CN117517926B - RFID chip sensitivity test method and system - Google Patents
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Abstract
The invention discloses a method and a system for testing the sensitivity of an RFID chip, which relate to the technical field of RFID chips and solve the problems that signal noise generated by external equipment and interference of the signal noise generated by a reader due to the refraction of an obstacle are not considered.
Description
Technical Field
The invention relates to the technical field of RFID chips, in particular to a method and a system for testing sensitivity of an RFID chip.
Background
The principle of the RFID chip is that the reader and the tag perform non-contact data communication, so that the aim of identifying the target is fulfilled; the RFID is widely applied, and is typically applied to animal wafers, automobile wafer burglar alarms, access control, parking lot control, production line automation and material management.
The application with the patent application number of CN108107339A proposes a method for testing the impedance and the sensitivity of a chip of an ultrahigh frequency RFID tag, which comprises the following steps: acquiring an antenna impedance value and an antenna gain of an antenna in the tag; acquiring a test value of the label sensitivity of the label; obtaining a calculated value of the tag sensitivity by traversing the chip impedance value and the chip sensitivity; and determining a correct chip impedance value and chip sensitivity by comparing the test value of the tag sensitivity with the calculated value. By the testing method provided by the invention, the antenna with more excellent performance can be designed and/or the label with higher sensitivity can be obtained.
When aiming at the sensitivity test of RFID, the response time point of the RFID chip is generally tested according to the intensity of the signal generated by the reader so as to lock the sensitivity parameter of the RFID chip, but the test mode still has the following defects to be improved:
1. signal noise generated by external equipment is not taken into consideration, so that the measured sensitivity parameters are inaccurate;
2. The interference of the signal noise generated by the refraction of the obstacle by the reader is not taken into consideration, and the measured sensitivity parameter is inaccurate.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a method and a system for testing the sensitivity of an RFID chip, which solve the problems that signal noise generated by external equipment and interference of the signal noise generated by a reader due to the refraction of an obstacle are not taken into consideration.
In order to achieve the above purpose, the invention is realized by the following technical scheme: an RFID chip sensitivity test system, comprising:
the frequency adjustment end is used for adjusting the signal generation frequency of the reader in real time, and the frequency difference value of each stage is the same, wherein the frequency difference value is a preset value;
The phase diagram recording end records the signal phase diagrams generated by the reader and the signal phase diagrams received by the RFID chip under different signal occurrence frequencies, and divides the signal phase diagrams into the same frequency interval, different signal phase diagrams are marked in different forms, the signal phase diagram generated by the reader is assigned 1, and the signal phase diagram received by the RFID chip is assigned 0;
The waveform primary screening end extracts a plurality of signal phase diagrams with value of 0 in different frequency intervals, preferentially determines turning points in the signal phase diagrams, and identifies whether the signal phase diagrams are regular waves or not by determining the intervals among the turning points, wherein the specific mode is as follows:
confirming turning points of different signal phase diagrams, wherein the trend of line segments at the front end and the rear end of the turning points is opposite, the trend of the front end line segment is downward, the turning point of the rear end line segment, which is upward, is marked as a type of turning point, and the turning point of the front end line segment, which is downward, is marked as a type of turning point;
Determining an initial turning point, determining a turning point of a type adjacent to the turning point, determining a distance value J1 between two points, sequentially determining a distance value between the turning points of the type adjacent to each other, and dividing the signal phase diagram into regular waves if the distance values are J1;
if the difference exists, the signal phase diagram is divided into irregular waves, and a frequency interval with the regular waves is transmitted into a frequency locking end;
The frequency locking end is used for receiving a frequency interval with regular waves, carrying out parameter analysis on two groups of signal phase diagrams in the same frequency interval, locking a group of frequency intervals with the minimum difference, and taking the frequency interval as a test interval, wherein the specific mode is as follows:
Calibrating a signal phase diagram with a value of 1 in the same frequency interval as a primary waveform, and calibrating a signal phase diagram with a value of 0 as a secondary waveform;
Determining a maximum peak value FZ1 i and a maximum slope XL1 i of the primary waveform, and determining a maximum peak value FZ2 i and a maximum slope XL2 i of the secondary waveform, wherein i represents different frequency intervals;
obtaining a standard value BZ i of a corresponding frequency interval by adopting BZ i＝|FZ1i-FZ2i|×C1+|XL1i-XL2i I multiplied by C2, wherein C1 and C2 are both preset fixed coefficient factors;
Selecting a minimum value from standard values BZ i generated by a plurality of different frequency intervals, determining a frequency interval corresponding to the minimum value, taking the frequency interval as a test interval, and transmitting the test interval into a main test end;
The main test end adjusts the signal generation frequency of the reader to the range of the test interval according to the received test interval, limits a group of enhancement periods T, enhances the signal when each group of enhancement periods T is finished, determines the received signal of the RFID chip after the signal is generated, and transmits the received signal generated in real time to the waveform analysis end;
The response monitoring end monitors the RFID chip in real time, and transmits response signals to the waveform analysis end when the RFID chip generates responses;
The waveform analysis end performs waveform analysis on the received signal, determines a waveform phase diagram of the received signal, locks an internal convex change point position, then intercepts the waveform, locks whether a response signal is generated in a time period corresponding to the waveform, and then determines sensitivity test parameters of the RFID chip according to the response time point.
Preferably, the specific mode of confirming the sensitivity test parameter of the waveform analysis end is as follows:
confirming the fluctuation point position appearing in the waveform phase diagram, wherein when the absolute value of the slope difference value of a line segment before and after a certain point position in the phase diagram exceeds X1, the point position is represented as the fluctuation point position, and X1 is a preset value;
Marking the first group of the fluctuation points as initial points, and recording the time difference CS of the two points when confirming the fluctuation points appearing in the subsequent succession, wherein the time difference CS is as follows: cs=t, if satisfied, intercepting the waveform, and calibrating the waveform as a waveform to be analyzed, if not satisfied, recording and confirming the fluctuation point position appearing subsequently, and judging whether the waveform satisfies: cs=t, if satisfied, intercepting the waveform, and calibrating the waveform as a class ii waveform to be analyzed, if not satisfied, selecting a second group of fluctuation points of the phase diagram as initial points, and so on, until a class ii waveform to be analyzed or a class ii waveform to be analyzed is determined, and stopping;
Determining the time point interval time period of a type of waveform to be analyzed, calibrating the time point interval time period to be a type of time period, analyzing whether a response signal appears in the type of time period, if the response signal appears, confirming the signal parameter of the type of waveform to be analyzed corresponding to the time point, displaying the signal parameter, confirming the sensitivity test parameter of the RFID chip by an external person, and if the response signal does not appear, continuing to acquire the subsequent type of waveform to be analyzed until the response signal appears;
Confirming initial points of the two types of waveforms to be analyzed, determining a waveform time period between the initial points and the next fluctuation point, analyzing whether a response signal appears in the time period, confirming signal parameters of the corresponding time point if the response signal appears, displaying the signal parameters, confirming sensitivity test parameters of the RFID chip by an external person, and continuously acquiring the subsequent two types of waveforms to be analyzed if the response signal does not appear, until the response signal is generated;
When a response signal appears in one waveform to be analyzed or any group of waveforms of the two waveforms to be analyzed, the acquisition of the subsequent waveforms is stopped and the analysis process is stopped.
Preferably, the method for testing the sensitivity of the RFID chip comprises the following steps:
step one, adjusting the signal generation frequency of a reader in real time, recording a signal phase diagram generated in a corresponding stage in the adjustment process, wherein the signal phase diagram generated by the reader is assigned with 1, and the signal phase diagram received by the RFID chip is assigned with 0;
Step two, extracting a plurality of signal phase diagrams with values of 0 in different frequency intervals, preferentially determining turning points in the signal phase diagrams, and identifying whether the signal phase diagrams are regular waves or not after determining the intervals between the turning points;
Step three, receiving a frequency interval with regular waves, carrying out parameter analysis on two groups of signal phase diagrams in the same frequency interval, thus locking a group of frequency intervals with the minimum difference value, and taking the frequency interval as a test interval;
And fourthly, adjusting the signal occurrence frequency of the reader to be within the range of the test interval according to the received test interval, defining a group of enhancement periods T, carrying out signal enhancement when each group of enhancement periods T are finished, carrying out waveform analysis on the received signal, determining a waveform phase diagram of the received signal, locking the internal convex change point, then intercepting the waveform, locking whether a response signal is generated in a time period corresponding to the waveform, and then determining the sensitivity test parameters of the RFID chip according to the response time point.
Advantageous effects
The invention provides a method and a system for testing sensitivity of an RFID chip. Compared with the prior art, the method has the following beneficial effects:
The invention changes the frequency interval of the reader in real time, determines the received waveform in the changing process, then carries out first-round screening by determining the mode of regular waves, eliminates the frequency interval with obvious noise interference, then identifies the difference degree between the primary waveform and the secondary waveform by confirming the standard value, locks a group of frequency intervals with the lowest difference degree as test intervals, and in this way, eliminates the corresponding interference frequency fully, locks a group of optimal test frequencies, filters the external noise fully, reduces the influence of the signal noise on the test fully, and ensures the accuracy of the test sensitivity preliminarily;
Then, in order to confirm the sensitivity test parameters of the RFID chip, a signal enhancement mode is adopted to determine the waveform, whether the RFID generates a response in the corresponding periodic waveform section is analyzed, rather than the response signal is received in the whole waveform test, so that the sensitivity test value is determined.
Drawings
Fig. 1 is a schematic diagram of a principle frame of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
Referring to fig. 1, the application provides a sensitivity test system for an RFID chip, which comprises a frequency adjustment end, a phase diagram recording end, a waveform primary screening end, a frequency locking end, a main test end, a waveform analysis end and a response monitoring end;
the frequency adjustment end is electrically connected with the phase diagram recording end input node, the phase diagram recording end is electrically connected with the waveform primary screening end input node, the waveform primary screening end is electrically connected with the frequency locking end input node, the frequency locking end is electrically connected with the main testing end input node, and the main testing end and the response monitoring end are electrically connected with the waveform analysis end input node;
The frequency adjustment end is used for adjusting the signal generation frequency of the reader in real time, and the frequency difference value of each stage is the same, wherein the frequency difference value is a preset value, and the specific value is drawn by an operator according to experience;
The phase diagram recording end records the signal phase diagrams generated by the reader and the signal phase diagrams received by the RFID chip under different signal occurrence frequencies, and divides the signal phase diagrams into the same frequency interval, different signal phase diagrams are marked in different forms, the signal phase diagrams generated by the reader are assigned with 1, the signal phase diagrams received by the RFID chip are assigned with 0, wherein the signal phase diagrams generated by the reader are all regular waveforms, and the distance values between the corresponding turning points are equal;
The waveform primary screening end extracts a plurality of signal phase diagrams with value of 0 in different frequency intervals, preferentially determines turning points in the signal phase diagrams, and identifies whether the signal phase diagrams are regular waves or not by determining the intervals among the turning points, wherein the specific mode for identifying is as follows:
confirming turning points of different signal phase diagrams, wherein the trend of line segments at the front end and the rear end of the turning points is opposite, the trend of the front end line segment is downward, the turning point of the rear end line segment, which is upward, is marked as a type of turning point, and the turning point of the front end line segment, which is downward, is marked as a type of turning point;
Determining an initial turning point, determining a turning point of a type adjacent to the turning point, determining a distance value J1 between two points, sequentially determining a distance value between the turning points of the type adjacent to each other, and dividing the signal phase diagram into regular waves if the distance values are J1;
if the difference exists, the signal phase diagram is divided into irregular waves, and a frequency interval with the regular waves is transmitted into a frequency locking end;
Specifically, the waveform generated by the reader is a regular waveform, if no external noise or interference of signals exists, the signal phase diagram received by the RFID chip is also a regular waveform, but if noise influence exists, the influence on the trend inside the signal phase diagram is caused, so that the waveform is disordered, the irregular situation occurs, the waveform can be directly removed without consideration, a group of frequency intervals capable of achieving the best test effect are confirmed, the subsequent sensitivity test on the RFID chip is facilitated, and therefore, the external noise influence can be the lowest in the frequency intervals.
The frequency locking end is used for receiving a frequency interval with regular waves, carrying out parameter analysis on two groups of signal phase diagrams in the same frequency interval, locking a group of frequency intervals with the minimum difference, and taking the frequency interval as a test interval, wherein the specific mode for carrying out parameter analysis is as follows:
Calibrating a signal phase diagram with a value of 1 in the same frequency interval as a primary waveform, and calibrating a signal phase diagram with a value of 0 as a secondary waveform;
determining a maximum peak value FZ1 i and a maximum slope XL1 i of the primary waveform, and determining a maximum peak value FZ2 i and a maximum slope XL2 i of the secondary waveform, wherein i represents different frequency intervals, and particularly, the slope represents the ratio of the difference between the ordinate of two points to the difference between the abscissa of two points;
Obtaining a standard value BZ i of a corresponding frequency interval by adopting BZ i＝|FZ1i-FZ2i|×C1+|XL1i-XL2i I multiplied by C2, wherein C1 and C2 are preset fixed coefficient factors, and the specific value is determined by an operator according to experience;
Selecting a minimum value from standard values BZ i generated by a plurality of different frequency intervals, determining a frequency interval corresponding to the minimum value, taking the frequency interval as a test interval, and transmitting the test interval to a main test end.
In combination with the analysis of the practical application scene, when a plurality of groups of frequency intervals exist, the corresponding primary waveform and secondary waveform are covered in each group of frequency intervals, the degree of difference between the primary waveform and the secondary waveform can be identified by confirming the standard value, if the degree of difference is too large, the generated standard value deviation is too large, the influence of corresponding external noise is caused as long as the difference exists, the minimum standard value is confirmed in order to confirm which group of frequency intervals are least influenced by the external noise, and the internal slope and peak value are changed as long as the primary waveform and the secondary waveform are influenced by noise, so that the standard value can be locked.
The main test end adjusts the signal generation frequency of the reader to the range of the test interval according to the received test interval, limits a group of enhancement periods T, enhances the signal when each group of enhancement periods T is finished, determines the receiving signal of the RFID chip after the signal is generated, and transmits the receiving signal generated in real time to the waveform analysis end;
The response monitoring end monitors the RFID chip in real time, and transmits response signals to the waveform analysis end when the RFID chip generates responses;
The waveform analysis end performs waveform analysis on the received signal, determines a waveform phase diagram of the received signal, locks an internal convex change point position, then intercepts the waveform, locks whether a response signal is generated in a corresponding time period of the waveform, and then determines a sensitivity test parameter of the RFID chip according to the response time point, wherein the specific mode for confirming the sensitivity test parameter is as follows:
confirming the fluctuation point position appearing in the waveform phase diagram, and when the absolute value of the slope difference value of the line segment before and after a certain point position in the phase diagram exceeds X1, representing the point position as the fluctuation point position, wherein X1 is a preset value, and the specific value is drawn by an operator according to experience;
Marking the first group of the fluctuation points as initial points, and recording the time difference CS of the two points when confirming the fluctuation points appearing in the subsequent succession, wherein the time difference CS is as follows: cs=t, if satisfied, intercepting the waveform, and calibrating the waveform as a waveform to be analyzed, if not satisfied, recording and confirming the fluctuation point position appearing subsequently, and judging whether the waveform satisfies: cs=t, if satisfied, intercepting the waveform, and calibrating the waveform as a class ii waveform to be analyzed, if not satisfied, selecting a second group of fluctuation points of the phase diagram as initial points, and so on, until a class ii waveform to be analyzed or a class ii waveform to be analyzed is determined, and stopping;
Determining the time point interval time period of a type of waveform to be analyzed, calibrating the time point interval time period to be a type of time period, analyzing whether a response signal appears in the type of time period, if the response signal appears, confirming the signal parameter of the type of waveform to be analyzed corresponding to the time point, displaying the signal parameter, confirming the sensitivity test parameter of the RFID chip by an external person, and if the response signal does not appear, continuing to acquire the subsequent type of waveform to be analyzed until the response signal appears;
Confirming initial points of the two types of waveforms to be analyzed, determining a waveform time period between the initial points and the next fluctuation point, analyzing whether a response signal appears in the time period, confirming signal parameters of the corresponding time point if the response signal appears, displaying the signal parameters, confirming sensitivity test parameters of the RFID chip by an external person, and continuously acquiring the subsequent two types of waveforms to be analyzed if the response signal does not appear, until the response signal is generated;
When a response signal appears in one waveform to be analyzed or any group of waveforms of the two waveforms to be analyzed, the acquisition of the subsequent waveforms is stopped and the analysis process is stopped.
Specifically, in order to confirm the sensitivity test parameters of the RFID chip, a signal enhancement mode is adopted to determine the waveform, and the RFID chip receives repeated signals secondarily due to the refraction influence of surrounding obstacles in the normal transmission process, so that the signal waveform is caused, and in order to confirm the test accuracy, the waveform section of the subsequent signal waveform which is enhanced can be confirmed by setting a period T and the signal enhancement mode;
By analyzing whether the corresponding waveform segment generates response to the RFID, rather than receiving the response signal in the whole waveform test, the sensitivity test value is determined, so that the deviation of the test result is caused, the accuracy is low, and by adopting the mode, the sensitivity test parameters generated by the corresponding RFID can be directly locked, the influence caused by obstacles can be fully avoided, and the test accuracy is improved.
Example two
A sensitivity test method of an RFID chip comprises the following steps:
step one, adjusting the signal generation frequency of a reader in real time, recording a signal phase diagram generated in a corresponding stage in the adjustment process, wherein the signal phase diagram generated by the reader is assigned with 1, and the signal phase diagram received by the RFID chip is assigned with 0;
Step two, extracting a plurality of signal phase diagrams with values of 0 in different frequency intervals, preferentially determining turning points in the signal phase diagrams, and identifying whether the signal phase diagrams are regular waves or not after determining the intervals between the turning points;
Step three, receiving a frequency interval with regular waves, carrying out parameter analysis on two groups of signal phase diagrams in the same frequency interval, thus locking a group of frequency intervals with the minimum difference value, and taking the frequency interval as a test interval;
And fourthly, adjusting the signal occurrence frequency of the reader to be within the range of the test interval according to the received test interval, defining a group of enhancement periods T, carrying out signal enhancement when each group of enhancement periods T are finished, carrying out waveform analysis on the received signal, determining a waveform phase diagram of the received signal, locking the internal convex change point, then intercepting the waveform, locking whether a response signal is generated in a time period corresponding to the waveform, and then determining the sensitivity test parameters of the RFID chip according to the response time point.
Some of the data in the above formulas are numerical calculated by removing their dimensionality, and the contents not described in detail in the present specification are all well known in the prior art.
The above embodiments are only for illustrating the technical method of the present invention and not for limiting the same, and it should be understood by those skilled in the art that the technical method of the present invention may be modified or substituted without departing from the spirit and scope of the technical method of the present invention.
Claims (4)
1. An RFID chip sensitivity test system, comprising:
the frequency adjustment end is used for adjusting the signal generation frequency of the reader in real time, and the frequency difference value of each stage is the same, wherein the frequency difference value is a preset value;
The phase diagram recording end records the signal phase diagrams generated by the reader and the signal phase diagrams received by the RFID chip under different signal occurrence frequencies, and divides the signal phase diagrams into the same frequency interval, different signal phase diagrams are marked in different forms, the signal phase diagram generated by the reader is assigned 1, and the signal phase diagram received by the RFID chip is assigned 0;
The waveform primary screening end extracts a plurality of signal phase diagrams with values of 0 in different frequency intervals, preferentially determines turning points in the signal phase diagrams, and identifies whether the signal phase diagrams are regular waves or not after determining the intervals among the turning points;
the frequency locking end is used for receiving the frequency interval with the regular wave, carrying out parameter analysis on two groups of signal phase diagrams in the same frequency interval, locking a group of frequency interval with the minimum difference value, and taking the frequency interval as a test interval;
The main test end adjusts the signal generation frequency of the reader to the range of the test interval according to the received test interval, limits a group of enhancement periods T, enhances the signal when each group of enhancement periods T is finished, determines the received signal of the RFID chip after the signal is generated, and transmits the received signal generated in real time to the waveform analysis end;
The response monitoring end monitors the RFID chip in real time, and transmits response signals to the waveform analysis end when the RFID chip generates responses;
the waveform analysis end performs waveform analysis on the received signal, determines a waveform phase diagram of the received signal, locks an internal convex change point position, then intercepts the waveform, locks whether a response signal is generated in a time period corresponding to the waveform, and then determines sensitivity test parameters of the RFID chip according to the response time point, wherein the specific mode is as follows:
confirming the fluctuation point position appearing in the waveform phase diagram, wherein when the absolute value of the slope difference value of a line segment before and after a certain point position in the phase diagram exceeds X1, the point position is represented as the fluctuation point position, and X1 is a preset value;
Marking the first group of the fluctuation points as initial points, and recording the time difference CS of the two points when confirming the fluctuation points appearing in the subsequent succession, wherein the time difference CS is as follows: cs=t, if satisfied, intercepting the waveform, and calibrating the waveform as a waveform to be analyzed, if not satisfied, recording and confirming the fluctuation point position appearing subsequently, and judging whether the waveform satisfies: cs=t, if satisfied, intercepting the waveform, and calibrating the waveform as a class ii waveform to be analyzed, if not satisfied, selecting a second group of fluctuation points of the phase diagram as initial points, and so on, until a class ii waveform to be analyzed or a class ii waveform to be analyzed is determined, and stopping;
Determining the time point interval time period of a type of waveform to be analyzed, calibrating the time point interval time period to be a type of time period, analyzing whether a response signal appears in the type of time period, if the response signal appears, confirming the signal parameter of the type of waveform to be analyzed corresponding to the time point, displaying the signal parameter, confirming the sensitivity test parameter of the RFID chip by an external person, and if the response signal does not appear, continuing to acquire the subsequent type of waveform to be analyzed until the response signal appears;
Confirming initial points of the two types of waveforms to be analyzed, determining a waveform time period between the initial points and the next fluctuation point, analyzing whether a response signal appears in the time period, confirming signal parameters of the corresponding time point if the response signal appears, displaying the signal parameters, confirming sensitivity test parameters of the RFID chip by an external person, and continuously acquiring the subsequent two types of waveforms to be analyzed if the response signal does not appear, until the response signal is generated;
When a response signal appears in one waveform to be analyzed or any group of waveforms of the two waveforms to be analyzed, the acquisition of the subsequent waveforms is stopped and the analysis process is stopped.
2. The system for testing the sensitivity of an RFID chip according to claim 1, wherein the specific way for the waveform prescreening end to identify whether the signal phase diagram is a regular wave is as follows:
confirming turning points of different signal phase diagrams, wherein the trend of line segments at the front end and the rear end of the turning points is opposite, the trend of the front end line segment is downward, the turning point of the rear end line segment, which is upward, is marked as a type of turning point, and the turning point of the front end line segment, which is downward, is marked as a type of turning point;
Determining an initial turning point, determining a turning point of a type adjacent to the turning point, determining a distance value J1 between two points, sequentially determining a distance value between the turning points of the type adjacent to each other, and dividing the signal phase diagram into regular waves if the distance values are J1;
If the difference exists, the signal phase diagram is divided into irregular waves, and the frequency interval with the regular waves is transmitted into the frequency locking end.
3. The system for testing the sensitivity of an RFID chip according to claim 1, wherein the frequency locking terminal performs the parameter analysis in the following specific manner:
Calibrating a signal phase diagram with a value of 1 in the same frequency interval as a primary waveform, and calibrating a signal phase diagram with a value of 0 as a secondary waveform;
Determining a maximum peak value FZ1 i and a maximum slope XL1 i of the primary waveform, and determining a maximum peak value FZ2 i and a maximum slope XL2 i of the secondary waveform, wherein i represents different frequency intervals;
obtaining a standard value BZ i of a corresponding frequency interval by adopting BZ i＝|FZ1i-FZ2i|×C1+|XL1i-XL2i I multiplied by C2, wherein C1 and C2 are both preset fixed coefficient factors;
Selecting a minimum value from standard values BZ i generated by a plurality of different frequency intervals, determining a frequency interval corresponding to the minimum value, taking the frequency interval as a test interval, and transmitting the test interval to a main test end.
4. A method of testing the sensitivity of an RFID chip, the method being based on an RFID chip sensitivity testing system according to any one of claims 1-3, comprising the steps of:
step one, adjusting the signal generation frequency of a reader in real time, recording a signal phase diagram generated in a corresponding stage in the adjustment process, wherein the signal phase diagram generated by the reader is assigned with 1, and the signal phase diagram received by the RFID chip is assigned with 0;
Step two, extracting a plurality of signal phase diagrams with values of 0 in different frequency intervals, preferentially determining turning points in the signal phase diagrams, and identifying whether the signal phase diagrams are regular waves or not after determining the intervals between the turning points;
Step three, receiving a frequency interval with regular waves, carrying out parameter analysis on two groups of signal phase diagrams in the same frequency interval, thus locking a group of frequency intervals with the minimum difference value, and taking the frequency interval as a test interval;
And fourthly, adjusting the signal occurrence frequency of the reader to be within the range of the test interval according to the received test interval, defining a group of enhancement periods T, carrying out signal enhancement when each group of enhancement periods T are finished, carrying out waveform analysis on the received signal, determining a waveform phase diagram of the received signal, locking the internal convex change point, then intercepting the waveform, locking whether a response signal is generated in a time period corresponding to the waveform, and then determining the sensitivity test parameters of the RFID chip according to the response time point.
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