CN117408231B - Method and device for converting format of chip test result and electronic equipment - Google Patents
Method and device for converting format of chip test result and electronic equipment Download PDFInfo
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Abstract
The present disclosure provides a format conversion method, a device and an electronic device for a chip test result, wherein a first format template defined with a plurality of basic test parameter fields and corresponding key value types is configured according to preset test result display requirements; acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information; and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file. CSV chip test data in different formats can be unified, and the utilization rate and universality of chip test result data are improved.
Description
Technical Field
The disclosure relates to the technical field of semiconductor testing, and in particular relates to a format conversion method and device of a chip test result and electronic equipment.
Background
Chip testing is the verification and detection of the performance of chip electrical appliances, evaluating the performance of the chip under various environments to ensure that it can work normally under specified operating conditions. The standard format STDF (Standard Test Data File) of the current chip test results, i.e., standard test data files, is a storage specification for chip test data in the semiconductor industry.
However, the STDF is complex in specification, actual data is stored in a binary form in a file, but is not a plaintext character of an ASCII character, a viewing result cannot be directly opened, and specific data can be seen after analysis. Therefore, most semiconductor enterprises often store data into a file in a CSV format, and because the CSV format does not have a standard format at present, test results among enterprises cannot be analyzed and checked by using a set of algorithms, and the problems of low utilization rate and low universality of chip test result data exist.
Disclosure of Invention
The embodiment of the disclosure at least provides a format conversion method, a format conversion device and electronic equipment for chip test results, which can unify CSV chip test data in different formats and improve the utilization rate and universality of the chip test result data.
The embodiment of the disclosure provides a format conversion method of a chip test result, which comprises the following steps:
according to preset test result display requirements, configuring a first format template defined with various basic test parameter fields and corresponding key value types;
acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information;
and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file.
In an optional implementation manner, after the first format template defining multiple basic test parameter fields and corresponding key value types is configured according to the preset test result display requirement, the method further includes:
generating an interactive interface for displaying the corresponding relation between the basic test parameter field and the key value type in the first format template;
providing a file adding control in the interactive interface;
responding to the triggering operation of a user for adding a control to the file, and determining whether the to-be-converted test result file is matched with the first format template;
If not, defining the basic test parameter field according to the header information, and configuring the corresponding first format template.
In an alternative embodiment, the target test result file is generated based on the steps of:
a function field for realizing a field format adjustment function is also defined in the first format template;
Establishing a data structure of the test result data and the corresponding basic test parameter field, and organizing the basic test parameter field into a plurality of data classes, wherein the data classes comprise: header class data, condition class data, and result class data;
executing the function field, and constructing a test result parameter table by taking the basic test parameter field as a table head according to the division of the data class;
And filling the test result data into the column of the corresponding basic test parameter field to generate the target test result file.
In an alternative embodiment, the function field includes a test parameter ignore field and a merge condition field;
the test parameter neglect field is used for defining the basic test parameter field which is not displayed in the target test result file;
And the merging condition field is used for defining data rows needing to be merged in the test result file to be converted.
In an alternative embodiment, when the format of the test result file to be converted does not fit the first format template, the step of configuring the format template further includes:
acquiring the basic test parameter field defined in the first format template;
Defining an association object field reflecting the association relation between the header information and the basic test parameter field according to the header information;
And executing a preset format conversion script according to the associated object field, and configuring a second format template inheriting the format of the first format template.
In an optional implementation manner, the basic test parameter field includes a template matching field carrying multiple test parameters, and the determining whether the header information matches with the basic test parameter field specifically includes:
determining the test parameters corresponding to the header information aiming at each header information;
Comparing the test parameters corresponding to each header information with the test parameters carried in the template matching field;
If the header information is the same, determining that the header information is matched with the first format template;
if the header information is different, determining that the header information is not matched with the first format template.
In an optional implementation manner, the defining the basic test parameter field according to the header information configures the corresponding first format template, and specifically includes:
defining the test parameters corresponding to the header information as the template matching fields;
and configuring the first format template corresponding to the basic test parameter field carrying the template matching field.
The embodiment of the disclosure also provides a format conversion device of a chip test result, which comprises:
The template configuration module is used for displaying requirements according to a preset test result and configuring a first format template defined with various basic test parameter fields and corresponding key value types;
The acquisition module is used for acquiring a to-be-converted test result file, and determining header information in the to-be-converted test result file and test result data included in each header information;
And the test result file generation module is used for filling the test result data into the key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field to generate a target test result file.
The embodiment of the disclosure also provides an electronic device, including: a processor, a memory and a bus, the memory storing machine readable instructions executable by the processor, the processor and the memory communicating over the bus when the electronic device is running, the machine readable instructions when executed by the processor performing the steps of the method of format conversion of chip test results described above, or of any one of the possible embodiments of the method of format conversion of chip test results described above.
The disclosed embodiments also provide a computer readable storage medium having a computer program stored thereon, which when executed by a processor performs the steps of the above-described method of format conversion of chip test results, or any one of the possible implementation manners of the above-described method of format conversion of chip test results.
Embodiments of the present disclosure also provide a computer program product comprising a computer program/instructions which, when executed by a processor, implement the method of format conversion of chip test results described above, or steps in any one of the possible implementations of the method of format conversion of chip test results described above.
According to the format conversion method, the format conversion device and the electronic equipment for the chip test result, according to the preset test result display requirement, a first format template with a plurality of basic test parameter fields and corresponding key value types is configured and defined; acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information; and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file. CSV chip test data in different formats can be unified, and the utilization rate and universality of chip test result data are improved.
The foregoing objects, features and advantages of the disclosure will be more readily apparent from the following detailed description of the preferred embodiments taken in conjunction with the accompanying drawings.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings required for the embodiments are briefly described below, which are incorporated in and constitute a part of the specification, these drawings showing embodiments consistent with the present disclosure and together with the description serve to illustrate the technical solutions of the present disclosure. It is to be understood that the following drawings illustrate only certain embodiments of the present disclosure and are therefore not to be considered limiting of its scope, for the person of ordinary skill in the art may admit to other equally relevant drawings without inventive effort.
FIG. 1 is a flow chart of a method for converting a format of a chip test result according to an embodiment of the disclosure;
FIG. 2 is a flow chart of another method for converting the format of a chip test result provided by an embodiment of the disclosure;
FIG. 3 is a schematic diagram of a format conversion device for chip test results according to an embodiment of the disclosure;
fig. 4 shows a schematic diagram of an electronic device provided by an embodiment of the disclosure.
Detailed Description
For the purposes of making the objects, technical solutions and advantages of the embodiments of the present disclosure more apparent, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is apparent that the described embodiments are only some embodiments of the present disclosure, but not all embodiments. The components of the embodiments of the present disclosure, which are generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present disclosure provided in the accompanying drawings is not intended to limit the scope of the disclosure, as claimed, but is merely representative of selected embodiments of the disclosure. All other embodiments, which can be made by those skilled in the art based on the embodiments of this disclosure without making any inventive effort, are intended to be within the scope of this disclosure.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
The term "and/or" is used herein to describe only one relationship, meaning that there may be three relationships, e.g., a and/or B, which may mean: a exists alone, A and B exist together, and B exists alone. In addition, the term "at least one" herein means any one of a plurality or any combination of at least two of a plurality, for example, including at least one of A, B, C, may mean including any one or more elements selected from the group consisting of A, B and C.
According to research, at present, because the specification of the STDF is complex, actual data is stored in a file in a binary form, but is not a plaintext character of ASCII characters, a viewing result cannot be directly opened, and specific data can be seen after analysis is needed. Therefore, most semiconductor enterprises often store data into a file in a CSV format, and because the CSV format does not have a standard format at present, test results among enterprises cannot be analyzed and checked by using a set of algorithms, and the problems of low utilization rate and low universality of chip test result data exist.
Based on the above researches, the present disclosure provides a format conversion method, apparatus and electronic device for a chip test result, where a first format template defined with multiple basic test parameter fields and corresponding key value types is configured according to preset test result display requirements; acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information; and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file. CSV chip test data in different formats can be unified, and the utilization rate and universality of chip test result data are improved.
For the sake of understanding the present embodiment, first, a detailed description will be given of a method for converting a format of a chip test result disclosed in the present embodiment, where an execution body of the method for converting a format of a chip test result provided in the present embodiment is generally a computer device with a certain computing capability, where the computer device includes, for example: the terminal device, or server or other processing device, may be a User Equipment (UE), mobile device, user terminal, cellular telephone, cordless telephone, personal digital assistant (Personal DIGITAL ASSISTANT, PDA), handheld device, computing device, vehicle mount device, wearable device, or the like. In some possible implementations, the method of format conversion of the chip test results may be implemented by way of a processor invoking computer readable instructions stored in a memory.
Referring to fig. 1, a flowchart of a format conversion method of a chip test result according to an embodiment of the disclosure is shown, where the method includes steps S101 to S103, where:
S101, according to preset test result display requirements, configuring a first format template defined with various basic test parameter fields and corresponding key value types.
In a specific implementation, a csv.template file or an excel.template file is created, and a built-in first format template is defined.
It should be noted that, the first format template is a universal template format defined by the user according to the chip test requirement of the user, and is adapted to different formats of the CSV file.
Here, the first format template is configured with a plurality of basic test parameter fields and a key value type corresponding to each basic test field.
Specifically, the basic test field may include: defining a category field of the template type, wherein the template type between templates is unique; systemic fields of whether the system built-in template is defined, if the system built-in template is the user-defined template, the fields are set to false, and if the system built-in template is the system built-in template, the fields are set to true; template fields column, namely header information in a user test result CSV file of the test result file to be converted; defining an ignore_keys field of a template field to be ignored, i.e., header information not to be displayed on a target test result file, for defining the basic test parameter field not to be displayed in the target test result file; a condition_keys field as a test condition, wherein the algorithm analyzes and converts field contents defined by the condition_keys field into a header of a target test result file list; defining a merge_key field of a data line to be merged in the test result file to be converted, and defining a merge condition in the merge_key field if a plurality of lines are required to be merged into one line in the CSV file.
Further, the basic test field may further include: calculation _keys field, which represents the field that needs to be calculated; a test_num_key field, a field representing a test item number. test_txt_key represents a field of a test item name; a test_value_key field representing a value of a test item; a unit_key field representing a field of a unit of measure; a hi_limit_key field, a field indicating an upper Limit of a test item; a lo_limit_key field, a field representing a lower Limit of a test item; testflow _filter field, a field representing testflow filter conditions; testname _filter field, a field representing testname filter conditions.
It should be noted that, the first format template may be stored through a json structure, where the basic test parameter field cannot be changed, and the corresponding key value type may be configured by itself according to the scenario.
S102, acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information.
In a specific implementation, a to-be-converted test result file in a CSV format is obtained, header information in the CSV file and corresponding test result data in a column where each header information is located are extracted.
As a possible implementation, after step S101, the following steps 1-4 may also be performed:
Step 1, generating an interactive interface for displaying the corresponding relation between the test parameter field and the key value type in the first format template.
And step 2, providing a file adding control in the interactive interface.
And step 3, responding to the triggering operation of a user for adding a control to the file, and determining whether the to-be-converted test result file is matched with the first format template.
And step 4, if the first format templates are not matched, defining the basic test parameter fields according to the header information, and configuring the corresponding first format templates.
In a specific implementation, after the first format template is configured, an interactive interface for displaying the corresponding relation between the test parameter field and the key value type in the first format template is generated, a file adding control is provided in the interactive interface, and a user can select a to-be-converted test result file needing format conversion to be loaded into a file list by triggering the file adding control.
Here, identifying whether a plurality of test parameters defined under the template field columns in the first format template are matched with test parameters corresponding to header information of the test result file to be converted, and if so, indicating that the test result file to be converted can be suitable for format conversion by the first format template.
Wherein the various test parameters defined under the template field columns may include ：TEST_PROGRAM、DEVICE_ID、ECID、LOT_ID、PART_ID、OPERATOR_NAME、TESTER_NAME、TEST_SUITE、SITE、HBIN_PF、START_TIME、END_TIME、CONDITION_SET、TEST_NUM、TEST_TXT、TEST_VALUE、UNITS、HI_LIMIT、LO_LIMIT.
Further, if the matching is unsuccessful, the column fields in the format template are defined by using the test parameters carried by the header information of the test result file to be converted, so as to generate the user-defined format template.
Specifically, for each header information, determining a test parameter corresponding to the header information; comparing the test parameters corresponding to each header information with the test parameters carried in the template matching field; if the header information is the same as the first format template, determining that the header information is matched with the first format template; if the header information is different, determining that the header information is not matched with the first format template. Defining the test parameters corresponding to the header information as template matching fields; and configuring a first format template corresponding to the basic test parameter field carrying the template matching field.
Here, when the built-in template cannot identify the test result file to be converted, the user is supported to manually configure the template, the user is generated after the configuration is completed, and when other test result files to be converted are selected, whether the test result file is matched with the built-in first format template or the user is detected.
Thus, when the to-be-converted test result file with the same header information is processed later, the to-be-converted test result file can be matched with the user-defined format template.
And S103, filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file.
In a specific implementation, a function field for realizing a field format adjustment function is also defined in the first format template; establishing a data structure of test result data and corresponding basic test parameter fields, and organizing the basic test parameter fields into a plurality of data classes, wherein the data classes comprise: header class data, condition class data, and result class data; executing a function field, and constructing a test result parameter table by taking a basic test parameter field as a table head according to the division of the data class; and filling the test result data into the column of the corresponding basic test parameter field to generate a target test result file.
According to the format conversion method of the chip test result, a first format template defined with various basic test parameter fields and corresponding key value types is configured according to preset test result display requirements; acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information; and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file. CSV chip test data in different formats can be unified, and the utilization rate and universality of chip test result data are improved.
Referring to fig. 2, a flowchart of another method for converting a format of a chip test result according to an embodiment of the present disclosure is shown, where the method includes steps S201 to S203, when the format of a test result file to be converted is not adapted to the first format template, another template format configuration is required, where:
S201, acquiring the basic test parameter field defined in the first format template.
S202, defining an association object field reflecting the association relation between the header information and the basic test parameter field according to the header information.
S203, executing a preset format conversion script according to the associated object field, and configuring a second format template inheriting the format of the first format template.
In a specific implementation, the CSV test result file in a special format is converted into the CSV test result file in the basic format by inheriting the first format template of the adaptive basic CSV format object and executing the conversion script.
Here, the template field of the second format template may include: defining a template type heating category field; systemic field defining whether it is built-in template, if the user-defined template, setting the field as false; template fields column define header information in a user test result CSV file; a mapping field defining a connection relationship between header information and a basic test parameter field of the first format template; defining an extended field of the inherited extension object; transformor fields defining the location of the script to be executed; args fields defining parameters of the script to be executed.
It should be noted that, script parameters and script positions corresponding to the execution and conversion script set may be set according to actual needs, which are not limited in particular herein.
According to the format conversion method of the chip test result, a first format template defined with various basic test parameter fields and corresponding key value types is configured according to preset test result display requirements; acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information; and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file. CSV chip test data in different formats can be unified, and the utilization rate and universality of chip test result data are improved.
It will be appreciated by those skilled in the art that in the above-described method of the specific embodiments, the written order of steps is not meant to imply a strict order of execution but rather should be construed according to the function and possibly inherent logic of the steps.
Based on the same inventive concept, the embodiment of the disclosure further provides a format conversion device for a chip test result, which corresponds to the format conversion method for a chip test result, and since the principle of solving the problem of the device in the embodiment of the disclosure is similar to that of the format conversion method for a chip test result in the embodiment of the disclosure, the implementation of the device can refer to the implementation of the method, and the repetition is omitted.
Referring to fig. 3, fig. 3 is a schematic diagram of a format conversion device for a chip test result according to an embodiment of the disclosure. As shown in fig. 3, a format conversion apparatus 300 for chip test results provided by an embodiment of the present disclosure includes:
The template configuration module 310 is configured to configure a first format template defined with a plurality of basic test parameter fields and corresponding key value types according to a preset test result display requirement.
The obtaining module 320 is configured to obtain a to-be-converted test result file, and determine header information in the to-be-converted test result file and test result data included in each header information.
And the test result file generating module 330 is configured to populate the test result data to a key value corresponding to the basic test parameter field according to the matching relationship between the header information and the basic test parameter field, and generate a target test result file.
The process flow of each module in the apparatus and the interaction flow between the modules may be described with reference to the related descriptions in the above method embodiments, which are not described in detail herein.
According to the format conversion device for the chip test result, which is provided by the embodiment of the disclosure, a first format template which is defined with various basic test parameter fields and corresponding key value types is configured according to the preset test result display requirement; acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information; and filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field, and generating a target test result file. CSV chip test data in different formats can be unified, and the utilization rate and universality of chip test result data are improved.
Corresponding to the format conversion method of the chip test result in fig. 1 and fig. 2, the embodiment of the disclosure further provides an electronic device 400, as shown in fig. 4, which is a schematic structural diagram of the electronic device 400 provided in the embodiment of the disclosure, including:
A processor 41, a memory 42, and a bus 43; memory 42 is used to store execution instructions, including memory 421 and external memory 422; the memory 421 is also referred to as an internal memory, and is used for temporarily storing operation data in the processor 41 and data exchanged with the external memory 422 such as a hard disk, and the processor 41 exchanges data with the external memory 422 through the memory 421, and when the electronic device 400 is operated, the processor 41 and the memory 42 communicate through the bus 43, so that the processor 41 performs the steps of the format conversion method of the chip test result in fig. 1 and 2.
The disclosed embodiments also provide a computer readable storage medium having a computer program stored thereon, which when executed by a processor performs the steps of the format conversion method of chip test results described in the method embodiments above. Wherein the storage medium may be a volatile or nonvolatile computer readable storage medium.
The embodiment of the disclosure further provides a computer program product, which includes computer instructions, where the computer instructions, when executed by a processor, may perform the steps of the format conversion method of the chip test result described in the above method embodiment, and specifically, reference may be made to the above method embodiment, which is not repeated herein.
Wherein the above-mentioned computer program product may be realized in particular by means of hardware, software or a combination thereof. In an alternative embodiment, the computer program product is embodied as a computer storage medium, and in another alternative embodiment, the computer program product is embodied as a software product, such as a software development kit (Software Development Kit, SDK), or the like.
It will be clear to those skilled in the art that, for convenience and brevity of description, reference may be made to the corresponding process in the foregoing method embodiment for the specific working process of the apparatus described above, which is not described herein again. In the several embodiments provided in the present disclosure, it should be understood that the disclosed apparatus and method may be implemented in other manners. The above-described apparatus embodiments are merely illustrative, for example, the division of the units is merely a logical function division, and there may be other manners of division in actual implementation, and for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some communication interface, device or unit indirect coupling or communication connection, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present disclosure may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a non-volatile computer readable storage medium executable by a processor. Based on such understanding, the technical solution of the present disclosure may be embodied in essence or a part contributing to the prior art or a part of the technical solution, or in the form of a software product stored in a storage medium, including several instructions to cause a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in the embodiments of the present disclosure. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a read-only memory (ROM), a random access memory (Random Access Memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
Finally, it should be noted that: the foregoing examples are merely specific embodiments of the present disclosure, and are not intended to limit the scope of the disclosure, but the present disclosure is not limited thereto, and those skilled in the art will appreciate that while the foregoing examples are described in detail, it is not limited to the disclosure: any person skilled in the art, within the technical scope of the disclosure of the present disclosure, may modify or easily conceive changes to the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features thereof; such modifications, changes or substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the disclosure, and are intended to be included within the scope of the present disclosure. Therefore, the protection scope of the present disclosure shall be subject to the protection scope of the claims.
Claims (7)
1. A method for converting a format of a chip test result, comprising:
according to preset test result display requirements, configuring a first format template defined with various basic test parameter fields and corresponding key value types;
acquiring a test result file to be converted, and determining header information in the test result file to be converted and test result data included in each header information;
Filling the test result data into a key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field to generate a target test result file;
generating the target test result file based on the steps of:
a function field for realizing a field format adjustment function is also defined in the first format template;
Establishing a data structure of the test result data and the corresponding basic test parameter field, and organizing the basic test parameter field into a plurality of data classes, wherein the data classes comprise: header class data, condition class data, and result class data;
executing the function field, and constructing a test result parameter table by taking the basic test parameter field as a table head according to the division of the data class;
Filling the test result data into the corresponding column of the basic test parameter field to generate the target test result file;
The function field comprises a test parameter neglect field and a merging condition field;
the test parameter neglect field is used for defining the basic test parameter field which is not displayed in the target test result file;
And the merging condition field is used for defining data rows needing to be merged in the test result file to be converted.
2. The method of claim 1, wherein after configuring the first format template defined with a plurality of basic test parameter fields and corresponding key types according to the preset test result display requirements, the method further comprises:
generating an interactive interface for displaying the corresponding relation between the basic test parameter field and the key value type in the first format template;
providing a file adding control in the interactive interface;
responding to the triggering operation of a user for adding a control to the file, and determining whether the to-be-converted test result file is matched with the first format template;
If not, defining the basic test parameter field according to the header information, and configuring the corresponding first format template.
3. The method according to claim 2, wherein the basic test parameter field includes a template matching field carrying a plurality of test parameters, and determining whether the header information matches the basic test parameter field includes:
determining the test parameters corresponding to the header information aiming at each header information;
Comparing the test parameters corresponding to each header information with the test parameters carried in the template matching field;
If the header information is the same, determining that the header information is matched with the first format template;
if the header information is different, determining that the header information is not matched with the first format template.
4. A method according to claim 3, wherein said defining said basic test parameter field according to said header information configures said corresponding first format template, and specifically comprises:
defining the test parameters corresponding to the header information as the template matching fields;
and configuring the first format template corresponding to the basic test parameter field carrying the template matching field.
5. A format conversion device for a chip test result, comprising:
The template configuration module is used for displaying requirements according to a preset test result and configuring a first format template defined with various basic test parameter fields and corresponding key value types;
The acquisition module is used for acquiring a to-be-converted test result file, and determining header information in the to-be-converted test result file and test result data included in each header information;
The test result file generation module is used for filling the test result data into the key value corresponding to the basic test parameter field according to the matching relation between the header information and the basic test parameter field to generate a target test result file;
the test result file generation module is specifically configured to:
a function field for realizing a field format adjustment function is also defined in the first format template;
Establishing a data structure of the test result data and the corresponding basic test parameter field, and organizing the basic test parameter field into a plurality of data classes, wherein the data classes comprise: header class data, condition class data, and result class data;
executing the function field, and constructing a test result parameter table by taking the basic test parameter field as a table head according to the division of the data class;
Filling the test result data into the corresponding column of the basic test parameter field to generate the target test result file;
The function field comprises a test parameter neglect field and a merging condition field;
the test parameter neglect field is used for defining the basic test parameter field which is not displayed in the target test result file;
And the merging condition field is used for defining data rows needing to be merged in the test result file to be converted.
6. An electronic device, comprising: a processor, a memory and a bus, the memory storing machine-readable instructions executable by the processor, the processor and the memory in communication over the bus when the electronic device is running, the machine-readable instructions when executed by the processor performing the steps of the method of format conversion of chip test results according to any one of claims 1 to 4.
7. A computer-readable storage medium, characterized in that the computer-readable storage medium has stored thereon a computer program which, when executed by a processor, performs the steps of the format conversion method of chip test results according to any one of claims 1 to 4.
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