CN117249922A - Temperature calibration method and system for temperature tester - Google Patents
Temperature calibration method and system for temperature tester Download PDFInfo
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Abstract
The invention relates to the technical field of temperature measurement and correction, and provides a temperature calibration method and a temperature calibration system for a temperature tester, wherein the temperature calibration method comprises the following steps: acquiring an indication temperature sequence and an actual measurement temperature sequence; acquiring a temperature error sequence according to the actually measured temperature sequence and the indicated temperature sequence; acquiring an error singular index according to the temperature error sequence; acquiring a measurement fluctuation sequence and an adjacent fluctuation set of each element in the measurement fluctuation sequence according to the temperature error sequence; acquiring a fluctuation jump index according to the adjacent fluctuation set; acquiring temperature indication anomaly degree according to the error singular index and the fluctuation jump index; and obtaining the detection result of the abnormal measurement point and the calibration range of the abnormal measurement point according to the temperature indication anomaly degree, and completing the temperature calibration of the temperature tester. According to the invention, through analyzing the distribution characteristics of the measurement data of different measurement positions, the operation efficiency of an anomaly detection algorithm and the calibration accuracy of an anomaly measurement result are improved.
Description
Technical Field
The invention relates to the technical field of temperature measurement and correction, in particular to a temperature calibration method and system for a temperature tester.
Background
The thermal deformation and Vicat softening point temperature tester is a temperature tester which is widely applied in industrial production, and is mainly used for measuring the thermal deformation temperature and Vicat softening point temperature of thermoplastic products such as plastics, rubber and the like after molding so as to process the products more accurately, so that the measurement accuracy of the temperature tester directly influences the production quality of the products. However, with the lapse of the service time, the accuracy of the temperature tester is often reduced, and in this case, in order to avoid the influence on the production process of the product, the temperature tester needs to be calibrated.
At present, most of temperature calibration methods of temperature testers adopt collectors and collection systems to acquire real-time temperature indication values and accurate measurement data, and single-point temperature calibration of the temperature testers is performed by utilizing a data processing technology. For example, an exponential smoothing algorithm predicts temperature data by using a data prediction mode, evaluates the degree of precision degradation of the temperature tester, and further realizes single-point prediction of the temperature tester. However, when the temperature data is predicted by using the traditional exponential smoothing algorithm, the prediction result is inaccurate because the prediction result in the exponential smoothing algorithm is sensitive to the smoothing coefficient, so that the accuracy of temperature calibration is affected.
Disclosure of Invention
The invention provides a temperature calibration method and a temperature calibration system for a temperature tester, which are used for solving the problem that the accuracy of a corrected temperature value obtained by a traditional temperature correction method is unstable, and the adopted technical scheme is as follows:
one embodiment of the invention is a temperature calibration method for a temperature tester, the method comprising the steps of:
acquiring an indication temperature sequence of a temperature tester and an actual measurement temperature sequence of each measurement position;
acquiring a temperature error sequence of each measuring position according to the difference value between the actually measured temperature sequence of each measuring position and the element in the indication temperature sequence; acquiring an error singular index of each element in the temperature error sequence of each measuring position according to the distribution difference of the elements in the temperature error sequence of each measuring position and the temperature error sequences of the rest measuring positions;
acquiring a measurement fluctuation sequence of each measurement position according to nonlinear fitting results of all elements in a temperature error sequence of each measurement position, acquiring a preset number of neighbor acquisition moments corresponding to acquisition moments of each element in the measurement fluctuation sequence of each measurement position, and taking a set consisting of the elements corresponding to the preset number of neighbor acquisition moments as an adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position; acquiring a fluctuation jump index of each element in the measurement fluctuation sequence of each measurement position according to the adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position;
taking a normalization result of the product of the error singular index and the fluctuation jump index of each element in each measuring position as the temperature indication anomaly of each element in each measuring position; and obtaining the detection result of the abnormal measurement point and the calibration range of the abnormal measurement point according to the temperature indication abnormal degree of all elements in all measurement positions, and completing the temperature calibration of the temperature tester.
Preferably, the method for obtaining the temperature error sequence of each measurement position according to the difference value between the actually measured temperature sequence and the element in the indication temperature sequence of each measurement position comprises the following steps:
and acquiring absolute values of differences between the actually measured temperature sequence and each identical sequence element in the indicated temperature sequence of each measuring position, and taking a sequence formed by the absolute values of the differences between all the identical sequence elements according to the time ascending sequence as a temperature error sequence of each measuring position.
Preferably, the method for obtaining the error singular index of each element in the temperature error sequence of each measurement position according to the distribution difference of the elements in the temperature error sequence of each measurement position and the temperature error sequences of the rest measurement positions comprises the following steps:
taking the acquisition time of each element in the temperature error sequence of each measurement position as a central time, and taking a sequence formed by the elements corresponding to the preset number of nearest neighbor acquisition times at the central time according to the ascending order as an adjacent data sequence of each element;
acquiring adjacent mutation indexes of each element in the temperature error sequence of each measuring position according to data distribution in the adjacent data sequence of each element in the temperature error sequence of each measuring position;
acquiring the dislocation measurement deviation of each element in the temperature error sequence of each measuring position according to the difference between the adjacent data sequences of the same sequence element in the temperature error sequence of each measuring position and the temperature error sequences of the rest measuring positions;
and taking the normalized result of the product of the adjacent mutation indexes of each element and the dislocation measurement deviation of each element as the error singular index of each element.
Preferably, the method for obtaining the adjacent mutation index of each element in the temperature error sequence of each measurement position according to the data distribution in the adjacent data sequence of each element in the temperature error sequence of each measurement position comprises the following steps:
for any one element in the temperature error sequence of each measuring position, taking the difference value between the maximum value and the minimum value in all data in the adjacent data sequences of each element as a first composition factor;
acquiring the average value of all data in the adjacent data sequences of each element, and taking the accumulation of the absolute value of the difference value between each data in the adjacent data sequences of each element and the average value in the adjacent data sequences of each element as a second composition factor;
the adjacent mutation index of each element consists of a first composition factor and a second composition factor, wherein the adjacent mutation index is in direct proportion to the first composition factor and the second composition factor.
Preferably, the method for obtaining the ectopic measurement deviation of each element in the temperature error sequence of each measurement position according to the difference between the adjacent data sequences of the same sequence element in the temperature error sequence of each measurement position and the temperature error sequences of the rest measurement positions comprises the following steps:
taking the temperature error sequence of each measuring position as a target sequence, and taking the measured distance between each element in the target sequence and the adjacent data sequences of the elements in the same sequence in the temperature error sequence of each measuring position as a first accumulation factor;
the accumulation of the first accumulation factor over all measurement locations is taken as the off-position measurement bias for each element in the temperature error sequence for each measurement location.
Preferably, the method for obtaining the measurement fluctuation sequence of each measurement position according to the nonlinear fitting result of all elements in the temperature error sequence of each measurement position comprises the following steps:
taking the element in the temperature error sequence of each measuring position as an ordinate and taking a coordinate system formed by taking the acquisition time corresponding to the element in the temperature error sequence of each measuring position as an abscissa as a single coordinate system of each measuring position, and acquiring a temperature error function of data points in the single coordinate system of each measuring position by using a nonlinear fitting algorithm;
and taking a sequence formed by slopes of all data points in the temperature error function according to ascending order of acquisition time as a measurement fluctuation sequence of each measurement position.
Preferably, the method for obtaining the fluctuation jump index of each element in the measurement fluctuation sequence of each measurement position according to the adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position comprises the following steps:
acquiring the probability of each value of data in adjacent fluctuation sets of each element in a measurement fluctuation sequence of each measurement position, and taking the product of the probability of each value and the logarithmic mapping result of the probability of each value as a first product factor;
taking the absolute value of each value of data in adjacent fluctuation sets of each element in a measurement fluctuation sequence of each measurement position as a numerator, taking the sum of the difference value between the absolute value of each value and the absolute value of the maximum value of the data in the adjacent fluctuation sets and a preset parameter as a denominator, and taking the ratio of the numerator to the denominator as a second product factor;
and taking the summation of the product of the first product factor and the second product factor on the adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position as the fluctuation jump index of each element in the measurement fluctuation sequence of each measurement position.
Preferably, the method for obtaining the detection result of the abnormal measurement point and the calibration range of the abnormal measurement point according to the temperature indication anomaly degree of all elements in all measurement positions comprises the following steps:
acquiring normal measurement points and abnormal measurement points in all elements in all measurement positions according to the temperature indication anomaly degree of all elements in all measurement positions;
taking the indication temperature value corresponding to each abnormal measurement point as a calibration object, and taking the average value of the measured temperatures of all measurement positions of each abnormal measurement point at the same acquisition time as the calibration ideal temperature of each abnormal measurement point;
taking the average value of the temperature error values of all normal measurement points in the sample data points as the calibration activity, taking the sum of the opposite numbers of the calibration ideal temperature and the calibration activity of each abnormal measurement point as the lower limit of the calibration range, taking the sum of the calibration ideal temperature and the calibration activity of each abnormal measurement point as the upper limit of the calibration range, and taking the open section formed by the lower limit and the upper limit as the calibration range of each abnormal measurement point.
Preferably, the method for obtaining the normal measurement points and the abnormal measurement points in all the elements in all the measurement positions according to the temperature indication anomaly degree of all the elements in all the measurement positions comprises the following steps:
acquiring the average value of the temperature indication anomaly degree of all elements in all measurement positions, and taking the elements with the temperature indication anomaly degree larger than the average value as sample data points;
and taking the temperature error values of all the sample data points as the input of an anomaly detection algorithm, and acquiring normal measurement points and anomaly measurement points in the sample data points by using the anomaly detection algorithm.
In a second aspect, an embodiment of the present invention further provides a temperature calibration system for a temperature tester, including a memory, a processor, and a computer program stored in the memory and running on the processor, where the processor implements the steps of any one of the methods described above when the processor executes the computer program.
The beneficial effects of the invention are as follows: according to the method, the temperature error sequence is obtained according to the indicated temperature time sequence and the actually measured temperature sequence, the temperature indication anomaly degree is constructed based on the fluctuation in the temperature error sequence and the similarity between the sequences, the sample data points are obtained according to the temperature indication anomaly degree, the calibration objects in the sample data points are detected by using the LOF anomaly detection algorithm, and then the calibration objects and the calibration range are adaptively calibrated, so that single-point calibration of measurement data of different measurement positions of the temperature tester is realized.
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In order to more clearly illustrate the embodiments of the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained according to these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a flow chart of a temperature calibration method for a temperature tester according to an embodiment of the invention;
FIG. 2 is a schematic diagram showing a distribution of measurement positions in a temperature tester according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a single coordinate system for each measurement location according to one embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, a flowchart of a temperature calibration method for a temperature tester according to an embodiment of the invention is shown, the method includes the following steps:
step S001, acquiring an indication temperature sequence and an actually measured temperature sequence.
The invention takes a thermal deformation and Vicat softening point temperature tester as an example, and the calibration parameters of the temperature tester are mainly temperature parameters. The temperature tester had 6 stations, one for each station, and one for the oil bath. Here, the platinum resistor of the temperature measurement system is placed at a position where the platinum resistor and the temperature control platinum resistor are measured, the distribution of the measured positions is shown in fig. 2, the temperature measurement system is connected to the data collector, and the data collector is connected to the computer.
Presetting the operation interface of the temperature tester to riseAt a temperature rate of 50The upper limit temperature of the temperature rise is 150The practitioner can set proper heating rate and upper limit temperature according to actual conditions. In the invention, the acquisition time interval of the data acquisition device is t, the acquisition quantity is n, t=7s, and n=500. Meanwhile, when the data acquisition device is used for acquiring temperature data each time, the indication temperature value of the temperature tester is recorded, the temperature data of each measurement position acquired by the data acquisition device is recorded as actual measurement temperature data, the actual measurement temperature data and the indication temperature value of each measurement position are respectively recorded as an actual measurement temperature sequence A and an indication temperature sequence B of each measurement position according to the ascending order of the acquisition time, for example, the actual measurement temperature sequence of the first measurement position is recorded as，The first element of (a)Is the measured temperature data acquired for the first time at the first measuring position and indicates the temperature sequence，The nth element of (a)Is an indication value of the temperature tester at the nth acquisition time.
So far, the indication temperature sequence of the temperature tester and the actually measured temperature sequence of each measuring position are obtained.
Step S002, obtaining the error singular index of each element in the temperature error sequence of each measuring position based on the distribution difference of the elements in the temperature error sequences of different measuring positions.
The calibration of the temperature tester usually adopts a single-point calibration method to calibrate the indication temperature value with larger error, and the purpose of the calibration is to make the measurement result of the temperature tester more accurate, so that the influence of the accuracy and the size of the calibration range on the calibration accuracy is important, and therefore, the self-adaptive acquisition calibration range is considered according to the actual measurement temperature value of each measurement position at different acquisition moments and the fluctuation condition of the actual measurement temperature value at the neighboring moment agreeing to the acquisition moment.
Constructing a temperature error sequence C of each measuring position according to the indication temperature sequence and the actually measured temperature sequence of each measuring position, and obtaining the temperature error sequence of each i measuring positions：
In the method, in the process of the invention,is the temperature error sequence of the i-th measuring positionThe j-th temperature error value of (c),、respectively the i-th measured position actual measurement temperature sequenceIndicating j elements in temperature sequence B.
The acquisition environment of the temperature data is tested under the temperature rising environment of the temperature tester and rises at a certain temperature rising rate, so that the temperature error sequences have stronger similarity and the fluctuation in the temperature time sequence is flatter. However, due to the instability of the accuracy of the temperature tester, when the temperature tester has a certain temperature value, there may be a large difference between the measured temperature and the indicated temperature, resulting in a large temperature error, and the above-mentioned similarity may be destroyed.
Based on the analysis, in order to clearly obtain the similarity relation between the temperature error sequences, according to the acquisition time of each element in the temperature error sequences, taking the acquisition time of each element as the center acquisition time, taking the element of k nearest neighbor acquisition times nearest to the center acquisition time as the adjacent data point of each element, taking the empirical value of k as 10, taking the sequence of the values of the adjacent data points of each element as the adjacent data sequence of each element according to the ascending order, and taking the temperature error sequence of the ith measurement positionThe adjacent data sequence of the j-th element in (a) is recorded as。
Constructing an error singular index of each element in the temperature error sequence of each measurement position based on adjacent data sequences of each element in the temperature error sequence of each measurement position, and calculating the temperature error sequence of the ith measurement positionError singular index of the j-th element in (a)：
In the method, in the process of the invention,is the temperature error sequence of the i-th measuring positionAdjacent mutation index of the j-th element,、respectively adjacent data sequencesMaximum and minimum values of data in (a), k being adjacent data sequencesThe number of data in the data set,adjacent data sequence being the j-th elementThe average value of the data in (a),is a contiguous data sequenceG data in (a);
for the normalization function, m is the number of measurement positions, in the present invention m is 7,is the temperature error sequence of the f-th measurement positionAdjacent data sequences of the j-th element of (c),is a sequence of、The DTW distance between the two is a known technology, and the specific process is not described again.
Wherein the greater the difference between the measured temperature and the indicated temperature, the greater the first composition factor in the adjacent data sequence of the jth data point in the temperature error sequence of the ith measurement locationThe greater the value of (b), the difference between the value of the g-th data point in the adjacent data sequence to the j-th data point in the temperature error sequence of the i-th measurement location and the data averageThe larger the second composition factorThe greater the value of (2); the greater the temperature difference at different measurement locations, the less the similarity between adjacent data sequences, and the measured distance between adjacent data sequences of the jth data point in the temperature error sequences of the ith and the f measurement locationsThe larger the ectopic measurement deviationThe larger the value of (2), the more likely the local temperature accuracy is poor, and the corresponding error singular indexThe greater the value of (2).
So far, the error singular index of each element in the temperature error sequence of each measuring position is obtained and is used for calculating the subsequent temperature indication anomaly degree.
And step S003, acquiring a measurement fluctuation sequence based on nonlinear fitting results of all elements in the temperature error sequence, and acquiring a fluctuation jump index based on the measurement fluctuation sequence and an adjacent fluctuation set.
Further, the fluctuation characteristic of the data in the temperature error sequence can better reflect the change characteristic of the temperature error, and the measured temperature and the indicated temperature are infinitely close under normal conditions, so that the accuracy of the temperature tester is higher, and the fluctuation of the data in the temperature error sequence is smaller, namely the stable distribution is stronger. And due to aging of the temperature tester in the use process, the difference between the measurement of certain temperature values and the actual result is quite likely to be quite large, and the fluctuation of data in the temperature error sequence is quite large at the moment, so that the state of stable distribution is broken.
Specifically, based on the above analysis, in order to obtain the smooth distribution characteristics in the temperature time series more clearly, from the viewpoint of the degree of fluctuation of the data at the adjacent timings. The temperature error sequence of each measuring position is utilized, the acquisition time in the temperature error sequence is taken as an abscissa, the data value in the temperature error sequence is taken as an ordinate to construct a coordinate system of each measuring position, as shown in fig. 3, a nonlinear fitting algorithm is utilized to acquire a temperature error function of data points in a single coordinate system of each measuring position, and the nonlinear fitting algorithm is a known technology and is not redundant. Further, the slope of each data point on the temperature error function is obtained by calculating the first order derivative of the function, the sequence formed by the slopes of the data points on each temperature error function according to the sequence of the acquisition time is used as the measurement fluctuation sequence of each measurement position, and the measurement fluctuation sequence of the ith measurement position is recorded as。
Secondly, as the fluctuation of the data in the temperature error sequence is smaller, namely the stable distribution is stronger, and the smaller the variation of the fluctuation degree of the data is, the more similar the data in the temperature error sequence is, the lower the information quantity in the temperature error sequence is; when the fluctuation is large, the stable distribution is broken, and the slope is changedThe larger the amount of information, the higher. In the invention, the acquisition time of each data point in the temperature slope sequence is taken as the central acquisition time, and the data points of 30 acquisition times closest to the central acquisition time are taken as the adjacent fluctuation set of each data point. For example, the measurement fluctuation sequence of the ith measurement positionThe acquisition time of the jth element is taken as the center time, and the adjacent fluctuation set of the jth element is obtained according to the steps。
Based on the analysis, a fluctuation jump index is constructed here for characterizing the data stability between each element in the temperature error sequence of each measuring position and the acquisition element at the adjacent moment, and a measuring fluctuation sequence is calculatedFluctuating jump index of the j-th element in (a)：
In the method, in the process of the invention,is the measurement fluctuation sequence of the ith measurement positionAdjacent fluctuation set of jth data point in (b)The number of unequal values in s is the set of adjacent fluctuationsThe s-th kind of the value of the Chinese medicine,is a set of adjacent undulationsIt should be noted that, the non-equal value refers to the type of data with non-equal size in the adjacent fluctuation set, for example,the two values are included, the first value is 1, and the second value is 2;
is a set of adjacent undulationsThe value of the s-th value in the formula,is a set of adjacent undulationsThe maximum value of all the values in (a),is an error parameter, has the function of avoiding that the denominator is 0,the size of (2) is 0.01.
Wherein adjacent wave setsThe more chaotic the distribution of slope values in a temperature error sequence, the worse the stationarity of local data points in the temperature error sequence, the adjacent sets of fluctuationsProbability of occurrence of the s-th numerical value in (2)The smaller the first product factorThe greater the value of (2); the worse the accuracy of the temperature tester, the different number of values in the adjacent fluctuation set of the jth data point in the measurement fluctuation sequence of the ith measurement positionThe larger the value of (c) is, the larger the fluctuation of local data in the temperature error function of the temperature error sequence is, the absolute value of the s-th numerical value in the adjacent fluctuation set of the j-th data point in the measurement fluctuation sequence of the i-th measurement position isThe larger the difference between the maximum value of the absolute values of the data point values in the adjacent fluctuation sets of the jth data point in the measurement fluctuation sequence of the ith measurement position and the absolute value of the jth valueThe smaller the second product factorThe larger the value of (a), the corresponding, fluctuating jump indexThe greater the value of (2).
So far, each element fluctuation jump index in the temperature error sequence of each measuring position is obtained and used for calculating the subsequent temperature indication anomaly degree.
Step S004, obtaining temperature indication anomaly degree based on the error singular index and the fluctuation jump index, obtaining normal measurement points and abnormal measurement points based on the temperature indication anomaly degree, obtaining a correction range of each abnormal measurement point based on the calibration activity amount, and realizing single-point correction of the temperature tester.
Furthermore, in the invention, the error singular index mainly measures the similarity abnormality between the temperature error sequences of the measuring positions, and the fluctuation jump index mainly measures the variation abnormality of the temperature error sequences of the measuring positions, namely, the error singular index and the fluctuation jump index reflect the abnormality of the accuracy of the temperature tester from two aspects.
Therefore, combining the error singular index and the fluctuation jump index, calculating the temperature indication abnormality degree of each element in the temperature error sequence of each measuring position, and calculating the temperature indication abnormality degree of the j-th element in the temperature error sequence of the i-th measuring position：
In the method, in the process of the invention,the temperature indication anomaly of the j-th element in the temperature error sequence representing the i-th measurement position,as a function of the normalization,an error singular index representing a j-th element in the temperature error sequence of the i-th measurement location,indicating the fluctuating jump index of the j-th element in the temperature error sequence of the i-th measurement location.
Error singular index of the j-th element in the temperature error sequence of the i-th measurement positionThe larger the fluctuation jump index of the j-th element in the temperature error sequence of the i-th measurement positionThe larger the temperature abnormality is, the more likely the temperature abnormality is to occur at this time, and the lower the accuracy is, the greater the degree of abnormality in the temperature indication is.
According to the above steps, the temperature indication anomaly degree of each element in the temperature error sequence of each measurement position is obtained, and the sample data point for anomaly detection is obtained according to the temperature indication anomaly degree of all elements in the temperature error sequence of all measurement positions. In general, the condition that the accuracy of the temperature tester is reduced may be the moment of a certain temperature value, at this time, more measured temperature values in the collected data are measured accurately, and a small number of measured temperature values are less accurate.
Further, a mean value of the temperature indication anomaly degree of all elements in the temperature error sequence of all the measurement positions is calculated, and the elements with the temperature indication anomaly degree higher than the mean value are taken as sample data points. And taking the temperature error values of all the sample data points as algorithm input, acquiring the abnormality score of each sample data point by using an LOF abnormality detection algorithm, and taking the sample data points with the abnormality scores of more than 1 and less than or equal to 1 as normal measurement points and abnormal measurement points respectively, wherein the LOF abnormality detection algorithm is a known technology and is not described in detail.
Secondly, taking the average value of temperature error values of all normal data points in the sample data points as a calibration activity, taking an indication temperature value corresponding to each abnormal measurement point as a calibration object, acquiring the acquisition time of each abnormal measurement point in an actually measured temperature sequence,
taking the average value of measured temperatures at all measurement positions at the same acquisition time with each abnormal measurement point as the calibration ideal temperature of each abnormal measurement point, acquiring the calibration range of each abnormal measurement point according to the calibration activity and the calibration ideal temperature, and calculating the calibration range of the q-th abnormal measurement point：
In the method, in the process of the invention,、respectively the calibration rangesIs set to be equal to the upper limit and the lower limit of (c),is the q-th abnormal measurement point to calibrate the ideal temperature,is the amount of calibration activity.
Further, the calibration range of each abnormal measurement point is sequentially obtained according to the steps, the acquisition time and the calibration range of the abnormal measurement points are uploaded to a temperature calibration system, the temperature calibration system stores the acquisition time and the calibration range of all the abnormal measurement points in a classified manner, the change condition of the test precision of the temperature tester after the correction is compared with the change condition of the test precision after the correction is stored in the temperature calibration system.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. The foregoing description of the preferred embodiments of the present invention is not intended to be limiting, but rather, any modifications, equivalents, improvements, etc. that fall within the principles of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A temperature calibration method for a temperature tester, the method comprising the steps of:
acquiring an indication temperature sequence of a temperature tester and an actual measurement temperature sequence of each measurement position;
acquiring a temperature error sequence of each measuring position according to the difference value between the actually measured temperature sequence of each measuring position and the element in the indication temperature sequence; acquiring an error singular index of each element in the temperature error sequence of each measuring position according to the distribution difference of the elements in the temperature error sequence of each measuring position and the temperature error sequences of the rest measuring positions;
acquiring a measurement fluctuation sequence of each measurement position according to nonlinear fitting results of all elements in a temperature error sequence of each measurement position, acquiring a preset number of neighbor acquisition moments corresponding to acquisition moments of each element in the measurement fluctuation sequence of each measurement position, and taking a set consisting of the elements corresponding to the preset number of neighbor acquisition moments as an adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position; acquiring a fluctuation jump index of each element in the measurement fluctuation sequence of each measurement position according to the adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position;
taking a normalization result of the product of the error singular index and the fluctuation jump index of each element in each measuring position as the temperature indication anomaly of each element in each measuring position; and obtaining the detection result of the abnormal measurement point and the calibration range of the abnormal measurement point according to the temperature indication abnormal degree of all elements in all measurement positions, and completing the temperature calibration of the temperature tester.
2. The method for temperature calibration of a temperature tester according to claim 1, wherein the method for obtaining the temperature error sequence of each measurement location according to the difference between the measured temperature sequence of each measurement location and the element in the indication temperature sequence is as follows:
and acquiring absolute values of differences between the actually measured temperature sequence and each identical sequence element in the indicated temperature sequence of each measuring position, and taking a sequence formed by the absolute values of the differences between all the identical sequence elements according to the time ascending sequence as a temperature error sequence of each measuring position.
3. The method for calibrating a temperature of a temperature tester according to claim 1, wherein the method for obtaining the error singular index of each element in the temperature error sequence of each measurement location according to the distribution difference of the elements in the temperature error sequence of each measurement location and the temperature error sequences of the rest measurement locations comprises the following steps:
taking the acquisition time of each element in the temperature error sequence of each measurement position as a central time, and taking a sequence formed by the elements corresponding to the preset number of nearest neighbor acquisition times at the central time according to the ascending order as an adjacent data sequence of each element;
acquiring adjacent mutation indexes of each element in the temperature error sequence of each measuring position according to data distribution in the adjacent data sequence of each element in the temperature error sequence of each measuring position;
acquiring the dislocation measurement deviation of each element in the temperature error sequence of each measuring position according to the difference between the adjacent data sequences of the same sequence element in the temperature error sequence of each measuring position and the temperature error sequences of the rest measuring positions;
and taking the normalized result of the product of the adjacent mutation indexes of each element and the dislocation measurement deviation of each element as the error singular index of each element.
4. A temperature calibration method for a temperature tester according to claim 3, wherein the method for obtaining the adjacent mutation index of each element in the temperature error sequence of each measurement position from the data distribution in the adjacent data sequence of each element in the temperature error sequence of each measurement position comprises:
for any one element in the temperature error sequence of each measuring position, taking the difference value between the maximum value and the minimum value in all data in the adjacent data sequences of each element as a first composition factor;
acquiring the average value of all data in the adjacent data sequences of each element, and taking the accumulation of the absolute value of the difference value between each data in the adjacent data sequences of each element and the average value in the adjacent data sequences of each element as a second composition factor;
the adjacent mutation index of each element consists of a first composition factor and a second composition factor, wherein the adjacent mutation index is in direct proportion to the first composition factor and the second composition factor.
5. A temperature calibration method for a temperature tester according to claim 3, wherein the method for obtaining the out-of-position measurement deviation of each element in the temperature error sequence of each measurement location based on the difference between the adjacent data sequences of the same order element in the temperature error sequence of each measurement location and the temperature error sequences of the rest measurement locations is as follows:
taking the temperature error sequence of each measuring position as a target sequence, and taking the measured distance between each element in the target sequence and the adjacent data sequences of the elements in the same sequence in the temperature error sequence of each measuring position as a first accumulation factor;
the accumulation of the first accumulation factor over all measurement locations is taken as the off-position measurement bias for each element in the temperature error sequence for each measurement location.
6. The method for calibrating a temperature of a temperature tester according to claim 1, wherein the method for obtaining the measurement fluctuation sequence of each measurement location according to the nonlinear fitting result of all elements in the temperature error sequence of each measurement location is as follows:
taking the element in the temperature error sequence of each measuring position as an ordinate and taking a coordinate system formed by taking the acquisition time corresponding to the element in the temperature error sequence of each measuring position as an abscissa as a single coordinate system of each measuring position, and acquiring a temperature error function of data points in the single coordinate system of each measuring position by using a nonlinear fitting algorithm;
and taking a sequence formed by slopes of all data points in the temperature error function according to ascending order of acquisition time as a measurement fluctuation sequence of each measurement position.
7. The method for calibrating a temperature of a temperature tester according to claim 1, wherein the method for obtaining the fluctuation jump index of each element in the measurement fluctuation sequence of each measurement location from the adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement location comprises:
acquiring the probability of each value of data in adjacent fluctuation sets of each element in a measurement fluctuation sequence of each measurement position, and taking the product of the probability of each value and the logarithmic mapping result of the probability of each value as a first product factor;
taking the absolute value of each value of data in adjacent fluctuation sets of each element in a measurement fluctuation sequence of each measurement position as a numerator, taking the sum of the difference value between the absolute value of each value and the absolute value of the maximum value of the data in the adjacent fluctuation sets and a preset parameter as a denominator, and taking the ratio of the numerator to the denominator as a second product factor;
and taking the summation of the product of the first product factor and the second product factor on the adjacent fluctuation set of each element in the measurement fluctuation sequence of each measurement position as the fluctuation jump index of each element in the measurement fluctuation sequence of each measurement position.
8. The method for temperature calibration of a temperature tester according to claim 1, wherein the method for obtaining the detection result of the abnormal measurement point and the calibration range of the abnormal measurement point according to the temperature indication anomaly degree of all elements in all measurement positions is as follows:
acquiring normal measurement points and abnormal measurement points in all elements in all measurement positions according to the temperature indication anomaly degree of all elements in all measurement positions;
taking the indication temperature value corresponding to each abnormal measurement point as a calibration object, and taking the average value of the measured temperatures of all measurement positions of each abnormal measurement point at the same acquisition time as the calibration ideal temperature of each abnormal measurement point;
taking the average value of the temperature error values of all normal measurement points in the sample data points as the calibration activity, taking the sum of the opposite numbers of the calibration ideal temperature and the calibration activity of each abnormal measurement point as the lower limit of the calibration range, taking the sum of the calibration ideal temperature and the calibration activity of each abnormal measurement point as the upper limit of the calibration range, and taking the open section formed by the lower limit and the upper limit as the calibration range of each abnormal measurement point.
9. The method for temperature calibration of a temperature tester according to claim 8, wherein the method for acquiring normal measurement points and abnormal measurement points in all elements in all measurement positions according to the temperature indication anomaly degree of all elements in all measurement positions is as follows:
acquiring the average value of the temperature indication anomaly degree of all elements in all measurement positions, and taking the elements with the temperature indication anomaly degree larger than the average value as sample data points;
and taking the temperature error values of all the sample data points as the input of an anomaly detection algorithm, and acquiring normal measurement points and anomaly measurement points in the sample data points by using the anomaly detection algorithm.
10. A temperature calibration system for a temperature tester, comprising a memory, a processor and a computer program stored in the memory and running on the processor, characterized in that the processor implements the steps of the method according to any one of claims 1-9 when the computer program is executed.
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