CN117312805A - Analysis method for high-low temperature tolerance test of touch screen finished product - Google Patents
Analysis method for high-low temperature tolerance test of touch screen finished product Download PDFInfo
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Abstract
The invention relates to the technical field of high-low temperature tolerance test of touch screen finished products, and particularly discloses a method for analyzing the high-low temperature tolerance test of the touch screen finished products, which comprises the following steps: setting test data, acquiring high-temperature test data, analyzing high-temperature tolerance, analyzing low-temperature tolerance and feeding back abnormal tolerance; according to the invention, the test data are set and collected, so that the tolerance evaluation indexes of the current production batch corresponding to the high-temperature layer and the low-temperature layer are analyzed, the comprehensive tolerance evaluation index of the mobile phone touch screen finished product is obtained, the performance of the touch screen finished product in different environments can be more comprehensively evaluated by testing at different temperatures, meanwhile, the reliability of the data can be increased, the influence of errors and abnormal data on analysis results is reduced, the comparison analysis of the test results at different temperatures can be conveniently carried out, and the performance difference of the touch screen finished product at different temperatures can be more intuitively known.
Description
Technical Field
The invention relates to the technical field of high-low temperature tolerance tests of touch screen finished products, in particular to a method for analyzing the high-low temperature tolerance test of the touch screen finished products.
Background
With the continuous development of technology, touch screens have become a main man-machine interaction mode of various electronic devices such as mobile phones, tablet computers and televisions, and because of the diversity of use environments, touch screen finished products need to have the capability of keeping good performance at low temperature and high and normal temperature, so that in order to ensure that the touch screen finished products have good performance at different temperatures, high and low temperature tolerance test analysis needs to be performed on the touch screen finished products.
The existing analysis mode for carrying out high-low temperature tolerance test on the touch screen finished product has the following problems: 1. at present, only three test temperatures, namely low temperature and high temperature and normal temperature, are set, and a plurality of test temperatures are not set in a low-temperature group and high Wen Zu respectively, so that the performance of the mobile phone touch screen finished product in different environments cannot be evaluated more comprehensively, the high-low temperature tolerance of the mobile phone touch screen finished product cannot be reflected more accurately, meanwhile, the reliability of data is reduced, the influence of errors and abnormal data on analysis results is increased, the test results at different temperatures cannot be analyzed in a comparison mode conveniently, and further the performance difference of the mobile phone touch screen finished product at different temperatures cannot be known intuitively.
2. The method has the advantages that the response speed abnormal condition, the screen color abnormal condition and the screen cracking abnormal condition of the mobile phone touch screen finished product under the high-low temperature test are not analyzed integrally at the same time, only the single analysis is performed, the coverage of the tolerance evaluation of the mobile phone touch screen finished product under the high-low temperature test is reduced, the comprehensiveness of the tolerance evaluation of the mobile phone touch screen finished product under the high-low temperature test cannot be ensured, the performance abnormal condition of the mobile phone touch screen finished product under the high-low temperature test cannot be found timely, the timeliness of production processing is reduced, and the production cost of a production factory is further improved.
3. Whether the test temperature is regulated to a corresponding temperature value is only considered at present, the uniformity and standard reaching degree of the test temperature are not subjected to deep analysis, and the consistency of the test conditions cannot be ensured, so that the test temperature cannot be ensured to have no influence on the test result, and the accuracy and convincing performance of the tolerance assessment of the mobile phone touch screen finished product under high and low temperature test are reduced.
Disclosure of Invention
In view of this, in order to solve the problems set forth in the background art, a method for analyzing a high-low temperature tolerance test of a touch screen product is proposed.
The aim of the invention can be achieved by the following technical scheme: the invention provides a method for analyzing a high-low temperature tolerance test of a touch screen finished product, which comprises the following steps: s1, test data setting: randomly selecting a plurality of mobile phone touch screen finished products from the current production batch of a target mobile phone touch screen production factory, dividing the mobile phone touch screen finished products into test groups according to equal proportion to obtain the number of the mobile phone touch screen finished products of the test groups, adjusting the temperature of each test box to the corresponding test temperature, and sequentially placing each test group into the corresponding test box for testing.
S2, acquiring high-temperature test data: dividing each test box into subareas according to a preset volume, performing thermal imaging monitoring on each subarea of the high-temperature test box corresponding to each test group, obtaining a thermosensitive image of each subarea of the high-temperature test box corresponding to each test group, and collecting test data of each mobile phone touch screen finished product of each test group in the corresponding high-temperature test box.
S3, high temperature tolerance analysis: analysis of the evaluation index of the tolerance of the test groups under the corresponding high-temperature testThereby analyzing tolerance evaluation index ++of the current production lot corresponding to the high temperature level>Wherein->The numbers of the test groups are indicated,。
s4, low-temperature tolerance analysis: carrying out thermal imaging monitoring on each subarea of the low-temperature test box corresponding to each test group, collecting test data of each mobile phone touch screen finished product in the corresponding low-temperature test box of each test group, and analyzing the tolerance evaluation index of the corresponding low-temperature layer of the current production batch in a same way according to the analysis mode of the tolerance evaluation index of the corresponding high-temperature layer of the current production batch。
S5, tolerance abnormal feedback: analyzing comprehensive tolerance evaluation index of mobile phone touch screen finished products in current production batchIf the current production batch is smaller than the set value, the current production batch is indicated to have abnormality, and feedback is carried out.
Specifically, the test data includes a point in time of each click on the screen, a point in time of each screen response, a screen RGB value, and the number of screen cracks and the crack length at each crack.
Specifically, the test groups were analyzed for their tolerance assessment index under the corresponding high temperature testThe specific analysis process is as follows: a1, extracting the time point of clicking the screen for each time, the time point of responding to the screen for each time, the RGB value of the screen, the number of the screen cracks and the crack length of each crack from the test data, and calculating the response speed abnormality index +_ +_of each test group under the corresponding high-temperature test according to the RGB value of the screen and the number of the screen cracks and the crack length of each crack>Screen color abnormality index->And screen cracking abnormality index->。
A2, according to the corresponding test groupsSetting temperature influence factors corresponding to each test group according to thermosensitive images of all subareas of the high-temperature test box。
A3, calculating tolerance evaluation indexes of each test group under corresponding high-temperature test，Wherein->、/>And->Respectively representing response speed abnormality index, screen color abnormality index and screen cracking abnormality index of the setting reference,/>、/>And->And respectively representing the set response speed abnormality, screen color abnormality and screen cracking abnormality corresponding to the tolerance evaluation duty ratio weight under the high-temperature test.
Specifically, the response speed abnormality index of each test group under the corresponding high temperature test is calculatedThe specific calculation process is as follows: b1, comparing the time point of clicking the screen for each time of each mobile phone touch screen finished product in the corresponding high-temperature test box with the time point of responding to each time of the screen to obtain the response time length of each test group in the corresponding high-temperature test boxThe deviation is compared with the response time deviation of the set reference, the number of mobile phone touch screen finished products, of which the response time deviation of each test group in the corresponding high-temperature test box is larger than the response time deviation of the set reference, is counted as the abnormal number of finished products->。
B2, recording the number of finished mobile phone touch screen products of the test group as。
B3, extracting the maximum value from the response time deviation of each test group in the corresponding mobile phone touch screen finished product in the high-temperature test box, and marking the maximum value as；
B4, calculating the response speed abnormality index of each test group under the corresponding high-temperature test，/>Wherein->And->Abnormal duty ratio and response time deviation, respectively, of the set reference +.>And->And respectively representing the set abnormal finished product duty ratio and response time deviation corresponding to the response speed abnormal evaluation duty ratio weight.
Specifically, the screen color abnormality index of each test group under the corresponding high-temperature test is calculatedThe specific calculation process is as follows: c1, respectively marking screen RGB values of the mobile phone touch screen finished products of each test group in the corresponding high-temperature test box as follows、/>And->Wherein->Number indicating mobile phone touch screen finished product, +.>。
C2, extracting screen RGB values of the mobile phone touch screen in a normal state from the cloud database and respectively marking the values as、/>And。
c3, calculating the abnormal index of the screen color of each test group under the corresponding high-temperature test，Wherein->And the number of finished touch screen products of the mobile phone is represented.
Specifically, the temperature influence factors corresponding to each test group are setThe specific setting process is as follows: and D1, locating the temperature value of each temperature distribution area from the thermosensitive image of each subarea of the high-temperature test box corresponding to each test group.
D2, carrying out average value calculation on the temperature values of the temperature distribution areas corresponding to the subareas of the high-temperature test boxes corresponding to the test groups to obtain the temperature average value corresponding to the subareas of the high-temperature test boxes corresponding to the test groups, taking the temperature average value as the temperature value corresponding to the subareas of the high-temperature test boxes corresponding to the test groups, and marking the temperature average value as the temperature value corresponding to the subareas of the high-temperature test boxes corresponding to the test groupsWherein->The number representing the sub-region is indicated,。
d3, calculating the temperature uniformity of the high-temperature test boxes corresponding to each test group，/>Wherein->Indicating the temperature deviation of the set reference +.>Indicate->Sub-area, & lt & gt>Representing natural constants.
D4, calculating the temperature reaching scale of the high-temperature test box corresponding to each test group。
D5, calculating temperature influence factors corresponding to all test groups，/>Wherein->Andtemperature uniformity and temperature up-scale, respectively, representing the set reference, +.>And->The set temperature uniformity and the set temperature arrival scale are respectively represented to corresponding temperature influence factor evaluation duty ratio weights.
Specifically, the temperature of the high-temperature test boxes corresponding to each test group is calculated to reach the scaleThe specific calculation process is as follows: e1, the test temperature of the high temperature test box corresponding to each test group is recorded as +.>。
E2, comparing the temperature value corresponding to each subarea of the high-temperature test box corresponding to each test group with the test temperature of the high-temperature test box corresponding to each test group, if the temperature value corresponding to each subarea of the high-temperature test box corresponding to a certain test group is smaller than the test temperature of the high-temperature test box, judging the subarea as a temperature substandard subarea, counting the number of the temperature substandard subareas in the high-temperature test box corresponding to each test group, and recording as。
E3, detecting the temperature of the high-temperature test boxes corresponding to each test group to be up to the standardExtracting the minimum value from the temperature values corresponding to the regions and recording as。
E4, calculating the temperature reaching scale of the high-temperature test box corresponding to each test group，/>Wherein->Representing the number of subregions>Indicating that the temperature of the set reference does not reach the sub-area duty ratio, < >>And->And respectively representing the set temperature substandard subarea duty ratio and the temperature deviation corresponding to the temperature standard evaluation duty ratio weight of the high-temperature test box.
Specifically, the analysis of the tolerance evaluation index of the current production lot corresponding to the high temperature levelThe specific analysis mode is as follows: f1, carrying out adjacent comparison on tolerance evaluation indexes of each test group under the corresponding high temperature test to obtain tolerance evaluation deviation of each test group under the corresponding high temperature test, comparing the tolerance evaluation deviation with the tolerance evaluation deviation of the set reference, counting the number of test groups with the tolerance evaluation deviation larger than the tolerance evaluation deviation of the set reference, and recording as the number of abnormal test groups->。
F2, carrying out uniformity on tolerance evaluation deviation of each test group under corresponding high-temperature testCalculating the value to obtain the average tolerance evaluation deviation of each test group under the corresponding high-temperature test, and recording as。
F3, calculating tolerance evaluation index of the current production batch corresponding to the high temperature layer，/>Wherein->And->The number of abnormal test groups representing the set reference is the ratio and tolerance evaluation deviation, respectively, +.>And->Respectively representing the set number of abnormal test groups and the tolerance evaluation weight corresponding to the tolerance evaluation deviation, +.>The number of test groups is indicated.
Specifically, the comprehensive tolerance evaluation index of the mobile phone touch screen finished product in the current production batchThe calculation formula of (2) is as follows: />Wherein->And->Respectively indicate the settingThe tolerance evaluation indexes of the high temperature layer and the low temperature layer correspond to the comprehensive tolerance evaluation duty ratio weight.
Compared with the prior art, the embodiment of the invention has at least the following advantages or beneficial effects: (1) According to the invention, test data are set, and the test data of each test group in the corresponding high-temperature and low-temperature test box are collected, so that tolerance evaluation indexes of the corresponding high-temperature layer and the low-temperature layer of the current production batch are analyzed, and further comprehensive tolerance evaluation indexes of the finished product of the mobile phone touch screen are obtained.
(2) According to the invention, the response speed abnormality index, the screen color abnormality index and the screen cracking abnormality index of each test group under the corresponding high-temperature test are calculated to carry out multi-azimuth and multi-level analysis, so that the coverage of the tolerance evaluation of the mobile phone touch screen finished product under the high-low temperature test is improved, the comprehensiveness of the tolerance evaluation of the mobile phone touch screen finished product under the high-low temperature test is ensured, meanwhile, the abnormal performance condition of the mobile phone touch screen finished product under the high-low temperature test can be found in time, the timeliness of production processing is improved, and the production cost of a production factory is further reduced.
(3) According to the invention, the temperature uniformity and the temperature reaching scale are analyzed by combining the thermosensitive images of each subarea of the high and low temperature test boxes corresponding to each test group, so that the temperature influence factors corresponding to each test group are analyzed, the consistency of test conditions is ensured, the test temperature is ensured not to influence the test result, and the accuracy and convincing of the tolerance assessment of the mobile phone touch screen finished product under the high and low temperature test are improved.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of the steps of the method of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, the invention provides a method for analyzing a high-low temperature tolerance test of a touch screen product, which comprises the following steps: s1, test data setting: randomly selecting a plurality of mobile phone touch screen finished products from the current production batch of a target mobile phone touch screen production factory, dividing the mobile phone touch screen finished products into test groups according to equal proportion to obtain the number of the mobile phone touch screen finished products of the test groups, adjusting the temperature of each test box to the corresponding test temperature, and sequentially placing each test group into the corresponding test box for testing.
In one embodiment of the present invention, the test temperature includes, but is not limited to、/>、、/>、/>、/>、/>And->Wherein->，/>、/>、/>And->For high temperature test temperature, +.>、/>、/>And->For low temperature test temperature, +.>Is at normal temperature.
It should also be noted that the typical test temperature range that a mobile phone touch screen can withstand is-25 ℃ to 60 ℃, in one embodiment of the present invention, the high temperature test temperature、/>、/>And->30 ℃, 40 ℃, 50 ℃ and 60 ℃ respectively, normal temperature20 ℃ and low temperature test temperature->、/>、/>And->5 ℃, -15 ℃ and-25 ℃ respectively.
S2, acquiring high-temperature test data: dividing each test box into subareas according to a preset volume, performing thermal imaging monitoring on each subarea of the high-temperature test box corresponding to each test group, obtaining a thermosensitive image of each subarea of the high-temperature test box corresponding to each test group, and collecting test data of each mobile phone touch screen finished product of each test group in the corresponding high-temperature test box.
In a specific embodiment of the present invention, the test data includes a time point of clicking the screen each time, a time point of responding to the screen each time, a screen RGB value, a number of screen cracks and a crack length at each crack.
It should be noted that, the collection modes of the time point of each clicking on the screen and the time point of each responding screen are as follows: the method comprises the steps of collecting videos responded by a click test screen through a camera, dividing the videos into pictures by taking frames as units, obtaining the pictures when the screens are touched for each time and the corresponding time points thereof, and the pictures when the screens are lightened for each time and the corresponding time points thereof, and further obtaining the time points of clicking the screens for each time and the time points of responding the screens for each time.
It should be further noted that, the screen RGB value is acquired by a color calibrator, and the number of the screen cracks and the crack length of each crack are acquired by a screen crack detector, and the detector can convert the cracks on the screen into digital signals by using an image processing technology, so as to automatically detect and calculate the number and the length of the cracks.
S3, high temperature tolerance analysis: analysis of the evaluation index of the tolerance of the test groups under the corresponding high-temperature testThereby analyzing tolerance evaluation index ++of the current production lot corresponding to the high temperature level>Wherein->The numbers of the test groups are indicated,。
in a specific embodiment of the present invention, the tolerance evaluation index of each test group under the corresponding high temperature test is analyzed, and the specific analysis process is as follows: a1, extracting the time point of clicking the screen for each time, the time point of responding to the screen for each time, the RGB value of the screen, the number of the screen cracks and the crack length of each crack from the test data, and calculating the abnormal index of the response speed of each test group under the corresponding high-temperature testScreen color abnormality index->And screen cracking abnormality index->。
In a specific embodiment of the invention, the calculationResponse speed abnormality index of each test group under corresponding high temperature testThe specific calculation process is as follows: b1, comparing the time point of clicking the screen for each time of each mobile phone touch screen finished product in the corresponding high-temperature test box with the time point of responding to each screen to obtain the response time length deviation of each mobile phone touch screen finished product in the corresponding high-temperature test box, comparing the response time length deviation with the response time length deviation of the set reference, counting the number of mobile phone touch screen finished products with the response time length deviation of each test group in the corresponding high-temperature test box being larger than the response time length deviation of the set reference, and recording as the abnormal finished product number +>。
The response time duration deviation refers to comparing the time point of clicking the screen for each time of each mobile phone touch screen finished product in the corresponding high-temperature test box with the time point of responding for each time of the screen, so as to obtain each time of responding time duration of each mobile phone touch screen finished product in the corresponding high-temperature test box, and making a difference with the responding time duration of the set reference, so as to obtain the response time duration deviation of each mobile phone touch screen finished product in the corresponding high-temperature test box.
B2, recording the number of finished mobile phone touch screen products of the test group as。
B3, extracting the maximum value from the response time deviation of each test group in the corresponding mobile phone touch screen finished product in the high-temperature test box, and marking the maximum value as；
B4, calculating the response speed abnormality index of each test group under the corresponding high-temperature test，Wherein->And->Abnormal duty ratio and response time deviation, respectively, of the set reference +.>And->And respectively representing the set abnormal finished product duty ratio and response time deviation corresponding to the response speed abnormal evaluation duty ratio weight.
In the specific embodiment of the invention, the screen color abnormality index of each test group under the corresponding high-temperature test is calculatedThe specific calculation process is as follows: c1, marking screen RGB values of the mobile phone touch screen finished products of each test group in the corresponding high-temperature test box as +.>、/>And->Wherein->Number indicating mobile phone touch screen finished product, +.>。
C2, extracting screen RGB values of the mobile phone touch screen in a normal state from the cloud database and respectively marking the values as、/>And。
c3, calculating the abnormal index of the screen color of each test group under the corresponding high-temperature test，Wherein->And the number of finished touch screen products of the mobile phone is represented.
The screen cracking abnormality index of each test group under the corresponding high temperature test is calculatedThe specific calculation process is as follows: g1, recording the number of screen cracks of each test group at each mobile phone touch screen finished product in the corresponding high-temperature test box as +.>。
And G2, carrying out average value calculation on the crack length of each test group at each crack of each mobile phone touch screen finished product in the corresponding high-temperature test box to obtain the average crack length of each test group at each mobile phone touch screen finished product in the corresponding high-temperature test box, and marking as。
G3, calculating the screen cracking abnormality index of each test group under the corresponding high-temperature test，/>Wherein->And->Respectively representing the number of screen cracks and the crack length of the set reference, < >>And->The number of the set screen cracks and the screen crack length corresponding to the screen crack abnormality evaluation duty ratio weight are respectively represented.
A2, setting temperature influence factors corresponding to the test groups according to the thermosensitive images of the sub-areas of the high-temperature test box corresponding to the test groups。
In the specific embodiment of the invention, the temperature influence factors corresponding to each test group are setThe specific setting process is as follows: and D1, locating the temperature value of each temperature distribution area from the thermosensitive image of each subarea of the high-temperature test box corresponding to each test group.
D2, carrying out average value calculation on the temperature values of the temperature distribution areas corresponding to the subareas of the high-temperature test boxes corresponding to the test groups to obtain the temperature average value corresponding to the subareas of the high-temperature test boxes corresponding to the test groups, taking the temperature average value as the temperature value corresponding to the subareas of the high-temperature test boxes corresponding to the test groups, and marking the temperature average value as the temperature value corresponding to the subareas of the high-temperature test boxes corresponding to the test groupsWherein->The number representing the sub-region is indicated,。
d3, calculating the temperature uniformity of the high-temperature test boxes corresponding to each test group，/>Wherein->Indicating the temperature deviation of the set reference +.>Indicate->Sub-area, & lt & gt>Representing natural constants.
D4, calculating the temperature reaching scale of the high-temperature test box corresponding to each test group。
In the specific embodiment of the invention, the temperature of the high-temperature test boxes corresponding to each test group is calculated to reach the scaleThe specific calculation process is as follows: e1, the test temperature of the high temperature test box corresponding to each test group is recorded as +.>。
E2, comparing the temperature value corresponding to each subarea of the high-temperature test box corresponding to each test group with the test temperature of the high-temperature test box corresponding to each test group, if the temperature value corresponding to each subarea of the high-temperature test box corresponding to a certain test group is smaller than the test temperature of the high-temperature test box, judging the subarea as a temperature substandard subarea, counting the number of the temperature substandard subareas in the high-temperature test box corresponding to each test group, and recording as。
E3, extracting the minimum value from the temperature values corresponding to the sub-areas of which the temperatures of the high-temperature test boxes corresponding to the test groups do not reach the standard, and marking the minimum value as。
E4, calculating the temperature reaching scale of the high-temperature test box corresponding to each test group，/>Wherein->Representing the number of subregions>Indicating that the temperature of the set reference does not reach the sub-area duty ratio, < >>And->And respectively representing the set temperature substandard subarea duty ratio and the temperature deviation corresponding to the temperature standard evaluation duty ratio weight of the high-temperature test box.
D5, calculating temperature influence factors corresponding to all test groups，/>Wherein->And->Respectively show the temperature uniformity and the temperature standard reaching degree of the set reference，/>And->The set temperature uniformity and the set temperature arrival scale are respectively represented to corresponding temperature influence factor evaluation duty ratio weights.
According to the embodiment of the invention, the temperature uniformity and the temperature up-to-scale are analyzed by combining the thermosensitive images of all the subareas of the high and low temperature test boxes corresponding to all the test groups, so that the temperature influence factors corresponding to all the test groups are analyzedThe consistency of the test conditions is ensured, so that the test temperature is ensured not to influence the test result, and the accuracy and convincing of the tolerance evaluation of the mobile phone touch screen finished product under high and low temperature test are improved.
A3, calculating tolerance evaluation indexes of each test group under corresponding high-temperature test，Wherein->、/>And->Respectively representing response speed abnormality index, screen color abnormality index and screen cracking abnormality index of the setting reference,/>、/>And->And respectively representing the set response speed abnormality, screen color abnormality and screen cracking abnormality corresponding to the tolerance evaluation duty ratio weight under the high-temperature test.
According to the embodiment of the invention, the response speed abnormality index, the screen color abnormality index and the screen cracking abnormality index of each test group under the corresponding high-temperature test are calculated to carry out multi-azimuth and multi-level analysis, so that the coverage of the tolerance evaluation of the mobile phone touch screen finished product under the high-low temperature test is improved, the comprehensiveness of the tolerance evaluation of the mobile phone touch screen finished product under the high-low temperature test is ensured, the performance abnormality condition of the mobile phone touch screen finished product under the high-low temperature test can be found in time, the timeliness of production processing is improved, and the production cost of a production factory is further reduced.
In a specific embodiment of the invention, the tolerance evaluation index of the current production batch corresponding to the high temperature level is analyzedThe specific analysis mode is as follows: f1, carrying out adjacent comparison on tolerance evaluation indexes of each test group under the corresponding high temperature test to obtain tolerance evaluation deviation of each test group under the corresponding high temperature test, comparing the tolerance evaluation deviation with the tolerance evaluation deviation of the set reference, counting the number of test groups with the tolerance evaluation deviation larger than the tolerance evaluation deviation of the set reference, and recording as the number of abnormal test groups->。
F2, carrying out average calculation on the tolerance evaluation deviation of each test group under the corresponding high temperature test to obtain the average tolerance evaluation deviation of each test group under the corresponding high temperature test, and recording as。
F3, calculating tolerance evaluation index of the current production batch corresponding to the high temperature layer，/>Wherein->And->The number of abnormal test groups representing the set reference is the ratio and tolerance evaluation deviation, respectively, +.>And->Respectively representing the set number of abnormal test groups and the tolerance evaluation weight corresponding to the tolerance evaluation deviation, +.>The number of test groups is indicated.
S4, low-temperature tolerance analysis: carrying out thermal imaging monitoring on each subarea of the low-temperature test box corresponding to each test group, collecting test data of each mobile phone touch screen finished product in the corresponding low-temperature test box of each test group, and analyzing the tolerance evaluation index of the corresponding low-temperature layer of the current production batch in a same way according to the analysis mode of the tolerance evaluation index of the corresponding high-temperature layer of the current production batch。
S5, tolerance abnormal feedback: analyzing comprehensive tolerance evaluation index of mobile phone touch screen finished products in current production batchIf the current production batch is smaller than the set value, the current production batch is indicated to have abnormality, and feedback is carried out.
In a specific embodiment of the present invention, the comprehensive tolerance evaluation index of the mobile phone touch screen finished product in the current production lotThe calculation formula of (2) is as follows: />Wherein->And->The tolerance evaluation indexes respectively representing the set high temperature layer and low temperature layer correspond to the comprehensive tolerance evaluation duty ratio weights.
According to the embodiment of the invention, the test data are set, and the test data of each test group in the corresponding high-temperature and low-temperature test box are collected, so that the tolerance evaluation indexes of the corresponding high-temperature layer and the low-temperature layer of the current production batch are analyzed, the comprehensive tolerance evaluation indexes of the finished touch screen product of the mobile phone are further obtained, the performance of the finished touch screen product in different environments can be more comprehensively evaluated through testing at different temperatures, the high-temperature and low-temperature tolerance of the finished touch screen product can be more accurately reflected, meanwhile, the reliability of the data can be increased, the influence of errors and abnormal data on analysis results can be reduced, the comparison analysis of the test results at different temperatures can be conveniently carried out, and the performance difference of the finished touch screen product at different temperatures can be more intuitively known.
The foregoing is merely illustrative and explanatory of the principles of this invention, as various modifications and additions may be made to the specific embodiments described, or similar arrangements may be substituted by those skilled in the art, without departing from the principles of this invention or beyond the scope of this invention as defined in the claims.
Claims (10)
1. The method for analyzing the high-low temperature tolerance test of the touch screen finished product is characterized by comprising the following steps of:
s1, test data setting: randomly selecting a plurality of mobile phone touch screen finished products from the current production batch of a target mobile phone touch screen production factory, dividing the mobile phone touch screen finished products into test groups according to equal proportion to obtain the number of the mobile phone touch screen finished products of the test groups, adjusting the temperature of each test box to the corresponding test temperature, and sequentially placing each test group into the corresponding test box for testing;
s2, acquiring high-temperature test data: dividing each test box into subareas according to a preset volume, performing thermal imaging monitoring on each subarea of the high-temperature test box corresponding to each test group to obtain a thermosensitive image of each subarea of the high-temperature test box corresponding to each test group, and collecting test data of each mobile phone touch screen finished product of each test group in the corresponding high-temperature test box;
s3, high temperature tolerance analysis: analysis of the evaluation index of the tolerance of the test groups under the corresponding high-temperature testThereby analyzing tolerance evaluation index ++of the current production lot corresponding to the high temperature level>Wherein->Number of the test group>；
S4, low-temperature tolerance analysis: carrying out thermal imaging monitoring on each subarea of the low-temperature test box corresponding to each test group, collecting test data of each mobile phone touch screen finished product in the corresponding low-temperature test box of each test group, and analyzing the tolerance evaluation index of the corresponding low-temperature layer of the current production batch in a same way according to the analysis mode of the tolerance evaluation index of the corresponding high-temperature layer of the current production batch；
S5, tolerance abnormal feedback: analyzing comprehensive tolerance evaluation index of mobile phone touch screen finished products in current production batchIf the current production batch is smaller than the set value, the current production batch is indicated to have abnormality, and feedback is carried out.
2. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 1, which is characterized in that: the test data includes a point in time of each click on the screen, a point in time of each screen response, a screen RGB value, the number of screen cracks, and a crack length at each crack.
3. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 2, which is characterized in that: the test groups were analyzed for their tolerance assessment index under corresponding high temperature testsThe specific analysis process is as follows:
a1, extracting the time point of clicking the screen for each time, the time point of responding to the screen for each time, the RGB value of the screen, the number of the screen cracks and the crack length of each crack from the test data, and calculating the abnormal index of the response speed of each test group under the corresponding high-temperature testScreen color abnormality index->And screen cracking abnormality index->；
A2, setting temperature influence factors corresponding to the test groups according to the thermosensitive images of the sub-areas of the high-temperature test box corresponding to the test groups；
A3, calculating each test group under the corresponding high-temperature testTolerance assessment index of (2)，Wherein->、/>And->Respectively representing response speed abnormality index, screen color abnormality index and screen cracking abnormality index of the setting reference,/>、/>And->And respectively representing the set response speed abnormality, screen color abnormality and screen cracking abnormality corresponding to the tolerance evaluation duty ratio weight under the high-temperature test.
4. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 3, which is characterized in that: the response speed abnormality index of each test group under the corresponding high temperature test is calculatedThe specific calculation process is as follows:
b1, comparing the time point of clicking the screen for each time of each test group on the finished product of each mobile phone touch screen in the corresponding high-temperature test box with the time point of responding to each time of screen to obtain each mobile phone touch screen of each test group in the corresponding high-temperature test boxComparing the response time deviation of the finished products with the response time deviation of the set reference, counting the number of finished products of the mobile phone touch screen, of which the response time deviation of each test group in the corresponding high-temperature test box is larger than the response time deviation of the set reference, and recording the number as the number of abnormal finished products；
B2, recording the number of finished mobile phone touch screen products of the test group as；
B3, extracting the maximum value from the response time deviation of each test group in the corresponding mobile phone touch screen finished product in the high-temperature test box, and marking the maximum value as；
B4, calculating the response speed abnormality index of each test group under the corresponding high-temperature test，/>Wherein->And->Abnormal duty ratio and response time deviation, respectively, of the set reference +.>And->And respectively representing the set abnormal finished product duty ratio and response time deviation corresponding to the response speed abnormal evaluation duty ratio weight.
5. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 3, which is characterized in that: the screen color abnormality index of each test group under the corresponding high-temperature test is calculatedThe specific calculation process is as follows:
c1, respectively marking screen RGB values of the mobile phone touch screen finished products of each test group in the corresponding high-temperature test box as follows、And->Wherein->Number indicating mobile phone touch screen finished product, +.>；
C2, extracting screen RGB values of the mobile phone touch screen in a normal state from the cloud database and respectively marking the values as、/>And->；
C3, calculating the abnormal index of the screen color of each test group under the corresponding high-temperature test，Wherein->And the number of finished touch screen products of the mobile phone is represented.
6. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 3, which is characterized in that: setting temperature influence factors corresponding to each test groupThe specific setting process is as follows:
d1, locating the temperature value of each temperature distribution area from the thermosensitive image of each subarea of the high-temperature test box corresponding to each test group;
d2, carrying out average value calculation on the temperature values of the temperature distribution areas corresponding to the subareas of the high-temperature test boxes corresponding to the test groups to obtain the temperature average value corresponding to the subareas of the high-temperature test boxes corresponding to the test groups, taking the temperature average value as the temperature value corresponding to the subareas of the high-temperature test boxes corresponding to the test groups, and marking the temperature average value as the temperature value corresponding to the subareas of the high-temperature test boxes corresponding to the test groupsWherein->The number representing the sub-region is indicated,；
d3, calculating the temperature uniformity of the high-temperature test boxes corresponding to each test group，/>Wherein, the method comprises the steps of, wherein,indicating the temperature deviation of the set reference +.>Indicate->Sub-area, & lt & gt>Representing natural constants;
d4, calculating the temperature reaching scale of the high-temperature test box corresponding to each test group；
D5, calculating temperature influence factors corresponding to all test groups，/>Wherein->And->Temperature uniformity and temperature up-scale, respectively, representing the set reference, +.>And->The set temperature uniformity and the set temperature arrival scale are respectively represented to corresponding temperature influence factor evaluation duty ratio weights.
7. A touch screen finished product high and low temperature tolerance test analysis according to claim 6The method is characterized in that: the temperature of the high-temperature test box corresponding to each test group is calculated to reach the scaleThe specific calculation process is as follows:
e1, the test temperature of the high-temperature test box corresponding to each test group is recorded as；
E2, comparing the temperature value corresponding to each subarea of the high-temperature test box corresponding to each test group with the test temperature of the high-temperature test box corresponding to each test group, if the temperature value corresponding to each subarea of the high-temperature test box corresponding to a certain test group is smaller than the test temperature of the high-temperature test box, judging the subarea as a temperature substandard subarea, counting the number of the temperature substandard subareas in the high-temperature test box corresponding to each test group, and recording as；
E3, extracting the minimum value from the temperature values corresponding to the sub-areas of which the temperatures of the high-temperature test boxes corresponding to the test groups do not reach the standard, and marking the minimum value as；
E4, calculating the temperature reaching scale of the high-temperature test box corresponding to each test group，/>Wherein->Representing the number of subregions>Indicating that the temperature of the set reference does not reach the standardDomain duty cycle->And->And respectively representing the set temperature substandard subarea duty ratio and the temperature deviation corresponding to the temperature standard evaluation duty ratio weight of the high-temperature test box.
8. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 1, which is characterized in that: the analysis of the tolerance evaluation index of the current production batch corresponding to the high temperature levelThe specific analysis mode is as follows:
f1, evaluating the tolerance index of each test group under the corresponding high temperature testPerforming adjacent comparison to obtain tolerance evaluation deviation of each test group under the corresponding high-temperature test, comparing the tolerance evaluation deviation with the tolerance evaluation deviation of the set reference, counting the number of test groups with the tolerance evaluation deviation larger than the tolerance evaluation deviation of the set reference, and marking as the number of abnormal test groups->；
F2, carrying out average calculation on the tolerance evaluation deviation of each test group under the corresponding high temperature test to obtain the average tolerance evaluation deviation of each test group under the corresponding high temperature test, and recording as；
F3, calculating tolerance evaluation index of the current production batch corresponding to the high temperature layer，/>Wherein->And->The number of abnormal test groups representing the set reference is the ratio and tolerance evaluation deviation, respectively, +.>And->Respectively representing the set number of abnormal test groups and the tolerance evaluation weight corresponding to the tolerance evaluation deviation, +.>The number of test groups is indicated.
9. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 1, which is characterized in that: comprehensive tolerance evaluation index of mobile phone touch screen finished products in current production batchThe calculation formula of (2) is as follows:wherein->And->The tolerance evaluation indexes respectively representing the set high temperature layer and low temperature layer correspond to the comprehensive tolerance evaluation duty ratio weights.
10. The method for analyzing the high-low temperature tolerance test of the touch screen finished product according to claim 5, which is characterized in that: screen cracking abnormality index of each test group under corresponding high temperature testThe specific calculation process is as follows: g1, recording the number of screen cracks of each test group at each mobile phone touch screen finished product in the corresponding high-temperature test box as +.>；
And G2, carrying out average value calculation on the crack length of each test group at each crack of each mobile phone touch screen finished product in the corresponding high-temperature test box to obtain the average crack length of each test group at each mobile phone touch screen finished product in the corresponding high-temperature test box, and marking as；
G3, calculating the screen cracking abnormality index of each test group under the corresponding high-temperature test，/>Wherein->And->Respectively representing the number of screen cracks and the crack length of the set reference, < >>And->Respectively represent the number and the sum of the set screen cracksThe crack length corresponds to the screen crack anomaly evaluation duty cycle.
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