CN117310336A - Testing device for testing voltage sensitivity of equipment to be tested and working method - Google Patents
Testing device for testing voltage sensitivity of equipment to be tested and working method Download PDFInfo
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- CN117310336A CN117310336A CN202311340374.3A CN202311340374A CN117310336A CN 117310336 A CN117310336 A CN 117310336A CN 202311340374 A CN202311340374 A CN 202311340374A CN 117310336 A CN117310336 A CN 117310336A
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- 238000012360 testing method Methods 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 16
- 238000001514 detection method Methods 0.000 claims description 37
- 230000001934 delay Effects 0.000 claims description 3
- 230000003111 delayed effect Effects 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims 8
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- 230000001960 triggered effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention provides a testing device and a working method for testing voltage sensitivity of equipment to be tested, the testing device comprises a mechanical switch and an IGBT switch, two ends of the mechanical switch are connected in parallel with two ends of the IGBT switch, an external power supply is connected with the voltage sensitivity testing device, the voltage sensitivity testing device is respectively connected with the equipment to be tested and one end connected with an MCU main control circuit, the other end of the MCU main control circuit is connected with a data collector, and the data collector is connected with the equipment to be tested.
Description
Technical Field
The invention relates to the technical field of measurement of electric variables, in particular to a testing device for testing voltage sensitivity of equipment to be tested and a working method thereof.
Background
Along with the continuous improvement of information technology, the continuous improvement of enterprise manufacturing process, precision instruments, electrical equipment and the like used in industry continuously improve the quality requirement on power supply voltage, and if voltage sag happens suddenly, the normal operation of voltage sensitive electrical equipment can be affected, even equipment damage can be caused, and serious economic loss is further brought.
The patent document with the publication date of 2013.01.30, whose number is 201210378404.5, discloses a method for detecting the voltage sag sensitivity of sensitive equipment, which is to monitor the frequency of voltage sag and the depth and duration of each voltage sag of a power grid in a certain time period at a measuring point, establish a small sample set of the actual voltage sag of the power grid in the time period, and the final evaluation result depends on the equipment failure rate caused by each actual voltage sag, which is a real reflection of the influence degree of the power grid operation condition on the sensitive equipment in a certain time period, so as to reflect the influence of the voltage sag caused by various short-circuit faults in the power grids with different structures on the sensitive equipment, thereby guiding the relevant departments to take more reasonable treatment measures or providing basis for calculating the economic loss caused by the voltage sag.
The method in the document is that a small sample set of the actual voltage sag of the power grid is established, then the average equipment failure rate of the voltage sag in the small sample set is used as equipment voltage sag sensitivity, and for single equipment, the accuracy of the detected voltage drop sensitivity is low, the accurate range of the voltage drop sensitivity is difficult to accurately detect, and the influence of the voltage sag on the voltage sensitive equipment cannot be accurately avoided.
Disclosure of Invention
The invention aims to provide a testing device and a working method for testing voltage sensitivity of equipment to be tested, which can conveniently and accurately detect an accurate voltage sensitivity range, and are efficient and easy to operate.
The technical scheme adopted by the invention for solving the technical problems is as follows: a testing device for testing voltage sensitivity of a device under test and a working method thereof,
the method comprises the following steps:
(1) The method comprises the steps of disconnecting a mechanical switch and an IGBT switch which are connected in parallel, enabling equipment to be tested, which is connected to the output ends of the mechanical switch and the IGBT switch, to be in a power-off state, and then only closing the mechanical switch, so that an external power supply enables the equipment to be tested to normally power on through the mechanical switch;
(2) After the equipment to be tested runs stably, the MCU main control circuit connected to the IGBT switch controls the IGBT switch to be closed, and delays to the point that the whole circuit runs stably, then the mechanical switch is disconnected, meanwhile, the MCU main control circuit controls the IGBT switch to be disconnected, the equipment to be tested pauses power supply, and the power-off time of the equipment to be tested is recorded;
(3) The time period from the power failure of the equipment to be tested to the complete stop of operation is marked as T, the power of the equipment to be tested is not changed in the time period T and is defined as the voltage sensitivity is not effective, otherwise, the power of the equipment to be tested is defined as the voltage sensitivity is effective;
(4) Drawing a time period T in the step (3) into a straight line segment, detecting in the time period T, dividing the length of the straight line segment into n equal parts with equal distances, and detecting that the device to be detected is positionedThe power state in the interval, when triggering the voltage sensitivity, is +.>Continuously dividing different intervals in the interval and sequentially detecting the intervals; in the absence of trigger voltage sensitivity, in->Expanding the interval value on the basis of the interval to form a new detection interval and detecting;
(5) After the voltage sensitivity test time is over, the MCU main control circuit controls the IGBT switch to be closed, the equipment to be tested is recovered to normally supply power, the mechanical switch is closed, and after the time delay is delayed until the whole circuit stably operates, the MCU main control circuit controls the IGBT switch to be opened, and the equipment to be tested is recovered to normally operate.
According to the setting, the time period T from the power failure of the equipment to be tested to the complete stop operation is recorded, whether the voltage sensitivity is effective or not is judged preliminarily in the time period, the time period is divided into a plurality of equidistant intervals, the voltage sensitivity detection range can be further narrowed, whether the voltage sensitivity is effective or not is triggered again in the detection interval, and therefore the voltage sensitivity can be detected rapidly and accurately in different interval ranges flexibly.
Further, the step (4) further includes the following steps:
(4.1) dividing the [0, n% x T ] interval into equal z equal parts if the trigger voltage sensitivity is effective, sequentially detecting the divided intervals until the trigger voltage sensitivity of the equipment to be tested is effective, and recording the time for testing the equipment to be tested;
(4.2) if the non-trigger voltage sensitivity is effective, updating the voltage value of the device to be tested, and simultaneously sequentially detecting the voltage value in the previous detection intervalExpansion on the basis of (a)>Interval value, wherein k represents the number of interval expansion and forms a new detection interval +.>And for a new detection intervalDetecting until the trigger voltage sensitivity of the device to be detected is judged to be effective, so as to preliminarily know that the voltage sensitivity exists in the detection interval;
and (4.3) dividing the detection interval [ k multiplied by n percent multiplied by T, (k multiplied by 1) multiplied by n percent multiplied by T ] in the step (4.2) into m equal parts with equal intervals, sequentially detecting the divided intervals, repeating the steps (4.1) - (4.2), gradually narrowing the detection interval until the trigger voltage sensitivity of the device to be tested is judged to be effective again, and recording the time for testing the device to be tested.
By the arrangement, whether the trigger voltage sensitivity is effective is further analyzed, the detection interval is further divided again, the detection range is gradually narrowed, and the accuracy of detecting the voltage sensitivity is improved. Further, k in the step (4.2) and z in the step (4.1) are positive integers. This facilitates counting the number of detections.
Further, m in the step (4.3) is equal to or greater than n. Therefore, when the voltage sensitivity is not triggered in the primary detection interval to take effect, different detection ranges can be selected according to actual conditions by subdividing the detection interval again, and then the voltage sensitivity of the equipment to be detected can be accurately measured. Further, n and m in the step (4.3) are positive integers. This facilitates the division into different detection intervals in the time period according to the actual different situations.
Further, the step (2) further includes recording the power-off time as zero time. This facilitates dividing the detection interval from time zero.
Further, the power of the equipment to be tested is collected through a data collector connected to the equipment to be tested and is sent to an MCU main control circuit, and if the power of the equipment to be tested is continuously increased, the equipment to be tested is judged not to be in a stable running state; and if the power of the equipment to be tested fluctuates within the value x, judging that the equipment to be tested is in a stable running state, wherein x is a preset value.
The device is convenient to detect the operation condition of the equipment to be tested effectively before the voltage sensitivity test is carried out, and the phenomenon that the voltage sensitivity test result is affected due to unstable operation of the equipment to be tested is avoided.
Further, the voltage sensitivity testing device comprises a mechanical switch and an IGBT switch, the mechanical switch is connected with the IGBT switch in parallel, an external power supply is connected with the voltage sensitivity testing device, the voltage sensitivity testing device is respectively connected with equipment to be tested and one end of an MCU main control circuit, the other end of the MCU main control circuit is connected with a data collector, and the data collector is connected with the equipment to be tested.
The device can control the closing of the mechanical switch and the IGBT switch through the MCU main control circuit respectively, so that the running stability of the device to be tested is realized, and the voltage sensitivity test of the device to be tested is completed.
Drawings
Fig. 1 is a general workflow diagram of the present invention.
Fig. 2 is a schematic diagram of the overall structure connection of the present invention.
Detailed Description
The invention is described in further detail below with reference to the drawings and the detailed description.
As shown in fig. 1-2, a testing device and a working method for testing voltage sensitivity of equipment to be tested, comprising a voltage sensitivity testing device and equipment to be tested, wherein the voltage sensitivity testing device comprises a mechanical switch 1 and an IGBT switch 2, the mechanical switch 1 is connected in parallel with the IGBT switch 2, an external power supply is connected with one ends of the mechanical switch 1 and the IGBT switch 2, the other ends of the mechanical switch 1 and the IGBT switch 2 are respectively connected with one ends of the equipment to be tested and an MCU master control circuit, the other ends of the MCU master control circuit are connected with a data collector, the data collector is connected with the equipment to be tested,
the working method comprises the following steps:
(1) The mechanical switch 1 and the IGBT switch 2 which are connected in parallel are disconnected, so that the equipment to be tested connected to the output ends of the mechanical switch and the IGBT switch is in a shutdown state, and then the mechanical switch 1 is only closed, so that an external power supply enables the equipment to be tested to normally electrify and operate through the mechanical switch.
The method comprises the steps of (1.1) collecting power of equipment to be tested through a data collector connected to the equipment to be tested and sending the power to an MCU main control circuit, and judging whether the equipment to be tested runs stably through power change of the equipment to be tested;
(1.1.1) if the power of the equipment to be tested is continuously increased, judging that the equipment to be tested is not in a stable running state at present;
and (1.1.2) if the power of the equipment to be tested fluctuates within the preset value a, judging that the equipment to be tested is in a stable running state at present.
(2) After the equipment to be tested runs stably, the MCU main control circuit connected to the IGBT switch controls the IGBT switch to be closed, delays until the whole circuit runs stably, then the mechanical switch is disconnected, meanwhile, the MCU main control circuit controls the IGBT switch to be disconnected, the equipment to be tested pauses power supply, the power-off time of the equipment to be tested is recorded, and the power-off time is recorded as zero time;
(3) The time period from the power failure of the equipment to be tested to the complete stop of operation is marked as T, the power of the equipment to be tested is not changed in the time period T and is defined as the voltage sensitivity is not effective, otherwise, the power of the equipment to be tested is defined as the voltage sensitivity is effective;
(4) Drawing a time period T in the step (3) into a straight line segment, dividing the length of the straight line segment into 10 equal parts with equal distance in the embodiment, wherein 0 represents the starting time of detection in the time period T, and detecting that the device to be detected is positionedThe power state in the interval and judges that the device under test is +.>Whether the triggering voltage sensitivity takes effect in the interval or not, and simultaneously, the data collector collects the data change of the power of the equipment to be tested in real time and feeds the data change back to the MCU master control circuit in real time;
(4.1) if the trigger voltage sensitivity is effective, in this embodimentThe interval is divided into 20 equal parts with equal intervals, the divided intervals are sequentially detected until the trigger voltage sensitivity of the equipment to be tested is judged to be effective, and the time t for testing the equipment to be tested is recorded 1 Specifically, the number of the cells, specifically,
wherein a is represented inThe detection times in the interval, thereby accurately detecting the voltage sensitivity;
(4.2) if the non-triggered voltage sensitivity is in effect, updating the voltage value of the device under test while in the previous detection intervalExpansion on the basis of (a)>In the present embodiment, k represents the 1 st expansion section and forms a new detection section
And for a new detection interval
Detecting until the trigger voltage sensitivity of the device to be detected is judged to be effective, so as to preliminarily learn that the device to be detected is in a detection interval
Voltage sensitivity exists in the circuit;
(4.3) the detection interval in step (4.2) is further followed
Equidistant division is performed, in this embodiment, the detection interval isDividing into 20 equal parts, sequentially detecting the divided intervals, gradually narrowing the detection intervals, sequentially detecting the re-divided detection intervals until the trigger voltage sensitivity of the device to be tested is judged to be effective in the re-divided detection again, and then recording the time t for testing the device to be tested 2 Specifically, the number of the cells, specifically,
wherein b represents a detection intervalThe detection times in the voltage sensor, thereby accurately detecting the voltage sensitivity;
(5) After the voltage sensitivity test time is over, the MCU main control circuit controls the IGBT switch to be closed, the equipment to be tested is recovered to normally supply power, the mechanical switch is closed, and after the time delay is delayed until the whole circuit runs stably, the MCU main control circuit controls the IGBT switch to be opened, and the equipment to be tested is recovered to normally run.
Claims (9)
1. A method of testing voltage sensitivity of a device under test, comprising: the method comprises the following steps:
(1) The method comprises the steps of disconnecting a mechanical switch and an IGBT switch which are connected in parallel, enabling equipment to be tested, which is connected to the output ends of the mechanical switch and the IGBT switch, to be in a power-off state, and then only closing the mechanical switch, so that an external power supply enables the equipment to be tested to normally power on through the mechanical switch;
(2) After the equipment to be tested runs stably, the MCU main control circuit connected to the IGBT switch controls the IGBT switch to be closed, and delays to the point that the whole circuit runs stably, then the mechanical switch is disconnected, meanwhile, the MCU main control circuit controls the IGBT switch to be disconnected, the equipment to be tested pauses power supply, and the power-off time of the equipment to be tested is recorded;
(3) The time period from the power failure of the equipment to be tested to the complete stop of operation is marked as T, the power of the equipment to be tested is not changed in the time period T and is defined as the voltage sensitivity is not effective, otherwise, the power of the equipment to be tested is defined as the voltage sensitivity is effective;
(4) Drawing a time period T in the step (3) into a straight line segment, detecting in the time period T, dividing the length of the straight line segment into n equal parts with equal distances, and detecting that the device to be detected is positionedThe power state in the interval, when triggering the voltage sensitivity, is +.>Continuously dividing different intervals in the interval and sequentially detecting the intervals; in the absence of trigger voltage sensitivity, in->Expanding the interval value on the basis of the interval to form a new detection interval and detecting;
(5) After the voltage sensitivity test time is over, the MCU main control circuit controls the IGBT switch to be closed, the equipment to be tested is recovered to normally supply power, the mechanical switch is closed, and after the time delay is delayed until the whole circuit stably operates, the MCU main control circuit controls the IGBT switch to be opened, and the equipment to be tested is recovered to normally operate.
2. A method of testing voltage sensitivity of a device under test according to claim 1, wherein: the step (4) further comprises the following steps:
(4.1) if the trigger voltage sensitivity is effectiveDividing the interval into equal z equal parts, sequentially detecting the divided intervals until the trigger voltage sensitivity of the equipment to be tested is judged to be effective, and recording the time for testing the equipment to be tested;
(4.2) if the non-trigger voltage sensitivity is effective, updating the voltage value of the device to be tested, and simultaneously sequentially detecting the voltage value in the previous detection intervalExpansion on the basis of (a)>Interval value, wherein k represents the number of interval expansion times, and forms a new detection interval
And for a new detection interval
Detecting until the trigger voltage sensitivity of the device to be detected is judged to be effective, so as to preliminarily know that the voltage sensitivity exists in the detection interval;
(4.3) the detection interval in the step (4.2)
Dividing into equidistant m equal parts, sequentially detecting the divided intervals, repeating the steps (4.1) - (4.2), gradually narrowing the detection interval until the trigger voltage sensitivity of the equipment to be tested is judged to be effective again, and recording the time for testing the equipment to be tested.
3. A method of testing voltage sensitivity of a device under test as claimed in claim 2, wherein: k and z are positive integers.
4. A method of testing voltage sensitivity of a device under test as claimed in claim 2, wherein: m is equal to or greater than n.
5. The method of testing voltage sensitivity of a device under test of claim 4, wherein: n and m are positive integers.
6. A method of testing voltage sensitivity of a device under test according to claim 1, wherein: the step (2) further comprises the step of recording the power-off time as zero time.
7. A method of testing voltage sensitivity of a device under test according to claim 1, wherein: the power of the equipment to be tested is collected through a data collector connected to the equipment to be tested and is sent to an MCU main control circuit, and if the power of the equipment to be tested is continuously increased, the equipment to be tested is judged not to be in a stable running state; and if the power of the equipment to be tested fluctuates within the x value, judging that the equipment to be tested is in a stable running state.
8. A method of testing voltage sensitivity of a device under test as recited in claim 7, wherein: a is a preset value.
9. The voltage sensitivity testing device of the method for testing the voltage sensitivity of the equipment to be tested comprises the voltage sensitivity testing device and the equipment to be tested, and is characterized in that: the voltage sensitivity testing device comprises a mechanical switch and an IGBT switch, the mechanical switch is connected with the IGBT switch in parallel, an external power supply is connected with the voltage sensitivity testing device, the voltage sensitivity testing device is respectively connected with equipment to be tested and one end of an MCU main control circuit, the other end of the MCU main control circuit is connected with a data collector, and the data collector is connected with the equipment to be tested.
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| CN202311340374.3A CN117310336A (en) | 2023-10-17 | 2023-10-17 | Testing device for testing voltage sensitivity of equipment to be tested and working method |
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| CN202311340374.3A CN117310336A (en) | 2023-10-17 | 2023-10-17 | Testing device for testing voltage sensitivity of equipment to be tested and working method |
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