CN117274379A - Point cloud processing method, equipment and storage medium - Google Patents
Point cloud processing method, equipment and storage medium Download PDFInfo
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- G—PHYSICS
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
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- G—PHYSICS
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
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Abstract
The present disclosure provides a point cloud processing method, device, and storage medium, by acquiring point cloud data of a measured object acquired by a laser profile scanner, wherein the laser profile scanner includes a light projection unit and a light receiving unit; for any first point in the point cloud data, determining the height of a search area of the first point, and determining the search area of the first point according to the height of the search area of the first point and the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit; judging whether other points exist in the search area, and if so, determining the first point as an interference point. The method and the device can adaptively determine the search area of any first point in the point cloud data, accurately judge whether the first point interferes with the points based on the search area, further filter the points, ensure that normal points are not affected by the interference points, and improve the robustness and accuracy of the identification of the interference points in the point cloud data.
Description
Technical Field
The disclosure relates to the field of computer technology, and in particular, to a point cloud processing method, a point cloud processing device and a storage medium.
Background
A laser profile scanner is a device for measuring the shape and profile of an object surface. The method uses a laser projection technology, a piece of laser is projected on a measured object through a light projection unit, then the reflection of the laser is captured by a light receiving element, and the shape information of the surface of the measured object is obtained through a triangle imaging principle and the pixel position of the laser on the light receiving element. However, when the laser profile scanner is used for measuring the surface of the object, the laser may enter the light receiving element again after one or more reflections on the surface of the object, if the normal laser is shielded by the object at this time, the error laser after the multiple reflections is considered to be reasonable, so that an error point cloud is presented in the point cloud.
Based on the technical problems, the interference points are removed by utilizing the view shielding principle in the related technology, but when noise points exist below the outline of the measured object, the noise points can appear in the view shielding range of the normal points, so that the normal points are regarded as the interference points and are filtered; in addition, the related art has low processing efficiency.
Disclosure of Invention
Aspects of the present disclosure provide a point cloud processing method, apparatus, and storage medium to improve accuracy of interference point identification in point cloud data.
A first aspect of an embodiment of the present disclosure provides a point cloud processing method, including:
acquiring point cloud data of a measured object acquired by a laser profile scanner, wherein the laser profile scanner comprises a light projection unit and a light receiving unit;
for any first point in the point cloud data, determining the height of a search area of the first point, and determining the search area of the first point according to the height of the search area of the first point and the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit;
judging whether other points exist in the search area, and if so, determining the first point as an interference point.
A second aspect of an embodiment of the present disclosure provides a point cloud processing apparatus, including:
the acquisition module is used for acquiring point cloud data of the measured object acquired by the laser profile scanner, wherein the laser profile scanner comprises a light projection unit and a light receiving unit;
a searching area determining module, configured to determine, for any first point in the point cloud data, a height range of a searching area of the first point, and determine, according to a height of the searching area of the first point and an angle between an extension line of an incident ray of the light projection unit at the first point and a reverse extension line of a reflected ray received by the light receiving unit, the searching area of the first point;
And the interference point identification module is used for judging whether other points exist in the search area, and if so, determining the first point as an interference point.
A third aspect of an embodiment of the present disclosure provides an electronic device, including: a processor, a memory and a computer program stored on the memory and executable on the processor, the processor implementing the method of the first aspect when executing the computer program.
A fourth aspect of the present disclosure provides a computer-readable storage medium having stored therein computer-executable instructions which, when executed by a processor, are adapted to carry out the method of the first aspect described above.
A fifth aspect of the present disclosure provides a computer program product comprising: a computer program stored in a readable storage medium, from which the computer program can be read by at least one processor of an electronic device, the at least one processor executing the computer program causing the electronic device to perform the method of the first aspect described above.
The embodiment of the disclosure is applied to a laser profile scanning scene, and the point cloud data of the measured object acquired by a laser profile scanner is acquired, wherein the laser profile scanner comprises a light projection unit and a light receiving unit; for any first point in the point cloud data, determining the height range of the searching area of the first point, and determining the searching area of the first point according to the height of the searching area of the first point and the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit; judging whether other points exist in the search area, and if so, determining the first point as an interference point. According to the embodiment of the disclosure, the search area of any first point in the point cloud data can be determined in a self-adaptive manner, whether the first point interferes with the point is accurately judged based on the search area, and the interference can be further filtered, so that the normal point is not influenced by the interference point, and the robustness and accuracy of identifying the interference point in the point cloud data are improved.
In addition, through carrying out downsampling on the point cloud data in the X-axis direction, judging whether each point in the downsampled data is an interference point or not; further, for the interference point in the downsampled data, the adjacent point in the X-axis direction is searched in the point cloud data, and then whether the adjacent point is the interference point is judged, so that the process of identifying the interference point is not required to be executed for each point in the point cloud data, and the identification efficiency of the interference point can be improved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the disclosure, illustrate and explain the present disclosure, and together with the description serve to explain the present disclosure. In the drawings:
FIG. 1 is a schematic diagram of the principle of operation of a line laser profile scanner;
FIG. 2 is a schematic diagram of the cause of the reflection disturbance point;
FIG. 3 is a graph of the effect of the reflected interference profile;
FIG. 4 is a schematic diagram of a method for determining a reflection interference point in the related art;
FIG. 5 is a schematic diagram showing that the intensity of the multiple reflected light is greater than the intensity of the direct reflected light;
FIG. 6 is a schematic diagram of erroneous judgment of a reflection interference point in an occlusion region of a normal point;
FIG. 7 is a schematic diagram of a search area provided by an exemplary embodiment of the present disclosure;
Fig. 8 is a flowchart of a point cloud processing method according to an exemplary embodiment of the present disclosure;
fig. 9 is a flowchart of a point cloud processing method based on a downsampling strategy according to an exemplary embodiment of the present disclosure;
fig. 10 is a flowchart of a point cloud processing method based on a downsampling strategy according to an exemplary embodiment of the present disclosure;
fig. 11 is a block diagram of a point cloud processing device according to an exemplary embodiment of the present disclosure;
fig. 12 is a schematic structural diagram of an electronic device according to an exemplary embodiment of the present disclosure.
Detailed Description
For the purposes of promoting an understanding of the principles and advantages of the disclosure, reference will now be made to the drawings and specific examples thereof, together with the following description. It will be apparent that the described embodiments are only some, but not all, of the embodiments of the present disclosure. Based on the embodiments in this disclosure, all other embodiments that a person of ordinary skill in the art would obtain without making any inventive effort are within the scope of protection of this disclosure.
A laser profile scanner is a device for measuring the shape and profile of an object surface. The method uses a laser projection technology, a piece of laser is projected on a measured object through a light projection unit, then the reflection of the laser is captured by a light receiving element, and the shape information of the surface of the measured object is obtained through a triangle imaging principle and the pixel position of the laser on the light receiving element.
The laser profile scanner may include a line laser profile scanner and a point laser profile scanner, for example, as shown in fig. 1, where the light projection unit may project slit light L1 along a projection direction, form a laser line on a surface of the measured object, and the light receiving unit receives a reflected light beam L2 projected from the light projection unit onto the surface of the measured object and reflected to the light receiving unit, records the brightness of the light, generates a light bar image with a change of the pixel intensity, and converts the light bar into a three-dimensional profile line by using a triangulation principle, where the three-dimensional profile line is formed by a point cloud calculated by a triangulation algorithm for each light bar pixel in the light bar image. For the spot laser profile scanner, the light projection unit is a point light source, and projects a laser beam along the projection direction, and the profile scanning principle is similar to that of the line laser profile scanner, which will not be described in detail herein, and the following example is also described by taking the line laser profile scanner as an example.
As shown in fig. 2, when the surface of the measured object is a dense reflective object, the measured object moves along the Y direction, and when the projection beam L1 reaches the pit of the object, the projection beam L1 will cause the normal reflective beam L2 to be blocked due to the dual effects of the view blocking and the material reflection, the L2 should be imaged as P1 by the light receiving unit, but the blocking P1 does not successfully image, and meanwhile, the reflection interference beam L3 generated by the laser line L1 through multiple reflections on the surface of the measured object will be imaged as an error point P2 on the light receiving unit. Because only the error point P2 is imaged, the point cloud CP generated according to the triangulation principle and corresponding to the P2 is an interference point, and the contour reconstructed by the triangulation principle is shown in fig. 3, and the interference point occurs in the contour in the pit.
In order to solve the problem of reflection interference, in the related art, all the reconstructed contour points CPj in the point cloud data are traversed, for each contour point, a light beam L1 is projected by the light projection unit along a direction perpendicular to a plane on which the measured object is placed, as shown in fig. 4, a triangle vertex is defined by the contour point CPj, a base line L (a horizontal distance from a lens center of the light receiving unit to the light projection unit) length is defined as a triangle base side length, a distance from CPj to the light projection unit is defined as a right angle side, a measurement angle θ is calculated, a diagonal angle θ 'is determined according to the measurement angle θ, a vertex is defined by CPj, and a diagonal angle θ' is defined as a vertex angle to form a shielding region Sj corresponding to CPj.
According to the view shielding principle, a second point does not exist in the shielding area of the normal contour point, because all points in the shielding area are shielded by the normal contour point and cannot be reconstructed, for example, the normal contour point CP0 in FIG. 4, and other points do not exist in the shielding area S0; if other points inevitably exist in the blocking area of the reflected interference point, for example, the interference point CP1 in fig. 4, where other points exist in the blocking area S1, the interference point CP1 should be filtered. Therefore, whether the point is an interference point can be judged by traversing whether other contour points exist in the shielding area corresponding to each point in the point cloud data.
However, as shown in fig. 5, in the detection of some shapes of the object to be detected, for example, in the detection of Ball Grid Array (BGA) solder paste, the spherical highly reflective surface causes multiple reflection light L4, L5 to be similar to specular reflection, the light intensity of the light is greater than the intensity of direct reflection light L2, the pixel value with higher intensity is considered as an effective light bar, and a reflection interference point CP2 is generated below the surface of the object to be detected, although these interference points do not affect the solder height detection, at this time, the above-mentioned interference point identification method based on the shielding area is directly adopted, which causes a second point in the shielding area S corresponding to the normal contour point CP, and the normal contour point is misjudged as the reflection interference point and is mistakenly filtered, as shown in fig. 6.
In addition, as for the point cloud data generated by the line laser profile scanner, since the light projection unit projects the slit light L1, thousands of profile points exist in the laser line direction, that is, in the X direction in fig. 1, which are profile points received by the light receiving unit at the same time, together form a profile line at the time, and as the object to be measured moves along the Y direction, a plurality of profile lines are reconstructed, together form the profile of the object to be measured. If each contour point calculates a shielding area and traverses the contour point generated by the same pixel at different moments along the Y direction, whether the contour point is in the shielding area or not is very time-consuming, and the processing efficiency is low.
Based on the above-mentioned problems, the disclosure provides a point cloud processing method, considering that, in fig. 6, for a reflection interference point CP2 caused by similar specular reflection, an included angle θ1 between an incident light ray at the CP2 and a reflected light ray received by a light receiving unit of the light projecting unit is relatively small, so that the CP2 is generally below a surface of a measured object, in order to avoid that the reflection interference point CP2 in fig. 6 falls within an occlusion area range of a normal contour point CP and causes the normal contour point CP to be misjudged as an interference point, in the method, it is desirable to reduce the occlusion area range of the normal contour point CP to a suitable range, so that the occlusion area range can realize that an interference point can be identified based on a view occlusion principle, and the reflection interference point CP2 can not fall within the occlusion area range of the normal contour point CP, so that Δabc is an occlusion area of the point CP as shown in fig. 7 is properly reduced, and the normal point can be misjudged as an interference point.
Specifically, the point cloud data of the measured object collected by a laser profile scanner can be obtained, wherein the laser profile scanner comprises a light projection unit and a light receiving unit; for any first point in the point cloud data, determining the height of a search area of the first point, and determining the search area of the first point according to the height of the search area of the first point and the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit; judging whether other points exist in the search area, and if so, determining the first point as an interference point.
In the embodiment of the disclosure, the point cloud processing method may be implemented by means of electronic devices such as a terminal device or a server. The terminal device for executing the point cloud processing method can be a processor of the laser profile scanner, or other terminal devices capable of acquiring point cloud data from the laser profile scanner, such as a computer and the like; the server performing the point cloud processing method may be a cloud server in order to run various algorithms by virtue of resources on the cloud; in contrast to cloud, the point cloud processing method may also be applied to a server device such as a conventional server or a server array, which is not limited herein.
Fig. 8 is a flowchart of steps of a point cloud processing method according to an exemplary embodiment of the present disclosure. The method specifically comprises the following steps as shown in fig. 8:
s801, acquiring point cloud data of a measured object acquired by a laser profile scanner, wherein the laser profile scanner comprises a light projection unit and a light receiving unit.
In this embodiment, the laser profile scanner includes a light projection unit and a light receiving unit, the measured object is located on a plane, the light projection unit projects laser light to the measured object along a projection direction, the light receiving unit receives reflected light projected to the surface of the measured object from the light projection unit and reflected to the light receiving unit, and point cloud data of the measured object is obtained through a triangulation principle.
If the laser profile scanner is a line laser profile scanner, the point cloud data is three-dimensional point cloud data, wherein the Y-axis direction of the point cloud data is the direction of relative movement between the measured object and the line laser profile scanner, the Z-axis direction is the upward direction perpendicular to the plane (such as the upper surface of the conveying device) where the measured object is located, and the X-axis direction is the cross product direction of the Y-axis and the Z-axis, and the coordinate axes are shown in fig. 1.
If the laser profile scanner is a point laser profile scanner, the point cloud data is two-dimensional point cloud data, and similar to the line laser profile scanner, the Y-axis direction of the point cloud data is the direction of relative movement between the measured object and the line laser profile scanner, the Z-axis direction is the plane perpendicular to the measured object, and the difference between the three-dimensional point cloud data of the line laser profile scanner and the three-dimensional point cloud data of the line laser profile scanner is that no X-axis direction data exists.
S802, determining the height of a searching area of a first point in the point cloud data, and determining the searching area of the first point according to the height of the searching area of the first point and the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit.
In this embodiment, for any first point in the point cloud data, the first point is a contour point reconstructed based on the measurement principle, in order to determine whether the first point is an interference point, a search area of the first point (i.e., an occlusion area of the first point) may be constructed by adopting the view occlusion principle, but in order to avoid that a reflection interference point similar to specular reflection falls within a search area range of the normal point, which leads to misjudgment of the normal point as an interference point, the search area is limited not to be infinite, the search area may be narrowed to a suitable range, wherein the angular range of the search area may be determined based on an incident light ray of the light projection unit at the first point and a reflected light ray received by the light receiving unit, that is, an angle between an extension line of the incident light ray of the light projection unit at the first point and an extension line of the reflected light ray received by the light receiving unit is an extension line of the light receiving unit, and in order to achieve reduction of the search area, so that a suitable height of the search area, that is also a height of the search area in the Z-axis direction, may be limited, so that the angle between the incident light ray of the light projection unit and the first point and the opposite extension line of the reflected light ray received by the light receiving unit is not limited, and the search area may be determined based on the angle between the incident light ray of the first point and the infinite, it is also possible to avoid that a reflection interference point (an interference point below the surface of the object to be measured) like specular reflection falls within the search area of the normal point, resulting in erroneous judgment of the normal point as the interference point.
S803, judging whether other points exist in the search area, and if so, determining the first point as an interference point.
In this embodiment, based on the above-mentioned search area of the first point, it may be determined whether other points exist in the search area, and if other points exist in the search area of the first point, the first point may be determined to be an interference point according to the view shielding principle, and the first point may be marked as an interference point (or a reflection interference point); if no other points exist in the search area of the first point, it can be determined that the first point is not an interference point, that is, the first point is a normal point, and the first point can be marked as a normal point.
Further, if the first point is determined to be an interference point, the first point may be deleted to ensure accuracy of the point cloud data.
According to the point cloud processing method provided by the embodiment, point cloud data of a measured object acquired by a laser profile scanner is acquired, wherein the laser profile scanner comprises a light projection unit and a light receiving unit; for any first point in the point cloud data, acquiring the height range of the search area of the first point, and determining the search area of the first point according to the height range of the search area of the first point, the incident light of the light projection unit at the first point and the reflected light received by the light receiving unit; judging whether other points exist in the search area, and if so, determining the first point as an interference point. In the embodiment, the search area of any first point in the point cloud data can be determined in a self-adaptive manner, the search area is small enough, the interference point can be identified based on the view shielding principle, meanwhile, the phenomenon that the normal point is misjudged as the interference point due to the fact that the reflection interference point similar to specular reflection falls into the search area range of the normal point can be avoided, the normal point is not influenced by the interference point, and the robustness and accuracy of the interference point identification in the point cloud data are improved.
On the basis of any one of the above embodiments, when the laser profile scanner is a line laser profile scanner, the point cloud data is three-dimensional point cloud data, the Y-axis direction of the point cloud data is the direction of relative movement between the measured object and the line laser profile scanner, the Z-axis direction is the upward direction perpendicular to the plane in which the measured object is located, and the X-axis direction is the cross product direction of the Y-axis and the Z-axis.
Further, when the height of the search area of the first point is obtained, the height Δz1 of the search area of the first point may be specifically determined in the Z-axis direction according to the Z values of the points in the vicinity of the first point in the X-axis direction.
The first point X-axis direction neighborhood can be a neighborhood of a preset range, and can be determined according to the size of the measured object in the X-axis direction, wherein the first point X-axis direction neighborhood can be larger than or equal to the size of the measured object in the X-axis direction, for example, the measured object is a BGA solder ball, and the neighborhood needs to cover the width of the solder ball in the X-axis direction; alternatively, the first point X-axis direction neighborhood may also be entered by the user.
In this embodiment, considering that the reflection interference point (such as CP2 in fig. 6) like specular reflection is usually far away from the first point in the Z-axis direction, the height Δz1 of the search area of the first point needs to be reduced, so that the reflection interference point like specular reflection does not fall within the range of the search area of the first point, and the search area is on the YZ plane, the height Δz1 of the search area of the first point should theoretically refer to the Z value of each point of the first point in the vicinity of the Y-axis direction, so as to realize the identification of the interference point based on the view shielding principle, however, because the existence of the reflection interference point like specular reflection can affect the height Δz1 of the search area of the first point, the determined search area of the first point includes the reflection interference point like specular reflection, in order to avoid the occurrence of the situation, and in consideration of the situation, the shape change of the profile line in the adjacent Y-axis direction is not large, and the height difference of each point in the vicinity of the Y-axis direction of the first point is substantially similar to the height difference of each point in the first point, so that the height Δz1 of the search area of the first point can refer to the Z-axis direction of each point in the vicinity of the first point, and the height Δz1 of the search area of the first point in the vicinity of the first point in the Y-axis direction can refer to the Z-axis direction, and the height difference of each point in the first point in the vicinity of the first point is not affected by the normal profile line, if the first point is included in the profile line in the first point 2 is contained in the vicinity of the first point, and the profile line in the first point and the first point is not normally contained in the vicinity of the first point 2.
The height range of the search area of the first point can refer to the Z values of each point in the neighborhood of the X axis direction of the first point, the Z values of each point in the neighborhood can reflect whether the X axis direction of the first point is relatively flat or not, the possibility of shielding in the Y direction can be indirectly reflected, the height range of the search area of the first point can be increased if the possibility of shielding in the Y direction is high, the possibility of shielding in the Y direction is low, and the height range of the search area of the first point can be reduced.
Specifically, according to the Z value of each point (including the first point) in the neighborhood of the first point in the X-axis direction, the height value Δz1 of the search area of the first point can be determined in the Z-axis direction, so as to realize adaptive determination of the height of the search area.
More specifically, the height value Δz1 of the search area of the first point is determined in the Z-axis direction according to the Z-value of the first point and the minimum Z-value of each point in the vicinity of the first X-axis direction.
Wherein the Z value Z of the first point CP Minimum Z value min (Z δCP ) Z value Z according to the first point CP Minimum Z value min (Z δCP ) It can be reflected whether the first point in the X-axis direction is relatively flat, and if so, the shielding possibility in the Y-axis direction is smaller, and the delta Z1 is reduced; if the unevenness occurs, the possibility of occurrence of shading in the Y direction is large, and Δz1 is increased.
The minimum Z value of each point in the neighborhood of the first point in the X-axis direction can be determined, the difference Δz2 between the Z value of the first point and the minimum Z value is determined, and a preset coefficient a (may be an empirical coefficient) is multiplied on the basis of Δz2 to obtain Δz1, where the preset coefficient a is greater than or equal to 1.
That is, Δz1=a×Δz2=a× (Z CP -min(Z δCP ))
As can be seen from the calculation formula of the delta Z1, the smaller the difference between the Z value of the first point and the minimum Z value is, the smaller the delta Z1 is, because the smaller the difference between the Z value of the first point and the minimum Z value is, the closer the heights of the first point and each point in the neighborhood of the X-axis direction of the first point are, namely the X-axis direction of the measured object at the first point is relatively flat, the probability that the first point is an interference point is smaller, the required search area can be smaller, and the processing speed can be accelerated; if the Z value of the first point is the minimum Z value, at this time Δz1 is 0, that is, the first point is the lowest point in the vicinity of the X axis direction, the heights of other points in the vicinity of the X axis direction of the first point are higher than the first point, and the first point is unlikely to block other points, so that the search area of the first point is 0; the larger the difference between the Z value of the first point and the minimum Z value is, the larger Δz1 is, because the larger the difference between the Z value of the first point and the minimum Z value is, the more the first point is highly protruded with respect to each point in the vicinity thereof in the X-axis direction, that is, the greater the possibility that the first point is blocked or the first point is an interference point is, so that the required search area can be larger.
In addition, considering that the reflection interference point CP2 similar to specular reflection may exist in the vicinity of the first point in the X-axis direction, Δz1 is increased, so that the search area of the first point is increased, but only the reflection interference points similar to specular reflection exist at the positions of the corresponding points of the next several contour lines of the first point on the current contour line, the normal point is mistakenly identified as the interference point, that is, the reflection interference points similar to specular reflection exist in the vicinity of the first point in the X-axis direction and the vicinity of the first point in the Y-axis direction, the normal point is mistakenly identified as the interference point, but the occurrence probability is much lower than the probability of searching only in the Y-axis direction, and filtering of the normal point can be effectively avoided.
In the above embodiment, when determining the minimum Z value of each point in the neighborhood of the first point in the X-axis direction, in order to reduce the search time, the second point may be selected in a downsampling manner or sampling manner in the neighborhood of the preset range in the X-axis direction of the first point, and the minimum Z value is determined from the Z value of the first point and the Z value of the second point, so that the search time is shortened and the efficiency of determining the minimum Z value is improved by reducing the number of points searched in the neighborhood of the preset range in the X-axis direction. Wherein the ratio of downsampling or sampling can be set according to the requirement, the smaller the ratio of downsampling or sampling is, the smaller the number of second points is, the shorter the search time is, the larger the efficiency improvement amplitude is, and the ratio of optional sampling or sampling can be 1/10.
In another alternative embodiment, when the laser profile scanner is a point laser profile scanner, the point cloud data is two-dimensional point cloud data, the Y-axis direction of the point cloud data is the direction of the relative movement between the measured object and the point laser profile scanner, and the Z-axis direction is the upward direction perpendicular to the plane in which the measured object is located, and there is no data in the X-axis direction, so when the height of the search area of the first point is obtained, the image line laser profile scanner cannot be determined according to the Z values of each point in the vicinity of the X-axis direction of the first point, but can be determined in the following manner:
determining the height of the search area of the first point in the Z-axis direction according to the height difference between the upper surface of the measured object and the platform where the measured object is located; or alternatively
And receiving a height value input by a user, and determining the height of the search area of the first point in the Z-axis direction according to the height value input by the user.
In this embodiment, the height of the search area of the first point is at least to cover the height difference between the upper surface of the measured object and the platform on which the measured object is located, that is, the height of the search area of the first point may be greater than or equal to the height difference between the upper surface of the measured object and the platform on which the measured object is located, for example, when the measured object is placed on the upper surface of the conveying device, the height of the search area of the first point is greater than or equal to the height difference between the upper surface of the measured object and the upper surface of the conveying device, and further, if the measured object is a component on the circuit board, the height of the search area of the first point is greater than or equal to the height difference between the upper surface of the component and the upper surface of the circuit board. The height difference between the upper surface of the measured object and the platform where the measured object is positioned can be obtained through measurement and can be input by a user; alternatively, the user may directly input a height value, and determine the height of the search area at the first point in the Z-axis direction according to the height value input by the user.
On the basis of any of the foregoing embodiments, whether the line laser profile scanner or the point laser profile scanner, after confirming the height of the search area of the first point, the determination of the search area of the first point may include:
and determining a triangle as the searching area according to the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit and the height of the searching area in the Z-axis direction.
In this embodiment, an included angle θ ' between an extension line of an incident light ray at a first point and a reverse extension line of a reflected light ray received by a light receiving unit may be determined, where the included angle is a subtended angle of the included angle θ between the incident light ray at the first point and the reflected light ray received by the light receiving unit, and the magnitude of the angle may be determined based on the positions of the light projecting unit, the light receiving unit, and the CP point, specifically, in the case that the light projecting unit projects a light beam in a direction perpendicular to a plane on which an object to be measured is placed, the included angle θ ' between the extension line of the incident light ray at the first point and the reverse extension line of the reflected light ray received by the light receiving unit may be determined by a known baseline L (horizontal distance from a lens center of the light receiving unit to the light projecting unit), a standard working distance WD (Z value of a light outlet of the light projecting unit), and a Z value of the first point, where the subtended angle is the included angle θ ' between the extension line of the incident light ray at the first point and the reverse extension line of the reflected light ray received by the light receiving unit is calculated as follows:
θ’＝θ＝arctan(L/(WD-Z CP ))
When a triangle is determined according to the included angle and the height of the search area in the Z-axis direction, the triangle is constructed on the YZ plane, a first point is taken as a vertex of the triangle, the base of the triangle is parallel to the Y-axis by the included angle theta', and the height on the base is equal to the height delta Z1 of the search area in the Z-axis direction.
Under the condition that the light projection unit projects light beams along the direction perpendicular to the plane where the measured object is placed, the triangle is a right triangle, one right-angle side (bottom side) is parallel to the Y axis, and the other right-angle side is along the Z axis direction, and the length of the right-angle side is equal to the height delta Z1 of the search area in the Z axis direction.
Based on the above embodiment, based on the included angle θ', the height Δz1 of the search area in the Z-axis direction, and the coordinates of the first point (one vertex of the triangle, denoted as a point), the coordinates of the remaining vertices (B and C) of the triangle in the YZ plane can be calculated, specifically as follows:
wherein Y is the Y value of C CP The "±" in ±tan θ' ×Δz1 depends on the object to be measured and the line laserThe direction of relative movement between the profile scanners.
Based on the coordinates of the above-described points a, B, and C, a triangle may be determined as the search area.
After determining the search area of the first point, it may be determined whether other points exist in the search area, so as to save the determination time and improve the determination efficiency, in this embodiment, not all points in the Y-axis direction are traversed, but only a limited number of points near the first point in the Y-axis direction are selected for traversing, which may specifically include:
Determining the number of traversals according to the range of the search area in the Y-axis direction and the distance between each point in the Y-axis direction;
the traversing quantity and the direction of relative movement between the measured object and the line laser profile scanner acquire a plurality of third points adjacent to the first point in the Y-axis direction;
and judging whether the third point is positioned in the searching area.
In this embodiment, the length of the base of the triangle of the search area in the Y-axis direction, which is the range of the search area in the Y-axis direction, may be determined as the points to be traversed in the Y-axis direction, and further, only the number of points to be traversed need to be selected in the Y-axis direction for the traversal, that is, the number of points to be traversed, is related to the range of the search area in the Y-axis direction and the pitch of the points in the Y-axis direction, and when the range of the search area in the Y-axis direction is determined, if the pitch of the points in the Y-axis direction is large, the points in the Y-axis direction are sparse, the points to be covered in the range of the search area in the Y-axis direction are fewer, if the pitch of the points in the Y-axis direction is small, the points in the Y-axis direction are dense, the points to be covered in the range of the Y-axis direction are more, and the number of traversals is fewer. Wherein the distance between each point in the Y-axis direction depends on parameters of the laser profile scanner and/or the moving speed of the measured object.
When determining the number of traversals, determining the ratio between the range of the search area in the Y-axis direction and the spacing of each point in the Y-axis direction, determining the number of traversals according to the ratio, and taking fig. 7 as an example, taking the whole value of the ratio as the number of traversals, wherein RY=tan θ'. DELTA.Z/DELTA.Y, and DELTA.Y is the spacing of each point in the Y-axis direction; alternatively, the number of traversals may be larger than the ratio, for example, a coefficient larger than 1 is multiplied on the basis of the ratio, and the rounded value is used as the number of traversals.
According to the view shielding principle, only the point reconstructed before the first point is needed to be judged, so that a plurality of third points can be obtained along the direction of the relative movement between the measured object and the line laser profile scanner along the Y axis according to the direction of the relative movement between the measured object and the line laser profile scanner, the number of the third points is equal to the traversing number, the third points are traversed, whether the third points are located in the searching area is judged, if any third point is located in the searching area, the first point is determined to be an interference point, and the first point can be deleted so as to ensure the accuracy of point cloud data.
It should be noted that, in fig. 6, the reflection interference point CP2 caused by similar specular reflection is generally below the surface of the measured object, and such a point need not be identified by the point cloud processing method in the foregoing embodiment, but may be identified in other manners, for example, if it is determined that a certain point is below the surface of the measured object, the point is identified as the reflection interference point, and may be deleted.
On the basis of any of the above embodiments, for the line laser profile scanner, since there are a plurality of points in the X-axis direction in the point cloud data, and the above-mentioned point cloud processing method is executed for each point in the X-axis direction to determine whether the point cloud is an interference point, the time is long and the efficiency is low, so in order to further accelerate the processing efficiency of the above-mentioned point cloud processing method, and considering that the reflection interference point is usually a patch, a downsampling strategy is proposed in this embodiment, which specifically includes:
downsampling the point cloud data in the X-axis direction to obtain downsampled data;
judging whether each point in the downsampled data is an interference point or not;
if any target point in the downsampled data is determined to be an interference point, searching for an adjacent point of the target point in the X-axis direction in the point cloud data, and taking the adjacent point as the first point, so as to execute the steps in the method described in the above embodiment, and judging whether the adjacent point is an interference point.
In this embodiment, as shown in fig. 9, the original point cloud data (point cloud or depth map) is downsampled in the X-axis direction to obtain downsampled data, where downsampling may be performed in a sampling manner, for example, 1 point is spaced in the X-axis direction, the downsampling of the point cloud data in the X-axis direction is 1/2 of the original point cloud data, the data size is reduced generally, and of course, the downsampling degree can be freely adjusted after the effect and the efficiency are balanced by the user; on the basis of the down-sampling data, judging whether each point in the down-sampling data is an interference point, and judging whether the adjacent point is an interference point or not because the point in the X-axis direction is reduced, wherein the identification efficiency of the interference point in the down-sampling data is improved.
Optionally, when judging whether each point in the downsampled data is an interference point, any method capable of realizing interference point judgment may be adopted; preferably, when determining whether each point in the down-sampled data is an interference point, each point in the down-sampled data may be respectively regarded as the first point in the above embodiment, and in the down-sampled data, the steps in the method of the above embodiment are performed to determine whether each point in the down-sampled data is an interference point.
In addition, when searching for the adjacent point of the target point in the X-axis direction in the original point cloud data, the searching range of the adjacent point can be determined according to the downsampling degree of the downsampling data, for example, if the downsampling data is downsampled to 1/2 of the original point cloud data, the searching range is one point of the target point on the left and right sides of the X-axis direction, and at least the point ignored by the downsampling process is covered; if the downsampled data is downsampled to 1/4 of the original point cloud data, the searching range is three points of the target point in the X-axis direction; if overlapping points exist, the method only needs to be calculated once, and repeated judgment of whether the points are interference points is not needed. After the searching range of the adjacent points is determined, the adjacent points of the target point in the X-axis direction are searched in the original point cloud data according to the searching range, and whether the adjacent points are interference points or not is judged.
As an example, as shown in fig. 10, the point cloud processing method of the present embodiment may specifically include the following steps:
s1001, acquiring point cloud data acquired by a line laser profile scanner;
s1002, downsampling the point cloud data to be 1/n of the original point cloud data in the X-axis direction;
s1003, traversing each point of the downsampled data, and carrying out first interference point identification on each point of the downsampled data, namely determining a search area of each point by adopting the method in the embodiment, and judging whether other points exist in the search area of each point so as to identify whether each point of the downsampled data is an interference point;
s1004, if any target point in the downsampled data is determined to be an interference point, recording the position of the target point;
s1005, searching n adjacent points of the target point in the X-axis direction in the point cloud data, and identifying secondary interference points of the adjacent points; that is, the method in the above embodiment is adopted to determine the search area of each adjacent point, and determine whether other points exist in the search area of each adjacent point, so as to identify whether each adjacent point is an interference point;
s1006, deleting all the identified interference points;
and S1007, outputting the processed point cloud data.
In an embodiment of the present disclosure, referring to fig. 11, in addition to providing a point cloud processing method, a point cloud processing apparatus 1100 is provided for performing the above-described point cloud processing method; the point cloud processing apparatus 1100 includes: an acquisition module 1101, a search area determination module 1102, and an interference point identification module 1103.
The acquisition module 1101 is configured to acquire point cloud data of an object to be measured acquired by a laser profile scanner, where the laser profile scanner includes a light projection unit and a light receiving unit;
a search area determining module 1102, configured to determine, for any first point in the point cloud data, a height of a search area of the first point, and determine, according to the height of the search area of the first point and an angle between an extension line of an incident ray of the light projection unit at the first point and a reverse extension line of a reflected ray received by the light receiving unit, the search area of the first point;
the interference point identifying module 1103 is configured to determine whether other points exist in the search area, and if so, determine that the first point is an interference point.
In one or more embodiments of the present disclosure, the laser profile scanner is a line laser profile scanner, a Y-axis direction of the point cloud data is a direction of relative movement between the measured object and the line laser profile scanner, a Z-axis direction is an upward direction perpendicular to a plane in which the measured object is located, and an X-axis direction is a cross product direction of the Y-axis and the Z-axis;
the search area determining module 1102 is configured to, when determining the height of the search area of the first point:
And determining the height delta Z1 of the search area of the first point in the Z-axis direction according to the Z values of the points in the vicinity of the first point in the X-axis direction.
In one or more embodiments of the present disclosure, the search area determining module 1102 is configured to, when determining the height Δz1 of the search area of the first point in the Z-axis direction according to the Z values of the points in the vicinity of the first point in the X-axis direction:
and determining the height value delta Z1 of the search area of the first point in the Z-axis direction according to the Z value of the first point and the minimum Z value of each point in the vicinity of the first X-axis direction.
In one or more embodiments of the present disclosure, the search area determining module 1102 is configured to, when determining, in a Z-axis direction, a height Δz1 of a search area of the first point according to a Z-value of the first point and a minimum Z-value of each point in the vicinity of the first X-axis direction:
determining the minimum Z value of each point in the neighborhood of the X axis direction of the first point;
determining a difference Δz2 between the Z value of the first point and the minimum Z value;
and determining the product of the delta Z2 and a preset coefficient as the delta Z1, wherein the preset coefficient is larger than or equal to 1.
In one or more embodiments of the present disclosure, the search area determining module 1102 is configured, when determining a minimum Z value of each point in the X-axis direction neighborhood of the first point, to:
And selecting a second point in a downsampling mode or a sampling mode in the vicinity of the preset range of the X-axis direction of the first point, and determining the minimum Z value from the Z value of the first point and the Z value of the second point.
In one or more embodiments of the present disclosure, the laser profile scanner is a point laser profile scanner, a Y-axis direction of the point cloud data is a direction of relative movement between the measured object and the point laser profile scanner, and a Z-axis direction is an upward direction perpendicular to a plane in which the measured object is located;
the search area determining module 1102 is configured to, when determining the height of the search area of the first point:
determining the height of the search area of the first point in the Z-axis direction according to the height difference between the upper surface of the measured object and the platform where the measured object is located; or alternatively
And receiving a height value input by a user, and determining the height of the search area of the first point in the Z-axis direction according to the height value input by the user.
In one or more embodiments of the present disclosure, the search area determining module 1102 is configured to, when determining the search area of the first point according to the height of the search area of the first point and an angle between an extension line of the incident light ray of the light projection unit at the first point and a reverse extension line of the reflected light ray received by the light receiving unit:
And determining a triangle as the searching area according to the included angle and the height of the searching area in the Z-axis direction.
In one or more embodiments of the present disclosure, the search area determining module 1102 is configured to, when determining a triangle as the search area according to the included angle and the height of the search area in the Z-axis direction,:
and constructing the triangle on the YZ plane, wherein the triangle takes the first point as a vertex, the included angle as a vertex angle, the base of the triangle is parallel to the axis, and the height on the base is equal to the height of the search area in the Z-axis direction.
In one or more embodiments of the present disclosure, the search area determining module 1102 is configured to, when constructing the triangle in the YZ plane:
acquiring the angle of the vertex angle;
determining coordinates of other vertexes of the triangle according to the angle of the vertex angle, the height of the search area in the Z-axis direction and the coordinates of the first point;
and constructing the triangle on the YZ plane according to the coordinates of the first point and the coordinates of the rest vertexes.
In one or more embodiments of the present disclosure, the interference point identifying module 1103 is configured to, when determining whether there are other points in the search area:
Determining the number of traversals according to the range of the search area in the Y-axis direction and the distance between each point in the Y-axis direction;
acquiring a plurality of third points adjacent to the first point in the Y-axis direction according to the traversing quantity and the direction of relative movement between the measured object and the line laser profile scanner;
and judging whether the third point is positioned in the searching area.
In one or more embodiments of the present disclosure, the interference point identifying module 1103 is configured to, when determining the number of traversals according to the range of the search area in the Y-axis direction and the distance between points in the Y-axis direction:
and determining the ratio of the range of the search area in the Y-axis direction to the distance between each point in the Y-axis direction, and determining the traversing quantity according to the ratio.
In one or more embodiments of the present disclosure, the apparatus further includes a downsampling module configured to downsample the point cloud data in an X-axis direction to obtain downsampled data;
the interference point identifying module 1103 is further configured to determine whether each point in the downsampled data is an interference point; if any target point in the downsampled data is determined to be an interference point, searching for an adjacent point of the target point in the X-axis direction in the point cloud data, and taking the adjacent point as the first point to execute the steps in the method in the embodiment to determine whether the adjacent point is an interference point.
In one or more embodiments of the present disclosure, the interference point identifying module 1103 is configured to, when determining whether each point in the downsampled data is an interference point:
and taking each point in the downsampled data as the first point respectively to execute the steps in the method described in the embodiment, and judging whether each point in the downsampled data is an interference point or not.
In one or more embodiments of the present disclosure, when the interfering point identifying module 1103 searches the point cloud data for an adjacent point of the target point in the X-axis direction, the interfering point identifying module is configured to:
determining a search range of the adjacent points according to the downsampling degree of the downsampled data;
and searching adjacent points of the target point in the X-axis direction in the point cloud data according to the searching range.
In one or more embodiments of the present disclosure, the interference point identifying module 1103 is further configured to, after determining the first point is an interference point:
and deleting the first point.
The device provided in this embodiment may be used to implement the technical solution of the foregoing method embodiment, and its implementation principle and technical effects are similar, and this embodiment will not be described herein again.
In addition, in some of the flows described in the above embodiments and the drawings, a plurality of operations appearing in a particular order are included, but it should be clearly understood that the operations may be performed out of order or performed in parallel in the order in which they appear herein, merely for distinguishing between the various operations, and the sequence number itself does not represent any order of execution. In addition, the flows may include more or fewer operations, and the operations may be performed sequentially or in parallel. It should be noted that, the descriptions of "first" and "second" herein are used to distinguish different messages, devices, modules, etc., and do not represent a sequence, and are not limited to the "first" and the "second" being different types.
Fig. 12 is a schematic structural diagram of an electronic device according to an exemplary embodiment of the present disclosure. As shown in fig. 9, the electronic apparatus 1200 includes: a processor 1201, and a memory 1202 communicatively coupled to the processor 1201, the memory 1202 storing computer-executable instructions.
The processor executes the computer-executed instructions stored in the memory to implement the point cloud processing method provided by any one of the method embodiments, and specific functions and technical effects that can be implemented are not described herein.
Optionally, the electronic device 1200 is a laser profile scanner.
The embodiment of the disclosure also provides a computer readable storage medium, in which computer executable instructions are stored, and the computer executable instructions are used for implementing the point cloud processing method provided by any one of the method embodiments when being executed by a processor.
The disclosed embodiments also provide a computer program product comprising: computer program, the computer program is stored in a readable storage medium, and at least one processor of the electronic device can read the computer program from the readable storage medium, and the at least one processor executes the computer program to enable the electronic device to execute the point cloud processing method provided by any one of the method embodiments.
In the several embodiments provided in the present disclosure, it should be understood that the disclosed systems and methods may be implemented in other ways. For example, the system embodiments described above are merely illustrative, e.g., the partitioning of elements is merely a logical functional partitioning, and there may be additional partitioning in actual implementation, e.g., multiple elements or components may be combined or integrated into another system, or some features may be omitted, or not implemented. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some interface, system or unit indirect coupling or communication connection, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present disclosure may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in hardware plus software functional units.
The integrated units implemented in the form of software functional units described above may be stored in a computer readable storage medium. The software functional unit is stored in a storage medium, and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor (processor) to perform part of the steps of the methods of the various embodiments of the disclosure. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional modules is illustrated, and in practical application, the above-described functional allocation may be performed by different functional modules according to needs, i.e. the internal structure of the system is divided into different functional modules to perform all or part of the functions described above. The specific working process of the system described above may refer to the corresponding process in the foregoing method embodiment, and will not be described herein.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This disclosure is intended to cover any adaptations, uses, or adaptations of the disclosure following the general principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It is to be understood that the present disclosure is not limited to the precise arrangements and instrumentalities shown in the drawings, and that various modifications and changes may be effected without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (19)
1. A method of point cloud processing, comprising:
acquiring point cloud data of a measured object acquired by a laser profile scanner, wherein the laser profile scanner comprises a light projection unit and a light receiving unit;
for any first point in the point cloud data, determining the height of a search area of the first point, and determining the search area of the first point according to the height of the search area of the first point and the included angle between the extension line of the incident light of the light projection unit at the first point and the reverse extension line of the reflected light received by the light receiving unit;
Judging whether other points exist in the search area, and if so, determining the first point as an interference point.
2. The method of claim 1, wherein the laser profile scanner is a line laser profile scanner, the Y-axis direction of the point cloud data is the direction of relative movement between the object under test and the line laser profile scanner, the Z-axis direction is the upward direction perpendicular to the plane in which the object under test is located, and the X-axis direction is the cross-product direction of the Y-axis and the Z-axis;
the determining the height of the search area of the first point includes:
and determining the height delta Z1 of the search area of the first point in the Z-axis direction according to the Z values of the points in the vicinity of the first point in the X-axis direction.
3. The method according to claim 2, wherein determining the height Δz1 of the search area of the first point in the Z-axis direction according to the Z-values of the points in the vicinity of the first point in the X-axis direction includes:
and determining the height value delta Z1 of the search area of the first point in the Z-axis direction according to the Z value of the first point and the minimum Z value of each point in the vicinity of the first X-axis direction.
4. A method according to claim 3, wherein determining the height Δz1 of the search area of the first point in the Z-axis direction based on the Z-value of the first point and the minimum Z-value of each point in the vicinity of the first X-axis direction comprises:
Determining the minimum Z value of each point in the neighborhood of the X axis direction of the first point;
determining a difference Δz2 between the Z value of the first point and the minimum Z value;
and determining the product of the delta Z2 and a preset coefficient as the delta Z1, wherein the preset coefficient is larger than or equal to 1.
5. The method of claim 4, wherein determining a minimum Z value for each point within the X-axis direction neighborhood of the first point comprises:
and selecting a second point in a downsampling mode or a sampling mode in the vicinity of the preset range of the X-axis direction of the first point, and determining the minimum Z value from the Z value of the first point and the Z value of the second point.
6. The method of claim 1, wherein the laser profile scanner is a point laser profile scanner, the Y-axis direction of the point cloud data is the direction of relative movement between the object under test and the point laser profile scanner, and the Z-axis direction is the upward direction perpendicular to the plane in which the object under test is located;
the determining the height of the search area of the first point includes:
determining the height of the search area of the first point in the Z-axis direction according to the height difference between the upper surface of the measured object and the platform where the measured object is located; or alternatively
And receiving a height value input by a user, and determining the height of the search area of the first point in the Z-axis direction according to the height value input by the user.
7. The method according to any one of claims 2 to 6, wherein determining the search area of the first point according to the height of the search area of the first point and an angle between an extension line of the incident light ray of the light projection unit at the first point and a reverse extension line of the reflected light ray received by the light receiving unit includes:
and determining a triangle as the searching area according to the included angle and the height of the searching area in the Z-axis direction.
8. The method of claim 7, wherein determining a triangle as the search area based on the included angle and the height of the search area in the Z-axis direction comprises:
and constructing the triangle on the YZ plane, wherein the triangle takes the first point as a vertex, the included angle as a vertex angle, the base of the triangle is parallel to the axis, and the height on the base is equal to the height of the search area in the Z-axis direction.
9. The method of claim 8, wherein said constructing the triangle in the YZ plane comprises:
Acquiring the angle of the vertex angle;
determining coordinates of other vertexes of the triangle according to the angle of the vertex angle, the height of the search area in the Z-axis direction and the coordinates of the first point;
and constructing the triangle on the YZ plane according to the coordinates of the first point and the coordinates of the rest vertexes.
10. The method of any of claims 2-6, wherein the determining whether there are other points within the search area comprises:
determining the number of traversals according to the range of the search area in the Y-axis direction and the distance between each point in the Y-axis direction;
acquiring a plurality of third points adjacent to the first point in the Y-axis direction according to the traversing quantity and the direction of relative movement between the measured object and the line laser profile scanner;
and judging whether the third point is positioned in the searching area.
11. The method of claim 10, wherein determining the number of traversals based on the extent of the search area in the Y-axis direction and the spacing of points in the Y-axis direction comprises:
and determining the ratio of the range of the search area in the Y-axis direction to the distance between each point in the Y-axis direction, and determining the traversing quantity according to the ratio.
12. The method according to any one of claims 2-5, wherein before determining the search area of the first point, further comprising:
downsampling the point cloud data in the X-axis direction to obtain downsampled data;
judging whether each point in the downsampled data is an interference point or not;
if any target point in the downsampled data is determined to be an interference point, searching for an adjacent point of the target point in the X-axis direction in the point cloud data, and taking the adjacent point as the first point to execute the steps in the method according to any one of claims 2-5, and judging whether the adjacent point is an interference point.
13. The method of claim 12, wherein said determining whether each point in the downsampled data is an interference point comprises:
each point in the downsampled data is taken as the first point, respectively, to perform the steps in the method according to any of claims 2-5, and to determine whether each point in the downsampled data is an interference point.
14. The method according to claim 12, wherein the searching for neighboring points of the target point in the X-axis direction in the point cloud data includes:
Determining a search range of the adjacent points according to the downsampling degree of the downsampled data;
and searching adjacent points of the target point in the X-axis direction in the point cloud data according to the searching range.
15. The method according to any one of claims 1-6, wherein after determining that the first point is an interference point, further comprising:
and deleting the first point.
16. A point cloud processing apparatus, comprising:
the acquisition module is used for acquiring point cloud data of the measured object acquired by the laser profile scanner, wherein the laser profile scanner comprises a light projection unit and a light receiving unit;
a searching area determining module, configured to determine, for any first point in the point cloud data, a height of a searching area of the first point, and determine, according to the height of the searching area of the first point and an angle between an extension line of an incident ray of the light projection unit at the first point and a reverse extension line of a reflected ray received by the light receiving unit, the searching area of the first point;
and the interference point identification module is used for judging whether other points exist in the search area, and if so, determining the first point as an interference point.
17. An electronic device, comprising: a processor, a memory and a computer program stored on the memory and executable on the processor, the processor implementing the method according to any one of claims 1-15 when the computer program is executed by the processor.
18. The electronic device of claim 17, wherein the electronic device is a laser profile scanner.
19. A computer readable storage medium having stored therein computer executable instructions which when executed by a processor are adapted to carry out the method of any one of claims 1-15.
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