CN117516715A - Wavelength calibration method, device and storage medium - Google Patents
Wavelength calibration method, device and storage medium Download PDFInfo
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- CN117516715A CN117516715A CN202311785831.XA CN202311785831A CN117516715A CN 117516715 A CN117516715 A CN 117516715A CN 202311785831 A CN202311785831 A CN 202311785831A CN 117516715 A CN117516715 A CN 117516715A
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- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000002835 absorbance Methods 0.000 claims abstract description 106
- 238000001228 spectrum Methods 0.000 claims abstract description 63
- 230000000694 effects Effects 0.000 abstract description 3
- 238000012545 processing Methods 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 230000010354 integration Effects 0.000 description 4
- 229910052786 argon Inorganic materials 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 3
- 229910052753 mercury Inorganic materials 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- -1 Polyethylene terephthalate Polymers 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000000075 oxide glass Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
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Abstract
The application discloses a wavelength calibration method, a device and a storage medium, and relates to the technical field of spectrum processing, wherein the method comprises the following steps: collecting a target absorbance graph of an original pixel domain of a target object; carrying out first peak searching on the target absorbance graph to obtain n characteristic peaks with absorbance meeting preset conditions, wherein n is a positive integer; carrying out secondary peak searching according to the n characteristic peaks to obtain n standard peaks; and converting the target absorbance graph into a wavelength spectrum according to the n standard peaks. The method solves the problems of lower calibration efficiency and higher cost of the existing wavelength calibration method, and achieves the effects of improving the calibration efficiency and reducing the cost while improving the accuracy by obtaining an accurate result through two peak searching in one calibration.
Description
Technical Field
The invention relates to a wavelength calibration method, a device and a storage medium, belonging to the technical field of spectrum processing.
Background
At present, most linear array spectrometers are calibrated by adopting a mercury lamp or an argon lamp, and after calibration, calibration coefficients are written in, so that wavelength calibration is completed.
However, in the practical use process, the spectrometer often generates a temperature drift along with the temperature transformation, and the temperature drift brings about a spectrum drift, that is, the wavelength accuracy obtained by calibration is not high. In order to improve the calibration accuracy, the existing method is to calibrate again through a mercury lamp or an argon lamp, and adding one mercury lamp or argon lamp greatly improves the cost and reduces the calibration efficiency through multiple calibration.
Disclosure of Invention
The invention aims to provide a wavelength calibration method, a device and a storage medium, which are used for solving the problems existing in the prior art.
In order to achieve the above purpose, the present invention provides the following technical solutions:
according to a first aspect, an embodiment of the present invention provides a wavelength calibration method, including:
collecting a target absorbance graph of an original pixel domain;
carrying out first peak searching on the target absorbance graph to obtain n characteristic peaks with absorbance meeting preset conditions, wherein n is a positive integer;
carrying out secondary peak searching according to the n characteristic peaks to obtain n standard peaks;
and converting the target absorbance graph into a wavelength spectrum according to the n standard peaks.
Optionally, the first peak searching is performed on the target absorbance graph, and n characteristic peaks with absorbance meeting a preset condition are obtained, including:
calculating a derivative spectrum of the target absorbance map;
and selecting n characteristic peaks with absorbance meeting the preset condition according to the derivative spectrum.
Optionally, the calculating the derivative spectrum of the target absorbance plot includes:
performing linear interpolation on the target absorbance graph;
and calculating the derivative spectrum of the target absorbance graph after linear interpolation.
Optionally, the selecting n characteristic peaks with absorbance satisfying the preset condition according to the derivative spectrum includes:
determining individual peak points in the derivative spectrum;
for each peak point, calculating the deviation of the absorbance of the peak point from the absorbance of the adjacent pixel point;
and selecting peak points with deviation larger than a preset threshold and the absorbance ranked at the top n from high to low as the n characteristic peaks.
Optionally, the calculating the deviation of the absorbance of the peak point from the absorbance of the adjacent pixel point includes:
calculating the deviation delta AXi of the absorbance of the peak point and the absorbance of the left adjacent pixel point and the deviation delta AXi of the absorbance of the right adjacent pixel point;
the selection deviation is larger than a preset threshold value, and the peak points with the absorbance ranked at the top n from high to low are used as the n characteristic peaks, and the method comprises the following steps:
selecting peak points with left delta AXi larger than a first threshold value and right delta AXi larger than a second threshold value from the peak points;
and ranking the selected peak points according to the order of absorbance from high to low, and taking the peak point ranked in the top n as the n characteristic peaks.
Optionally, the second peak searching is performed according to the n characteristic peaks to obtain n standard peaks, which includes:
for each of the n characteristic peaks, determining a peak region corresponding to the characteristic peak;
and carrying out secondary peak searching on the absorbance of each peak area corresponding to the n characteristic peaks to obtain the n standard peaks.
Optionally, the second peak searching is performed on the absorbance of each peak area corresponding to the n characteristic peaks, so as to obtain the n standard peaks, which includes:
performing secondary fitting peak searching on the n peak areas and the corresponding absorbance;
and sorting peak points obtained by peak searching according to the sequence from high to low, and identifying the peak points as the n standard peaks.
Optionally, the converting the target absorbance map into a wavelength spectrum according to the n standard peaks includes:
calculating calibration coefficients according to the n characteristic peaks and the n standard peaks;
and converting the target absorbance graph into the wavelength spectrum according to the calibration coefficient.
In a second aspect, there is provided a wavelength calibration device comprising a memory having stored therein at least one program instruction and a processor for implementing the method according to the first aspect by loading and executing the at least one program instruction.
In a third aspect, there is provided a computer storage medium having stored therein at least one program instruction that is loaded and executed by a processor to implement the method of the first aspect.
Collecting a target absorbance graph of an original pixel domain; carrying out first peak searching on the target absorbance graph to obtain n characteristic peaks with absorbance meeting preset conditions, wherein n is a positive integer; carrying out secondary peak searching according to the n characteristic peaks to obtain n standard peaks; and converting the target absorbance graph into a wavelength spectrum according to the n standard peaks. The method solves the problems of lower calibration efficiency and higher cost of the existing wavelength calibration method, and achieves the effects of improving the calibration efficiency and reducing the cost while improving the accuracy by obtaining an accurate result through two peak searching in one calibration.
The foregoing description is only an overview of the present invention, and is intended to provide a better understanding of the present invention, as it is embodied in the following description, with reference to the preferred embodiments of the present invention and the accompanying drawings.
Drawings
FIG. 1 is a flow chart of a method for calibrating wavelength according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a target absorbance map acquired by a first type of spectrometer according to one embodiment of the invention;
FIG. 3 is a schematic diagram of a target absorbance map acquired by a second type of spectrometer according to one embodiment of the invention;
FIG. 4 is a schematic representation of one possible derivative spectrum calculated from the target absorbance plot shown in FIG. 2 according to one embodiment of the invention;
FIG. 5 is a schematic representation of one possible derivative spectrum calculated from the target absorbance plot shown in FIG. 3 according to one embodiment of the invention;
FIG. 6 is a schematic diagram showing one possible n characteristic peaks calculated from the target absorbance map shown in FIG. 2 according to one embodiment of the invention;
FIG. 7 is a schematic diagram showing one possible n characteristic peaks calculated from the target absorbance map shown in FIG. 3 according to one embodiment of the invention;
FIG. 8 is a schematic diagram of a possible wavelength spectrum corresponding to the target absorbance graph shown in FIG. 2 according to one embodiment of the invention;
fig. 9 is a schematic diagram of a possible wavelength spectrum corresponding to the target absorbance graph shown in fig. 3 according to one embodiment of the invention.
Detailed Description
The following description of the embodiments of the present invention will be made apparent and fully in view of the accompanying drawings, in which some, but not all embodiments of the invention are shown. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In addition, the technical features of the different embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
First, for the sake of easy understanding, a brief description will be given of the implementation scenario involved in the present application. When spectrum data acquisition is carried out, a target object is connected to a light source through an optical fiber, and then connected to a circulation bracket, and further connected to a spectrometer. When monochromatic laser light needs to be collected, the light source is replaced by a laser. During actual collection, three first type spectrometers and three second type spectrometers are used for data collection, specifically, dark noise is collected firstly, then background spectrum is collected, finally sample spectrum is collected, and absorbance is calculated according to the collected spectrum. The first type spectrometer and the second type spectrometer are spectrometers of different manufacturers respectively, and the specific implementation is not limited
Wherein the target object is standard sheet+PET (Polyethylene terephthalate, thermoplastic polyester), and standard wavelengths of the standard sheet+PET are 1068.3nm, 1220.5nm, 1362.9nm, 14643.6nm, 1524.0nm and 1660.5nm. In actual implementation, the standard sheet is rare earth oxide glass. The specific acquisition mode comprises the following steps:
the first type of spectrometer, acquisition is carried out by using Pro software, the integration time is 1ms, and the average times are 30; 10 standard piece spectra are collected, and 1 laser spectrum is collected.
Second type spectrometer: the original software collects, the integration time is 1ms, and the average times are 30 times; 10 standard piece spectra are collected, and 1 laser spectrum is collected.
The monochromators are respectively adjusted to 925nm, 950nm, 1000nm, 1050nm, 1100nm, 1150nm, 1200nm, 1250nm, 1300nm, 1350nm, 1400nm, 1450nm, 1500nm, 1550nm, 1600nm, 1650nm and 1675nm positions, and the monochromatic light is collected by using the second type spectrometer and the first type spectrometer respectively.
The first type of spectrometer, acquisition is performed by using Pro software, the integration time is 10ms, and the average times are 30; the monochromatic light is collected into 17 monochromatic light spectrums.
Second type spectrometer: the original software collects, the integration time is 10ms, and the average times are 30 times; the monochromatic light is collected into 17 monochromatic light spectrums.
Referring to fig. 1, a method flowchart of a wavelength calibration method according to an embodiment of the present application is shown, and as shown in fig. 1, the method includes:
step 101, collecting a target absorbance graph of an original pixel domain;
the method of collecting the target absorbance map is not limited in this application, and in one possible embodiment, the collection may be performed by the method described above.
Referring to fig. 2 and 3, there is shown a schematic diagram of a target absorbance map acquired by the first type spectrometer and the second type spectrometer when the light source is a composite light source. In actual implementation, the composite light source may be a halogen lamp.
102, carrying out first peak searching on the target absorbance graph to obtain n characteristic peaks with absorbance meeting preset conditions, wherein n is a positive integer;
optionally, the step includes:
firstly, calculating a derivative spectrum of the target absorbance graph;
the actual implementation, this step may include:
(1) Performing linear interpolation on the target absorbance graph;
in one possible implementation, the linear interpolation is 2 times the number of points in the target absorbance plot, i.e., 288 pixels after the original 144 pixels are linearly interpolated for the first type of spectrometer, the application selects the 25 th to 259 th pixels; for the second type of spectrometer, 256 pixels are interpolated linearly from the original 128 pixels.
(2) And calculating a derivative spectrum of the target absorbance graph after linear interpolation.
And calculating the derivative spectrum of each pixel point after linear interpolation through a first derivative algorithm. Assuming absorbance as a, the calculated derivative spectrum is dA.
Reference is made to fig. 4 and 5, which show one possible schematic representation of the derivative spectra obtained after calculation of fig. 2 and 3, respectively.
And secondly, selecting n characteristic peaks with absorbance meeting the preset condition according to the derivative spectrum.
Optionally, the step may include:
(1) Determining individual peak points in the derivative spectrum;
specifically, identifying the points dAX which are more than or equal to 0& & dAX +1<0 in the derivative spectrum, and taking each identified point as a peak point.
(2) Calculating the deviation of the absorbance of each peak point from the absorbance of the adjacent pixel point;
the adjacent pixel points may be directly adjacent pixel points, and of course, in order to better obtain the deviation of absorbance, the adjacent pixel points may be pixel points after a plurality of pixel points are different. For example, in the present embodiment, the adjacent pixel points here are pixel points after being offset by 6 pixel points; for example, the pixel is shifted by 8 pixels, which is not limited in this embodiment.
Of course, in actual implementation, the deviation from the left-side neighboring pixel point and the deviation from the right-side neighboring pixel point may be calculated separately, that is, this step includes: and calculating the deviation delta AXi of the absorbance of the peak point and the absorbance of the left adjacent pixel point and the deviation delta AXi of the absorbance of the right adjacent pixel point.
When the adjacent pixel is a pixel after being shifted by 6 pixel points, Δaxi left=a (Xi) -a (Xi-6), Δaxi right=a (Xi) -a (xi+6).
If the pixel point shifted on one side does not exist, the pixel point with the largest shift number is identified as the adjacent pixel point.
(3) And selecting peak points with deviation larger than a preset threshold and the absorbance ranked at the top n from high to low as the n characteristic peaks.
In actual implementation, the method comprises the following steps:
selecting peak points with left delta AXi larger than a first threshold value and right delta AXi larger than a second threshold value from the peak points;
the first threshold value and the second threshold value can be self-defined values or default values, and the values of the first threshold value and the second threshold value can be the same or different. For example, when the first threshold=the second threshold=0.03, then a peak point of Δaxi left >0.03& & Δaxi right >0.03 is selected.
And ranking the selected peak points according to the order of absorbance from high to low, and taking the peak point ranked in the top n as the n characteristic peaks.
Please refer to fig. 6 and 7, which show n characteristic peaks obtained by peak searching for the target absorbance maps shown in fig. 2 and 3, respectively.
n is a positive integer, the specific value of the n can be a custom value or a default value, and in actual implementation, n can be 6.
Step 103, carrying out second peak searching according to the n characteristic peaks to obtain n standard peaks;
first, for each of the n characteristic peaks, determining a peak area corresponding to the characteristic peak;
the peak region is a region after m pixel points are taken around the characteristic peak. For example, when m is 3, the peak area is 7 pixels in total.
And secondly, carrying out secondary peak searching on the absorbance of each peak area corresponding to the n characteristic peaks to obtain the n standard peaks.
And carrying out secondary peak searching on the absorbance of each peak area corresponding to the n characteristic peaks, namely carrying out secondary peak searching on the absorbance of each peak area in the n peak areas, so as to obtain n standard peaks.
In actual implementation, this step may include:
(1) Performing secondary fitting peak searching on the n peak areas and the corresponding absorbance;
in this step, only the peak searching by the second fitting is exemplified, and in actual implementation, multiple fitting may be performed, which is not limited in this embodiment.
(2) And sorting peak points obtained by peak searching according to the sequence from high to low, and identifying the peak points as the n standard peaks.
In the present embodiment, only the same number of standard peaks and the same number of characteristic peaks are illustrated, and they may be different in actual implementation. For example, after sorting in order from high to low in the above steps, the peak value ranked in the top i bits is selected as the standard peak, i standard peaks are obtained. Wherein i+.n.
And 104, converting the target absorbance graph into a wavelength spectrum according to the n standard peaks.
Firstly, calculating calibration coefficients according to the n characteristic peaks and the n standard peaks;
optionally, calculating Xreal values of the abscissa of the n characteristic peaks, performing polynomial fitting on each Xreal value obtained by calculation and the standard peak for multiple times, and calculating to obtain the calibration coefficient. Wherein the polynomial fit may be 3 times.
And secondly, converting the target absorbance graph into the wavelength spectrum according to the calibration coefficient.
And after the calibration coefficient is calculated, obtaining the wavelength spectrum according to the calibration coefficient. Specifically, the calibration coefficient is multiplied by the pixel of the target absorbance map, and the target absorbance map is converted into the wavelength domain.
Assuming the wavelength range 900-1700, the interval is 1, the total 801 points are adopted, and the linear interpolation reconstruction is carried out on the spectrum, so that the spectrum in the wavelength range 900-1700nm is obtained.
For an example with a polynomial fit of degree 3, please refer to fig. 8 and 9, which show the wavelength spectra corresponding to the target absorbance maps of fig. 2 and 3.
The absorbance of the composite light source is only processed to illustrate the application, and in actual implementation, the absorbance of a single light source such as a laser can be processed, and the processing manner is similar and is not repeated here.
It should be noted that, after obtaining the wavelength spectrum, self-test evaluation was performed, and the self-test evaluation procedure was as follows:
1. indexing the nearest wavelength point corresponding to the standard wavelength for the reconstructed spectrum;
2. expanding 15 wavelength points left and right respectively, and adding 31 wavelength points;
3. searching peaks by a quadratic polynomial, then performing difference with a standard wavelength, and solving the average difference of six peaks;
the parameters evaluated mainly include:
accuracy: ten standard piece spectrums are collected by each spectrometer, ten spectrums calculate the (mean square error) of each peak, and then the average mean square error of six peaks is calculated;
repeatability: ten standard piece spectra are collected by each spectrometer, ten spectra are calculated (standard deviation) of each peak, and then the average standard deviation of six peaks is obtained;
standard inter-stage difference: each ten spectrums are obtained, the average wavelength of six peaks of the ten spectrums is obtained, then the average wavelength of three spectrometers is obtained, and finally, the difference is made between the average wavelength and the standard peak;
laser inter-table difference: each spectrum is obtained, the average wavelength of four peaks of three spectrometers is obtained, and the average wavelength is finally differenced with a standard peak;
monochromatic light accuracy: carrying out peak searching on the spectrum of each single light, carrying out difference between the spectrum and the corresponding standard peak value, and obtaining an absolute value;
through the self-checking evaluation, the accuracy of the method is higher.
In summary, the target absorbance map of the original pixel domain is collected; carrying out first peak searching on the target absorbance graph to obtain n characteristic peaks with absorbance meeting preset conditions, wherein n is a positive integer; carrying out secondary peak searching according to the n characteristic peaks to obtain n standard peaks; and converting the target absorbance graph into a wavelength spectrum according to the n standard peaks. The method solves the problems of lower calibration efficiency and higher cost of the existing wavelength calibration method, and achieves the effects of improving the calibration efficiency and reducing the cost while improving the accuracy by obtaining an accurate result through two peak searching in one calibration.
The present application also provides a wavelength calibration device, the device comprising a memory and a processor, the memory storing at least one program instruction, the processor implementing the method as described above by loading and executing the at least one program instruction.
The present application also provides a computer storage medium having stored therein at least one program instruction that is loaded and executed by a processor to implement the method as described above.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the invention, which are described in detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.
Claims (10)
1. A method of wavelength calibration, the method comprising:
collecting a target absorbance graph of an original pixel domain of a target object;
carrying out first peak searching on the target absorbance graph to obtain n characteristic peaks with absorbance meeting preset conditions, wherein n is a positive integer;
carrying out secondary peak searching according to the n characteristic peaks to obtain n standard peaks;
and converting the target absorbance graph into a wavelength spectrum according to the n standard peaks.
2. The method according to claim 1, wherein the performing the first peak searching on the target absorbance map to obtain n characteristic peaks with absorbance satisfying a preset condition includes:
calculating a derivative spectrum of the target absorbance map;
and selecting n characteristic peaks with absorbance meeting the preset condition according to the derivative spectrum.
3. The method of claim 2, wherein said calculating a derivative spectrum of said target absorbance plot comprises:
performing linear interpolation on the target absorbance graph;
and calculating the derivative spectrum of the target absorbance graph after linear interpolation.
4. The method according to claim 2, wherein the selecting n characteristic peaks whose absorbance satisfies the preset condition according to the derivative spectrum includes:
determining individual peak points in the derivative spectrum;
for each peak point, calculating the deviation of the absorbance of the peak point from the absorbance of the adjacent pixel point;
and selecting peak points with deviation larger than a preset threshold and the absorbance ranked at the top n from high to low as the n characteristic peaks.
5. The method of claim 4, wherein calculating the deviation of the absorbance of the peak point from the absorbance of an adjacent pixel point comprises:
calculating the deviation delta AXi of the absorbance of the peak point and the absorbance of the left adjacent pixel point and the deviation delta AXi of the absorbance of the right adjacent pixel point;
the selection deviation is larger than a preset threshold value, and the peak points with the absorbance ranked at the top n from high to low are used as the n characteristic peaks, and the method comprises the following steps:
selecting peak points with left delta AXi larger than a first threshold value and right delta AXi larger than a second threshold value from the peak points;
and ranking the selected peak points according to the order of absorbance from high to low, and taking the peak point ranked in the top n as the n characteristic peaks.
6. The method according to claim 1, wherein said performing a second peak search based on said n characteristic peaks results in n standard peaks, comprising:
for each of the n characteristic peaks, determining a peak region corresponding to the characteristic peak;
and carrying out secondary peak searching on the absorbance of each peak area corresponding to the n characteristic peaks to obtain the n standard peaks.
7. The method of claim 6, wherein the second peak searching for the absorbance of each peak area corresponding to the n characteristic peaks, to obtain the n standard peaks, comprises:
performing secondary fitting peak searching on the n peak areas and the corresponding absorbance;
and sorting peak points obtained by peak searching according to the sequence from high to low, and identifying the peak points as the n standard peaks.
8. The method of any one of claims 1 to 7, wherein said converting said target absorbance plot into a wavelength spectrum according to said n standard peaks comprises:
calculating calibration coefficients according to the n characteristic peaks and the n standard peaks;
and converting the target absorbance graph into the wavelength spectrum according to the calibration coefficient.
9. A wavelength calibration device, characterized in that it comprises a memory in which at least one program instruction is stored and a processor that implements the method according to any one of claims 1 to 8 by loading and executing the at least one program instruction.
10. A computer storage medium having stored therein at least one program instruction that is loaded and executed by a processor to implement the method of any one of claims 1 to 8.
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103954368A (en) * | 2014-05-21 | 2014-07-30 | 北京遥测技术研究所 | Narrow-band light demodulating system and method based on photoelectric detection array |
| CN105424185A (en) * | 2015-11-04 | 2016-03-23 | 清华大学 | Computer assisted full-waveband spectrometer wavelength calibration method |
| CN112986161A (en) * | 2021-05-11 | 2021-06-18 | 南京智谱科技有限公司 | Online wavelength calibration method and device for water quality monitoring spectrometer |
| CN113624746A (en) * | 2021-08-05 | 2021-11-09 | 合肥金星机电科技发展有限公司 | LIBS spectrum drift online correction method and system |
| CN113984208A (en) * | 2021-10-26 | 2022-01-28 | 重庆川仪自动化股份有限公司 | Spectrometer wavelength calibration method, system, medium and electronic terminal |
| CN116265917A (en) * | 2021-12-17 | 2023-06-20 | 塞莫费雪科学（不来梅）有限公司 | Method for analyzing spectral peaks |
| CN116660176A (en) * | 2023-06-09 | 2023-08-29 | 无锡迅杰光远科技有限公司 | Fourier spectrum automatic baseline correction method, device and storage medium |
| CN117146977A (en) * | 2023-08-30 | 2023-12-01 | 杭州奥盛仪器有限公司 | Peak searching method and device for monochromator spectrum and electronic equipment |
-
2023
- 2023-12-22 CN CN202311785831.XA patent/CN117516715A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103954368A (en) * | 2014-05-21 | 2014-07-30 | 北京遥测技术研究所 | Narrow-band light demodulating system and method based on photoelectric detection array |
| CN105424185A (en) * | 2015-11-04 | 2016-03-23 | 清华大学 | Computer assisted full-waveband spectrometer wavelength calibration method |
| WO2017076228A1 (en) * | 2015-11-04 | 2017-05-11 | 清华大学 | Computer-assisted full wave-band spectrometer wavelength calibration method |
| CN112986161A (en) * | 2021-05-11 | 2021-06-18 | 南京智谱科技有限公司 | Online wavelength calibration method and device for water quality monitoring spectrometer |
| CN113624746A (en) * | 2021-08-05 | 2021-11-09 | 合肥金星机电科技发展有限公司 | LIBS spectrum drift online correction method and system |
| CN113984208A (en) * | 2021-10-26 | 2022-01-28 | 重庆川仪自动化股份有限公司 | Spectrometer wavelength calibration method, system, medium and electronic terminal |
| CN116265917A (en) * | 2021-12-17 | 2023-06-20 | 塞莫费雪科学（不来梅）有限公司 | Method for analyzing spectral peaks |
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