CN117516759A - Test platform and method for evaluating applicability of temperature sensor in low-temperature environment - Google Patents

Test platform and method for evaluating applicability of temperature sensor in low-temperature environment Download PDF

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Publication number
CN117516759A
CN117516759A CN202311310647.XA CN202311310647A CN117516759A CN 117516759 A CN117516759 A CN 117516759A CN 202311310647 A CN202311310647 A CN 202311310647A CN 117516759 A CN117516759 A CN 117516759A
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China
Prior art keywords
temperature
test
low
temperature sensor
tested
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Pending
Application number
CN202311310647.XA
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Chinese (zh)
Inventor
张可心
孙巍
张健
梁建权
王磊
张亮
王悦
李璐
宫铭辰
曲利民
赵翔宇
尚书磊
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State Grid Heilongjiang Electric Power Co Ltd Electric Power Research Institute
State Grid Corp of China SGCC
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State Grid Heilongjiang Electric Power Co Ltd Electric Power Research Institute
State Grid Corp of China SGCC
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Application filed by State Grid Heilongjiang Electric Power Co Ltd Electric Power Research Institute, State Grid Corp of China SGCC filed Critical State Grid Heilongjiang Electric Power Co Ltd Electric Power Research Institute
Priority to CN202311310647.XA priority Critical patent/CN117516759A/en
Publication of CN117516759A publication Critical patent/CN117516759A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00Testing or calibrating of thermometers
    • G01K15/005Calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00Testing or calibrating of thermometers
    • G01K15/007Testing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

A test platform and a test method for evaluating the applicability of a temperature sensor in a low-temperature environment relate to a sensor applicability evaluation technology and aim to solve the problems that the existing temperature sensor applicability evaluation method is small in temperature test range and low in test precision. The temperature adjustment range of the high-low temperature test chamber is-70-100 ℃; the detector is arranged on one side of the high-low temperature test box, the temperature sensor to be tested is arranged in the high-low temperature test box, the temperature in the high-low temperature test box is regulated to be the fixed point temperature, the return parameters of the temperature sensor to be tested are obtained through the detector, and whether the power supply and the data transmission of the temperature sensor are normal or not is tested. The beneficial effects are that temperature regulation scope is big, and the precision of test is higher.

Description

Test platform and method for evaluating applicability of temperature sensor in low-temperature environment
Technical Field
The invention relates to a sensor applicability evaluation technology.
Background
The temperature sensor is used as an important element for realizing the temperature detection of the key node of the equipment, and is widely applied to a power grid system; however, under the condition of low temperature, whether the measurement effect of the temperature sensor can meet the standard requirement or not needs to be checked, and the existing sensor environment temperature parameter indexes comprise working temperature range, temperature error, temperature drift, sensitivity coefficient and thermal hysteresis; the sensor environmental temperature parameter indexes can represent the quality of the sensor to a certain extent, so that the sensor is used as a low-temperature environment for network access detection without detection of performance indexes; the existing temperature sensor applicability evaluation method has the defects of small temperature test range, low test precision and incapability of measuring the influence of circulating temperature on the temperature sensor.
Disclosure of Invention
The invention aims to solve the problems of small temperature testing range and low testing precision of the existing temperature sensor applicability evaluation method, and provides a temperature sensor applicability evaluation test platform and method under a low-temperature environment.
The invention relates to a test platform for evaluating the applicability of a temperature sensor in a low-temperature environment, which comprises a high-low temperature test box and a detector;
the temperature adjustment range of the high-low temperature test chamber is-70-100 ℃;
the temperature sensor to be tested is arranged in the high-low temperature test box, the temperature in the high-low temperature test box is regulated to be the fixed point temperature, the return parameters of the temperature sensor to be tested are obtained through the detector, and whether the power supply and the data transmission of the temperature sensor are normal or not is tested.
Further, a test cavity and an air conditioning channel are arranged in the high-low temperature test chamber;
the temperature sensor to be tested is arranged in the test cavity;
the air conditioning channel is positioned at one side of the test cavity; the air conditioning channel is internally provided with a wind wheel, a heater and an evaporator from top to bottom in sequence; meanwhile, a humidifying pipe is arranged between the wind wheel and the heater; the wind wheel is used for promoting air circulation in the air conditioning channel; the humidifying pipe is used for adding humidity to the flowing air; the heater is used for heating the flowing air; the evaporator is used for evaporating the flowing air.
Further, the bottom of the air conditioning channel is provided with a drain pipe;
the drain pipe discharges water generated by condensing water vapor in the high-low temperature test chamber to the outside of the high-low temperature test chamber.
Further, a motor is arranged at the top end of the outer part of the high-low temperature test chamber;
the motor is used for driving the wind wheel to rotate.
Further, the setpoint temperature is 50 ℃, 40 ℃, 30 ℃, 20 ℃, 10 ℃, 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃ or 50 ℃.
A test method of a temperature sensor applicability evaluation test platform in a low-temperature environment comprises the following steps:
step one, performing basic detection on a temperature sensor to be tested at normal temperature;
step two, performing a temperature cycle test on the temperature sensor to be tested;
the temperature cycling test includes:
step two, performing a temperature rise test on a temperature sensor to be tested;
step two, in the high-low temperature test box 1, performing a cooling test on the temperature sensor to be tested;
step two, in the high-low temperature test box 1, carrying out a low-temperature 96-hour operation test on the temperature sensor to be tested;
step two, performing a temperature recovery test on the temperature sensor to be tested;
step three, determining whether to carry out a temperature cycle test again; if yes, returning to the execution step II, otherwise ending the test.
Further, the specific flow of the temperature rise test in the step two is as follows:
after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
Further, the specific flow of the cooling test in the second step is as follows:
after each temperature is reduced by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
Further, the specific flow of the low-temperature 96-hour operation test in the second and third steps is as follows:
placing the temperature sensor to be tested in a high-low temperature test box 1, continuously operating at the lowest temperature for 96 hours, testing and recording the performance index of the temperature sensor to be tested every 12 hours;
the lowest temperature is that the temperature sensor to be tested is in the high-low temperature test box 1 to carry out the test in the whole process, and the lowest temperature is-50 ℃.
Further, the specific flow of the temperature recovery test in the second and fourth steps is as follows:
after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
The beneficial effects of the invention are as follows: the temperature adjustment range of the high-low temperature test box at the temperature of between 70 ℃ below zero and 100 ℃ is utilized, the adjustment range of a temperature sensor applicability evaluation method is enlarged, the applicability of the temperature sensor in the temperature range of between 50 ℃ below zero and 100 ℃ is analyzed by the test method, the temperature sensor is compared with a standard temperature sensor, and the accuracy of the temperature sensor at each temperature is determined; as a network access detection method of the temperature sensor used in the low-temperature environment, guidance comments are provided for the temperature sensor used in the low-temperature environment.
Drawings
FIG. 1 is a schematic structural view of a high and low temperature test chamber according to a first embodiment;
FIG. 2 is a flow chart of a test method for evaluating a test platform for the suitability of a temperature sensor in a low-temperature environment according to the second embodiment;
fig. 3 is a graph showing a temperature cycle test in the second embodiment.
Detailed Description
The first embodiment describes the present embodiment with reference to fig. 1, and the test platform for evaluating the suitability of a temperature sensor in a low-temperature environment according to the present embodiment includes a high-low temperature test chamber 1 and a detector;
the temperature adjustment range of the high-low temperature test chamber 1 is-70-100 ℃;
the temperature sensor to be tested is arranged in the high-low temperature test box 1, the temperature in the high-low temperature test box 1 is regulated to be the fixed point temperature, the return parameters of the temperature sensor to be tested are obtained through the detector, and whether the power supply and the data transmission of the temperature sensor are normal or not is tested.
In a preferred embodiment, a test cavity 2 and an air conditioning channel are arranged in the high-low temperature test chamber 1;
the temperature sensor to be tested is arranged in the test cavity 2;
the air conditioning channel is positioned at one side of the test cavity 2; the air conditioning channel is internally provided with a wind wheel 4, a heater 6 and an evaporator 7 from top to bottom in sequence; meanwhile, a humidifying pipe 5 is arranged between the wind wheel 4 and the heater 6; wherein the wind wheel 4 is used for promoting the air circulation in the air conditioning channel; the humidifying pipe 5 is used for adding humidity to the flowing air; the heater 6 is used for heating the flowing air; the evaporator 7 is used for evaporating the flowing air.
In the preferred embodiment, the bottom of the air conditioning channel is provided with a drain pipe;
the drain pipe discharges water generated by condensing water vapor in the high-low temperature test chamber 1 to the outside of the high-low temperature test chamber 1.
In the present embodiment, the use of the humidifying pipe 5 in combination with the heater 6 and the evaporator 7 allows water vapor to be obtained, and the heat absorption is performed by condensing the water vapor, so that the temperature of the test chamber 2 of the high/low temperature test chamber 1 is reduced, and the water vapor is condensed into water and discharged through the drain pipe.
In a preferred embodiment, the motor 3 is arranged at the outer top end of the high-low temperature test chamber 1;
the motor 3 is used for driving the wind wheel 4 to rotate.
In a preferred embodiment, the setpoint temperature is 50 ℃, 40 ℃, 30 ℃, 20 ℃, 10 ℃, 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃ or 50 ℃.
In the present embodiment, 1, a temperature range, and measurement accuracy;
the sensor is placed in a high-low temperature test box 1, temperature detection is carried out at each fixed point temperature (50 ℃, 40 ℃, 30 ℃, 20 ℃, 10 ℃, 0 ℃, -10 ℃, -20 ℃, -30 ℃, -40 ℃ and-50 ℃), the applicability of the temperature sensor in the range of-50 ℃ -100 ℃ is analyzed, and the temperature sensor is compared with a standard temperature sensor to determine the accuracy of the temperature sensor at each temperature.
2. Temperature cycling effects;
the whole sensor is placed in a high-low temperature test box 1, the temperature is kept for 30min at 0 ℃, -10 ℃, -25 ℃, -30 ℃, -40 ℃ and-50 ℃ respectively in the process of reducing the temperature from 0 ℃ to-50 ℃, then the temperature is gradually increased to-40 ℃, -30 ℃, -20 ℃, -10 ℃ and 0 ℃, the return parameters of the sensor are recorded, and whether the conditions of power supply, data transmission and the like of the sensor are normal or not is recorded.
3. Limit temperature effects;
the whole sensor is placed in a high-low temperature test box 1, and after the temperature is reduced from 0 ℃ to-50 ℃, the temperature is respectively maintained at 0 ℃, -10 ℃, -25 ℃, -30 ℃, -40 ℃ and-50 ℃ for 2 hours, the return parameters of the sensor are recorded, and whether the conditions of power supply, data transmission and the like of the sensor are normal or not is recorded.
4. Linearity test
The sensor is arranged in a high-low temperature test box 1, the display temperature of the high-low temperature test box 1 and the output temperature of an optical fiber temperature measuring device are recorded at the temperature of 0 ℃, -10 ℃, -25 ℃, -30 ℃, -40 ℃ and-50 ℃ respectively in the process of reducing the temperature from 0 ℃ to-50 ℃, and the temperature measured by a platinum resistance temperature sensor is used as a reference of the display temperature of the incubator.
A second embodiment is a test method for evaluating a test platform for suitability of a temperature sensor in a low-temperature environment according to the first embodiment, and the test method includes the steps of:
step one, performing basic detection on a temperature sensor to be tested at normal temperature;
step two, performing a temperature cycle test on the temperature sensor to be tested;
the temperature cycling test includes:
step two, performing a temperature rise test on a temperature sensor to be tested;
step two, in the high-low temperature test box 1, performing a cooling test on the temperature sensor to be tested;
step two, in the high-low temperature test box 1, carrying out a low-temperature 96-hour operation test on the temperature sensor to be tested;
step two, performing a temperature recovery test on the temperature sensor to be tested;
step three, determining whether to carry out a temperature cycle test again; if yes, returning to the execution step II, otherwise ending the test.
In a preferred embodiment, the specific flow of the temperature increase test in the second step is as follows:
after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
In a preferred embodiment, the specific flow of the cooling test in the second step is as follows:
after each temperature is reduced by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
In a preferred embodiment, the specific flow of the low-temperature 96-hour operation test in the second step and the third step is as follows:
placing the temperature sensor to be tested in a high-low temperature test box 1, continuously operating at the lowest temperature for 96 hours, testing and recording the performance index of the temperature sensor to be tested every 12 hours;
the lowest temperature is that the temperature sensor to be tested is in the high-low temperature test box 1 to carry out the test in the whole process, and the lowest temperature is-50 ℃.
In a preferred embodiment, the specific flow of the temperature recovery test in the second and fourth steps is as follows:
after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
In this embodiment, a temperature cycle test is performed according to fig. 3;
1. maximum temperature: the maximum operating temperature specified by the sensor;
2. minimum temperature: the sensor is in a high-low temperature test box for test in the whole process, and the lowest temperature is-50 ℃;
3. t1 to t4 are one test cycle:
t1 period: a temperature rise test is shown, after each temperature rise is 10 ℃, each temperature point is stabilized for 2 hours, the performance index of the sensor is tested and recorded;
t2 period: a cooling test is shown, after each temperature is lowered by 10 ℃, each temperature point is stabilized for 2 hours, the performance index of the sensor is tested and recorded;
t3 period: representing a low-temperature 96-hour operation test (stability test), placing the sensor in a low-temperature laboratory, continuously operating for 96 hours at the lowest temperature, testing every 12 hours, and recording the performance index of the sensor;
t4 period: the temperature recovery test is shown: after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the sensor;
4. at each test temperature point, 5 sets of test data were recorded.
Wherein, the tested product (high-low temperature test chamber 1) is always in a working state in the test process.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (10)

1. The test platform for evaluating the applicability of the temperature sensor in the low-temperature environment is characterized by comprising a high-low temperature test box (1) and a detector;
the temperature adjusting range of the high-low temperature test chamber (1) is-70-100 ℃;
the temperature sensor to be tested is arranged in the high-low temperature test box (1), the temperature in the high-low temperature test box (1) is regulated to be the fixed point temperature, the return parameters of the temperature sensor to be tested are obtained through the detector, and whether the power supply and the data transmission of the temperature sensor are normal or not is tested.
2. The test platform for evaluating the suitability of the temperature sensor in the low-temperature environment according to claim 1, wherein a test cavity (2) and an air conditioning channel are arranged in the high-low temperature test box (1);
the temperature sensor to be tested is arranged in the test cavity (2);
the air conditioning channel is positioned at one side of the test cavity (2); a wind wheel (4), a heater (6) and an evaporator (7) are sequentially arranged in the air conditioning channel from top to bottom; meanwhile, a humidifying pipe (5) is arranged between the wind wheel (4) and the heater (6); wherein the wind wheel (4) is used for promoting the air circulation in the air conditioning channel; a humidifying pipe (5) for adding humidity to the flowing air; a heater (6) for heating the flowing air; the evaporator (7) is used for evaporating the flowing air.
3. The test platform for evaluating the suitability of a temperature sensor in a low-temperature environment according to claim 2, wherein a drain pipe is arranged at the bottom of the air conditioning channel;
the drain pipe discharges water generated by condensing water vapor in the high-low temperature test chamber (1) to the outside of the high-low temperature test chamber (1).
4. The test platform for evaluating the suitability of the temperature sensor in the low-temperature environment according to claim 2, wherein the motor (3) is arranged at the outer top end of the high-low temperature test box (1);
the motor (3) is used for driving the wind wheel (4) to rotate.
5. The test bench for evaluating suitability of temperature sensor in low temperature environment according to claim 1, wherein the setpoint temperature is 50 ℃, 40 ℃, 30 ℃, 20 ℃, 10 ℃, 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃ or 50 ℃.
6. The test method based on the test platform for evaluating the suitability of the temperature sensor in the low-temperature environment according to claim 1, which is characterized by comprising the following steps:
step one, performing basic detection on a temperature sensor to be tested at normal temperature;
step two, performing a temperature cycle test on the temperature sensor to be tested;
the temperature cycling test includes:
step two, performing a temperature rise test on a temperature sensor to be tested;
step two, in a high-low temperature test box (1), performing a cooling test on the temperature sensor to be tested;
step two, in a high-low temperature test box (1), carrying out a low-temperature 96-hour operation test on a temperature sensor to be tested;
step two, performing a temperature recovery test on the temperature sensor to be tested;
step three, determining whether to carry out a temperature cycle test again; if yes, returning to the execution step II, otherwise ending the test.
7. The test method of the test platform for evaluating the suitability of the temperature sensor in the low-temperature environment according to claim 6, wherein the specific flow of the temperature rise test in the second step is as follows:
after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
8. The test method of the temperature sensor applicability evaluation test platform under the low-temperature environment according to claim 6, wherein the specific flow of the cooling test in the second step is as follows:
after each temperature is reduced by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
9. The test method of the temperature sensor applicability evaluation test platform under the low-temperature environment according to claim 6, wherein the specific flow of the low-temperature 96-hour operation test in the second and third steps is as follows:
placing a temperature sensor to be tested in a high-low temperature test box (1), continuously operating at the lowest temperature for 96 hours, testing and recording performance indexes of the temperature sensor to be tested every 12 hours;
the lowest temperature is that the temperature sensor to be tested is in a high-low temperature test box (1) to conduct test in the whole process, and the lowest temperature is-50 ℃.
10. The test method of the temperature sensor applicability evaluation test platform under the low-temperature environment according to claim 6, wherein the specific flow of the temperature recovery test in the second and fourth steps is as follows:
after each temperature is raised by 10 ℃ and each temperature point is stabilized for 2 hours, testing and recording the performance index of the temperature sensor to be tested.
CN202311310647.XA 2023-10-10 2023-10-10 Test platform and method for evaluating applicability of temperature sensor in low-temperature environment Pending CN117516759A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202311310647.XA CN117516759A (en) 2023-10-10 2023-10-10 Test platform and method for evaluating applicability of temperature sensor in low-temperature environment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202311310647.XA CN117516759A (en) 2023-10-10 2023-10-10 Test platform and method for evaluating applicability of temperature sensor in low-temperature environment

Publications (1)

Publication Number Publication Date
CN117516759A true CN117516759A (en) 2024-02-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202311310647.XA Pending CN117516759A (en) 2023-10-10 2023-10-10 Test platform and method for evaluating applicability of temperature sensor in low-temperature environment

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