test circuit, comprising:
providing a test circuit according to any one of claims 1 to 10;
acquiring a feedback signal of the low-voltage switch, wherein the feedback signal comprises a closing signal or an opening signal;
acquiring a first signal according to a voltage comparison module;
and acquiring a normal or abnormal result of the low-voltage switch according to the feedback signal and the first signal.
12. The method of operation of a test circuit of claim 11, wherein the first signal comprises a low level signal or a high level signal.
13. The method of claim 12, wherein obtaining a result of the low voltage switch being normal or abnormal based on the feedback signal and the first signal comprises: when the feedback signal of the low-voltage switch is a closing signal, if the first signal is a low-level signal, the low-voltage switch is judged to be in a closing state, and the feedback signal of the low-voltage switch is consistent with the feedback signal of the low-voltage switch, and the low-voltage switch is normal.
14. The method of claim 12, wherein obtaining a result of the low voltage switch being normal or abnormal based on the feedback signal and the first signal comprises: when the feedback signal of the low-voltage switch is an off signal, if the first signal is a high-level signal, the low-voltage switch is judged to be in an off state, and is consistent with the feedback signal of the low-voltage switch, and the low-voltage switch is normal.
15. The method of operation of a test circuit of claim 10, further comprising: acquiring a second signal according to the detection module, wherein the second signal comprises a low-level signal or a high-level signal; and acquiring a normal or abnormal result of the low-voltage switch according to the feedback signal, the first signal and the second signal.
16. The method of claim 15, wherein obtaining a result of the low voltage switch being normal or abnormal based on the feedback signal, the second signal, and the first signal comprises:
when the feedback signal of the low-voltage switch is a closing signal, if the second signal is a low-level signal and the first signal is a low-level signal, judging that the low-voltage switch is in a closing state and is consistent with the feedback signal of the low-voltage switch, and the low-voltage switch is normal; and if at least one of the second signal and the first signal is a high-level signal, judging that the low-voltage switch is abnormal.
17. The method of claim 15, wherein obtaining a result of the low voltage switch being normal or abnormal based on the feedback signal, the second signal, and the first signal comprises:
when the feedback signal of the low-voltage switch is an off signal, if the first signal is a high-level signal, judging that the low-voltage switch is in an off state, and keeping consistent with the feedback signal of the low-voltage switch, wherein the low-voltage switch is normal; and if the first signal is a low-level signal, judging that the low-voltage switch is abnormal.
18. The method of claim 16, wherein if the second signal is not output, determining that the first power terminal is abnormal.
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| CN202311573163.4A CN117590218A (en) | 2023-11-23 | 2023-11-23 | Test circuit and working method thereof |
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| CN202311573163.4A CN117590218A (en) | 2023-11-23 | 2023-11-23 | Test circuit and working method thereof |
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