CN117367963B - Radar chip test system with convenient operation terminal - Google Patents
Radar chip test system with convenient operation terminal Download PDFInfo
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- CN117367963B CN117367963B CN202311406923.2A CN202311406923A CN117367963B CN 117367963 B CN117367963 B CN 117367963B CN 202311406923 A CN202311406923 A CN 202311406923A CN 117367963 B CN117367963 B CN 117367963B
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- 238000012360 testing method Methods 0.000 title claims abstract description 83
- 239000007788 liquid Substances 0.000 claims abstract description 83
- 238000012544 monitoring process Methods 0.000 claims abstract description 16
- 238000011161 development Methods 0.000 claims description 5
- 229920006395 saturated elastomer Polymers 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 17
- 238000001125 extrusion Methods 0.000 abstract description 14
- 238000001514 detection method Methods 0.000 abstract description 4
- 230000001360 synchronised effect Effects 0.000 abstract description 3
- 239000002775 capsule Substances 0.000 description 6
- 230000000630 rising effect Effects 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/062—Special adaptations of indicating or recording means with mechanical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/067—Parameter measured for estimating the property
- G01N2203/0676—Force, weight, load, energy, speed or acceleration
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
Abstract
The invention relates to a radar chip testing system with a convenient operation terminal, wherein through the arrangement of a force monitoring module, when the radar chip testing system is used for detecting, a limiting module can firstly generate extrusion force for the force monitoring module in the process of approaching a chip to be detected, and a plurality of liquid change pipes can gradually generate liquid level change in the process of gradually approaching the chip to be detected, so that the extrusion condition of a limiting component to the chip to be detected can be displayed and monitored in real time, the limiting force can be effectively ensured to be reduced under the condition of stable extrusion limiting, the chip to be detected is protected from being deformed due to the detection process, the quality of the chip to be detected is not easily affected, and meanwhile, in the detection process, whether the stress of the chip is uniform is judged by observing whether the changes on display rows at two sides are synchronous or not, and the protection of the chip to be detected is further improved.
Description
Technical Field
The invention relates to a radar chip testing system, in particular to a radar chip testing system with a convenient operation terminal, which is applied to the field of chip testing.
Background
With the continuous development of electronic technology, light and thin electronic devices gradually become a trend of industry pursuit. As the thickness of electronic devices becomes thinner, the available design space for chips disposed on the internal motherboard becomes smaller, which results in the problem that the chips are prone to fracture under mechanical stress.
Therefore, in order to provide a chip meeting the strength requirement on the motherboard of the electronic device, the strength of the chip needs to be detected in advance. In the process of detecting the chip, in order to ensure the stability of the chip, the limiting component is required to be used for limiting the chip in an extrusion mode, and the extrusion limiting force cannot be too large due to the light and thin of the chip, otherwise, the chip is easy to deform, the subsequent normal use is affected, the extrusion limiting force is small, the stability of the mounting is low, and the test result is affected when the test is easily caused.
Content of the application
Aiming at the prior art, the invention aims to solve the technical problems that the limiting force is difficult to control during testing and a certain problem is generated when the limiting force is too large and too small.
In order to solve the problems, the invention provides a radar chip testing system with a convenient operation terminal, which comprises a testing terminal, wherein the testing terminal comprises a bottom plate, a testing circuit board arranged in the bottom plate and a limiting assembly arranged on the bottom plate, a testing program is carried in the testing circuit board, the testing system is connected with a PC end, a testing groove is cut at the upper end of the bottom plate, a chip to be tested is matched with the testing groove, the limiting assembly comprises a limiting total plate and a plurality of electric push rods respectively arranged between the limiting total plate and the bottom plate, the limiting total plate comprises a top plate, a hard pressing plate fixedly connected to the lower end of the top plate and an elastic sheet fixedly connected to the lower end of the hard pressing plate, the elastic sheet is positioned right above the testing groove, and a force monitoring module is further arranged on a testing base and corresponds to the limiting assembly; the force monitoring module comprises two display rows which are symmetrical with respect to the test groove, each display row comprises a cross rod fixedly connected to the upper end of the bottom plate, a plurality of layer-level semi-bags fixedly connected to the upper end of the cross rod respectively, and a plurality of liquid changing pipes fixedly connected to the lower end of the cross rod, wherein the liquid changing pipes correspond to the layer-level semi-bags respectively, the liquid changing pipes are in fold line shapes, the bottoms of the liquid changing pipes fixedly penetrate through the bottom plate, and one ends of the liquid changing pipes, far away from the cross rod, extend to the upper portion of the bottom plate.
In the radar chip test system with the convenient operation terminal, through the setting of the force monitoring module, when detecting, the suppression power of limiting component to the chip that awaits measuring can be displayed and monitored in real time, and then effectively guarantee under the spacing circumstances of stable extrusion, reduce spacing dynamics, the chip that awaits measuring is difficult for taking place deformation because of the testing process, is difficult for influencing its quality.
As a further improvement of the application, one end of the liquid changing pipe close to the cross rod is fixedly penetrated through the cross rod and communicated with the level semi-bag, and the transverse length of the top plate is smaller than the distance between the liquid changing pipes at the two sides of the test groove.
As a further improvement of the present application, the heights of the plurality of hierarchical semi-capsules are different, and the heights of the plurality of hierarchical semi-capsules gradually decrease along the direction from both sides to the middle.
As a further improvement of the application, the plurality of level half bags are filled with the color developing liquid in a saturated manner, the color developing liquid extends into the liquid changing pipe, and the height of the liquid level of the color developing liquid in the liquid changing pipe is higher than the top of the level half bag.
As a further improvement of the application, the hierarchical semi-capsule and the liquid changing pipe are both transparent structures, and the hierarchical semi-capsule is of a semi-ellipsoidal structure.
As a further improvement of the application, the liquid changing pipe comprises a concave pipe positioned in the cross rod and the bottom plate, an outer vertical pipe fixedly connected with the upper end of the concave pipe, and a plurality of outer convex rings respectively fixedly connected with the upper ends of the outer vertical pipes, wherein a liquid matching strip is fixedly connected between two corresponding outer convex rings on two adjacent outer vertical pipes.
As a further improvement of the application, the convex cambered surface structure of the convex ring is a color straight thin line for the liquid strip.
As a further improvement of the application, after the chip is arranged in the test groove, the upper end face of the chip is higher than the upper end of the cross bar, and the upper end face of the chip is lower than the top of the lowest level half-capsule, and the thickness of the elastic sheet is consistent with the minimum distance between the top of the chip and the top of the level half-capsule.
As a further improvement of the application, the upper end of the bottom plate is also provided with a pressure sensor, and the stress end of the pressure sensor is level with the upper end of the chip in the test groove.
In general, through the setting of power monitoring module, when detecting, spacing module can produce the extrusion force to power monitoring module earlier in the in-process that is close to the chip that awaits measuring, in the in-process that is close to the chip that awaits measuring gradually, a plurality of liquid pipes that become can produce liquid level variation gradually, and then can show in real time and monitor spacing subassembly to the extrusion condition of chip that awaits measuring, and then effectively guarantee under the spacing circumstances of stable extrusion, reduce spacing dynamics, the chip that awaits measuring is difficult for taking place deformation because of the testing process, be difficult for influencing its quality, simultaneously in the testing process, whether the change on the display row of both sides is synchronous through observing, judge whether the chip atress is even, further improve the protection of treating the chip.
Drawings
FIG. 1 is a system diagram of a first embodiment of the present application;
FIG. 2 is an exploded view of a test terminal according to a first embodiment of the present application;
FIG. 3 is a perspective view of a test terminal with a limiting plate removed according to a first embodiment of the present application;
FIG. 4 is a top perspective view of a test terminal according to a first embodiment of the present application;
FIG. 5 is a side view of a test terminal according to a first embodiment of the present application;
FIG. 6 is a left side perspective view of a display row according to a first embodiment of the present application;
FIG. 7 is a right side perspective view of a display row according to a first embodiment of the present application;
FIG. 8 is a schematic side view of a display section according to a first embodiment of the present application;
FIG. 9 is a schematic view of a section of a portion of a liquid change tube according to a first embodiment of the present application;
Fig. 10 is a schematic view showing the change of the liquid level in the liquid change pipe according to the first embodiment of the present application.
The reference numerals in the figures illustrate:
1 bottom plate, 2 electric putter, 31 roof, 32 hard clamp plate, 33 elastic sheet, 4 horizontal poles, 5 become liquid pipe, 6 level half bags, 7 pairs of liquid strips, 51 indent pipe, 52 outer standpipe, 53 outer bulge loop.
Detailed Description
Two embodiments of the present application will be described in detail with reference to the accompanying drawings.
First embodiment:
Fig. 1 shows a radar chip testing system with a convenient operation terminal, in which a represents a chip, and the chip testing system comprises a testing terminal, wherein the testing terminal comprises a bottom plate 1, a testing circuit board installed in the bottom plate 1 and a limiting component installed on the bottom plate 1, a testing program is carried in the testing circuit board, and the testing system is connected with a PC end.
As shown in fig. 2-4, a test slot is cut at the upper end of the bottom plate 1, a chip to be tested is matched with the test slot, the limiting assembly comprises a limiting total plate and a plurality of electric push rods 2 which are respectively installed between the limiting total plate and the bottom plate 1, the limiting total plate comprises a top plate 31, a hard pressing plate 32 fixedly connected to the lower end of the top plate 31 and an elastic sheet 33 fixedly connected to the lower end of the hard pressing plate 32, as shown in fig. 5, the elastic sheet 33 is located right above the test slot, a force monitoring module is further arranged on the test base, and the force monitoring module corresponds to the limiting assembly.
As shown in fig. 6-7, the force monitoring module comprises two display rows symmetrical about the test slot, the display rows comprise a cross bar 4 fixedly connected to the upper end of the bottom plate 1, a plurality of layer half bags 6 respectively fixedly connected to the upper end of the cross bar 4, and a plurality of liquid changing pipes 5 fixedly connected to the lower end of the cross bar 4, the plurality of liquid changing pipes 5 respectively correspond to the layer half bags 6, the layer half bags 6 and the liquid changing pipes 5 are transparent structures, so that workers can observe the change of the liquid level of the internal color development liquid conveniently, the layer half bags 6 are semi-ellipsoidal structures, the liquid changing pipes 5 are fold-line-shaped, the bottom of the liquid changing pipes 5 fixedly penetrate through the bottom plate 1, one end of each liquid changing pipe 5 far away from the cross bar 4 extends to the upper part of the bottom plate 1, one end of the liquid changing pipe 5, which is close to the cross rod 4, is fixedly penetrated through the cross rod 4 and is communicated with the level semi-bags 6, the plurality of level semi-bags 6 are filled with color developing liquid in a saturated manner, the color developing liquid extends into the liquid changing pipe 5, the height of the color developing liquid level in the liquid changing pipe 5 is higher than the top of the level semi-bags 6, before detection, a chip to be detected is firstly installed in a test groove to be connected with a test circuit board, then the connection is established with a PC end, then the electric push rod 2 is controlled to be shortened, the limiting total plate gradually moves downwards and extrudes and limits the chip, the chip to be detected is stably connected with the test groove, then the test program starts to test the chip, and the test result is displayed at the PC end.
The transverse length of the top plate 31 is smaller than the distance between the liquid changing pipes 5 at two sides of the test groove, so that the display rows at two sides are not easy to influence the up-and-down movement of the limiting total plate.
The heights of the plurality of layer-level semi-bags 6 are different, and the heights of the plurality of layer-level semi-bags 6 gradually decrease along the direction from two sides to the middle, so that when the limiting total plate is gradually close to a chip, the plurality of layer-level semi-bags 6 are gradually extruded from two sides to the middle, the liquid levels on the plurality of liquid changing pipes 5 are gradually increased one by one, according to the change condition of the liquid levels on the plurality of liquid changing pipes 5, whether the hard pressing plate 32 and the elastic sheet 33 are in contact with the chip or not and the approximate distance from the chip can be timely known, when the liquid level on the liquid changing pipe 5 in the middle begins to change, the elastic sheet 33 is indicated to be in contact with the chip, the limiting total plate begins to generate extrusion force on the chip, at the moment, the electric push rod 2 can be continuously and properly shortened, the stable limiting of the chip can be ensured, meanwhile, the pressing force is not too large, compared with the situation that the chip is directly extruded and limited in the prior art, the chip is not prone to being suddenly deformed, and the chip is not prone to deformation.
As shown in fig. 8, after the chip is installed in the test slot, the upper end surface of the chip is higher than the upper end of the cross bar 4, and the upper end surface of the chip is lower than the top of the lowest level semi-bag 6, the thickness of the elastic sheet 33 is consistent with the minimum distance between the top of the chip and the top of the level semi-bag 6, when the elastic sheet 33 just contacts the surface of the chip, the hard pressing plate 32 just contacts the top of the middle lowest level semi-bag 6, in the continuous shortening process of the electric push rod 2, the liquid level at the position of the liquid changing pipe 5 can rise, and the rising of the liquid level on the liquid changing pipe 5 can indicate the start of the stress of the chip, the rising amplitude of the liquid level can indicate the stress of the chip, and in the test, visual indication of the chip stress condition of an image can be visually played to the staff, and under the condition that the chip is stably pressed and limited can be ensured, the limited force received is not easy to be too large, and the chip is not easy to deform can be protected.
As shown in fig. 9-10, the liquid changing pipe 5 comprises an inner concave pipe 51 positioned in the cross rod 4 and the bottom plate 1, an outer vertical pipe 52 fixedly connected with the upper end of the inner concave pipe 51, and a plurality of outer convex rings 53 respectively fixedly connected with the upper ends of the outer vertical pipes 52, wherein the arrangement of the plurality of outer convex rings 53 is equivalent to scales, so that the change of the liquid level on the same liquid changing pipe 5 can be intuitively known, the liquid strips 7 are fixedly connected between the two corresponding outer convex rings 53 on the two adjacent outer vertical pipes 52, the cambered surface structures of the convex rings 53 are outwards protruded, the liquid strips 7 are thin lines with color and straightness, and when the liquid levels of the plurality of liquid changing pipes 5 change, the liquid levels on the adjacent liquid changing pipes 5 can be effectively shifted for indication, thereby facilitating the comparison of the relative change condition of the liquid levels on the two liquid changing pipes 5 by staff, and facilitating the analysis and judgment of the downward movement condition of the limiting total plate by the staff.
In sum, through the setting of power monitoring module, when detecting, spacing module can produce the extrusion force to power monitoring module earlier in the in-process that is close to the chip that awaits measuring, in the in-process that is close to the chip that awaits measuring gradually, a plurality of liquid pipes 5 that become can produce the liquid level change gradually, and then can show in real time and monitor spacing subassembly and to the extrusion condition of chip that awaits measuring, and then effectively guarantee under the spacing circumstances of stable extrusion, reduce spacing dynamics, the chip that awaits measuring is difficult for taking place deformation because of the testing process, be difficult for influencing its quality, simultaneously in the testing process, whether the change through observing both sides demonstration row is synchronous, judge whether the chip atress is even, further improve the protection of treating the chip.
Second embodiment:
The present embodiment is the same as the first embodiment except that the following is added to the first embodiment.
The pressure sensor is still installed to bottom plate 1 upper end, and pressure sensor's atress end and test tank chip upper end parallel and level each other, in the test process, cooperation pressure sensor makes this test but remote control, and during each time test, the staff need not to observe the change of becoming liquid pipe 5 in test terminal department all the time, has both effectively reduced staff's work load, simultaneously effectively reduces the input of cost of labor.
In the first embodiment, the related structure for monitoring the stress of the chip is still reserved, so that the functions can be observed simultaneously in two modes, the use convenience is higher, when the system is in error or other unexpected conditions in remote test, the test can be continued manually, the test process is not easily affected, and after the problem occurs, obvious abnormality can be found visually when the detection is carried out again on site, and the on-site maintenance is convenient.
In addition, the two pressure sensors can be arranged and respectively positioned at two sides of the test groove, and whether the stress of the chip is consistent can be judged according to whether the pressure data of the two pressure sensors change when the pressure sensors are pressed down, so that the chip is further protected, and the chip is not easily damaged due to overlarge local parts.
The present application is not limited to the above-described embodiments, which are adopted in connection with the actual demands, and various changes made by the person skilled in the art without departing from the spirit of the present application are still within the scope of the present application.
Claims (9)
1. A radar chip test system with a convenient operation terminal is characterized in that: the test terminal comprises a bottom plate (1), a test circuit board arranged in the bottom plate (1) and a limit assembly arranged on the bottom plate (1), wherein a test program is carried in the test circuit board, a test system is connected with a PC end, a test groove is cut at the upper end of the bottom plate (1), a chip to be tested is matched with the test groove, the limit assembly comprises a limit total plate and a plurality of electric push rods (2) respectively arranged between the limit total plate and the bottom plate (1), the limit total plate comprises a top plate (31), a hard pressing plate (32) fixedly connected to the lower end of the top plate (31) and an elastic sheet (33) fixedly connected to the lower end of the hard pressing plate (32), the elastic sheet (33) is positioned right above the test groove, a force monitoring module is further arranged on the bottom plate (1), and the force monitoring module corresponds to the limit assembly;
The force monitoring module comprises two display rows which are symmetrical with respect to the test groove, each display row comprises a cross rod (4) fixedly connected to the upper end of the bottom plate (1), a plurality of level semi-bags (6) fixedly connected to the upper end of the cross rod (4) respectively, and a plurality of liquid changing pipes (5) fixedly connected to the lower end of the cross rod (4), wherein the liquid changing pipes (5) correspond to the level semi-bags (6) respectively, the liquid changing pipes (5) are in a fold line shape, the bottoms of the liquid changing pipes (5) fixedly penetrate through the bottom plate (1), and one ends, far away from the cross rod (4), of the liquid changing pipes (5) extend to the upper portion of the bottom plate (1).
2. The radar chip testing system with portable operation terminal according to claim 1, wherein: one end of the liquid changing pipe (5) close to the cross rod (4) is fixedly penetrated through the cross rod (4) and communicated with the level semi-bag (6), and the transverse length of the top plate (31) is smaller than the distance between the liquid changing pipes (5) at two sides of the test groove.
3. The radar chip testing system with portable operation terminal according to claim 1, wherein: the heights of the hierarchical semi-bags (6) are different, and the heights of the hierarchical semi-bags (6) gradually decrease along the direction from two sides to the middle.
4. A radar chip testing system with a portable operating terminal as claimed in claim 3, wherein: the plurality of the level semi-bags (6) are filled with color development liquid in a saturated mode, the color development liquid extends into the liquid change pipe (5), and the height of the liquid level of the color development liquid in the liquid change pipe (5) is higher than the top of the level semi-bags (6).
5. The radar chip testing system with portable operation terminal according to claim 4, wherein: the level semi-bag (6) and the liquid changing pipe (5) are transparent structures, and the level semi-bag (6) is of a semi-ellipsoidal structure.
6. The radar chip testing system with portable operation terminal according to claim 5, wherein: the liquid changing pipe (5) comprises a concave pipe (51) positioned in the cross rod (4) and the bottom plate (1), an outer vertical pipe (52) fixedly connected with the upper end of the concave pipe (51) and a plurality of outer convex rings (53) respectively fixedly connected with the upper end of the outer vertical pipe (52), and a liquid matching strip (7) is fixedly connected between two corresponding outer convex rings (53) on two adjacent outer vertical pipes (52).
7. The radar chip testing system with portable operation terminal according to claim 6, wherein: the convex ring (53) has a convex cambered surface structure, and the pair of liquid strips (7) are thin lines with color straightening.
8. The radar chip testing system with portable operation terminal according to claim 7, wherein: after the chip is arranged in the test groove, the upper end face of the chip is higher than the upper end of the cross rod (4), the upper end face of the chip is lower than the top of the lowest level semi-bag (6), and the thickness of the elastic sheet (33) is consistent with the minimum distance between the top of the chip and the top of the level semi-bag (6).
9. The radar chip testing system with portable operation terminal according to claim 1, wherein: the upper end of the bottom plate (1) is also provided with a pressure sensor, and the stress end of the pressure sensor is level with the upper end of the chip in the test groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311406923.2A CN117367963B (en) | 2023-10-27 | 2023-10-27 | Radar chip test system with convenient operation terminal |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311406923.2A CN117367963B (en) | 2023-10-27 | 2023-10-27 | Radar chip test system with convenient operation terminal |
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| CN117367963A CN117367963A (en) | 2024-01-09 |
| CN117367963B true CN117367963B (en) | 2024-04-26 |
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| CN115877044A (en) * | 2022-11-30 | 2023-03-31 | 南通市飞宇石油科技开发有限公司 | Resistivity rock core holder |
| CN115754685A (en) * | 2023-01-09 | 2023-03-07 | 微网优联科技(成都)有限公司 | PCBA test pre-electrifying jig |
| CN219757952U (en) * | 2023-08-24 | 2023-09-26 | 广东卓柏信息科技有限公司 | Pipeline pressure detection device |
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