CN117192462A

CN117192462A - Current correction method, apparatus, device and storage medium

Info

Publication number: CN117192462A
Application number: CN202311150338.0A
Authority: CN
Inventors: 陈永伟; 周新星
Original assignee: China Nuclear Power Operation Co Ltd
Current assignee: China Nuclear Power Operation Co Ltd
Priority date: 2023-09-06
Filing date: 2023-09-06
Publication date: 2023-12-08

Abstract

The application relates to a current correction method, a device, equipment and a storage medium. The method comprises the following steps: dividing a test current interval according to preset steps to obtain a plurality of test currents, and further adopting a preset current sensor to respectively perform voltage conversion processing on each test current to determine a target voltage corresponding to each test current. And then determining a current correction parameter according to each test current and the corresponding target voltage. The application can accurately measure the magnitude of each test current and the magnitude of the corresponding test voltage, and in order to avoid the influence of environmental factors on the measured voltages, the application measures the measured currents for a plurality of times, so that each measured voltage has a unique target voltage, and the target voltage has high precision, thereby improving the accuracy of the current correction parameters obtained later. The current of the transmission channel is corrected through the current correction parameter, so that the accuracy in measuring the current can be improved, and the calibration accuracy of the subsequent transmission channel is improved.

Description

Current correction method, apparatus, device and storage medium

Technical Field

The present application relates to the field of instrument control technologies, and in particular, to a current correction method, apparatus, device, and storage medium.

Background

As industrial technology advances, many power devices require the use of transmitters. The transducer can convert the analog signal into a direct current signal of 4-20 mA and then transmit the direct current signal to a remote instrument. The transmitter is adopted for signal transmission, and the advantages of small noise, long transmission distance and reduced attenuation are achieved. In the process of signal transmission, in order to ensure the accuracy of the signal transmission channel, the signal transmission channel needs to be calibrated.

In the related art, in the process of calibrating a signal transmission channel, a signal generator is generally used to give a direct current signal similar to a signal of a transmitter, and a small current sensor is used to measure the direct current signal, so as to obtain the accuracy of the current transmission channel, and then the transmission channel is calibrated.

However, since the transmitted direct current signal is often a small current of mA level, the small current sensor is affected by environmental factors to some extent, resulting in lower accuracy in measuring the current, and thus may affect the calibration accuracy of the subsequent transmission channel.

Disclosure of Invention

In view of the above, it is necessary to provide a current correction method, apparatus, device, and storage medium capable of improving accuracy in measuring a current and accuracy in calibrating a transmission channel.

In a first aspect, the present application provides a current correction method. The method comprises the following steps:

dividing a test current interval according to preset steps to obtain a plurality of test currents;

respectively carrying out voltage conversion treatment on each test current by adopting a preset current sensor, and determining a target voltage corresponding to each test current;

and determining a current correction parameter according to each test current and the corresponding target voltage.

In one embodiment, performing voltage conversion processing on each test current by using a preset current sensor, and determining a target voltage corresponding to each test current includes:

performing voltage conversion treatment on each test current for a plurality of times by adopting a preset current sensor, and determining a test voltage set corresponding to each test current; the test voltage set includes at least one test voltage;

and determining the target voltage corresponding to each test current according to the test voltage set corresponding to each test current.

In one embodiment, determining the target voltage corresponding to each test current according to the test voltage set corresponding to each test current includes:

denoising each test voltage set to determine each candidate test voltage set corresponding to each test voltage set; each candidate test voltage set includes at least one candidate test voltage;

And determining target voltages corresponding to the test currents according to the candidate test voltage sets.

In one embodiment, determining a target voltage corresponding to each test current according to each candidate test voltage set includes:

carrying out average value processing on the candidate test voltages in each candidate test voltage set, and determining average value voltages corresponding to each candidate test voltage set;

and respectively determining each average voltage as the target voltage of the corresponding test current.

In one embodiment, determining the current correction parameter from each test current and the corresponding target voltage includes:

and carrying out linear fitting processing on each test current and the corresponding target voltage, and determining a current correction parameter.

In one embodiment, the method further comprises:

acquiring current to be corrected, performing voltage conversion processing on the current to be corrected by adopting a current sensor, and determining conversion voltage corresponding to the current to be corrected;

and correcting the conversion voltage according to the current correction parameters, and determining a target current corresponding to the current to be corrected.

In one embodiment, the current correction parameters include correspondence between different voltage intervals and different correction parameters;

Correcting the conversion voltage according to the current correction parameter to determine a target current corresponding to the current to be corrected, including:

determining a target voltage interval in which the conversion voltage is located in different voltage intervals;

and correcting the conversion voltage by adopting correction parameters corresponding to the target voltage interval, and determining the target current corresponding to the current to be corrected.

In a second aspect, the application further provides a current correction device. The device comprises:

the current acquisition module is used for dividing a test current interval according to preset steps to obtain a plurality of test currents;

the voltage determining module is used for respectively performing voltage conversion processing on each test current by adopting a preset current sensor and determining a target voltage corresponding to each test current;

and the correction parameter determining module is used for determining current correction parameters according to each test current and the corresponding target voltage.

In a third aspect, the present application also provides a computer device. The computer device comprises a memory and a processor, the memory stores a computer program, and the processor executes the computer program to realize the following steps:

In a fourth aspect, the present application also provides a computer-readable storage medium. The computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of:

In a fifth aspect, the present application also provides a computer program product. The computer program product comprising a computer program which, when executed by a processor, performs the steps of:

According to the current correction method, the device, the equipment and the storage medium, the test current interval is divided according to the preset steps to obtain a plurality of test currents, and then the voltage conversion processing is carried out on each test current by adopting the preset current sensor to determine the target voltage corresponding to each test current. And then determining a current correction parameter according to each test current and the corresponding target voltage. The embodiment of the application adopts the high-precision current sensor to accurately measure the magnitude of each test current and the magnitude of the corresponding test voltage, and further, in order to avoid the influence of environmental factors on the measured voltage, the embodiment of the application measures the measured current for many times, so that each measured voltage has a unique target voltage, and the target voltage has high precision, thereby improving the accuracy of the current correction parameters obtained later. Further, the accuracy in measuring the current can be improved by correcting the current of the transmission channel by the current correction parameter, so that the accuracy in calibrating the subsequent transmission channel is improved.

Drawings

FIG. 1 is a diagram of an application environment of a current correction method in one embodiment;

FIG. 2 is a flow chart of a method of current correction in one embodiment;

FIG. 3 is a flow chart of determining a target voltage in one embodiment;

FIG. 4 is a wiring diagram of a D/A conversion chip and a digital multimeter in one embodiment;

FIG. 5 is a schematic diagram of absolute error of current converted by the D/A conversion chip according to one embodiment;

FIG. 6 is a schematic diagram showing the relative error of the current converted by the D/A converter chip according to one embodiment;

FIG. 7 is a wiring diagram of an A/D conversion chip and a standard signal source in one embodiment;

FIG. 8a is a schematic diagram of absolute error of voltages converted by the A/D conversion chip according to one embodiment;

FIG. 8b is a schematic diagram showing the relative error of the voltages converted by the A/D conversion chip according to one embodiment;

FIG. 9a is a graph showing the output voltage distribution at 10 test times according to one embodiment;

FIG. 9b is a graph showing the output voltage distribution at 10 test times according to one embodiment;

FIG. 9c is a graph showing the output voltage distribution at 10 test times according to one embodiment;

FIG. 9d is a graph showing the output voltage distribution at 10 test times according to one embodiment;

FIG. 10a is a graph of test times versus voltage average in one embodiment;

FIG. 10b is a graph of test times versus standard deviation in one embodiment;

FIG. 11 is a flow chart of determining a target voltage according to another embodiment;

FIG. 12 is a graph showing absolute errors of the processed output voltage and the predicted current in one embodiment;

FIG. 13 is a flow chart of determining a target voltage according to another embodiment;

FIG. 14 is a flow diagram of determining a target current in one embodiment;

FIG. 15 is a flow chart of determining a target current according to another embodiment;

FIG. 16 is a schematic diagram of absolute error between voltage and predicted current using a modified equation in one embodiment;

FIG. 17 is a graph illustrating relative error between voltage and predicted current using a modified equation in one embodiment;

FIG. 18 is a schematic diagram of absolute error between output voltage and predicted current using conversion ratios in one embodiment;

FIG. 19 is a graph showing the relative error of output voltage and predicted current using conversion ratios in one embodiment;

FIG. 20 is a flow chart of a current correction method according to another embodiment;

FIG. 21 is a block diagram of a current correction device in one embodiment;

fig. 22 is an internal structural view of the computer device in one embodiment.

Detailed Description

The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.

First, before the technical scheme of the embodiment of the present application is specifically described, a description is first given of a technical background on which the embodiment of the present application is based.

In the industrial field, analog signals are converted into 4-20 mA DC signals by a transmitter and then transmitted to a remote meter. The signal transmission mode has the advantages of small noise, long transmission distance and reduced attenuation. But in order to ensure accuracy, the signal transmission channels need to be calibrated frequently. The existing method is to give and measure a DC current signal similar to the signal of the transmitter, thereby obtaining the accuracy of the current transmission channel, and then adjusting the corresponding instrument.

In the conventional channel verification or channel inspection process, the original loop is disconnected, and then the signal generator is connected in series to the loop, so that the given and adjustment of the signals are realized. The main disadvantages of this method include: firstly, the efficiency is low, the time and the labor are consumed for disassembling the wire or opening the signal loop, and the wire and the signal loop often occupy more than half of the whole workload; secondly, the risk of human error exists in the process of disconnecting the wire or opening the signal loop, and human negligence can bring great influence to the normal and stable operation of the process system.

To avoid inconvenience and risk of disconnecting the wires or opening the signal loop, a disconnection-free signal generator and measuring device may be used for signal giving and adjustment. The device can give a current signal with the error lower than 0.1%, and the micro-current non-contact sensor is used for measuring the loop current, the measurement accuracy can reach 0.2%, so that the check sum inspection of the channel is realized, and the original signal loop is not required to be disconnected.

In order to realize disassembly-free high-precision verification of the channel, the key technical difficulty is selection of a non-contact type current probe.

Most of traditional current measurement is a serial ammeter, which cannot meet the requirement of disassembly-free.

Non-contact current sensors on the market are mainly divided into two categories: hall sensors and fluxgate sensors. Please refer to table 1 for several types of current sensors developed for a company:

TABLE 1

For the corresponding parameters of the 3 current sensors, please refer to table 2:

TABLE 2

For detailed parameters of a conventional microcurrent measurement clamp meter, fluke773, please refer to table 3:

TABLE 3 Table 3

The above-mentioned current sensor has high accuracy in measuring the current of the class a, but has poor accuracy in measuring the small current of the class mA. And most of current sensors adopt a closed iron core design, which cannot meet the requirement of disassembly-free measurement. To some extent, the low current sensor may be affected by ambient temperature, thereby producing an offset in output. In addition, the existing micro-current sensor has some problems such as narrow bandwidth, low precision and the like. Fluke773 is an existing product that best fits the application scenario of the present application, but its high price limits large-scale applications. These problems and limitations affect the accuracy and practicality of non-contact current measurement and require further technical improvements and innovations.

Based on the above, the present application provides a current correction method, apparatus, device and storage medium, which aim to solve the above technical problems.

The current correction method provided by the embodiment of the application can be applied to an application environment shown in fig. 1. The application environment comprises an online calibration device 101 and a signal test platform 102. The on-line calibration device 101 adopts a 16-bit D/a conversion chip connected in parallel to an original signal loop on the signal test platform 102, and a user can change the on-off state of a 16-bit D/a current output loop through a front-end display screen, adjust the magnitude of an output current signal and display the magnitude of the value of the current output current signal. The original signal loop comprises a transmitter and a collecting card. One end of the transmitter is connected with an external power supply V _DC The other end of the positive electrode is connected with an external power supply V through a collecting card _DC And a negative electrode. The two ends of the acquisition card are connected in parallel and provided with a high-precision sampling resistor R.

The on-line calibration device 101 comprises a 16bit D/A (16 bit D/A conversion chip), a terminal (MCU is adopted in the embodiment of the application), a display screen, a high-precision micro-current sensor and a 24bit A/D (24 bit high-precision A/D conversion chip). The high-precision micro-current sensor is provided with a non-contact micro-current probe A, and the output conversion ratio of the high-precision micro-current sensor is 10mV/mA. The device can measure the voltage output by the high-precision micro-current sensor in real time, and the voltage is processed and synchronously updated on the display screen.

During normal operation, the D/A is disconnected from the original signal channel, the transmitter converts external signals into direct current signals of 4-20 mA, the direct current signals reach the high-precision sampling resistor R at the far end through the signal transmission channel, and the high-precision sampling resistor R converts analog current signals into analog voltage signals for measurement by the acquisition card.

Without applying external power V _DC In the case of (2), the transmitter does not output a current signal. At this time, a current signal generated by 16bit D/A is injected into a transmitter channel, and then the magnitude of the current signal in the wire is measured by a non-contact micro-current probe A.

In one embodiment, as shown in fig. 2, a current correction method is provided, and the method is applied to the terminal in fig. 1 for illustration, and includes the following steps:

s201, dividing a test current interval according to preset steps to obtain a plurality of test currents.

In the embodiment of the application, the preset step can be manually given or randomly generated by the terminal. To ensure accuracy, the smaller the preset step is, the better. For example, the preset step is set to 0.01.

The size of the test current interval depends on the size of the interval when the transmitter converts the analog signal to a direct current signal. For example, transmitters typically convert an external signal to a 4-20 mA dc signal, and thus the test current range at this time is 4-20 mA.

For example, by dividing the direct current signal with the test current interval of 4-20 mA with 0.01 as a preset step, 1600 test currents can be obtained.

S202, respectively performing voltage conversion processing on each test current by adopting a preset current sensor, and determining a target voltage corresponding to each test current.

The current sensor in the embodiment of the application is used for measuring the micro-current of the mA stage, and the type of the current sensor is not particularly limited in the embodiment of the application. The target voltages are in one-to-one correspondence with the test currents, i.e. each test current passing process has a unique target voltage.

In the embodiment of the application, based on a plurality of measured currents obtained in the last step, each measured current is respectively input into a transmission channel through a D/A conversion chip, then is measured through a micro-current probe in a current sensor, the micro-current probe generates a voltage signal through the inside of the current sensor and inputs the voltage signal into an A/D conversion chip, and the A/D conversion chip converts the voltage signal into a corresponding digital signal so that a terminal performs data processing on each voltage signal. The data processing may be compression processing, filtering processing, denoising processing, etc., and the mode of the data processing in the embodiment of the present application is not particularly limited. And after the terminal performs data processing on each voltage signal, obtaining a target voltage corresponding to each test current.

S203, determining a current correction parameter according to each test current and the corresponding target voltage.

According to the embodiment of the application, based on the test currents and the corresponding target voltages obtained in the previous step, correlation processing is carried out on the test currents and the corresponding target voltages, and the correlation processing can determine the linear relation between the test currents and the corresponding target voltages in a regression analysis, curve fitting and other modes. And performing correlation processing on each test current and the corresponding target voltage to obtain a current correction parameter. The current correction parameter may be combined with the input voltage to obtain a corrected current.

According to the current calibration method, the test current interval is divided according to the preset steps to obtain a plurality of test currents, and then voltage conversion processing is carried out on each test current by adopting the preset current sensor to determine the target voltage corresponding to each test current. And then determining a current correction parameter according to each test current and the corresponding target voltage. The embodiment of the application adopts the high-precision current sensor to accurately measure the magnitude of each test current and the magnitude of the corresponding test voltage, and further, in order to avoid the influence of environmental factors on the measured voltage, the embodiment of the application measures the measured current for many times, so that each measured voltage has a unique target voltage, and the target voltage has high precision, thereby improving the accuracy of the current correction parameters obtained later. Further, the accuracy in measuring the current can be improved by correcting the current of the transmission channel by the current correction parameter, so that the accuracy in calibrating the subsequent transmission channel is improved.

In another embodiment, referring to fig. 3, referring to the embodiment shown in fig. 2, the embodiment of the present application relates to a process of performing voltage conversion processing on each test current by using a preset current sensor to determine a target voltage corresponding to each test current, including the following steps:

s301, performing voltage conversion processing on each test current by adopting a preset current sensor for a plurality of times, and determining a test voltage set corresponding to each test current. The set of test voltages includes at least one test voltage.

Before determining the times of measuring the current, the embodiment of the application needs to verify the output precision of the output current signal.

The D/A conversion chip is set to generate 1600 current outputs with the stepping of 0.01mA and the stepping of 4-20 mA, as shown in FIG. 4, which is a calibration wiring diagram of the D/A conversion chip and a digital multimeter with 6.5 bits, and the actual current can be measured by adopting the digital multimeter with 6.5 bits. Fig. 5 shows the absolute error between the measured actual current and the set current. Fig. 6 shows the relative error of the measured actual current and the set current. As can be seen from FIG. 6, the output accuracy of the D/A conversion chip in the embodiment of the application can reach 0.02%, which meets the measurement requirement.

Similarly, a standard signal source is used to generate a voltage signal of 0-2V and the voltage signal is measured by an A/D conversion chip. Fig. 7 is a wiring diagram of an a/D conversion chip and a standard signal source. Then, the absolute error and the relative error between the voltage output by the A/D conversion chip and the given voltage are measured. As shown in fig. 8, the absolute error between the voltage output by the a/D conversion chip and the given voltage is shown. As shown in fig. 8a, the relative error between the voltage output by the a/D conversion chip and the given voltage is shown. As can be seen from FIG. 8b, the output accuracy of the A/D conversion chip according to the embodiment of the application can reach 0.02%, and the measurement requirements are met.

Because the microcurrent sensor probe is greatly influenced by environmental factors, such as temperature, wire materials and the like, the output voltage can be offset to different degrees each time, but the linearity can be maintained. It is therefore necessary to calibrate before each measurement of the current in order to obtain a current result with as high accuracy as possible in the measurement.

The MCU will drive the D/A conversion chip to generate a DC current of 4mA to 20mA, the minimum current step being 0.1mA, the number of total set current magnitudes being 160 (4.1 mA,4.2MA, … …). After each current is stably output, the MCU reads a plurality of voltage measurement values (denoted as n) from the a/D conversion chip. The last measured voltage data is stored in an n x 160 matrix.

As shown in fig. 9a, 9b, 9c, 9d, the voltage measurement output by the probe conforms to different degrees of normal distribution for different values of n while keeping the input current unchanged.

Wherein n is the number of repeated measurements, the curve is a normal distribution simulation curve fitted by the data set, and the histogram is the distribution of the measured voltage. It can be seen that as the number of measurements increases, the more closely the output voltage data of the measured microcurrent sensor probe is distributed normally.

The sample size calculation formula (1) is:

where Z is the normal distribution score at a given confidence level, E is the acceptable estimation error, i.e., the expected accuracy requirement, at a given confidence level, σ is the overall standard deviation, estimated here using the sample standard deviation.

See table 4 for normal distribution scores at different confidence levels.

TABLE 4 Table 4

Please refer to fig. 9, which shows the correspondence between the number of measurements n and the average value. Please refer to fig. 10a for the correspondence between the measurement times n and the average difference, and fig. 10b for the correspondence between the measurement times n and the standard difference. By varying the number of repeated measurements n, the average standard deviation σ of the samples can be obtained as 0.3214mV.

The desired voltage accuracy E takes 0.03mV, which is lower than the absolute error of the a/D voltage measurement in most cases.

As can be seen from equation (2), the minimum value of the number of measurements n is 441 when the 95% confidence level is reached.

The number of times n of measurement is 450, and each measurement current is tested to obtain a plurality of test voltages. These test voltages constitute a set of test voltages corresponding to the test current.

S302, determining target voltages corresponding to the test currents according to the test voltage sets corresponding to the test currents.

Based on the test voltage set obtained in the previous step, the linear relation between each test current and the corresponding target voltage can be determined by adopting modes such as regression analysis, curve fitting and the like, and the mode of correlation processing is not particularly limited in the embodiment of the application.

In the embodiment of the application, in order to avoid the influence of environmental factors on the measured voltage, the measured current is measured for a plurality of times according to the determined measurement times, and the target voltage corresponding to each measured current is measured for a plurality of times and processed in a correlation way, so that the accuracy of the obtained target voltage is improved.

In another embodiment, referring to fig. 11, referring to the embodiment shown in fig. 3, the process of determining the target voltage corresponding to each test current according to the test voltage set corresponding to each test current includes the following steps:

s401, denoising is carried out on each test voltage set, and each candidate test voltage set corresponding to each test voltage set is determined. Wherein each candidate test voltage set includes at least one candidate test voltage.

In this step, based on each test voltage set obtained in the previous embodiment, in order to improve the measurement accuracy, it is necessary to perform denoising processing on each test voltage in each test voltage set. N test voltages per measurement are processed. According to the rayleigh criterion (3σ criterion). In data analysis, in order to remove the interference of abnormal data, it is necessary to reject values outside the range of the mean value plus or minus three standard deviations. In the embodiment of the application, coarse error removal is required for repeated measurement data of each voltage, namely 3 sigma criterion is used in the range of each column, and at least one candidate test voltage is finally obtained. As shown in fig. 12, the absolute error of the processed voltage data is shown.

S402, determining target voltages corresponding to the test currents according to the candidate test voltage sets.

In this step, based on each candidate test voltage set obtained in the previous step, we perform numerical processing on the candidate test voltages in each candidate test voltage set to obtain target voltages corresponding to each test current. The numerical processing may include averaging, variance, correction, and the like. The obtained target voltage is the voltage value output by the current sensor probe after denoising treatment when the D/A conversion chip outputs a certain current.

In the embodiment of the application, the candidate test voltages are obtained by denoising the obtained test voltages, so that inaccurate measurement voltages caused by coarse errors are avoided. And each candidate test voltage is subjected to numerical processing to accurately obtain a unique target voltage, so that the accuracy of determining the target voltage is further improved.

In another embodiment, referring to fig. 13, referring to the embodiment shown in fig. 10, the present application relates to a process for determining a target voltage corresponding to each test current according to each candidate test voltage set, including the following steps:

s501, carrying out mean value processing on candidate test voltages in the candidate test voltage sets, and determining the mean value voltage corresponding to each candidate test voltage set. S502, determining each average voltage as a target voltage of a corresponding test current.

In this step, based on the candidate test voltages in the candidate test voltage set obtained in the previous embodiment, average processing is performed on each candidate test voltage to obtain an average voltage corresponding to each candidate test voltage set. And then respectively determining the obtained average voltage as the target voltage of the corresponding test current.

With continued reference to fig. 12, the output voltage matrix after the candidate test voltages are averaged is reduced to a vector of 1×160, which corresponds to the set 160 test currents one by one.

In the embodiment of the application, the average value processing is carried out on the candidate test voltages in the candidate test voltage set, so that the measurement error can be reduced, and the accuracy of the target voltage of the test current is improved.

In another embodiment, please continue to refer to the embodiment shown in fig. 2, the process of determining the current correction parameter according to each test current and the corresponding target voltage includes: and carrying out linear fitting processing on each test current and the corresponding target voltage, and determining a current correction parameter.

According to the embodiment of the application, each test current and the corresponding target voltage are substituted into the theoretical function, so that the current correction parameters can be calculated. The embodiment of the application does not limit the theoretical function in detail. The linear fitting is simple in form, easy to model, high in interpretability and easy to acquire current correction parameters.

In another embodiment, referring to fig. 14, the method of the embodiment of the present application further includes:

s601, obtaining current to be corrected, performing voltage conversion processing on the current to be corrected by adopting a current sensor, and determining conversion voltage corresponding to the current to be corrected.

In the step, aiming at a correction stage, a current to be corrected is obtained through a current sensor probe, and then the current to be corrected is subjected to voltage conversion processing through a current sensor and an A/D conversion chip, so that conversion voltage corresponding to the current to be corrected is determined.

S602, correcting the conversion voltage according to the current correction parameters, and determining a target current corresponding to the current to be corrected.

In this step, based on the obtained conversion voltage in the previous step, the obtained conversion voltage is input into the terminal, the terminal corrects the conversion voltage through the current correction parameter, the correction processing mode may be corrected through a correction equation, or the conversion voltage is corrected according to the set error value, and the correction processing mode is not specifically limited in the embodiment of the present application. And correcting the conversion voltage to obtain a target current corresponding to the current to be corrected.

In the embodiment of the application, the conversion voltage corresponding to the current to be corrected is corrected by using the current correction parameter, so that the problem of measurement voltage drift caused by environmental factors is avoided.

In another embodiment, referring to fig. 15, the current correction parameters include the correspondence between different voltage intervals and different correction parameters based on the embodiment shown in fig. 14. The embodiment of the application relates to a process for correcting conversion voltage according to current correction parameters and determining target current corresponding to current to be corrected, which comprises the following steps:

s701, determining a target voltage section in which the conversion voltage is located among different voltage sections.

In this step, after the terminal obtains the conversion voltage, it is determined to which target voltage section the conversion voltage specifically belongs. With continued reference to FIG. 12, the voltage intervals can be divided into [40mV-80mV ], [80mV-120mV ], [120mV-200mV ]. Illustratively, the switching voltage is 100mV and the target interval is [80mV-120mV ].

S702, correcting the conversion voltage by adopting correction parameters corresponding to the target voltage interval, and determining the target current corresponding to the current to be corrected.

In this step, after determining the target voltage interval in which the conversion voltage is located, correction processing is required for the conversion voltage according to the corresponding correction parameter. The correction parameters are determined as follows:

the embodiment of the application is used for calculating the target current of the current loop by a piecewise linear fitting (establishment of a correction equation) method based on the processed conversion voltage and the known current standard value.

The magnitude of the voltage error can be roughly divided into three segments, depending on the order of the error: the current is 4-8 mA, and the voltage error is within-0.2-0.1 mV; the current is 8-12 mA, and the voltage error is 0.2-0.4 mV; the current is 12 mA-20 mA, and the voltage error is-0.1-0.2 mV. According to the three-section voltage-current data, three-section voltage-current characteristics are obtained by linear fitting.

And solving the optimal parameters of the linear fitting by adopting a normal equation. The normal equation is shown in formula (3):

wherein X is the input matrix composed of the transpose of the processed voltage vector and another column of offset vectors, and Y is the transpose of the set current vector.

Substituting the measured current and the converted voltage into X and Y as shown in formula (4):

the solved w is a weight matrix as shown in formula (5), w ₁ Is the coefficient of the voltage primary term, w ₂ Is a constant bias.

i＝w ₂ v+w ₁ (5)

And (3) combining the formulas (3), (4) and (5) to obtain correction equations for respectively obtaining the output characteristics of the three-section probe, wherein the correction equations are shown in the formula (6):

wherein the obtained w ₁ And w ₂ Is a current correction parameter.

The 160 converted voltages after processing are brought into this correction equation, and predicted 160 target currents are obtained, the absolute errors of which are shown in fig. 16, and the relative errors are shown in fig. 17. The absolute error of the current using the theoretical conversion ratio is shown in fig. 18, and the relative error is shown in fig. 19. Therefore, compared with the method of obtaining the final value of the loop current by directly using the conversion ratio, the embodiment of the application establishes the correction equation to greatly reduce the deviation of the test current, thereby enabling the target current displayed by the display screen to be more accurate.

In another embodiment, referring to fig. 20, the method of the embodiment of the present application further includes:

s801, dividing a test current interval according to preset steps to obtain a plurality of test currents;

s802, performing voltage conversion treatment on each test current by adopting a preset current sensor for a plurality of times, and determining a test voltage set corresponding to each test current;

s803, denoising each test voltage set to determine each candidate test voltage set corresponding to each test voltage set;

s804, carrying out average value processing on the candidate test voltages in each candidate test voltage set, and determining average value voltages corresponding to each candidate test voltage set;

s805, respectively determining each average voltage as a target voltage of a corresponding test current;

s806, performing linear fitting processing on each test current and the corresponding target voltage, and determining a current correction parameter;

s807, obtaining current to be corrected, performing voltage conversion processing on the current to be corrected by adopting a current sensor, and determining conversion voltage corresponding to the current to be corrected;

s808, determining a target voltage interval in which the conversion voltage is located in different voltage intervals;

s809, correcting the conversion voltage by adopting the correction parameters corresponding to the target voltage interval, and determining the target current corresponding to the current to be corrected.

In the embodiment of the application, the magnitude of each test current and the corresponding test voltage can be accurately measured by adopting the high-precision current sensor, and further, in order to avoid the influence of environmental factors on the measured voltage, the embodiment of the application measures the measured current for many times, and obtains the unique target voltage through mean value calculation, and the target voltage has high precision. The target voltage is input into a correction equation, the current correction parameter in the correction equation can adjust the target voltage, and the correction equation is established to greatly reduce the deviation of the test current, so that the target current displayed by the display screen is more accurate, and the calibration accuracy of the subsequent transmission channel is improved.

It should be understood that, although the steps in the flowcharts related to the embodiments described above are sequentially shown as indicated by arrows, these steps are not necessarily sequentially performed in the order indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the flowcharts described in the above embodiments may include a plurality of steps or a plurality of stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of the steps or stages is not necessarily performed sequentially, but may be performed alternately or alternately with at least some of the other steps or stages.

Based on the same inventive concept, the embodiment of the application also provides a current correction device for realizing the current correction method. The implementation of the solution provided by the device is similar to the implementation described in the above method, so the specific limitation of one or more embodiments of the current correction device provided below may be referred to the limitation of the current correction method hereinabove, and will not be repeated here.

In one embodiment, referring to fig. 21, an embodiment of the present application provides a current correction device 900, including:

the current acquisition module 901 is configured to divide a test current interval according to a preset step to obtain a plurality of test currents;

the voltage determining module 902 is configured to perform voltage conversion processing on each test current by using a preset current sensor, and determine a target voltage corresponding to each test current;

the correction parameter determining module 903 is configured to determine a current correction parameter according to each test current and a corresponding target voltage.

In one embodiment, the voltage determination module includes:

the voltage set determining unit is used for performing voltage conversion treatment on each test current for a plurality of times by adopting a preset current sensor to determine a test voltage set corresponding to each test current; the test voltage set includes at least one test voltage;

The voltage determining unit is used for determining the target voltage corresponding to each test current according to the test voltage set corresponding to each test current.

In one embodiment, the correction parameter determination module includes:

the candidate voltage set determining unit is used for carrying out denoising processing on each test voltage set and determining each candidate test voltage set corresponding to each test voltage set; each candidate test voltage set includes at least one candidate test voltage;

and the target voltage determining unit is used for determining the target voltage corresponding to each test current according to each candidate test voltage set.

In one embodiment, the voltage determining unit includes:

the average voltage determining subunit is used for carrying out average processing on the candidate test voltages in each candidate test voltage set and determining average voltages corresponding to each candidate test voltage set;

and the target voltage determining subunit is used for respectively determining each average voltage as the target voltage of the corresponding test current.

In one embodiment, the correction parameter determination module includes:

and the correction parameter determining unit is used for carrying out linear fitting processing on each test current and the corresponding target voltage to determine the current correction parameter.

In one embodiment, the method further comprises:

The conversion voltage determining module is used for obtaining the current to be corrected, performing voltage conversion processing on the current to be corrected by adopting the current sensor, and determining the conversion voltage corresponding to the current to be corrected;

and the target current determining module is used for correcting the conversion voltage according to the current correction parameters and determining the target current corresponding to the current to be corrected.

In one embodiment, the current correction parameters include correspondence between different voltage intervals and different correction parameters; the target current determination module includes:

a voltage interval determining subunit, configured to determine a target voltage interval in which the conversion voltage is located in different voltage intervals;

and the target current determining subunit is used for correcting the conversion voltage by adopting the correction parameters corresponding to the target voltage interval and determining the target current corresponding to the current to be corrected.

The respective modules in the above-described current correction device may be implemented in whole or in part by software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.

In one embodiment, a computer device is provided, which may be a terminal, and the internal structure thereof may be as shown in fig. 22. The computer device includes a processor, a memory, an input/output interface, a communication interface, a display unit, and an input means. The processor, the memory and the input/output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input/output interface. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The input/output interface of the computer device is used to exchange information between the processor and the external device. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless mode can be realized through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a current correction method. The display unit of the computer device is used for forming a visual picture, and can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, can also be a key, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.

It will be appreciated by those skilled in the art that the structure shown in FIG. 22 is merely a block diagram of some of the structures associated with the present inventive arrangements and is not limiting of the computer device to which the present inventive arrangements may be applied, and that a particular computer device may include more or fewer components than shown, or may combine some of the components, or have a different arrangement of components.

In one embodiment, a computer device is provided comprising a memory and a processor, the memory having stored therein a computer program, the processor when executing the computer program performing the steps of:

In one embodiment, the processor when executing the computer program further performs the steps of:

In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of:

In one embodiment, the computer program when executed by the processor further performs the steps of:

In one embodiment, a computer program product is provided comprising a computer program which, when executed by a processor, performs the steps of:

It should be noted that, the user information (including but not limited to user equipment information, user personal information, etc.) and the data (including but not limited to data for analysis, stored data, presented data, etc.) related to the present application are information and data authorized by the user or sufficiently authorized by each party, and the collection, use and processing of the related data need to comply with the related laws and regulations and standards of the related country and region.

Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, database, or other medium used in embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high density embedded nonvolatile Memory, resistive random access Memory (ReRAM), magnetic random access Memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric Memory (Ferroelectric Random Access Memory, FRAM), phase change Memory (Phase Change Memory, PCM), graphene Memory, and the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, and the like. By way of illustration, and not limitation, RAM can be in the form of a variety of forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), and the like. The databases referred to in the embodiments provided herein may include at least one of a relational database and a non-relational database. The non-relational database may include, but is not limited to, a blockchain-based distributed database, and the like. The processor referred to in the embodiments provided in the present application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, or the like, but is not limited thereto.

The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The foregoing examples illustrate only a few embodiments of the application and are described in detail herein without thereby limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of the application should be assessed as that of the appended claims.

Claims

1. A method of current correction, the method comprising:

respectively performing voltage conversion processing on each test current by adopting a preset current sensor, and determining a target voltage corresponding to each test current;

2. The method of claim 1, wherein the performing voltage conversion processing on each of the test currents with a preset current sensor to determine a target voltage corresponding to each of the test currents includes:

performing voltage conversion treatment on each test current for a plurality of times by adopting a preset current sensor, and determining a test voltage set corresponding to each test current; the set of test voltages includes at least one test voltage;

3. The method of claim 2, wherein determining the target voltage for each of the test currents from the set of test voltages for each of the test currents comprises:

4. A method according to claim 3, wherein said determining a target voltage for each of said test currents from each of said candidate test voltage sets comprises:

and respectively determining each average voltage as a target voltage of a corresponding test current.

5. The method of any of claims 1-4, wherein determining a current correction parameter from each of the test currents and the corresponding target voltages comprises:

and carrying out linear fitting processing on each test current and the corresponding target voltage, and determining the current correction parameters.

6. The method according to any one of claims 1-4, further comprising:

acquiring current to be corrected, performing voltage conversion processing on the current to be corrected by adopting the current sensor, and determining conversion voltage corresponding to the current to be corrected;

and correcting the conversion voltage according to the current correction parameters, and determining the target current corresponding to the current to be corrected.

7. The method of claim 6, wherein the current correction parameters include correspondence between different voltage intervals and different correction parameters;

the step of correcting the conversion voltage according to the current correction parameter to determine a target current corresponding to the current to be corrected, including:

Determining a target voltage interval in which the conversion voltage is located in the different voltage intervals;

and correcting the conversion voltage by adopting the correction parameters corresponding to the target voltage interval, and determining the target current corresponding to the current to be corrected.

8. A current correction device, the device comprising:

and the correction parameter determining module is used for determining a current correction parameter according to each test current and the corresponding target voltage.

9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any of claims 1 to 7 when the computer program is executed.

10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 7.