CN117176086A

CN117176086A - Voltage compensation method and device, electronic equipment and storage medium

Info

Publication number: CN117176086A
Application number: CN202311108407.1A
Authority: CN
Inventors: 胡广建
Original assignee: Suzhou Inspur Intelligent Technology Co Ltd
Current assignee: Suzhou Inspur Intelligent Technology Co Ltd
Priority date: 2023-08-30
Filing date: 2023-08-30
Publication date: 2023-12-05

Abstract

The application discloses a voltage compensation method, which comprises the following steps: acquiring a first ambient temperature of the operational amplifier, determining the first temperature of the operational amplifier based on the first ambient temperature, determining a first offset voltage of the operational amplifier based on the first temperature, and compensating an output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage. According to the method, the temperature of the operational amplifier can be determined through the ambient temperature of the operational amplifier, and further the offset voltage generated by the operational amplifier can be determined according to the temperature of the operational amplifier, and the corresponding offset voltage can be adopted to compensate under the condition that the operational amplifier is at different temperatures, so that the effect of voltage compensation is improved, and the accuracy of the output voltage of the operational amplifier is improved.

Description

Voltage compensation method and device, electronic equipment and storage medium

Technical Field

The application belongs to the technical field of electronic science, and particularly relates to a voltage compensation method, a voltage compensation device, electronic equipment and a storage medium.

Background

Operational amplifiers are often used in front-end and back-end circuits as critical devices for processing the gain of analog signals. However, the operational amplifier generally has a problem of offset voltage. The offset voltage, also known as the input offset voltage, changes when the independent variables such as temperature change, time duration, supply voltage, etc. change. The ratio of the input offset voltage to the variation of the independent variable is called offset voltage drift.

In the related art, a mirrored current subtracting circuit may be used to compensate for the positive and negative offset voltages, respectively. In the scheme, a current subtracting circuit is formed by using a plurality of PMOS tubes and NMOS tubes, offset voltage of an operational amplifier in an analog circuit is collected, then an available subtracting circuit is automatically judged based on the offset voltage, and finally output voltage is compensated through the subtracting circuit.

However, the method can only compensate offset voltage of the low-voltage band gap reference circuit, and cannot compensate offset voltage of the operational amplifier in other scenes, so that the compensation effect of the scheme is poor.

Disclosure of Invention

The embodiment of the application aims to provide a voltage compensation method, a device, electronic equipment and a storage medium, which can solve the problem of poor offset voltage compensation effect in the related technology.

In a first aspect, an embodiment of the present application provides a voltage compensation method, including:

acquiring a first ambient temperature of an operational amplifier;

determining a first temperature of the operational amplifier based on the first ambient temperature;

determining a first offset voltage of the operational amplifier based on the first temperature;

and compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage.

Optionally, the determining the first temperature of the operational amplifier based on the first ambient temperature includes:

determining a second temperature of the operational amplifier based on the first ambient temperature;

and correcting the second temperature to obtain the first temperature.

Optionally, the determining the second temperature of the operational amplifier based on the first ambient temperature includes:

determining a first power of the operational amplifier;

determining a first ramp-up temperature of the operational amplifier compared to the first ambient temperature based on the first power;

a second temperature of the operational amplifier is determined based on the first ambient temperature and the first elevated temperature.

Optionally, the determining, based on the first power, a first ramp-up temperature of the operational amplifier compared to the first ambient temperature includes:

acquiring a first corresponding relation between the rising temperature of the operational amplifier and the working power of the operational amplifier;

the first rising temperature is determined based on the first correspondence and the first power.

Determining a first drift voltage of a power supply of a circuit in which the operational amplifier is positioned;

a first temperature of the operational amplifier is determined if the first drift voltage is less than or equal to a first threshold.

Optionally, the correcting the second temperature to obtain the first temperature includes:

determining a second correspondence between junction temperature and time of the operational amplifier;

determining a first error of the second temperature based on the second correspondence;

and correcting the second temperature based on the first error to obtain the first temperature.

Optionally, the correcting the second temperature based on the first error to obtain the first temperature includes:

acquiring an acquisition time stamp and temperature acquisition time delay of the second temperature;

and determining the first temperature corresponding to the acquisition time stamp based on the temperature acquisition time delay and the first error.

Optionally, the determining the first offset voltage of the operational amplifier based on the first temperature includes:

determining a first temperature drift coefficient of the operational amplifier based on the first temperature; the first temperature drift coefficient represents a ratio of an input offset voltage of the operational amplifier to the first temperature;

The first offset voltage is determined based on the first temperature and the first temperature drift coefficient.

Optionally, the determining the first temperature drift coefficient of the operational amplifier based on the first temperature includes:

acquiring a third corresponding relation between the temperature drift coefficient of the operational amplifier and the first temperature;

the first temperature drift coefficient is determined based on the first temperature and the third correspondence.

Optionally, the compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage includes:

calculating the difference value between the output voltage and the first offset voltage under the condition that the operational amplifier is in a voltage following working state, so as to obtain the target output voltage;

and under the condition that the operational amplifier is in a voltage amplification working state, acquiring the voltage gain of the operational amplifier, and compensating the output voltage based on the voltage gain and the first offset voltage to obtain the target output voltage.

Optionally, the compensating the output voltage based on the voltage gain and the first offset voltage to obtain the target output voltage includes:

Determining a voltage amplification factor of the operational amplifier based on the voltage gain;

determining a compensation value of the output voltage based on the voltage amplification and the first offset voltage;

and compensating the output voltage based on the compensation value to obtain the target output voltage.

determining a second offset voltage of the operational amplifier;

and compensating the output voltage based on the first offset voltage and the second offset voltage to obtain the target output voltage.

Optionally, the determining the second offset voltage of the operational amplifier includes:

determining a first working time length of the operational amplifier and a time drift coefficient of the operational amplifier; the time drift coefficient represents the ratio of the input offset voltage of the operational amplifier to the working time of the operational amplifier;

and determining a second offset voltage of the operational amplifier based on the time drift coefficient and the first working time length.

Optionally, the compensating the output voltage based on the first offset voltage and the second offset voltage to obtain the target output voltage includes:

Determining a first accumulated value of the second offset voltage based on the first operating duration and the time drift coefficient;

and under the condition that the first accumulated value is larger than or equal to a second threshold value, compensating the output voltage based on the first accumulated value and the first offset voltage to obtain the target output voltage.

Optionally, the method further comprises:

and under the condition that the first working time length is greater than or equal to a third threshold value, calibrating the operational amplifier, and setting the second offset voltage and the first working time length to zero.

determining a second drift voltage of a power supply of a circuit in which the operational amplifier is positioned;

and compensating the output voltage based on the second drift voltage and the first offset voltage to obtain the target output voltage.

In a second aspect, an embodiment of the present application provides a voltage compensation device, including:

the acquisition module is used for acquiring the first ambient temperature of the operational amplifier;

a first determination module for determining a first temperature of the operational amplifier based on the first ambient temperature;

A second determining module configured to determine a first offset voltage of the operational amplifier based on the first temperature;

and the compensation module is used for compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage.

Optionally, the first determining module includes:

a first determination sub-module for determining a second temperature of the operational amplifier based on the first ambient temperature;

and the correction submodule is used for correcting the second temperature to obtain the first temperature.

Optionally, the first determining sub-module includes:

a first determining unit configured to determine a first power of the operational amplifier;

a second determining unit configured to determine a first rising temperature of the operational amplifier compared to the first ambient temperature based on the first power;

and a third determining unit configured to determine a second temperature of the operational amplifier based on the first ambient temperature and the first rising temperature.

Optionally, the second determining unit includes:

a first obtaining subunit, configured to obtain a first correspondence between a rising temperature of the operational amplifier and an operating power of the operational amplifier;

And a first determination subunit configured to determine the first rising temperature based on the first correspondence and the first power.

Optionally, the first determining module includes:

the second determining submodule is used for determining a first drift voltage of a power supply of a circuit where the operational amplifier is located;

and a third determination submodule configured to determine a first temperature of the operational amplifier if the first drift voltage is less than or equal to a first threshold.

Optionally, the correction submodule includes:

a fourth determining unit configured to determine a second correspondence between junction temperature and time of the operational amplifier;

a fifth determining unit configured to determine a first error of the second temperature based on the second correspondence;

and the correction unit is used for correcting the second temperature based on the first error to obtain the first temperature.

Optionally, the correction unit includes:

the second acquisition subunit is used for acquiring the acquisition time stamp and the temperature acquisition time delay of the second temperature;

and the second determining subunit is used for determining the first temperature corresponding to the acquisition time stamp based on the temperature acquisition time delay and the first error.

Optionally, the second determining module includes:

a fourth determination submodule for determining a first temperature drift coefficient of the operational amplifier based on the first temperature; the first temperature drift coefficient represents a ratio of an input offset voltage of the operational amplifier to the first temperature;

and a fifth determining sub-module for determining the first offset voltage based on the first temperature and the first temperature drift coefficient.

Optionally, the fourth determining sub-module includes:

an obtaining unit, configured to obtain a third correspondence between a temperature drift coefficient of the operational amplifier and the first temperature;

a sixth determining unit configured to determine the first temperature drift coefficient based on the first temperature and the third correspondence.

Optionally, the compensation module includes:

the calculating sub-module is used for calculating the difference value between the output voltage and the first offset voltage to obtain the target output voltage under the condition that the operational amplifier is in a voltage following working state;

the first compensation sub-module is used for acquiring the voltage gain of the operational amplifier and compensating the output voltage based on the voltage gain and the first offset voltage to obtain the target output voltage when the operational amplifier is in a voltage amplification working state.

Optionally, the compensation module includes:

a sixth determination submodule for determining a voltage amplification factor of the operational amplifier based on the voltage gain;

a seventh determining sub-module for determining a compensation value of the output voltage based on the voltage amplification and the first offset voltage;

and the second compensation submodule is used for compensating the output voltage based on the compensation value to obtain the target output voltage.

Optionally, the compensation module includes:

an eighth determination submodule configured to determine a second offset voltage of the operational amplifier;

and the third compensation sub-module is used for compensating the output voltage based on the first offset voltage and the second offset voltage to obtain the target output voltage.

Optionally, the eighth determining submodule includes:

a seventh determining unit, configured to determine a first operation duration of the operational amplifier and a time drift coefficient of the operational amplifier; the time drift coefficient represents the ratio of the input offset voltage of the operational amplifier to the working time of the operational amplifier;

and an eighth determining unit, configured to determine a second offset voltage of the operational amplifier based on the time drift coefficient and the first operating duration.

Optionally, the third compensation sub-module includes:

a ninth determining unit, configured to determine a first accumulated value of the second offset voltage based on the first operating duration and the time drift coefficient;

and the compensation unit is used for compensating the output voltage based on the first accumulated value and the first offset voltage to obtain the target output voltage under the condition that the first accumulated value is larger than or equal to a second threshold value.

Optionally, the apparatus further includes:

and the calibration module is used for calibrating the operational amplifier and setting the second offset voltage and the first working time to zero under the condition that the first working time is longer than or equal to a third threshold value.

Optionally, the compensation module includes:

a ninth determining submodule, configured to determine a second drift voltage of a power supply of a circuit in which the operational amplifier is located;

and the fourth compensation sub-module is used for compensating the output voltage based on the second drift voltage and the first offset voltage to obtain the target output voltage.

In a third aspect, an embodiment of the present application provides an electronic device, including a voltage compensation device as described above, configured to implement a voltage compensation method as described in any one of the above.

In a fourth aspect, embodiments of the present application provide a storage medium having stored thereon a program or instructions which, when executed by a processor, implement a voltage compensation method as described in any one of the above.

In an embodiment of the present application, a voltage compensation method is provided, including: the first temperature of the operational amplifier is determined based on the first ambient temperature, the first offset voltage of the operational amplifier is determined based on the first temperature, the output voltage of the operational amplifier is compensated based on the first offset voltage, the target output voltage is obtained, offset voltages generated by the operational amplifier can be compensated according to junction temperature of the operational amplifier, different offset voltages can be adopted for compensation under the condition that the operational amplifier is at different temperatures, the voltage compensation effect is improved, and the accuracy of the output voltage of the operational amplifier is improved.

Drawings

FIG. 1 is a flow chart of steps of a voltage compensation method according to an embodiment of the present application;

FIG. 2 is an exemplary diagram of a temperature acquisition circuit provided by an embodiment of the present application;

FIG. 3 is an exemplary graph of offset voltage provided by an embodiment of the present application;

FIG. 4 is a flowchart illustrating steps of another voltage compensation method according to an embodiment of the present application;

FIG. 5 is a logic block diagram of a voltage compensation device according to an embodiment of the present application;

fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

The technical solutions of the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which are obtained by a person skilled in the art based on the embodiments of the present application, fall within the scope of protection of the present application.

The terms first, second and the like in the description and in the claims, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged, as appropriate, such that embodiments of the present application may be implemented in sequences other than those illustrated or described herein, and that the objects identified by "first," "second," etc. are generally of a type, and are not limited to the number of objects, such as the first object may be one or more. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship.

The voltage compensation method provided by the embodiment of the application is described in detail below through specific embodiments and application scenes thereof with reference to the accompanying drawings.

Referring to fig. 1, fig. 1 shows a step flowchart of a voltage compensation method according to an embodiment of the present application, where the method specifically may include the following steps:

step 101, a first ambient temperature of an operational amplifier is obtained.

In an embodiment of the present application, the operational amplifier may be an electronic integrated circuit including a multi-stage amplifying circuit, and may include two input terminals and one output terminal. The operational amplifier is mainly composed of a differential input stage, a voltage amplification stage and an output stage. The differential input stage can be a differential amplifying circuit formed by two triodes, and has high input resistance and zero drift inhibition capability; the voltage amplifying stage can amplify voltage and is generally composed of a common emitter amplifying circuit; the output electrode is connected with the load and has the characteristics of strong load capacity and low output resistance. Operational amplifiers are often used in front-end and back-end circuits of analog-to-digital converters (analog to digital converter, ADC) and digital-to-analog converters (digital to analog converter, DAC) as key devices for processing analog signal gain. For any practical operational amplifier, there is a problem of offset voltage. The temperature offset voltage caused by the temperature of the operational amplifier occupies a main position in the offset voltage output by the operational amplifier as a whole. For a certain operational amplifier, the corresponding relation between the temperature offset voltage and the temperature is determined; this correspondence is typically different for different operational amplifiers.

In the embodiment of the application, since the operational amplifier is usually in a package structure, it is difficult to directly obtain the junction temperature inside the operational amplifier, and in addition, since the operational amplifier is usually soldered on a PCB, it is also difficult to measure the surface temperature of the operational amplifier, and thus, the first ambient temperature of the operational amplifier can be obtained.

The process of acquiring and determining the first temperature may be based on a temperature acquisition circuit on which the LM96163 chip is mounted, for example. As shown in fig. 2, fig. 2 is an exemplary diagram of a temperature acquisition circuit according to an embodiment of the present application. The principle of triode for temperature acquisition is that when the temperature outside the triode changes, the bias degree of holes and electrons inside PN junctions inside the triode can be increased, and the electromotive force between PN junctions can be changed due to the drift effect of minority carriers inside the P section and the N section, if the PN junctions are conducted outside, weak current can be generated by an external circuit. The magnitude of this weak current is directly related to the temperature of the PN junction. Thus, this characteristic of the transistor can be used to indirectly capture the first ambient temperature of the environment in which the operational amplifier is located. In the figure, a PNP type transistor may be used for temperature acquisition, pin 3 of LM96163 may be connected to the emitter of the PNP type transistor, and pin 4 may be connected to the base of the PNP type transistor. LM96163 can monitor the weak current of the transistor and convert the weak current into temperature information that is stored in a register inside LM 96163. Pin 7, pin 9 and pin 10 of LM96163 can send temperature information to the control center over the SMbus bus. Pin 5 of LM96163 can output a pulse width modulation (pulse width modulation, PWM) by which the rotational speed of the rightmost fan 401 of the circuit diagram can be controlled. The effect finally achieved may be that the higher the collected first ambient temperature is, the higher the rotation speed of the fan 401 is, and the lower the first ambient temperature is, the lower the rotation speed of the fan 401 is, so that the temperature of the PNP transistor is in a stable state.

Step 102, determining a first temperature of the operational amplifier based on the first ambient temperature.

In the embodiment of the application, when the operational amplifier works, the triode inside the operational amplifier is conducted to work so as to generate heat, and the temperature of the operational amplifier affects the ambient temperature around the operational amplifier chip, so that the first temperature of the operational amplifier can be determined based on the first ambient temperature. The first temperature may be a junction temperature of the operational amplifier, that is, a temperature inside the operational amplifier, a surface temperature of the operational amplifier, or a temperature after the junction temperature of the operational amplifier is corrected.

Step 103, determining a first offset voltage of the operational amplifier based on the first temperature.

In the embodiment of the present application, the offset voltage is also called an input offset voltage, which refers to the difference between the dc voltages applied to the two input terminals in order to obtain a constant zero voltage output at the output terminal in the differential amplifier or the differential input operational amplifier. Because of the materials and manufacturing process of the operational amplifier, the operational amplifier inevitably generates offset voltage during operation, and the offset voltage of the operational amplifier can be determined by the junction temperature and the working time of the operational amplifier.

For example, as shown in fig. 3, fig. 3 is an exemplary diagram of offset voltage according to an embodiment of the present application. Any practical operational amplifier can be seen as a voltage source of Vos connected in series inside the positive pole of the input terminal. In the diagram, the circuit diagram on the left side of the schematic diagram shows that a controllable voltage source with the voltage Vos and opposite to the offset voltage is connected to the positive electrode of the input end of the operational amplifier, and then the other end of the controllable voltage source and the negative electrode of the input end of the operational amplifier are grounded, so that the output voltage Uo can be equal to 0; the circuit diagram on the right side of the schematic diagram shows that the positive electrode of the input end of the operational amplifier is grounded, the negative electrode of the input end is connected with the output end to form a voltage follower, and at the moment, the output voltage Uo can be equal to the offset voltage Vos, and the direction of the output voltage and the direction of the input voltage can be opposite because the voltage follower has the function of reverse phase.

In embodiments of the present application, different temperatures may correspond to different offset voltages for a given operational amplifier, which may be measured by the laboratory environment, as an inherent property of the operational amplifier itself. Therefore, after the first temperature of the operational amplifier is determined based on the first ambient temperature, the first offset voltage of the operational amplifier may be determined according to the correspondence between the temperature and the offset voltage and the first temperature.

And 104, compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage.

In the embodiment of the application, after the first offset voltage is determined, voltage compensation can be performed on the output end of the operational amplifier in the circuit where the operational amplifier is located, so as to obtain the target output voltage. For a circuit taking a field programmable gate array (Field Programmable Gate Array, FPGA) as a control center, offset voltage compensation can be issued by the field programmable gate array; for a circuit taking other processors as a control center, a controllable voltage source can be mounted in the circuit, and the voltage value provided by the controllable voltage source is regulated by the processors so as to compensate the output voltage. The target output voltage may be a voltage that a circuit including the operational amplifier wants to obtain. After compensation, the target output voltage may be the same as or similar to the output voltage of the ideal operational amplifier.

In the embodiment of the application, the first ambient temperature of the operational amplifier is obtained, the first temperature of the operational amplifier is determined based on the first ambient temperature, the first offset voltage of the operational amplifier is determined based on the first temperature, the output voltage of the operational amplifier is compensated based on the first offset voltage to obtain the target output voltage, the temperature of the operational amplifier can be determined through the ambient temperature of the operational amplifier, the offset voltage generated by the operational amplifier can be further determined according to the temperature of the operational amplifier, and the corresponding offset voltage can be adopted for compensation under the condition that the operational amplifier is at different temperatures, so that the voltage compensation effect is improved, and the accuracy of the output voltage of the operational amplifier is improved.

As shown in fig. 4, fig. 4 is another voltage compensation method according to an embodiment of the present application, where the method may include:

step 201, a first ambient temperature of the operational amplifier is obtained.

In the embodiment of the application, the first ambient temperature can be obtained through a temperature acquisition circuit which is also arranged on the PCB, and the first ambient temperature can also be obtained through a temperature sensor or a thermistor and peripheral circuits thereof. When the thermistor is used, the circuit of the thermistor can be freely designed according to the requirement. The method for acquiring the first ambient temperature is not limited in the application. Other implementation contents of this step may refer to the embodiment contents of step 101, and will not be described herein.

Step 202, determining a first temperature of the operational amplifier based on the first ambient temperature.

In the embodiment of the present application, the content of the embodiment of the step 101 may be referred to herein, and will not be described in detail.

Optionally, in step 202, the following sub-steps may be included:

substep 2021 determines a second temperature of the operational amplifier based on the first ambient temperature.

In an embodiment of the present application, the second temperature may be a junction temperature of the operational amplifier, and the second temperature of the operational amplifier may be determined by a first ambient temperature of an environment in which the operational amplifier is located. The second temperature inside the operational amplifier can be obtained according to the temperature propagation characteristics of the operational amplifier packaging material and the temperature propagation characteristics in the air.

Optionally, in the sub-step 2021, the following sub-steps may be included:

sub-step a211, determining a first power of the operational amplifier.

In an embodiment of the present application, the first power may be an operating power of the operational amplifier. When the operational amplifier is actually used, the external voltage-stabilizing direct current power supply can supply power, and the internal current of the operational amplifier is often smaller due to higher impedance of the operational amplifier. In the embodiment of the application, the current of the two input ends of the operational amplifier can be collected through the weak current collection equipment, and then the first power of the operational amplifier is determined through the current of the two input ends and the voltage of the external voltage-stabilizing direct current power supply.

Substep a212 determines a first elevated temperature of the operational amplifier compared to the first ambient temperature based on the first power.

In an embodiment of the present application, the rising value of the junction temperature of the operational amplifier compared to the ambient temperature is positively correlated with the operating power of the operational amplifier, and thus the first rising temperature of the operational amplifier compared to the first ambient temperature can be determined based on the first power.

Further, in the sub-step a212, the following sub-steps may be included:

And a substep B1, obtaining a first corresponding relation between the rising temperature of the operational amplifier and the working power of the operational amplifier.

In an embodiment of the present application, the rising temperature may represent a rising value of the junction temperature of the operational amplifier compared to the ambient temperature. Meanwhile, the magnitude of the temperature rise may be directly related to the operating power of the operational amplifier. After the operational amplifier is packaged, a first corresponding relation between the rising temperature and the working power can be obtained through a laboratory environment. In the actual use scenario of the operational amplifier, the data manual corresponding to the operational amplifier may be consulted to obtain the first correspondence relationship. The first correspondence may be a mapping or a functional relationship.

And a substep B2 of determining the first rising temperature based on the first correspondence and the first power.

In the embodiment of the application, after the first corresponding relation is acquired, the first rising temperature of the operational amplifier can be determined according to the first power of the operational amplifier and the first corresponding relation. The first rising temperature may represent a rising value of a junction temperature of the operational amplifier compared to the first ambient temperature.

In the embodiment of the application, the junction temperature in the operational amplifier can be obtained by obtaining the first corresponding relation between the rising temperature of the operational amplifier and the working power of the operational amplifier and determining the first rising temperature based on the first corresponding relation and the first power, so that the accuracy of the second temperature is improved.

Substep a213 determines a second temperature of the operational amplifier based on the first ambient temperature and the first elevated temperature.

In the embodiment of the application, after the first ambient temperature of the environment where the operational amplifier is located and the first rising temperature of the operational amplifier are obtained, the sum of the first ambient temperature and the first rising temperature can be calculated to obtain the second temperature of the operational amplifier, namely the junction temperature of the operational amplifier.

For example, if the first ambient temperature is 60 degrees celsius and the first rising temperature is 20 degrees celsius, the second temperature may be 80 degrees celsius, i.e., the second temperature may be the sum of the first ambient temperature and the first rising temperature.

In the embodiment of the application, the first power of the operational amplifier is determined, the first rising temperature of the operational amplifier compared with the first environment temperature is determined based on the first power, and the second temperature of the operational amplifier is determined based on the first environment temperature and the first rising temperature, so that the junction temperature in the operational amplifier can be obtained according to the working power of the operational amplifier and the temperature characteristic of the operational amplifier, and the accuracy and the reliability of the available temperature of the operational amplifier are improved.

In a sub-step 2022, the second temperature is corrected to obtain the first temperature.

In the embodiment of the application, the second temperature is obtained after a series of transformations on the first ambient temperature, and meanwhile, because the first ambient temperature is obtained through acquisition, some errors are unavoidable, so that the second temperature can also have a certain error under the condition that the first ambient temperature has errors. Thus, the second temperature can be error corrected, resulting in the first temperature of the operational amplifier.

Optionally, in the sub-step 2022, the following sub-steps may be included:

sub-step a221, determining a second correspondence between junction temperature and time of the operational amplifier.

In embodiments of the present application, the junction temperature of the operational amplifier is typically not a constant value, but a variable that may vary over time. Under the state that the circuit of the operational amplifier is in stable operation, a change relation diagram of junction temperature and time of the operational amplifier can be mapped, and then a second corresponding relation between the junction temperature and the time is determined.

Along the above example, if the temperature acquisition circuit based on LM96163 is adopted, the first ambient temperature will be in a dynamic balance state, and the second temperature of the corresponding operational amplifier will also be in a dynamic balance state, and at this time, the change rule of the dynamic balance, that is, the correspondence between the second temperature and time, can be obtained.

Step a222, determining a first error of the second temperature based on the second correspondence.

In an embodiment of the present application, after the second correspondence between the junction temperature and the time of the amplifier is obtained, the first error of the second temperature may be determined according to such correspondence. According to the foregoing embodiment, the second temperature is the junction temperature of the collected operational amplifier, so that the collection time stamp corresponding to the second temperature may be recorded and compared with the second correspondence, so as to determine the first error.

And a substep a223, correcting the second temperature based on the first error, so as to obtain the first temperature.

In an embodiment of the present application, after the first error is determined, the second temperature may be corrected based on the first error, that is, a difference between the first error and the second temperature is calculated, so as to obtain the first temperature. The first temperature is the temperature value after the second temperature is corrected.

In embodiments of the application, there may be another implementation. The acquisition of the first ambient temperature may be performed based on a certain frequency. Typically, the value of the acquisition frequency may be in a higher state. Thus, after the second temperature is obtained, the unreasonable second temperature can be filtered out in a digital filtering manner according to the second corresponding relation. The digital filtering may employ a digital filter, such as an infinite impulse response (Infinite Impulse Response, IIR) digital filter. After filtering, the filtered second temperature value may be replaced by an arithmetic average of the temperatures on adjacent sides of the filtered data. In this way, the second temperature can likewise be corrected.

Optionally, in the sub-step a223, the following sub-steps may be included:

and B3, acquiring the acquisition time stamp and the temperature acquisition time delay of the second temperature.

In the embodiment of the application, the circuit in which the operational amplifier is located can be provided with the clock chip, and when the first ambient temperature of the environment in which the operational amplifier is located is obtained, the clock chip can be used for adding a time stamp to the first ambient temperature, and similarly, the second temperature obtained from the first ambient temperature can also have the same time stamp as the original first ambient temperature. In addition, since the electronic measurement has hysteresis, the temperature acquisition time delay of the second temperature, that is, the temperature acquisition time delay of the first ambient temperature, can be acquired.

Along with the above example, in the LM96163 based temperature acquisition circuit, the output delay of LM96163 compared to the input of pin 3 and pin 4 can be obtained, and the transmission delay of the SMbus bus can be determined, and then the output delay and the bus transmission delay are added, so that the temperature acquisition delay can be obtained.

And a sub-step B4 of determining the first temperature corresponding to the acquisition time stamp based on the temperature acquisition time delay and the first error.

In the embodiment of the application, after the acquisition time stamp and the temperature acquisition time delay of the second temperature are acquired, the real temperature value corresponding to the acquisition time stamp can be determined based on the second corresponding relation, so that the hysteresis of temperature acquisition is eliminated; the true temperature value may then be corrected based on the first error to determine a first temperature of the operational amplifier corresponding to the acquisition time stamp.

In the embodiment of the application, the acquisition time stamp and the temperature acquisition time delay of the second temperature are acquired, and the first temperature corresponding to the acquisition time stamp is determined based on the temperature acquisition time delay and the first error, so that the second temperature can be corrected from two angles of the acquisition time delay and the acquisition error, and the accuracy and the reliability of the first temperature are further improved.

In the embodiment of the application, the second corresponding relation between the junction temperature and the time of the operational amplifier is determined, the first error of the second temperature is determined based on the second corresponding relation, the second temperature is corrected based on the first error to obtain the first temperature, and the second temperature can be corrected according to the temperature characteristic of the operational amplifier, so that the first temperature is obtained, and the accuracy and the reliability of the first temperature data are improved.

In the embodiment of the application, the first ambient temperature of the operational amplifier is obtained, the second temperature of the operational amplifier is determined based on the first ambient temperature, the second temperature is corrected to obtain the first temperature, the second temperature inside the operational amplifier can be indirectly obtained through the first ambient temperature of the environment where the operational amplifier is positioned, and the correction is performed, so that the first temperature is obtained, and the accuracy of the first temperature of the operational amplifier is improved.

Sub-step 2023, determining a first drift voltage of a power supply of a circuit in which the operational amplifier is located.

In the embodiment of the application, the power supply of the operational amplifier can be a direct current stabilized power supply generally, and the direct current stabilized power supply cannot generate electricity autonomously due to the limitation of manufacturing process and technology, that is, the direct current stabilized power supply cannot generate stable direct current by itself, and in general, the direct current stabilized power supply can convert civil or industrial alternating current into direct current so as to supply power for various components. Also, the dc voltage-stabilized power supply may have a voltage drift due to limitations in manufacturing process and technology, i.e., the dc voltage provided by the dc voltage-stabilized power supply may have an oscillation, i.e., a voltage drift. Thus, the first drift voltage of the power supply of the circuit in which the operational amplifier is located can be detected and determined. The detection and determination modes can be performed through an oscilloscope or through a manually written voltage acquisition program.

Sub-step 2024, determining a first temperature of the operational amplifier if the first drift voltage is less than or equal to a first threshold.

In the embodiment of the application, after the first drift voltage of the power supply is determined, whether the first drift voltage meets the power supply standard or not can be judged, namely, the magnitude relation between the first drift voltage and the manually set first threshold value is judged. In the case where the first drift voltage is less than or equal to the first threshold value, the power supply may be considered to meet a power supply standard, at which time the first temperature of the operational amplifier may be determined based on the first ambient temperature.

In the embodiment of the application, by determining the first drift voltage of the power supply of the circuit where the operational amplifier is located, and determining the first temperature of the operational amplifier based on the first ambient temperature when the first drift voltage is smaller than or equal to the first threshold value, whether the power supply of the operational amplifier meets the use standard can be judged, and the first temperature is determined when the power supply meets the use standard, so that the usability of the first temperature is improved.

Step 203, determining a first temperature drift coefficient of the operational amplifier based on the first temperature; the first temperature drift coefficient represents a ratio of an input offset voltage of the operational amplifier relative to the first temperature.

In embodiments of the present application, temperature drift is an inherent property of an operational amplifier, and the temperature drift coefficient may be a ratio of an input offset voltage of the operational amplifier to a junction temperature of the operational amplifier. In an embodiment of the present application, after determining the first temperature of the operational amplifier, the first temperature drift coefficient of the operational amplifier may be determined based on the first ambient temperature according to the temperature drift characteristic of the operational amplifier and the temperature value of the first temperature.

Optionally, in step 203, the following sub-steps may be included:

in a sub-step 2031, a third correspondence between the temperature drift coefficient of the operational amplifier and the first temperature is obtained.

In embodiments of the present application, the temperature drift coefficient of the operational amplifier generally varies with the junction temperature of the operational amplifier, i.e., the temperature drift coefficient of the operational amplifier may be a varying value and may be directly related to the junction temperature of the operational amplifier. After the operational amplifier package is completed, the temperature drift coefficient versus temperature correspondence may be determined in a laboratory environment. In an actual use scenario of the operational amplifier, such correspondence relationship may be acquired by referring to a data manual of the operational amplifier. In the embodiment of the present application, the third correspondence relationship between the temperature drift coefficient of the operational amplifier and the first temperature may be obtained by referring to the data manual, or may be measured by a laboratory, which is not limited in the embodiment of the present application.

A substep 2032 of determining the first temperature drift coefficient based on the first temperature and the third correspondence.

In an embodiment of the present application, after determining the first temperature of the operational amplifier based on the first ambient temperature, a first temperature drift coefficient corresponding to the first temperature may be determined based on the first temperature and a third correspondence relationship between a temperature drift coefficient and a junction temperature.

In the embodiment of the application, the first temperature drift coefficient corresponding to the first temperature can be determined according to the temperature drift characteristic of the operational amplifier by acquiring the third corresponding relation between the temperature drift coefficient of the operational amplifier and the first temperature and determining the first temperature drift coefficient based on the first temperature and the third corresponding relation, so that the reliability of the first temperature drift coefficient is improved.

Step 204, determining the first offset voltage based on the first temperature and the first temperature drift coefficient.

In an embodiment of the present application, after determining the first temperature drift coefficient, the first offset voltage of the operational amplifier may be determined based on the first temperature and the first temperature drift coefficient. Specifically, the temperature value of the first temperature and the first temperature drift coefficient may be multiplied, so that the voltage value of the first offset voltage may be obtained.

In an embodiment of the application, a first temperature drift coefficient of the operational amplifier is determined based on the first ambient temperature by based on a first temperature; the first temperature drift coefficient represents the ratio of the input offset voltage of the operational amplifier relative to the first temperature, the first offset voltage is determined based on the first temperature and the first temperature drift coefficient, the first offset voltage of the operational amplifier can be determined based on the temperature drift characteristic of the operational amplifier and the first temperature, and the availability of the first offset voltage is improved.

And step 205, compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage.

In the embodiment of the present application, the content of the embodiment of the step 103 may be referred to, and will not be described herein.

Optionally, in step 205, the following sub-steps may be included:

sub-step 2051, calculating a difference between the output voltage and the first offset voltage to obtain the target output voltage when the operational amplifier is in a voltage following working state.

In the embodiment of the present application, the voltage following operation state of the operational amplifier is as described in the related implementation content in step 101, and may be an operation state of the operational amplifier formed by directly connecting the negative electrode of the input terminal and the output terminal of the operational amplifier through a wire. In the voltage following working state, the voltage gain of the operational amplifier can be shielded to fail, so that after the first offset voltage is determined, the difference between the output voltage and the first offset voltage can be calculated, and the target output voltage is obtained. The voltage direction can be considered during calculation, and any voltage direction can be set as a reference direction.

For example, in the voltage following operation state, if the first offset voltage is 0.3V and the output voltage is-3V, the target output voltage is-3.3V; if the first offset voltage is 0.3V and the output voltage is 3V, the target output voltage is 2.7V.

Sub-step 2052, obtaining a voltage gain of the operational amplifier and compensating the output voltage based on the voltage gain and the first offset voltage to obtain the target output voltage when the operational amplifier is in a voltage amplification working state.

In the embodiment of the application, under the condition that the operational amplifier is in a voltage amplification working state, two input pins of the input end of the operational amplifier are provided with voltage inputs. At this time, the voltage gain of the operational amplifier may function, so that the voltage gain of the operational amplifier may be obtained, and the output voltage may be further compensated based on the voltage gain and the first offset voltage, thereby obtaining the target output voltage.

Optionally, in the sub-step 2052, the following sub-steps may be included:

substep a521 determines a voltage amplification of the operational amplifier based on the voltage gain.

In the embodiment of the application, a certain conversion relation exists between the voltage gain and the voltage amplification factor of the operational amplifier, so that after the voltage gain of the operational amplifier is acquired, the voltage amplification factor of the operational amplifier can be obtained through the conversion relation. In addition, the voltage gain and the voltage amplification factor of the operational amplifier can be directly obtained by consulting the data manual of the operational amplifier.

Substep a522 determines a compensation value for the output voltage based on the voltage amplification and the first offset voltage.

In the embodiment of the application, when the operational amplifier is in the voltage amplification working state, the effect of the first offset voltage on the output end is affected by the voltage amplification factor. Accordingly, the compensation value of the output voltage may be determined based on the voltage amplification and the first offset voltage. The specific determination method may be that the voltage amplification factor is multiplied by the voltage value of the first offset voltage, so as to obtain the compensation value of the output voltage.

And a substep a523 of compensating the output voltage based on the compensation value to obtain the target output voltage.

In an embodiment of the present application, after determining the compensation value of the output voltage, the output voltage may be compensated based on the compensation value, so that the target output voltage may be obtained. Specifically, a difference between the compensation value and the output voltage may be calculated to obtain the target output voltage. Also, the direction of the compensation value and the output voltage may be considered, and any one of the voltage direction of the compensation value and the output voltage may be determined as the reference direction.

In the embodiment of the application, the voltage amplification factor of the operational amplifier is determined based on the voltage gain, the compensation value of the output voltage is determined based on the voltage amplification factor and the first offset voltage, and the output voltage is compensated based on the compensation value to obtain the target output voltage, so that the output voltage can be more reasonably compensated when the operational amplifier is in the voltage amplification working state, and the accuracy and the reliability of the target output voltage are further improved.

In the embodiment of the application, the difference between the output voltage and the first offset voltage is calculated to obtain the target output voltage when the operational amplifier is in the voltage following working state, and the voltage gain of the operational amplifier is obtained and the output voltage is compensated based on the voltage gain and the first offset voltage to obtain the target output voltage when the operational amplifier is in the voltage amplifying working state, so that the output voltage of the operational amplifier can be compensated in a targeted manner according to different working states of the operational amplifier, and the accuracy of the target output voltage is improved.

Sub-step 2053, determining a second offset voltage of the operational amplifier.

In an embodiment of the present application, as the operation time of the operational amplifier increases, the operational amplifier may further generate a second offset voltage based on the operation time period. Thus, the second offset voltage of the operational amplifier can be determined.

Optionally, in the sub-step 2053, the following sub-steps may be included:

sub-step A531, determining a first working time length of the operational amplifier and a time drift coefficient of the operational amplifier; and the time drift coefficient represents the ratio of the input offset voltage of the operational amplifier to the working time of the operational amplifier.

In an embodiment of the present application, the time drift coefficient may represent a ratio of an input offset voltage of the operational amplifier to an operation duration of the operational amplifier. In the embodiment of the application, since the second offset voltage is generated and changed based on the operation time of the operational amplifier, the first operation time of the operational amplifier can be determined by the clock chip in the circuit where the operational amplifier is located. The time drift characteristic of an operational amplifier is an inherent property of an operational amplifier, and thus, the time drift coefficient of an operational amplifier can be measured in a laboratory environment. In an actual use scenario of the operational amplifier, the time drift coefficient of the operational amplifier may be obtained by referring to a data manual of the operational amplifier.

And a substep a532, determining a second offset voltage of the operational amplifier based on the time drift coefficient and the first operating duration.

In the embodiment of the application, the time drift coefficient of the operational amplifier may be a constant value in general, so that the second offset voltage of the operational amplifier may be determined based on the time drift coefficient and the first operation duration, that is, the first operation duration and the time drift coefficient may be multiplied, so that the second offset voltage of the operational amplifier may be obtained.

In the embodiment of the application, the first working time length of the operational amplifier and the time drift coefficient of the operational amplifier are determined; the time drift coefficient represents the ratio of the input offset voltage of the operational amplifier to the working time of the operational amplifier, the second offset voltage of the operational amplifier is determined based on the time drift coefficient and the first working time, the offset voltage of the operational amplifier can be obtained from the time dimension, and the availability of the second offset voltage is ensured.

In step 2054, the output voltage is compensated based on the first offset voltage and the second offset voltage, so as to obtain the target output voltage.

In the embodiment of the application, after the second offset voltage is determined, the output voltage can be compensated based on the first offset voltage and the second offset voltage, so that the target output voltage can be obtained. Similar to the previous embodiments, the output voltage may also be compensated for pertinently according to the specific operating state of the operational amplifier.

Optionally, in the sub-step 2054, the following sub-steps may be included:

and step a541, determining a first accumulated value of the second offset voltage based on the first operating duration and the time drift coefficient.

In the embodiment of the application, the second offset voltage may be in a small range, so that in an actual usage scenario of the operational amplifier, the first accumulated value of the second offset voltage may be determined according to the first working duration and the time drift coefficient of the operational amplifier. The first accumulated value may be one of the values of the second offset voltage.

And sub-step a542, where the first accumulated value is greater than or equal to a second threshold, of compensating the output voltage based on the first accumulated value and the first offset voltage to obtain the target output voltage.

In the embodiment of the present application, in the case where the first accumulation value is greater than or equal to the second threshold value, it may be considered that the influence of the second offset voltage on the output voltage is already not negligible, and at this time, the output voltage may be compensated based on the first accumulation value and the first offset voltage, so that the target output voltage may be obtained.

In the embodiment of the application, the first accumulated value of the second offset voltage is determined based on the first working time length and the time drift coefficient, and the output voltage is compensated based on the first accumulated value and the first offset voltage to obtain the target output voltage under the condition that the first accumulated value is larger than or equal to the second threshold value, so that unnecessary compensation of the output voltage when the second offset voltage is lower can be avoided, the calculation resource of a control center is saved, and the performance of a circuit where the operational amplifier is located is improved.

In the embodiment of the application, the second offset voltage of the operational amplifier is determined, the output voltage is compensated based on the first offset voltage and the second offset voltage, the target output voltage is obtained, the output voltage can be compensated from the time dimension and the temperature dimension, and the accuracy and the reliability of the target output voltage are improved.

Sub-step 2055, calibrating the operational amplifier and setting zero the second offset voltage and the first operating time period if the first operating time period is greater than or equal to a third threshold.

In the embodiment of the application, when the operation time length of the operational amplifier is greater than or equal to the third threshold value, the accumulated second offset voltage is considered to be in a larger numerical range, so that the operational amplifier can be calibrated when the operation time length of the operational amplifier is greater than or equal to the third threshold value, and the second offset voltage and the operation time length of the operational amplifier are set to zero after the calibration.

In the embodiment of the application, the operational amplifier is calibrated under the condition that the working time length is larger than or equal to the third threshold value, and the second offset voltage and the first working time length are set to zero, so that the operational amplifier can be calibrated in time, serious consequences possibly caused by overlarge output voltage deviation are avoided, and the stability of a circuit where the operational amplifier is positioned is improved.

Sub-step 2056, determining a second drift voltage of a power supply of a circuit in which the operational amplifier is located.

In an embodiment of the present application, a second drift voltage of a power supply of a circuit in which the operational amplifier is located may be determined. The relevant implementation details may refer to the embodiment details of the substep 2023, which are not described herein.

And step 2057, compensating the output voltage based on the second drift voltage and the first offset voltage to obtain the target output voltage.

In the embodiment of the application, after the second drift voltage of the power supply of the circuit where the operational amplifier is located is determined, the output voltage can be compensated based on the second drift voltage and the first offset voltage, so that the target output voltage can be obtained. Because the characteristic of the power supply is not easy to determine the direction of the second drifting voltage, the absolute value of the second drifting voltage can be taken to participate in compensation. Similar to the foregoing embodiment, the directions of the first offset voltage and the output voltage may be considered, and any one of the voltage directions of the first offset voltage and the output voltage may be determined as the reference direction.

In the embodiment of the application, the second drift voltage of the power supply of the circuit where the operational amplifier is positioned is determined, the output voltage is compensated based on the second drift voltage and the first offset voltage, the target output voltage is obtained, the output voltage can be compensated according to the drift voltage and the first offset voltage generated by the power supply, and the accuracy and the reliability of the target output voltage are improved.

As shown in fig. 5, fig. 5 is a logic block diagram of a voltage compensation device according to an embodiment of the present application, where the device 500 may include:

an acquisition module 501, configured to acquire a first ambient temperature of the operational amplifier;

a first determining module 502 for determining a first temperature of the operational amplifier based on the first ambient temperature;

a second determining module 503, configured to determine a first offset voltage of the operational amplifier based on the first temperature;

and the compensation module 504 is configured to compensate the output voltage of the operational amplifier based on the first offset voltage, so as to obtain a target output voltage.

Optionally, the first determining module 502 includes:

Optionally, the first determining sub-module includes:

Optionally, the third determining unit includes:

Optionally, the first determining module 502 includes:

Optionally, the correction submodule includes:

Optionally, the correction unit includes:

Optionally, the second determining module 503 includes:

Optionally, the fourth determining sub-module includes:

Optionally, the compensation module 504 includes:

Optionally, the eighth determining submodule includes:

Optionally, the third compensation sub-module includes:

Optionally, the apparatus 500 further includes:

Optionally, the compensation module 504 includes:

In summary, a voltage compensation device provided by an embodiment of the present application includes: the system comprises an acquisition module, a first determination module, a second determination module and a compensation module, wherein the acquisition module is used for acquiring a first ambient temperature of the operational amplifier, the first determination module is used for determining the first temperature of the operational amplifier based on the first ambient temperature, the second determination module is used for determining a first offset voltage of the operational amplifier based on the first temperature, the compensation module is used for compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage, the temperature of the operational amplifier can be determined through the ambient temperature of the operational amplifier, the offset voltage generated by the operational amplifier can be determined according to the temperature of the operational amplifier, and the corresponding offset voltage can be adopted for compensation under the condition that the operational amplifier is at different temperatures, so that the voltage compensation effect is improved, and the accuracy of the output voltage of the operational amplifier is improved.

The voltage compensation device in the embodiment of the application can be an electronic device or a component in the electronic device, such as an integrated circuit or a chip. The electronic device may be a terminal, or may be other devices than a terminal. The electronic device may be a GPU BOX, a mobile phone, a tablet computer, a notebook computer, a palm computer, a vehicle-mounted electronic device, a mobile internet appliance (Mobile Internet Device, MID), an augmented reality (augmented reality, AR)/Virtual Reality (VR) device, a robot, a wearable device, an ultra-mobile personal computer (ultra-mobile personal computer, UMPC), a netbook or a personal digital assistant (personal digital assistant, PDA), or the like, and may also be a server, a network attached storage (Network Attached Storage, NAS), a personal computer (personal computer, PC), a Television (TV), a teller machine, a self-service machine, or the like, which is not particularly limited in the embodiments of the present application.

The voltage compensation device in the embodiment of the application can be a device with an operating system. The operating system may be an Android operating system, a Linux, windows operating system or the like, and may also be other possible operating systems, which are not particularly limited in the embodiments of the present application.

The voltage compensation device provided by the embodiment of the present application can implement each process implemented by the embodiments of the methods of fig. 1, fig. 2 and fig. 4, and in order to avoid repetition, the description is omitted here.

Optionally, as shown in fig. 6, the embodiment of the present application further provides an electronic device M00, which includes a processor M01 and a memory M02, where a program or an instruction that can be executed on the processor M01 is stored in the memory M02, and the program or the instruction implements each step of the above-mentioned voltage compensation method embodiment when executed by the processor M01, and can achieve the same technical effect, so that repetition is avoided and no further description is given here.

In an embodiment of the present application, the memory M02 may be used to store software programs as well as various data. The memory M02 may mainly include a first memory area storing programs or instructions and a second memory area storing data, wherein the first memory area may store an operating system, application programs or instructions (such as a sound playing function, an image playing function, etc.) required for at least one function, and the like. Further, the memory M02 may include a volatile memory or a nonvolatile memory, or the memory M02 may include both a volatile and nonvolatile memory. The nonvolatile Memory may be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable EPROM (EEPROM), or a flash Memory. The volatile memory may be random access memory (Random Access Memory, RAM), static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (ddr SDRAM), enhanced SDRAM (Enhanced SDRAM), synchronous DRAM (SLDRAM), and Direct RAM (DRRAM). Memory M02 in embodiments of the application includes, but is not limited to, these and any other suitable types of memory.

The processor M01 may include one or more processing units; optionally, the processor M01 integrates an application processor that primarily processes operations involving an operating system, user interface, application programs, etc., and a modem processor that primarily processes wireless communication signals, such as a baseband processor. It will be appreciated that the modem processor described above may not be integrated into the processor M01.

The embodiment of the application also provides a readable storage medium, on which a program or an instruction is stored, which when executed by a processor, implements each process of the above voltage compensation method embodiment, and can achieve the same technical effects, and in order to avoid repetition, the description is omitted here.

Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes computer readable storage medium such as computer readable memory ROM, random access memory RAM, magnetic or optical disk, etc.

The embodiment of the application further provides a chip, which comprises a processor and a communication interface, wherein the communication interface is coupled with the processor, and the processor is used for running programs or instructions to realize the processes of the voltage compensation method embodiment, and the same technical effects can be achieved, so that repetition is avoided, and the description is omitted here.

It should be understood that the chip according to the embodiments of the present application may also be referred to as a system-on-chip, a chip system, or a system-on-chip.

Embodiments of the present application provide a computer program product stored in a storage medium, where the program product is executed by at least one processor to implement the respective processes of the above-described voltage compensation method embodiments, and achieve the same technical effects, and for avoiding repetition, a detailed description is omitted herein.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the related art in the form of a computer software product stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), including several instructions for causing a terminal (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present application.

The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are to be protected by the present application.

Claims

1. A method of voltage compensation, the method comprising:

acquiring a first ambient temperature of an operational amplifier;

2. The method of claim 1, wherein the determining the first temperature of the operational amplifier based on the first ambient temperature comprises:

and correcting the second temperature to obtain the first temperature.

3. The method of claim 2, wherein the determining the second temperature of the operational amplifier based on the first ambient temperature comprises:

determining a first power of the operational amplifier;

4. The method of claim 3, wherein the determining a first ramp-up temperature of the operational amplifier compared to the first ambient temperature based on the first power comprises:

5. The method of claim 1, wherein the determining the first temperature of the operational amplifier based on the first ambient temperature comprises:

6. The method of claim 2, wherein said modifying said second temperature to obtain said first temperature comprises:

7. The method of claim 6, wherein said correcting said second temperature based on said first error to obtain said first temperature comprises:

8. The method of claim 1, wherein the determining a first offset voltage of the operational amplifier based on the first temperature comprises:

9. The method of claim 8, wherein the determining a first temperature drift coefficient of the operational amplifier based on the first temperature comprises:

10. The method of claim 1, wherein compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage comprises:

11. The method of claim 10, wherein compensating the output voltage based on the voltage gain and the first offset voltage to obtain the target output voltage comprises:

12. The method of claim 1, wherein compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage comprises:

determining a second offset voltage of the operational amplifier;

13. The method of claim 12, wherein the determining the second offset voltage of the operational amplifier comprises:

14. The method of claim 13, wherein compensating the output voltage based on the first offset voltage and the second offset voltage results in the target output voltage, comprising:

15. The method of claim 13, wherein the method further comprises:

16. The method of claim 1, wherein compensating the output voltage of the operational amplifier based on the first offset voltage to obtain a target output voltage comprises:

17. A voltage compensation device, the device comprising:

18. An electronic device comprising the voltage compensation apparatus of claim 17 for implementing the voltage compensation method of any one of claims 1 to 16.

19. A storage medium having stored thereon a program or instructions which when executed by a processor implements the voltage compensation method of any one of claims 1 to 16.