CN117339650A - Low-temperature test system and low-temperature test method - Google Patents
Low-temperature test system and low-temperature test method Download PDFInfo
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- CN117339650A CN117339650A CN202210762093.6A CN202210762093A CN117339650A CN 117339650 A CN117339650 A CN 117339650A CN 202210762093 A CN202210762093 A CN 202210762093A CN 117339650 A CN117339650 A CN 117339650A
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- 238000012360 testing method Methods 0.000 title claims abstract description 119
- 238000010998 test method Methods 0.000 title abstract description 12
- 238000007789 sealing Methods 0.000 claims abstract description 74
- 238000000034 method Methods 0.000 claims abstract description 14
- 238000005057 refrigeration Methods 0.000 claims description 3
- 238000001816 cooling Methods 0.000 abstract description 10
- 238000004891 communication Methods 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L7/00—Heating or cooling apparatus; Heat insulating devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L1/00—Enclosures; Chambers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
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Abstract
The invention provides a low-temperature test system and a low-temperature test method, and relates to the technical field of low-temperature tests. The low-temperature test system comprises a first box body, a second box body, a movable piece and a refrigerator; the first box body and the second box body are adjacent, and a sealing door is arranged between the first box body and the second box body and can be opened or closed to communicate or separate the first box body and the second box body; the refrigerator is at least partially arranged in the first box body, the movable piece is movably inserted in the second box body, the end part of the movable piece is used for installing a sample, and under the condition that the sealing door is opened, the end part of the movable piece can enter the first box body. According to the low-temperature test system and the low-temperature test method provided by the invention, the sealing door is closed, so that the vacuum state and the low-temperature state in the first box body can be always kept, the refrigerator does not need to be stopped, the process of rewarming and cooling the low-temperature test system is omitted, and the test efficiency of the low-temperature test system is improved.
Description
Technical Field
The invention relates to the technical field of low-temperature testing, in particular to a low-temperature testing system and a low-temperature testing method.
Background
With the development of scientific technology, scientific research such as superconducting test research, low-temperature material test, low-temperature thermometer calibration and the like are not separated from a low-temperature test environment.
The low-temperature test system is equipment for providing a low-temperature test environment, wherein the low-temperature test system based on the refrigerator can continuously work only by being electrified, has wide working temperature area, is simple and convenient to operate, can realize unattended operation and is widely applied.
However, the cooling and rewarming time of the low-temperature test system based on the refrigerator is too long, after the test of a sample is completed, the refrigerator needs to be closed for rewarming for a plurality of hours to detach or replace the sample, then the refrigerator is started again for cooling for a plurality of hours, and under the condition of testing a plurality of samples, the refrigerator needs to be cooled and rewarmed repeatedly, so that the low-temperature test efficiency is greatly reduced, and the development of low-temperature test work is not facilitated.
Disclosure of Invention
The invention provides a low-temperature test system and a low-temperature test method, which are used for solving the technical problem that the low-temperature test system in the prior art needs repeated cooling and rewarming, so that the test efficiency is low.
In a first aspect, the present invention provides a low temperature test system, comprising a first tank, a second tank, a movable member, and a refrigerator;
the first box body and the second box body are adjacent, and a sealing door is arranged between the first box body and the second box body and can be opened or closed to communicate or separate the first box body and the second box body;
the refrigerator is at least partially arranged in the first box body, the movable piece is movably inserted in the second box body, the end part of the movable piece is used for installing a sample, and under the condition that the sealing door is opened, the end part of the movable piece can enter the first box body.
According to the low-temperature test system provided by the invention, the low-temperature test system further comprises a low-temperature platform, wherein the low-temperature platform is arranged at one end of the refrigerator and is in thermal contact with the refrigerator.
According to the low-temperature test system provided by the invention, the low-temperature test system further comprises a heat conducting piece, wherein the heat conducting piece is arranged at the end part of the movable piece and is used for thermally contacting the sample and the low-temperature platform.
According to the low-temperature test system provided by the invention, the heat conduction piece is provided with the first heat conduction surface, the low-temperature platform is provided with the second heat conduction surface, and the shapes of the first heat conduction surface and the second heat conduction surface are matched, so that the heat conduction piece is tightly abutted with the refrigeration platform through the first heat conduction surface and the second heat conduction surface.
According to the low-temperature test system provided by the invention, the low-temperature test system further comprises a cold screen, wherein the cold screen is arranged in the first box body and connected with the refrigerator, and the low-temperature platform is positioned in a space surrounded by the cold screen.
According to the low-temperature test system provided by the invention, the low-temperature test system further comprises a sealing element, the second box body is provided with an opening, the sealing element is detachably arranged at the opening, and the movable element is movably inserted into the sealing element.
According to the low-temperature test system provided by the invention, the movable piece is of a hollow structure, and the inside of the movable piece is used for accommodating functional elements or wires.
In a second aspect, the present invention provides a low temperature test method, based on the low temperature test system of the first aspect, including:
placing the end part of the movable part provided with the sample in a first box body for low-temperature test, wherein the sealing door is in an open state, and the inside of the first box body and the inside of the second box body are both in a vacuum state;
after the low-temperature test is completed, the end part of the movable piece is moved into the second box body;
closing the sealing door, breaking vacuum on the second box body, and taking out the movable piece from the second box body so as to detach or replace the sample.
According to the low-temperature testing method provided by the invention, before the end part of the movable piece provided with the sample is placed in the first box body, the method further comprises the following steps:
closing a sealing door, vacuumizing the first box body, and starting a refrigerator when the vacuum degree of the first box body reaches a preset vacuum degree so as to enable the temperature of the first box body to reach a preset temperature;
mounting a sample to an end of the movable member, and placing the end of the movable member inside the second case;
and vacuumizing the second box body, and opening the sealing door under the condition that the vacuum degree in the second box body reaches the preset vacuum degree.
According to the low-temperature test method provided by the invention, the low-temperature test system comprises a sealing element, the second box body is provided with an opening, the sealing element is detachably arranged at the opening, and the movable element is movably inserted into the sealing element;
the sample is mounted to the end of the movable piece, the end of the movable piece is arranged in the second box body, and the sample mounting device specifically comprises:
the movable piece is inserted into the sealing piece, a sample is mounted at the end part of the movable piece, the end part of the movable piece is placed in the second box body through the opening, and the sealing piece is locked.
According to the low-temperature test system and the low-temperature test method, the first box body and the second box body are adjacent, and the sealing door is arranged between the first box body and the second box body and can be opened or closed, so that the first box body and the second box body can be communicated or separated; the movable piece is movably inserted into the second box body, and after the test is finished, the movable piece can be moved, so that the sample is transferred to the second box body, and the sample is convenient to detach or replace; the sealing door is closed, so that the vacuum state and the low-temperature state inside the first box body can be always kept, the refrigerator does not need to be stopped, the long process of rewarming and cooling of the low-temperature test system is omitted, the test efficiency of the low-temperature test system is greatly improved, and the continuous and repeated low-temperature test is facilitated.
Drawings
In order to more clearly illustrate the invention or the technical solutions of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are some embodiments of the invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a cryogenic test system provided by the present invention;
FIG. 2 is a schematic diagram of the cryogenic test system according to the present invention after removal of the moveable member;
FIG. 3 is a schematic diagram of the cryogenic test system according to the present invention when the movable member is located inside the second housing;
FIG. 4 is a schematic flow chart of the low temperature test method provided by the invention;
FIG. 5 is a flow chart of a low temperature testing method according to another embodiment of the present invention;
FIG. 6 is a flow chart of a low temperature test method according to another embodiment of the present invention.
Reference numerals:
1: a first case; 11: a first cavity; 12: sealing the door; 2: a second case; 21: a second cavity; 22: an opening; 3: a movable member; 4: a refrigerating machine; 41: a primary cold head; 42: a second-stage cold head; 5: a low temperature platform; 6: a heat conductive member; 7: a cold screen; 8: a seal; 100: and (3) a sample.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be understood that the directions or positional relationships indicated by the terms "upper", "lower", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of description and simplification of the description, and do not indicate or imply that the apparatus or element in question must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
According to the invention, as shown in fig. 1 to 3, the low temperature test system provided by the invention comprises a first box 1, a second box 2, a movable part 3 and a refrigerator 4.
The first casing 1 and the second casing 2 are adjacent with a sealing door 12 provided therebetween, and the sealing door 12 can be opened or closed to communicate or separate the first casing 1 and the second casing 2.
The refrigerator 4 is at least partially arranged in the first box 1, the movable piece 3 is movably inserted in the second box 2, the end part of the movable piece 3 is used for installing the sample 100, and under the condition that the sealing door 12 is opened, the end part of the movable piece 3 can enter the first box 1.
The first box 1 is provided with a first cavity 11, the second box 2 is provided with a second cavity 21, and a sealing door 12 is arranged on the first box 1 and the second box 2 and is used for realizing communication and separation of the first cavity 11 and the second cavity 21.
Preferably, the low-temperature test system comprises a first driving device and a control device which are in communication connection, wherein the driving device is in transmission connection with the sealing door 12, an operator can send a door opening signal or a door closing signal to the driving device through the control device, and the driving device correspondingly drives the sealing door 12 to move after receiving the door opening signal or the door closing signal, so that the sealing door 12 can be opened or closed, and automatic control of the low-temperature test system is realized. It should be noted that any structure capable of opening or closing the sealing door is within the scope of the present invention.
The refrigerator 4 is used for creating a low-temperature environment for the sample 100, the refrigerator 4 comprises a primary cold head 41 and a secondary cold head 42 which are connected, the primary cold head 41 and the secondary cold head 42 are arranged along the height direction of the first box body 1, and the secondary cold head 42 is positioned close to the inside of the first box body 1 relative to the primary cold head 41. For example, as shown in fig. 1, the secondary cooling head 42 is located below the primary cooling head 41, and the refrigerator 4 is at least partially located in the first tank 1.
The movable piece 3 is in a rod shape and is inserted into the second box body 2, and the movable piece 3 can axially move along the movable piece 3, so that a sample 100 at the end part of the movable piece 3 enters the first cavity 11 or the second cavity 21, and the transfer of the sample 100 is completed. Fig. 1 shows a state in which the sample 100 at the end of the movable member 3 is located in the first chamber 11, and fig. 3 shows a state in which the sample 100 at the end of the movable member 3 is located in the second chamber 21. And, as shown in fig. 2, the movable member 3 can be taken out from the second cavity 21, facilitating the installation or removal of the sample 100.
Optionally, the low-temperature test system further comprises a second driving device, and the second driving device is in transmission connection with the movable piece 3 and is used for driving the movable piece 3 to move. The second driving device is in communication connection with the control device, and correspondingly drives the movable piece 3 to axially move along the self by receiving a movement signal sent by the control device. It should be noted that any design that enables axial movement of the movable member 3 is within the scope of the present invention.
In the prior art, the process of using a cryotest system based on a refrigerator to perform a cryotest includes: vacuumizing a low-temperature test system; after the vacuum degree of the low-temperature test system meets the test requirement, starting a refrigerator to cool; after the temperature of the low-temperature test system reaches the test requirement, carrying out relevant test of the sample; after the test is completed, the refrigerator is closed for rewarming; in order to avoid a great amount of frosting of the low-temperature test system, after the temperature of the low-temperature test system reaches the room temperature, breaking vacuum of the low-temperature test system, and disassembling the low-temperature test system to replace a sample; the cryogenic test system is reassembled and ready for testing of the next sample. In the process, the cooling of the refrigerator and the rewarming of the low-temperature test system can be achieved only in a few hours, so that a large amount of time is consumed, and the rapid and continuous low-temperature test is not facilitated.
In the low-temperature test system provided by the embodiment of the invention, the first cavity 11 is a place where the sample 100 is subjected to the low-temperature test, after the test of the sample 100 is completed, the sample 100 can be transferred to the second cavity 21, the first cavity 11 and the second cavity 21 are separated by closing the sealing door 12, so that the first cavity 11 is kept in a vacuum and low-temperature state, and then the second cavity 21 is broken in vacuum, so that the sample 100 is disassembled or replaced. In the process, the refrigerator 4 does not need to be repeatedly opened and closed, the first cavity 11 does not need to be repeatedly cooled and rewarmed, a large amount of time is saved, the sample 100 can be detached or replaced in a state that the refrigerator 4 is not stopped, the next low-temperature test is facilitated, and the efficiency of the low-temperature test is greatly improved.
According to the low-temperature test system provided by the invention, the first box body 1 and the second box body 2 are adjacent, and the sealing door 12 is arranged between the first box body 1 and the second box body 2, so that the sealing door 12 can be opened or closed, and the communication or separation of the first box body 1 and the second box body 2 can be realized; the movable piece 3 is movably inserted into the second box body 2, and after the test is finished, the movable piece 3 can be moved, so that the sample 100 is transferred to the second box body 2, and the sample can be conveniently detached or replaced; the sealing door 12 is closed, so that the vacuum state and the low-temperature state inside the first box body 1 can be always kept, the refrigerator 4 does not need to be stopped, the long process of rewarming and cooling the low-temperature test system is omitted, the test efficiency of the low-temperature test system is greatly improved, and the continuous and repeated low-temperature test is facilitated.
Further, the cryogenic test system further comprises a cryogenic platform 5, the cryogenic platform 5 being mounted at one end of the refrigerator 4 and being in thermal contact with the refrigerator 4.
The low-temperature platform 5 is arranged on the secondary cold head 42 of the refrigerator 4, can realize heat conduction with the secondary cold head 42, and the sample 100 can realize heat conduction with the low-temperature platform 5 through direct thermal contact or indirect thermal contact, so that the test temperature is reached.
Specifically, the cryogenic test system further comprises a heat conducting member 6, the heat conducting member 6 being arranged at the end of the movable member 3, the heat conducting member 6 being adapted to be in thermal contact with the sample 100 and the cryogenic platform 5.
The heat conducting member 6 is used for realizing cold energy transfer between the sample 100 and the low-temperature platform 5, so that the sample 100 can reach the test temperature quickly. As shown in fig. 1, the sample 100 is mounted on one side of the heat conducting member 6 and is in thermal contact with the heat conducting member 6.
Specifically, the heat conducting member 6 has a first heat conducting surface, the low temperature platform 5 has a second heat conducting surface, and the shapes of the first heat conducting surface and the second heat conducting surface are adapted, so that the heat conducting member 6 is closely abutted to the refrigeration platform 0 through the first heat conducting surface and the second heat conducting surface.
As shown in fig. 1 or 3, the heat conducting member 6 is triangular and has a first heat conducting surface inclined relative to a horizontal plane, which is beneficial to increasing the contact area and the contact force with the second heat conducting surface and enhancing the heat conducting effect. The inclination angle and the shape of the second heat conducting surface of the low-temperature platform 5 are matched with those of the first heat conducting surface, and the heat conducting piece 6 and the low-temperature platform 5 can be tightly attached to the first heat conducting surface and the second heat conducting surface to rapidly cool the sample 100.
The low-temperature test system further comprises a cold screen 7, wherein the cold screen 7 is arranged in the first box body 1 and connected with the refrigerator 4, and the low Wen Pingtai 5 is located in a space surrounded by the cold screen 7.
Specifically, cold screen 7 installs in first order cold head 41, and cold screen 7 is tubular structure, and low temperature platform 5 and second grade cold head 42 all are located the space that cold screen 7 encloses, and cold screen 7 is used for reducing the heat radiation loss of second grade cold head 42 and low temperature platform 5, guarantees that sample 100 reaches the test temperature fast.
The cryogenic test system further comprises a sealing member 8, the second box 2 is provided with an opening 22, the sealing member 8 is detachably arranged at the opening 22, and the movable member 3 is movably inserted into the sealing member 8.
As shown in fig. 1, the opening 22 is located in a direction away from the sealing door 12, and the movable member 3 can enter the second cavity 21 through the opening 22. The movable part 3 vertically penetrates through the sealing part 8 and can axially move along the movable part.
Specifically, the sealing member 8 is a quick-release sealing flange, provides an installation position for the movable member 3, and can be quickly installed and removed. The second cavity 21 can be isolated from the external environment through the locking sealing piece 8, so that the second box body 2 can be conveniently vacuumized; by disassembling the sealing element 8, the movable element 3 can be taken out from the second box body 2, and the sample 100 can be replaced or disassembled conveniently.
It will be appreciated that a sealing element is provided between the periphery of the moveable member 3 and the sealing member 8 to ensure the tightness of the second cavity 21 during movement of the moveable member 3.
According to the low-temperature test system provided by the invention, the movable part 3 is of a hollow structure, and the inside of the movable part 3 is used for accommodating functional elements or wires.
The functional elements are used for data acquisition, data transmission and the like. By accommodating the functional elements and the wires inside the movable part 3, the functional elements and the wires can move along with the movable part 3 when relevant data are collected and transmitted.
The invention also provides a low-temperature test method, based on the low-temperature test system described in any of the above embodiments, as shown in fig. 4, the method includes:
s10: placing the end of the movable part 3 provided with the sample 100 in the first box body 1 for low-temperature test, wherein the sealing door 12 is in an open state, and the inside of the first box body 1 and the inside of the second box body 2 are both in a vacuum state;
s20: after the low-temperature test is completed, the end part of the movable piece 3 is moved into the second box body 2;
s30: the sealing door 12 is closed, the second casing 2 is broken in vacuum, and the movable member 3 is taken out from the inside of the second casing 2 to detach or replace the sample 100.
In step S10, when the sample 100 is subjected to the low temperature test, the sealing door 12 is opened, the first cavity 11 and the second cavity 21 are communicated with each other and are all in a vacuum state, and the sample 100 is subjected to the related test in the first cavity 11.
In step S20, after the low temperature test of the sample 100 is completed, the movable member 3 moves along the axial direction thereof in a direction away from the first housing 1 under the driving of the human power or the second driving device until the sample 100 reaches the second cavity 21.
Subsequently, in step S30, the first chamber 11 and the second chamber 21 are separated by closing the sealing door 12, the first chamber 11 is kept in a vacuum, low-temperature state, and then the second chamber 21 is broken in vacuum, so that the sample 100 is detached or replaced.
In the process, the refrigerator 4 does not need to be repeatedly opened and closed, the first cavity 11 does not need to be repeatedly cooled and rewarmed, a large amount of time is saved, the sample 100 can be detached or replaced in a state that the refrigerator 4 is not stopped, the next low-temperature test is facilitated, and the efficiency of the low-temperature test is greatly improved.
According to the low-temperature test method provided by the invention, the first box body 1 and the second box body 2 are adjacent, and the sealing door 12 is arranged between the first box body 1 and the second box body 2, so that the sealing door 12 can be opened or closed, and the communication or separation of the first box body 1 and the second box body 2 can be realized; the movable piece 3 is movably inserted into the second box body 2, and after the test is finished, the movable piece 3 can be driven to move, so that the sample 100 is transferred to the second box body 2, and the sample is convenient to detach or replace; the sealing door 12 is closed, so that the vacuum state and the low-temperature state inside the first box body 1 can be always kept, the refrigerator 4 does not need to be stopped, the long process of rewarming and cooling the low-temperature test system is omitted, the test efficiency of the low-temperature test system is greatly improved, and the continuous and repeated low-temperature test is facilitated.
Specifically, as shown in fig. 5 or 6, before the end of the movable member 3 on which the sample 100 is mounted is placed in the first casing 1 in step S10, it further includes:
s101: closing the sealing door 12, vacuumizing the interior of the first box body 1, and starting the refrigerator 4 when the vacuum degree of the interior of the first box body 1 reaches a preset vacuum degree so as to enable the temperature of the interior of the first box body 1 to reach a preset temperature;
s102: mounting the sample 100 to the end of the movable member 3, and placing the end of the movable member 3 inside the second casing 2;
s103: the inside of the second casing 2 is evacuated, and the sealing door 12 is opened when the vacuum degree in the inside of the second casing 2 reaches a preset vacuum degree.
In step S101, in the initial state, the sealing door 12 is ensured to be in a closed state, the first cavity 11 is vacuumized, and when the vacuum degree of the first cavity 11 reaches the preset vacuum degree, the opening requirement of the refrigerator 4 is met, and at this time, the refrigerator 4 is started to cool. The preset vacuum degree is a vacuum degree target value which needs to be reached in a low-temperature test environment. In the initial state, the first cavity 11 is at normal temperature, and the refrigerator 4 needs to cool down for a long time.
After the temperature of the first chamber 11 reaches the preset temperature, in step S102, the sample 100 is mounted to the end of the movable member 3, and the position of the movable member 3 is adjusted so that the sample 100 is located in the second chamber 21. The low-temperature test system further comprises a heat conducting piece 6, wherein the heat conducting piece 6 is arranged at the end part of the movable piece 3, and the sample 100 is mounted on one side of the heat conducting piece 6, so that the sample 100 is in thermal contact with the heat conducting piece 6.
In step S103, the inside of the second casing 2 is vacuumized to make the vacuum degree of the second cavity 21 reach the preset vacuum degree, and the sealing door 12 is opened to make the first cavity 11 and the second cavity 21 communicate, and at this time, both the first cavity 11 and the second cavity 21 are in a vacuum state. Then, the process goes to step S10, and the end of the movable member 3 with the sample 100 mounted thereon is placed in the first casing 1 to perform the low temperature test.
Specifically, the cryogenic test system comprises a sealing member 8, the second case 2 has an opening 22, the sealing member 8 is detachably mounted at the opening 22, and the movable member 3 is movably inserted into the sealing member 8. In step S102, the sample 100 is mounted to the end of the movable member 3, and the end of the movable member 3 is placed inside the second casing 2, specifically including:
the movable member 3 is inserted into the sealing member 8, the sample 100 is mounted to the end of the movable member 3, the end of the movable member 3 is placed inside the second casing 2 through the opening 22, and the sealing member 8 is locked.
Specifically, the sealing member 8 is a quick-release sealing flange, provides an installation position for the movable member 3, and can be quickly installed and removed. The second cavity 21 can be isolated from the external environment through the locking sealing piece 8, so that the second box body 2 can be conveniently vacuumized; in step S30, the movable member 3 can be taken out from the second casing 2 by removing the sealing member 8, so that the sample 100 can be replaced or removed conveniently.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The low-temperature test system is characterized by comprising a first box body, a second box body, a movable piece and a refrigerator;
the first box body and the second box body are adjacent, and a sealing door is arranged between the first box body and the second box body and can be opened or closed to communicate or separate the first box body and the second box body;
the refrigerator is at least partially arranged in the first box body, the movable piece is movably inserted in the second box body, the end part of the movable piece is used for installing a sample, and under the condition that the sealing door is opened, the end part of the movable piece can enter the first box body.
2. The cryogenic test system of claim 1 further comprising a cryogenic platform mounted at one end of the refrigerator and in thermal contact with the refrigerator.
3. The cryogenic test system of claim 2 further comprising a thermally conductive member disposed at an end of the moveable member, the thermally conductive member for thermal contact with the sample and the cryogenic platform.
4. The cryogenic test system of claim 3, wherein the thermally conductive member has a first thermally conductive surface and the cryogenic platform has a second thermally conductive surface, the first thermally conductive surface and the second thermally conductive surface being shaped to closely abut the thermally conductive member and the refrigeration platform via the first thermally conductive surface and the second thermally conductive surface.
5. The cryogenic test system of claim 2, further comprising a cold screen disposed within the first tank and connected to the refrigerator, the cryogenic platform being located within a space enclosed by the cold screen.
6. The cryogenic test system of claim 1, further comprising a seal, the second tank having an opening, the seal being removably mounted to the opening, the moveable member being removably insertable into the seal.
7. The cryogenic test system of claim 1, wherein the moveable member is hollow and the interior of the moveable member is configured to receive a functional element or wire.
8. A method of cryogenic testing based on the cryogenic test system of any one of claims 1 to 7, comprising:
placing the end part of the movable part provided with the sample in a first box body for low-temperature test, wherein the sealing door is in an open state, and the inside of the first box body and the inside of the second box body are both in a vacuum state;
after the low-temperature test is completed, the end part of the movable piece is moved into the second box body;
closing the sealing door, breaking vacuum on the second box body, and taking out the movable piece from the second box body so as to detach or replace the sample.
9. The method of claim 8, wherein the placing the end of the movable member with the sample mounted therein is preceded by:
closing a sealing door, vacuumizing the first box body, and starting a refrigerator when the vacuum degree of the first box body reaches a preset vacuum degree so as to enable the temperature of the first box body to reach a preset temperature;
mounting a sample to an end of the movable member, and placing the end of the movable member inside the second case;
and vacuumizing the second box body, and opening the sealing door under the condition that the vacuum degree in the second box body reaches the preset vacuum degree.
10. The method according to claim 9, wherein the cryogenic test system comprises a sealing member, the second housing has an opening, the sealing member is detachably mounted at the opening, and the movable member is movably inserted into the sealing member;
the sample is mounted to the end of the movable piece, the end of the movable piece is arranged in the second box body, and the sample mounting device specifically comprises:
the movable piece is inserted into the sealing piece, a sample is mounted at the end part of the movable piece, the end part of the movable piece is placed in the second box body through the opening, and the sealing piece is locked.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210762093.6A CN117339650A (en) | 2022-06-29 | 2022-06-29 | Low-temperature test system and low-temperature test method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117554155A (en) * | 2024-01-09 | 2024-02-13 | 北京飞斯科科技有限公司 | Top loading and unloading type low-temperature equipment for electron spin resonance |
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- 2022-06-29 CN CN202210762093.6A patent/CN117339650A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117554155A (en) * | 2024-01-09 | 2024-02-13 | 北京飞斯科科技有限公司 | Top loading and unloading type low-temperature equipment for electron spin resonance |
| CN117554155B (en) * | 2024-01-09 | 2024-03-29 | 北京飞斯科科技有限公司 | Top loading and unloading type low-temperature equipment for electron spin resonance |
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