CN117517830A - Device, method and system for measuring deflection coefficient and electronic equipment - Google Patents
Device, method and system for measuring deflection coefficient and electronic equipment Download PDFInfo
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- CN117517830A CN117517830A CN202311485740.4A CN202311485740A CN117517830A CN 117517830 A CN117517830 A CN 117517830A CN 202311485740 A CN202311485740 A CN 202311485740A CN 117517830 A CN117517830 A CN 117517830A
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- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000006073 displacement reaction Methods 0.000 claims abstract description 84
- 239000002305 electric material Substances 0.000 claims abstract description 25
- 239000000463 material Substances 0.000 claims abstract description 24
- 230000005611 electricity Effects 0.000 claims abstract description 22
- 238000005259 measurement Methods 0.000 claims abstract description 10
- 239000010410 layer Substances 0.000 claims description 63
- 239000000523 sample Substances 0.000 claims description 7
- 238000004590 computer program Methods 0.000 claims description 6
- 239000012790 adhesive layer Substances 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 3
- 230000007812 deficiency Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 23
- 230000005684 electric field Effects 0.000 description 7
- 230000004044 response Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001808 coupling effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000028161 membrane depolarization Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a device, a method and a system for measuring a deflection coefficient and electronic equipment, and relates to the field of deflection coefficient measurement. One end of the controlled structure is fixed, and the electrode unit is arranged on the flexible electric material layer at a set distance from the fixed end of the controlled structure; the flexible electric material layer is arranged on the upper surface of the electrode layer; the electrode layer is arranged on the upper surface of the controlled structure; one end of the voltage applying unit is connected with the electrode unit, and the other end of the voltage applying unit is connected with the electrode layer; the voltage applying unit and the displacement measuring unit are connected with the upper computer; the voltage applying unit is used for applying control voltage to drive the controlled structure; the displacement measuring unit is used for collecting the displacement of the driven controlled structure; the upper computer is used for calculating the flexible electricity coefficient of the flexible electricity material layer according to the displacement. The invention utilizes the displacement measurement result to accurately calculate the deflection coefficient, and makes up the blank and the deficiency of the prior art.
Description
Technical Field
The present invention relates to the field of measurement of a flexible electrical system, and in particular, to a device, a method, a system and an electronic device for measuring a flexible electrical system.
Background
Compared with piezoelectric materials, the flexural electric materials do not need complex pre-polarization, so the flexural electric materials are simple and convenient to use, have no depolarization and aging problems, and have considerable application prospects. To further understand and utilize the flexoelectric effect, it is important to quantitatively measure the flexoelectric effect and calculate the flexoelectric parameters of the flexoelectric material. The flexoelectric effect is classified into a positive flexoelectric effect and a negative flexoelectric effect. When the flexible electric material is subjected to uneven strain, namely a strain gradient exists, the flexible electric material generates a polarized electric field, and the force electric coupling relation between the strain gradient and the polarized electric field is positive flexible electric effect; when a non-uniform electric field exists in the flexoelectric material, namely an electric field gradient exists, mechanical strain is generated in the flexoelectric material, and the force electric coupling relation between the electric field gradient and the mechanical strain is the inverse flexoelectric effect. Existing methods for measuring the flex coefficient mostly utilize the positive flex effect. Measuring the flexoelectric coefficient based on the inverse flexoelectric effect has been the focus and difficulty of research.
Disclosure of Invention
The invention aims to provide a device, a method and a system for measuring the flex electric coefficient and electronic equipment, so as to accurately and simply measure the flex electric coefficient by utilizing the inverse flex electric effect.
In order to achieve the above object, the present invention provides the following solutions:
a device for measuring a coefficient of deflection, comprising: the device comprises an electrode unit, a flexible electric material layer, an electrode layer, an applied voltage unit, a displacement measuring unit and an upper computer;
the electrode unit is arranged on the flexible electric material layer at a set distance from the controlled structure; the flexible electric material layer is arranged on the upper surface of the electrode layer; the electrode layer is arranged on the upper surface of the controlled structure; one end of the controlled structure is fixed; one end of the voltage applying unit is connected with the electrode unit, and the other end of the voltage applying unit is connected with the electrode layer;
the voltage applying unit and the displacement measuring unit are connected with the upper computer;
the voltage applying unit is used for applying control voltage to drive the controlled structure;
the displacement measuring unit is used for collecting the displacement of the driven controlled structure; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end;
and the upper computer is used for calculating the flex electricity coefficient of the flex electricity material layer according to the displacement.
Optionally, the electrode unit is a wire electrode or an atomic force microscope probe point electrode.
Optionally, the displacement measurement unit is a laser vibrometer.
Optionally, an adhesive layer is also included; the bonding layer is arranged between the electrode layer and the controlled structure; the bonding layer is used for bonding the electrode layer and the controlled structure.
Optionally, the voltage applying unit is a voltage controller.
The method for measuring the flexural electric number is applied to the device for measuring the flexural electric number, and comprises the following steps:
applying a control voltage to drive the controlled structure;
acquiring displacement generated after a controlled structure is driven; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end;
and determining the flex electricity coefficient of the flex electricity material layer according to the displacement.
Optionally, determining the flexoelectric coefficient of the layer of the flexoelectric material according to the displacement specifically includes:
using the formulaDetermining a flex coefficient of the flex electrical material layer; wherein u is (x) A displacement of x at a preset distance from the upper surface of the controlled structure to the fixed end is set; phi (phi) a To apply a control voltage; h is the thickness of the controlled structure; h is a a Is the thickness of the flex electric material layer; x is the distance between the contact position of the electrode unit and the flexible electric material layer and the fixed end of the controlled structure; r is the radius of the electrode unit; b is the width of the structure to be controlled; y is the elastic modulus of the controlled structure; i is the moment of inertia of the structure being controlled.
A system for measuring a flexural electrical number, the system for measuring a flexural electrical number being used for implementing the method for measuring a flexural electrical number, the system for measuring a flexural electrical number comprising:
the voltage application module is used for applying control voltage to drive the controlled structure;
the displacement acquisition module is used for acquiring the displacement generated after the controlled structure is driven; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end;
and the flexible electric coefficient calculation module is used for determining the flexible electric coefficient of the flexible electric material layer according to the displacement.
An electronic device, comprising: the system comprises a memory and a processor, wherein the memory is used for storing a computer program, and the processor runs the computer program to enable the electronic equipment to execute the method for measuring the flexural electric number.
Optionally, the memory is a readable storage medium.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects:
according to the device, the method, the system and the electronic equipment for measuring the flex coefficient, one end of the controlled structure is fixed, and the electrode unit is arranged on the flex material layer at a set distance from the fixed end of the controlled structure; the flexible electric material layer is arranged on the upper surface of the electrode layer; the electrode layer is arranged on the upper surface of the controlled structure; one end of the voltage applying unit is connected with the electrode unit, and the other end of the voltage applying unit is connected with the electrode layer; the voltage applying unit and the displacement measuring unit are connected with the upper computer; the voltage applying unit is used for applying control voltage to drive the controlled structure; the displacement measuring unit is used for collecting the displacement of the driven controlled structure; the upper computer is used for calculating the flexible electricity coefficient of the flexible electricity material layer according to the displacement. The invention can obtain the inverse flex electricity coefficient according to static deformation or dynamic displacement response based on the inverse flex electricity effect, only needs to measure displacement, does not need to convert, can directly utilize the displacement measurement result to accurately calculate the flex electricity coefficient, and makes up the blank and the defect of the prior art.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the drawings that are needed in the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic view of a device for measuring a bending electric coefficient according to the present invention;
fig. 2 is a flowchart of a method for measuring a flex electric coefficient according to the present invention.
Symbol description:
1. an electrode unit; 2. a layer of flex electrical material; 3. an electrode layer; 4. a controlled structure; 5. a voltage applying unit; 6. and a displacement measuring unit.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention aims to provide a device, a method and a system for measuring the flex electric coefficient and electronic equipment, so as to accurately and simply measure the flex electric coefficient by utilizing the inverse flex electric effect.
The invention can obtain the reverse flex electricity coefficient of the flex electricity material through displacement change based on the reverse flex electricity effect, and makes up the blank of the prior art.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
Example 1
When the inverse flexoelectric effect is used as a control panel shell structure of a flexoelectric actuator (a flexoelectric coefficient measuring device), a driving voltage needs to be applied to the flexoelectric actuator, and an atomic force microscope probe or a wire electrode is generally adopted to construct uneven electric field distribution in a flexoelectric material, so that the structure is controlled.
For different plate and shell structures, the stress simplification of a general double-curvature shell structure can be applied to various shell structures.
As shown in fig. 1, the device for measuring the flex coefficient of the present invention comprises: an electrode unit 1, a layer of flexoelectric material 2, an electrode layer 3, an applied voltage unit 5, a displacement measurement unit 6, and an upper computer (not shown in fig. 1).
The controlled structure 4 is fixed at one end, and in practical application, the controlled structure 4 may be any beam or plate or shell, such as a cantilever beam, an elastic beam. The left end of the cantilever beam is fixedly supported, and the right end of the cantilever beam is free. The length of the elastic beam is L, the width of the elastic beam is b, and the thickness of the elastic beam is h. The cross-sectional bending stiffness of the cantilever is YI.
The electrode unit 1 is arranged on the flexible electric material layer 2 at a set distance from the fixed end of the controlled structure; the flexible electric material layer 2 is arranged on the upper surface of the electrode layer 3; the electrode layer 3 is arranged on the upper surface of the controlled structure 4; one end of the voltage applying unit 5 is connected with the electrode unit 1, and the other end of the voltage applying unit 5 is connected with the electrode layer 3; the voltage applying unit 5 and the displacement measuring unit 6 are connected with the upper computer. The layer of electro-flex material 2 may cover the spring beam completely as shown in fig. 1, or only a small part.
In practical application, the electrode unit is a wire electrode or an atomic force microscope (Atomic Force Microscope, AFM) probe point electrode. The distance of the AFM probe point electrode (or wire electrode) to the contact position of the flexoelectric material layer 2 from the cantilever fixed end is x. The radius of the AFM probe point electrode (or wire electrode) is r. The thickness of the flexible electric material layer is h a 。
The voltage applying unit 5 is configured to apply a control voltage to drive the controlled structure 4. The voltage applying unit 5 is a voltage controller.
In practical applications, the inverse flexoelectric coefficient is measured for static deformation based on the inverse flexoelectric effect when the applied voltage is a constant amount. When the applied voltage excitation is a simple harmonic excitation, an inverse flexoelectric coefficient is obtained for a dynamic displacement response based on the inverse flexoelectric effect.
The displacement measuring unit 6 is used for collecting the displacement of the driven controlled structure 4; the displacement is the displacement of the upper surface of the controlled structure 4 at a preset distance from the fixed end.
In practice, a control voltage phi is applied between the wire electrode (or AFM probe point electrode) and the electrode layer 3 a . Under the action of the control voltage, the flexoelectric actuator generates a non-uniform electric field to cause an electric-electric coupling effect, so that the conversion of electric load to a force field is realized, and control force and control moment are generated, thereby driving the controlled structure 4. At this time, a displacement sensor (displacement measuring unit 6) is used to measure the displacement on the beam at a set distance x from the fixed end.
Any displacement sensor can be adopted for displacement measurement, and the displacement measurement is within the protection scope of the invention. Alternatively, a non-contact laser displacement sensor (such as a laser vibration meter) is adopted, that is, the laser vibration meter is aligned to a position to be measured, and the displacement is measured by comparing the angle of light reflection obtained by transmitting laser with the distance of the displacement sensor.
The upper computer is used for calculating the flex electricity coefficient of the flex electricity material layer 2 according to the displacement.
As an alternative embodiment, the flex electrical number measurement device of the present invention further comprises an adhesive layer (not shown in fig. 1); the adhesive layer is arranged between the electrode layer 3 and the controlled structure 4; the adhesive layer is used for adhering the electrode layer 3 and the controlled structure 4.
In practice, an electro-flex actuator is arranged above the controlled structure 4. The electro-flex actuator is adhesively secured to the upper surface of the structure 4 to be controlled. The flexoelectric actuator is tightly adhered to the controlled structure 4, and various ways of adhesion can be adopted for the connection.
Example two
The present embodiment provides a method for measuring a flex electrical coefficient, which is applied to the device for measuring a flex electrical coefficient in the first embodiment, and includes:
step 201: and applying a control voltage to drive the controlled structure.
Step 202: acquiring displacement generated after a controlled structure is driven; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end.
Step 203: and determining the flex electricity coefficient of the flex electricity material layer according to the displacement.
As an alternative embodiment, step 203 specifically includes:
using the formulaDetermining a flex coefficient of the flex electrical material layer; wherein u is (x) A displacement of x at a preset distance from the upper surface of the controlled structure to the fixed end is set; phi (phi) a To apply a control voltage; h is the thickness of the controlled structure; h is a a Is the thickness of the flex electric material layer; x is the distance between the contact position of the electrode unit and the flexible electric material layer and the fixed end of the controlled structure; r is the radius of the electrode unit; b is the width of the structure to be controlled; y is the elastic modulus of the controlled structure; i is the moment of inertia of the structure being controlled.
In practical application, the transverse flexoelectric coefficient mu can be obtained according to the force-electric coupling relation of the inverse flexoelectric effect 12 Is an expression of (2).
If the displacement of the end of the cantilever beam, i.e. the displacement u of the beam at a distance L from the fixed end, is measured (L) Coefficient of deflection mu 12 The expression can be as follows:
the invention can obtain the inverse flexoelectric coefficient according to static deformation or dynamic displacement response based on the inverse flexoelectric effect, only the displacement is required to be measured, conversion is not required, and the measured result can be directly used for calculating the flexoelectric coefficient, thereby making up the blank and the defect of the prior art.
The invention obtains the inverse flexoelectric coefficient based on the inverse flexoelectric effect, and is more reliable, direct and effective in the follow-up dynamic action response and vibration control based on the inverse flexoelectric effect.
The experimental operation is simpler and more reliable without the need to apply a large load and to use a high-precision current amplifier to measure the current as is required based on the positive flexoelectric effect.
The needed instrument is only a displacement sensor and a voltage controller, and is easy to operate and low in cost.
Example III
In order to perform the method corresponding to the second embodiment to achieve the corresponding functions and technical effects, a system for measuring a flexural electrical parameter is provided below, including:
and the voltage application module is used for applying control voltage to drive the controlled structure.
The displacement acquisition module is used for acquiring the displacement generated after the controlled structure is driven; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end.
And the flexible electric coefficient calculation module is used for determining the flexible electric coefficient of the flexible electric material layer according to the displacement.
Example IV
The invention provides an electronic device, comprising: the electronic device includes a memory for storing a computer program, and a processor that runs the computer program to cause the electronic device to perform the method of measuring a flex electrical number of the second embodiment.
As an alternative embodiment, the memory is a readable storage medium.
In the present specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different point from other embodiments, and identical and similar parts between the embodiments are all enough to refer to each other. For the system disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant points refer to the description of the method section.
The principles and embodiments of the present invention have been described herein with reference to specific examples, the description of which is intended only to assist in understanding the methods of the present invention and the core ideas thereof; also, it is within the scope of the present invention to be modified by those of ordinary skill in the art in light of the present teachings. In view of the foregoing, this description should not be construed as limiting the invention.
Claims (10)
1. A device for measuring a flexural electrical number, comprising: the device comprises an electrode unit, a flexible electric material layer, an electrode layer, an applied voltage unit, a displacement measuring unit and an upper computer;
the electrode unit is arranged on the flexible electric material layer at a set distance from the controlled structure; the flexible electric material layer is arranged on the upper surface of the electrode layer; the electrode layer is arranged on the upper surface of the controlled structure; one end of the controlled structure is fixed; one end of the voltage applying unit is connected with the electrode unit, and the other end of the voltage applying unit is connected with the electrode layer;
the voltage applying unit and the displacement measuring unit are connected with the upper computer;
the voltage applying unit is used for applying control voltage to drive the controlled structure;
the displacement measuring unit is used for collecting the displacement of the driven controlled structure; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end;
and the upper computer is used for calculating the flex electricity coefficient of the flex electricity material layer according to the displacement.
2. The device of claim 1, wherein the electrode unit is a wire electrode or an atomic force microscope probe point electrode.
3. The device of claim 1, wherein the displacement measurement unit is a laser vibrometer.
4. The device of claim 1, further comprising an adhesive layer; the bonding layer is arranged between the electrode layer and the controlled structure; the bonding layer is used for bonding the electrode layer and the controlled structure.
5. The device of claim 1, wherein the applied voltage unit is a voltage controller.
6. A method for measuring a flexural electric power, characterized in that the method is applied to the flexural electric power measuring device as claimed in any one of claims 1 to 5, the method comprising:
applying a control voltage to drive the controlled structure;
acquiring displacement generated after a controlled structure is driven; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end;
and determining the flex electricity coefficient of the flex electricity material layer according to the displacement.
7. The method of claim 6, wherein determining the flex coefficient of the layer of flex material based on the displacement, comprises:
using the formulaDetermining a flex coefficient of the flex electrical material layer; wherein u is (x) A displacement of x at a preset distance from the upper surface of the controlled structure to the fixed end is set; phi (phi) a To apply a control voltage; h is the thickness of the controlled structure; h is a a Is the thickness of the flex electric material layer; x is the distance between the contact position of the electrode unit and the flexible electric material layer and the fixed end of the controlled structure; r is the radius of the electrode unit; b is the width of the structure to be controlled; y is the elasticity of the structure to be controlledModulus; i is the moment of inertia of the structure being controlled.
8. A system for measuring a flex electrical coefficient, wherein the system for measuring a flex electrical coefficient is configured to implement the method for measuring a flex electrical coefficient according to any one of claims 6-7, the system for measuring a flex electrical coefficient comprising:
the voltage application module is used for applying control voltage to drive the controlled structure;
the displacement acquisition module is used for acquiring the displacement generated after the controlled structure is driven; the displacement is the displacement of the upper surface of the controlled structure at a preset distance from the fixed end;
and the flexible electric coefficient calculation module is used for determining the flexible electric coefficient of the flexible electric material layer according to the displacement.
9. An electronic device, comprising: a memory for storing a computer program, and a processor that runs the computer program to cause the electronic device to perform the method of measuring a flex electrical number as claimed in any one of claims 6 to 7.
10. The electronic device of claim 9, wherein the memory is a readable storage medium.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311485740.4A CN117517830A (en) | 2023-11-09 | 2023-11-09 | Device, method and system for measuring deflection coefficient and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311485740.4A CN117517830A (en) | 2023-11-09 | 2023-11-09 | Device, method and system for measuring deflection coefficient and electronic equipment |
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| Publication Number | Publication Date |
|---|---|
| CN117517830A true CN117517830A (en) | 2024-02-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202311485740.4A Pending CN117517830A (en) | 2023-11-09 | 2023-11-09 | Device, method and system for measuring deflection coefficient and electronic equipment |
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| CN (1) | CN117517830A (en) |
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2023
- 2023-11-09 CN CN202311485740.4A patent/CN117517830A/en active Pending
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