CN117405934A - Electronic component testing arrangement - Google Patents

Electronic component testing arrangement Download PDF

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Publication number
CN117405934A
CN117405934A CN202311316326.0A CN202311316326A CN117405934A CN 117405934 A CN117405934 A CN 117405934A CN 202311316326 A CN202311316326 A CN 202311316326A CN 117405934 A CN117405934 A CN 117405934A
Authority
CN
China
Prior art keywords
electronic component
wire
test
tested
circuit breaker
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202311316326.0A
Other languages
Chinese (zh)
Inventor
曹兵兵
邸云飞
宋成爱
虞国荣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Foretech Elec App Jiangsu Corp ltd
Original Assignee
Foretech Elec App Jiangsu Corp ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Foretech Elec App Jiangsu Corp ltd filed Critical Foretech Elec App Jiangsu Corp ltd
Priority to CN202311316326.0A priority Critical patent/CN117405934A/en
Publication of CN117405934A publication Critical patent/CN117405934A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/006—Calibration or setting of parameters
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/08—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses an electronic component testing device, and belongs to the field of electronic equipment. The test device comprises: base, circuit breaker, mutual inductance fixing base and test fixed plate are installed in the base top, and mutual inductance fixing base is used for installing zero sequence transformer, and the test fixed plate is used for demountable installation electronic component that awaits measuring, and zero sequence transformer's wire is connected with electronic component that awaits measuring, and the tripping coil of circuit breaker is connected with test fixed plate, and the wire that is qualified for next round of competitions of circuit breaker passes zero sequence transformer and is connected with test fixed plate, makes electronic component that awaits measuring pass through test fixed plate and be connected with the circuit breaker. The electronic component to be tested in the test process is simplified in the method, the damage rate of the electronic component to be tested is reduced, the problem that the electronic component can be tested only by assembling the electronic component into the circuit breaker in the prior art, and the electronic component is difficult to assemble and disassemble in the test process, and even the electronic component is possibly damaged in the test process is solved.

Description

Electronic component testing arrangement
Technical Field
The invention belongs to the field of electronic equipment, and particularly relates to an electronic component testing device.
Background
The circuit breaker with residual current protection is one of the most common low-voltage components and mainly used for protecting the life of a person with fatal danger from electric shock when equipment has electric leakage faults, the residual current protection is realized by a system consisting of three continuous functions, residual electric leakage is detected, measurement and comparison are carried out on the residual electric leakage, and a tripping device is started to disconnect a fault circuit.
For circuit breaker manufacturers, the incoming material inspection link of the leakage electronic component is particularly important, and because the electronic component is required to be assembled into the circuit breaker for testing in the prior art, the electronic component is difficult to disassemble and assemble in the testing process, and even the electronic component is possibly damaged in the testing process.
Disclosure of Invention
The invention aims to: the electronic component testing device can test under the condition that the electronic component to be tested is not assembled in the circuit breaker, so that the damage rate of the electronic component to be tested is reduced, the problem that the electronic component is difficult to assemble and disassemble in the testing process and possibly damaged in the testing process because the electronic component is assembled in the circuit breaker in the prior art is solved.
The technical scheme of the invention is as follows: an electronic component testing apparatus includes: base, circuit breaker, mutual inductance fixing base and test fixed plate.
The circuit breaker, the mutual inductance fixing seat and the test fixing plate are arranged above the base.
The mutual inductance fixing seat is used for installing a zero sequence transformer, the test fixing plate is used for detachably installing an electronic component to be tested, and a lead of the zero sequence transformer is connected with the electronic component to be tested.
The tripping coil of the circuit breaker is connected with the test fixing plate, and an outgoing line wire of the circuit breaker passes through the zero sequence transformer to be connected with the test fixing plate, so that the electronic component to be tested is connected with the circuit breaker through the test fixing plate.
In a further embodiment, the test device further comprises: the device comprises a placing groove, a thimble, a quick wire clamp, a quick clamp and a connecting wire.
The utility model discloses a circuit breaker, including test fixed plate, quick clamp, standing groove, ejector pin, quick clamp, connecting wire, ejector pin and circuit breaker, the standing groove is seted up in test fixed plate top, the ejector pin sets up in the standing groove, quick clamp and quick clamp are installed in test fixed plate top, the one end and the ejector pin of connecting wire are connected, and its other end is connected with the tripping coil of circuit breaker.
The position of the thimble corresponds to the position of a coil welding point of the electronic component to be tested.
The position of the quick wire clamp corresponds to the position of a power wire of the electronic component to be tested, and the quick wire clamp is connected with an outgoing wire of the circuit breaker.
The position of the quick clamp is matched with the position of the placing groove, and the quick clamp is used for detachably fixing the electronic component to be tested in the placing groove.
When the electronic component to be measured is arranged in the placing groove, the thimble is detachably connected with the coil welding point of the electronic component to be measured, the quick clamp is detachably connected with the power line of the electronic component to be measured, the quick clamp is detachably connected with the electronic component to be measured, and quick detachable installation of the electronic component to be measured and the test fixing plate can be realized.
In a further embodiment, the test device further comprises: wiring grooves, power supply wires and wire terminals.
The wiring groove is arranged below the test fixing plate, the power supply lead is arranged in the wiring groove, and the lead terminal is arranged at one end of the test fixing plate.
One end of the power wire is connected with the quick wire clamp, the other end of the power wire is connected with the wire terminal, and the wire terminal is connected with an outgoing wire of the circuit breaker, so that the structure of the testing device is compact, and the surface cleanliness of the testing device is improved.
In a further embodiment, the test device further comprises: and the test fixing plate is connected with the base through the fixing column.
In a further embodiment, the test device further comprises: and the foot pad is arranged below the base.
The beneficial effects of the invention are as follows: according to the electronic component to be tested and the circuit breaker, the electronic component to be tested can be detachably mounted through the test fixing plate and connected with the circuit breaker, the electronic component to be tested can be tested under the condition that the electronic component to be tested is not assembled into the circuit breaker, the electronic component to be tested is mounted outside the circuit breaker and is matched with the detachable mounting of the test fixing plate and the electronic component to be tested, the mounting difficulty of the electronic component to be tested in the test process is simplified, the damage rate of the electronic component to be tested is reduced, the problem that the electronic component to be tested is difficult to assemble and disassemble in the test process and even the electronic component is possibly damaged in the test process is solved, and the electronic component to be tested is particularly suitable for a feeding inspection department and other similar scenes.
Drawings
Fig. 1 is a schematic top view of an embodiment of the invention without electronic components to be tested mounted.
Fig. 2 is an isometric view of an embodiment of the invention for mounting an electronic component to be tested.
The reference numerals shown in the figures are: base 1, mutual inductance fixing base 2, test fixed plate 3, quick fastener 4, quick clamp 5, callus on sole 6, thimble 7, zero sequence transformer 8, electronic component 9 that awaits measuring, fixed column 10, inlet wire 11, outlet wire 12, connecting wire 13, wire terminal 14, standing groove 15, circuit breaker 16.
Detailed Description
In the following description, numerous specific details are set forth in order to provide a more thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced without one or more of these details. In other instances, well-known features have not been described in detail in order to avoid obscuring the invention.
The application discloses electronic component testing arrangement, it is used for testing electronic component 9 that awaits measuring, and the zero sequence transformer 8 that is connected with electronic component that awaits measuring, can test under the condition of not assembling electronic component 9 that awaits measuring in circuit breaker 16, reduced the damage rate of electronic component 9 that awaits measuring, solved prior art and need assemble electronic component 9 that awaits measuring in circuit breaker 16 and just can test, there is the difficult dismouting of electronic component 9 that awaits measuring in the test process, probably lead to the problem that awaits measuring electronic component 9 damages at the test process even.
The test device comprises: base 1, circuit breaker 16, mutual inductance fixing base 2 and test fixed plate 3.
The circuit breaker 16, the mutual inductance fixing seat 2 and the test fixing plate 3 are installed above the base 1.
The mutual inductance fixing seat 2 is used for installing a zero sequence transformer 8, the test fixing plate 3 is used for detachably installing an electronic component 9 to be tested, and a lead of the zero sequence transformer 8 is connected with the electronic component 9 to be tested.
The tripping coil of the circuit breaker 16 is connected with the test fixing plate 3, and the outgoing line 12 of the circuit breaker 16 passes through the zero sequence transformer 8 to be connected with the test fixing plate 3, so that the electronic component 9 to be tested is connected with the circuit breaker 16 through the test fixing plate 3.
In this embodiment, the test apparatus further includes: foot pads 6 are provided below the base 1, in this embodiment four foot pads 6 are provided, the four foot pads 6 being provided below the four corner positions of the base 1, respectively.
Regarding the connection of the mutual inductance fixing seat 2 and the related components,
in this embodiment, the test apparatus further includes: the quick clamp comprises a placing groove 15, a thimble 7, a quick clamp 4, a quick clamp 5 and a connecting wire 13.
The standing groove 15 is arranged above the test fixed plate 3, the ejector pin 7 is arranged in the standing groove 15, the quick wire clamp 4 and the quick clamp 5 are arranged above the test fixed plate 3, one end of the connecting wire 13 is connected with the ejector pin 7, and the other end of the connecting wire is connected with a tripping coil of the circuit breaker 16.
The position of the thimble 7 corresponds to the position of a coil welding point of the electronic component 9 to be tested.
The position of the quick wire clamp 4 corresponds to the position of the power line of the electronic component 9 to be tested, the quick wire clamp 4 is connected with the outgoing wire 12 of the circuit breaker 16, and three quick wire clamps 4 are arranged corresponding to three power lines of the electronic component 9 to be tested respectively as shown in fig. 1.
The position of the quick clamp 5 is matched with the position of the placing groove 15, and the quick clamp is used for detachably fixing the electronic component 9 to be tested in the placing groove 15.
When the electronic component 9 to be tested is arranged in the placing groove 15, the thimble 7 is detachably connected with the coil welding point of the electronic component 9 to be tested, the quick clamp 4 is detachably connected with the power line of the electronic component 9 to be tested, and the quick clamp 5 is detachably connected with the electronic component 9 to be tested.
In this embodiment, the detachable connection between the thimble 7 and the coil welding point of the electronic component 9 to be tested is that the thimble 7 abuts against the coil welding point, the detachable connection between the quick wire clamp 4 and the power wire of the electronic component 9 to be tested is that the quick wire clamp 4 clamps the power wire, and the detachable connection between the quick clamp 5 and the electronic component 9 to be tested is that the quick clamp 5 clamps the electronic component 9 to be tested.
The electronic component 9 to be tested is clamped and connected through the quick clamp 5, so that the thimble 7 is propped against the coil welding point, and the power line is clamped and connected through the quick clamp 4, so that the electronic component 9 to be tested and the test fixing plate 3 can be quickly and detachably mounted.
In this embodiment, the test apparatus further includes: wire troughs, power conductors and conductor terminals 14.
The wiring groove is arranged below the test fixing plate 3, the power supply lead is arranged in the wiring groove, and the lead terminal 14 is arranged at one end of the test fixing plate 3.
One end of the power wire is connected with the quick wire clamp 4, the other end of the power wire is connected with the wire terminal 14, and the wire terminal 14 is connected with the outgoing wire 12 of the circuit breaker 16.
Through the cooperation of wiring groove, power wire and wire terminal 14, can make testing arrangement's compact structure, improved testing arrangement's surface neatly degree, avoid the power wire to interfere the dismouting of electronic component 9 that awaits measuring, connect power wire and wire 12 of being qualified for the next round of competitions through wire terminal 14, can make power wire and wire 12 of being qualified for the next round of competitions quick assembly disassembly.
In this embodiment, the test apparatus further includes: the fixed column 10, the test fixed plate 3 is connected with the base 1 through the fixed column 10.
In the present embodiment, four fixing columns 10 are provided, and the four fixing columns 10 are respectively disposed below four corner positions of the test fixing plate 3.
The fixing columns 10 are arranged between the test fixing plate 3 and the base 1 at intervals, so that wiring of the connecting wires 13 and the power supply wires below the test fixing plate 3 can be facilitated.
In connection with the circuit breaker 16,
the circuit breaker 16 is not limited to a structure having the earth leakage circuit breaker 16, but the inside must be equipped with a trip coil.
The circuit breaker 16 includes a circuit breaker 16 body, a trip coil, an incoming wire 11 and an outgoing wire 12.
The trip coil is arranged in the circuit breaker 16 body, the incoming wire 11 and the outgoing wire 12 are connected with the circuit breaker 16 body, the incoming wire 11 is used for being connected with an external residual current test board, the outgoing wire 12 is used for being connected with the test fixing plate 3, and the outgoing wire 12 is a three-phase wire.
Regarding the electronic components 9 to be tested and the zero sequence transformer 8,
the electronic component 9 to be tested and the zero sequence transformer 8 are all detection components, wherein the electronic component 9 to be tested and the zero sequence transformer 8 are connected through wires, the electronic component 9 to be tested comprises a coil welding point and a power wire, and a circuit matched with the zero sequence transformer 8, the coil welding point and the power wire is arranged in the electronic component 9 to be tested.
The coil welding point is used for connecting the tripping coil, and the power wire is used for connecting the three-phase wire.
Working principle: when the functions of the electronic component 9 to be tested and the mutual inductor need to be detected, the following preparation operations are carried out:
the electronic component 9 to be tested is placed in the placing groove 15 of the test fixing plate 3, the quick clamp 5 is operated to fix the electronic component 9 to be tested, and the ejector pin 7 is connected with the coil welding point of the electronic component 9 to be tested.
The power lines of the electronic component 9 to be tested are respectively corresponding to the quick wire clamps 4.
The outgoing lines 12 of the circuit breaker 16 are connected to the test fixture 3 through the zero sequence transformers 8, respectively.
The wires of the zero sequence transformer 8 are connected with the electronic component 9 to be tested.
The incoming line wire 11 of the circuit breaker 16 is connected to a residual current test stand.
And applying residual current on the basis of the operation, wherein the circuit breaker 16 is in a closing position, detecting through the zero sequence transformer 8, measuring the electronic component 9 to be tested, and when the residual current reaches a preset protection value, releasing a tripping signal by the electronic component 9 to be tested to drive a tripping coil in the circuit breaker 16 to trip the circuit breaker 16, wherein the tripping coil indicates that the electronic component 9 to be tested and the zero sequence transformer 8 pass the test.
When the residual current reaches a preset protection value, the electronic component 9 to be tested does not release the tripping signal to drive the tripping coil in the circuit breaker 16 to trip the circuit breaker 16, and the electronic component 9 to be tested and the zero sequence transformer 8 do not pass the test.
As described above, although the present invention has been shown and described with reference to certain preferred embodiments, it is not to be construed as limiting the invention itself. Various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (5)

1. An electronic component testing apparatus, comprising: the device comprises a base, a circuit breaker, a mutual inductance fixing seat and a test fixing plate;
the circuit breaker, the mutual inductance fixing seat and the test fixing plate are arranged above the base;
the mutual inductance fixing seat is used for installing a zero sequence transformer, the test fixing plate is used for detachably installing an electronic component to be tested, and a lead of the zero sequence transformer is connected with the electronic component to be tested;
the tripping coil of the circuit breaker is connected with the test fixing plate, and an outgoing line wire of the circuit breaker passes through the zero sequence transformer to be connected with the test fixing plate, so that the electronic component to be tested is connected with the circuit breaker through the test fixing plate.
2. The electronic component testing apparatus according to claim 1, further comprising: the device comprises a placing groove, a thimble, a quick clamp and a connecting wire;
the test fixture comprises a test fixture plate, a thimble, a quick wire clamp, a quick clamp, a connecting wire, a thimble, a tripping coil, a test wire, a quick clamp, a test wire, a connecting wire, a test wire and a test wire, wherein the placing groove is arranged above the test fixture plate;
the position of the thimble corresponds to the position of a coil welding point of the electronic component to be tested;
the position of the quick wire clamp corresponds to the position of a power wire of the electronic component to be tested, and the quick wire clamp is connected with an outgoing wire of the circuit breaker;
the position of the quick clamp is matched with the position of the placing groove, and the quick clamp is used for detachably fixing the electronic component to be tested in the placing groove;
when the electronic component to be tested is arranged in the placing groove, the thimble is detachably connected with the coil welding point of the electronic component to be tested, the quick clamp is detachably connected with the power line of the electronic component to be tested, and the quick clamp is detachably connected with the electronic component to be tested.
3. An electronic component testing apparatus according to claim 2, further comprising: wiring grooves, power supply wires and wire terminals;
the wiring groove is arranged below the test fixing plate, the power supply lead is arranged in the wiring groove, and the lead terminal is arranged at one end of the test fixing plate;
one end of the power supply wire is connected with the quick wire clamp, the other end of the power supply wire is connected with the wire terminal, and the wire terminal is connected with an outgoing wire of the circuit breaker.
4. The electronic component testing apparatus according to claim 1, further comprising: and the test fixing plate is connected with the base through the fixing column.
5. The electronic component testing apparatus according to claim 1, further comprising: and the foot pad is arranged below the base.
CN202311316326.0A 2023-10-12 2023-10-12 Electronic component testing arrangement Pending CN117405934A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202311316326.0A CN117405934A (en) 2023-10-12 2023-10-12 Electronic component testing arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202311316326.0A CN117405934A (en) 2023-10-12 2023-10-12 Electronic component testing arrangement

Publications (1)

Publication Number Publication Date
CN117405934A true CN117405934A (en) 2024-01-16

Family

ID=89497207

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202311316326.0A Pending CN117405934A (en) 2023-10-12 2023-10-12 Electronic component testing arrangement

Country Status (1)

Country Link
CN (1) CN117405934A (en)

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