CN117299576A - Integrated circuit four-station test sorting machine - Google Patents

Integrated circuit four-station test sorting machine Download PDF

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Publication number
CN117299576A
CN117299576A CN202311483857.9A CN202311483857A CN117299576A CN 117299576 A CN117299576 A CN 117299576A CN 202311483857 A CN202311483857 A CN 202311483857A CN 117299576 A CN117299576 A CN 117299576A
Authority
CN
China
Prior art keywords
integrated circuit
supporting plate
station test
base
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202311483857.9A
Other languages
Chinese (zh)
Inventor
吴灿煌
苏华庭
殷小罕
黄敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hefei Core Semiconductor Co ltd
Original Assignee
Hefei Core Semiconductor Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hefei Core Semiconductor Co ltd filed Critical Hefei Core Semiconductor Co ltd
Priority to CN202311483857.9A priority Critical patent/CN117299576A/en
Publication of CN117299576A publication Critical patent/CN117299576A/en
Pending legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/361—Processing or control devices therefor, e.g. escort memory
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/361—Processing or control devices therefor, e.g. escort memory
    • B07C5/362—Separating or distributor mechanisms
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/38—Collecting or arranging articles in groups

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses an integrated circuit four-station test sorting machine which comprises a support base and a fixed base, wherein the front part of the upper end, the left part of the upper end and the rear part of the upper end of the support base are all provided with material receiving devices, the fixed base is provided with four, one ends of the four fixed bases, which are opposite to each other, are all provided with storage devices, the upper ends of the four fixed bases are respectively provided with a limiting conveying device and a supporting column, the upper ends of the four supporting columns are all provided with test devices, and the upper ends of the four test devices are all provided with heat dissipation devices. According to the integrated circuit four-station test sorting machine, the integrated circuits are continuously conveyed and tested through the conveying belt of the limiting conveying device, so that the testing efficiency of the device is improved, the limiting plate is driven by the hydraulic cylinder to adjust the upper part of the conveying belt, further, the shaking and shifting of the integrated circuits of different types during conveying are avoided, and further, the testing effect of the device is improved.

Description

Integrated circuit four-station test sorting machine
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to a four-station testing and sorting machine for integrated circuits.
Background
The integrated circuit can be used for data processing and operation, including a Central Processing Unit (CPU), a memory (RAM, ROM), a logic gate circuit and the like of a computer, can efficiently process and store data, is a core component of the computer and electronic equipment, plays an important role in industrial control, an automation system, household appliances and the like, and can be used for sensor signal processing, motion control, temperature control and the like, so that the production efficiency and the life convenience are improved. Therefore, the integrated circuit has important roles in modern technology, is a core component of various electronic devices and systems, and is continuously developed and innovated, so that the progress of the modern technology and the convenience of human life are promoted.
However, after the integrated circuits are produced, an integrated circuit test handler, which is a special device for testing and sorting Integrated Circuits (ICs), is a very critical link in the semiconductor industry for quality and performance testing of the integrated circuits, and is used for automatically testing and sorting the ICs to ensure that the quality and function thereof meet the standard requirements. However, after the defective integrated circuits are detected, the conventional test sorting machine usually stops conveying and is manually taken out, so that time and labor can be wasted, normal or damaged integrated circuits are not well distinguished and collected, and certain limitation exists in the use of the device; in addition, when carrying, the integrated circuit of different models is not had fine spacing, and it is comparatively easily influenced by the conveyer belt and is led to the skew, and then influences the test quality and the efficiency of device. In summary, the conventional test handler has the following problems:
1. after detecting the defective integrated circuit, the normal or damaged integrated circuit is not well distinguished and collected, so that the device has certain limitation in use; 2. when carrying, if not very good spacing of integrated circuit of different models, it is comparatively easily influenced by the conveyer belt and leads to the skew, and then influences the test quality and the efficiency of device.
Therefore, we propose a four-station test handler for integrated circuits.
Disclosure of Invention
The invention mainly aims to provide a four-station test sorting machine for integrated circuits, which can effectively solve the problems in the background technology.
In order to achieve the above purpose, the technical scheme adopted by the invention is as follows:
the utility model provides an integrated circuit four station test sorting machine, includes support base and unable adjustment base, support base upper end front portion, upper end left portion and upper end rear portion all install material receiving device, unable adjustment base is provided with four, four unable adjustment base is all installed the storage device in the one end of every two looks backs of unable adjustment base, four spacing conveyor and support column are installed respectively to unable adjustment base upper end, four testing arrangement is all installed to the support column upper end, four heat abstractor is all installed to the testing arrangement upper end.
Preferably, the limit conveying device comprises a first supporting plate and a second supporting plate, two driving rollers are arranged at one ends of the first supporting plate and the second supporting plate, the surfaces of the driving rollers are jointly provided with a conveying belt, a first motor is arranged at the left part of the rear end of the second supporting plate, mounting blocks are arranged at the middle part of the front end of the first supporting plate and the middle part of the rear end of the second supporting plate, hydraulic cylinders are arranged at one ends of the mounting blocks, limiting plates are arranged at one ends of the hydraulic cylinders, and the first supporting plate and the second supporting plate are arranged at the upper end of a fixed base. The driving roller is driven by the motor, the driving roller further drives the conveying belt, the conveying belt further drives the integrated circuit on the conveying belt to be transferred to the lower part of the testing device, the integrated circuit is continuously conveyed and tested through the conveying belt, and then the testing efficiency of the device is improved.
Preferably, the material receiving device comprises a second motor, a rotating disc is arranged at the upper end of the second motor, mounting grooves are formed in the left part of the upper end of the rotating disc and the right part of the upper end of the rotating disc, a first material receiving box and a second material receiving box are respectively arranged in the two mounting grooves, and the second motor is arranged at the upper end of the supporting base. The first material receiving box and the second material receiving box on the second motor are driven to rotate through the second motor, so that the first material receiving box and the second material receiving box are aligned to the lower part of the conveying belt according to the quality of the integrated circuit, and the normal or damaged integrated circuit is distinguished and collected, and the practicability of the device is improved.
Preferably, the testing device comprises a testing mechanism, a controller is arranged at the front end of the testing mechanism, a camera is arranged at the left end of the testing mechanism, a camera is arranged at the lower end of the camera, a connecting wire is jointly arranged at the front end of the camera and the front end of the controller, and the testing mechanism is arranged at the upper end of the supporting column. The integrated circuit information is transmitted into the controller through the camera, and the controller analyzes the integrated circuit information to judge the quality of the integrated circuit.
Preferably, the heat dissipating device comprises a mounting frame and a fan, mounting screws are mounted at the front part of the upper end of the fan and the rear part of the upper end of the fan, vent holes are formed in the middle of the upper end of the mounting frame, screw holes are formed in the front part of the upper end of the mounting frame and the rear part of the upper end of the mounting frame, the fan is mounted at the upper end of the mounting frame through the mounting screws, and the mounting frame is mounted at the upper end of the testing mechanism. The fan rotates to blow air, and the air is blown into the testing mechanism through the vent holes, so that material resources of the testing mechanism are radiated, and the using effect and the service life of the testing mechanism are improved.
Preferably, the storage device comprises four storage drawers, the middle parts of the front ends of the four storage drawers are provided with pulling handles, the front ends of the fixed bases are provided with four drawer openings, and the four storage drawers are respectively positioned in the four drawer openings. Through the design of storing drawer, not only conveniently store debris, when needs simultaneously, the storing drawer can be replaced for receiving the magazine, and then conveniently dock the storage and the change of magazine.
Preferably, the front part of the upper end, the left part of the upper end and the rear part of the upper end of the support base are all provided with fixing grooves, and the lower end of the support base is provided with an anti-skid base.
Preferably, a gap exists between the limiting plate and the conveying belt.
Preferably, the camera is electrically connected with the controller through a connecting wire.
Compared with the prior art, the invention has the following beneficial effects:
1. when the integrated circuit needs to be tested, the driving roller is driven by the motor I on the limiting conveying device, the driving roller further drives the conveying belt, the conveying belt further drives the integrated circuit on the driving roller to be transferred to the lower part of the testing device, at the moment, integrated circuit information is transmitted to the controller through the camera, the controller is used for analyzing to judge whether the integrated circuit is good or bad, the integrated circuit is continuously conveyed and tested through the conveying belt, and further the testing efficiency of the device is improved.
2. After the integrated circuit test, connect magazine and No. two connect the magazine to rotate through the motor drive on the receiving device No. two on it, make No. one connect the magazine and connect the magazine to align the lower part of conveyer belt according to the quality of integrated circuit No. two to distinguish the collection to normal or integrated circuit that damages, and then improved the practicality of device, connect the magazine and No. two connect the magazine all through the mounting groove joint in the rolling disc upper end simultaneously, and then make No. one connect the magazine and No. two connect the magazine install and dismantle all comparatively convenient.
3. After the testing mechanism works for a long time, the fan at the upper end of the heat radiating device rotates and blows air, and the air is blown into the testing mechanism through the vent holes, so that the testing mechanism is subjected to material resource heat radiation, and the use effect and the service life of the testing mechanism are improved.
4. Through the design of storing drawer on the storage device, not only conveniently store debris, when needs, the storage drawer can be replaced for receiving the magazine simultaneously, and then conveniently dock the storage and the change of magazine.
Drawings
FIG. 1 is a block diagram of an integrated circuit four-station test handler of the present invention;
FIG. 2 is a schematic diagram of a limit conveyer of a four-station test handler for integrated circuits according to the present invention;
FIG. 3 is a schematic view of a receiving device of a four-station test handler for integrated circuits according to the present invention;
FIG. 4 is a schematic diagram of a testing apparatus of a four-station testing and sorting machine for integrated circuits according to the present invention;
FIG. 5 is a schematic diagram of a heat dissipation device of a four-station test handler for integrated circuits according to the present invention;
FIG. 6 is a schematic diagram of a storage device of a four-station test handler for integrated circuits according to the present invention;
fig. 7 is a schematic diagram showing the overall structure of a support base of a four-station test handler for integrated circuits according to the present invention.
In the figure: 1. a support base; 2. a limit conveying device; 3. a receiving device; 4. a testing device; 5. a heat sink; 6. a storage device; 7. a fixed base; 8. a support column; 20. a first support plate; 21. a second supporting plate; 22. a driving roller; 23. a conveyor belt; 24. a motor I; 25. a mounting block; 26. a hydraulic cylinder; 27. a limiting plate; 30. a motor II; 31. a first material receiving box; 32. a second material receiving box; 33. a rotating disc; 34. a mounting groove; 40. a testing mechanism; 41. a controller; 42. a camera; 43. a camera; 44. a connecting wire; 50. a mounting frame; 51. a fan; 52. screw holes; 53. a vent hole; 54. installing a screw; 60. a storage drawer; 61. pulling the handle; 62. a drawer opening; 71. a fixing groove; 72. an anti-skid base.
Detailed Description
The invention is further described in connection with the following detailed description, in order to make the technical means, the creation characteristics, the achievement of the purpose and the effect of the invention easy to understand.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific direction, be configured and operated in the specific direction, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "provided," "connected," and the like are to be construed broadly, and may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
As shown in fig. 1-7, an integrated circuit four-station test separator comprises a support base 1 and a fixing base 7, wherein the front part of the upper end of the support base 1, the left part of the upper end and the rear part of the upper end are all provided with a material receiving device 3, the fixing base 7 is provided with four fixing bases 7, one ends of the four fixing bases 7, which are opposite to each other, are all provided with a storage device 6, the upper ends of the four fixing bases 7 are respectively provided with a limit conveying device 2 and a support column 8, the upper ends of the four support columns 8 are respectively provided with a test device 4, and the upper ends of the four test devices 4 are respectively provided with a heat dissipation device 5.
The limit conveying device 2 comprises a first supporting plate 20 and a second supporting plate 21, two driving rollers 22 are arranged at corresponding ends of the first supporting plate 20 and the second supporting plate 21, a conveying belt 23 is jointly arranged on the surfaces of the two driving rollers 22, a first motor 24 is arranged at the left part of the rear end of the second supporting plate 21, mounting blocks 25 are arranged at the middle part of the front end of the first supporting plate 20 and the middle part of the rear end of the second supporting plate 21, hydraulic cylinders 26 are arranged at corresponding ends of the two mounting blocks 25, limit plates 27 are arranged at corresponding ends of the two hydraulic cylinders 26, and the first supporting plate 20 and the second supporting plate 21 are arranged at the upper end of the fixed base 7; a gap exists between the limiting plate 27 and the conveyor belt 23. The driving roller 22 is driven by the first motor 24, the driving roller 22 further drives the conveying belt 23, the conveying belt 23 further drives the integrated circuit on the conveying belt 23 to be transferred to the lower portion of the testing device 4, the integrated circuit is continuously conveyed and tested through the conveying belt 23, and then the testing efficiency of the device is improved.
The material receiving device 3 comprises a second motor 30, a rotating disc 33 is arranged at the upper end of the second motor 30, mounting grooves 34 are formed in the left part of the upper end of the rotating disc 33 and the right part of the upper end of the rotating disc 33, a first material receiving box 31 and a second material receiving box 32 are respectively arranged in the two mounting grooves 34, and the second motor 30 is arranged at the upper end of the supporting base 1. The first material receiving box 31 and the second material receiving box 32 are driven to rotate by the second motor 30, so that the first material receiving box 31 and the second material receiving box 32 are aligned to the lower part of the conveying belt 23 according to the quality of the integrated circuit, and the normal or damaged integrated circuit is distinguished and collected, so that the practicability of the device is improved.
The testing device 4 comprises a testing mechanism 40, a controller 41 is arranged at the front end of the testing mechanism 40, a camera 42 is arranged at the left end of the testing mechanism 40, a camera 43 is arranged at the lower end of the camera 42, a connecting wire 44 is jointly arranged at the front end of the camera 42 and the front end of the controller 41, and the testing mechanism 40 is arranged at the upper end of the supporting column 8; the camera 42 is electrically connected to the controller 41 via a connection line 44. The integrated circuit information is transmitted to the controller 41 through the camera 43, and the controller 41 analyzes the integrated circuit information to determine whether the integrated circuit is good or bad.
The heat dissipating device 5 comprises a mounting frame 50 and a fan 51, wherein mounting screws 54 are mounted at the front part of the upper end and the rear part of the upper end of the fan 51, a vent hole 53 is formed in the middle of the upper end of the mounting frame 50, screw holes 52 are formed in the front part of the upper end and the rear part of the upper end of the mounting frame 50, the fan 51 is mounted at the upper end of the mounting frame 50 through the mounting screws 54, and the mounting frame 50 is mounted at the upper end of the test mechanism 40. The fan 51 rotates to blow air, and the air is blown into the testing mechanism 40 through the vent hole 53, so that material resources of the testing mechanism 40 are radiated, and the use effect and the service life of the testing mechanism are improved.
The storage device 6 comprises four storage drawers 60, wherein the four storage drawers 60 are provided with pulling handles 61 at the middle parts of the front ends of the four storage drawers 60, four drawer openings 62 are formed in the front end of the fixed base 7, and the four storage drawers 60 are respectively positioned in the four drawer openings 62. Through the design of storing drawer 60, not only conveniently store debris, when needs simultaneously, storing drawer 60 can replace for receiving the magazine, and then conveniently dock the storage and the change of magazine.
The front part of the upper end, the left part of the upper end and the rear part of the upper end of the support base 1 are all provided with fixing grooves 71, and the lower end of the support base 1 is provided with an anti-skid base 72.
It should be noted that, the invention is an integrated circuit four-station test sorting machine, when the integrated circuit needs to be tested, the driving roller 22 is driven by the motor 24 on the limit conveying device 2, the driving roller 22 drives the conveying belt 23, the conveying belt 23 drives the integrated circuit on the driving roller to be transferred to the lower part of the testing device 4, at this time, the integrated circuit information is transmitted to the controller 41 through the camera 43, the controller 41 analyzes to judge whether the integrated circuit is good or not, the conveying belt 23 continuously carries out the conveying test on the integrated circuit, thereby improving the testing efficiency of the device, in addition, the hydraulic cylinder 26 drives the limit plate 27 to adjust the upper part of the conveying belt 23, thereby avoiding the shaking and shifting of the integrated circuits of different types during the conveying, further improving the testing effect of the device, in addition, the design of the four stations of the device further improves the testing efficiency of the device, after the integrated circuit is tested, the first material receiving box 31 and the second material receiving box 32 on the material receiving device 3 are driven to rotate by the second motor 30, so that the first material receiving box 31 and the second material receiving box 32 are aligned to the lower part of the conveying belt 23 according to the quality of the integrated circuit, normal or damaged integrated circuits are collected in a distinguishing way, the practicability of the device is improved, meanwhile, the first material receiving box 31 and the second material receiving box 32 are clamped at the upper end of the rotating disc 33 through the mounting groove 34, the mounting and dismounting of the first material receiving box 31 and the second material receiving box 32 are convenient, meanwhile, by the design of the storage drawer 60 on the storage device 6, sundries are conveniently stored, and meanwhile, the storage drawer 60 can be replaced by the material receiving boxes when needed, so that the storage and replacement of the material receiving boxes are convenient, after the test mechanism 40 works for a long time, the fan 51 at the upper end of the heat dissipating device 5 rotates to blow air, and the air is blown into the test mechanism 40 through the vent hole 53, so that the test mechanism 40 dissipates heat in material resources, and the use effect and the service life of the test mechanism are improved.
The foregoing has shown and described the basic principles and main features of the present invention and the advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present invention, and various changes and modifications may be made without departing from the spirit and scope of the invention, which is defined in the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (9)

1. The utility model provides an integrated circuit four-station test sorter, includes support base (1) and unable adjustment base (7), its characterized in that: the utility model discloses a support base, including support base (1), support base (7) upper end front portion, upper end left part and upper end rear portion all install material receiving device (3), unable adjustment base (7) are provided with four, four unable adjustment base (7) are all installed in the one end that is opposite to each other in pairs and are stored device (6), four spacing conveyor (2) and support column (8) are installed respectively to unable adjustment base (7) upper end, four testing arrangement (4) are all installed to support column (8) upper end, four heat abstractor (5) are all installed to testing arrangement (4) upper end.
2. The integrated circuit four-station test handler of claim 1, wherein: the limiting conveying device (2) comprises a first supporting plate (20) and a second supporting plate (21), two driving rollers (22) are arranged at one ends, corresponding to the first supporting plate (20) and the second supporting plate (21), the surfaces of the driving rollers (22) are jointly provided with a conveying belt (23), a first motor (24) is arranged at the left part of the rear end of the second supporting plate (21), mounting blocks (25) are arranged at the middle part of the front end of the first supporting plate (20) and the middle part of the rear end of the second supporting plate (21), hydraulic cylinders (26) are arranged at one ends, corresponding to the mounting blocks (25), of the first supporting plate, limiting plates (27) are arranged at one ends, corresponding to the hydraulic cylinders (26), of the first supporting plate (20) and the second supporting plate (21), and the upper end of a fixing base (7) is arranged at the other ends.
3. The integrated circuit four-station test handler of claim 1, wherein: the material receiving device (3) comprises a second motor (30), a rotating disc (33) is arranged at the upper end of the second motor (30), mounting grooves (34) are formed in the left part of the upper end of the rotating disc (33) and the right part of the upper end of the rotating disc, a first material receiving box (31) and a second material receiving box (32) are respectively arranged in the two mounting grooves (34), and the second motor (30) is arranged at the upper end of the supporting base (1).
4. The integrated circuit four-station test handler of claim 1, wherein: the testing device (4) comprises a testing mechanism (40), a controller (41) is arranged at the front end of the testing mechanism (40), a camera (42) is arranged at the left end of the testing mechanism (40), a camera (43) is arranged at the lower end of the camera (42), a connecting wire (44) is jointly arranged at the front end of the camera (42) and the front end of the controller (41), and the testing mechanism (40) is arranged at the upper end of the supporting column (8).
5. The integrated circuit four-station test handler of claim 4, wherein: the heat dissipation device (5) comprises a mounting frame (50) and a fan (51), mounting screws (54) are mounted at the front part of the upper end and the rear part of the upper end of the fan (51), vent holes (53) are formed in the middle of the upper end of the mounting frame (50), screw holes (52) are formed in the front part of the upper end and the rear part of the upper end of the mounting frame (50), the fan (51) is mounted at the upper end of the mounting frame (50) through the mounting screws (54), and the mounting frame (50) is mounted at the upper end of the test mechanism (40).
6. The integrated circuit four-station test handler of claim 1, wherein: the storage device (6) comprises four storage drawers (60), the four storage drawers (60) are provided with pulling handles (61) at the middle parts of the front ends of the four storage drawers (60), four drawer openings (62) are formed in the front ends of the fixed bases (7), and the four storage drawers (60) are respectively located in the four drawer openings (62).
7. The integrated circuit four-station test handler of claim 1, wherein: the anti-slip support is characterized in that fixing grooves (71) are formed in the front of the upper end, the left of the upper end and the rear of the upper end of the support base (1), and an anti-slip base (72) is arranged at the lower end of the support base (1).
8. The integrated circuit four-station test handler of claim 2, wherein: a gap exists between the limiting plate (27) and the conveying belt (23).
9. The integrated circuit four-station test handler of claim 4, wherein: the camera (42) is electrically connected with the controller (41) through a connecting wire (44).
CN202311483857.9A 2023-11-09 2023-11-09 Integrated circuit four-station test sorting machine Pending CN117299576A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202311483857.9A CN117299576A (en) 2023-11-09 2023-11-09 Integrated circuit four-station test sorting machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202311483857.9A CN117299576A (en) 2023-11-09 2023-11-09 Integrated circuit four-station test sorting machine

Publications (1)

Publication Number Publication Date
CN117299576A true CN117299576A (en) 2023-12-29

Family

ID=89262152

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202311483857.9A Pending CN117299576A (en) 2023-11-09 2023-11-09 Integrated circuit four-station test sorting machine

Country Status (1)

Country Link
CN (1) CN117299576A (en)

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