CN117137504B - Correction tool and correction method for detector module of medical imaging equipment - Google Patents
Correction tool and correction method for detector module of medical imaging equipment Download PDFInfo
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Abstract
The application provides a correction tool and a correction method for a detector module of medical imaging equipment, wherein the correction tool comprises: the detector module includes a scan frame having a radiation source at a top, a module correction device disposed at a bottom of the scan frame opposite the radiation source, a data acquisition device for acquiring scan data of the crystal units being scanned, and a data processing device, the module correction device being configured to continuously correct an angle of each crystal unit at a predetermined angle around a lateral direction and a longitudinal direction of the scan frame based on first and second judgment variables provided by the data processing device so as to orient the crystal units toward a focal point of the radiation source, and to provide a corrected angle of the crystal units that is qualified to indicate a qualified mounting angle of the crystal units on a module support of the detector module. The correction tool and the correction method can accurately adjust the angle of the crystal unit, allow correction of the detector to be completed in parallel, reduce correction workload and improve production efficiency of the detector.
Description
Technical Field
The present application relates to medical imaging devices, and in particular, to correction of detectors of medical imaging devices.
Background
A conventional CT (Computed Tomography ) scanning system consists of a gantry (with rotatable X-ray sources and X-ray detectors inside), a patient support (with a horizontally movable couch for supporting the patient being scanned), an operator console (providing a user interface, receiving save scan data, reconstructing and displaying CT tomograms), and some auxiliary systems. During the scanning process, the scanning frame rotates at a fixed position, the patient is horizontally laid on the patient support, and the bed board of the patient support supports the patient to horizontally move.
The detector of a CT scanning system is a device for converting X-ray energy into an electrical signal which can be recorded, and is one of the most important and critical components in the whole CT system. Mechanically, the detector is fan-shaped by a series of detector modules arranged in the X-direction, each module facing the focal point of the bulb. Each detector module is formed by a plurality of crystal units arranged in the Z-direction, each crystal unit being constituted by an ASG (post collimator, anti-scatter grid arranged in front of the detector), a crystal and a crystal mount, the ASG being arranged above the crystal. In the case of a wide-body detector, where the Z-dimension is large, the contribution of the scattered signal increases, and to some extent the one-dimensional ASG is insufficient, a two-dimensional ASG or other method is used to reduce the scattering of the signal.
Currently, high-end CT scanning systems pursue larger scan fields of view and larger detector widths. When the scanning aperture of the CT ring is fixed, the larger the scanning visual field of the CT ring is, the more detector modules are arranged along the X direction; the larger the detector width, the more crystal units are Z-aligned in each detector module. Meanwhile, in order to reduce the influence of scattered signals, a module of the wide-body detector is generally adhered to the surface of a crystal to form a crystal unit by two-dimensional ASG, so that the accuracy of acquiring signals by the detector module is improved, and higher requirements are placed on the installation accuracy of the crystal unit.
At present, the number of crystal units of a detector module of a low-end CT system is 1 to 2, and the requirement on signal precision can be met by improving the processing precision by using one-dimensional ASG; on a wide body detector, the number of crystal units used for a single module is up to 6 to 10, the surface of the crystal in each crystal unit is bonded with a two-dimensional ASG, and the crystal units are assembled into a detector module. CT scanning systems require that the focal response of these crystal units relative to the X-ray source be uniform, but it is difficult to ensure this uniformity by only increasing the machining accuracy.
Disclosure of Invention
The utility model aims at providing a correction tool and a correction method for a detector module of medical imaging equipment, which are used for improving the consistency of the response of the detector module to a ray source, submitting correction accuracy and simplifying the correction process.
To achieve the above object, according to a first aspect of the present application, a correction tool for a detector module of a medical imaging apparatus is provided, including:
a scanning frame, a radiation source is arranged at the top of the scanning frame;
a module correction device disposed opposite the radiation source at a bottom of the scan gantry, the module correction device configured to receive the detector module therein and correct an angle of the detector module at predetermined angles θ, θ/n;
the data acquisition device is in communication connection with the detector module to acquire and send scanning data of a plurality of crystal units in the detector module after being scanned by the ray source;
a data processing device communicatively connected with the data acquisition device for receiving the scan data and configured to provide a first judgment variable delta and a second judgment variable R for correcting the crystal unit according to the scan data L 、R R ；
Wherein the module correction means continuously corrects the angle of each crystal unit at a predetermined angle around the transverse direction and the longitudinal direction of the scanning gantry, respectively, according to the first judgment variable and the second judgment variable, such that the crystal unit is directed towards the focal point of the radiation source, the module correction means providing a corrected angle of the crystal unit, the corrected angle indicating a qualified mounting angle of the crystal unit on the module support of the detector module.
Optionally, the module correcting device is provided with a reference zero position and a tool zero position, the reference zero position indicates the initial correcting position of the crystal unit, the initial correcting position is determined according to the scanning data of each crystal unit of the detector module on the same module support, the tool zero position indicates the updating correcting position of the module correcting device after each correction, and the difference between the tool zero position and the reference zero position provides the correcting angle of the crystal unit.
Optionally, the first and second decision variables are based on a response value D of each pixel in the scan data to the radiation source 0 、D +θ 、D -θ The first judgment variable is defined as Δ=abs (R L -R R ) The second judgment variable is defined as R L =D -θ /D 0 、R R =D +θ /D 0 Wherein, delta is a first judgment variable, R L And R is R As the second judgment variable, D 0 Is the original response value of the pixel, D +θ And D -θ To correct the updated response values of the pixels when the detector modules are calibrated in opposite directions, a first decision variable provides an indication of whether the crystal unit is qualified for correction and a second decision variable provides an indication of the direction of rotation of the crystal unit.
Optionally, a first for angle correction is providedJudging condition 0 is less than or equal to delta<V1, the second judgment condition delta is more than or equal to V1 and R L Or R is R <V2, and third judgment condition R L And R is R Not less than V2, wherein V1 is a first threshold value, V2 is a second threshold value,
If the first judging condition is met, determining that the crystal unit faces the focus of the ray source; if the second judgment condition is met, the module correcting device is used for correcting the variable R along the second judgment variable R L And R is R The direction indicated by the smaller of (a) continues to correct the angle of the crystal unit; if the third judgment condition is met, it is determined that the crystal unit should be newly manufactured or replaced with a new crystal unit.
Optionally, the predetermined angles include a first predetermined angle and a second predetermined angle, and the module correction means corrects the angle of each crystal module stepwise at the first predetermined angle in the first correction and at the second predetermined angle in the subsequent correction.
Optionally, the module correction device includes a first correction table, a second correction table, and a base, wherein the first correction table is nested in the second correction table, is rotatably mounted to the second correction table by a first rotation shaft in a lateral direction, and is provided at an edge with a first angle adjuster for adjusting an angle, the first correction table having a receiving portion for receiving the detector module; the second correction table is rotatably mounted to the base by a second rotation shaft in the longitudinal direction, and a second angle adjuster for adjusting the angle is arranged at the edge.
Optionally, the first and second angle adjusters each include first and second spiral rangefinders, ends of respective rotational pieces of the first and second spiral rangefinders being in contact with edge surfaces of the first and second correction stages to correlate a step value of the rotational pieces with rotational angles of the first and second correction stages so as to accurately adjust angles of the first and second correction stages.
Optionally, the first angle adjuster is installed through a second correction table, the second angle adjuster is installed through a base, and the first correction table and the second correction table are respectively provided with a first elastic limiting device and a second elastic limiting device on the opposite sides of the sides where the first spiral distance meter and the second spiral distance meter are located.
Optionally, the scanning frame comprises a bracket and an annular scanning frame fixedly supported by the bracket, the ray source and the module correction device are oppositely arranged at the top and the bottom of the scanning frame, and an image chain formed by the ray source and the module correction device is consistent with an image chain of the medical imaging equipment.
In a second aspect of the present application, there is provided a correction method for a detector module of a medical imaging device, which corrects the detector module using a correction tool according to the first aspect of the present application, the correction method comprising the steps of:
Setting a reference zero position of a module correction device, and taking the reference zero position as a starting correction position of the detector module;
installing a detector module to a module correction device, wherein each crystal unit is preinstalled to a module support, scanning the detector module by using a ray source, and transmitting acquired original scanning data to a data processing device through a data acquisition device;
in the first correction, correcting the angle of the crystal unit by a predetermined angle around the transverse direction or the longitudinal direction in the opposite direction by using a module correction device, and transmitting updated scanning data to a data processing device through a data acquisition device to obtain a first judgment variable and a second judgment variable;
determining whether the crystal unit is qualified according to the first judgment variable, if so, providing a correction angle according to an updated correction position of the module correction device when the crystal unit is qualified, and if not, determining to execute subsequent correction or change the crystal unit according to the second judgment variable, and continuing to correct the angle of the crystal unit at a predetermined angle along one of opposite directions in the previous correction in the subsequent correction until the crystal unit is determined to be qualified, wherein the data processing device updates the first judgment variable and the second judgment variable for the next correction according to updated scanning data.
The technical scheme provided by the embodiment of the application can comprise the following beneficial effects: the special correction tool can finish the correction of the detector modules of the CT equipment in parallel, the module level correction of each detector module is finished on the correction tool, and the corrected detector modules only need to be subjected to simple system level correction on the CT equipment, so that the production efficiency of the detector modules is obviously improved; the image ring of the scanning frame and the ray source provide correction conditions which are the same as the correction of the module on the CT equipment, so that the correction accuracy is ensured; the module correction device uses the correction angle of the preset angle, combines the judgment variable provided by the data processing device to accurately correct the angle of the crystal module, can obviously reduce correction times and workload, and simplifies the correction process.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the application and to provide a further understanding of the application with regard to the other features, objects and advantages of the application. The drawings of the illustrative embodiments of the present application and their descriptions are for the purpose of illustrating the present application and are not to be construed as unduly limiting the present application. In the drawings:
FIG. 1 is a schematic illustration of a radiation source and detector of a medical imaging device;
FIG. 2 is a schematic diagram of a calibration fixture for a detector module according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a module calibration device in a calibration fixture according to an embodiment of the present application;
FIGS. 4 and 5 are schematic views of a rotational mode of a module calibration device according to an embodiment of the present application;
FIG. 6 is an example diagram of an angular correction manner of a modular correction apparatus according to an embodiment of the present application;
FIG. 7 is a schematic view of an image chain during scanning using a calibration tool according to an embodiment of the present application;
FIG. 8 is a schematic diagram of a properly installed crystal unit according to an embodiment of the present application;
FIGS. 9 and 10 are schematic views showing an incorrect mounting angle and a correct mounting angle of the crystal unit of FIG. 8;
FIG. 11 is an example flow chart of a correction method for a detector module according to an embodiment of the present application;
FIG. 12 is a schematic illustration of a determination of a reference zero of a module correction device according to an embodiment of the present application;
FIG. 13 is a graph of response values of a crystal unit of a detector module to a radiation source at different angles after correction according to an embodiment of the present application.
Detailed Description
In order to make the present application solution better understood by those skilled in the art, the following description will be made in detail and with reference to the accompanying drawings in the embodiments of the present application, it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, shall fall within the scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate in order to describe the embodiments of the present application described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In the present application, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal" and the like indicate an azimuth or a positional relationship based on that shown in the drawings. These terms are used primarily to better describe the present application and its embodiments and are not intended to limit the indicated device, element or component to a particular orientation or to be constructed and operated in a particular orientation.
Also, some of the terms described above may be used to indicate other meanings in addition to orientation or positional relationships, for example, the term "upper" may also be used to indicate some sort of attachment or connection in some cases. The specific meaning of these terms in this application will be understood by those of ordinary skill in the art as appropriate.
Furthermore, the terms "mounted," "configured," "provided," "connected," "coupled," and "sleeved" are to be construed broadly. For example, "connected" may be in a fixed connection, a removable connection, or a unitary construction; may be a mechanical connection, or an electrical connection; may be directly connected, or indirectly connected through intervening media, or may be in internal communication between two devices, elements, or components. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
Specific embodiments according to the present application will be described below with reference to the accompanying drawings.
The application aims to provide a special detector module correction tool and a related correction method, which can accurately adjust the angle of a crystal unit of a detector module, ensure the consistency of the response of the crystal unit to a radiation source and realize the correct installation of the crystal unit.
First, referring to fig. 1, a scanning method of an existing medical imaging apparatus will be described, taking a CT apparatus as an example. Fig. 1 shows a CT apparatus scanning a patient lying on a scanning bed 40 through a bulb 20 on top of a slip ring 10, and radiation passing through the patient irradiates a detector module 30 on the bottom of the slip ring 10, generating scan data. The detector module 30 shown in fig. 1 is a typical wide body detector module. During the scanning process, the detector modules in the detector module 30 and each crystal unit therein are required to respond consistently and with a maximum response value to radiation emitted from the focal spot of the bulb 20 to provide accurate scan data and high quality scan images. Having each crystal unit facing the focus of the bulb 20 achieves a consistent response, and having the crystal unit properly facing the focus minimizes the ASG of the crystal unit from blocking rays of the bulb 20, maximizing the response value of the crystal unit to the bulb 20. This is achieved by ensuring the geometric accuracy of each crystal unit, which includes machining accuracy and mounting accuracy, which is important for achieving the geometric accuracy of the crystal units of the wide body detector module 30.
Fig. 2 shows a calibration fixture 100 for a detector module according to an embodiment of the present application, comprising a support 110, a gantry 120, a module calibration device 130, a data acquisition device 150 and a data processing device 160. The cradle 110 and the gantry 120 constitute a scan gantry for simulating a scan scene close to that of a CT apparatus, and the cradle 110 fixedly supports the gantry 120. In the example of fig. 2, the stand 110 includes a stand base 111, a column 112, and a fixing member 113 for fixing the gantry 120. The gantry 120 can be specially manufactured according to the size of the medical imaging device to be corrected or retrofitted with the gantry of the old medical imaging device. A radiation source 140 is disposed at the top of the gantry 120 and a module correction device 130 is disposed at the bottom of the gantry 120 opposite the radiation source 140 to receive the scan radiation from the radiation source 140. The module calibration device 130 is used for accommodating the detector module 200 (refer to fig. 3) therein to calibrate the angles of the plurality of crystal units 211-218 (refer to fig. 7) in the detector module 200. The module correction device 130 is configured to correct the detector module 200 at a predetermined angle. The data acquisition device 150 is communicatively connected to the detector module 200 to acquire scan data of the plurality of crystal units 211 to 218 scanned by the radiation source 140, and transmits the scan data to the data processing device 160. The data processing device 160 provides a first judgment variable delta and a second judgment variable R for correcting the crystal units 211-218 according to the scan data L 、R R . In fig. 2, the data acquisition device 150 is shown arranged adjacent to the module correction device 130, and the data acquisition device 150 is arranged in the gantry 120, which is advantageous in terms of simplifying the structure and keeping the structure compact. The data acquisition device 150 may be arranged independent of the gantry 120. The data processing device 160 may be integrated in a main control device of the CT apparatus or may be separately arranged (refer to fig. 2). First judgment variable delta and second judgment variable R L 、R R Indicating how to calibrate the crystal units 211-218. According to the first judgment variable delta and the second judgment variable R L 、R R The module correction device 130 continuously corrects the angle of each crystal unit 211 to 218 at the above-mentioned predetermined angle around the transverse direction X and the longitudinal direction Z (refer to fig. 2 and 3) of the scanning frame, respectively, so that the crystal units 211 to 218 face the focal spot 141 of the radiation source 140. After the crystal units 211-218 are aligned in place, the module alignment device 130 provides an alignment angle of the aligned crystal units 211-218 that indicates a proper mounting angle of the crystal units 211-218 on the module support 220 (see FIG. 8) of the detector module 200.
In the above-mentioned correction tool 100 according to the present application, the scanning scene similar to the CT apparatus is provided by the scanning frame 120 and the radiation source 140, so that the same correction conditions as the module correction on the CT apparatus in the field can be achieved; the module correction device 130 provides a movable correction platform capable of accommodating the detector module 200, can correlate the angle change of the module correction device with the angle change of the crystal units 211-218 of the detector module 200 to be corrected, and realizes the angle correction of the crystal units 211-218 through the rotation of the movable member of the module correction device; the module correction device 130 may use a predetermined correction angle to combine the first judgment variable delta and the second judgment variable R provided by the data processing device 160 L 、R R The angles of the crystal modules 211-218 are accurately corrected, so that the correction times and workload can be remarkably reduced, the correction process is simplified, and the installation accuracy of the detector module 200 is improved; the module correction device 130 can complete module-level correction of each detector module 200, and can realize correct installation of the detector modules 200, so that the detector modules 200 only need to perform simple system-level correction on the CT equipment later, thereby remarkably improving the production efficiency of the detector modules 200, especially the wide-body detector modules.
Other aspects of the present application are described with continued reference to the accompanying drawings.
According to the present application, the module correction device 130 automatically or manually corrects the angle of each crystal unit 211 to 218 around the transverse direction X and the longitudinal direction Z of the gantry 120 by a worker through the module correction device 130. The correction angle of the crystal units 211 to 218 after being corrected in place, that is, the change angle of the crystal units 211 to 218 with respect to the original position thereof, including the change angle around the transverse direction X and the longitudinal direction Z, completes the installation of the crystal units 211 to 218 with respect to each module holder 220 or the corresponding installation position on the module holder 220 according to the correction angle. In this process, the angle of each crystal unit 211 to 218 is corrected one by one, starting from the crystal module 211. For example, crystal module 211 is first calibrated and then mounted on module support 220 according to the calibration angle, then crystal module 212 is calibrated, and the position and angle of crystal module 211 are not changed when crystal module 212 is calibrated.
One example configuration of the module correction device 130 is described with reference to fig. 3. The module correction device 130 includes a base 131, a first correction stage 132, and a second correction stage 133. The base 131 serves as a supporting structure of the module correction device 130, the first correction stage 132 for correction about the transverse direction X, the second correction stage 133 for correction about the longitudinal direction Z, the first correction stage 132 and the second correction stage 133 being movable members. The first correction stage 132 is nested in the second correction stage 133 and rotatably mounted to the second correction stage 133 by a first rotation shaft 132a in the lateral direction X, and a first angle adjuster 134 for changing the rotation angle thereof is disposed at an edge of the first correction stage 132, and the angle of the first correction stage 132 is changed by the first angle adjuster 134 by the above-described predetermined angle. The second correction table 133 is rotatably mounted to the base 131 through a second rotation shaft 133a along the longitudinal direction Z, and a second angle adjuster 135 for changing a rotation angle thereof is disposed at an edge, and an angle of the second correction table 133 is changed by the second angle adjuster 135 by a predetermined angle. During the rotation of the second correction stage 133, the first correction stage 132 and the detector module 200 mounted therein rotate together with the second correction stage 133, and the relative positions of the first correction stage 132 and the detector module 200 are not changed. Fig. 4 and 5 show schematic views of the rotation of the first correction stage 132 and the second correction stage 133 about the transverse direction X and the longitudinal direction Z, respectively, and at the time of correction, the first correction stage 132 is rotated from the first reference surface 132X to the first plane 132r about the first rotation axis 132a in the transverse direction X, and the second correction stage 133 is rotated from the second reference surface 133Z to the second plane 133r about the second rotation axis 133a in the longitudinal direction Z.
The first angle adjuster 134 may be an electrically or manually operated device whose end movably contacts the edge of the first correction stage 132, and rotates the first correction stage 132 about the first rotation shaft 132a by applying a pressing force to the edge of the first correction stage 132. The second angle adjuster 135 operates in a similar manner to the first angle adjuster 134. Fig. 6 is a diagram illustrating an example of changing the angle by the first angle adjuster 134, taking the first correction stage 132 as an example, the first correction stage 132 is pressed down by the first angle adjuster 134 disposed at the edge, and the edge thereof is moved down by a displacement h corresponding to the above-described predetermined angle for rotating the first correction stage 132. Also shown in fig. 6 is that the length of the first correction stage 132 is 2L, and the displacement h by which the first angle adjuster 134 should move the first correction stage 132 downward when the first correction stage 132 is rotated by a predetermined angle is determined at h=l·tan (θ) based on the predetermined angle indicated by θ, the length 2L, and the displacement h, which is a step value of the first angle adjuster 134. According to the present application, the predetermined angles of the calibration crystal units 211 to 218 may be the same angle, or may include different angles for calibration at different stages. In an embodiment, the predetermined angle may include a first predetermined angle θ and a second predetermined angle θ/n, where n is, for example, an integer between 5 and 10, and the first predetermined angle θ may be set within a range of 0 to 0.3 °. The displacement h is determined at h=l·tan (θ/n) when corrected at a second predetermined angle θ/n. Advantageously, in the continuous correction using the module correction device 130, the angle of each crystal module 211 to 218 may be corrected stepwise at a first predetermined angle θ in the first correction and at a second predetermined angle θ/n in the subsequent correction, which will be described later in detail.
In the case where the first correction stage 132 and the second correction stage 133 are configured to be manually operated, the first angle adjuster 134 and the second angle adjuster 135 each include a first spiral rangefinder and a second spiral rangefinder, which can convert a minute displacement into a minute rotation of the first correction stage 132 and the second correction stage 133. The distal ends of the respective rotational pieces of the first and second spiral rangefinders are in contact with the edge surfaces of the first correction stage 132 and the second correction stage 133, and the rotational angles of the first correction stage 132 and the second correction stage 133 are minutely changed according to the relationship of the stepping value of the rotational pieces (readings of the spiral rangefinder) and the rotational angles of the first correction stage 132 and the second correction stage 133. The use of a spiral rangefinder allows the angle of the first 132 and second 133 correction stages to be changed simply and accurately without the use of additional motorized drives and controls. In the case where the first correction stage 132 and the second correction stage 133 are configured to be electrically operated, the first angle adjuster 134 and the second angle adjuster 135 are driven by a driving device (not shown) to rotate the first correction stage 132 and the second correction stage 133, and the rotation angles of the first correction stage 132 and the second correction stage 133 are controlled by a control device (not shown). In this case, the worker controls the angle correction using the master control apparatus.
As shown in fig. 3, in the case where the first and second angle adjusters 134 and 135 include a spiral rangefinder, the first spiral rangefinder is mounted through the second correction table 133 and the second spiral rangefinder is mounted through the base 131, whereby the second correction table 133 and the base 131 serve as relatively fixed reference surfaces when the first and second correction tables 132 and 133 are rotated. Advantageously, in order to ensure that the first correction stage 132 and the second correction stage 133 are rotated only at the time of correction, the first correction stage 132 and the second correction stage 133 are each provided with a first elastic stopper and a second elastic stopper (not shown) on the side opposite to the side on which the first spiral distance meter and the second spiral distance meter are located, the first and second elastic stoppers each allowing only the first correction stage 132 and the second correction stage 133 to be rotated by the first angle adjuster 134 and the second angle adjuster 135.
As described above, the first calibration stage 132 is configured to receive the detector module 200, and has the receiving portion 132b therein, and the detector module 200 is disposed in the receiving portion 132b to rotate together with the first calibration stage 132. The first calibration stage 132 also has a support frame 132c for supporting each of the crystal units 211-218 and its associated module support 220. To individually calibrate each crystal unit 211-218, a holder (not shown) may be disposed within the support frame 132 c. Taking the crystal unit 211 as an example, the crystal unit 211 is held by a holder to rotate together with the first calibration table 132 during calibration, and the holder is removed after calibration is completed, so that the other crystal units 212 to 218 are identical.
In the example of fig. 3, the first correction stage 132 and the second correction stage 133 are configured as concentric rectangular plate members to accommodate the appearance of the detector module 200. In other embodiments, the first and second correction stages 132 and 133 may be configured as concentric circular, elliptical, or other suitable forms of plate members, and the shapes of the first and second correction stages 132 and 133 may be the same or different. Advantageously, the base 131 is configured to have an open structure to facilitate the operator's view of the condition of the detector module 200 and the installation of the detector module 200.
According to the present application, the arrangement of the module correction device 130 and the radiation source 140 on the gantry 120 is such that they form an image chain C which corresponds to the image chain of the CT apparatus to be corrected, so that the detector module 200 can be corrected on the correction tool 100 and assembled directly to the gantry of the CT apparatus for subsequent system-level correction.
Fig. 7 shows an image chain C when the crystal units 211 to 218 are calibrated, in which the radiation source 140 emits fan-shaped or cone-shaped radiation to irradiate the crystal units 211 to 218 within the range of the image chain C, the crystal unit 214 in the middle receives radiation irradiated vertically, and the crystal units 211 and 218 on both sides receive radiation irradiated obliquely, so that after calibration, the inclination angles of the crystal units 211 to 218 are different, but are finally calibrated to the focus toward the radiation source 140, i.e., such that the received radiation is perpendicular to the surfaces of the crystal units 211 to 218. According to the present application, taking the crystal module 211 as an example, at the beginning of calibration, the crystal unit 211 is pre-arranged on the module support 220, the position is not fixed yet, and the module support 220 is accommodated in the module calibration device 130 below the crystal unit 211. After the crystal unit 211 is corrected in place, the crystal module 211 is mounted and fixed to the module holder 220 using an auxiliary correction member (not shown) according to the correction angle provided by the module correction device 130. The auxiliary correction member is for example a spacer or a filler material providing a correction angle.
Fig. 8 shows a correctly mounted unit module 210 of the detector module 200, comprising a crystal unit 211 and a module holder 220, the crystal unit 211 being constituted by an ASG 211a, a crystal (scintillator) 211b, and a crystal mount 211c, the crystal unit 211 being fastened to the module holder 220, for example by means of screws, for example by bonding to each other. During the scan, radiation from source 140 will impinge on crystal 211b through ASG 211 a. As described above, the crystal unit 211 (specifically, the ASG 211a and the crystal 211b thereof) should be directed to the focus, but the change of the angle of the crystal unit 211 may cause the ASG 211a to block the radiation, thereby affecting the response value of the crystal unit 211 and reducing the image quality. The deviation in the mounting angle of the crystal unit 211 from the module holder 220 causes this angular change. Fig. 9 shows the improperly installed crystal unit 211, with ASG 211a and crystal 211b not facing the focal spot of radiation source 140, with an angular deviation of θ' from the intended installation location, and with radiation not impinging perpendicularly on ASG 211 a. Therefore, the grid sheet of the ASG 211a may block the rays and generate a blocked area, and the blocked area of the surface of the crystal 211b is not irradiated with the rays, so that the portion of the pixels of the crystal 211b has no response value. In fig. 9, x denotes the width of the shielding region, H denotes the height of the ASG 211a, and the relationship between them is x=h·sin (θ'). According to the present application, crystal unit 211 is properly oriented toward the focal spot of radiation source 140 by correcting the mounting angle of crystal unit 211 with respect to module support 220, at which time the angular deviation θ' is 0. Fig. 10 shows the crystal unit 211 properly mounted after correction, with the crystal unit 211 facing the focal spot of the source 140, and the spherical center of the sphere formed by the tips of the grid pieces of the ASG 211a coincident with the focal spot of the source 140, the grid pieces being substantially parallel to the rays, without blocking the rays.
According to the present application, the first judgment variable Δ and the second judgment variable R are provided by the data processing device 160 L 、R R The response value D of each pixel in the scan data of the crystal units 211-218 to the radiation source 0 、D +θ 、D -θ The result is that the response values of the pixels in the scan data visually indicate whether the crystal elements 211-218 are facing the focal spot of the radiation source 140. The first judgment variable is defined as Δ=abs (R L -R R ) The second judgment variable is defined as R L =D -θ /D 0 、R R =D +θ /D 0 Wherein D is 0 Is the original response value of the pixel, D +θ And D -θ For the updated response value of the pixel when the first correction stage 132 or the second correction stage 133 rotates in the opposite direction, Δ is a first judgment variable representing the original response value D of each pixel 0 And updating the response value D +θ 、D -θ Is the ratio of (R) L And R is R For the second judgment variable, the update response value D of each pixel is represented +θ 、D -θ And the original response value D 0 Is a ratio of (2). The first judgment variable delta provides an indication of whether the crystal units 211-218 are qualified for correction, and the second judgment variable R L 、R R An indication is provided as to the direction of rotation (correction direction) of the crystal units 211 to 218.
Specifically, a first judgment condition 0.ltoreq.delta.is provided<V1, a second judgment condition V1 is less than or equal to delta and R L Or R is R <V2, and third judgment condition R L And R is R Gtoreq V2 for angle correction, wherein R L =D -θ /D 0 ，R R =D +θ /D 0 V1 is a first threshold and V2 is a second threshold. If the first judging condition is met, determining that the crystal units 211-218 face the focal point of the ray source 140, and providing a correction angle for correcting the installation positions of the crystal units 211-218 by the module correction device 130; if the second judgment condition is met, the module correcting device 130 is used for correcting the position along R L And R is R The smaller one of the directions continuously corrects the angles of the crystal units 211-218; if the third determination condition is met, it is determined that the crystal units 211 to 218 should be newly manufactured or replaced with new crystal units.
In the second judgment condition, if the first judgment variable delta is larger than V1, according to the second judgment variable R L And R is R R Sizing ASG 211a toward R L And R is R The smaller of which is rotated (offset or tilted) in the direction of the smaller of which is rotated (offset or tilted). For example, D +θ And D -θ As the first correction stage 132 or the second correction stage 133, rotates in the plus direction (+) and is minusThe pixel response value for the direction (-) rotation, positive rotation is right about the axis of rotation and negative rotation is left about the axis of rotation. If R is L <R R The direction of rotation is negative, i.e. to the left. Herein, R L Smaller representation D -θ Less than D +θ At this time, correcting the crystal unit 211 in a direction in which the response value is small can reduce the shielding of the ASG 211a from the rays, and increase the response value. For the second judgment variable R L And R is R If the detector module 200 is fully compliant with the design requirements, R L =R R I.e. the crystal units 211-218 are directed exactly towards the focal spot of the radiation source 140. In practice, R is the result of machining errors and mounting errors (even small) in the crystal units 211-218 L Not necessarily equal to R R The crystal units 211-218 are directed to R L And R is R The smaller one of these corrections can be such that R L Near R R 。
According to the present application, for the first threshold V1 and the second threshold V2, v1=2%o and v2=1 may be determined according to the system design requirements.
According to a second aspect of the present application, a correction method for a detector module of a medical imaging device is provided, which corrects the detector module 200 using a correction tool 100 according to the first aspect of the present application. The correction method is described by way of example with reference to fig. 11, which includes the steps of:
setting a reference zero position of the module correction device 130, and taking the reference zero position as a starting correction position of the detector module 200;
mounting the detector module 200 to the module correction device 130, wherein each crystal unit 211-218 is pre-mounted to the module support 220, scanning the detector module 200 with the radiation source 140, and transmitting the acquired original scan data to the data processing device 160 through the data acquisition device 150;
In the first correction, the angle of the crystal units 211 to 218 is corrected by using the module correction device 130 at predetermined angles θ and θ/n in opposite directions around the transverse direction X or the longitudinal direction Z ， Transmitting the updated scan data to the data acquisition device 150A data processing device 160 for obtaining a first judgment variable delta and a second judgment variable R L 、R R ；
Determining whether the crystal units 211-218 are qualified according to the first judgment variable delta, if so, providing a correction angle according to the correction position of the module correction device 130 when the crystal units 211-218 are qualified, and if not, providing a correction angle according to the second judgment variable R L 、R R Determining to execute a subsequent correction or replacement of the crystal units 211 to 218, in which the correction of the angles of the crystal units 211 to 218 in one of opposite directions in the previous correction is continued at a predetermined angle until the correction of the crystal units 211 to 218 is acceptable, and the data processing device 160 updates the first judgment variable delta and the second judgment variable R according to the updated scan data L 、R R For the next correction.
According to the calibration fixture 100 and the calibration method of the present application, the reference zero position, i.e. the original positions of the first calibration stage 132 and the second calibration stage 133, which are the initial positions of the angle calibration, are determined before using the module calibration device 130, and can be defined by the angle values. The reference zero position is determined based on the scan data of each crystal unit 211-218 of the detector module 200 on one and the same module support 220, and the manner in which the reference zero position of the module correction device 130 is determined is described below with reference to fig. 12.
It is assumed that the processing precision of the module holders 220 of the crystal units 211 to 218 and the crystal units 211 to 218 are randomly distributed. Before calibration begins, 8 module holders 220 and crystal units 211-218 are selected, for example, to determine a reference zero. The crystal unit 211 is first mounted to a module support 220 at an intermediate position among 8 corresponding module supports 220, such as to the module support 220 for the 4 th crystal unit 214. The crystal unit 211 (hereinafter, referred to as a pre-assembly) of the module holder 220 assembled to the intermediate position is mounted to the module correction device 130, the first correction stage 132 and the second correction stage 133 are rotated to maximize a signal response value of the pre-assembly under irradiation of the radiation source 140, and angles of rotation about the lateral direction X and the longitudinal direction Z are recorded. The same operations are performed for the crystal modules 212-218. The recorded 8 angles are averaged to obtain the reference zero position of the module correction device 30. It should be appreciated that the module support 220 may be the same number as the crystal units 211-218 or may be constructed as a unitary module support 220 having the same number of mounting locations thereon as the crystal units 211-218. According to the present application, before each detector module 200 is installed in the calibration fixture 100, the fixture 100 needs to be calibrated to a reference zero position to ensure that all the calibration of the detector modules 200 is performed on the same reference.
The calibration fixture 100 of the present application also has a fixture zero indicating that the module calibration device 130 updates the calibration position after each calibration. The predetermined reference zero position before the start of correction coincides with the tooling zero position of the module correction device 130, but after the first correction stage 132 and the second correction stage 133 are rotated, the tooling zero position is changed with respect to the reference zero position by a rotation angle of the first correction stage 132 and the second correction stage 133. The difference between the tool zero position and the reference zero position when the crystal modules 211-218 are qualified for correction provides the correction angle of the crystal units 211-218.
Fig. 13 shows a response value distribution diagram of the crystal units 211 to 218 of the detector module 200, which is corrected by using the correction method of the present application, to the radiation source 140, as verification of the correction effect of the present application. In fig. 13, C0 is a response value distribution curve when the detector module 200 completely meets the design requirement, and Cn is a response value distribution curve of the detector module 200 corrected by the correction method of the present application. In fig. 13, the horizontal axis represents the rotation angle of the crystal unit 211 (or 212-218) of the calibration tool 100 or the detector module 200, and the vertical axis represents the response value of the pixel in the scan data of the crystal unit 211. Taking the crystal unit 211 as an example, a "1" in the vertical axis represents that the ASG 211a does not have any shielding against radiation, and the pixel surface of the crystal 211b can be irradiated with radiation. As can be understood from fig. 13, the calibration targets of the crystal unit 211 are: when the correction tool 100 rotates +/- θ: when the curve Cn is about the X-axis and the Z-axis, the curve Cn should have a straight section (a portion parallel to the transverse axis in the curve) whose width is not smaller than the set value and is symmetric about 0 bit based on the transverse axis. The correction target indicates that the geometric center of the crystal unit 211 is correctly oriented toward the focal spot of the radiation source 140 and that the mounting error is within an allowable range. The "straight segment" of the curve Cn indicates that the magnitude of the response value of the vertical axis varies little over a certain range of the horizontal axis, and that the ASG 211a does not block the ray or blocks an area within an allowable range within the range of the straight segment, so that the performance of the detector is not affected. The closer the straight segment of curve Cn is to the straight segment of curve C0, the closer the installation of the detector module 200 is to the design requirements. The extent of the straight segment of the curve Cn is indicated in fig. 13 by its width, i.e. the angular value difference of the end points of the projection of the straight segment on the transverse axis. The width of the straight section has the above-mentioned set value indicating an allowable error in the design requirement for the installation angle of the crystal unit 211, and may be determined to be ±0.04° according to the design requirement of the detector, and a width of the straight section covering or exceeding the set value indicates that the crystal unit 211 of the detector module 200 is installed within the allowable error range, and that the correction of the crystal unit 211 is acceptable.
In summary, the correction tool 100 and the related correction method of the present application can accurately obtain the correction angles required by the crystal units 211-218 of the detector module 200, ensure the consistency of the plurality of detector modules 100 through the dedicated correction tool 100, and perform subsequent simple correction after the corrected detector modules 100 are assembled on the detector bracket of the CT apparatus, i.e. complete the production and debugging of the detector. By using the correction tool 100 and the correction method, the debugging of the detector can be completed in parallel, the correction of the module level is completed on the correction tool 100, and then the correction of the system level is completed on the CT equipment, so that the workload can be reduced, and the product precision and the production efficiency can be improved.
The foregoing description is only of the preferred embodiments of the present application and is not intended to limit the same, but rather, various modifications and variations may be made by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application.
Claims (10)
1. A correction tool (100) for a detector module of a medical imaging device, comprising:
A scanning gantry, a radiation source (140) arranged on top of the scanning gantry;
a module correction device (130) arranged opposite the radiation source at a bottom of the scanning gantry, the module correction device being configured to receive the detector module (200) therein and to correct an angle of the detector module at predetermined angles θ, θ/n;
the data acquisition device (150) is in communication connection with the detector module and is used for acquiring and transmitting scanning data of a plurality of crystal units (211-218) in the detector module after being scanned by the ray source;
a data processing device (160) communicatively connected to the data acquisition device for receiving the scan data and configured to provide a first determination variable delta and a second determination variable R for correcting the crystal unit based on the scan data L 、R R ；
Wherein, according to the first and second judgment variables, the module correction means continuously corrects the angle of each crystal unit at the predetermined angle around the transverse direction (X) and the longitudinal direction (Z) of the scanning frame, respectively, so that the crystal unit is directed to the focal point (141) of the radiation source, the module correction means providing corrected correction angles of the crystal unit, the correction angles indicating acceptable mounting angles of the crystal unit on the module support of the detector module.
2. The correction tool (100) according to claim 1, characterized in that the module correction means has a reference zero indicating a starting correction position of the crystal unit and a tool zero indicating an updated correction position after each correction of the module correction means, the difference between the tool zero and the reference zero providing a correction angle of the crystal unit, determined from the scan data of each crystal unit of the detector module on one and the same module support.
3. The correction tool (100) of claim 1, wherein the first and second decision variables are based on a response value D of each pixel in the scan data to the radiation source 0 、D +θ 、D -θ Obtained, the first judgment variable is defined as Δ=abs (R L -R R ) The second judgment variable is defined as R L =D -θ /D 0 、R R =D +θ /D 0 Wherein, delta is the first judgment variable, R L And R is R D as the second judgment variable 0 D is the original response value of the pixel +θ And D -θ To correct the updated response value of the pixel when the detector module is in the opposite direction, the first decision variable provides an indication of whether the crystal unit is qualified for correction and the second decision variable provides an indication of the direction of rotation of the crystal unit.
4. The correction tool according to claim 3, wherein a first judgment condition 0.ltoreq.Δ for angle correction is provided<V1, the second judgment condition delta is more than or equal to V1 and R L Or R is R <V2, and third judgment condition R L And R is R Not less than V2, wherein V1 is a first threshold value, V2 is a second threshold value,
determining that the crystal unit is oriented towards the focal point of the radiation source if the first judging condition is met; if the second judgment condition is met, the module correcting device is used for correcting the second judgment variable R along the second judgment variable R L And R is R The direction represented by the smaller of (a) continues to correct the angle of the crystal unit; if the third judgment condition is met, determining that the crystal unit should be manufactured again or replaced by a new crystal unit.
5. The correction tool (100) according to claim 1, wherein the predetermined angles comprise a first predetermined angle and a second predetermined angle, the module correction means correcting the angle of each crystal unit step by step at the first predetermined angle in a first correction and at the second predetermined angle in a subsequent correction.
6. The correction tool (100) according to any one of claims 1 to 5, wherein the module correction device comprises a first correction stage (132), a second correction stage (133), and a base (131), wherein,
The first correction table is nested in the second correction table, rotatably mounted to the second correction table by a first rotation shaft (132 a) in the lateral direction, and provided with a first angle adjuster (134) for adjusting an angle at an edge, the first correction table having a receiving portion (132 b) for receiving the detector module;
the second correction table is rotatably mounted to the base by a second rotation shaft (133 a) in the longitudinal direction, and a second angle adjuster (135) for adjusting an angle is arranged at an edge.
7. The correction tool (100) of claim 6, wherein the first and second angle adjusters each include first and second spiral rangefinders, ends of respective rotational members of the first and second spiral rangefinders contacting edge surfaces of the first and second correction stages to correlate a step value of the rotational members with rotational angles of the first and second correction stages so as to accurately adjust angles of the first and second correction stages.
8. The correction tool (100) according to claim 7, characterized in that the first angle adjuster is mounted through the second correction stage, the second angle adjuster is mounted through the base, and the first correction stage and the second correction stage are each provided with a first elastic limiting device and a second elastic limiting device on a side opposite to a side on which the first spiral distance meter and the second spiral distance meter are located.
9. Correction tool (100) according to any one of claims 1 to 5, characterized in that the scanning frame comprises a support (110) and an annular scanning frame (120) fixedly supported by the support, the radiation source and the module correction device being arranged opposite each other at the top and bottom of the scanning frame, the image chain (C) constituted by the radiation source and the module correction device being conformed to the image chain of the medical imaging device.
10. A correction method for a detector module of a medical imaging device, characterized in that the detector module is corrected using a correction tool according to any one of claims 1 to 9, the correction method comprising the steps of:
setting a reference zero position of the module correction device, and taking the reference zero position as a starting correction position of the detector module;
mounting the detector module to the module correction device, wherein each crystal unit is pre-mounted to the module support, scanning the detector module with the radiation source, and transmitting the acquired original scanning data to the data processing device through the data acquisition device;
in the first correction, correcting the angle of the crystal unit at the predetermined angle in the opposite direction around the lateral direction or the longitudinal direction using the module correction means, and transmitting the updated scan data to the data processing means by the data acquisition means to obtain the first judgment variable and the second judgment variable;
Determining whether the crystal unit is qualified for correction according to the first judgment variable, if so, providing the correction angle according to an updated correction position of the module correction device when the crystal unit is qualified for correction, and if not, determining to perform subsequent correction or replacement of the crystal unit according to the second judgment variable, in which subsequent correction the angle of the crystal unit is continued to be corrected by the predetermined angle in one of the opposite directions in the last correction until it is determined that the crystal unit is qualified for correction, wherein the data processing device updates the first judgment variable and the second judgment variable for the next correction according to the updated scan data.
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| JPS63139300A (en) * | 1986-12-02 | 1988-06-11 | 科学技術庁無機材質研究所長 | Scanning x-ray diffraction microscope with one-dimensional position sensor |
| US5912938A (en) * | 1996-10-07 | 1999-06-15 | Analogic Corporation | Tomography system having detectors optimized for parallel beam image reconstruction |
| JP2018114211A (en) * | 2017-01-20 | 2018-07-26 | 株式会社日立製作所 | X-ray CT apparatus |
| CN116831607A (en) * | 2023-09-01 | 2023-10-03 | 赛诺威盛科技(北京)股份有限公司 | Correction device and correction method for medical imaging equipment and medical imaging equipment |
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| US7570734B2 (en) * | 2003-07-25 | 2009-08-04 | J. Morita Manufacturing Corporation | Method and apparatus for X-ray image correction |
| US10758203B2 (en) * | 2017-08-08 | 2020-09-01 | Canon Medical Systems Corporation | X-ray computed tomography apparatus |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JPS63139300A (en) * | 1986-12-02 | 1988-06-11 | 科学技術庁無機材質研究所長 | Scanning x-ray diffraction microscope with one-dimensional position sensor |
| US5912938A (en) * | 1996-10-07 | 1999-06-15 | Analogic Corporation | Tomography system having detectors optimized for parallel beam image reconstruction |
| JP2018114211A (en) * | 2017-01-20 | 2018-07-26 | 株式会社日立製作所 | X-ray CT apparatus |
| CN116831607A (en) * | 2023-09-01 | 2023-10-03 | 赛诺威盛科技(北京)股份有限公司 | Correction device and correction method for medical imaging equipment and medical imaging equipment |
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