CN117304719A - Preparation method of low-refractive-index silicon dioxide film - Google Patents

Preparation method of low-refractive-index silicon dioxide film Download PDF

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Publication number
CN117304719A
CN117304719A CN202311259847.7A CN202311259847A CN117304719A CN 117304719 A CN117304719 A CN 117304719A CN 202311259847 A CN202311259847 A CN 202311259847A CN 117304719 A CN117304719 A CN 117304719A
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acid
parts
refractive index
silicon dioxide
minutes
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王云
陈维恕
黄师侨
余镭
何丹丹
李铮
陈梓铭
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Quatec Guangzhou New Materials Co ltd
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/1204Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
    • C23C18/1208Oxides, e.g. ceramics
    • C23C18/1212Zeolites, glasses
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B33/00Silicon; Compounds thereof
    • C01B33/113Silicon oxides; Hydrates thereof
    • C01B33/12Silica; Hydrates thereof, e.g. lepidoic silicic acid
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/009After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/45Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
    • C04B41/4505Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application
    • C04B41/455Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/45Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
    • C04B41/50Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D7/00Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
    • C09D7/40Additives
    • C09D7/60Additives non-macromolecular
    • C09D7/63Additives non-macromolecular organic

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Abstract

The invention belongs to the technical field of semiconductor materials, and particularly relates to a preparation method of a low-refractive-index silicon dioxide film, which comprises the following steps: preparing a low refractive index silica coating solution; the solution is filtered under pressure by using a filter element, and the solution is uniformly coated on a silicon wafer at 3000rpm/min by using a spin coating method; placing the silicon wafer on a baking tray, heating at 80 ℃ for 2 minutes, heating at 150 ℃ for 2 minutes, and heating at 300 ℃ for 10 minutes to form a porous silicon dioxide film; the low-refractive-index silicon dioxide coating solution comprises the following components in parts by weight: 16-20 parts of siloxane compound, 8-12 parts of alkyl quaternary ammonium salt, 1-2 parts of catalyst, 1-2 parts of surfactant with solid content of 1.75%, 100-120 parts of solvent and 10-15 parts of deionized water. The invention can prepare the silicon dioxide film with the refractive index below 1.2, has simple preparation device, and is convenient for economically and efficiently finishing large-area coating and coating of components with complex forms.

Description

Preparation method of low-refractive-index silicon dioxide film
Technical Field
The invention relates to the technical field of semiconductor materials, in particular to a preparation method of a low-refractive-index dioxide film.
Background
Silicon dioxide films have been widely used in the fields of semiconductors, microwaves, optoelectronics, optical devices, film sensors, and the like with their excellent properties. Silicon oxide films are used in microelectronics as diffusion masking layers, insulating gates for MOS devices, insulating spacers for multilayer wiring, passivation protection layers for device surfaces, and the like. For silicon dioxide films used in microelectronics and sensor technology, electrical performance indicators such as dielectric constant, breakdown field strength, insulation resistance, fixed charge and movable charge density of the silicon dioxide film are of interest. The silicon dioxide film applied to the field of optical coating is more focused on the index of optical performance such as refractive index, extinction coefficient and transparent interval of the film layer.
The introduction of porosity can effectively reduce the refractive index of the material, so that the mesoporous material is widely applied to the aspects of chemical sensing, novel photoelectric materials and the like. For example, patent CN111253854A, CN101016415B is all laid out around the subject of porous silica films. The technology in the patent has the defects of high equipment precision requirement, high equipment investment and high process difficulty.
Disclosure of Invention
The invention aims to solve the problems and provide a preparation method of a low-refractive-index silicon dioxide film.
In order to achieve the above object, the present invention provides a method for preparing a low refractive index silica film, comprising:
preparing a low refractive index silica coating solution;
the solution is filtered under pressure by using a filter element, and the solution is uniformly coated on a silicon wafer at 3000rpm/min by using a spin coating method;
placing the silicon wafer on a baking tray, heating at 80 ℃ for 2 minutes, heating at 150 ℃ for 2 minutes, and heating at 300 ℃ for 10 minutes to form a porous silicon dioxide film;
the low-refractive-index silicon dioxide coating solution comprises the following components in parts by weight: 16-20 parts of siloxane compound, 8-12 parts of alkyl quaternary ammonium salt, 1-2 parts of catalyst, 1-2 parts of surfactant with solid content of 1.75%, 100-120 parts of solvent and 10-15 parts of deionized water.
Further, the siloxane compound is one or more of trimethoxysilane, methyltriethoxysilane and ethyl orthosilicate.
Further, the alkyl quaternary ammonium salt is dodecyl trimethyl ammonium chloride.
Further, the catalyst is one or more of hydrochloric acid, nitric acid, boric acid, hydrofluoric acid, sulfuric acid, carbonic acid, phosphoric acid, formic acid, acetic acid, propionic acid, butyric acid, caprylic acid, oxalic acid, malonic acid, succinic acid, maleic acid, tartaric acid, benzoic acid, phenylacetic acid, phthalic acid, terephthalic acid, valeric acid, caproic acid, capric acid, palmitic acid and acrylic acid.
Further, the surfactant is one or more of stearic acid, sodium dodecyl benzene sulfonate, alkyl glucoside and fatty glyceride.
Further, the solvent is one or more of acetone, isopropanol, n-butanol, PGMEA, pentane, hexane, octane, formic acid, acetic acid, diethyl ether, anisole, propanol, 2-propanol, butanol, 2-butanol, amyl alcohol, butyl acetate, tributylmethyl ethyl ether, isopropyl acetate, methyl ethyl ketone, dimethyl sulfoxide, isopropyl benzene, ethyl acetate, ethyl formate, isobutyl acetate, methyl acetate, 3-methyl-1-butanol, methyl isobutyl ketone, 2-methyl-1-propanol, propyl acetate, cyclohexane, and cyclohexanone.
The invention uses the coating containing the hydrolysate of the siloxane compound, the thermal decomposition component, the catalyst, the surfactant and the solvent to coat on the silicon wafer, and the thermal decomposition component volatilizes when heating and solidifying, so that the silicon dioxide film with multiple pores and refractive index below 1.2 can be formed, and the preparation device is simple, thereby being convenient for economically and efficiently completing large-area coating and coating of components with complex forms.
Detailed Description
The present invention will be described in detail with reference to the following specific embodiments, which are not to be construed as being limited thereto.
The invention provides a preparation method of a low-refractive-index silicon dioxide film, which comprises the following steps: preparing a low refractive index silica coating solution; the solution is filtered under pressure by using a filter element, and the solution is uniformly coated on a silicon wafer at 3000rpm/min by using a spin coating method; the silicon wafer is placed on a baking tray and heated at 80 ℃ for 2 minutes, at 150 ℃ for 2 minutes and at 300 ℃ for 10 minutes to form the porous silicon dioxide film.
In the invention, the low refractive index silica coating solution comprises the following components in parts by weight: 16-20 parts of siloxane compound, 8-12 parts of alkyl quaternary ammonium salt, 1-2 parts of catalyst with solid content of 1.75%, 1-2 parts of surfactant, 100-120 parts of solvent and 10-15 parts of deionized water.
Wherein the siloxane compound is one or more of trimethoxy silane, methyltriethoxy silane and ethyl orthosilicate. The alkyl quaternary ammonium salt is dodecyl trimethyl ammonium chloride. The catalyst is one or more of hydrochloric acid, nitric acid, boric acid, hydrofluoric acid, sulfuric acid, carbonic acid, phosphoric acid, formic acid, acetic acid, propionic acid, butyric acid, caprylic acid, oxalic acid, malonic acid, succinic acid, maleic acid, tartaric acid, benzoic acid, phenylacetic acid, phthalic acid, terephthalic acid, valeric acid, caproic acid, capric acid, palmitic acid and acrylic acid. The surfactant is one or more of stearic acid, sodium dodecyl benzene sulfonate, alkyl glucoside and fatty glyceride. The solvent is one or more of acetone, isopropanol, n-butanol, PGMEA, pentane, hexane, octane, formic acid, acetic acid, diethyl ether, anisole, propanol, 2-propanol, butanol, 2-butanol, amyl alcohol, butyl acetate, tributylmethyl ethyl ether, isopropyl acetate, methyl ethyl ketone, dimethyl sulfoxide, isopropyl benzene, ethyl acetate, ethyl formate, isobutyl acetate, methyl acetate, 3-methyl-1-butanol, methyl isobutyl ketone, 2-methyl-1-propanol, propyl acetate, cyclohexane and cyclohexanone.
The invention uses the coating containing the hydrolysate of the siloxane compound, the thermal decomposition component, the catalyst, the surfactant and the solvent to coat on the silicon wafer, and the thermal decomposition component volatilizes when heating and solidifying, so that the silicon dioxide film with multiple pores and refractive index below 1.2 can be formed, and the preparation device is simple, thereby being convenient for economically and efficiently completing large-area coating and coating of components with complex forms.
The following is a description of the method for preparing a silica film according to the present invention by way of specific examples:
example 1:
9.5g of ethyl orthosilicate, 8.5g of methyltriethoxysilane, 10g of dodecyl trimethyl ammonium chloride, 1.5g of nitric acid, 105g of n-butanol and 15g of deionized water are added into a 250m l flask, mixed and stirred for 48 hours at normal temperature, and 1g of stearic acid with 1.75% of solid content is added to form a low-refractive-index silica coating solution; the low refractive index silica solution was pressure filtered using a 0.2 micron filter cartridge, uniformly coated onto an 8 inch silicon wafer using spin coating at 3000rpm/min, and the wafer was placed on a baking pan and heated at 80 c for 2 minutes, 150 c for 2 minutes, and 300 c for 10 minutes.
Example 2:
the siloxane compound was 16g trimethoxysilane, the alkyl quaternary ammonium salt was 8g dodecyltrimethylammonium chloride, the catalyst was 0.5g hydrochloric acid, 0.5g formic acid, the solvent was 30g acetone, 70g acetone, 10g deionized water, the surfactant was 1g sodium dodecylbenzenesulfonate, 1g alkyl glucoside, and the other conditions were the same as in the example.
Example 3:
the conditions were the same as in example 1 except that the siloxane compound was selected from 4g trimethoxysilane, 8g methyltriethoxysilane, 8g ethylorthosilicate, the alkyl quaternary ammonium salt was selected from 12g dodecyltrimethylammonium chloride, the catalyst was selected from 1g nitric acid, 0.5g formic acid, 0.5 phenylacetic acid, the solvent was selected from 60g ethyl acetate, 40g 3-methyl-1-butanol, 20g isopropyl acetate, 12g deionized water, the surfactant was selected from 1.5g fatty acid glyceride.
Example 4:
the siloxane compound was selected from 9.5g of ethyl orthosilicate and 8.5g of trimethoxysilane, and the other conditions were the same as in example 1.
Comparative example 1:
the other conditions were the same as in example 1 without adding a surfactant.
Comparative example 2:
the surfactant was sodium hexadecyl benzene sulfonate, and the other conditions were the same as in example 1.
Comparative example 3:
the surfactant solids content was 3% and the rest of the conditions were the same as in example 1.
Comparative example 4:
heating was performed at 300℃for 7 minutes, and the other conditions were the same as in example 1.
Comparative example 5:
heating was performed at 300℃for 20 minutes, and the other conditions were the same as in example 1.
Comparative example 6:
the coating speed was 1000rpm/min and the heating was carried out at 300℃for 20 minutes, the other conditions being the same as in example 1.
Comparative example 7:
the coating speed was 2000rpm/min and the heating was carried out at 300℃for 20 minutes, the other conditions being the same as in example 1.
The results of the above experiments are shown in the following table:
uniformity of film surface% Film thickness/nm Refractive index Extinction coefficient
Example 1 5.04 181.73 1.17 0.0019
Example 2 5.01 182.35 1.19 0.0017
Example 3 5.01 181.65 1.18 0.0018
Example 4 5.10 178.49 1.20 0.0015
Comparative example 1 Film formation prevention / / /
Comparative example 2 4.77 194.30 1.31 0.00021
Comparative example 3 Poor film surface / / /
Comparative example 4 6.47 177.28 1.29 0.0017
Comparative example 5 6.96 180.30 1.21 0.0014
Comparative example 6 2.58 308.90 1.19 0.00028
Comparative example 7 2.0 226.20 1.19 0.00024
From the above experimental data, the refractive index of the silica thin film prepared by the low refractive index silica thin film preparation method of the present invention can be 1.2 or less.
The above description is only one embodiment of the present invention and is not intended to limit the present invention, and various modifications and variations of the present invention will be apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (6)

1. A method for preparing a low refractive index silica film, comprising:
preparing a low refractive index silica coating solution;
the solution is filtered under pressure by using a filter element, and the solution is uniformly coated on a silicon wafer at 3000rpm/min by using a spin coating method;
placing the silicon wafer on a baking tray, heating at 80 ℃ for 2 minutes, heating at 150 ℃ for 2 minutes, and heating at 300 ℃ for 10 minutes to form a porous silicon dioxide film;
the low-refractive-index silicon dioxide coating solution comprises the following components in parts by weight: 16-20 parts of siloxane compound, 8-12 parts of alkyl quaternary ammonium salt, 1-2 parts of catalyst, 1-2 parts of surfactant with solid content of 1.75%, 100-120 parts of solvent and 10-15 parts of deionized water.
2. The method for producing a low refractive index silica film according to claim 1, wherein the siloxane compound is one or more of trimethoxysilane, methyltriethoxysilane, and ethyl orthosilicate.
3. The method for producing a low refractive index silica film according to claim 1, wherein the alkyl quaternary ammonium salt is dodecyl trimethyl ammonium chloride.
4. The method for preparing a low refractive index silica film according to claim 1, wherein the catalyst is one or more of hydrochloric acid, nitric acid, boric acid, hydrofluoric acid, sulfuric acid, carbonic acid, phosphoric acid, formic acid, acetic acid, propionic acid, butyric acid, caprylic acid, oxalic acid, malonic acid, succinic acid, maleic acid, tartaric acid, benzoic acid, phenylacetic acid, phthalic acid, terephthalic acid, valeric acid, caproic acid, capric acid, palmitic acid, and acrylic acid.
5. The method for producing a low refractive index silica film according to claim 1, wherein the surfactant is one or more of stearic acid, sodium dodecylbenzenesulfonate, alkyl glucoside, and fatty acid glyceride.
6. The method for producing a low refractive index silica film according to claim 1, wherein the solvent is one or more of acetone, isopropyl alcohol, n-butanol, PGMEA, pentane, hexane, octane, formic acid, acetic acid, diethyl ether, anisole, propanol, 2-propanol, butanol, 2-butanol, pentanol, butyl acetate, tributylmethylethyl ether, isopropyl acetate, methyl ethyl ketone, dimethyl sulfoxide, isopropyl benzene, ethyl acetate, ethyl formate, isobutyl acetate, methyl acetate, 3-methyl-1-butanol, methyl isobutyl ketone, 2-methyl-1-propanol, propyl acetate, cyclohexane, and cyclohexanone.
CN202311259847.7A 2023-09-27 2023-09-27 Preparation method of low-refractive-index silicon dioxide film Pending CN117304719A (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1824691A (en) * 2004-11-24 2006-08-30 三星康宁株式会社 Method of preparing mesoporous thin film having low dielectric constant
JP2006350025A (en) * 2005-06-16 2006-12-28 Ulvac Japan Ltd Ultra-low refractive index film and method for fabricating the same
CN101016415A (en) * 2006-02-07 2007-08-15 东京应化工业株式会社 Composition for forming low refractive index silica-based film
CN101983223A (en) * 2008-04-02 2011-03-02 三井化学株式会社 Composition and method for production thereof, porous material and method for production thereof, interlayer insulating film, semiconductor material, semiconductor device, and low-refractive-index surface protection film

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1824691A (en) * 2004-11-24 2006-08-30 三星康宁株式会社 Method of preparing mesoporous thin film having low dielectric constant
JP2006350025A (en) * 2005-06-16 2006-12-28 Ulvac Japan Ltd Ultra-low refractive index film and method for fabricating the same
CN101016415A (en) * 2006-02-07 2007-08-15 东京应化工业株式会社 Composition for forming low refractive index silica-based film
CN101983223A (en) * 2008-04-02 2011-03-02 三井化学株式会社 Composition and method for production thereof, porous material and method for production thereof, interlayer insulating film, semiconductor material, semiconductor device, and low-refractive-index surface protection film

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