CN117571752A - Imaging apparatus, detecting apparatus, and imaging method - Google Patents

Imaging apparatus, detecting apparatus, and imaging method Download PDF

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Publication number
CN117571752A
CN117571752A CN202311498180.6A CN202311498180A CN117571752A CN 117571752 A CN117571752 A CN 117571752A CN 202311498180 A CN202311498180 A CN 202311498180A CN 117571752 A CN117571752 A CN 117571752A
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light beam
imaging
target
receiving
focused
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杨祎罡
于洋懿
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Tsinghua University
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Tsinghua University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/025—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material using neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/05—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using neutrons

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)

Abstract

The application relates to an imaging device, a detection device and an imaging method. The device comprises a visible light conversion component, a light splitting component and an imaging component; the visible light conversion assembly is used for converting the target X-ray beam and the target neutron beam into visible light beams; the target X-ray beam and the target neutron beam are beams passing through the substance to be detected; the light splitting assembly is used for receiving the visible light beam and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam; and the imaging component is used for receiving the first light beam and the second light beam, respectively imaging the first light beam and the second light beam, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. By adopting the method, the imaging effect of photons and neutrons can be improved.

Description

Imaging apparatus, detecting apparatus, and imaging method
Technical Field
The present disclosure relates to the field of non-destructive testing, and in particular, to an imaging apparatus, a detection apparatus, and an imaging method.
Background
With the development of radiation imaging technology, dual mode imaging methods have emerged. The dual mode imaging method is a method of generating photons and neutrons using an electron accelerator and passing the photons and neutrons through a substance to be detected, so that the photons and neutrons passing through the substance to be detected can be imaged using an imaging apparatus. Furthermore, nondestructive detection of the substance to be detected can be realized according to imaging results of photons and neutrons.
Therefore, the dual-mode imaging method can be applied to the technical field of nondestructive testing, for example, the dual-mode imaging method can be widely applied to the engineering fields of aeroengine detection, lithium battery detection, concrete detection and the like, and has wide application prospect.
However, when the nondestructive detection is performed by adopting the dual-mode imaging method, photons and neutrons are imaged based on the traditional imaging equipment, and the imaging effect is poor due to the fact that the luminous intensity difference between the imaged neutron image and the photon image is large.
Disclosure of Invention
In view of the foregoing, it is desirable to provide an imaging apparatus, a detection apparatus, and an imaging method capable of improving the imaging effect of photons and neutrons.
In a first aspect, the present application provides an imaging apparatus. The device comprises a visible light conversion component, a light splitting component and an imaging component;
the visible light conversion assembly is used for converting the target X-ray beam and the target neutron beam into visible light beams; the target X-ray beam and the target neutron beam are beams penetrating through a substance to be detected;
the light splitting assembly is used for receiving the visible light beam and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam;
The imaging component is used for receiving the first light beam and the second light beam, respectively imaging the first light beam and the second light beam, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam.
In one embodiment, the imaging assembly comprises a first imaging assembly; the first imaging component comprises a first lens unit and a first imaging unit;
the first lens unit is used for receiving the first light beam, focusing the first light beam and making the focused first light beam incident to the first imaging unit;
the first imaging unit is used for receiving the focused first light beam and imaging the focused first light beam.
In one embodiment, the first imaging unit includes a microchannel plate, a delay line, and a digital circuit;
the micro-channel plate is used for converting the focused first light beam into an electric signal and sending the electric signal corresponding to the first light beam to the delay line;
the delay line is used for receiving the electric signal corresponding to the first light beam and transmitting the electric signal corresponding to the first light beam to the digital circuit;
The digital circuit is used for receiving the electric signal corresponding to the first light beam, and imaging the focused first light beam according to the electric signal corresponding to the first light beam.
In one embodiment, the imaging assembly further comprises a second imaging assembly; the second imaging component comprises a second lens unit and a second imaging unit;
the second lens unit is used for receiving the second light beam, focusing the second light beam and making the focused second light beam incident to the second imaging unit;
the second imaging unit is used for receiving the focused second light beam and imaging the focused second light beam.
In one embodiment, the second imaging unit comprises an image intensifier and an image sensor;
the image intensifier is used for receiving the focused second light beam, intensifying the luminous intensity of the focused second light beam, and making the intensified second light beam incident to the image sensor;
the image sensor is used for receiving the enhanced second light beam and imaging the enhanced second light beam.
In one embodiment, the image sensor comprises a complementary metal oxide semiconductor based image sensor or a charge coupled device based image sensor.
In one embodiment, the second lens unit comprises a plane mirror and a lens group;
the plane mirror is used for receiving the second light beam and reflecting the second light beam to the lens group;
the lens group is used for receiving the second light beam reflected to the lens group, focusing the second light beam and making the focused second light beam incident to the second imaging unit.
In one embodiment, the beam splitting assembly includes a half-mirror.
In a second aspect, the present application provides a detection apparatus. The apparatus comprises an imaging apparatus and a detection assembly in any of the embodiments of the first aspect;
the detection component is used for detecting the substance to be detected according to the imaging result corresponding to the first light beam and the imaging result corresponding to the second light beam.
In a third aspect, the present application provides an imaging method. The imaging device applied to any one of the embodiments of the first aspect, the method includes:
converting the target X-ray beam and the target neutron beam into visible light beams through the visible light conversion assembly; the target X-ray beam and the target neutron beam are beams penetrating through a substance to be detected;
Receiving the visible light beam through the beam splitting assembly, and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam;
and receiving the first light beam and the second light beam through the imaging component, respectively imaging the first light beam and the second light beam, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam.
The imaging device comprises a visible light conversion component, a light splitting component and an imaging component. The visible light conversion assembly is used for converting a target X-ray beam and a target neutron beam which pass through a substance to be detected into a visible light beam. The beam splitting component is used for receiving the visible light beam and splitting the visible light beam into a first beam and a second beam. The imaging component is used for receiving a first light beam corresponding to the target neutron beam and a second light beam corresponding to the target X-ray beam, imaging the first light beam and the second light beam respectively, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. Therefore, the imaging device in the embodiment of the application can be used for carrying out light splitting on the visible light beam to obtain the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam. Then, the first light beam corresponding to the split target neutron beam can be imaged, and an imaging result corresponding to the target neutron beam is generated; and the second light beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, the imaging device can image the target X-ray beam and the target neutron beam according to the characteristics of the X-ray beam and the neutron beam, so that the imaging effect of the X-ray and the neutrons can be improved.
Drawings
FIG. 1 is a schematic diagram of an image forming apparatus in one embodiment;
FIG. 2 is a schematic diagram of an imaging device including a first imaging assembly and a second imaging assembly in one embodiment;
FIG. 3 is a schematic diagram of an imaging device according to an embodiment;
FIG. 4 is a schematic diagram of an imaging device in an alternative embodiment;
FIG. 5 is a schematic perspective view of an imaging device in one embodiment;
FIG. 6 is a flow diagram of an imaging method in one embodiment.
Reference numerals illustrate:
100: an image forming apparatus; 120: a visible light conversion assembly; 140: a light splitting component; 160: an imaging assembly;
162: a first imaging assembly; 1622: a first lens unit; 1624: a first imaging unit;
1624a: a microchannel plate; 1624b: a delay line; 1624c: a digital circuit;
164: a second imaging assembly; 1642: a second lens unit; 1644: a second imaging unit;
1642a: a plane mirror; 1642b: a lens group;
1644a: an image intensifier; 1644b: an image sensor;
a1: a microchannel plate in the image intensifier 1644 a; a2: a phosphor screen in the image intensifier 1644 a;
520: a substance to be detected;
540: imaging the first beam; 560: imaging results of the second beam.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
With the development of radiation imaging technology, dual mode imaging methods have emerged. The dual mode imaging method is a method of generating photons and neutrons using an electron accelerator and passing the photons and neutrons through a substance to be detected, so that the photons and neutrons passing through the substance to be detected can be imaged using an imaging apparatus. Furthermore, nondestructive detection of the substance to be detected can be realized according to imaging results of photons and neutrons.
Therefore, the dual-mode imaging method can be applied to the technical field of nondestructive testing, for example, the dual-mode imaging method can be widely applied to the engineering fields of aeroengine detection, lithium battery detection, concrete detection and the like, and has wide application prospect.
However, when the nondestructive detection is performed by adopting the dual-mode imaging method, photons and neutrons are imaged based on the traditional imaging equipment, and the imaging effect is poor due to the fact that the luminous intensity difference between the imaged neutron image and the photon image is large.
Based on this, in one embodiment, the present application provides an imaging apparatus. The imaging device comprises a visible light conversion component, a light splitting component and an imaging component;
the visible light conversion assembly is used for converting the target X-ray beam and the target neutron beam into visible light beams; the target X-ray beam and the target neutron beam are beams passing through the substance to be detected;
the light splitting assembly is used for receiving the visible light beam and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam;
and the imaging component is used for receiving the first light beam and the second light beam, respectively imaging the first light beam and the second light beam, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam.
The imaging device refers to a device for imaging photons and neutrons passing through a substance to be detected. As shown in fig. 1, fig. 1 is a schematic structural view of an image forming apparatus in one embodiment. The imaging apparatus 100 includes a visible light conversion assembly 120, a light splitting assembly 140, and an imaging assembly 160. X-rays are particle streams generated by electrons transitioning between two energy levels that differ significantly in energy. X-rays are a type of photon. Photon refers to a wave packet of electromagnetic waves, i.e. the smallest unit of energy into which electromagnetic waves can be decomposed. Neutrons are particles that make up the nucleus. The substance to be detected refers to a substance that needs to be subjected to nondestructive detection. Visible light refers to electromagnetic waves that can be perceived by the human eye. The imaging result refers to an image generated after imaging the light beam.
By way of example, because photons and neutrons generated by an electron accelerator or other dual-ray imaging system have the same optical path characteristics, X-ray beams and neutron beams generated by the electron accelerator or other dual-ray imaging system may be directed through a substance to be detected, generating a target X-ray beam and a target neutron beam directed through the substance to be detected. The target X-ray beam and the target neutron beam may then be emitted to the visible light conversion assembly 120. Since the visible light converting assembly 120 is sensitive to both the X-ray beam and the neutron beam, the visible light converting assembly 120 is configured to receive the target X-ray beam and the target neutron beam and convert the target X-ray beam and the target neutron beam into visible light beams.
The visible light beam is incident on the beam splitting component 140, and the beam splitting component 140 is configured to receive the visible light beam and split the visible light beam into a first beam and a second beam. The first light beam is a visible light beam corresponding to a target neutron beam, and the second light beam is a visible light beam corresponding to a target X-ray beam. In one embodiment, the beam splitting assembly 140 includes a half-mirror. Then, the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam are propagated to the imaging component 160, and the imaging component 160 is configured to receive the first beam and the second beam, and image the first beam and the second beam respectively, so as to generate an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.
In the above-mentioned imaging device, the imaging device includes a visible light conversion component, a light splitting component, and an imaging component. The visible light conversion assembly is used for converting a target X-ray beam and a target neutron beam which pass through a substance to be detected into a visible light beam. The beam splitting component is used for receiving the visible light beam and splitting the visible light beam into a first beam and a second beam. The imaging component is used for receiving a first light beam corresponding to the target neutron beam and a second light beam corresponding to the target X-ray beam, imaging the first light beam and the second light beam respectively, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. Therefore, the imaging device in the embodiment of the application can be used for carrying out light splitting on the visible light beam to obtain the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam. Then, the first light beam corresponding to the split target neutron beam can be imaged, and an imaging result corresponding to the target neutron beam is generated; and the second light beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, the imaging device can image the target X-ray beam and the target neutron beam according to the characteristics of the X-ray beam and the neutron beam, so that the imaging effect of the X-ray and the neutrons can be improved.
In one embodiment, the imaging assembly includes a first imaging assembly; the first imaging component comprises a first lens unit and a first imaging unit;
the first lens unit is used for receiving the first light beam, focusing the first light beam and making the focused first light beam incident to the first imaging unit;
and the first imaging unit is used for receiving the focused first light beam and imaging the focused first light beam.
Exemplary, as shown in fig. 2, fig. 2 is a schematic structural diagram of an imaging apparatus including a first imaging assembly and a second imaging assembly in one embodiment. The imaging assembly 160 includes a first imaging assembly 162. The first imaging assembly 162 includes a first lens unit 1622 and a first imaging unit 1624. The first lens unit 1622 is configured to receive a first light beam corresponding to the split target neutron beam, focus the first light beam, and make the focused first light beam incident on the first imaging unit 1624. Wherein the first lens unit 1622 may be a lens group. The lens group is an optical system composed of two or more lenses. The position of the first lens unit 1622 may be set according to information such as a diameter of a lens in the first lens unit 1622 and a distance between the first lens unit 1622 and the spectroscopic assembly 140, which is, of course, not limited in the embodiment of the present application. The first imaging unit 1624 is configured to receive the focused first light beam, image the focused first light beam, and generate an imaging result corresponding to the target neutron beam. The first imaging unit 1624 may include, but is not limited to, a delay line, cross bar, or the like, counting imaging device.
In this embodiment, the imaging assembly includes a first imaging assembly; the first imaging component comprises a first lens unit and a first imaging unit. The first lens unit is used for receiving the first light beam, focusing the first light beam, and enabling the focused first light beam to enter the first imaging unit, so that the brightness of the first light beam can be enhanced through focusing. The first imaging unit is used for receiving the focused first light beam, imaging the focused first light beam, and imaging the first light beam with enhanced brightness, so that the imaging effect of the first light beam corresponding to the target neutron beam can be improved.
In one embodiment, the first imaging unit includes a microchannel plate, a delay line, and a digital circuit;
the micro-channel plate is used for converting the focused first light beam into an electric signal and transmitting the electric signal corresponding to the first light beam to the delay line;
the delay line is used for receiving the electric signal corresponding to the first light beam and transmitting the electric signal corresponding to the first light beam to the digital circuit;
and the digital circuit is used for receiving the electric signal corresponding to the first light beam and imaging the focused first light beam according to the electric signal corresponding to the first light beam.
Exemplary, as shown in fig. 3, fig. 3 is a schematic diagram of the most specific structure of the imaging device in one embodiment. The first imaging unit 1624 includes a micro-channel board 1624a, a delay line 1624b, and a digital circuit 1624c. The micro channel plate 1624a is configured to convert the focused first light beam into an electrical signal by a photoelectric effect, and transmit the electrical signal corresponding to the first light beam to the delay line 1624b. Delay line 1624b is configured to receive the electrical signal corresponding to the first light beam and transmit the electrical signal corresponding to the first light beam to digital circuit 1624c. The digital circuit 1624c is configured to receive the electrical signal corresponding to the first light beam, image the focused first light beam according to the electrical signal corresponding to the first light beam, and generate an imaging result corresponding to the target neutron beam.
Where the microchannel plate 1624a (Microchannel Plate, MCP) is a high spatial resolution electron multiplying detector, the microchannel plate 1624a may be a photocathode microchannel plate. Delay line 1624b is a position sensitive detector and delay line 1624b includes a delay line anode for collecting an electrical signal corresponding to the first light beam and transmitting the electrical signal to both ends of delay line 1624b. The digital circuit 1624c may be a time-to-digital converter, and the digital circuit 1624c is disposed at two ends of the delay line 1624b to measure the time when the electrical signal reaches the two ends of the delay line 1624b and determine the position of the electrical signal when it is transmitted to the delay line 1624b according to the time when the electrical signal reaches the two ends of the delay line 1624b. Therefore, a neutron event can be recorded according to the position where the electrical signal is transmitted to the delay line 1624b, and the first beam corresponding to the target neutron beam is imaged according to the recorded neutron event, so as to obtain an imaging result of the target neutron beam.
Since the X-ray beam is characterized by a strong instantaneous flow and a short duration, X-rays are generated within tens of nanoseconds (ns) after the electron accelerator hits the tungsten target; while neutron beams are characterized by small instantaneous current intensity and long duration, neutrons are continuously generated within a period of hundreds of nanoseconds (ns) to microseconds (ms) after the electron accelerator impinges on the tungsten target. Thus, the best method of imaging for X-ray beams and neutron beams is different. For neutron beams, the method is suitable for imaging in a counting mode for counting neutron events, namely recording the position and time of each neutron on the arrival delay line, and imaging the sub-beams according to the position and time of each neutron on the arrival delay line. The counting mode can directly record neutron events according to the electric signals, namely, noise floor and signals can be distinguished according to the information such as the amplitude of the electric signals, so that noise floor of interference signals is reduced, and the imaging effect of neutron beams can be improved.
However, since a large number of X-ray beams are generated in a short time, and a large number of signals cannot be processed in a short time by using the counting mode, the X-ray beams are suitable for an integration mode of imaging by using an image sensor. Although the integral mode cannot filter the noise floor according to the information such as the amplitude of the electric signal, the duration of the X-ray beam is short, and the amplitude of the signal is large, so that the influence of the noise generated by the integral mode on the signal is relatively small, namely, the integral mode can ensure the imaging effect of the X-ray beam.
In this embodiment, the first imaging unit includes a microchannel plate, a delay line and a digital circuit. The micro-channel plate is used for converting the focused first light beam into an electric signal and sending the electric signal corresponding to the first light beam with enhanced brightness to the delay line. The delay line is used for receiving the electric signal corresponding to the first light beam after the brightness is enhanced and transmitting the electric signal corresponding to the first light beam to the digital circuit. The digital circuit is used for receiving the electric signal corresponding to the first light beam, recording neutron events according to the electric signal corresponding to the first light beam, and accordingly imaging the first light beam corresponding to the target neutron beam according to the recorded neutron events, and then the imaging result of the target neutron beam can be obtained in a counting mode. Since the neutron beam is suitable for imaging in a counting mode, the imaging effect of the neutron beam can be improved.
In one embodiment, the imaging assembly further comprises a second imaging assembly; the second imaging component comprises a second lens unit and a second imaging unit;
the second lens unit is used for receiving the second light beam, focusing the second light beam and making the focused second light beam incident to the second imaging unit;
And the second imaging unit is used for receiving the focused second light beam and imaging the focused second light beam.
Illustratively, as shown in connection with fig. 3, the imaging assembly 160 further includes a second imaging assembly 164, the second imaging assembly 164 including a second lens unit 1642 and a second imaging unit 1644. The second lens unit 1642 is configured to receive a second light beam corresponding to the split target X-ray beam, focus the second light beam, and make the focused second light beam incident on the second imaging unit 1644. The second lens unit 1642 may include only a lens group, or the second lens unit 1642 may include a lens group and a plane mirror. Of course, the structure of the second lens unit 1642 may be specifically set according to the size, cost, and the like of the imaging apparatus, which is not limited in the embodiment of the present application. The second imaging unit 1644 is configured to receive the focused second light beam, image the focused second light beam, and generate an imaging result corresponding to the target X-ray beam.
In this embodiment, the imaging assembly further comprises a second imaging assembly; the second imaging component comprises a second lens unit and a second imaging unit. And the second lens unit is used for receiving the second light beam, focusing the second light beam and enabling the focused second light beam to enter the second imaging unit so as to enhance the brightness of the second light beam through focusing. The second imaging unit is used for receiving the focused second light beam, imaging the focused second light beam, and imaging the second light beam with enhanced brightness, so that the imaging effect of the second light beam corresponding to the target X-ray beam can be improved.
In one embodiment, the second imaging unit includes an image intensifier and an image sensor;
the image intensifier is used for receiving the focused second light beam, intensifying the luminous intensity of the focused second light beam and making the intensified second light beam incident to the image sensor;
and the image sensor is used for receiving the enhanced second light beam and imaging the enhanced second light beam.
Illustratively, as shown in connection with FIG. 3, the second imaging unit 1644 includes an image intensifier 1644a and an image sensor 1644b. The image intensifier 1644a is configured to receive the focused second light beam, intensify the luminous intensity of the focused second light beam, and make the intensified second light beam incident on the image sensor 1644b. The image sensor 1644b is configured to receive the enhanced second light beam, and image the enhanced second light beam to generate an imaging result corresponding to the target X-ray beam.
The image intensifier 1644a is a vacuum photocell capable of changing a light signal having low luminance into a light signal having high luminance. In embodiments of the present application, image intensifier 1644a may include a microchannel plate and a phosphor screen, or image intensifier 1644a may include a photocathode, an electron lens, and a phosphor screen. Of course, the embodiments of the present application are not limited thereto. In one embodiment, the image sensor 1644b comprises a complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor, CMOS) based image sensor or a charge coupled device (Charge Coupled Device, CCD) based image sensor.
In this embodiment, the second imaging unit includes an image intensifier and an image sensor. The image intensifier is used for receiving the focused second light beam, intensifying the luminous intensity of the focused second light beam, and making the second light beam with the intensified luminous intensity (namely brightness) incident to the image sensor. The image sensor is configured to receive the enhanced second light beam and image the enhanced second light beam. The second beam corresponding to the target X-ray beam can be imaged based on the image intensifier and the image sensor, i.e. the target X-ray beam can be imaged in an integration mode. Since the X-ray beam is suitable for imaging in the integration mode, the present embodiment can improve the imaging effect of the X-ray beam.
In one embodiment, the second lens unit includes a plane mirror and a lens group;
the plane mirror is used for receiving the second light beam and reflecting the second light beam to the lens group;
and the lens group is used for receiving the second light beam reflected to the lens group, focusing the second light beam and making the focused second light beam incident to the second imaging unit.
Illustratively, as shown in connection with FIG. 3, the second lens unit 1642 includes a planar mirror 1642a and a lens group 1642b. The plane mirror 1642a is configured to receive the split second light beam and reflect the second light beam to the lens set 1642b. The lens set 1642b is configured to receive the second light beam reflected to the lens set 1642b, focus the second light beam, and make the focused second light beam incident on the second imaging unit 1644. The position of the lens group 1642b may be set according to information such as a diameter of a lens in the lens group 1642b and a distance between the lens group 1642b and the plane mirror 1642a, and of course, the setting position of the plane mirror 1642a and the setting position of the lens group 1642b are not limited in the embodiment of the present application.
In this embodiment, the second lens unit includes a plane mirror and a lens group. The plane mirror is used for receiving the second light beam and reflecting the second light beam to the lens group. The lens group is used for receiving the second light beam reflected to the lens group, focusing the second light beam, and enabling the focused second light beam to be incident to the second imaging unit, so that the brightness of the second light beam can be enhanced through focusing.
In order to make the solution in the present application more clear, the imaging apparatus described above is described below in an alternative embodiment. In an alternative embodiment, as shown in fig. 4, there is provided an image forming apparatus including:
a visible light conversion assembly 120 for converting the target X-ray beam and the target neutron beam into visible light beams; the target X-ray beam and the target neutron beam are beams passing through the substance to be detected; wherein visible light conversion assembly 120 includes neutron sensitive microchannel plate 122 and phosphor screen 124; neutron sensitive microchannel plate 122 is used to convert the target X-ray beam and the target neutron beam into electrical signals comprising a plurality of electrons, and phosphor screen 124 is used to convert the electrical signals into visible light beams;
the beam splitting component 140 is configured to receive the visible light beam and split the visible light beam into a first beam and a second beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam; wherein, the beam splitting component 140 may be a half-transmitting half-reflecting beam splitter; the first light beam may be a reflected light beam, which refers to light reflected by the object when incident light impinges on the surface of the object; the second light beam may be a transmitted light beam, which refers to the outgoing light of the incident light after being refracted through the object. It should be noted that, both photons and X-rays may be used as the transmission imaging result or the reflection imaging result, and fig. 4 in the embodiment of the present application only shows a schematic view of the optical path;
The imaging assembly 160 includes a first imaging assembly 162 and a second imaging assembly 164; the first imaging component 162 includes a first lens unit 1622 and a first imaging unit 1624;
a first lens unit 1622 for receiving the first light beam, focusing the first light beam, and making the focused first light beam incident on a first imaging unit 1624; wherein the first lens unit 1622 may be a lens group;
the first imaging unit 1624 includes a micro-channel board 1624a, a delay line 1624b, and a digital circuit 1624c; a micro-channel plate 1624a for converting the focused first light beam into an electrical signal and transmitting the electrical signal corresponding to the first light beam to a delay line 1624b; a delay line 1624b for receiving the electrical signal corresponding to the first light beam and transmitting the electrical signal corresponding to the first light beam to the digital circuit 1624b; digital circuit 1624c, for receiving the electric signal corresponding to the first light beam, imaging the focused first light beam according to the electric signal corresponding to the first light beam, and generating an imaging result corresponding to the first light beam; wherein the microchannel plate 1624a may be a photocathode microchannel plate, the delay line 1624b may include a delay line anode, and the digital circuit 1624c may be a time-to-digital converter;
The second imaging assembly 164 includes a second lens unit 1642 and a second imaging unit 1644; a second lens unit 1642 for receiving the second light beam, focusing the second light beam, and making the focused second light beam incident on a second imaging unit 1644; the second lens unit 1642 includes a plane mirror 1642a and a lens group 1642b; a plane mirror 1642a for receiving the second light beam and reflecting the second light beam to the lens group 1642b; a lens group 1642b for receiving the second light beam reflected to the lens group, focusing the second light beam, and making the focused second light beam incident to a second imaging unit 1644;
the second imaging unit 1644 includes an image enhancer 1644a and an image sensor 1644b; an image intensifier 1644a for receiving the focused second light beam, intensifying the luminous intensity of the focused second light beam, and making the intensified second light beam incident on the image sensor 1644b; the image sensor 1644b is configured to receive the enhanced second light beam, and image the enhanced second light beam to generate an imaging result corresponding to the second light beam;
wherein the image intensifier 1644a may include a microchannel plate a1 in the image intensifier 1644a and a phosphor screen a2 in the image intensifier 1644 a; the micro-channel plate a1 in the image intensifier 1644a is used for converting the focused second light beam into an electric signal, and the fluorescent screen a2 in the image intensifier 1644a is used for converting the electric signal into the intensified second light beam; the image sensor 1644b may include a complementary metal oxide semiconductor based image sensor or a charge coupled device based image sensor.
Exemplary, as shown in fig. 5, fig. 5 is a schematic perspective view of an imaging device in one embodiment. First, an X-ray beam and a neutron beam generated by an electron accelerator or other dual-ray imaging system are passed through a substance to be detected 520, generating a target X-ray beam and a target neutron beam that pass through the substance to be detected 520. Second, the visible light conversion assembly 120, which is comprised of a neutron sensitive microchannel plate 122 and a phosphor screen 124, converts the target X-ray beam and the target neutron beam into visible light beams. Third, the beam splitting component 140 receives the visible light beam and splits the visible light beam into a first beam and a second beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam. Fourth, the first light beam is incident on the first lens unit 1622, the first lens unit 1622 receives the first light beam, focuses the first light beam, and the focused first light beam is incident on the first imaging unit 1624 composed of the micro channel plate 1624a, the delay line 1624b, and the digital circuit 1624 c. Fifth, the first imaging unit 1624 receives the focused first light beam, images the focused first light beam, and generates an imaging result 540 of the first light beam corresponding to the target neutron beam.
Sixth, the second light beam is incident on the plane mirror 1642a, and the plane mirror 1642a receives the second light beam and reflects the second light beam to the lens group 1642b. The lens group 1642b receives the second light beam reflected to the lens group, focuses the second light beam, and makes the focused second light beam incident on the second imaging unit 1644. Seventh, the focused second beam is received, and the focused second beam is imaged, so as to generate an imaging result 560 of the second beam corresponding to the target X-ray beam.
In the above-mentioned imaging device, the imaging device includes a visible light conversion component, a light splitting component, and an imaging component. The visible light conversion assembly is used for converting a target X-ray beam and a target neutron beam which pass through a substance to be detected into a visible light beam. The beam splitting component is used for receiving the visible light beam and splitting the visible light beam into a first beam and a second beam. The imaging component is used for receiving a first light beam corresponding to the target neutron beam and a second light beam corresponding to the target X-ray beam, imaging the first light beam and the second light beam respectively, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. Therefore, the imaging device in the embodiment of the application can be used for carrying out light splitting on the visible light beam to obtain the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam. Then, the first light beam corresponding to the split target neutron beam can be imaged, and an imaging result corresponding to the target neutron beam is generated; and the second light beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, the imaging device can image the target X-ray beam and the target neutron beam according to the characteristics of the X-ray beam and the neutron beam, so that the imaging effect of the X-ray and the neutrons can be improved.
In one embodiment, the present application further provides a detection apparatus including the imaging apparatus and the detection assembly in the above embodiments;
and the detection component is used for detecting the substance to be detected according to the imaging result corresponding to the first light beam and the imaging result corresponding to the second light beam.
The detection component may obtain the attenuation coefficient of the target X-ray beam and the attenuation coefficient of the target neutron beam according to the imaging result corresponding to the first light beam and the imaging result corresponding to the second light beam. Therefore, the attribute information of the substance to be detected, such as the information of the element type of the substance to be detected, and the like, can be obtained by calculating according to the attenuation coefficient of the target X-ray beam and the attenuation coefficient of the target neutron beam. Further, the substance to be detected may be detected based on the attribute information of the substance to be detected. The related description of the imaging apparatus may refer to the above-described embodiments, and will not be described herein.
In the above-mentioned detection device, the detection device includes an imaging device and a detection assembly. Because the detection device comprises the imaging device, the detection device in the embodiment of the application can be used for carrying out light splitting on the target X-ray beam and the visible light beam corresponding to the target neutron beam to obtain the first light beam corresponding to the target neutron beam and the second light beam corresponding to the target X-ray beam. Then, the first light beam corresponding to the split target neutron beam can be imaged, and an imaging result corresponding to the target neutron beam is generated; and the second light beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, the imaging device can image the target X-ray beam and the target neutron beam according to the characteristics of the X-ray beam and the neutron beam, so that the imaging effect of the X-ray and the neutrons can be improved. Furthermore, by adopting the detection assembly, the substance to be detected can be detected more accurately according to the imaging result corresponding to the first light beam and the imaging result corresponding to the second light beam with good imaging effects.
In one embodiment, as shown in fig. 6, an imaging method is provided, taking an example in which the method is applied to the imaging apparatus 100 in fig. 1 as an illustration, comprising the steps of:
s620, converting the target X-ray beam and the target neutron beam into visible light beams through a visible light conversion assembly; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected.
Alternatively, since photons and neutrons generated by the electron accelerator or other dual-ray imaging system have the same optical path characteristics, the X-ray beam and neutron beam generated by the electron accelerator or other dual-ray imaging system may be made to pass through the substance to be detected, generating a target X-ray beam and a target neutron beam that pass through the substance to be detected. The target X-ray beam and the target neutron beam may then be emitted to a visible light conversion assembly. Since the visible light converting assembly is sensitive to both the X-ray beam and the neutron beam, the target X-ray beam and the target neutron beam can be received by the visible light converting assembly and converted into visible light beams. At this time, the visible light beam corresponding to the target X-ray beam and the visible light beam corresponding to the target neutron beam are on the same optical path.
S640, receiving the visible light beam through the beam splitting assembly, and splitting the visible light beam into a first beam and a second beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam.
Optionally, the visible light beam is incident on the beam splitting component, and the visible light beam can be received by the beam splitting component and split into the first beam and the second beam. The first light beam is a visible light beam corresponding to a target neutron beam, and the second light beam is a visible light beam corresponding to a target X-ray beam.
It should be noted that, because the X-ray beam is characterized by strong instantaneous flow and short duration, X-rays are generated within tens of nanoseconds (ns) after the electron accelerator hits the tungsten target; while neutron beams are characterized by small instantaneous current intensity and long duration, neutrons are continuously generated within a period of hundreds of nanoseconds (ns) to microseconds (ms) after the electron accelerator impinges on the tungsten target. Therefore, different time windows are respectively set for the first light beam and the second light beam, so that the optical signals corresponding to the first light beam and the optical signals corresponding to the second light beam are respectively read through the different time windows, and the visible light beam corresponding to the target neutron beam and the visible light beam corresponding to the target X-ray beam can be separated according to the time sequence of generating the X-ray beam and the neutron beam.
S660, the first light beam and the second light beam are received through the imaging component, the first light beam and the second light beam are imaged respectively, and an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam are generated.
Optionally, the first light beam corresponding to the target neutron beam and the second light beam corresponding to the target X-ray beam are propagated to the imaging component, and the imaging component can receive the first light beam and the second light beam and respectively image the first light beam and the second light beam to generate an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. It can be understood that the imaging component can image the first light beam corresponding to the split target neutron beam to generate an imaging result corresponding to the target neutron beam; and the second light beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam.
In the imaging method, a target X-ray beam and a target neutron beam which pass through a substance to be detected are converted into visible light beams through a visible light conversion assembly; receiving the visible light beam through the light splitting assembly, and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam; and the imaging component receives the first light beam and the second light beam, images the first light beam and the second light beam respectively, and generates an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. Therefore, by using the imaging method in the embodiment of the application, the visible light beam can be split, so that the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam are obtained. Then, the first light beam corresponding to the split target neutron beam can be imaged, and an imaging result corresponding to the target neutron beam is generated; and the second light beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, the imaging device can image the target X-ray beam and the target neutron beam according to the characteristics of the X-ray beam and the neutron beam, so that the imaging effect of the X-ray and the neutrons can be improved.
It should be understood that, although the steps in the flowcharts related to the above embodiments are sequentially shown as indicated by arrows, these steps are not necessarily sequentially performed in the order indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the flowcharts described in the above embodiments may include a plurality of steps or a plurality of stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of the steps or stages is not necessarily performed sequentially, but may be performed alternately or alternately with at least some of the other steps or stages.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The foregoing examples represent only a few embodiments of the present application, which are described in more detail and are not thereby to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.

Claims (10)

1. An imaging device, wherein the device comprises a visible light conversion assembly, a light splitting assembly and an imaging assembly;
the visible light conversion assembly is used for converting the target X-ray beam and the target neutron beam into visible light beams; the target X-ray beam and the target neutron beam are beams penetrating through a substance to be detected;
the light splitting assembly is used for receiving the visible light beam and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam;
the imaging component is used for receiving the first light beam and the second light beam, respectively imaging the first light beam and the second light beam, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam.
2. The imaging device of claim 1, wherein the imaging assembly comprises a first imaging assembly; the first imaging component comprises a first lens unit and a first imaging unit;
the first lens unit is used for receiving the first light beam, focusing the first light beam and making the focused first light beam incident to the first imaging unit;
the first imaging unit is used for receiving the focused first light beam and imaging the focused first light beam.
3. The imaging apparatus of claim 2, wherein the first imaging unit comprises a microchannel plate, a delay line, and a digital circuit;
the micro-channel plate is used for converting the focused first light beam into an electric signal and sending the electric signal corresponding to the first light beam to the delay line;
the delay line is used for receiving the electric signal corresponding to the first light beam and transmitting the electric signal corresponding to the first light beam to the digital circuit;
the digital circuit is used for receiving the electric signal corresponding to the first light beam, and imaging the focused first light beam according to the electric signal corresponding to the first light beam.
4. The imaging apparatus of claim 2, wherein the imaging assembly further comprises a second imaging assembly; the second imaging component comprises a second lens unit and a second imaging unit;
the second lens unit is used for receiving the second light beam, focusing the second light beam and making the focused second light beam incident to the second imaging unit;
the second imaging unit is used for receiving the focused second light beam and imaging the focused second light beam.
5. The imaging apparatus of claim 4, wherein the second imaging unit comprises an image intensifier and an image sensor;
the image intensifier is used for receiving the focused second light beam, intensifying the luminous intensity of the focused second light beam, and making the intensified second light beam incident to the image sensor;
the image sensor is used for receiving the enhanced second light beam and imaging the enhanced second light beam.
6. The imaging apparatus of claim 5, wherein the image sensor comprises a complementary metal oxide semiconductor-based image sensor or a charge coupled device-based image sensor.
7. The imaging apparatus according to claim 4, wherein the second lens unit includes a plane mirror and a lens group;
the plane mirror is used for receiving the second light beam and reflecting the second light beam to the lens group;
the lens group is used for receiving the second light beam reflected to the lens group, focusing the second light beam and making the focused second light beam incident to the second imaging unit.
8. The imaging apparatus of claim 1, wherein the light splitting assembly comprises a semi-transparent semi-reflective beam splitter.
9. A detection apparatus comprising the imaging apparatus of any one of claims 1-8 and a detection assembly;
the detection component is used for detecting the substance to be detected according to the imaging result corresponding to the first light beam and the imaging result corresponding to the second light beam.
10. An imaging method, applied to the imaging apparatus according to any one of claims 1 to 8, the method comprising:
converting the target X-ray beam and the target neutron beam into visible light beams through the visible light conversion assembly; the target X-ray beam and the target neutron beam are beams penetrating through a substance to be detected;
Receiving the visible light beam through the beam splitting assembly, and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam;
and receiving the first light beam and the second light beam through the imaging component, respectively imaging the first light beam and the second light beam, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam.
CN202311498180.6A 2023-11-10 2023-11-10 Imaging apparatus, detecting apparatus, and imaging method Pending CN117571752A (en)

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