CN117539697A - Storage controller testing method, device, computer equipment and storage medium - Google Patents
Storage controller testing method, device, computer equipment and storage medium Download PDFInfo
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Abstract
The application relates to a storage device testing method, an apparatus, a computer device, a storage medium and a computer program product. The method comprises the following steps: in a BMC management system of a storage device to be tested, executing a test command corresponding to each test item in a configuration file in sequence, and performing functional test on the storage device; acquiring first test information of a functional test corresponding to a test item through a BMC management system; and determining the test result of the test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage device. By adopting the method, the test efficiency of the storage equipment can be improved.
Description
Technical Field
The present disclosure relates to the field of storage devices, and in particular, to a method and apparatus for testing a storage controller, a computer device, and a storage medium.
Background
With the development of computer technology, the use demand of storage devices is increasing, and ensuring the stability and reliability of the storage devices is an important ring of computer services. Therefore, in the field of servers, it is necessary to test the storage device to ensure the stability and reliability of the storage device.
In a conventional storage device testing method, a technician performs a test of each function in a storage controller by performing an operation in a command manner under an operating system with respect to the storage controller of the storage device.
However, since the memory controller of the memory device has many functions and relies on manual execution, it takes too much time to test each function of the memory controller one by one, and the test efficiency is low.
Disclosure of Invention
Based on this, it is necessary to provide a storage device testing method, apparatus, computer device and computer readable storage medium in order to address the above technical problems.
In a first aspect, the present application provides a method for testing a storage device. The method comprises the following steps:
in a BMC management system of a storage device to be tested, sequentially executing a test command corresponding to each test item in a configuration file, and performing functional test on the storage device;
acquiring first test information of a functional test corresponding to the test item through the BMC management system;
and determining a test result of each test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage equipment.
In this embodiment, based on the test instruction of each test item set in the configuration file, the test instruction is automatically executed by the relevant test tool or interface in the BMC management system of the storage device to be tested, and based on the first test information and the preset reference test information acquired by the BMC management system, the test result of the test item is obtained, so that automation of functional test in the storage device corresponding to each test item is realized, manual operation is reduced, and the test efficiency of the storage device is improved.
In one embodiment, in the BMC management system of the storage device to be tested, the method further includes, before performing the functional test on the storage device, executing a test command corresponding to each test item in the configuration file in sequence:
logging in a BMC management system of a storage device to be tested, and performing test setting based on a configuration file template in the BMC management system to obtain a set configuration file.
In this embodiment, a BMC management system of a storage device to be tested is logged in, a configuration file template is displayed, and a set configuration file is obtained through a test setting of human-computer interaction performed in the configuration file template by a user, so that not only is preparation for an automatic test of a subsequent storage device, but also the configuration file set by the user independently improves the flexibility of the test.
In one embodiment, in the BMC management system of a storage device to be tested, a test command corresponding to each test item in a configuration file is executed in sequence, and a functional test is performed on the storage device, including:
in a BMC management system of the storage device to be tested, according to the sequence of each test item set in the configuration file, sequentially executing a test instruction corresponding to each test item;
and based on the test instruction, performing functional test on each test item on the storage equipment.
In this embodiment, based on the test items in the pre-configured configuration file, the function test is performed on the storage device to be tested by executing the test instructions in the test items, so as to realize the test automation of the storage device.
In one embodiment, after the obtaining, by the BMC management system, the first test information of the functional test corresponding to the test item, the method further includes:
acquiring second test information of the functional test corresponding to the test item under an operating system;
and determining a test result of each test item based on the first test information, the second test information and preset reference test information corresponding to the test item.
In this embodiment, the second test information of the test item is obtained by adding the second test information under the operating system, and the pairwise comparison test is performed by combining the first test information and the prediction reference information under the BMC management system, so that various checks of the test result of the test item are realized, and the accuracy of the test result is improved.
In one embodiment, the determining the test result of each test item based on the first test information, the second test information and the preset reference test information corresponding to the test item includes:
comparing the first test information and the second test information corresponding to each test item to determine a first initial test result;
comparing the first test information corresponding to each test item with preset reference test information to determine a second initial test result;
comparing the second test information with preset reference test information to determine a third initial test result;
and determining the test result of the test item according to the first initial test result, the second initial test result and the third initial test result.
In this embodiment, the first initial test result, the second initial test result and the third initial test result are obtained by comparing the first test information, the second test information and the preset reference test information in pairs, and then multiple verification of the test item test is realized by the three initial test results, so that the final test result of the test item is determined, and the test accuracy of the test item is improved.
In one embodiment, the obtaining the test result of the storage device includes:
obtaining a test result corresponding to each test item;
and determining the test result of the storage equipment based on the test result corresponding to each test item, and generating a test report in a preset document format by using the test result of the storage equipment.
In the embodiment, based on the test results corresponding to the test items, the test report in the preset document format corresponding to the storage device is automatically generated, the consistency and standardization of the test results of the storage device are ensured, the clear display of the test results of the storage device is realized, further, the manual operation is reduced, and the abnormality of the storage device is rapidly located based on the test report.
In one embodiment, the test item includes a controller information test item, and the controller information of the storage device acquired by the BMC management system is used as the first test information; acquiring controller information of the storage device under the operating system as the second test information;
the determining a test result of each test item based on the first test information, the second test information and preset reference test information corresponding to the test item includes:
And comparing the first test information, the second test information and preset reference controller information corresponding to each test item in pairs to determine the test result of the controller information test item.
In this embodiment, taking the controller information test item as an example, the automatic test of the controller of the storage device is completed through the interface call under the BMC management system, so as to improve the test efficiency of the storage device. And then, the controller information acquired by the BMC management system is used as first test information, the controller information acquired under the operating system is used as second test information, and then, based on the first test information, the second test information and preset reference controller information, the test result of the controller information test item is determined, and the three information are compared and checked pairwise, so that the accuracy of the test result is improved.
In one embodiment, the test items include physical disk test items, and in a BMC management system of a storage device to be tested, executing a test command corresponding to each test item in a configuration file in turn, and performing a functional test on the storage device, where the method includes:
sending a physical disk state switching instruction to the storage equipment; the physical disk state switching instruction is used for setting the state of the physical disk to be at least one of a global hot standby state, removing the physical disk state and positioning the physical disk or a local hot standby state;
The obtaining, by the BMC management system, first test information of a functional test corresponding to the test item includes:
and acquiring physical disk information and the state of the physical disk of the storage device to be tested after responding to the physical disk state switching instruction through the BMC management system, and taking the physical disk information and the state of the physical disk as first test information.
In this embodiment, for the test item of the physical disk information, according to the test instruction in the test item automatically executed by the corresponding interface or tool in the BMC management system, the function test is performed on the physical disk in the storage device, and the test information corresponding to the test item can be obtained through the BMC management system, so as to determine the test result of the test item.
In one embodiment, the test items include a logical disk test item, and in a BMC management system of a storage device to be tested, executing a test command corresponding to each test item in a configuration file in turn, and performing a functional test on the storage device, where the method includes:
identifying and avoiding a physical disk of the storage device where the operating system is located;
sending a logic disk creation instruction to the storage device to be tested, and indicating the storage device to be tested to create multiple types of logic disks on a physical disk where the operating system is not located;
And testing the logic disks of the multiple types one by one based on the corresponding test instruction in the test item.
In this embodiment, for the test item of the logical disk information, the test instruction in the test item is automatically executed according to the corresponding interface or tool in the BMC management system, so that the function test of the logical disk of the storage device is realized, and the test efficiency of the storage device is improved.
In a second aspect, the present application further provides a storage device testing apparatus. The device comprises:
the test module is used for executing the test command corresponding to each test item in the configuration file in sequence in the BMC management system of the storage device to be tested, and carrying out functional test on the storage device;
the acquisition module is used for acquiring first test information of the functional test corresponding to the test item through the BMC management system;
and the processing module is used for determining the test result of the test item based on the first test information corresponding to each test item and preset reference test information and obtaining the test result of the storage device.
In a third aspect, the present application also provides a computer device. The computer device comprises a memory storing a computer program and a processor which when executing the computer program performs the steps of:
In a BMC management system of a storage device to be tested, sequentially executing a test command corresponding to each test item in a configuration file, and performing functional test on the storage device;
acquiring first test information of a functional test corresponding to the test item through the BMC management system;
and determining a test result of each test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage equipment.
In a fourth aspect, the present application also provides a computer-readable storage medium. The computer readable storage medium having stored thereon a computer program which when executed by a processor performs the steps of:
in a BMC management system of a storage device to be tested, sequentially executing a test command corresponding to each test item in a configuration file, and performing functional test on the storage device;
acquiring first test information of a functional test corresponding to the test item through the BMC management system;
and determining a test result of each test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage equipment.
In a fifth aspect, the present application also provides a computer program product. The computer program product comprises a computer program which, when executed by a processor, implements the steps of:
in a BMC management system of a storage device to be tested, sequentially executing a test command corresponding to each test item in a configuration file, and performing functional test on the storage device;
acquiring first test information of a functional test corresponding to the test item through the BMC management system;
and determining a test result of each test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage equipment.
The storage device testing method, the storage device testing device, the computer device, the storage medium and the computer program product are characterized in that in a BMC management system of the storage device to be tested, a testing command corresponding to each testing item in a configuration file is executed in sequence, and the storage device is subjected to functional test; acquiring first test information of a functional test corresponding to the test item through the BMC management system, and acquiring second test information under an operating system; and determining a test result of each test item based on the first test information, the second test information and preset reference test information corresponding to each test item, and obtaining the test result of the storage device. By adopting the method, based on the test instruction of each test item set in the configuration file, the test instruction is automatically executed through the related test tool or interface in the BMC management system of the storage device to be tested, and based on the first test information acquired by the BMC management system and the preset reference test information, the test result of the test item is obtained, the automation of the function test in the storage device corresponding to each test item is realized, the manual operation is reduced, and the test efficiency of the storage device is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the related art, the drawings that are required to be used in the embodiments or the related technical descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to the drawings without inventive effort for a person having ordinary skill in the art.
FIG. 1 is an application environment diagram of a storage device testing method in one embodiment;
FIG. 2 is a flow chart of a method of testing a storage device according to one embodiment;
FIG. 3 is a flow chart of an automated test procedure based on test instructions in one embodiment;
FIG. 4 is a flowchart illustrating steps for determining test results by multiple information comparison in one embodiment;
FIG. 5 is a detailed flowchart of the steps for determining test results by multiple information comparison in one embodiment;
FIG. 6 is a flow diagram of the steps for generating a test report in one embodiment;
FIG. 7 is a flow diagram of a method of testing physical disk test items in one embodiment;
FIG. 8 is a flow chart of a method of testing logical disk test items in one embodiment;
FIG. 9 is a schematic diagram of the content of various test items detected by clicking an external configuration button in one embodiment;
FIG. 10 is a flow diagram of an example of a storage device testing method including a target test item in one embodiment;
FIG. 11 is a block diagram of a storage device testing apparatus in one embodiment;
fig. 12 is an internal structural diagram of a computer device in one embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
First, technical terms related to the present application will be described:
BMC (baseboard management controller ) is a small operating system independent of a server system. The function is to facilitate remote management, monitoring, installation, restarting, etc. of the server. Meanwhile, the BMC entity is a chip integrated on the main board, and is an RJ45 network port to the outside, and the network port is also called a management port and has independent IP (Internet protocol) independent of the IP address of a service port of the server system. While the BMC basically supports operating the storage device.
RAID (Redundant Array of Independent Disks ), simply referred to as disk array, is a large disk system formed by combining multiple independent disks together, thereby achieving better storage performance and higher reliability than a single disk. The conventional RAID is classified into different grades, and different speeds, safety and cost performance can be provided respectively. The typical RAID levels are as follows: NRAID, JBOD, RAID0, RAID1, RAID10, RAID5, RAID6, etc.
A storage controller, also called a RAID controller (simply called a controller), is a hardware device or software program for managing Hard Disk Drives (HDDs)/Solid State Disks (SSDs) in a computer or disk array so that they can function as logical components, each of which performs its role.
The storage device testing method provided by the embodiment of the application can be applied to an application environment shown in fig. 1. Wherein the test device 102 communicates with the storage device 104 to be tested over a network. The method comprises the steps that test equipment sequentially executes test commands corresponding to each test item in a configuration file in a BMC management system of a storage device to be tested, and functional test is conducted on the storage device; acquiring first test information of a functional test corresponding to a test item through a BMC management System, and acquiring second test information under an Operating System (OS); and determining the test result of the test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage device. The test device 102 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, etc.
In one embodiment, as shown in fig. 2, a method for testing a storage device is provided, and the method is applied to the test device in fig. 1, which is specifically considered to be applied to a test tool integrated in the test device, and the embodiment of the present application is not limited, and specifically includes the following steps:
step 202, in a BMC management system of a storage device to be tested, executing a test command corresponding to each test item in the configuration file in sequence, and performing a functional test on the storage device.
In implementation, the test device and the storage device to be tested are included in a pre-built test environment, wherein the storage device to be tested can be one, but is not limited to one, the test device can test a single storage device, batch tests can also be performed on a plurality of storage devices, and the number of the storage devices is not limited in the embodiment of the present application. When starting to test, a user logs in a BMC management system (namely BMC web) of the storage device to be tested through the test device, and sequentially executes a test command corresponding to each test item in a preset configuration file through the BMC management system to perform functional test on the storage device.
Each test item corresponds to a functional test of the storage device to be tested, and the functional test of the storage device can be adaptively set based on the service requirements of users and the like.
Step 204, obtaining, by the BMC management system, first test information of the functional test corresponding to the test item.
In implementation, when each test item is executed, the test equipment acquires first test information of a functional test corresponding to the test item through the BMC management system. Specifically, two parts are involved in the test process of executing each test item, namely a first part: executing the test item for functional testing, and a second part: test information corresponding to the test item (the test information comprises first test information) is acquired so as to determine a test result through the test information.
Step 206, determining a test result of the test item based on the first test information corresponding to each test item and the preset reference test information, and obtaining the test result of the storage device.
In implementation, the test device determines a test result of each test item based on the first test information corresponding to the test item and preset reference test information set in the configuration file. And then, the test equipment obtains the test result of the storage equipment based on the test result corresponding to each test item.
In the storage device testing method, based on the testing instruction of each testing item set in the configuration file, the testing instruction is automatically executed through the relevant testing tool or interface in the BMC management system of the storage device to be tested, and based on the first testing information and the preset reference testing information acquired by the BMC management system, the testing result of the testing item is obtained, the automation of the function test in the storage device corresponding to each testing item is realized, the manual operation is reduced, and the testing efficiency of the storage device is improved.
Alternatively, the preset test tool in the present application may be written using Python development, and the embodiment of the present application is not limited.
In one embodiment, prior to step 202, the method further comprises:
step 201, logging in a BMC management system of a storage device to be tested, and performing test setting based on a configuration file template in the BMC management system to obtain a set configuration file.
In implementation, when starting to test the storage device, the subsequent automatic test flow needs to be preconfigured, the test device is in communication connection with the storage device to be tested, the test device logs in a BMC management system of the storage device to be tested through a preconfigured BMC account password, a test configuration interface is displayed, the test configuration interface comprises a configuration file template, and a user can set relevant parameters through the interface to obtain a configuration file for finally testing the storage device.
In this embodiment, a BMC management system of a storage device to be tested is logged in, a configuration file template is displayed, and a set configuration file is obtained through a test setting of human-computer interaction performed in the configuration file template by a user, so that not only is preparation for an automatic test of a subsequent storage device, but also the configuration file set by the user independently improves the flexibility of the test.
In one embodiment, as shown in fig. 3, in step 202, in a BMC management system of a storage device to be tested, a test command corresponding to each test item in a configuration file is sequentially executed, and a functional test is performed on the storage device, including:
step 302, in the BMC management system of the storage device to be tested, according to the sequence of each test item set in the configuration file, executing the test instruction corresponding to each test item in sequence.
In implementation, a configuration file for testing is stored in a BMC management system of a storage device to be tested, the configuration file contains test items corresponding to functional tests of the storage device, which are preset, the test items are mutually independent, and the test device can execute test instructions corresponding to each test item in sequence based on test sequences among the test items set in the configuration file. And the test equipment sequentially executes the test instructions corresponding to each test item according to the sequence of each test item set in the configuration file.
Optionally, the function test or the pressure test program modularization of each function of the storage device in the application, namely the test item modularization, has independence, can be independently set according to different requirements, and has high freedom degree in setting the test item. Specifically, the test program row of the full test item is configured in the configuration file template, and whether the test item is executed or not is determined only by configuring a parameter value, for example, when the parameter value is 1, the test item is represented to be executed in the test process of the current storage device, and when the parameter value is 0, the test item is represented to be not executed in the test process of the current storage device.
Alternatively, the test items that may be included in the configuration file may be, but are not limited to,: control information test items, storage controller test items, physical disk test items, logical disk test items, external configuration test items, import-export function test items, and event log test items.
Step 304, based on the test instruction, performing a functional test on each test item on the storage device.
In implementation, since the BMC may support operations on the storage device, the test device performs automated functional testing of the storage device based on the test instructions in the test items.
In this embodiment, based on the test items in the pre-configured configuration file, the function test is performed on the storage device to be tested by executing the test instructions in the test items, so as to realize the test automation of the storage device.
In one example, as shown in fig. 4, after step 204, the method further comprises:
step 402, obtaining second test information of the functional test corresponding to the test item under the operating system.
In implementation, after the first test information corresponding to the test item is obtained through the BMC management system, the second test information of the functional test corresponding to the test item can also be obtained under the operating system through a preset toolkit (or called a test tool) of the operating system.
Optionally, a test tool matched with the type of the operating system is preset in the configuration file according to the different types of the operating system.
Step 404, determining a test result of each test item based on the first test information, the second test information and the preset reference test information corresponding to each test item.
In implementation, the test equipment determines a test result of each test item based on the first test information, the second test information and preset reference test information corresponding to each test item. Specifically, the test device can utilize the three pieces of test information to perform pairwise comparison and verification, and determine the test result of the test item based on the comparison result.
In this embodiment, the second test information of the test item is obtained by adding the second test information under the operating system, and the pairwise comparison test is performed by combining the first test information and the prediction reference information under the BMC management system, so that various checks of the test result of the test item are realized, and the accuracy of the test result is improved.
In one embodiment, as shown in fig. 5, the specific process of determining the test result of each test item in step 404 based on the first test information, the second test information and the preset reference test information includes:
step 502, comparing the first test information and the second test information corresponding to each test item, and determining a first initial test result.
In implementation, whether the storage device is tested through the BMC management system or the storage device is tested based on a tool kit (test tool) under the operating system, because the storage device is aimed at, the obtained test information is the same, the test device is aimed at the first test information and the second test information corresponding to each obtained test item, the comparison of the test information is carried out, and the comparison result is used as a first initial test result. The first initial test result comprises two conditions of consistent comparison and inconsistent comparison, and when the first test information and the second test information are inconsistent in comparison, the test item can be characterized as not passing the test; and when the first test information and the second test information are consistent in comparison, the preliminary test of the test item is represented to pass.
Step 504, comparing the first test information corresponding to each test item with the preset reference test information to determine a second initial test result.
In implementation, when the configuration file is set in advance, for the function test corresponding to each test item, reference test information corresponding to the test item is preset in the configuration file, where the reference test information is test information given by the storage device under normal operation conditions when the test item is executed to perform the function test of the storage device. Therefore, the test equipment compares the first test information corresponding to each test item with preset reference test information, and takes the comparison result as a second initial test result. The second initial test result also comprises two conditions of consistent comparison and inconsistent comparison. And when the first test information and the reference test information are inconsistent in comparison, the test item can be characterized as failing to pass the test.
Step 506, comparing the second test information with the preset reference test information to determine a third initial test result.
In an implementation, the second test information is test information generated when the functional test of each test item is performed on the storage device, which is obtained under the operating system. The test equipment compares the second test information with preset reference test information, and takes the comparison result as a third initial test result. The third initial test result also comprises two conditions of consistent comparison and inconsistent comparison. And when the first test information and the reference test information are consistent in comparison, the test item can be characterized as failing to pass the test.
Step 508, determining the test result of the test item according to the first initial test result, the second initial test result and the third initial test result.
In practice, the test equipment determines a final test result for the test item based on the first initial test result, the second initial test result, and the third initial test result. For example, when the comparison of the first initial test result, the second initial test result and the third initial test result, which are all the test results representing the test information, is consistent, the test result of the test item is determined to be that the test is passed, and when the comparison of the first initial test result, the second initial test result and the third initial test result, which are at least one of the test results representing the test information, is inconsistent, the test is abnormal, so that the test equipment determines that the test result of the test item is that the test is not passed.
Optionally, the test item test passes, the preset next test item may be continuously executed, the test item test fails, and the portion of the test failed is recorded in the test report in advance, so as to trigger and determine whether to continuously execute the next test item.
In this embodiment, the first initial test result, the second initial test result and the third initial test result are obtained by comparing the first test information, the second test information and the preset reference test information in pairs, and then multiple verification of the test item test is realized by the three initial test results, so that the final test result of the test item is determined, and the test accuracy of the test item is improved.
In one embodiment, as shown in fig. 6, the specific process of obtaining the test result of the storage device in step 206 includes:
step 602, obtaining a test result corresponding to each test item.
In implementation, after the functional test of each test item is performed on the storage device, the test device collects and packages test results corresponding to each test item in the mapping log, wherein the test results of each test item are independent of each other and do not affect each other.
Step 604, determining a test result of the storage device based on the test results corresponding to the test items, and generating a test report in a preset document format from the test result of the storage device.
In implementation, the test equipment determines the test result of the storage equipment based on the test result corresponding to each test item, and generates a test report in a preset document format by converting the test result of the storage equipment. For example, the test device correspondingly arranges the test results corresponding to the test items according to the test sequence of the test items through the conversion tool, and generates and outputs a test report in a PDF (Portable Document Format ) format.
In the embodiment, based on the test results corresponding to the test items, the test report in the preset document format corresponding to the storage device is automatically generated, the consistency and standardization of the test results of the storage device are ensured, the clear display of the test results of the storage device is realized, further, the manual operation is reduced, and the abnormality of the storage device is rapidly located based on the test report.
In one embodiment, the storage device has more functions, corresponding test items can be set for each function to perform functional test, or part of test items can be selected for performing functional test based on requirements. The test items of the storage device may include a controller information test item, which is exemplified by the controller information test item, and in a test process of one test item, the first part is for executing a functional test of the test item, the first part is automatically implemented by the test device in a BMC management system through an interface, and the second part is for acquiring test information corresponding to the test item, that is, in an execution process of a control information test item, the test device performs controller setting, and then, acquires controller information of the storage device through a BMC management system interface, and takes the controller information acquired by the BMC management system interface as first test information. And acquiring the controller information of the storage device under the operating system of the storage device, and taking the controller information under the operating system as second test information. Therefore, in step 404, based on the first test information, the second test information and the preset reference test information corresponding to each test item, the specific processing procedure of determining the test result of the test item includes:
Step 4041, the first test information, the second test information and the preset reference controller information corresponding to each test item are compared in pairs, and the test result of the controller information test item is determined.
In implementation, the test equipment compares the first test information, the second test information and the preset reference controller information corresponding to each test item in pairs to determine the test result of the final controller information test item. The specific comparison of the test information and the process of determining the test result refer to steps 502 to 508 in the above embodiment, and the embodiments of the present application are not repeated here.
In this embodiment, taking the controller information test item as an example, the automatic test of the controller of the storage device is completed through the interface call under the BMC management system, so as to improve the test efficiency of the storage device. And then, the controller information acquired by the BMC management system is used as first test information, the controller information acquired under the operating system is used as second test information, and then, based on the first test information, the second test information and preset reference controller information, the test result of the controller information test item is determined, and the three information are compared and checked pairwise, so that the accuracy of the test result is improved.
Optionally, after the controller information of the storage device is grabbed to perform the test, the test item can be set to perform the test of the controller function, that is, the BMC management system is used for executing the test item of the controller function, setting the function of the controller, after the setting is completed, the BMC management system is used for obtaining the setting result, and the setting result of the controller is obtained under the operating system, and the two-to-two comparison is performed based on the setting result obtained by the BMC management system, the setting result of the controller obtained under the operating system and the reference setting result of the controller, if the comparison results are consistent, the test item test of the controller of the current storage device is determined to pass, and if the comparison results are inconsistent, the test item test of the controller is determined to fail.
In one embodiment, as shown in fig. 7, each test item of the storage device further includes a physical disk test item, and the test process of the physical disk test item also includes two parts, namely, a first part: executing the test item for functional testing, and a second part: the test information corresponding to the test item is coupled to determine a test result according to the test information, so in step 202, in the BMC management system of the storage device to be tested, for the physical disk test item, a test command corresponding to each test item in the configuration file is sequentially executed, and the functional test on the storage device specifically includes the following steps:
Step 702, a physical disk state switching instruction is sent to a storage device.
The physical disk state switching instruction is used for setting the state of the physical disk to be at least one of a global hot standby state, removing the physical disk state and positioning the physical disk or a local hot standby state.
In an implementation, a test device sends a switch instruction of a physical disk state to a storage device. And the storage equipment responds to the switching instruction of the physical disk state to switch the physical disk state. For example, the test equipment may instruct operations of locating the physical disk, setting the physical disk to a global hot standby state, removing the physical disk, and the like through a switch instruction of the physical disk state.
Further, in step 204, the acquiring, by the BMC management system, the first test information of the functional test corresponding to the test item specifically includes:
in step 704, the BMC management system obtains, as the first test information, physical disk information and a state of the physical disk after the storage device to be tested responds to the physical disk state switching instruction.
In implementation, after the physical disk state of the storage device is switched, the current physical disk information and the state of the physical disk of the storage device to be tested are obtained through the BMC management system, and the physical disk information and the physical disk state are used as first test information.
Optionally, the determining of the test result is performed subsequently based on the comparison of the first test information and preset reference test information (i.e. reference physical disk information and reference physical disk state), or the test result of the test item is determined based on the comparison of the first test information, the second test information (physical disk information and physical disk state acquired under the OS) and the reference test information.
Optionally, before the function test of the physical disk is performed by the physical disk state switching instruction in the test item, the test item can be set, then the test item is executed, the physical disk information is acquired by the BMC management system by using a corresponding API (Application Programming Interface ) or tool, the physical disk information is acquired by the test tool under the operating system, and then the physical disk information acquired by the BMC management system, the physical disk information under the operating system, and the preset reference physical disk information are compared in pairs, so that a test result of the test item corresponding to the physical disk information can be obtained.
In this embodiment, for the test item of the physical disk information, according to the test instruction in the test item automatically executed by the corresponding interface or tool in the BMC management system, the function test is performed on the physical disk in the storage device, and the test information corresponding to the test item can be obtained through the BMC management system, so as to determine the test result of the test item.
In one embodiment, as shown in fig. 8, each test item corresponding to the storage device further includes a logical disk test item, and in step 202, in a BMC management system of the storage device to be tested, a test command corresponding to each test item in the configuration file is executed in sequence, so as to perform a functional test on the storage device, which specifically includes:
step 802, identifying and circumventing a physical disk where an operating system of a storage device is located.
In implementation, in order to avoid damage of test operation to an operating system when a logical disk test is performed, in a pre-configured configuration file, an identification avoidance mechanism is preset for the logical disk test of the storage device, and the test device identifies and avoids a physical disk where the operating system of the storage device is located through a corresponding interface of the BMC management system, so that the logical disk test is performed on the disk where a non-operating system is located.
Step 804, sending a logic disk creation instruction to the storage device to be tested, where the logic disk creation instruction instructs the storage device to be tested to create multiple types of logic disks on the physical disk where the non-operating system is located.
In implementation, the test device sends a logic disk creation instruction to the storage device to be tested, and the storage device to be tested automatically creates multiple types of logic disks on the physical disk where the non-operating system is located by using a corresponding tool or an API interface of the BMC management system. For example, the plurality of types of logical disks include, but are not limited to, logical disks of different RAID levels, RAID0, RAID1, RAID01, RAID5, RAID6, and the like, respectively.
Step 806, testing multiple types of logical disks one by one based on the corresponding test instruction in the test item.
In implementation, the test equipment tests multiple types of logic disks one by one based on the corresponding test instruction in the test item. For example, performance testing, reliability testing, capacity testing, etc. may be performed on different types of logical disks. The performance test is to simulate load through a tool or a test script, measure the read-write performance (including sequential read-write and random read-write) of a logic disk and the like; the reliability test is to simulate a disk fault, check redundancy and recovery capacity of RAID level, and ensure the reliability of data; the capacity test is to verify the capacity and available space of the logical disk according to RAID level and logical disk composition.
Optionally, the test is performed one by one for different types of logical disks, and the test of different types of logical disks may be packaged in the same test item, or may be set as different test items respectively.
In this embodiment, for the test item of the logical disk information, the test instruction in the test item is automatically executed according to the corresponding interface or tool in the BMC management system, so that the function test of the logical disk of the storage device is realized, and the test efficiency of the storage device is improved.
In an alternative embodiment, in addition to the controller information test item, the controller function test item, the physical disk test item, and the logical disk test item related to the above embodiments, each test item of the function test of the storage device may further include: external configuration test items, import and export function test items, and event log test items.
Wherein, the external configuration test item: the external configuration is triggered by removing the hard disk of the storage device, the test device checks whether the external configuration function is successful, and if so, the test result representing the test item is that the test passes, and then the next test item can be executed or the current test flow can be ended.
Importing and exporting functional test items: and constructing a logic disk, performing export operation on the configuration of the logic disk, deleting the logic disk after the configuration export is successful, re-importing the logic disk, and testing the availability of the import and export functions of the storage device.
Event log test item: and acquiring a test event log through an interface of the BMC management system, acquiring corresponding log events under the operation system for comparison, detecting whether the test event log is the same or not, namely reflecting whether the test event log is accurate or not, if so, determining that the test item of the event log passes, and if not, determining that the test item of the event log fails.
In one embodiment, the test button may be externally configured, and by triggering the test button, an automated test of the storage device is achieved, as shown in fig. 9, and fig. 9 is a view of the content of each test item detected by clicking the external configuration button, where each test item may include, but is not limited to, a controller information test item: (BMC) obtaining RAID controller information, and a controller function test item: acquiring an index of the RAID controller and generating dictionary mapping; modifying the controller settings; physical disk test item: acquiring a physical disk state, and the like.
In one embodiment, an example of a storage device testing method containing target test items is given, as shown in fig. 10, the example method comprising:
step 1001, logging in a BMC management system of a storage device and configuring an operating system desktop;
step 1002, a user configures a test environment in a configuration file template displayed on an operating system desktop, selects test items, and generates a configuration file;
step 1003, setting a controller according to a first test item (i.e., a controller function test item) in the configuration file, and obtaining a controller setting result (i.e., judging whether the interface returns success or not, successfully characterizing that the controller setting result is successfully grabbed) through the BMC management system; during execution of the first test item, viewing a controller setting result under an Operating System (OS); the method comprises the steps of comparing a controller setting result obtained by a BMC management system, a controller setting result under an operating system and a controller setting result of a preset reference in pairs; when the comparison results are consistent, determining that the test result is that the test is passed; when the comparison results are inconsistent, determining that the test results are failed in test, and recording failed test results;
continuing to execute the next test item;
Step 1004, for a second test item (i.e., a logical disk test item) in the configuration file, identifying and avoiding a physical disk where the operating system is located, and in the execution process of the second test item, sending a creation instruction of the logical disk to the storage device to be tested, and indicating that the storage device to be tested creates multiple types of logical disks on the physical disk where the non-operating system is located; obtaining a logical disk creation result through a BMC management system, obtaining the logical disk creation result under an Operating System (OS), comparing the logical disk creation result obtained by the BMC management system, the logical disk creation result under the operating system and a preset reference logical disk creation result in pairs, and determining that the test result is passing when the comparison results are consistent; when the comparison results are inconsistent, determining that the test results are failed in test, and recording failed test results;
continuing to execute the next test item;
step 1005, executing other test items;
at step 1006, the test ends.
It should be understood that, although the steps in the flowcharts related to the embodiments described above are sequentially shown as indicated by arrows, these steps are not necessarily sequentially performed in the order indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the flowcharts described in the above embodiments may include a plurality of steps or a plurality of stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of the steps or stages is not necessarily performed sequentially, but may be performed alternately or alternately with at least some of the other steps or stages.
Based on the same inventive concept, the embodiment of the application also provides a storage device testing device for implementing the storage device testing method. The implementation of the solution provided by the apparatus is similar to the implementation described in the above method, so the specific limitation in the embodiments of the storage device testing apparatus provided below may refer to the limitation of the storage device testing method described above, and will not be repeated herein.
In one embodiment, as shown in FIG. 11, there is provided a storage device testing apparatus 1100 comprising: a test module 1101, an acquisition module 1102, and a processing module 1103, wherein:
the test module 1101 is configured to execute, in a BMC management system of a storage device to be tested, a test command corresponding to each test item in the configuration file in sequence, and perform a functional test on the storage device;
an obtaining module 1102, configured to obtain, by using a BMC management system, first test information of a functional test corresponding to a test item;
the processing module 1103 is configured to determine a test result of the test item based on the first test information corresponding to each test item and the preset reference test information, and obtain the test result of the storage device.
In one embodiment, the apparatus 1100 further comprises:
the configuration module is used for logging in the BMC management system of the storage device to be tested, and performing test setting based on a configuration file template in the BMC management system to obtain a set configuration file.
In one embodiment, the test module 1101 is specifically configured to execute, in a BMC management system of a storage device to be tested, a test instruction corresponding to each test item in sequence according to an order of each test item set in a configuration file;
and based on the test instruction, performing functional test on each test item on the storage device.
In one embodiment, the apparatus 1100 further comprises:
the second acquisition module is used for acquiring second test information of the functional test corresponding to the test item under the operating system;
the determining module is used for determining the test result of each test item based on the first test information, the second test information and the preset reference test information corresponding to each test item.
In one embodiment, the determining module is specifically configured to compare the first test information and the second test information corresponding to each test item, and determine a first initial test result;
comparing the first test information corresponding to each test item with preset reference test information to determine a second initial test result;
Comparing the second test information with preset reference test information to determine a third initial test result;
and determining the test result of the test item according to the first initial test result, the second initial test result and the third initial test result.
In one embodiment, the processing module 1103 is specifically configured to obtain a test result corresponding to each test item;
and determining the test result of the storage equipment based on the test result corresponding to each test item, and generating a test report with a preset document format from the test result of the storage equipment.
In one embodiment, the test items include a controller information test item, and the controller information of the storage device acquired by the BMC management system is used as first test information; acquiring controller information of the storage device under an operating system as second test information;
the determining module is specifically configured to compare the first test information, the second test information and the preset reference controller information corresponding to each test item in pairs, and determine a test result of the controller information test item.
In one embodiment, the test items include a physical disk test item, and the test module 1101 is specifically configured to send a physical disk state switching instruction to the storage device; the physical disk state switching instruction is used for setting the state of the physical disk to be at least one of a global hot standby state, removing the state of the physical disk and positioning the physical disk or a local hot standby state;
The obtaining module 1102 is specifically configured to obtain, by using the BMC management system, physical disk information and a state of a physical disk of the storage device to be tested after responding to the physical disk state switching instruction, as first test information.
In one embodiment, the test items include a logical disk test item, and the test module 1101 is specifically configured to identify and avoid a physical disk where an operating system of the storage device is located;
sending a creation instruction of a logic disk to a storage device to be tested, and indicating the storage device to be tested to create various types of logic disks on a physical disk where a non-operating system is located;
and testing the logic disks of various types one by one based on the corresponding test instruction in the test item.
The modules in the storage device testing apparatus described above may be implemented in whole or in part by software, hardware, or a combination thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, a computer device is provided, which may be a server, and the internal structure of which may be as shown in fig. 12. The computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database of the computer device is used for storing test items of the configuration file and data related to the test objects. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a storage device testing method.
It will be appreciated by those skilled in the art that the structure shown in fig. 12 is merely a block diagram of some of the structures associated with the present application and is not limiting of the computer device to which the present application may be applied, and that a particular computer device may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.
In an embodiment, there is also provided a computer device comprising a memory and a processor, the memory having stored therein a computer program, the processor implementing the steps of the method embodiments described above when the computer program is executed.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored which, when executed by a processor, carries out the steps of the method embodiments described above.
In an embodiment, a computer program product is provided, comprising a computer program which, when executed by a processor, implements the steps of the method embodiments described above.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the various embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high density embedded nonvolatile Memory, resistive random access Memory (ReRAM), magnetic random access Memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric Memory (Ferroelectric Random Access Memory, FRAM), phase change Memory (Phase Change Memory, PCM), graphene Memory, and the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, and the like. By way of illustration, and not limitation, RAM can be in the form of a variety of forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), and the like. The databases referred to in the various embodiments provided herein may include at least one of relational databases and non-relational databases. The non-relational database may include, but is not limited to, a blockchain-based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic units, quantum computing-based data processing logic units, etc., without being limited thereto.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.
Claims (12)
1. A method of testing a storage device, the method comprising:
in a BMC management system of a storage device to be tested, sequentially executing a test command corresponding to each test item in a configuration file, and performing functional test on the storage device;
acquiring first test information of a functional test corresponding to the test item through the BMC management system;
And determining a test result of each test item based on the first test information corresponding to each test item and preset reference test information, and obtaining the test result of the storage equipment.
2. The method according to claim 1, wherein, in the BMC management system of the storage device to be tested, the method further comprises, before performing the functional test on the storage device, sequentially executing the test command corresponding to each test item in the configuration file:
logging in a BMC management system of a storage device to be tested, and performing test setting based on a configuration file template in the BMC management system to obtain a set configuration file.
3. The method of claim 1, wherein the executing, in the BMC management system of the storage device to be tested, the test command corresponding to each test item in the configuration file in turn, and performing the functional test on the storage device, includes:
in a BMC management system of the storage device to be tested, according to the sequence of each test item set in the configuration file, sequentially executing a test instruction corresponding to each test item;
and based on the test instruction, performing functional test on each test item on the storage equipment.
4. The method according to claim 1, wherein after the acquiring, by the BMC management system, the first test information of the functional test corresponding to the test item, the method further comprises:
acquiring second test information of the functional test corresponding to the test item under an operating system;
and determining a test result of each test item based on the first test information, the second test information and preset reference test information corresponding to the test item.
5. The method of claim 4, wherein determining the test result of each test item based on the first test information, the second test information, and the preset reference test information corresponding to the test item comprises:
comparing the first test information and the second test information corresponding to each test item to determine a first initial test result;
comparing the first test information corresponding to each test item with preset reference test information to determine a second initial test result;
comparing the second test information with preset reference test information to determine a third initial test result;
And determining the test result of the test item according to the first initial test result, the second initial test result and the third initial test result.
6. The method of claim 1, wherein the obtaining the test result of the storage device comprises:
obtaining a test result corresponding to each test item;
and determining the test result of the storage equipment based on the test result corresponding to each test item, and generating a test report in a preset document format by using the test result of the storage equipment.
7. The method of claim 4, wherein the test item comprises a controller information test item, and wherein the controller information of the storage device obtained by the BMC management system is used as the first test information; acquiring controller information of the storage device under the operating system as the second test information;
the determining a test result of each test item based on the first test information, the second test information and preset reference test information corresponding to the test item includes:
and comparing the first test information, the second test information and preset reference controller information corresponding to each test item in pairs to determine the test result of the controller information test item.
8. The method of claim 1, wherein the test items include physical disk test items, and the executing, in a BMC management system of a storage device to be tested, a test command corresponding to each test item in a configuration file in turn, and performing a functional test on the storage device includes:
sending a physical disk state switching instruction to the storage equipment; the physical disk state switching instruction is used for setting the state of the physical disk to be at least one of a global hot standby state, removing the physical disk state and positioning the physical disk or a local hot standby state;
the obtaining, by the BMC management system, first test information of a functional test corresponding to the test item includes:
and acquiring physical disk information and the state of the physical disk of the storage device to be tested after responding to the physical disk state switching instruction through the BMC management system, and taking the physical disk information and the state of the physical disk as first test information.
9. The method of claim 1, wherein the test items include logical disk test items, and the executing, in a BMC management system of a storage device to be tested, a test command corresponding to each test item in a configuration file in turn, and performing a functional test on the storage device includes:
Identifying and avoiding a physical disk of the storage device where the operating system is located;
sending a logic disk creation instruction to the storage device to be tested, and indicating the storage device to be tested to create multiple types of logic disks on a physical disk where the operating system is not located;
and testing the logic disks of the multiple types one by one based on the corresponding test instruction in the test item.
10. A storage device testing apparatus, the apparatus comprising:
the test module is used for executing the test command corresponding to each test item in the configuration file in sequence in the BMC management system of the storage device to be tested, and carrying out functional test on the storage device;
the acquisition module is used for acquiring first test information of the functional test corresponding to the test item through the BMC management system;
and the processing module is used for determining the test result of the test item based on the first test information corresponding to each test item and preset reference test information and obtaining the test result of the storage device.
11. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any one of claims 1 to 9 when the computer program is executed.
12. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 9.
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