CN117572036A - Test equipment and test system for accelerator board card - Google Patents
Test equipment and test system for accelerator board card Download PDFInfo
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- CN117572036A CN117572036A CN202311520728.2A CN202311520728A CN117572036A CN 117572036 A CN117572036 A CN 117572036A CN 202311520728 A CN202311520728 A CN 202311520728A CN 117572036 A CN117572036 A CN 117572036A
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- 238000012360 testing method Methods 0.000 title claims abstract description 216
- 238000004891 communication Methods 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 10
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- 230000005856 abnormality Effects 0.000 claims description 2
- 238000012544 monitoring process Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 230000002159 abnormal effect Effects 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
- 230000006872 improvement Effects 0.000 description 3
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Abstract
The application provides a test equipment and test system for accelerator integrated circuit board, test equipment includes: the test part comprises an electrode contact area, wherein the electrode contact area is used for placing an accelerator board card to be tested; a power supply part electrically connected with the electrode contact area; and the control part is used for generating a power supply control signal or a power-off control signal according to the reliability test operation, wherein the power supply control signal indicates the power supply part to start providing test voltage for the test part, the test voltage is used for carrying out reliability test on the accelerator board card to be tested, and the power-off control signal indicates the power supply part to stop providing the test voltage for the test part. Therefore, the control part automatically generates a power supply control signal or a power-off control signal according to the testability operation, namely, the test voltage supply of the accelerator board to be tested is automatically finished or stopped, and the test efficiency is high.
Description
Technical Field
The present application relates to the field of electrical technology, and more particularly, to a test apparatus and test system for accelerator boards.
Background
With the technical innovation and improvement, the accelerator boards such as the DPU board are more powerful and more widely applied, and after the accelerator boards are produced, each accelerator board needs to be powered on and subjected to reliability test so as to ensure the delivery quality of the accelerator boards.
The existing test equipment mainly aims at electronic products and does not specially aim at equipment for reliability test of an accelerator board card. Therefore, the power-on reliability test is generally performed on each accelerator board card manually, however, each test requires to connect and disconnect the power source from the power source interface manually, resulting in low test efficiency and large loss to the power source interface.
Disclosure of Invention
The application provides test equipment and test system for accelerator board card, which can realize automatic test and improve test efficiency.
In a first aspect, the present application provides a test apparatus for an accelerator board card, comprising:
the test part comprises an electrode contact area, wherein the electrode contact area is used for placing an accelerator board card to be tested;
a power supply part electrically connected with the electrode contact area;
a control section for generating a power supply control signal or a power-off control signal according to a reliability test operation,
the power supply control signal indicates the power supply part to start providing test voltage for the test part, and the test voltage is used for testing the reliability of the accelerator board card to be tested, wherein the power-off control signal indicates the power supply part to stop providing the test voltage for the test part.
Optionally, the test device further includes a device main body, the device main body includes a receiving cavity, the power supply part and the control part are both installed on the device main body, the test part is movably installed in the receiving cavity, and a movement path of the test part includes a test position and a retraction position; when the testing part is at the testing position, the electrode contact area is positioned in the accommodating cavity; when the testing part is at the folding and unfolding position, the electrode contact area is positioned outside the containing cavity.
Optionally, the test device further includes a sub-buckle and a female buckle that are mutually adapted, the sub-buckle is installed on the device main body, and the female buckle is installed on the test portion; when the child buckle and the female buckle are buckled together, the test part is locked at the test position by the child buckle and the female buckle together; when the sub-buckle and the main buckle are separated, the testing part can reciprocate between the testing position and the retraction position.
Optionally, the test device further includes a position sensor, where the position sensor is installed on the device main body and is used to detect whether the female buckle is located at the locking position, if yes, the position sensor generates a first detection signal, otherwise, the position sensor generates a second detection signal; when the female buckle is positioned at the locking position, the sub buckle and the female buckle are buckled together; the control part comprises a trigger switch and a processor, the trigger switch is manually triggered to generate a first enabling signal, the processor is in communication connection with the trigger switch, the position sensor and the power supply part,
the first enable signal is for causing the processor to generate the power supply control signal on the premise that the processor has acquired the first detection signal.
Optionally, the test device further includes a timer, where the timer is communicatively connected to the control unit, and when the control unit generates the power supply signal, the control unit further generates a timing start signal, and the timer starts to count according to the timing start signal; when the timing is completed, the timer generates a timing completion signal, and the control part generates the power-off control signal according to the timing completion signal.
Optionally, the test device further includes a first indicator light and a current monitor, where the current monitor is configured to monitor an output current of the power supply unit, and determine whether the output current is less than a preset threshold, and if yes, the current monitor generates an abnormal signal; the control part is in communication connection with the current monitor, and when the timer is in a timing state, the control part controls the first indicator lamp to be in a lighting state according to the abnormal signal.
Optionally, the test device further includes a second indicator light and/or a third indicator light, the control part is in communication connection with the second indicator light, and the second indicator light is in a lighting state according to the power supply control signal; the control part is in communication connection with the third indicator lamp, and the third indicator lamp is in a lighting state according to the power-off control signal.
Optionally, the test part includes a base and at least one socket, the socket is mounted on the base, the socket includes a receiving groove, and the electrode contact areas are located in the receiving groove and correspond to the receiving grooves one by one.
Optionally, the socket is detachably connected with the base body.
In a second aspect, there is provided a test system comprising: accelerator board card and the test equipment described above.
Through the technical scheme, in the whole test process, the accelerator board card to be tested is placed in the electrode contact area or taken out from the electrode contact area only by manual operation or by using a mechanical arm, and the control part automatically generates a power supply control signal or a power failure control signal according to the testability operation, namely, the supply of test voltage to the accelerator board card to be tested is automatically completed or the supply of the test voltage is stopped. The whole test process does not need to plug a power interface, and the test efficiency is high.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the description of the prior art will be briefly described, and advantages and benefits in the solutions will become apparent to those skilled in the art from reading the detailed description of the embodiments below. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention.
In the drawings:
fig. 1 is a schematic perspective view of a test apparatus for an accelerator board according to an embodiment of the present application, in which a power supply unit is shown by a partial perspective means, one test unit is located at a retracted position, and the other test units are located at test positions.
Fig. 2 is a schematic side view of a test apparatus for an accelerator board according to an embodiment of the present application, where one test portion is located in a retracted position and the other test portions are located in test positions.
Fig. 3 is a schematic front view of a test apparatus for an accelerator board card according to an embodiment of the present application.
Reference numerals:
10-a power supply part, 20-a test part, 21-a socket,
30-equipment main body, 31-accommodating cavity, 40-trigger switch, 50-buzzer, 60-timer,
71-a first indicator lamp, 72-a second indicator lamp, 73-a third indicator lamp;
80-accelerator board card to be tested.
Detailed Description
The technical solutions in the present application will be described below with reference to the accompanying drawings.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes and substitutions are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
In a first aspect, referring to fig. 1, the present application provides a test apparatus for an accelerator board card, including:
a test section 20 including an electrode contact area for placing an accelerator board 80 to be tested;
a power supply part 10 electrically connected to the electrode contact region;
a control section for generating a power supply control signal and a power-off control signal according to a reliability test operation,
wherein the power supply control signal instructs the power supply section 10 to start supplying a test voltage for performing a reliability test on the accelerator board to be tested 80 to the test section 20,
wherein the power-off control signal instructs the power supply section 10 to stop supplying the test voltage to the test section 20.
Through the technical scheme, a user can place the accelerator board card 80 to be tested in the electrode contact area, so that the electrical connection between the accelerator board card 80 to be tested and the electrode contact area is realized, the power supply part 10 is electrically connected with the electrode contact area, the reliability test operation is performed on the control part, the control part generates a power supply control signal or a power failure control signal based on the operation, and therefore, the two ends of the accelerator board card 80 to be tested can be loaded with test voltage or not loaded with test voltage.
In this way, in the whole test process, the accelerator board card 80 to be tested is only required to be placed in the electrode contact area manually or by using a manipulator, or is taken out from the electrode contact area, and the control part automatically generates a power supply control signal or a power failure control signal according to the testability operation, that is, the supply of the test voltage to the accelerator board card 80 to be tested is automatically completed or the supply of the test voltage is stopped. The whole test process does not need to plug a power interface, and the test efficiency is high.
The test device may include a step-down device, which is turned on with a normal 220V voltage, and then the 220V voltage is reduced to 12V by using the step-down device, and then the power supply part 10 may be a circuit board capable of providing a test voltage of 12V to the electrode contact area.
In a possible implementation manner, the test device further comprises a device main body 30, the device main body 30 comprises a containing cavity 31, the power supply part 10 and the control part are both installed on the device main body 30, the test part 20 is movably installed in the containing cavity 31, and the moving path of the test part 20 comprises a test position and a retraction position; when the test part 20 is in the test position, the electrode contact area is positioned in the accommodating cavity 31, and when the test part 20 is in the retracted position, the electrode contact area is positioned outside the accommodating cavity 31. Thus, during the test, the accelerator board to be tested 80 is accommodated in the accommodating chamber 31 and can be protected from interference by the apparatus main body 30. Before testing, the test part 20 can conveniently place the speed reducer board card to be tested in the electrode contact area when in the retracted position, or after testing, the test part 20 can conveniently retract the accelerator board card 80 to be tested from the electrode contact area when in the retracted position.
Specifically, the test apparatus further includes a flexible wire electrically connected between the power supply section 10 and the test section 20. Thus, the flexible wire can be always connected between the power supply part 10 and the test part 20, and the flexible wire stretches or bends along with the reciprocating movement of the test part 20 between the test position and the retraction position so as to meet the position change requirement of the test part 20.
Wherein the test device further comprises a sliding block and a sliding rail which are mutually matched, one of the sliding block and the sliding rail is arranged on the test part 20, and the other is arranged on the device main body 30; the test part 20 reciprocates between a testing position and a storage position along the extending direction of the slide rail. Under the limiting action of the slide rail, the test part 20 can smoothly reciprocate between the test position and the retracted position. In this way, the test part 20 can be pulled like a drawer, and in the drawings provided in the application, in order to clearly show the accelerator board to be tested inside the test part 20, the panel of the test part 20 is omitted, and when the test part 20 is located at the test position, the panel is substantially flush with the surface of the apparatus main body.
In order to prevent the test section 20 from being moved towards the retracted position away from the testing position during testing, in one possible implementation, the test device further comprises a sub-buckle and a female buckle that are mutually adapted, the sub-buckle being mounted on the device body 30, the female buckle being mounted on the test section 20; when the sub-buckle and the female buckle are buckled together, the test part 20 is locked at the test position by the sub-buckle and the female buckle together; the test section 20 is capable of reciprocating between a testing position and a retracted position when the sub-buckle and the main buckle are separated. In this way, the test part 20 can be ensured to be reliably positioned at the test position in the test process, the accelerator board card 80 to be tested is hidden in the accommodating cavity 31, and the safety in the test process is improved.
In addition, in order to further test the safety, the test device further comprises a position sensor, wherein the position sensor is installed on the device main body 30 and is used for detecting whether the female buckle is positioned at the locking position, if so, the position sensor generates a first detection signal, and if not, the position sensor generates a second detection signal; when the female buckle is positioned at the locking position, the male buckle and the female buckle are buckled together; the control part comprises a trigger switch 40 and a processor, the trigger switch 40 is manually triggered to generate a first enabling signal, the processor is in communication connection with the trigger switch 40, the position sensor and the power supply part 10, and the first enabling signal is used for enabling the processor to generate a power supply control signal on the premise that the processor acquires a first detection signal. In other words, if the female buckle is not located at the locking position, it means that there is no lock between the test portion 20 and the device main body 30, and the test portion 20 may move towards the retracted position during the test, so the present application defines that the first detection signal needs to be obtained, and the processor can be triggered by the first enable signal to generate the power supply control signal on the premise that the female buckle is not located at the locking position, so as to start providing the test voltage for the accelerator board 80 to be tested.
In order to be able to stop the supply of the test voltage to the test section 20 by means of a timer, referring to fig. 3, the test device further comprises a timer 60, the timer 60 being in communication with the control section, the control section generating a timing start signal when generating the power supply signal, the timer 60 starting the timing in accordance with the timing start signal; when the timer is completed, the timer 60 generates a timer completion signal, and the control section generates a power-off control signal according to the timer completion signal. Thus, the whole process is automatically timed, the test voltage is automatically stopped to be provided, manual timing is not needed, the operation is convenient, and operators can pay out energy to test other accelerator board cards 80 to be tested, so that the test efficiency is improved.
In one example, a preset time period may be set on the timer 60 or by the control portion, for example, 24 hours, and when 24 hours are full, the timer 60 stops counting and generates a count completion signal.
In one possible implementation, the test apparatus further includes a buzzer 50, the buzzer 50 being communicatively connected to the timer 60, the buzzer 50 generating a warning sound in response to the timing completion signal. Thus, the operator at a remote location may be alerted by sound that at least one of the test sections 20 has completed the test, and the accelerator board card that has completed the test needs to be removed again and a new accelerator board card 80 to be tested is replaced in the electrode test area. Which is a kind of
Wherein the test apparatus may have a plurality of test sections 20, each test section 20 may have a timer 60, each timer 60 being in communication with the buzzer 50.
In one example, a plurality of electrode contact areas may be included on one test section 20, and the electrode contact areas may be connected in parallel, and may be powered on or powered off simultaneously, so that the test section 20 and the timer 60 may be in a one-to-one correspondence, and the timer 60 may be used to take charge of timing of all the electrode contact areas on one test section 20.
In a possible embodiment, the test apparatus further includes a first indicator light 71 and a current monitor, where the current monitor is configured to monitor an output current of the power supply portion 10 and determine whether the output current is less than a preset threshold, and if yes, the current monitor generates an abnormal signal; the control unit is connected to the current monitor in communication, and when the timer 60 is in the time counting state, the control unit controls the first indicator lamp 71 to be in the on state according to the abnormality signal. During the test, if the accelerator board card 80 to be tested fails the reliability test, the circuit on the accelerator board card 80 to be tested will be disconnected or shorted, resulting in a significant decrease or a significant increase in the output current of the power supply portion 10 and the output current, the current monitor may record the output current initially as a preset threshold, and if the output current is monitored to be smaller than the preset threshold later, it indicates that at least one accelerator board card 80 to be tested fails the reliability test, so that the first indicator 71 may be in a lit state to prompt the tester that at least one of all accelerator board cards 80 to be tested on the test portion 20 fails the reliability test.
In one possible implementation, the test apparatus further includes a second indicator light 72, the control portion being in communication with the second indicator light 72, the second indicator light 72 being in an illuminated state in accordance with the power control signal. By the second indicator lamp 72 being in the lighted state, it can be judged that the test section 20 corresponding to the second indicator lamp 72 is in the process of testing.
Similarly, the test device further comprises a third indicator lamp 73, the control part is in communication connection with the third indicator lamp 73, and the third indicator lamp 73 is in a lighting state according to the power-off control signal. By the third indicator lamp 73 being in the on state, it can be judged that the test section 20 corresponding to the third indicator lamp 73 is not in the test state.
In one example, the test portion 20 and the second indicator lamp 72 may be in one-to-one correspondence, and the test portion 20 and the third indicator lamp may be in one-to-one correspondence. The current state of the test section 20 can be judged if the first indicator lamp 71 and the second indicator lamp 72 are passed.
In summary, when the control unit generates the power supply control signal, the second indicator lamp 72 is turned on, and the first indicator lamp 71 and the third indicator lamp 73 are in a non-lighted state.
During the test, the second indicator lamp 72 is kept in a lighting state, and the control part controls the first indicator lamp 71 to be in a lighting state according to the abnormal signal;
at the time of the test, the control unit sends out a power-off control signal, the third indicator lamp 73 is turned on, the second indicator lamp enters a non-lighted state, and the first indicator lamp 71 is still in a lighted state.
In a specific implementation, the test part 20 includes a base and at least one socket 21, the socket 21 is mounted on the base, the socket 21 includes a receiving groove, and the electrode contact areas are located in the receiving groove and correspond to the receiving grooves one by one. Thus, by placing the accelerator board to be tested 80 in the accommodation groove, the conductive portion of the accelerator board to be tested 80 and the electrode contact area can be electrically connected, so that testing can be performed.
Specifically, a plurality of sockets 21 may be provided on one substrate, so that one test section 20 can test a plurality of accelerator boards 80 to be tested at the same time.
In addition, by detachably connecting the socket 21 and the base body, it is possible to replace different sockets 21 according to the type of the accelerator board 80 to be tested. The test range of the test equipment is enlarged.
In this application, the power supply unit 10 and the test unit 20 may be in one-to-one correspondence, and the power supply unit 10 and the control unit may be in one-to-one correspondence.
In a second aspect, the present application also provides a test system comprising an accelerator board to be tested 80 and the test apparatus described above. By this test system, the reliability test of the accelerator board to be tested 80 can be completed.
It should be noted that, on the premise of no conflict, the embodiments described in the present application and/or the technical features in the embodiments may be arbitrarily combined with each other, and the technical solutions obtained after the combination should also fall into the protection scope of the present application.
It should be understood that the specific examples in the embodiments of the present application are only for helping those skilled in the art to better understand the embodiments of the present application, and not limit the scope of the embodiments of the present application, and those skilled in the art may make various improvements and modifications based on the above embodiments, and these improvements or modifications fall within the protection scope of the present application.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes and substitutions are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A test apparatus for an accelerator board, comprising:
a test section (20) including an electrode contact area for placing an accelerator board card (80) to be tested;
a power supply unit (10) electrically connected to the electrode contact region;
a control section for generating a power supply control signal or a power-off control signal according to a reliability test operation,
wherein the power supply control signal instructs the power supply section (10) to start supplying a test voltage for performing a reliability test on the accelerator board to be tested (80) to the test section (20),
wherein the power-off control signal instructs the power supply section (10) to stop supplying the test voltage to the test section (20).
2. The test device according to claim 1, further comprising a device body (30), the device body (30) comprising a housing cavity (31), the power supply portion (10) and the control portion being both mounted on the device body (30), the test portion (20) being movably mounted in the housing cavity (31), the movement path of the test portion (20) comprising a test position and a retracted position;
the electrode contact area is located in the receiving chamber (31) when the test part (20) is in the test position;
when the testing part (20) is at the folding and unfolding position, the electrode contact area is positioned outside the accommodating cavity (31).
3. The test device according to claim 2, characterized in that it further comprises a snap and a female snap adapted to each other, said snap being mounted on said device body (30) and said female snap being mounted on said test section (20);
when the child buckle and the female buckle are buckled together, the test part (20) is locked at the test position by the child buckle and the female buckle together;
the test section (20) is capable of reciprocating between the test position and the retracted position when the sub-buckle and the main buckle are separated.
4. A test device according to claim 3, further comprising a position sensor mounted on the device body (30) for detecting whether the button is in the locked position, the position sensor generating a first detection signal if it is, and generating a second detection signal if it is; when the female buckle is positioned at the locking position, the sub buckle and the female buckle are buckled together;
the control part comprises a trigger switch (40) and a processor, the trigger switch (40) is manually triggered to generate a first enabling signal, the processor is in communication connection with the trigger switch (40), the position sensor and the power supply part (10),
the first enable signal is for causing the processor to generate the power supply control signal on the premise that the processor has acquired the first detection signal.
5. The test device according to claim 1, further comprising a timer (60), the timer (60) being communicatively connected to the control portion,
when the control part generates the power supply signal, the control part also generates a timing starting signal, and the timer (60) starts timing according to the timing starting signal;
when the timing is completed, the timer (60) generates a timing completion signal, and the control section generates the power-off control signal according to the timing completion signal.
6. The test device according to claim 5, further comprising a first indicator light (71) and a current monitor for monitoring the output current of the power supply section (10) and determining whether the output current is less than a preset threshold, if so, the current monitor generating an anomaly signal;
the control unit is in communication with the current monitor, and when the timer (60) is in a time counting state, the control unit controls the first indicator lamp (71) to be in a lighting state according to the abnormality signal.
7. Test device according to claim 1, characterized in that the test device further comprises a second indicator light (72) and/or a third indicator light (73),
the control part is in communication connection with the second indicator lamp (72), and the second indicator lamp (72) is in a lighting state according to the power supply control signal;
the control part is in communication connection with the third indicator lamp (73), and the third indicator lamp (73) is in a lighting state according to the power-off control signal.
8. The test device according to claim 1, wherein the test section (20) comprises a base body and at least one socket (21), the socket (21) being mounted on the base body, the socket (21) comprising a receiving groove, the electrode contact areas being located in the receiving groove and being in one-to-one correspondence with the receiving grooves.
9. Test apparatus according to claim 8, characterized in that the socket (21) is detachably connected to the base body.
10. A test system, the test system comprising: accelerator board card and the test apparatus of any one of claims 1-9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311520728.2A CN117572036A (en) | 2023-11-15 | 2023-11-15 | Test equipment and test system for accelerator board card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311520728.2A CN117572036A (en) | 2023-11-15 | 2023-11-15 | Test equipment and test system for accelerator board card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117572036A true CN117572036A (en) | 2024-02-20 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311520728.2A Pending CN117572036A (en) | 2023-11-15 | 2023-11-15 | Test equipment and test system for accelerator board card |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117572036A (en) |
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2023
- 2023-11-15 CN CN202311520728.2A patent/CN117572036A/en active Pending
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