CN117384378A - Photosensitive polyamic acid ester resin, resin composition, preparation method and application thereof - Google Patents
Photosensitive polyamic acid ester resin, resin composition, preparation method and application thereof Download PDFInfo
- Publication number
- CN117384378A CN117384378A CN202311396951.0A CN202311396951A CN117384378A CN 117384378 A CN117384378 A CN 117384378A CN 202311396951 A CN202311396951 A CN 202311396951A CN 117384378 A CN117384378 A CN 117384378A
- Authority
- CN
- China
- Prior art keywords
- bis
- acid ester
- polyamic acid
- ester resin
- solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 150000002148 esters Chemical class 0.000 title claims abstract description 82
- 239000011347 resin Substances 0.000 title claims abstract description 82
- 229920005989 resin Polymers 0.000 title claims abstract description 82
- 229920005575 poly(amic acid) Polymers 0.000 title claims abstract description 69
- 239000011342 resin composition Substances 0.000 title claims abstract description 57
- 238000002360 preparation method Methods 0.000 title claims abstract description 35
- 229920001721 polyimide Polymers 0.000 claims abstract description 57
- 150000004985 diamines Chemical class 0.000 claims abstract description 48
- -1 aromatic diester Chemical class 0.000 claims abstract description 37
- 238000004528 spin coating Methods 0.000 claims abstract description 25
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052731 fluorine Inorganic materials 0.000 claims abstract description 21
- 239000011737 fluorine Substances 0.000 claims abstract description 21
- 239000003153 chemical reaction reagent Substances 0.000 claims abstract description 20
- 238000000034 method Methods 0.000 claims abstract description 19
- 238000005886 esterification reaction Methods 0.000 claims abstract description 18
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims abstract description 17
- 239000007787 solid Substances 0.000 claims abstract description 14
- 125000005373 siloxane group Chemical group [SiH2](O*)* 0.000 claims abstract description 13
- 150000004984 aromatic diamines Chemical class 0.000 claims abstract description 11
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 claims abstract description 10
- 150000005690 diesters Chemical class 0.000 claims abstract description 10
- 125000003118 aryl group Chemical group 0.000 claims abstract description 9
- 238000006068 polycondensation reaction Methods 0.000 claims abstract description 8
- 230000032050 esterification Effects 0.000 claims abstract description 7
- 238000002156 mixing Methods 0.000 claims abstract description 6
- 238000004806 packaging method and process Methods 0.000 claims abstract description 6
- 150000001263 acyl chlorides Chemical class 0.000 claims abstract description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 35
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 28
- 238000003756 stirring Methods 0.000 claims description 25
- 239000010410 layer Substances 0.000 claims description 18
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 claims description 15
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 239000003960 organic solvent Substances 0.000 claims description 15
- 239000011248 coating agent Substances 0.000 claims description 14
- 238000000576 coating method Methods 0.000 claims description 14
- 239000002904 solvent Substances 0.000 claims description 14
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 claims description 12
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical group C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 claims description 12
- 238000006116 polymerization reaction Methods 0.000 claims description 12
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 claims description 10
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical group NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 claims description 9
- LIFWPLOFXPGAJJ-UHFFFAOYSA-N 2,6-bis[[4-(diethylamino)phenyl]methylidene]cyclohexan-1-one Chemical compound C1=CC(N(CC)CC)=CC=C1C=C(CCC1)C(=O)C1=CC1=CC=C(N(CC)CC)C=C1 LIFWPLOFXPGAJJ-UHFFFAOYSA-N 0.000 claims description 9
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 claims description 9
- 239000012752 auxiliary agent Substances 0.000 claims description 9
- 238000004132 cross linking Methods 0.000 claims description 9
- 239000003112 inhibitor Substances 0.000 claims description 9
- 239000011229 interlayer Substances 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 8
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 claims description 7
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 claims description 6
- 150000008064 anhydrides Chemical class 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 239000003504 photosensitizing agent Substances 0.000 claims description 6
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical group CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 claims description 6
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 claims description 6
- 125000003837 (C1-C20) alkyl group Chemical group 0.000 claims description 4
- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 claims description 4
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 claims description 4
- VHSHLMUCYSAUQU-UHFFFAOYSA-N 2-hydroxypropyl methacrylate Chemical group CC(O)COC(=O)C(C)=C VHSHLMUCYSAUQU-UHFFFAOYSA-N 0.000 claims description 4
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 claims description 4
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 claims description 4
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 claims description 4
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 claims description 4
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 claims description 4
- CREMABGTGYGIQB-UHFFFAOYSA-N carbon carbon Chemical compound C.C CREMABGTGYGIQB-UHFFFAOYSA-N 0.000 claims description 4
- 239000011203 carbon fibre reinforced carbon Substances 0.000 claims description 4
- 239000003054 catalyst Substances 0.000 claims description 4
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 claims description 4
- KZTYYGOKRVBIMI-UHFFFAOYSA-N diphenyl sulfone Chemical compound C=1C=CC=CC=1S(=O)(=O)C1=CC=CC=C1 KZTYYGOKRVBIMI-UHFFFAOYSA-N 0.000 claims description 4
- 238000001704 evaporation Methods 0.000 claims description 4
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 claims description 4
- 239000001257 hydrogen Substances 0.000 claims description 4
- 229910052739 hydrogen Inorganic materials 0.000 claims description 4
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 claims description 4
- 125000000962 organic group Chemical group 0.000 claims description 4
- CTSLXHKWHWQRSH-UHFFFAOYSA-N oxalyl chloride Chemical compound ClC(=O)C(Cl)=O CTSLXHKWHWQRSH-UHFFFAOYSA-N 0.000 claims description 4
- RPQRDASANLAFCM-UHFFFAOYSA-N oxiran-2-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1CO1 RPQRDASANLAFCM-UHFFFAOYSA-N 0.000 claims description 4
- NWVVVBRKAWDGAB-UHFFFAOYSA-N p-methoxyphenol Chemical compound COC1=CC=C(O)C=C1 NWVVVBRKAWDGAB-UHFFFAOYSA-N 0.000 claims description 4
- AUHHYELHRWCWEZ-UHFFFAOYSA-N tetrachlorophthalic anhydride Chemical compound ClC1=C(Cl)C(Cl)=C2C(=O)OC(=O)C2=C1Cl AUHHYELHRWCWEZ-UHFFFAOYSA-N 0.000 claims description 4
- BMCVSUCDMJFKSZ-UHFFFAOYSA-N (2-hydroxy-3-methoxypropyl) 2-methylprop-2-enoate Chemical compound COCC(O)COC(=O)C(C)=C BMCVSUCDMJFKSZ-UHFFFAOYSA-N 0.000 claims description 2
- JOEWGPALVTUVKQ-UHFFFAOYSA-N (2-hydroxy-3-methoxypropyl) prop-2-enoate Chemical compound COCC(O)COC(=O)C=C JOEWGPALVTUVKQ-UHFFFAOYSA-N 0.000 claims description 2
- HHQAGBQXOWLTLL-UHFFFAOYSA-N (2-hydroxy-3-phenoxypropyl) prop-2-enoate Chemical compound C=CC(=O)OCC(O)COC1=CC=CC=C1 HHQAGBQXOWLTLL-UHFFFAOYSA-N 0.000 claims description 2
- DQOKNNHAZSNFOC-UHFFFAOYSA-N (3-butoxy-2-hydroxypropyl) 2-methylprop-2-enoate Chemical compound CCCCOCC(O)COC(=O)C(C)=C DQOKNNHAZSNFOC-UHFFFAOYSA-N 0.000 claims description 2
- AZNUOOZUBQUQJV-UHFFFAOYSA-N (3-butoxy-2-hydroxypropyl) prop-2-enoate Chemical compound CCCCOCC(O)COC(=O)C=C AZNUOOZUBQUQJV-UHFFFAOYSA-N 0.000 claims description 2
- XUFXKBJMCRJATM-FMIVXFBMSA-N (e)-3-(4-methoxyphenyl)-1-phenylprop-2-en-1-one Chemical compound C1=CC(OC)=CC=C1\C=C\C(=O)C1=CC=CC=C1 XUFXKBJMCRJATM-FMIVXFBMSA-N 0.000 claims description 2
- ZNNRTWIXUUGIFI-UHFFFAOYSA-N 1,5-bis[4-(diethylamino)phenyl]penta-1,4-dien-3-one Chemical compound C1=CC(N(CC)CC)=CC=C1C=CC(=O)C=CC1=CC=C(N(CC)CC)C=C1 ZNNRTWIXUUGIFI-UHFFFAOYSA-N 0.000 claims description 2
- JWTSVUUPJIIXTO-UHFFFAOYSA-N 1,5-bis[4-(dimethylamino)phenyl]penta-1,4-dien-3-one Chemical compound C1=CC(N(C)C)=CC=C1C=CC(=O)C=CC1=CC=C(N(C)C)C=C1 JWTSVUUPJIIXTO-UHFFFAOYSA-N 0.000 claims description 2
- LHBQGXZUVXFJRH-UHFFFAOYSA-N 1-hydroxybut-3-en-2-one Chemical compound OCC(=O)C=C LHBQGXZUVXFJRH-UHFFFAOYSA-N 0.000 claims description 2
- YXAOOTNFFAQIPZ-UHFFFAOYSA-N 1-nitrosonaphthalen-2-ol Chemical compound C1=CC=CC2=C(N=O)C(O)=CC=C21 YXAOOTNFFAQIPZ-UHFFFAOYSA-N 0.000 claims description 2
- WJFKNYWRSNBZNX-UHFFFAOYSA-N 10H-phenothiazine Chemical compound C1=CC=C2NC3=CC=CC=C3SC2=C1 WJFKNYWRSNBZNX-UHFFFAOYSA-N 0.000 claims description 2
- SFXPLYOSNTZJFW-UHFFFAOYSA-N 2,6-bis[[4-(diethylamino)phenyl]methylidene]-4-methylcyclohexan-1-one Chemical compound C1=CC(N(CC)CC)=CC=C1C=C(CC(C)C1)C(=O)C1=CC1=CC=C(N(CC)CC)C=C1 SFXPLYOSNTZJFW-UHFFFAOYSA-N 0.000 claims description 2
- NGNBDVOYPDDBFK-UHFFFAOYSA-N 2-[2,4-di(pentan-2-yl)phenoxy]acetyl chloride Chemical compound CCCC(C)C1=CC=C(OCC(Cl)=O)C(C(C)CCC)=C1 NGNBDVOYPDDBFK-UHFFFAOYSA-N 0.000 claims description 2
- YZTUIKZEIMOMGF-UHFFFAOYSA-N 2-[3-[4-(dimethylamino)phenyl]prop-2-enylidene]-3h-inden-1-one Chemical compound C1=CC(N(C)C)=CC=C1C=CC=C1C(=O)C2=CC=CC=C2C1 YZTUIKZEIMOMGF-UHFFFAOYSA-N 0.000 claims description 2
- YCKZAOPKIOWTEH-UHFFFAOYSA-N 2-[[4-(dimethylamino)phenyl]methylidene]-3h-inden-1-one Chemical compound C1=CC(N(C)C)=CC=C1C=C1C(=O)C2=CC=CC=C2C1 YCKZAOPKIOWTEH-UHFFFAOYSA-N 0.000 claims description 2
- IEVADDDOVGMCSI-UHFFFAOYSA-N 2-hydroxybutyl 2-methylprop-2-enoate Chemical compound CCC(O)COC(=O)C(C)=C IEVADDDOVGMCSI-UHFFFAOYSA-N 0.000 claims description 2
- NJRHMGPRPPEGQL-UHFFFAOYSA-N 2-hydroxybutyl prop-2-enoate Chemical compound CCC(O)COC(=O)C=C NJRHMGPRPPEGQL-UHFFFAOYSA-N 0.000 claims description 2
- GWZMWHWAWHPNHN-UHFFFAOYSA-N 2-hydroxypropyl prop-2-enoate Chemical compound CC(O)COC(=O)C=C GWZMWHWAWHPNHN-UHFFFAOYSA-N 0.000 claims description 2
- SYUYTOYKQOAVDW-UHFFFAOYSA-N 2-nitrosonaphthalen-1-ol Chemical compound C1=CC=C2C(O)=C(N=O)C=CC2=C1 SYUYTOYKQOAVDW-UHFFFAOYSA-N 0.000 claims description 2
- BOKCJGOOHNNDCL-UHFFFAOYSA-N 3-(2-phenylethynyl)aniline Chemical compound NC1=CC=CC(C#CC=2C=CC=CC=2)=C1 BOKCJGOOHNNDCL-UHFFFAOYSA-N 0.000 claims description 2
- BQGXXEGJJMEZMZ-UHFFFAOYSA-N 3-(n-ethyl-3-hydroxy-4-nitrosoanilino)propane-1-sulfonic acid Chemical compound OS(=O)(=O)CCCN(CC)C1=CC=C(N=O)C(O)=C1 BQGXXEGJJMEZMZ-UHFFFAOYSA-N 0.000 claims description 2
- GPXCORHXFPYJEH-UHFFFAOYSA-N 3-[[3-aminopropyl(dimethyl)silyl]oxy-dimethylsilyl]propan-1-amine Chemical compound NCCC[Si](C)(C)O[Si](C)(C)CCCN GPXCORHXFPYJEH-UHFFFAOYSA-N 0.000 claims description 2
- UERPUZBSSSAZJE-UHFFFAOYSA-N 3-chlorophthalic anhydride Chemical compound ClC1=CC=CC2=C1C(=O)OC2=O UERPUZBSSSAZJE-UHFFFAOYSA-N 0.000 claims description 2
- GNSFRPWPOGYVLO-UHFFFAOYSA-N 3-hydroxypropyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCCO GNSFRPWPOGYVLO-UHFFFAOYSA-N 0.000 claims description 2
- QZPSOSOOLFHYRR-UHFFFAOYSA-N 3-hydroxypropyl prop-2-enoate Chemical compound OCCCOC(=O)C=C QZPSOSOOLFHYRR-UHFFFAOYSA-N 0.000 claims description 2
- NICWCCHKIXETCO-UHFFFAOYSA-N 4,5-dibromo-2-benzofuran-1,3-dione Chemical compound BrC1=CC=C2C(=O)OC(=O)C2=C1Br NICWCCHKIXETCO-UHFFFAOYSA-N 0.000 claims description 2
- ODFQRHOQXHVJTQ-UHFFFAOYSA-N 4-(2-phenylethynyl)aniline Chemical compound C1=CC(N)=CC=C1C#CC1=CC=CC=C1 ODFQRHOQXHVJTQ-UHFFFAOYSA-N 0.000 claims description 2
- ZWQOXRDNGHWDBS-UHFFFAOYSA-N 4-(2-phenylphenoxy)aniline Chemical group C1=CC(N)=CC=C1OC1=CC=CC=C1C1=CC=CC=C1 ZWQOXRDNGHWDBS-UHFFFAOYSA-N 0.000 claims description 2
- BOVVHULZWVFIOX-UHFFFAOYSA-N 4-[3-(4-aminophenyl)phenyl]aniline Chemical compound C1=CC(N)=CC=C1C1=CC=CC(C=2C=CC(N)=CC=2)=C1 BOVVHULZWVFIOX-UHFFFAOYSA-N 0.000 claims description 2
- JCRRFJIVUPSNTA-UHFFFAOYSA-N 4-[4-(4-aminophenoxy)phenoxy]aniline Chemical compound C1=CC(N)=CC=C1OC(C=C1)=CC=C1OC1=CC=C(N)C=C1 JCRRFJIVUPSNTA-UHFFFAOYSA-N 0.000 claims description 2
- XUWFAPDKIXEUPR-UHFFFAOYSA-N 4-[[3-[[4-(diethylamino)phenyl]methylidene]cyclopentylidene]methyl]-n,n-diethylaniline Chemical compound C1=CC(N(CC)CC)=CC=C1C=C(CC1)CC1=CC1=CC=C(N(CC)CC)C=C1 XUWFAPDKIXEUPR-UHFFFAOYSA-N 0.000 claims description 2
- AQBFKBMMIDHCFS-UHFFFAOYSA-N 4-bromo-2-benzofuran-1,3-dione Chemical compound BrC1=CC=CC2=C1C(=O)OC2=O AQBFKBMMIDHCFS-UHFFFAOYSA-N 0.000 claims description 2
- BTTRMCQEPDPCPA-UHFFFAOYSA-N 4-chlorophthalic anhydride Chemical compound ClC1=CC=C2C(=O)OC(=O)C2=C1 BTTRMCQEPDPCPA-UHFFFAOYSA-N 0.000 claims description 2
- XESZUVZBAMCAEJ-UHFFFAOYSA-N 4-tert-butylcatechol Chemical compound CC(C)(C)C1=CC=C(O)C(O)=C1 XESZUVZBAMCAEJ-UHFFFAOYSA-N 0.000 claims description 2
- BCKVHOUUJMYIAN-UHFFFAOYSA-N 5-bromo-2-benzofuran-1,3-dione Chemical compound BrC1=CC=C2C(=O)OC(=O)C2=C1 BCKVHOUUJMYIAN-UHFFFAOYSA-N 0.000 claims description 2
- PZNXJCRPOUAPKN-UHFFFAOYSA-N 5-hydroxypent-1-en-3-one Chemical compound OCCC(=O)C=C PZNXJCRPOUAPKN-UHFFFAOYSA-N 0.000 claims description 2
- RZWRYPGAUIOOMK-UHFFFAOYSA-N 5-nitroso-8-quinolinol Chemical compound C1=CN=C2C(O)=CC=C(N=O)C2=C1 RZWRYPGAUIOOMK-UHFFFAOYSA-N 0.000 claims description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 2
- UOTQHOWSLZQYQP-UHFFFAOYSA-N CN(C1=CC=C(C=C1)C=C=C1SC2=C(N1)C=CC=C2)C Chemical compound CN(C1=CC=C(C=C1)C=C=C1SC2=C(N1)C=CC=C2)C UOTQHOWSLZQYQP-UHFFFAOYSA-N 0.000 claims description 2
- DQFBYFPFKXHELB-UHFFFAOYSA-N Chalcone Natural products C=1C=CC=CC=1C(=O)C=CC1=CC=CC=C1 DQFBYFPFKXHELB-UHFFFAOYSA-N 0.000 claims description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 claims description 2
- UBUCNCOMADRQHX-UHFFFAOYSA-N N-Nitrosodiphenylamine Chemical compound C=1C=CC=CC=1N(N=O)C1=CC=CC=C1 UBUCNCOMADRQHX-UHFFFAOYSA-N 0.000 claims description 2
- XQVWYOYUZDUNRW-UHFFFAOYSA-N N-Phenyl-1-naphthylamine Chemical compound C=1C=CC2=CC=CC=C2C=1NC1=CC=CC=C1 XQVWYOYUZDUNRW-UHFFFAOYSA-N 0.000 claims description 2
- 239000002202 Polyethylene glycol Substances 0.000 claims description 2
- KXDCZERDHTYLKY-UHFFFAOYSA-N [2-hydroxy-3-[(2-methylpropan-2-yl)oxy]propyl] prop-2-enoate Chemical compound CC(C)(C)OCC(O)COC(=O)C=C KXDCZERDHTYLKY-UHFFFAOYSA-N 0.000 claims description 2
- 125000003277 amino group Chemical group 0.000 claims description 2
- TWBUZCYRSGERMA-UHFFFAOYSA-N benzo[a]anthracen-1-yl(silyloxy)silane Chemical compound C1(=CC=CC2=CC=C3C=C4C=CC=CC4=CC3=C12)[SiH2]O[SiH3] TWBUZCYRSGERMA-UHFFFAOYSA-N 0.000 claims description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 claims description 2
- LSDYQEILXDCDTR-UHFFFAOYSA-N bis[4-(4-aminophenoxy)phenyl]methanone Chemical compound C1=CC(N)=CC=C1OC1=CC=C(C(=O)C=2C=CC(OC=3C=CC(N)=CC=3)=CC=2)C=C1 LSDYQEILXDCDTR-UHFFFAOYSA-N 0.000 claims description 2
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 claims description 2
- 235000005513 chalcones Nutrition 0.000 claims description 2
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 claims description 2
- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 claims description 2
- 125000002147 dimethylamino group Chemical group [H]C([H])([H])N(*)C([H])([H])[H] 0.000 claims description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims description 2
- SZAZNSHZTGHEOF-UHFFFAOYSA-N ethanol;2-methylpropan-2-amine Chemical compound CCO.CC(C)(C)N SZAZNSHZTGHEOF-UHFFFAOYSA-N 0.000 claims description 2
- SUPCQIBBMFXVTL-UHFFFAOYSA-N ethyl 2-methylprop-2-enoate Chemical group CCOC(=O)C(C)=C SUPCQIBBMFXVTL-UHFFFAOYSA-N 0.000 claims description 2
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 claims description 2
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 claims description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 2
- 238000004377 microelectronic Methods 0.000 claims description 2
- JRXMBBDJETXSIO-UHFFFAOYSA-N n'-[[[(2-aminoethylamino)methyl-dimethylsilyl]oxy-dimethylsilyl]methyl]ethane-1,2-diamine Chemical compound NCCNC[Si](C)(C)O[Si](C)(C)CNCCN JRXMBBDJETXSIO-UHFFFAOYSA-N 0.000 claims description 2
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 claims description 2
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 claims description 2
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 claims description 2
- 229950000688 phenothiazine Drugs 0.000 claims description 2
- 229920001223 polyethylene glycol Polymers 0.000 claims description 2
- 229920001296 polysiloxane Polymers 0.000 claims description 2
- 239000001294 propane Substances 0.000 claims description 2
- PNXMTCDJUBJHQJ-UHFFFAOYSA-N propyl prop-2-enoate Chemical group CCCOC(=O)C=C PNXMTCDJUBJHQJ-UHFFFAOYSA-N 0.000 claims description 2
- 239000011241 protective layer Substances 0.000 claims description 2
- 230000035484 reaction time Effects 0.000 claims description 2
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 claims description 2
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 claims description 2
- DQFBYFPFKXHELB-VAWYXSNFSA-N trans-chalcone Chemical compound C=1C=CC=CC=1C(=O)\C=C\C1=CC=CC=C1 DQFBYFPFKXHELB-VAWYXSNFSA-N 0.000 claims description 2
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 claims description 2
- JKRVKAAJSJWYFT-UHFFFAOYSA-N (3,4-dichlorobenzoyl) 3,4-dichlorobenzoate Chemical compound C1=C(Cl)C(Cl)=CC=C1C(=O)OC(=O)C1=CC=C(Cl)C(Cl)=C1 JKRVKAAJSJWYFT-UHFFFAOYSA-N 0.000 claims 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 claims 1
- 239000005977 Ethylene Substances 0.000 claims 1
- CSCPPACGZOOCGX-UHFFFAOYSA-N acetone Substances CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims 1
- 125000004185 ester group Chemical group 0.000 claims 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims 1
- 125000002816 methylsulfanyl group Chemical group [H]C([H])([H])S[*] 0.000 claims 1
- RZXMPPFPUUCRFN-UHFFFAOYSA-N p-toluidine Chemical class CC1=CC=C(N)C=C1 RZXMPPFPUUCRFN-UHFFFAOYSA-N 0.000 claims 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims 1
- 238000001259 photo etching Methods 0.000 abstract description 3
- 239000010408 film Substances 0.000 description 62
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 27
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 20
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 18
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 14
- 239000004952 Polyamide Substances 0.000 description 14
- 229920002647 polyamide Polymers 0.000 description 14
- 239000002253 acid Substances 0.000 description 13
- RPGGAEJRQFMZOJ-UHFFFAOYSA-N 2-methylprop-2-enoic acid;hydrochloride Chemical compound Cl.CC(=C)C(O)=O.CC(=C)C(O)=O RPGGAEJRQFMZOJ-UHFFFAOYSA-N 0.000 description 11
- 238000011161 development Methods 0.000 description 11
- 150000002923 oximes Chemical class 0.000 description 11
- 238000002834 transmittance Methods 0.000 description 10
- 238000005406 washing Methods 0.000 description 10
- PWMWNFMRSKOCEY-UHFFFAOYSA-N 1-Phenyl-1,2-ethanediol Chemical compound OCC(O)C1=CC=CC=C1 PWMWNFMRSKOCEY-UHFFFAOYSA-N 0.000 description 9
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- 239000004642 Polyimide Substances 0.000 description 9
- 239000008367 deionised water Substances 0.000 description 9
- 229910021641 deionized water Inorganic materials 0.000 description 9
- 229920000642 polymer Polymers 0.000 description 9
- 230000035882 stress Effects 0.000 description 8
- 238000001816 cooling Methods 0.000 description 7
- 238000001914 filtration Methods 0.000 description 7
- 229910052757 nitrogen Inorganic materials 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 238000001291 vacuum drying Methods 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 6
- 239000007788 liquid Substances 0.000 description 5
- 239000009719 polyimide resin Substances 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 239000004020 conductor Substances 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 125000001153 fluoro group Chemical group F* 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000002243 precursor Substances 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 230000008646 thermal stress Effects 0.000 description 3
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 2
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229940116333 ethyl lactate Drugs 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000001878 scanning electron micrograph Methods 0.000 description 2
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 2
- 230000000930 thermomechanical effect Effects 0.000 description 2
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- LWRBVKNFOYUCNP-UHFFFAOYSA-N 2-methyl-1-(4-methylsulfanylphenyl)-2-morpholin-4-ylpropan-1-one Chemical compound C1=CC(SC)=CC=C1C(=O)C(C)(C)N1CCOCC1 LWRBVKNFOYUCNP-UHFFFAOYSA-N 0.000 description 1
- GAIPRQZXSYSCRD-UHFFFAOYSA-N 4,5-dichloro-2-benzofuran-1,3-dione Chemical compound ClC1=CC=C2C(=O)OC(=O)C2=C1Cl GAIPRQZXSYSCRD-UHFFFAOYSA-N 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 1
- 238000004847 absorption spectroscopy Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 150000008366 benzophenones Chemical class 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013039 cover film Substances 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000009878 intermolecular interaction Effects 0.000 description 1
- 230000008863 intramolecular interaction Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- PZYDAVFRVJXFHS-UHFFFAOYSA-N n-cyclohexyl-2-pyrrolidone Chemical compound O=C1CCCN1C1CCCCC1 PZYDAVFRVJXFHS-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920006149 polyester-amide block copolymer Polymers 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229920006009 resin backbone Polymers 0.000 description 1
- 230000007281 self degradation Effects 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1039—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors comprising halogen-containing substituents
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1042—Copolyimides derived from at least two different tetracarboxylic compounds or two different diamino compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1057—Polyimides containing other atoms than carbon, hydrogen, nitrogen or oxygen in the main chain
- C08G73/106—Polyimides containing other atoms than carbon, hydrogen, nitrogen or oxygen in the main chain containing silicon
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2379/00—Characterised by the use of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen, or carbon only, not provided for in groups C08J2361/00 - C08J2377/00
- C08J2379/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08J2379/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
Abstract
The invention discloses a photosensitive polyamic acid ester resin, a resin composition, a preparation method and application thereof. The structural formula of the photosensitive polyamic acid ester resin is shown as formula I, and the preparation method comprises the following steps: s1, carrying out esterification reaction on fluorine-containing aromatic dianhydride and an esterification reagent to obtain fluorine-containing aromatic diester diacid; s2, reacting fluorine-containing aromatic diester diacid with an acyl chloride reagent to obtain corresponding diester diacid chloride; s3, preparing a mixed diamine solution of diamine containing siloxane groups and aromatic diamine; s4, mixing diester diacid chloride, mixed diamine solution and molecular weight regulator,obtaining polyamic acid ester resin solution through polycondensation reaction; separating out solid resin from the polyamic acid ester resin solution. The resin composition solution obtained by the photosensitive polyamic acid ester resin can be obtained by adopting a secondary spin coating process, and a polyimide film with the thickness of more than 50um after pre-baking and more than 30um after thermal imidization can be obtained, so that the resin composition solution can be applied to a thick film photoetching process to realize finer wiring and higher packaging density.
Description
Technical Field
The invention relates to a photosensitive polyamic acid ester resin, a resin composition, a preparation method and application thereof, and belongs to the technical field of polymers.
Background
With the continuous upgrading and updating of electronic products, the emerging markets such as smart phones, 5G, AI and the like have put higher requirements on packaging technologies, and after the ultra-large scale integrated circuit (ULIC) manufacture is completed, many integrated circuit manufacturers continue to manufacture multi-layer metal interconnection circuits on the wafer surface so as to realize BGA, CSP, WLP, siP and other advanced IC packages. Due to the promotion of miniaturization and multilayer technology, the packaging density of hybrid circuits is higher and higher, the conductor lines are finer, the line spacing is narrower, thick film lithography (Thick Film Lithography) is the mainstream, and the thickness of films prepared from photoresist is generally required to be larger than 30um. The multilayer metal interconnection circuit can be manufactured on the surface of the wafer by adopting ultraviolet light technology, and the photosensitive polyimide resin (Photosensitive Polyimides, PSPI) interlayer dielectric insulating layers and the metal copper conductor wiring layers are alternately overlapped.
Because of the strong intermolecular and intramolecular interactions in the conventional polyimide molecular structure, a Charge Transfer Complex (CTC) is easily formed between an electron donor (diamine) and an electron acceptor (dianhydride), and thus, the thin film prepared therefrom has strong light absorption in the visible light region, poor light transmittance, and exhibits characteristic pale yellow or dark brown color. Hoyle et al (C.E.Hoyle, D.Creed, P.Subraamaian.Polym Prep, 1993, 34:369) report that the polymerization of a fluorine-containing diamine with a fluorine-containing dianhydride to form a PI resin decreases the dielectric constant of the polymer as the fluorine content increases. This is because the introduction of fluorine atoms in the PI resin backbone structure reduces the electron polarization effect, and as the fluorine content increases, the free volume fraction of the system increases, causing a linear decrease in the dielectric constant. However, perfluorinated polyimides can lead to polymers with reduced glass transition temperatures and mechanical properties and increased coefficients of thermal expansion.
When the thickness of the polyimide film after high-temperature curing is more than 30um, the thermal stress at high temperature can cause the stripping of the high polymer coating and the inorganic substrate with lower thermal expansion coefficient, and the subsequent packaging process is serious. Therefore, when the polyimide resin is used in an electronic component such as an interlayer insulating film or a cover film, and the electronic component is used in a heat treatment process such as a reflow soldering process, the polyimide resin should have good adhesion to metal and silicon, otherwise, molten tin flows at the delamination place of the dielectric film, resulting in failure of the whole product.
Disclosure of Invention
The invention aims to provide photosensitive polyamic acid ester resin, wherein a resin composition solution obtained by adopting the photosensitive polyamic acid ester resin adopts a secondary spin coating process, so that a polyimide film with the thickness of more than 50um after pre-baking and more than 30um after thermal imidization can be obtained, and the photosensitive polyamic acid ester resin can be applied to a thick film photoetching process to realize finer wiring and higher packaging density.
The polyimide film obtained by the photosensitive polyamic acid ester resin has the characteristics of low dielectric constant (Dk is less than or equal to 2.5) and low dielectric loss (Df is less than or equal to 0.006), and meanwhile, due to the introduction of fluorine atoms, the transparency of the polyimide film is improved, so that the film has excellent i-line transmittance and resolution is improved; the introduction of siloxane groups can reduce internal stress, increase the cohesiveness of polyimide films to metals (copper, aluminum and the like) and silicon, avoid the phenomenon that a high polymer coating and an inorganic substrate with a lower thermal expansion coefficient are peeled off due to thermal stress at high temperature, and ensure that molten tin does not flow when an electronic component is subjected to reflow soldering; a patterned resin film (patterned resin film) can be easily formed by introducing a photosensitive group into a polyimide precursor by an esterification reagent; the resin composition solution obtained by using the photosensitive polyamic acid ester resin can be subjected to a secondary spin coating process to obtain a polyimide film with the thickness of more than 50um after pre-baking and more than 30um after curing.
The structural formula of the photosensitive polyamic acid ester resin provided by the invention is shown as formula I:
in the formula I, X is selected from one of fluorine-containing groups shown in formulas IIa to IId;
Y 1 one of the siloxane-containing groups shown in formulas IIIa to IIId;
Y 2 at least one selected from the groups shown in formulas VIa-VIg;
R 1 and R is 2 Each independently selected from at least one of hydrogen, C1-C20 alkyl, C3-C20 cycloalkyl, and monovalent organic groups having carbon-carbon unsaturated double bonds;
m and n represent polymerization degrees, the value range of m is 30-150, and the value range of n is 0-150, but not 0.
Preferably, R 1 And R is 2 Each independently selected from methyl, ethylAny one of n-propyl, isopropyl, n-butyl, 2-butyl, tert-butyl, n-hexyl, cyclohexyl, ethyl acrylate, ethyl methacrylate, propyl acrylate and 2-hydroxy-n-propyl methacrylate.
The invention provides a preparation method of photosensitive polyamic acid ester resin, which comprises the following steps:
s1, carrying out esterification reaction on fluorine-containing aromatic dianhydride and an esterification reagent to obtain fluorine-containing aromatic diester diacid;
the fluorine-containing aromatic dianhydride is at least one of 4,4'- (hexafluoroisopropenyl) diphthalic anhydride, 2-bis (3, 4-dicarboxyphenyl) hexafluoropropane dianhydride, 4' - (hexafluoroisopropylidene) diphthalic anhydride, (trifluoromethyl) pyromellitic anhydride, 2-bis [4- (3, 4 dicarboxyphenoxy) phenyl ] hexafluoropropane dianhydride and pentafluoroethyl pyromellitic anhydride;
The esterifying reagent is R 1 OH and R 2 OH, wherein R is 1 And R is 2 Each independently selected from at least one of hydrogen, C1-C20 alkyl, C3-C20 cycloalkyl, and monovalent organic groups having carbon-carbon unsaturated double bonds;
s2, reacting the fluorine-containing aromatic diester diacid with an acyl chloride reagent to obtain corresponding diester diacid chloride;
s3, preparing a mixed diamine solution of diamine containing siloxane groups and aromatic diamine;
s4, mixing the diester diacid chloride, the mixed diamine solution and a molecular weight regulator, and performing polycondensation reaction to obtain a polyamic acid ester resin solution;
the solid resin is separated out from the polyamic acid ester resin solution, namely the photosensitive polyamic acid ester resin.
In the above preparation method, in the step S1, the esterification reagent is an alcohol compound containing an unsaturated double bond, and the alcohol compound containing an unsaturated double bond is at least one of 2-acryloyloxy ethanol, 2-acrylamide ethanol, hydroxymethyl vinyl ketone, 1-acryloyloxy-3-propanol, 2-hydroxyethyl vinyl ketone, 2-hydroxy-3-butoxypropyl acrylate, 2-hydroxy-3-methoxypropyl acrylate, 2-hydroxy-3-phenoxypropyl acrylate, 2-hydroxy-3-tert-butoxypropyl acrylate, 2-hydroxy-3-cyclohexyloxy propyl acrylate, 1-methacryloyloxy-3-propanol, 2-methacryloyloxy ethanol, 2-isobutylamide ethanol, 2-hydroxy-3-butoxypropyl methacrylate, and 2-hydroxy-3-methoxypropyl methacrylate;
The esterification reaction is carried out under the action of an alkaline catalyst;
the alkaline catalyst is pyridine or triethylamine;
the esterification reaction is carried out in an organic solvent, wherein the organic solvent is at least one of N-methylpyrrolidone, N-dimethylformamide, N-dimethylacetamide and dimethyl sulfoxide;
the molar ratio of the fluorine-containing aromatic dianhydride to the esterifying reagent is 1:2;
the temperature of the esterification reaction is 20-150 ℃ and the time is 0.5-96 hours;
the esterification reaction is carried out under stirring.
In the above preparation method, in step S2, the molar ratio of the fluorinated aromatic diester diacid to the acid chloride reagent is 1:1.5 to 3;
the acyl chloride reagent is SOCl 2 、PCl 3 、PCl 5 Oxalyl chloride or COCl 2 ;
The reaction temperature is-30-50 ℃ and the reaction time is 1-48 h.
In the above preparation method, in step S3, the diamine containing siloxane groups is 1, 3-bis (3-aminobutyl) -1, 3-tetramethyl polysiloxane, 1, 3-bis (3-aminopropyl) tetramethyl disiloxane, 1, 3-bis (2-aminoethylaminomethyl) tetramethyl disiloxane at least one of 1, 3-bis (3-aminopropyl) -1, 3-tetramethyldisiloxane, 1, 3-bis (3-aminobutyl) -1, 3-tetraphenyldisiloxane;
The aromatic diamine is p-phenylenediamine, 4 '-biphenyl diamine, 4' -diaminodiphenyl ether, 4 '-diaminodiphenyl methane and 4, at least one of 4' -diaminodiphenyl sulfone, 1, 3-bis (4-aminophenyl) benzene, 1, 4-bis (4-aminophenoxy) benzene, 4 '-bis (4-aminophenoxy) biphenyl, 1, 4-bis (4-amino-4, 4' -diisopropylbenzene), 4 '-bis (4-aminophenoxy) diphenyl sulfone, 2' -bis [4- (4-aminophenoxyphenyl) ] propane, 4 '-bis (4-aminophenoxy) diphenyl ether, and 4,4' -bis (4-aminophenoxy) benzophenone;
the molar ratio of the siloxane group-containing diamine to the aromatic diamine is 1:0.1 to 0.5;
the mixed diamine solution was formulated using the following organic solvents: at least one of N-methylpyrrolidone, N-dimethylacetamide, N-dimethylformamide and dimethylsulfoxide;
in the mixed diamine solution, the mass percentage concentration of the diamine containing siloxane groups and the aromatic diamine is 5-35%.
In the above preparation method, in step S4, the molecular weight regulator is at least one of phthalic anhydride, 4-phenylacetylene phthalic anhydride, hydrogenated 4-phthalic anhydride, 3-bromophthalic anhydride, 3-chlorophthalic anhydride, 4-chlorophthalic anhydride, perchlorophthalic anhydride, 4-bromophthalic anhydride, perchlorophthalic anhydride, 3, 4-dibromophthalic anhydride, 3, 4-dichlorophthalic anhydride, 4-phenylethynyl aniline, aniline and 3-phenylethynyl aniline;
The mole ratio of the diester diacid chloride to the mixed diamine is 1:0.8 to 1.2;
the polycondensation reaction temperature is-30-10 ℃ and the time is 0.5-96 h;
the polycondensation reaction comprises the following steps: dripping the organic solution of the diester diacid chloride into the mixed diamine solution for reaction for 5-15 hours after the dripping is finished, and then adding the molecular weight regulator for continuous reaction for 0.5-2 hours to form a polyamic acid ester resin solution;
the molecular weight regulator is used in an amount such that the molar ratio of anhydride groups to amino groups in the final reaction solution is 1:1.
in the above preparation method, in step S4, the polycondensation reaction further includes the following processing steps:
mixing the polyamic acid ester resin solution with a poor solvent to precipitate a solid resin; washing and drying the solid resin to obtain the photosensitive polyamic acid ester resin;
the poor solvent can be deionized water, methanol, ethanol, hexane, butyl cellosolve, toluene, etc., preferably deionized water, methanol or ethanol;
the consumption of the poor solvent is 3-20 times of the mass of the polyamic acid ester resin solution;
the cleaning step is carried out by using the poor solvent used for the precipitation, and the amount of the poor solvent used for the cleaning is preferably 1 to 6 times by mass relative to the polymer; the more the number of times the polymer is washed, the less impurity of the polymer can be obtained. The number of washing is preferably 2 to 6.
The drying is preferably performed under vacuum at 20 to 70 ℃ to obtain a solid polyesteramide resin.
On the basis of the photosensitive polyamic acid ester resin, the invention also provides a resin composition which is prepared from the following components in parts by mass:
100 parts of photosensitive polyamic acid ester resin, 1-10 parts of photoinitiator, 0.01-30 parts of photosensitizer, 0.01-30 parts of polymerization inhibitor, 0.01-30 parts of crosslinking auxiliary agent and 100-1000 parts of organic solvent;
the resin composition preferably comprises the following components in parts by mass:
100 parts of photosensitive polyamic acid ester resin, 3-6 parts of photoinitiator, 1-5 parts of photosensitizer, 0.01-0.1 part of polymerization inhibitor, 5-15 parts of crosslinking auxiliary agent and 100-500 parts of organic solvent;
the resin composition most preferably comprises the following components in parts by mass:
100 parts of the photosensitive polyamic acid ester resin, 5 parts of a photoinitiator, 2 parts of a photosensitizer, 0.075 part of a polymerization inhibitor, 10 parts of a crosslinking auxiliary agent and 200 parts of an organic solvent;
wherein the photoinitiator is at least one of oxime ester compounds (such as 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 2-benzyl-2-dimethylamino-1- (4-morpholinophenyl) butanone, 1-phenyl-1, 2-butanedione-2- (O-methoxycarbonyl) oxime, N '-tetramethyl-4, 4' -diaminobenzophenone, 1, 3-diphenylpropanetrione-2- (O-ethoxycarbonyl) oxime), benzophenone, 2-methyl-1- [4- (methylthio) phenyl ] -2-morpholino-1-propanone; oxime ester compounds and benzophenones are preferred; the oxime ester compound is preferably 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime;
The sensitizer is at least one of Michler's ketone, 4' -bis (diethylamino) benzophenone, 2, 5-bis (4 ' -diethylaminobenzylidene) cyclopentane, 2, 6-bis (4 ' -diethylaminobenzylidene) cyclohexanone, 4' -bis (diethylamino) chalcone, 4' -bis (dimethylamino) chalcone, p-dimethylaminocinnamylidene indanone, p-dimethylaminobenzylidene indanone, 2, 6-bis (4 ' -diethylaminobenzylidene) -4-methylcyclohexanone, 1, 3-bis (4 ' -dimethylaminobenzylidene) acetone, 2- (p-dimethylaminophenyl-biphenylidene) -benzothiazole, 1, 3-bis (4 ' -diethylaminobenzylidene) acetone and 2- (p-dimethylaminophenyl-vinylidene) benzothiazole;
the polymerization inhibitor is at least one of hydroquinone, 4-methoxyphenol, 2, 6-di-tert-butyl-p-methylphenol, phenothiazine, p-tert-butylcatechol, N-phenylnaphthylamine, 5-nitroso-8-hydroxyquinoline, 2-nitroso-1-naphthol, 1-nitroso-2-naphthol, N-nitrosodiphenylamine and 2-nitroso-5- (N-ethyl-sulfopropylamino) phenol;
the cross-linking auxiliary agent is at least one of glycidyl methacrylate, 2-hydroxypropyl methacrylate, 2-hydroxyethyl methacrylate, 2-hydroxymethyl acrylate, 2-hydroxybutyl methacrylate, 2-hydroxypropyl acrylate, 2-hydroxyethyl acrylate, 2-hydroxybutyl acrylate, glycidyl acrylate, ethylene glycol diethyl ether methacrylate, glycidyl acrylate, ethylene glycol diethyl ether acrylate, polyethylene glycol methacrylate and glycidyl methacrylate;
The organic solvent is at least one of N-methyl pyrrolidone, dimethyl sulfoxide, N-dimethyl acetamide and N, N-dimethyl formamide.
The resin composition may be prepared as follows:
and mixing the polyamic acid ester resin, the photoinitiator, the photosensitizer, the polymerization inhibitor, the crosslinking auxiliary agent and the organic solvent, and stirring until a uniform solution is formed, thus obtaining the resin composition.
Preferably, the preparation process is completed in a thousands of ultra-clean room equipped with a yellow light source;
preferably, the addition sequence of the raw materials is as follows: sequentially adding the photosensitive polyamic acid ester resin, the photoinitiator, the photosensitizer, the polymerization inhibitor and the crosslinking auxiliary agent into the organic solvent;
preferably, the preparation process is carried out at room temperature, for example 15-30 ℃, and further for example 25 ℃.
Preferably, the stirring time is 8-72 h;
the solid content of the resin composition provided by the invention is 10-30%, and the apparent viscosity at 25 ℃ is 2000-3 multiplied by 10 5 Cp。
The resin composition is subjected to secondary spin coating to obtain a polyimide film with the thickness of more than 50um after pre-baking and more than 30um after curing; the method comprises the following specific steps:
1) And (3) homogenizing: coating the resin composition on the surface of the substrate at a low rotational speed;
2) Pre-baking: evaporating the solvent in the resin composition to form a first resin coating film with a thickness of 25-35 um;
baking in a hot plate or oven at 80-130 ℃ for 1-60 min;
3) And (3) secondary spin coating: coating the resin composition on the first resin coating film at a high rotational speed;
4) And (5) pre-baking again: evaporating the solvent in the resin composition to form a second resin coating film with the thickness of 50-60 um;
5) Exposing, developing and curing: and exposing, developing and curing in sequence to obtain the polyimide film.
The speed difference between the high speed and the low speed is 1000-1500 rpm/s.
In the above method, the developer and the rinse solution can be used as auxiliaries conventionally used in the prior art. Among them, the developing solution is preferably a good solvent of the negative photosensitive resin composition or a combination of a good solvent and a poor solvent; the good solvent is preferably N-methylpyrrolidone, N-dimethylacetamide, N-cyclohexyl-2-pyrrolidone, cyclopentanone, methyl ethyl ketone, cyclohexanone, methyl isobutyl ketone or gamma-butyrolactone; the poor solvent is preferably methanol, isopropanol, ethanol, ethyl lactate, butyl acetate, ethyl acetate, tetrahydrofuran, propylene glycol monomethyl ether or propylene glycol and methyl ether acetate dioxane; the rinsing liquid is preferably at least one of isopropanol, butyl acetate, ethyl acetate, propylene glycol monomethyl ether, ethyl lactate, propylene glycol monomethyl ether acetate, cyclopentanone and cyclohexanone.
After the resin composition is formed into a cured film, the resin composition layer forming step, the exposure step, and the development treatment step may be sequentially performed again. In particular, the resin composition layer forming step, the exposure step and the development treatment step are preferably performed 2 to 5 times in this order (i.e., 3 to 6 times in total). By laminating the cured films in this manner, a laminate can be obtained. In the present invention, it is particularly preferable that after the cured film is provided and developed, a new metal line is formed by electroplating after the portion removed by the developer, so as to connect the original aluminum pad or gold pad, thereby completing the rewiring layer (Redistribution Layer, RDL).
The polyimide film of the present invention can be used in A1) or A2) as follows:
a1 Preparing an insulating layer film, a dielectric layer film or a stress buffer protective layer film in the microelectronic packaging industry;
a2 Inter-layer dielectric or insulating membrane of the multilayer metal wiring interconnection structure;
specifically, the film is useful as a surface protective film, an interlayer insulating film of a multilayer wiring board, or the like of an electronic component. Among these, it can be particularly suitable for use in the redistribution layer (Redistribution Layer, RDL) process in a package.
The invention also provides an electronic component, comprising the polyimide film;
As the electronic component, there may be mentioned a semiconductor device, a multilayer wiring board, various electronic devices, etc., as shown in fig. 1, the above resin composition solution may be spin-coated on a semiconductor substrate 1 such as a Si substrate by spin coating, and after exposure and development, a polyimide film 2 is obtained, a conductor layer 3 is formed in the exposed window, a polyimide resin film as an interlayer insulating film 4 is formed on the upper surface of 2 by spin coating, etc., a new metal wiring 5 is formed by electroplating in the exposed window on the upper surface 4 after exposure and development, a polyimide resin film as an interlayer insulating film 6 is formed on the upper surface of 5 by spin coating, etc., and after exposure and development, an external connection terminal 7 called a bump is formed in the exposed window on the upper surface 6 by a known method, that is, the electronic component shown in fig. 1 is obtained.
The electronic component has a pattern cured film of the above resin composition solution containing a photosensitive polyamic acid ester resin. Examples of the electronic component include a semiconductor device, a multilayer wiring board, and various electronic devices. Specifically, the pattern cured film can be used as a surface protective film for electronic parts, an interlayer insulating film for a multilayer wiring board, and the like. Among these, it can be particularly suitable for use in the redistribution layer (Redistribution Layer, RDL) process in a package.
The invention has the following beneficial effects:
the resin composition solution obtained by the photosensitive polyamic acid ester resin used in the invention can be obtained by adopting a secondary spin coating process, and a polyimide film with the thickness of more than 50um after pre-baking and more than 30um after thermal imidization can be obtained, so that the resin composition solution can be applied to a thick film photoetching process to realize finer wiring and higher packaging density. The polyimide film has the characteristics of low dielectric constant (Dk is less than or equal to 2.5) and low dielectric loss (Df is less than or equal to 0.006), and meanwhile, due to the introduction of fluorine atoms, the transparency of the polyimide film is improved, so that the film has excellent i-line transmittance and resolution is improved; the introduction of siloxane groups can reduce internal stress, increase the cohesiveness of polyimide films to metals such as copper, aluminum and the like and silicon, avoid the phenomenon that a high polymer coating and an inorganic substrate with a lower thermal expansion coefficient are peeled off due to thermal stress at high temperature, and ensure that molten tin does not flow when an electronic component is subjected to reflow soldering; a photosensitive group is introduced into the polyimide precursor by an esterification reagent, so that a patterned resin film can be easily formed; by heating and curing the pattern resin film, a pattern cured film can be easily formed; meanwhile, through an esterification reagent, polyamide acid is changed into polyamide ester, so that self-degradation of a polyimide precursor is prevented, and the stability and practicability of polyimide are improved.
Drawings
FIG. 1 is a schematic view of the structure of an electronic component comprising a polyimide film of the present invention;
the marks are as follows: 1-a semiconductor substrate; a 2-polyimide layer; a 3-conductor layer; a 4, 6-interlayer insulating film polyimide layer; 5-metal wiring; 7 external connection terminals.
FIG. 2 is a graph showing the transmittance of the polyimide film prepared in example 1 of the present invention.
FIG. 3 is a graph showing the transmittance of the polyimide film prepared in comparative example 3 of the present invention.
Fig. 4 is an SEM image of the polyimide film prepared in example 1 of the present invention.
Detailed Description
The experimental methods used in the following examples are conventional methods unless otherwise specified.
Materials, reagents and the like used in the examples described below are commercially available unless otherwise specified.
In the following examples, the glass transition temperature of polyimide films was measured using dynamic thermo-mechanical analysis (DMA). Dynamic thermo-mechanical analyzer: model Q800 of TA company in the united states.
In the following examples, the residual stress of the cured polyimide film was measured using a film stress measuring instrument (FLX-2320).
In the following examples, adhesion between a film and metal (copper, aluminum, etc.) and silicon was evaluated by a dicing method: every 100 dividing layers of films are stripped off 0 grid by the adhesive tape to be the best, and the films are stripped off 1 to 10 grids by the adhesive tape to be the best; the dicing layer film was peeled off by the tape by more than 11 cells per 100 cells as "bad".
In the following examples, the optical properties of the films were measured using ultraviolet-visible (UV-vis) absorption spectroscopy and a color difference meter, and the film samples were each greater than 50 μm thick, wherein lambda 0 For the initial transmission wavelength, T 365 For light transmittance at 365nm, T 500 Is light transmittance at 500 nm.
Example 1
1. Preparation of photosensitive Polyamic acid ester resins
(1) 89.12g of 4,4' - (hexafluoroisopropenyl) isophthalic anhydride (6 FDA), 52.24g of 2-hydroxyethyl methacrylate (HEMA), 28.44g of pyridine and 232g of N-methylpyrrolidone (NMP) are sequentially added into a 1L three-neck round bottom flask with electric stirring, and stirring is carried out at room temperature for 6-10 hours to generate corresponding 6 FDA-diacid dimethacrylate. The esterified liquid was cooled to below 10℃with an ice bath, and 43.60g SOCl was slowly added dropwise 2 After the dripping is completed for 30min, reacting for 2-4 h at the temperature of 10-20 ℃ to generate the corresponding diacyl chloride dimethacrylate.
(2) Into a 1L three-necked round bottom flask equipped with electric stirring, 39.76g of 1, 3-bis (3-aminopropyl) -1, 3-tetramethyldisiloxane, 4.32g of p-phenylenediamine and 306g of NMP were successively added and stirred to dissolve to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting ice bath, and dropwise adding the prepared mixed diacid chloride dimethacrylate into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands grade super clean room equipped with a yellow light lamp, 40g of the above polyamide acid ester resin, 2.0g of 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 0.8g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-tert-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were added in this order to 80g of NMP, and stirred at room temperature for 10 hours to form a homogeneous negative photosensitive polyamide acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6 inch wafer by using a spin coater, baking at 110 ℃ for 4min to obtain a film with the thickness of 25-35 um, spin-coating again, baking at 110 ℃ for 4min to obtain a film with the thickness of 50-60 um,then placing a mask on the surface of the mask, and exposing for 30s by adopting an ultraviolet lamp (i and g lines); after development with cyclopentanone and ethyl acetate rinse, the temperature was programmed in a nitrogen-filled oven (60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
The transmittance curve of the polyimide film prepared in this example is shown in fig. 2, and the SEM image is shown in fig. 4.
Example 2
1. Preparation of photosensitive Polyamic acid ester resins
Into a 1L three-necked round bottom flask equipped with electric stirring, 32.31 g of 1, 3-bis (3-aminopropyl) -1, 3-tetramethyldisiloxane, 7.56g of p-phenylenediamine and 306g of NMP were sequentially added and stirred to dissolve to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting an ice bath, and dropwise adding the mixed diacid chloride dimethacrylate prepared in the embodiment 1 into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands grade super clean room equipped with a yellow light lamp, 40g of the above polyamide acid ester resin, 2.0g of 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 0.8g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-tert-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were added in this order to 80g of NMP, and stirred at room temperature for 10 hours to form a homogeneous negative photosensitive polyamide acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6 inch wafer by using a spin coater, baking at 110 ℃ for 4min to obtain a film with a thickness of 25-35 um, spin-coating again, baking at 110 ℃ for 4min to obtain a film with a thickness of 50-60 um, and then coating on the surface of the filmPlacing a mask on the surface, and exposing for 30s by adopting an ultraviolet lamp (i and g lines); after development with cyclopentanone and ethyl acetate rinse, the temperature was programmed in a nitrogen-filled oven (60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
Example 3
1. Preparation of photosensitive Polyamic acid ester resins
Into a 1L three-neck round bottom flask with electric stirring, sequentially adding 24.9g of 1, 3-bis (3-aminopropyl) -1, 3-tetramethyldisiloxane, 10.8g of p-phenylenediamine and 306g of NMP, and stirring to dissolve the mixture to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting an ice bath, and dropwise adding the mixed diacid chloride dimethacrylate prepared in the embodiment 1 into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands grade super clean room equipped with a yellow light lamp, 40g of the above polyamide acid ester resin, 2.0g of 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 0.8g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-tert-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were added in this order to 80g of NMP, and stirred at room temperature for 10 hours to form a homogeneous negative photosensitive polyamide acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6-inch wafer by using a spin coater, baking for 4min at 110 ℃ to obtain a film with the thickness of 25-35 um, spin-coating again, baking for 4min at 110 ℃ to obtain a film with the thickness of 50-60 um, placing a mask on the surface, and exposing for 30s by using an ultraviolet lamp (i and g lines); developing with cyclopentanone, washing with ethyl acetate, and heating in nitrogen-filled oven with programmed temperature(60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
Example 4
1. Preparation of photosensitive Polyamic acid ester resins
Into a 1L three-necked round bottom flask equipped with electric stirring, 40.48g of 1, 3-bis (3-aminobutyl) -1, 3-tetramethyldisiloxane, 4.32g of p-phenylenediamine and 306g of NMP were sequentially added, and stirred to dissolve to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting an ice bath, and dropwise adding the mixed diacid chloride dimethacrylate prepared in the embodiment 1 into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands grade super clean room equipped with a yellow light lamp, 40g of the above polyamide acid ester resin, 2.0g of 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 0.80g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-tert-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were added in this order to 80g of NMP, and stirred at room temperature for 10 hours to form a homogeneous negative photosensitive polyamide acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6-inch wafer by using a spin coater, baking for 4 min at 110 ℃ to obtain a film with the thickness of 25-35 um, spin-coating again, baking for 4 min at 110 ℃ to obtain a film with the thickness of 50-60 um, placing a mask on the surface, and exposing for 30s by using an ultraviolet lamp (i and g lines); after development with cyclopentanone and ethyl acetate rinse, the temperature was programmed in a nitrogen-filled oven (60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
Comparative example 1,
1. Preparation of Polyamic acid ester resins
(1) Into a 1L three-necked round bottom flask equipped with electric stirring, 62.05g of 3,3', 4' -biphenylene oxide tetracarboxylic dianhydride (ODPA), 52.24g of 2-hydroxyethyl methacrylate (HEMA), 28.44g of pyridine and 232g of N-methylpyrrolidone (NMP) were successively added, and stirred at room temperature for 6 hours to give the corresponding ODPA-diacid dimethacrylate. The esterified liquid was cooled to below 10℃with an ice bath, and 43.60g SOCl was slowly added dropwise 2 After the dripping is completed for 30min, reacting for 2-4 h at the temperature of 10-20 ℃ to generate the corresponding diacyl chloride dimethacrylate.
(2) Into a 1L three-necked round bottom flask equipped with electric stirring, 39.76g of 1, 3-bis (3-aminopropyl) -1, 3-tetramethyldisiloxane, 4.32g of p-phenylenediamine and 306g of NMP were successively added and stirred to dissolve to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting ice bath, and dropwise adding the prepared mixed diacid chloride dimethacrylate into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands grade super clean room equipped with a yellow light lamp, 40g of the above polyamide acid ester resin, 2.0g of 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 0.8g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-tert-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were added in this order to 80g of MP, and stirred at room temperature for 10 hours to form a homogeneous negative photosensitive polyamide acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6 inch wafer by using a spin coater, baking at 110deg.C for 4 min to obtain a film with a thickness of 25-35 um, spin-coating again, and heating at 110deg.CBaking for 4 min to obtain a film with the thickness of 50-60 um, then placing a mask on the surface of the film, and exposing for 30s by adopting an ultraviolet lamp (i and g lines); after development with cyclopentanone and ethyl acetate rinse, the temperature was programmed in a nitrogen-filled oven (60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
Comparative example 2,
1. Preparation of photosensitive Polyamic acid ester resins
(1) Into a 1L three neck round bottom flask equipped with electric stirring, 89.12g of 4,4' - (hexafluoroisopropenyl) isophthalic anhydride (6 FDA), 52.24g of 2-hydroxyethyl methacrylate (HEMA), 28.44g of pyridine and 232g of N-methylpyrrolidone (NMP) were sequentially added, and stirred at room temperature for 6 hours to yield the corresponding 6 FDA-diacid dimethacrylate. The esterified liquid was cooled to below 10℃with an ice bath, and 43.60g SOCl was slowly added dropwise 2 After the dripping is completed for 30min, reacting for 2-4 h at the temperature of 10-20 ℃ to generate the corresponding diacyl chloride dimethacrylate.
(2) Into a 1L three-necked round bottom flask equipped with an electric stirring and compressed air (CDA) inlet and outlet, 36.06g of 4,4' -diaminodiphenyl ether (ODA), 2.16g of p-phenylenediamine and 306g of NMP were sequentially added, and stirred to dissolve to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting ice bath, and dropwise adding the prepared mixed diacid chloride dimethacrylate into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands grade super clean room equipped with a yellow light lamp, 40g of the above polyamide acid ester resin, 2.0g of 1-phenyl-1, 2-propanedione-2- (O-ethoxycarbonyl) oxime, 0.8g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-tert-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were added in this order to 80g of NMP, and stirred at room temperature for 10 hours to form a homogeneous negative photosensitive polyamide acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6-inch wafer by using a spin coater, baking for 4min at 110 ℃ to obtain a film with the thickness of 25-35 um, spin-coating again, baking for 4min at 110 ℃ to obtain a film with the thickness of 50-60 um, placing a mask on the surface, and exposing for 30s by using an ultraviolet lamp (i and g lines); after development with cyclopentanone and ethyl acetate rinse, the temperature was programmed in a nitrogen-filled oven (60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
Comparative example 3,
1. Preparation of Polyamic acid ester resins
(1) Into a 1L three-necked round bottom flask equipped with an electric stirring and compressed air (CDA) inlet and outlet were successively charged 62.05g of 3,3', 4' -biphenylene oxide tetracarboxylic dianhydride (ODPA), 52.24g of 2-hydroxyethyl methacrylate (HEMA), 28.44g of pyridine and 232g of N-methylpyrrolidone (NMP), and stirred at room temperature for 6 hours to give the corresponding ODPA-diacid dimethacrylate. The esterified liquid was cooled to below 10℃with an ice bath, and 43.60g SOCl was slowly added dropwise 2 After the dripping is completed for 30min, reacting for 2-4 h at the temperature of 10-20 ℃ to generate the corresponding diacyl chloride dimethacrylate.
(2) Into a 1L three-necked round bottom flask equipped with an electric stirring and compressed air (CDA) inlet and outlet, 36.06g of 4,4' -diaminodiphenyl ether (ODA), 2.16g of p-phenylenediamine and 306g of NMP were sequentially added, and stirred to dissolve to form a homogeneous transparent mixed diamine solution; cooling the mixed diamine solution to below 10 ℃ by adopting ice bath, and dropwise adding the prepared mixed diacid chloride dimethacrylate into the mixed diamine solution for 1h; then restoring the room temperature, and reacting for 12-16 hours at the room temperature; adding 12ml of ethanol, and continuously stirring for 1h; slowly pouring the reaction solution into 5L of deionized water to precipitate solid, and washing, filtering and vacuum drying to obtain the polyamic acid ester resin.
2. Preparation of polyamic acid ester resin composition solution
In a thousands of ultra clean room equipped with a yellow light lamp, 40g of the above polyamic acid ester resin, 0.6g of 2-propanedione-2- (O-methoxycarbonyl) oxime, 0.10g of 2, 6-bis (4' -diethylaminobenzylidene) cyclohexanone, 0.03g of 2, 6-di-t-butyl-p-methylphenol, 4.0g of 2-hydroxyethyl methacrylate were successively added to 80g of NMP, and stirred at room temperature for 3 hours to form a homogeneous negative photosensitive polyamic acid ester resin composition solution.
3. Preparation of polyimide film
Spin-coating the negative photosensitive polyamic acid ester resin composition solution on the surface of a 6-inch wafer by using a spin coater, baking for 4min at 110 ℃ to obtain a film with the thickness of 25-35 um, spin-coating again, baking for 4min at 110 ℃ to obtain a film with the thickness of 50-60 um, placing a mask on the surface, and exposing for 30s by using an ultraviolet lamp (i and g lines); after development with cyclopentanone and ethyl acetate rinse, the temperature was programmed in a nitrogen-filled oven (60 o C/1h,80 o C/1h,120 o C/1h,170 o C/1h,250 o C/1h,300 o C/1h,350 o C/1 h) to obtain a polyimide film.
The transmittance curve of the polyimide film prepared in this comparative example is shown in fig. 3.
As can be seen from examples 1 to 4, comparative examples 1, 2, 3 and tables 1 and 2, as the proportion of diamine containing siloxane groups in the resin decreases (examples 1 to 3 decrease in order), the stress of the resin film gradually increases and the adhesion to metal and silicon becomes poor. The resin film containing only the fluorine aromatic dianhydride and the aromatic diamine has a low dielectric constant, but the film has high stress and poor adhesion to metal and silicon; the resin film which is composed of the fluorine-free aromatic dianhydride, the siloxane group-containing diamine and other aromatic diamines has small stress and good adhesion with metal and silicon, but has a dielectric constant higher than 3. The fluorine-containing resin film has high light transmittance at 365nm and 500nm and low yellow index.
Claims (14)
1. A photosensitive polyamic acid ester resin has a structural formula shown in a formula I:
;
in the formula I, X is selected from one of fluorine-containing groups shown in formulas IIa to IId;
;
Y 1 one of the siloxane-containing groups shown in formulas IIIa to IIId;
;
Y 2 at least one selected from the groups shown in formulas VIa-VIg;
;
R 1 and R is 2 Each independently selected from at least one of hydrogen, C1-C20 alkyl, C3-C20 cycloalkyl, and monovalent organic groups having carbon-carbon unsaturated double bonds;
m and n represent polymerization degrees, the value range of m is 30-150, and the value range of n is 0-150, but not zero.
2. The photosensitive polyamic acid ester resin according to claim 1, wherein: r is R 1 And R is 2 Each independently selected from methyl, ethyl, n-propyl, isopropyl, n-butyl, 2-butyl, t-butyl, n-hexyl, cyclohexyl, ethylene acrylateAny one of an ester group, an ethyl methacrylate group, a propyl acrylate group, and a 2-hydroxy-n-propyl methacrylate group.
3. The method for preparing the photosensitive polyamic acid ester resin according to claim 1 or 2, comprising the steps of:
s1, carrying out esterification reaction on fluorine-containing aromatic dianhydride and an esterification reagent to obtain fluorine-containing aromatic diester diacid;
the fluorine-containing aromatic dianhydride is at least one of 4,4'- (hexafluoroisopropenyl) diphthalic anhydride, 2-bis (3, 4-dicarboxyphenyl) hexafluoropropane dianhydride, 4' - (hexafluoroisopropylidene) diphthalic anhydride, (trifluoromethyl) pyromellitic anhydride, 2-bis [4- (3, 4 dicarboxyphenoxy) phenyl ] hexafluoropropane dianhydride and pentafluoroethyl pyromellitic anhydride;
The esterifying reagent is R 1 OH and R 2 OH, wherein R is 1 And R is 2 Each independently selected from at least one of hydrogen, C1-C20 alkyl, C3-C20 cycloalkyl, and monovalent organic groups having carbon-carbon unsaturated double bonds;
s2, reacting the fluorine-containing aromatic diester diacid with an acyl chloride reagent to obtain corresponding diester diacid chloride;
s3, preparing a mixed diamine solution of diamine containing siloxane groups and aromatic diamine;
s4, mixing the diester diacid chloride, the mixed diamine solution and a molecular weight regulator, and performing polycondensation reaction to obtain a polyamic acid ester resin solution;
the solid resin is separated out from the polyamic acid ester resin solution, namely the photosensitive polyamic acid ester resin.
4. A method of preparation according to claim 3, characterized in that: in the step S1, the esterifying reagent is an alcohol compound containing unsaturated double bonds, and the alcohol compound containing unsaturated double bonds is at least one of 2-acryloyloxy ethanol, 2-acrylamide ethanol, hydroxymethyl vinyl ketone, 1-acryloyloxy-3-propanol, 2-hydroxyethyl vinyl ketone, 2-hydroxy-3-butoxypropyl acrylate, 2-hydroxy-3-methoxypropyl acrylate, 2-hydroxy-3-phenoxypropyl acrylate, 2-hydroxy-3-tert-butoxypropyl acrylate, 2-hydroxy-3-cyclohexyloxy propyl acrylate, 1-methacryloyloxy-3-propanol, 2-methacryloyloxy ethanol, 2-isobutylamide ethanol, 2-hydroxy-3-butoxypropyl methacrylate and 2-hydroxy-3-methoxypropyl methacrylate;
The esterification reaction is carried out under the action of an alkaline catalyst;
the alkaline catalyst is pyridine or triethylamine;
the esterification reaction is carried out in an organic solvent, wherein the organic solvent is at least one of N-methylpyrrolidone, N-dimethylformamide, N-dimethylacetamide and dimethyl sulfoxide;
the molar ratio of the fluorine-containing aromatic dianhydride to the esterifying reagent is 1:2;
the temperature of the esterification reaction is 20-150 ℃ and the time is 0.5-96 hours;
the esterification reaction is carried out under stirring.
5. The method according to claim 3 or 4, wherein: in the step S2, the molar ratio of the fluorinated aromatic diester diacid to the acid chloride reagent is 1:1.5 to 3;
the acyl chloride reagent is SOCl 2 、PCl 3 、PCl 5 Oxalyl chloride or COCl 2 ;
The reaction temperature is-30-50 ℃ and the reaction time is 1-48 h.
6. The method of manufacturing according to claim 5, wherein: in the step S3 of the process, the diamine containing siloxane groups is 1, 3-bis (3-aminobutyl) -1, 3-tetramethyl polysiloxane, 1, 3-bis (3-aminopropyl) tetramethyl disiloxane, 1, 3-bis (2-aminoethylaminomethyl) tetramethyl disiloxane at least one of 1, 3-bis (3-aminopropyl) -1, 3-tetramethyldisiloxane and 1, 3-bis (3-aminobutyl) -1, 3-tetraphenyldisiloxane;
The aromatic diamine is p-phenylenediamine, 4 '-biphenyl diamine, 4' -diaminodiphenyl ether, 4 '-diaminodiphenyl methane, 4' -diaminodiphenyl sulfone, 1, 3-bis (4-aminophenyl) benzene, 1, 4-bis (4-aminophenoxy) benzene, 4 '-bis (4-aminophenoxy) biphenyl, and at least one of 1, 4-bis (4-amino-4, 4' -diisopropylbenzene), 4 '-bis (4-aminophenoxy) diphenylsulfone, 2' -bis [4- (4-aminophenoxyphenyl) ] propane, 4 '-bis (4-aminophenoxy) diphenylether, and 4,4' -bis (4-aminophenoxy) benzophenone;
the molar ratio of the siloxane group-containing diamine to the aromatic diamine is 1:0.1 to 0.5;
the mixed diamine solution was formulated using the following organic solvents: at least one of N-methylpyrrolidone, N-dimethylacetamide, N-dimethylformamide and dimethylsulfoxide;
in the mixed diamine solution, the mass percentage concentration of the diamine containing siloxane groups and the aromatic diamine is 5-35%.
7. The method of manufacturing according to claim 6, wherein: in the step S4, the molecular weight regulator is at least one of phthalic anhydride, 4-phenylacetylene phthalic anhydride, hydrogenated 4-methylaniline, 3-bromophthalic anhydride, 3-chlorophthalic anhydride, 4-chlorophthalic anhydride, perchlorophthalic anhydride, 4-bromophthalic anhydride, perchlorophthalic anhydride, 3, 4-dibromophthalic anhydride, 3, 4-dichlorobenzoic anhydride, 4-phenylethynyl aniline, aniline and 3-phenylethynyl aniline;
The mole ratio of the diester diacid chloride to the mixed diamine is 1:0.8 to 1.2;
the polycondensation reaction temperature is-30-10 ℃ and the time is 0.5-96 h;
the polycondensation reaction comprises the following steps: dripping the organic solution of the diester diacid chloride into the mixed diamine solution for reaction for 5-15 hours after the dripping is finished, and then adding the molecular weight regulator for continuous reaction for 0.5-2 hours to form a polyamic acid ester resin solution;
the molecular weight regulator is used in an amount such that the molar ratio of anhydride groups to amino groups in the final reaction solution is 1:1.
8. a resin composition is prepared from the following components in parts by mass:
100 parts of the photosensitive polyamic acid ester resin according to claim 1 or 2, 1 to 10 parts of a photoinitiator, 0.01 to 30 parts of a sensitizer, 0.01 to 30 parts of a polymerization inhibitor, 0.01 to 30 parts of a crosslinking auxiliary agent and 100 to 1000 parts of an organic solvent.
9. The resin composition according to claim 8, wherein: the photoinitiator is at least one of oxime ester compound, diphenyl ketone and 2-methyl-1- [4- (methylthio) phenyl ] -2-morpholinyl-1-acetone;
the sensitizer is at least one of Michler's ketone, 4' -bis (diethylamino) benzophenone, 2, 5-bis (4 ' -diethylaminobenzylidene) cyclopentane, 2, 6-bis (4 ' -diethylaminobenzylidene) cyclohexanone, 4' -bis (diethylamino) chalcone, 4' -bis (dimethylamino) chalcone, p-dimethylaminocinnamylidene indanone, p-dimethylaminobenzylidene indanone, 2, 6-bis (4 ' -diethylaminobenzylidene) -4-methylcyclohexanone, 1, 3-bis (4 ' -dimethylaminobenzylidene) acetone, 2- (p-dimethylaminophenyl-biphenylidene) -benzothiazole, 1, 3-bis (4 ' -diethylaminobenzylidene) acetone and 2- (p-dimethylaminophenyl-vinylidene) benzothiazole;
The polymerization inhibitor is at least one of hydroquinone, 4-methoxyphenol, 2, 6-di-tert-butyl-p-methylphenol, phenothiazine, p-tert-butylcatechol, N-phenylnaphthylamine, 5-nitroso-8-hydroxyquinoline, 2-nitroso-1-naphthol, 1-nitroso-2-naphthol, N-nitrosodiphenylamine and 2-nitroso-5- (N-ethyl-sulfopropylamino) phenol;
the cross-linking auxiliary agent is at least one of glycidyl methacrylate, 2-hydroxypropyl methacrylate, 2-hydroxyethyl methacrylate, 2-hydroxymethyl acrylate, 2-hydroxybutyl methacrylate, 2-hydroxypropyl acrylate, 2-hydroxyethyl acrylate, 2-hydroxybutyl acrylate, glycidyl acrylate, ethylene glycol diethyl ether methacrylate, glycidyl acrylate, ethylene glycol diethyl ether acrylate, polyethylene glycol methacrylate and glycidyl methacrylate;
the organic solvent is at least one of N-methyl pyrrolidone, dimethyl sulfoxide, N-dimethyl acetamide and N, N-dimethyl formamide.
10. A method for producing the resin composition according to claim 8 or 9, comprising the steps of:
mixing the photosensitive polyamic acid ester resin according to claim 1 or 2, the photoinitiator, the photosensitizer, the polymerization inhibitor, the crosslinking auxiliary agent and the organic solvent, and stirring to form a uniform solution, thus obtaining the resin composition.
11. A polyimide film obtained from the resin composition according to claim 8 or 9 by secondary spin coating.
12. The method for producing a polyimide film according to claim 11, comprising the steps of:
1) And (3) homogenizing: coating the resin composition on the surface of the substrate at a low rotational speed;
2) Pre-baking: evaporating the solvent in the resin composition to form a first resin coating film with a thickness of 25-35 um;
3) And (3) secondary spin coating: coating the resin composition on the first resin coating film at a high rotational speed;
4) And (5) pre-baking again: evaporating the solvent in the resin composition to form a second resin coating film with the thickness of 50-60 um;
5) Exposing, developing and curing: sequentially exposing, developing and curing to obtain a polyimide film;
the speed difference between the high speed and the low speed is 1000-1500 rpm/s.
13. Use of the polyimide film according to claim 11 in A1) or A2) as follows:
a1 Preparing an insulating layer film, a dielectric layer film or a stress buffer protective layer film in the microelectronic packaging industry;
a2 Inter-layer dielectric or insulating separator for multilayer metal wiring interconnection structure.
14. An electronic component comprising the polyimide film of claim 11.
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