CN117518965B - Special control system for thickness measuring scanning device - Google Patents
Special control system for thickness measuring scanning device Download PDFInfo
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- CN117518965B CN117518965B CN202311481837.8A CN202311481837A CN117518965B CN 117518965 B CN117518965 B CN 117518965B CN 202311481837 A CN202311481837 A CN 202311481837A CN 117518965 B CN117518965 B CN 117518965B
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- 238000004891 communication Methods 0.000 claims abstract description 21
- 238000005070 sampling Methods 0.000 claims description 96
- 238000001514 detection method Methods 0.000 claims description 64
- 239000000463 material Substances 0.000 claims description 56
- 238000005259 measurement Methods 0.000 claims description 44
- 238000012545 processing Methods 0.000 claims description 22
- 230000002159 abnormal effect Effects 0.000 claims description 17
- 238000011897 real-time detection Methods 0.000 claims description 13
- 238000009826 distribution Methods 0.000 claims description 10
- 238000013441 quality evaluation Methods 0.000 claims description 7
- 238000011156 evaluation Methods 0.000 claims description 6
- 238000003860 storage Methods 0.000 claims description 6
- 230000005856 abnormality Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 description 7
- 230000009286 beneficial effect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009776 industrial production Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000004831 Hot glue Substances 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000001303 quality assessment method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
- G05B19/054—Input/output
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/10—Plc systems
- G05B2219/11—Plc I-O input output
- G05B2219/1103—Special, intelligent I-O processor, also plc can only access via processor
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention provides a special control system for a thickness measuring scanning device, which comprises the following components: the intelligent control system comprises a logic control module, a driving control module, a power module, an encoder input module, a sensor interface, a communication interface, a panel switch signal interface, a limit switch signal interface, an alarm output module and a power output module, wherein the logic control module is respectively connected with the driving control module, the power module, the encoder input module, the sensor interface, the communication interface, the panel switch signal interface, the limit switch signal interface, the alarm output module and the power output module, and the logic control module is connected with an upper computer through the communication interface for communication. The invention integrates control logic, IO interface, AD module, power management module, driving module and communication interface.
Description
Technical Field
The invention relates to the technical field of control systems, in particular to a special control system for a thickness measuring scanning device.
Background
With the progress of industrial production and the rise of process requirements, industrial detection equipment is required in various industrial production processes. An on-line thickness measuring device is one of the very common devices, and most of the devices adopt a scanning mode for detection. It generally comprises: thickness gauge, thickness gauge position adjustment device (refer to CN203286989U, CN 217762841U).
In the prior art, a set of thickness scanning detection control system is generally realized by adopting independent AD modules, PLCs, servo driving, servo motors, motion units, power supply units and the like. The system has the advantages of numerous elements, low assembly efficiency, troublesome programming and debugging and high manufacturing cost. Therefore, an integrated thickness scanning detection dedicated control system is needed.
Disclosure of Invention
The invention provides a special control system for a thickness measuring scanning device, which is used for solving the technical problem that an integrated special control system for thickness scanning detection is needed in the prior art.
In order to solve the technical problems, the invention discloses a special control system for a thickness measuring scanning device, which comprises the following components:
The intelligent control system comprises a logic control module, a driving control module, a power module, an encoder input module, a sensor interface, a communication interface, a panel switch signal interface, a limit switch signal interface, an alarm output module and a power output module, wherein the logic control module is respectively connected with the driving control module, the power module, the encoder input module, the sensor interface, the communication interface, the panel switch signal interface, the limit switch signal interface, the alarm output module and the power output module, and the logic control module is connected with an upper computer through the communication interface for communication.
Preferably, the driving control module is used for controlling a thickness gauge position adjusting device of the thickness gauge scanning device to work, the thickness gauge position adjusting device comprises a motor, the motor is connected with an encoder, and the encoder is electrically connected with an encoder input module;
The sensor interface is used for electrically connecting with a sensor assembly of the thickness measuring scanning device;
The alarm output module is used for being electrically connected with an alarm lamp;
the limit switch signal interface is used for connecting a limit switch of the thickness measuring scanning device;
the panel switch signal interface is used for connecting a control panel of the thickness measuring scanning device.
Preferably, the upper computer is a computer, and thickness measuring software running in the computer is connected with the logic control module through the Ethernet.
Preferably, the method further comprises: the first processing module, the first processing module includes:
The first acquisition unit is used for acquiring the width of the material to be measured;
The first calculation unit is used for determining the number of thickness measurement sampling areas in the same length range based on the first acquisition unit, and each thickness measurement sampling area is provided with at least one thickness measurement sampling point;
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Is the minimum area of the abnormal area of the historical thickness of the thick material to be measured,/> For the width of the thick material to be measured,The value is 3.14; ln is natural logarithm,/>Is an important coefficient of thickness of thick materials to be measured,/>The thickness abnormality rate of the thick material to be measured; s is the number of thickness measuring sampling areas in the same length range;
rounding up the symbol;
And the numbering module is used for numbering the thickness sampling areas.
Preferably, the first processing module further comprises:
A second calculation unit for calculating the number of sampling points of each sampling region;
；
For the total number of sampling points of the ith sampling area,/> For the area of the ith sampling region,/>For the preset area of single sampling point,/>Historical thickness anomaly rate for thickness of ith sampling area of thick material to be measured,/>Importance of the ith sampling area for the thick material to be measured; /(I)To round the symbol up.
Preferably, the first processing module further comprises:
The second obtaining unit is configured to obtain parameters of a thickness gauge, where the parameters of the thickness gauge include: the time required by the thickness gauge to measure a single thickness sampling point is measured, and the target time interval of two adjacent measurements of the thickness gauge is measured;
The third acquisition unit is used for acquiring the application scene information of the thickness measuring scanning device;
The first determining unit is used for identifying application scene information of the thickness measuring scanning device based on a preset model and determining corresponding scene key parameters, wherein the scene key parameters correspond to scene speed adjusting coefficients;
the third calculation unit is used for determining the target moving speed of the thickness gauge based on the width of the material to be measured, the distribution of thickness measurement sampling points and the first determination unit, and controlling the position adjusting device of the thickness gauge to work by the driving control module so that the actual moving speed of the thickness gauge is the target moving speed;
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The target moving speed of the thickness gauge is; /(I) The minimum distance between adjacent sampling points along the width direction of the thick material to be measured; /(I)The target time interval of two adjacent measurements of the thickness gauge; /(I)Is the base 10 logarithm; /(I)A scene speed adjusting coefficient corresponds to the jth scene key parameter; /(I)The maximum distance of adjacent sampling points along the width direction of the thick material to be measured; /(I)The minimum distance between adjacent sampling points along the width direction of the thick material to be measured; /(I)The average distance between adjacent sampling points along the width direction of the thick material to be measured is M, and M is the total number of scene key parameters.
Preferably, the first processing module further comprises:
and the material conveying strategy determining unit is used for determining the conveying strategy of the material based on the target moving speed of the thickness gauge and the application scene information of the thickness measuring scanning device.
Preferably, the system further comprises a second processing module, the second processing module comprising:
The fourth obtaining unit is configured to obtain actual operation data of the thickness measurement scanning device, where the actual operation data of the thickness measurement scanning device includes: actual operation data of the thickness gauge and actual operation data of the thickness gauge position adjusting device;
A fifth acquisition unit for acquiring actual thickness data obtained by detection of the thickness gauge;
A sixth obtaining unit, configured to obtain actual non-operation data of the thickness gauge, where the actual non-operation data of the thickness gauge affect the detection result, includes: actual vibration data of the thickness gauge, actual detection data of a critical position of the thickness gauge relative to a component for mounting the thickness gauge in the thickness gauge position adjusting device;
A first storage unit for storing actual data belonging to the fourth acquisition unit and the sixth acquisition unit;
The second storage unit is used for storing actual thickness data obtained by detection of the thickness gauge and dividing the actual thickness data obtained by detection of the thickness gauge belonging to the same length range of the material into a first data set;
a first evaluation unit for determining a detection anomaly according to the time stamps of the actual data of the fourth acquisition unit and the sixth acquisition unit;
the first early warning unit is used for carrying out early warning when the real-time detection anomaly degree is greater than or equal to a corresponding first preset threshold value;
A fourth calculation unit for calculating a thickness detection result of each thickness measurement sampling area;
The thickness abnormal region determining unit is used for determining the corresponding thickness sampling region as an abnormal thickness sampling region when the thickness detection result of the thickness measurement sampling region is larger than or equal to a corresponding second preset threshold value;
The second evaluation unit is used for acquiring G continuous adjacent first data sets with the real-time detection anomaly degree smaller than a first preset threshold value, and acquiring a quality evaluation coefficient according to the real-time detection anomaly degree and the time stamps of the G first data sets;
The second early warning unit is used for carrying out early warning when the quality evaluation coefficient is larger than a corresponding second preset threshold value;
a fifth calculation unit, which is used for obtaining G continuously adjacent first data sets with real-time detection anomaly degree smaller than a first preset threshold value and detection results of each detection area, and accumulating the total number of the abnormal thickness sampling areas in the same width range to obtain a plurality of first accumulated values;
and the sorting unit is used for sorting the plurality of first accumulated values.
The technical scheme of the invention is further described in detail through the drawings and the embodiments.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate the invention and together with the embodiments of the invention, serve to explain the invention. In the drawings:
FIG. 1 is a schematic block diagram of the structure of the present invention;
Fig. 2 is a schematic diagram of the working principle of the present invention.
Detailed Description
The preferred embodiments of the present invention will be described below with reference to the accompanying drawings, it being understood that the preferred embodiments described herein are for illustration and explanation of the present invention only, and are not intended to limit the present invention.
In addition, the descriptions of the "first," "second," and the like, herein are for descriptive purposes only and are not intended to be specifically construed as order or sequence, nor are they intended to limit the invention solely for distinguishing between components or operations described in the same technical term, but are not to be construed as indicating or implying any relative importance or order of such features. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, technical solutions and technical features between the embodiments may be combined with each other, but it is necessary to base that a person skilled in the art can implement the combination of technical solutions, when the combination of technical solutions contradicts or cannot be implemented, should be considered that the combination of technical solutions does not exist, and is not within the scope of protection claimed by the present invention.
The invention provides the following examples
Example 1
The invention relates to a special control system for equipment for measuring the thickness of a hot melt adhesive coating on line.
The embodiment of the invention provides a special control system for a thickness measuring scanning device, as shown in fig. 1-2, comprising:
The intelligent control system comprises a logic control module, a driving control module, a power module, an encoder input module, a sensor interface, a communication interface, a panel switch signal interface, a limit switch signal interface, an alarm output module and a power output module, wherein the logic control module is respectively connected with the driving control module, the power module, the encoder input module, the sensor interface, the communication interface, the panel switch signal interface, the limit switch signal interface, the alarm output module and the power output module, and the logic control module is connected with an upper computer through the communication interface for communication. The modules of the invention can be arranged on an integrated circuit board;
preferably, the driving control module is used for controlling a thickness gauge position adjusting device of the thickness gauge scanning device to work, the thickness gauge position adjusting device comprises a motor, the motor is connected with an encoder, and the encoder is electrically connected with an encoder input module; the thickness gauge position adjusting device is used for adjusting the position of the thickness gauge, is in the prior art, and can refer to CN203286989U, CN 217762841U;
The sensor interface is used for electrically connecting with a sensor assembly of the thickness measuring scanning device;
The alarm output module is used for being electrically connected with an alarm lamp;
the limit switch signal interface is used for connecting a limit switch of the thickness measuring scanning device; the limit switch is used for realizing the movement limit of the thickness gauge, and is in the prior art;
the panel switch signal interface is used for connecting a control panel of the thickness measuring scanning device.
Preferably, the upper computer is a computer, and thickness measuring software running in the computer is connected with the logic control module through the Ethernet.
Specific: (1) a power module;
the power supply module is responsible for converting AC220V into DC48V, DC V, DC3.3V and the like
(2) A communication interface;
The communication interface module is an RJ45 interface and provides gigabit communication speed.
(3) Logic control module
Is responsible for linking various input and output, providing logic processing and operation, processing communication scheduling of upper computer and the like
(4) Drive control module
The driving control module can output pulse signals for driving the servo motor or the stepping motor
(5) Encoder input module
The high-speed input counter is provided with a path for receiving pulse signals of the encoder
(6) Sensor signal input interface
The device consists of two paths of 0-10V analog input interfaces, provides a maximum acquisition rate of 10kHz, and has an AD bit of 24 bits
(7) Limit signal input interface
Is used for connecting a positive limit, a positive origin, a negative limit and a negative origin, and totally 4 paths of input signals
(8) Button signal input interface
The device is used for connecting a forward line, a reverse line, returning to the original point and stopping, and totally adds 4 paths of signals;
(9) Alarm signal output interface
The device is used for outputting 5 paths of alarm output signals in total of red, yellow, blue, white and green;
(10) Power output interface
And power supply output such as DC48V, DC, 24 and V, DC V is provided for the outside, so that the connection of the peripheral equipment is facilitated.
Thickness measuring software running in the computer is connected with the controller through the Ethernet, and the stepping or servo motor, the encoder, the sensor, the operation button, the limit switch and the alarm lamp are connected to the controller through interfaces. The controller may receive control of the operating panel buttons and the thickness measurement software. The data of the sensor is synchronously acquired with signals such as the state of the controller and the position of the encoder, and the like, and is stored in a cache of the controller, and a computer reads the data in the cache through an Ethernet port, analyzes and processes the data to finally obtain thickness data.
Working steps or operating logic:
(1) Forward running: in a stop state, a forward button is pressed or a forward instruction is received and then the motor is operated forward until a forward limit signal is received and then the motor stops;
(2) Reverse row: in a stop state, a reverse button is pressed down or the motor reversely runs after a stop instruction is received until the motor stops after a reverse limit signal is received;
(3) Stopping: in any state, the stop button is pressed or a stop instruction is received, and then the operation is stopped immediately;
(4) Returning to the original point: in a stop state, receiving an origin return instruction, and running to an origin approach switch position;
(5) Positioning: in a stop state, a positioning instruction is received and the device is operated to a designated position;
(6) Automatic scanning operation: scanning according to the designated speed, the starting position and the ending position;
The beneficial effects of the invention are as follows: the invention integrates control logic, IO interface, AD module, power management module, driving module and communication interface.
Embodiment 2, on the basis of embodiment 1, further includes: the first processing module, the first processing module includes:
The first acquisition unit is used for acquiring the width of the material to be measured;
The first calculating unit is configured to determine, based on the first obtaining unit, the number of thickness measurement sampling areas in the same length range (the length range may be a unit length, for example, the total length is 3, and the length range is 0-1,1-2, 2-3), where each thickness measurement sampling area is provided with at least one thickness measurement sampling point;
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Is the minimum area of the abnormal area of the historical thickness of the thick material to be measured,/> For the width of the thick material to be measured,The value is 3.14; ln is natural logarithm,/>Is an important coefficient (the value is more than 0 and less than 1) of the thickness of the thick material to be measured, and is/isThe thickness abnormality rate (the value is more than 0 and less than 1) of the thick material to be measured; /(I)Rounding up the symbol; s is the number of thickness measuring sampling areas in the same length range;
And the numbering module is used for numbering the thickness sampling areas.
Preferably, the method further comprises:
A second calculation unit for calculating the number of sampling points of each sampling region;
；
For the total number of sampling points of the ith sampling area,/> For the area of the ith sampling region,/>For the preset area of single sampling point,/>Historical thickness abnormality rate (the value is more than 0 and less than 1) of the thickness of the ith sampling area of the thick material to be measured,/>Importance of the ith sampling area (the value is more than 0 and less than 1) of the material to be measured; /(I)To round the symbol up.
The beneficial effects of the technical scheme are as follows: 1. selecting a proper number of thickness measurement sampling areas and thickness measurement sampling points, and ensuring the reliability and representativeness of thickness measurement detection results;
2. and divide into a plurality of thickness measurement sampling areas and the serial number is convenient for obtain the thickness distribution state of the specific position of material to according to the thickness distribution state of different thickness measurement sampling areas targeted adjustment to the production process of material, guarantee the quality of material.
Embodiment 3, on the basis of embodiment 2, the first processing module further includes:
The second obtaining unit is configured to obtain parameters of a thickness gauge, where the parameters of the thickness gauge include: the time required by the thickness gauge to measure a single thickness sampling point is measured, and the target time interval of two adjacent measurements of the thickness gauge is measured;
A third obtaining unit, configured to obtain application scenario information of the thickness measuring scanning device (different application scenario environmental parameters, such as different temperatures and vibration states, affect heat dissipation effects and stability of the thickness measuring device and the position adjusting device);
The first determining unit is used for identifying application scene information of the thickness measuring scanning device based on a preset model and determining corresponding scene key parameters, wherein the scene key parameters correspond to scene speed adjusting coefficients;
the third calculation unit is used for determining the target moving speed of the thickness gauge based on the width of the material to be measured, the distribution of thickness measurement sampling points and the first determination unit, and controlling the position adjusting device of the thickness gauge to work by the driving control module so that the actual moving speed of the thickness gauge is the target moving speed;
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The target moving speed of the thickness gauge is; /(I) The minimum distance between adjacent sampling points along the width direction of the thick material to be measured; /(I)The target time interval of two adjacent measurements of the thickness gauge; /(I)Is the base 10 logarithm; /(I)A scene speed adjusting coefficient corresponds to the jth scene key parameter; /(I)The maximum distance of adjacent sampling points along the width direction of the thick material to be measured; /(I)The minimum distance between adjacent sampling points along the width direction of the thick material to be measured; /(I)An average distance between adjacent sampling points along the width direction of the thick material to be measured; m is the total number of scene critical parameters (e.g., including at least one of ambient temperature, ambient humidity, ambient vibration information).
Preferably, the first processing module further comprises:
and the material conveying strategy determining unit is used for determining the conveying strategy of the material based on the target moving speed of the thickness gauge and the application scene information of the thickness measuring scanning device.
The beneficial effects of the technical scheme are as follows: based on the parameters of the thickness gauge, the application scene information of the thickness measuring scanning device and the parameters of materials (the width of the materials to be measured and the distribution of thickness measuring sampling points), the proper target moving speed is obtained, so that the detection effect is ensured, and the stable and reliable operation of the thickness gauge and the position adjusting device is also ensured.
Embodiment 4, further comprising a second processing module on the basis of any one of embodiments 1-3, the second processing module comprising:
The fourth obtaining unit is configured to obtain actual operation data of the thickness measurement scanning device, where the actual operation data of the thickness measurement scanning device includes: actual operation data of the thickness gauge and actual operation data of the thickness gauge position adjusting device;
A fifth acquisition unit for acquiring actual thickness data obtained by detection of the thickness gauge;
A sixth obtaining unit, configured to obtain actual non-operation data of the thickness gauge, where the actual non-operation data of the thickness gauge affect the detection result, includes: actual vibration data of the thickness gauge, actual detection data of a critical position of the thickness gauge relative to a component for mounting the thickness gauge in the thickness gauge position adjusting device;
A first storage unit for storing actual data belonging to the fourth acquisition unit and the sixth acquisition unit;
The second storage unit is used for storing actual thickness data obtained by detection of the thickness gauge and dividing the actual thickness data obtained by detection of the thickness gauge belonging to the same length range of the material into a first data set;
a first evaluation unit for determining a detection anomaly according to the time stamps of the actual data of the fourth acquisition unit and the sixth acquisition unit;
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to detect anomalies in real time,/> For the total amount of actual operation data of the thickness measuring scanning device,/>For the kth actual operation data of the thickness measuring scanning device,/>For/>Corresponding standard value,/>For/>Relative to/>The influence coefficient of the change on the detection result of the thickness gauge; /(I)The total number of actual non-operation data of the influence detection result of the thickness gauge (the actual non-operation data of the influence detection result of the thickness gauge can be, for example, the influence of the detection environment of the thickness gauge or the parameter of the influence detection result of the thickness gauge, such as the temperature) is/>The/>, which is the influence of the thickness gauge, on the detection resultActual non-operational data,/>Is thatCorresponding standard value,/>For/>Relative to/>The influence coefficient (the value is more than 0 and less than 1) of the change on the detection result of the thickness gauge; m is the total number of scene key parameters;
the first early warning unit is used for carrying out early warning when the real-time detection anomaly degree is greater than or equal to a corresponding first preset threshold value;
A fourth calculation unit for calculating a thickness detection result of each thickness measurement sampling area;
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for/> First data set No./>Detection results of the respective thickness measurement sampling regions,/>As an exponential function based on e,/>For/>First data set No./>Average thickness detection value of sampling points of each thickness measurement sampling area,/>First/>First data set No./>Maximum thickness detection value of sampling points of each thickness measurement sampling area,/>The minimum thickness detection value of the sampling point of the f thickness measurement sampling area of the u first data set is obtained; /(I)Is the target thickness of the material;
The thickness abnormal region determining unit is used for determining the corresponding thickness sampling region as an abnormal thickness sampling region when the thickness detection result of the thickness measurement sampling region is larger than or equal to a corresponding second preset threshold value;
The second evaluation unit is used for acquiring G continuous adjacent first data sets with the real-time detection anomaly degree smaller than a first preset threshold value, and acquiring a quality evaluation coefficient according to the real-time detection anomaly degree and the time stamps of the G first data sets;
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total number of thickness measurement sampling regions divided for each length range,/> For/>The detection result of the f-th thickness measurement sampling area of the first data set; /(I)For/>First data set No./>Detecting results of the thickness measuring sampling areas; /(I)For/>Length range/>Average thickness detection value of thickness sampling points of each thickness measurement sampling area,/>For/>Length range/>Average thickness detection value of thickness sampling points of each thickness measurement sampling area,/>AndIs opposite to the thickness measuring sampling area; /(I)Is the abnormal influence coefficient (the value is more than 0 and less than 1) of the width direction distribution, and is/The method is characterized in that the method is used for distributing abnormal influence coefficients (the value is more than 0 and less than 1) in the length direction; r is the total number of selected length ranges (R is G); q is a quality evaluation coefficient;
The second early warning unit is used for carrying out early warning when the quality evaluation coefficient is larger than a corresponding second preset threshold value;
a fifth calculation unit, which is used for obtaining G continuously adjacent first data sets with real-time detection anomaly degree smaller than a first preset threshold value and detection results of each detection area, and accumulating the total number of the abnormal thickness sampling areas in the same width range to obtain a plurality of first accumulated values;
and the sorting unit is used for sorting the plurality of first accumulated values.
The beneficial effects of the technical scheme are as follows:
1. Acquiring actual operation data of a thickness measuring scanning device, acquiring actual non-operation data of an influence detection result of a thickness meter, storing, and determining detection anomaly degree based on the actual operation data of the thickness measuring scanning device and a timestamp of the actual non-operation data of the influence detection result of the thickness meter so as to judge whether the detection result of the thickness meter is reliable;
The method comprises the steps of obtaining actual thickness data detected by a thickness meter, and obtaining the actual thickness data detected by the thickness meter with a time stamp, so that the reliability of the detection result of the actual thickness data detected by the thickness meter at specific time can be judged, and whether the thickness quality of certain batches of materials is reliable or not can be determined according to the distribution of detection time and the actual production time of the materials;
2. Acquiring thickness detection results of each thickness measurement sampling area, determining whether the corresponding thickness sampling area is an abnormal thickness sampling area, acquiring G continuously adjacent first data sets with real-time detection anomaly degree smaller than a first preset threshold value and detection results of each corresponding detection area, realizing selection of G detection result sets with reliable detection, and ensuring reliable quality assessment;
Accumulating the total number of the abnormal thickness sampling areas in the same width range to obtain a plurality of first accumulated values; a sorting unit configured to sort the plurality of first accumulated values; thereby obtaining whether the thickness states in different width ranges are abnormal or not, and adjusting the material production parameters according to the thickness states in different width ranges to ensure that the final material is qualified;
3. G detection result sets with reliable detection are selected, and according to the thickness distribution state in the same length range And thickness distribution state/>, in the same width rangeAnd comprehensively evaluating the quality of materials, and evaluating reliably.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (7)
1. A special control system for a thickness measuring scanning device is characterized in that: comprising the following steps:
The device comprises a logic control module, a driving control module, a power module, an encoder input module, a sensor interface, a communication interface, a panel switch signal interface, a limit switch signal interface, an alarm output module and a power output module, wherein the logic control module is respectively connected with the driving control module, the power module, the encoder input module, the sensor interface, the communication interface, the panel switch signal interface, the limit switch signal interface, the alarm output module and the power output module, and is communicated with an upper computer through the communication interface;
The special control system of the thickness measuring scanning device further comprises: the first processing module, the first processing module includes:
The first acquisition unit is used for acquiring the width of the material to be measured;
The first calculation unit is used for determining the number of thickness measurement sampling areas in the same length range based on the first acquisition unit, and each thickness measurement sampling area is provided with at least one thickness measurement sampling point;
；
s is the number of thickness measuring sampling areas in the same length range; Is the minimum area of the abnormal area of the historical thickness of the thick material to be measured,/> For the width of thick material to be measured,/>The value is 3.14; ln is natural logarithm,/>Is an important coefficient of thickness of thick materials to be measured,/>The thickness abnormality rate of the thick material to be measured;
rounding up the symbol;
And the numbering module is used for numbering the thickness sampling areas.
2. The special control system for a thickness measuring scanning device according to claim 1, wherein:
The driving control module is used for controlling the thickness gauge position adjusting device of the thickness measuring scanning device to work, the thickness gauge position adjusting device comprises a motor, the motor is connected with an encoder, and the encoder is electrically connected with the encoder input module;
The sensor interface is used for electrically connecting with a sensor assembly of the thickness measuring scanning device;
The alarm output module is used for being electrically connected with an alarm lamp;
the limit switch signal interface is used for connecting a limit switch of the thickness measuring scanning device;
the panel switch signal interface is used for connecting a control panel of the thickness measuring scanning device.
3. The special control system for a thickness measuring scanning device according to claim 1, wherein: the upper computer is a computer, and thickness measuring software running in the computer is connected with the logic control module through the Ethernet.
4. The special control system for a thickness measuring scanning device according to claim 1, wherein: the first processing module further includes:
A second calculation unit for calculating the number of sampling points of each sampling region;
；
For the total number of sampling points of the ith sampling area,/> For the area of the ith sampling region,/>For the preset area of single sampling point,/>Historical thickness anomaly rate for thickness of ith sampling area of thick material to be measured,/>Importance of the ith sampling area for the thick material to be measured; /(I)To round the symbol up.
5. A control system dedicated to a thickness scanning device according to claim 1 or 4, characterized in that: the first processing module further includes:
The second obtaining unit is configured to obtain parameters of a thickness gauge, where the parameters of the thickness gauge include: the time required by the thickness gauge to measure a single thickness sampling point is measured, and the target time interval of two adjacent measurements of the thickness gauge is measured;
The third acquisition unit is used for acquiring the application scene information of the thickness measuring scanning device;
The first determining unit is used for identifying application scene information of the thickness measuring scanning device based on a preset model and determining corresponding scene key parameters, wherein the scene key parameters correspond to scene speed adjusting coefficients;
the third calculation unit is used for determining the target moving speed of the thickness gauge based on the width of the material to be measured, the distribution of thickness measurement sampling points and the first determination unit, and controlling the position adjusting device of the thickness gauge to work by the driving control module so that the actual moving speed of the thickness gauge is the target moving speed;
；
The target moving speed of the thickness gauge is; /(I) The minimum distance between adjacent sampling points along the width direction of the thick material to be measured; /(I)The target time interval of two adjacent measurements of the thickness gauge; /(I)Is the base 10 logarithm; /(I)A scene speed adjusting coefficient corresponding to the j-th scene key parameter; /(I)The maximum distance of adjacent sampling points along the width direction of the thick material to be measured; /(I)The minimum distance between adjacent sampling points along the width direction of the thick material to be measured; /(I)An average distance between adjacent sampling points along the width direction of the thick material to be measured; m is the total number of scene key parameters.
6. The special control system for a thickness measuring scanning device according to claim 5, wherein: the first processing module further includes:
and the material conveying strategy determining unit is used for determining the conveying strategy of the material based on the target moving speed of the thickness gauge and the application scene information of the thickness measuring scanning device.
7. The special control system for a thickness measuring scanning device according to claim 1, wherein: also included is a second processing module, the second processing module comprising:
The fourth obtaining unit is configured to obtain actual operation data of the thickness measurement scanning device, where the actual operation data of the thickness measurement scanning device includes: actual operation data of the thickness gauge and actual operation data of the thickness gauge position adjusting device;
A fifth acquisition unit for acquiring actual thickness data obtained by detection of the thickness gauge;
A sixth obtaining unit, configured to obtain actual non-operation data of the thickness gauge, where the actual non-operation data of the thickness gauge affect the detection result, includes: actual vibration data of the thickness gauge, actual detection data of a critical position of the thickness gauge relative to a component for mounting the thickness gauge in the thickness gauge position adjusting device;
A first storage unit for storing actual data belonging to the fourth acquisition unit and the sixth acquisition unit;
The second storage unit is used for storing actual thickness data obtained by detection of the thickness gauge and dividing the actual thickness data obtained by detection of the thickness gauge belonging to the same length range of the material into a first data set;
a first evaluation unit for determining a detection anomaly according to the time stamps of the actual data of the fourth acquisition unit and the sixth acquisition unit;
the first early warning unit is used for carrying out early warning when the real-time detection anomaly degree is greater than or equal to a corresponding first preset threshold value;
A fourth calculation unit for calculating a thickness detection result of each thickness measurement sampling area;
The thickness abnormal region determining unit is used for determining the corresponding thickness sampling region as an abnormal thickness sampling region when the thickness detection result of the thickness measurement sampling region is larger than or equal to a corresponding second preset threshold value;
The second evaluation unit is used for acquiring G continuous adjacent first data sets with the real-time detection anomaly degree smaller than a first preset threshold value, and acquiring a quality evaluation coefficient according to the real-time detection anomaly degree and the time stamps of the G first data sets;
The second early warning unit is used for carrying out early warning when the quality evaluation coefficient is larger than a corresponding second preset threshold value;
a fifth calculation unit, which is used for obtaining G continuously adjacent first data sets with real-time detection anomaly degree smaller than a first preset threshold value and detection results of each detection area, and accumulating the total number of the abnormal thickness sampling areas in the same width range to obtain a plurality of first accumulated values;
and the sorting unit is used for sorting the plurality of first accumulated values.
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