CN117420121B - Metal spectrum identification method and system based on collision radiation and spectrum correlation - Google Patents
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- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention provides a metal spectrum identification method and a system based on collision radiation and spectrum association, which belong to the field of aerospace plasma propulsion, and the method comprises the steps of firstly determining the offset of the central wavelength of a spectrum acquired in an experiment; under the condition of meeting the offset, comprehensively comparing the intensities of the Einstein emission coefficient, the relative intensity, the upper energy level and the lower energy level to perform primary identification of spectral lines; for spectral lines which have the offset meeting the determined range and cannot be distinguished, the energy level structure on the spectral lines is focused, other strong spectral lines with the same upper energy level are found out, whether the spectral lines exist or not is further determined, so that metal spectrum identification of complex structures based on collision radiation and spectrum association is completed, and metal spectral lines of key components in the barium-tungsten hollow cathode can be identified and separated by means of the method.
Description
Technical Field
The invention belongs to the field of aerospace plasma propulsion, and particularly relates to a metal spectrum identification method and system based on collision radiation and spectrum correlation.
Background
With the rapid development of tasks such as full-electric propulsion satellites, space cargo transportation, north-south maneuver and the like, urgent demands are made on high-power electric propellers, so that the hollow cathode is expected to operate in a high-current working state, and the erosion effect is further aggravated by high-energy ions generated in the hollow cathode. Because of the faintness of this erosion, long erosion test experiments have been conducted for hundreds or even thousands of hours, and this measurement has been limited to only rough testing for the mass and shape profile of the material.
To further reveal this erosion mechanism, it is necessary to elucidate the kinds of the individual erosion atoms. Methods for measuring corrosion products of hollow cathodes by emission spectroscopy have been developed, which can monitor corrosion product atoms of key components inside the hollow cathode, and can quantitatively analyze the corrosion product atoms at the same time, thereby greatly saving manpower and financial resources. However, due to the extremely low content of the corrosion products to be monitored, the emitted spectral lines are very weak and often mixed with the strong spectral lines of the main working medium gas, especially the metal spectral lines of some complex structures are extremely difficult to identify. Aiming at the problem, the invention provides a complex-structure metal spectrum identification method based on a collision radiation mechanism and spectrum correlation analysis, which can accurately identify corrosion products of key components in the electric propulsion hollow cathode, and can well solve a problem of corrosion diagnosis of the hollow cathode by an emission spectrum method.
Disclosure of Invention
Aiming at the difficulty of complex spectrum line identification in diagnosing an erosion product of an air cathode by an emission spectrometry at present, the invention provides a metal spectrum identification method and a system based on collision radiation and spectrum association, which are used for identifying weak metal spectrums mixed in strong spectrum lines by utilizing a spectrum association analysis mode from a collision radiation mechanism generating the emission spectrum; by means of the method, metal spectral lines of key parts in complex structures such as barium-tungsten hollow cathodes can be identified and separated.
The invention is realized by the following technical scheme:
The metal spectrum identification method based on collision radiation and spectrum association comprises the following steps: the method specifically comprises the following steps:
step one, determining the offset of the central wavelength of a spectrum acquired in an experiment;
Under the condition of meeting the offset, comprehensively comparing the intensities of the Einstein emission coefficient A ki, the relative intensity Rel.Int, the upper energy level E k level and the lower energy level E i level to perform primary identification of spectral lines;
And thirdly, regarding the spectral lines of which the offset meets the range determined in the first step but cannot be distinguished according to the second step, focusing on the energy level structure of the spectral lines, finding out other strong spectral lines with the same upper energy level, and further determining whether the spectral lines exist or not so as to complete the metal spectrum identification of the complex structure based on collision radiation and spectrum association.
Further, in a first step, the first step,
Because the PI spectrometer is provided with three gratings with different reticles, the different gratings are switched by the accurate control of a stepping motor in experiments, and the comprehensive influence of vibration and mechanical deformation on the spectrometer can lead to small-angle rotation of an optical axis in a spectrometer optical path system, namely the change of an incident angle and a diffraction angle;
as can be seen from the grating equation nλ=d (sinθ -sini), a nonlinear shift of the center wavelength is eventually caused;
Wherein n is the diffraction order, lambda is the spectral wavelength, d is the grating constant, theta is the incident angle, and i is the diffraction angle;
When the grating plane is deflected by a small shock by an angle alpha, the new wavelength lambda 1 becomes, corresponding to the original diffraction angle spectrum channel:
Wherein lambda 0 is the original wavelength;
The offset caused by small angle rotation of the optical axis is very small, and the relationship of the offset and the intrinsic center wavelength of the original spectrum channel is a quadratic function, so that the change of diffraction orders is not changed, in the experiment, the offset of the center wavelength of the spectrometer is firstly determined by using a standard light source mercury argon lamp, and finally the observed offset is in a certain range;
The light-emitting wavelength of the standard light source mercury-argon lamp is fixed, the light-emitting of the mercury-argon lamp is measured by a spectrometer, the measured spectrum wavelength data is compared with the actual standard mercury-argon lamp data, and the offset of the central wavelength of the spectrometer is determined.
Further, in step two, the emission spectrum line emission intensity is directly determined by the einstein emission coefficient a ki: i ik∝NkAkihνik,hνik＝Ek-Ei; therefore, the spectral line with a larger Einstein emission coefficient has larger relative intensity, and the observed probability in the experiment is also larger;
where I ik is the intensity of the emission line from the upper energy state E k to the lower energy state E i, N k is the number of excited atoms at the upper energy state E k, A ki Einstein emission coefficient, h is the Planckian constant, and v ik is the frequency of the spectrum determined by the upper and lower energy structures.
Further, in step three, for a very strong emission line, a high probability from the same upper energy level will generate a line transition at other wavelengths, and the unrecognized line is further confirmed by searching the lines in the experiment.
Metal spectrum recognition system based on impinging radiation and spectral correlation:
The identification system comprises an acquisition module, a preliminary identification module and an identification supplementing module:
the acquisition module is used for determining the offset of the central wavelength of the spectrum acquired in the experiment;
The primary identification module is used for comprehensively comparing the intensities of the upper energy level E k level and the lower energy level E i level according to the Einstein emission coefficient A ki, the relative intensity Rel.int and the like under the condition of meeting the offset to perform primary identification of spectral lines;
The recognition supplementing module focuses on the energy level structure of the spectral lines which are not distinguished according to the primary recognition module and the offset meets the range determined by the acquisition module, finds out other strong spectral lines with the same upper energy level, and further determines whether the spectral lines exist or not so as to complete the metal spectrum recognition of the complex structure based on collision radiation and spectrum association.
An electronic device comprising a memory storing a computer program and a processor implementing the steps of the above method when the processor executes the computer program.
A computer readable storage medium storing computer instructions which, when executed by a processor, implement the steps of the above method.
The invention has the beneficial effects that
The spectral line identification method is suitable for monitoring metal erosion products (trace products) with complex structures in the electric propulsion field through an emission spectrometry;
aiming at the difficulty of spectral line identification when the corrosion product monitoring in the electric propulsion field is performed by adopting an emission spectrometry at present, the invention can accurately identify the corrosion product of the key component in the electric propulsion hollow cathode from the generation mechanism of the emission spectrum, thereby solving a great difficulty of performing corrosion diagnosis on the hollow cathode by adopting the emission spectrometry.
Drawings
FIG. 1 is a flow chart of the method of the present invention;
Fig. 2 is a schematic representation of the change in angle of incidence and diffraction angle due to small angle deflection of the optical axis of the spectrometer grating according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
With reference to fig. 1-2.
The metal spectrum identification method based on collision radiation and spectrum association comprises the following steps: the method specifically comprises the following steps:
step one, determining the offset of the central wavelength of a spectrum acquired in an experiment;
Because the PI spectrometer is provided with three gratings with different reticles, the structure of the PI spectrometer is very precise by switching the different gratings through the accurate control of a stepping motor, and the accuracy of the spectrometer can be greatly influenced by the change of the mechanical structure caused by any fine vibration; the combined effects of these vibrations and mechanical deformations on the spectrometer can result in small angular rotations of the optical axis in the spectrometer's optical path system, i.e., changes in the angle of incidence and diffraction;
as can be seen from the grating equation nλ=d (sinθ -sini), a nonlinear shift of the center wavelength is eventually caused;
Wherein n is the diffraction order, lambda is the spectral wavelength, d is the grating constant, theta is the incident angle, and i is the diffraction angle;
When the grating plane is deflected by a small shock by an angle alpha, the new wavelength lambda 1 becomes, corresponding to the original diffraction angle spectrum channel:
Wherein lambda 0 is the original wavelength;
the offset caused by small angle rotation of the optical axis is small, and the relationship of the offset and the intrinsic center wavelength of the original spectrum channel is a quadratic function, so that the change of diffraction orders can not be changed, and the offset of the center wavelength of the spectrometer is determined by using a standard light source mercury-argon lamp in an experiment. The final observed offset was in the range of 0.5nm or less.
The light-emitting wavelength of the standard light source mercury-argon lamp is fixed, the light-emitting of the mercury-argon lamp is measured by a spectrometer, the measured spectrum wavelength data is compared with the actual standard mercury-argon lamp data, and the offset of the central wavelength of the spectrometer is determined.
The shift of the spectrum center wavelength collected in the experiment is determined to be less than or equal to 0.5nm through a laboratory standard light source within the range of 780nm-800 nm. Wherein the offset of the xenon atomic line (796.958 nm) is specifically 0.22nm.
Under the condition of meeting the offset, comprehensively comparing the intensities of the Einstein emission coefficient A ki, the relative intensity Rel.Int, the upper energy level E k level and the lower energy level E i level to perform primary identification of spectral lines;
The emission spectrum line emission intensity is directly determined by the einstein emission coefficient a ki: i ik∝NkAkihνik,hνik＝Ek-Ei; therefore, the spectral line with a larger Einstein emission coefficient has larger relative intensity, and the observed probability in the experiment is also larger;
where I ik is the intensity of the emission line from the upper energy state E k to the lower energy state E i, N k is the number of excited atoms at the upper energy state E k, A ki Einstein emission coefficient, h is the Planckian constant, and v ik is the frequency of the spectrum determined by the upper and lower energy structures.
In the second step, the upper and lower energy levels directly reflect the electron energy in the plasma, and the electron energy is almost below 25eV in the normal discharge state for the hollow cathode, so the upper and lower energy levels of the excited atoms caused by the collision excitation of electrons do not exceed the range, which is an important reference point in the spectral line identification.
Preliminary identification of xenon atoms and monovalent xenon ion spectral lines is carried out within the wave bands of 780nm-800 nm. Finally, the line at 790.46nm cannot be further identified.
And thirdly, regarding the spectral lines of which the offset meets the range determined in the first step but cannot be distinguished according to the second step, focusing on the energy level structure on the spectral lines, finding out other strong spectral lines with the same upper energy level by referring to related documents, and further determining whether the spectral lines exist in an experiment so as to further distinguish and identify the spectral lines and finish the metal spectrum identification of the complex structure based on collision radiation and spectrum association.
By referring to the parameters such as the offset of the center wavelength, the Einstein emission coefficient, the relative intensity, the upper and lower energy level and the like, the unrecognizable spectral line is still not identified, and other spectral lines with the same upper energy level structure are found for the unrecognizable possible spectral lines, because for a very strong emission spectral line, spectral line transitions of other wavelengths can be generated from the same upper energy level with high probability, and the unrecognizable spectral line is further confirmed by searching the spectral lines in an experiment.
For lines with a wavelength of 790.46nm, attention is focused on possible atoms: the upper energy level structure of 790.5747nm barium atoms and 790.29nm divalent xenon ions, and other strong spectral lines with the same upper energy level are found by referring to the prior literature.
For barium atoms with a wavelength of 790.5747nm, the upper energy level structure is 6s7s3s1; the other spectral lines with the same upper energy level are 739.2405nm.
For divalent xenon ions with a wavelength of 790.29nm, the upper energy level structure is 5s 25p3(4S0) 6d 3; the other spectral lines with the same upper energy level are 420.239nm.
In the experiment, whether the two spectral lines exist or not is further determined to distinguish and identify, and finally, no spectral line is found near the wavelength of 739.24 +/-0.5 nm, but a weak spectral line exists at the position of 420.528nm, and the difference between the weak spectral line and the bivalent xenon ion with the same upper-level structure of NIST is 0.2nm, so that the 790.46nm spectral line which cannot be identified is well proved to be the bivalent xenon ion.
The method of the invention also successfully identifies carbon atoms and tungsten atoms in the plume of the barium-tungsten hollow cathode, wherein the carbon is mainly sourced from the touch electrode of the cathode, and the tungsten is mainly sourced from the tungsten tip.
The invention can also be extended to the following steps:
Correcting measurement errors: although the shift in center wavelength is determined in step one, the actual measurement process may be affected by a number of factors including, but not limited to, ambient noise, equipment errors, sample non-uniformity, and the like. Thus, to obtain accurate results, the spectrometer may be wavelength corrected by a laser of known wavelength; the background noise correction is achieved by measuring a blank sample to obtain the line of background noise and then subtracting this background line from the line of the actual experiment.
Step five, repeating measurement and verification: by repeating the measurement, the accuracy and stability of the results can be better ensured. Different experimental equipment and conditions can also be used for verification.
Step six, final identification of spectral lines is carried out by using a statistical method: after all data collection and preliminary processing is completed, statistical methods such as principal component analysis, cluster analysis, etc. can be used to make final identification of spectral lines.
Metal spectrum recognition system based on impinging radiation and spectral correlation:
The identification system comprises an acquisition module, a preliminary identification module and an identification supplementing module:
the acquisition module is used for determining the offset of the central wavelength of the spectrum acquired in the experiment;
The primary identification module is used for comprehensively comparing the intensities of the upper energy level E k level and the lower energy level E i level according to the Einstein emission coefficient A ki, the relative intensity Rel.int and the like under the condition of meeting the offset to perform primary identification of spectral lines;
The recognition supplementing module focuses on the energy level structure of the spectral lines which are not distinguished according to the primary recognition module and the offset meets the range determined by the acquisition module, finds out other strong spectral lines with the same upper energy level, and further determines whether the spectral lines exist or not so as to complete the metal spectrum recognition of the complex structure based on collision radiation and spectrum association.
An electronic device comprising a memory storing a computer program and a processor implementing the steps of the above method when the processor executes the computer program.
A computer readable storage medium storing computer instructions which, when executed by a processor, implement the steps of the above method.
The memory in embodiments of the present application may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The nonvolatile memory may be read only memory, ROM, programmable ROM, PROM, erasable programmable ROM erasable PROM, EPROM, electrically erasable programmable ROM, EEPROM or flash memory. The volatile memory can be random access memory random access memory, RAM, which acts as external cache memory. By way of example, and not limitation, many forms of RAM are available, such as static random access memory STATIC RAM, SRAM, dynamic random access memory DYNAMIC RAM, DRAM, synchronous dynamic random access memory DRAM, SDRAM, double data rate synchronous dynamic random access memory doubledata RATE SDRAM, DDR SDRAM, enhanced synchronous dynamic random access memory ENHANCED SDRAM, ESDRAM, synchronous link dynamic random access memory SYNCHLINK DRAM, SLDRAM, and direct memory bus random access memory direct rambus RAM, DR RAM. It should be noted that the memory of the methods described herein is intended to comprise, without being limited to, these and any other suitable types of memory.
In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer instructions are loaded and executed on a computer, the processes or functions described in accordance with embodiments of the present application are produced in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by means of a wired, such as coaxial cable, optical fiber, digital subscriber line digital subscriber line, DSL, or wireless, such as infrared, wireless, microwave, or the like. The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a server, data center, etc. that contains an integration of one or more available media. The usable medium may be a magnetic medium such as a floppy disk, hard disk, magnetic tape, optical medium such as a high-density digital video disc digital video disc, DVD, or semiconductor medium such as a solid state disk solid STATE DISC, SSD, or the like.
In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in a processor or by instructions in the form of software. The steps of a method disclosed in connection with the embodiments of the present application may be embodied directly in a hardware processor for execution, or in a combination of hardware and software modules in the processor for execution. The software modules may be located in a random access memory, flash memory, read only memory, programmable read only memory, or electrically erasable programmable memory, registers, etc. as well known in the art. The storage medium is located in a memory, and the processor reads the information in the memory and, in combination with its hardware, performs the steps of the above method. To avoid repetition, a detailed description is not provided herein.
It should be noted that the processor in the embodiments of the present application may be an integrated circuit chip with signal processing capability. In implementation, the steps of the above method embodiments may be implemented by integrated logic circuits of hardware in a processor or instructions in software form. The processor may be a general purpose processor, a digital signal processor DSP, an application specific integrated circuit ASIC, a field programmable gate array FPGA or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component. The disclosed methods, steps, and logic blocks in the embodiments of the present application may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present application may be embodied directly in the execution of a hardware decoding processor, or in the execution of a combination of hardware and software modules in a decoding processor. The software modules may be located in a random access memory, flash memory, read only memory, programmable read only memory, or electrically erasable programmable memory, registers, etc. as well known in the art. The storage medium is located in a memory, and the processor reads the information in the memory and, in combination with its hardware, performs the steps of the above method.
The metal spectrum recognition method and system based on collision radiation and spectrum association provided by the invention are described in detail, the principle and the implementation mode of the invention are explained, and the above embodiment is only used for helping to understand the method and core idea of the invention; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present invention, the present description should not be construed as limiting the present invention in view of the above.
Claims (6)
1. The metal spectrum identification method based on collision radiation and spectrum association is characterized by comprising the following steps of:
the method specifically comprises the following steps:
step one, determining the offset of the central wavelength of a spectrum acquired in an experiment;
in the first step, since the PI spectrometer is equipped with three gratings with different reticles, in the experiment, the different gratings are switched by precisely controlling the stepper motor, and the comprehensive influence of vibration and mechanical deformation on the spectrometer can cause small-angle rotation of the optical axis in the optical path system of the spectrometer, namely, the change of the incident angle and the diffraction angle;
As can be seen from the grating equation nλ=d (sinθ—sini), a nonlinear shift in the center wavelength is eventually caused;
Wherein n is the diffraction order, lambda is the spectral wavelength, d is the grating constant, theta is the incident angle, and i is the diffraction angle;
When the deflection angle of the grating plane is alpha due to the tiny vibration, the grating plane corresponds to the original diffraction angle spectrum channel, and the new spectrum wavelength lambda 1 after deflection is as follows:
Wherein lambda 0 is the original wavelength;
The offset caused by small angle rotation of the optical axis is very small, and the relationship of the offset and the intrinsic center wavelength of the original spectrum channel is a quadratic function, so that the change of diffraction orders is not changed, in the experiment, the offset of the center wavelength of the spectrometer is firstly determined by using a standard light source mercury argon lamp, and finally the observed offset is in a certain range;
The light-emitting wavelength of the standard light source mercury-argon lamp is fixed, the light-emitting of the mercury-argon lamp is measured by a spectrometer, the measured spectrum wavelength data is compared with the actual standard mercury-argon lamp data, and the offset of the central wavelength of the spectrometer is determined;
Under the condition of meeting the offset, comprehensively comparing the intensities of the Einstein emission coefficient A ki, the relative intensity Rel.Int, the upper energy level E k level and the lower energy level E i level to perform primary identification of spectral lines;
and thirdly, regarding the offset to be within the offset range determined in the first step, but not distinguishing the spectral lines according to the second step, focusing on the energy level structure on the spectral lines, finding out other strong spectral lines with the same upper energy level, and further determining whether the spectral lines exist or not so as to complete the metal spectrum recognition of the complex structure based on collision radiation and spectrum association.
2. The identification method of claim 1, wherein:
In step two, the emission spectrum line emission intensity is directly determined by the einstein emission coefficient a ki: i ik∝NkAkihνik,hνik＝Ek-Ei; therefore, the spectral line with a larger Einstein emission coefficient has larger relative intensity, and the observed probability in the experiment is also larger;
where I ik is the intensity of the emission line from the upper energy state E k to the lower energy state E i, N k is the number of excited atoms at the upper energy state E k, A ki Einstein emission coefficient, h is the Planckian constant, and v ik is the frequency of the spectrum determined by the upper and lower energy structures.
3. The identification method according to claim 2, characterized in that:
in step three, for a very strong emission line, a high probability of spectral line transitions at other wavelengths from the same upper energy level will occur, and the unrecognizable line is further confirmed by searching for these lines in the experiment.
4. A recognition system for performing the method for recognizing a metal spectrum based on collision radiation and spectral correlation as claimed in any one of claims 1 to 3, characterized in that:
The identification system comprises an acquisition module, a preliminary identification module and an identification supplementing module:
the acquisition module is used for determining the offset of the central wavelength of the spectrum acquired in the experiment;
The acquisition module is provided with three gratings with different reticles, different gratings are switched through the accurate control of a stepping motor in experiments, and the comprehensive influence of vibration and mechanical deformation on the spectrometer can cause small-angle rotation of an optical axis in a spectrometer optical path system, namely the change of an incident angle and a diffraction angle;
As can be seen from the grating equation nλ=d (sinθ—sini), a nonlinear shift in the center wavelength is eventually caused;
Wherein n is the diffraction order, lambda is the spectral wavelength, d is the grating constant, theta is the incident angle, and i is the diffraction angle;
When the deflection angle of the grating plane is alpha due to the tiny vibration, the grating plane corresponds to the original diffraction angle spectrum channel, and the new spectrum wavelength lambda 1 after deflection is as follows:
Wherein lambda 0 is the original wavelength;
The offset caused by small angle rotation of the optical axis is very small, and the relationship of the offset and the intrinsic center wavelength of the original spectrum channel is a quadratic function, so that the change of diffraction orders is not changed, and the offset of the center wavelength of the spectrometer is determined by using a standard light source mercury argon lamp in an experiment; the final observed offset is within a certain range; the light-emitting wavelength of the standard light source mercury-argon lamp is fixed, the light-emitting of the mercury-argon lamp is measured by a spectrometer, the measured spectrum wavelength data is compared with the actual standard mercury-argon lamp data, and the offset of the central wavelength of the spectrometer is determined;
The primary identification module is used for comprehensively comparing the intensities of the upper energy level E k level and the lower energy level E i level according to the Einstein emission coefficient A ki, the relative intensity Rel.int and the like under the condition of meeting the offset to perform primary identification of spectral lines;
and the identification supplementing module focuses on the energy level structure of the spectral lines which are not distinguishable according to the primary identification module and the range of which the offset meets the determination of the acquisition module, finds out other strong spectral lines with the same upper energy level, and determines whether the spectral lines exist or not so as to complete metal spectrum identification based on collision radiation and spectrum association.
5. An electronic device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any one of claims 1 to 3 when the computer program is executed.
6. A computer readable storage medium storing computer instructions which, when executed by a processor, implement the steps of the method of any one of claims 1 to 3.
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