CN117110100A - Circuit pin bending test device - Google Patents

Circuit pin bending test device Download PDF

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Publication number
CN117110100A
CN117110100A CN202310994425.8A CN202310994425A CN117110100A CN 117110100 A CN117110100 A CN 117110100A CN 202310994425 A CN202310994425 A CN 202310994425A CN 117110100 A CN117110100 A CN 117110100A
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CN
China
Prior art keywords
guide rail
circular arc
circuit
bending test
arc
Prior art date
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Pending
Application number
CN202310994425.8A
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Chinese (zh)
Inventor
杨凯
潘廷龙
高思鹏
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Anhui North Microelectronics Research Institute Group Co ltd
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Anhui North Microelectronics Research Institute Group Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Anhui North Microelectronics Research Institute Group Co ltd filed Critical Anhui North Microelectronics Research Institute Group Co ltd
Priority to CN202310994425.8A priority Critical patent/CN117110100A/en
Publication of CN117110100A publication Critical patent/CN117110100A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/32Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • G01N3/04Chucks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/32Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
    • G01N3/36Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces generated by pneumatic or hydraulic means

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

The invention relates to a circuit pin bending test device, and belongs to the technical field of circuit reliability tests. The test fixture comprises a base, wherein the base is connected with a circular arc guide rail, the circular arc guide rail is connected with a movable frame capable of relatively moving in a matched manner, the movable frame is connected with a test clamp for clamping a circuit pin, and the test clamp points to the circle center of the circular arc guide rail; the base is also provided with a workbench for fixing a circuit; the moving frame moves along the circular arc guide rail to make the circuit pins clamped by the test clamp bend. The invention can easily clamp the tested circuit pins by carrying out bending test of single or multiple pins, and the test clamp can reciprocate along the semicircular guide rail along the movable frame in the bending test process, so that the bending axle center of the circuit pins to be tested can be ensured to be always concentrated at one point, and the invention can be suitable for circuit pins with various length specifications. Overall, the device can ensure the reliability, stability and repeatability of the pin bending test.

Description

Circuit pin bending test device
Technical Field
The invention relates to the technical field of circuit reliability tests, in particular to a circuit pin bending test device.
Background
Since the release of the GJB548C-2021 Standard of microelectronic device test methods and procedures, electronic component lead wire fastness tests have not been performed with fixed test equipment, especially for the standard: method 2014.3 test condition B1, a reasonable test apparatus is not yet available. Currently there are two general ways of performing this test: the temporary customized tool clamp or the handheld tweezers and clamps of the testers are adopted for operation, and the reliability, stability and repeatability of the test cannot be ensured because the force applied by different technicians and the force applied angle are different, the test process is uncontrollable, and the test result is not persuasive; another is to use a custom test device, such as a multifunctional tester for lead wire firmness, publication number CN110044684a, to clamp the circuit with a clamp, and to bend the pins by rotating the clamp. However, in the pin bending process, the position of the bending axis of the device is uncontrollable, and a plurality of bending points can be generated on the pin in one test, so that the test purpose can not be achieved.
Even though standard documents are available for reference at the present stage, the differences among test tools, testers and nonstandard test devices are always uncertainty factors in the lead wire firmness test. To normalize the test, a special test apparatus is now designed for the test.
Disclosure of Invention
The invention provides a circuit pin bending test device for solving the problems of low reliability, poor stability and poor repeatability in a pin bending test in the prior art.
The technical scheme is as follows:
the circuit pin bending test device comprises a base, wherein an arc-shaped guide rail is connected to the base, a movable frame capable of relatively moving is connected to the arc-shaped guide rail in a matched mode, a test clamp for clamping the circuit pin is connected to the movable frame, and the test clamp points to the circle center of the arc-shaped guide rail; the base is also provided with a workbench for fixing a circuit; the moving frame moves along the circular arc guide rail to make the circuit pins clamped by the test clamp bend.
Further, the circular arc-shaped guide rail is provided with a first circular arc track surface and a second circular arc track surface, and the first circular arc track surface and the second circular arc track surface are arranged concentrically;
the movable frame is provided with a group of first rollers which are in rolling fit with the first circular arc track surface and a group of second rollers which are in rolling fit with the second circular arc track surface, and the movable frame is limited on the circular arc guide rail to precisely move through the first rollers and the second rollers.
Further, the movable frame comprises a first frame body, a second frame body and an adjusting bolt, wherein the first idler wheel and the second idler wheel are respectively and correspondingly arranged on the first frame body and the second frame body; the inner side of the first frame body is provided with a threaded hole, the threaded hole axially points to the circle center of the circular arc-shaped guide rail, the second frame body is provided with a threaded through hole, an adjusting bolt penetrates into the second frame body through a through hole gap to be connected with the threaded hole of the first frame body, the adjusting bolt is detachably connected with a positioning ring, the second frame body is positioned between the head of the adjusting bolt and the positioning ring to form axial limit, and the second frame body can be adjusted and moved along the radial direction of the circular arc-shaped guide rail by rotating the adjusting bolt.
Further, the arc-shaped guide rail is an assembly and comprises two semicircular plates which are arranged in parallel and at a certain distance, the two semicircular plates are connected into a whole through a connecting plate, the adjacent side surfaces of each semicircular plate are respectively connected with an arc-shaped plate, the arc-shaped surface of each arc-shaped plate, which is far away from the circle center side, is the first arc-shaped rail surface, and the arc-shaped surface, which is close to the circle center side, is the second arc-shaped rail surface.
Further, the workbench comprises a bearing plate, positioning blocks are respectively arranged on two adjacent side edges of the bearing plate, a pair of telescopic compressing devices are further arranged on the bearing plate, the telescopic directions of the two telescopic compressing devices are mutually perpendicular in a plane, and the telescopic directions of the telescopic compressing devices respectively correspond to the positioning surfaces of the positioning blocks.
Further, the telescopic compressing device comprises a telescopic screw rod, the telescopic screw rod is in transmission fit with a nut seat fixed on the bearing plate, and the end part of the telescopic screw rod is rotatably connected with the compressing block.
Further, the pressing surface of the pressing block is provided with two convex first cambered surfaces and a second cambered surface which is arranged between the two first cambered surfaces, is connected smoothly and is concave.
Further, the bearing plates are arranged on a pair of stacked sliding tables with mutually perpendicular moving directions, so that the bearing plates have two movements in the vertical directions in the plane.
Further, the base comprises a bottom plate, a supporting sleeve is arranged on the bottom plate, an adjusting block is slidably matched with the supporting sleeve in a fixed mode with the circular-arc-shaped guide rail, the shape of the adjusting block is matched with the shape of an inner hole of the supporting sleeve and can slide up and down, locking bolts in threaded connection penetrate into the side walls of the supporting sleeve, and the end heads of the locking bolts are in butt press fit with the adjusting block to achieve locking and fixing of the circular-arc-shaped guide rail.
Further, the test clamp comprises a first clamping plate and a second clamping plate which are hinged with each other, the first clamping plate provides a positioning surface, the second clamping plate provides a clamping surface, the tail of the first clamping plate is fixedly connected with the movable frame, a threaded hole is formed in the tail of the second clamping plate, a pressing bolt is connected to the threaded hole, the end of a threaded column of the pressing bolt presses the first clamping plate, and the clamping force of the clamping ends of the first clamping plate and the second clamping plate can be changed by adjusting the relative position of the pressing bolt.
Compared with the prior art, the invention has the beneficial effects that:
the invention can be used for traditional rectangular and round circuits to carry out bending test of single or multiple pins. The test clamp of the device can easily clamp the pin of the circuit to be tested, and in the bending test process, the test clamp moves along the semicircular guide rail in a reciprocating manner along with the moving frame, so that the bending circle center of the pin of the circuit to be tested is always concentrated at one point; meanwhile, the supporting sleeve with the locking is matched with the adjusting block to realize the height adjustment of the circle center of the semicircular guide rail, and the circuit fixing position is adjusted to the circle center of the semicircular guide rail through the workbench, so that the circuit pin with various length specifications can be adapted. Overall, the device can ensure the reliability, stability and repeatability of the pin bending test.
Drawings
Fig. 1 is a schematic perspective view of a circuit pin bending test device according to an embodiment of the present invention;
FIG. 2 is a side elevation view of a circuit pin bend test apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic view of a circular arc guide rail in an embodiment of the present invention;
FIG. 4 is a schematic cross-sectional view of a circular arc guide rail in an embodiment of the present invention;
FIG. 5 is a schematic view of a structure of a movable frame according to an embodiment of the present invention;
FIG. 6 is a schematic diagram illustrating the connection and matching of an adjusting bolt with a first and a second frame bodies in an embodiment of the present invention;
FIG. 7 is a schematic view of a structure of a workbench according to an embodiment of the invention;
fig. 8 is a schematic structural view of a test clip according to an embodiment of the present invention.
Reference numerals illustrate: 1. a base; 11. a bottom plate; 12. a support sleeve; 13. an adjusting block; 14. a locking bolt; 15. a support base; 2. a circular arc guide rail; 21. a semicircular plate; 211. a groove; 22. a connecting plate; 23. an arc-shaped plate; 231. a first circular arc track surface; 232. a second circular arc track surface; 233. a convex rib; 3. a moving rack; 31. a first frame body; 311. a threaded hole; 32. a second frame body; 321. a through hole; 33. an adjusting bolt; 34. a first roller; 35. a second roller; 36. a positioning ring; 37. a handle; 4. a work table; 41. a carrying plate; 42. a positioning block; 43. a telescopic compressing device; 431. a telescopic screw rod; 432. a nut seat; 433. a compaction block; 4331. a first cambered surface; 4332. a second cambered surface; 44. a sliding table; 5. a test clamp; 51. a first clamping plate; 52. a second clamping plate; 53. pressing the bolt; 54. a positioning surface; 55. a clamping surface.
Detailed Description
In order that the invention may be more clearly understood, a circuit pin bending test apparatus according to the present invention will be further described with reference to the accompanying drawings, wherein the specific embodiments described herein are for purposes of illustration only and are not intended to be limiting.
As shown in fig. 1 and fig. 2, a circuit pin bending test device comprises a base 1, wherein the base 1 is a bearing component of the device, the device is provided with a bottom plate 11, a supporting sleeve 12 is arranged on the bottom plate 11, the supporting sleeve 12 is vertically arranged, an adjusting block 13 is slidably matched in the supporting sleeve 12, the adjusting block 13 can be a square tube, and accordingly, the shape of an inner hole of the supporting sleeve 12 is also rectangular with the shape of the square tube. The adjusting block 13 is fixedly connected with the circular arc-shaped guide rail 2 through a fastener. The outer side wall of the supporting sleeve 12 is connected with a locking bolt 14 in a threaded manner, the stud end of the locking bolt 14 penetrates into the supporting sleeve 12 and is used for propping against the adjusting block 13, and when the adjusting block 13 and the circular arc-shaped guide rail 2 move up and down to a proper position relative to the supporting sleeve 12, the end of the locking bolt 14 and the adjusting block 13 form propping fit so as to realize locking and fixing of the circular arc-shaped guide rail 2. The bottom plate 11 is also provided with a supporting seat 15, and the supporting seat 15 is provided with a workbench 4 for fixing a test circuit.
The circular arc-shaped guide rail 2 is provided with a circular arc-shaped track, the track is matched and connected with a movable frame 3 capable of moving along the track, the movable frame 3 is connected with a test clamp 5 used for clamping circuit pins, when a circuit to be tested is fixed on a workbench, the movable frame 3 moves, the test clamp 5 always points to the circle center of the track to move along the circular arc line, and the clamped circuit pins are bent to perform a test.
The matching structure of the circular arc-shaped track and the moving frame 3 can be realized by various structures, for example, a sliding structure of a chute and an arc-shaped sliding block can be adopted, a rolling structure of a guide rail and a roller can also be adopted, and the like. In consideration of the frictional resistance of running, the assemblability and the like, the following structure is preferably adopted:
as shown in fig. 3 and 4, the circular arc guide rail 2 is an assembly, and includes two semicircular plates 21 arranged in parallel and at a certain distance, wherein the left and right sides of the semicircular plates 21 are planes, and the inner and outer sides are cambered surfaces. The two ends of the two semicircular plates 21 are respectively connected into a whole through a connecting plate 22, and the connecting plate 22 and the two semicircular plates 21 are connected in a detachable manner through screws. Wherein, the adjacent side of each semicircular plate 21 is fixedly connected with an arc plate 23, the surface of the arc plate 23 far away from the center side (outside) is a first arc track surface 231, the surface close to the center side (inside) is a second arc track surface 232, and the centers of the circles of the first arc track surface and the second arc track surface coincide.
As shown in fig. 5 and 6, the moving frame 3 preferably has the following structure: the device comprises a first frame body 31, a second frame body 32 and an adjusting bolt 33, wherein the first frame body 31 is of an arc-like plate-shaped structure, two ends of the first frame body 31 are respectively connected with a pair of first rollers 34, and two first rollers 34 at each end are symmetrically distributed on two side surfaces of the first frame body 31. A threaded hole 311 is arranged at the center of the inner side surface of the first frame body 31, and the axis of the threaded hole 311 points to the circle center of the track. Two ends of the second frame body 32 are respectively connected with a pair of second rollers 35, and the second rollers 35 are symmetrically distributed on two side surfaces of the second frame body 32; a through hole 321 is arranged at the center of the second frame body 32, the adjusting bolt 33 penetrates into the second frame body 32 through the through hole 321 in a clearance fit mode, then is connected with the threaded hole 311 of the first frame body 31, the positioning ring 36 is detachably connected to the adjusting bolt 33, and the positioning ring 36 is fixed on a screw of the adjusting bolt 33 through a positioning pin. The second frame 32 is located between the head of the adjusting bolt 33 and the positioning ring 36 to form an axial limit, namely: the second frame 32 is only rotatable relative to the adjusting bolt 33 and cannot be displaced axially. Under the condition that the second frame body is prevented from rotating by rotating the adjusting bolt 33 and holding the second frame body, the second frame body 32 can be adjusted and moved along the radial direction of the track, the distance between the first roller and the second roller can be adjusted, the first roller 34 and the first arc track surface 231 can be conveniently and fully contacted in a rolling manner, the second roller 35 and the second arc track surface 232 can be conveniently and fully contacted in a rolling manner, clamping stagnation when the roller and the arc track surface are in contact too tightly is prevented, inaccuracy of the moving path of the moving frame 3 when the roller and the arc track surface are in contact too loose is also prevented, and reliability, stability and repeatability of a circuit pin bending test are affected.
In addition, in order to facilitate the movement of the toggle moving frame 3, a handle 37 for holding and driving the first frame 31 to move is connected to the upper end portion of the first frame 31; according to the motion trail of the first roller and the second roller, the movable frame 3 carries out corresponding evasion design, and a corresponding arc-shaped groove 211 is arranged on the semicircular plate 21 to avoid the fixing piece at the shaft end of the roller; in order to improve the strength of the arc plate 23 and limit the axial direction of the first roller and the second roller, an arc-shaped convex rib 233 is arranged on the outer surface of the arc plate 23.
As shown in fig. 7, the workbench 4 includes a carrier 41, and the top of the carrier 41 is a plane, which is used as a carrier surface of the circuit to be tested. The adjacent edges of the side, close to the circular arc-shaped guide rail 2, of the bearing plate 41 are respectively provided with a positioning block 42, and the inner side edge of the positioning block 42 is used as a positioning surface for positioning the circuit to be tested. A pair of telescopic compressing devices 43 are further arranged on the bearing plate 41, the telescopic directions of the two telescopic compressing devices 43 are mutually perpendicular in the upper plane of the bearing plate 41, and the telescopic direction of each telescopic compressing device 43 points to the positioning surface of the corresponding positioning block 42. Here, the telescopic compressing device 43 includes a reciprocable telescopic mechanism, and a compressing block 433 is provided at a telescopic end of the telescopic mechanism, wherein the telescopic mechanism may be an air cylinder, a hydraulic cylinder, an electric cylinder, or the like. Considering that the present device is often manually operated, the telescopic hold-down device 43 is preferably of the following construction: the telescopic screw rod pressing device comprises telescopic screw rods 431 and nut seats 432, wherein the nut seats 432 are fixed at positions, close to the edges, of the bearing plates 41, the telescopic screw rods 431 penetrate into the nut seats 432 to form transmission fit, the compression blocks 433 capable of rotating freely are sleeved at the inner side end heads of the telescopic screw rods 431, the end heads of the telescopic screw rods 431 are connected with screws to limit axial displacement of the compression blocks 433, the compression blocks 433 only can rotate, and when the telescopic screw rods 431 are rotated, the compression blocks 433 cannot be driven to rotate. The compressing block 433 can be a rectangular block, and the outer plane of the rectangular block is used as a clamping surface to be contacted and extruded with the circuit to be tested to form fixation.
In some cases, the circuit to be tested may be circular, and in order to ensure the clamping stability of the circuit, the compressing block 433 may further have the following structure: the pressing surface of the pressing block 433 has two convex first cambered surfaces 4331 and a second cambered surface 4332 which is arranged between the two first cambered surfaces 4331, is smoothly connected with the concave second cambered surfaces 4332, and the round circuit to be tested and the concave second cambered surfaces 4332 form at least two stable contact points, so that the clamping stability is improved.
Of course, the table 4 has a function of holding and carrying circuits, and in some embodiments, it can also have a function of moving back and forth and left and right in a horizontal plane. The concrete structure is as follows: the carrying plates 41 are arranged on a pair of stacked sliding tables 44 with mutually perpendicular moving directions, so that the carrying plates 41 have two movements in the vertical directions in the plane. The sliding table 44 has a linear reciprocating movement function with guide, such as a cylinder, an oil cylinder or an electric cylinder with guide, or adopts a structure of a screw bolt and a guide mechanism, and the guide mechanism can be a structure of a double guide post, a guide groove and the like.
As shown in fig. 8, the test clamp 5 includes a first clamping plate 51 and a second clamping plate 52 which are hinged, the first clamping plate 51 providing a locating surface 54, and the second clamping plate 52 providing a clamping surface 55. The second clamping plate 52 is rotatable about the hinge point, and preferably, a resilient member such as a torsion spring is provided at the hinge point to resiliently close the clamping portion of the test clamp 5 in the initial state. The tail of the first clamping plate 51 is fixedly connected with the movable frame 3, the tail of the second clamping plate 52 is provided with a threaded hole, the threaded hole is connected with a pressing bolt 53, the end of a threaded column of the pressing bolt 53 points to and presses against the first clamping plate 51, the clamping force of the clamping ends of the first clamping plate and the second clamping plate can be changed by adjusting the relative position of the pressing bolt, and the circuit pins clamped during the test are prevented from being separated. When the test clamp 5 clamps the circuit pins, the positioning surface 54 of the first clamping plate 51 is completely attached to the circuit pins, and the clamping surface 55 of the second clamping plate 52 is used for clamping the circuit pins, so that under the action of the positioning surface 54, the bending circle center of the circuit pins is ensured to be positioned on the circle center of the circular arc guide rail 2.
When the device is used, firstly, a circuit to be tested is adjusted to a proper position of a workbench and then fixed; then, a certain circuit pin to be tested is clamped stably through the test clamp 5, then the movable frame 3 is held by hand to enable the movable frame to reciprocate in the circular arc-shaped guide rail 2 according to a set track, and a circuit pin bending test is carried out according to test requirements.
The device can be used for traditional rectangular and circular contour circuits to carry out bending test of single or multiple pins. The test clamp of the device can easily clamp the pin of the circuit to be tested, and in the bending test process, the test clamp moves along the semicircular guide rail in a reciprocating manner along with the movable frame, so that the bending axis of the pin of the circuit to be tested can be ensured to be always concentrated at one point theoretically; meanwhile, the supporting sleeve with the locking is matched with the adjusting block to realize the adjustable circle center height of the semicircular guide rail and the circle center position of the guide rail is adjusted by the circuit fixing position of the workbench, so that the device can be suitable for circuit pins with various length specifications. Overall, the device can ensure the reliability, stability and repeatability of the pin bending test.
The above examples of the present invention are merely illustrative of the present invention and are not intended to limit the embodiments of the present invention. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. While those obvious variations or modifications which come within the spirit of the invention remain within the scope of the invention.

Claims (10)

1. The utility model provides a circuit pin bending test device, includes base (1), its characterized in that: the base (1) is connected with a circular arc guide rail (2), the circular arc guide rail (2) is connected with a movable frame (3) capable of relatively moving in a matching way, the movable frame (3) is connected with a test clamp (5) for clamping a circuit pin, and the test clamp (5) points to the circle center of the circular arc guide rail (2); a workbench (4) for fixing a circuit is further arranged on the base (1); the moving frame (3) moves along the circular arc guide rail (2) to make the circuit pins clamped by the test clamp (5) bend.
2. The circuit pin bending test device according to claim 1, wherein: the circular arc-shaped guide rail (2) is provided with a first circular arc track surface (231) and a second circular arc track surface (232), and the first circular arc track surface and the second circular arc track surface are arranged concentrically;
the movable frame (3) is provided with a group of first rollers (34) in rolling fit on a first circular arc track surface (231) and a group of second rollers (35) in rolling fit on a second circular arc track surface (232), and the movable frame (3) is limited on the circular arc guide rail (2) to precisely move through the first rollers and the second rollers.
3. The circuit pin bending test device according to claim 2, wherein: the movable frame (3) comprises a first frame body (31), a second frame body (32) and an adjusting bolt (33), and the first idler wheel and the second idler wheel are respectively and correspondingly arranged on the first frame body and the second frame body; the inside screw hole (311) that is equipped with of first support body (31), screw hole axial direction are located the centre of a circle of convex guide rail (2), are equipped with through-hole (321) on second support body (32), and adjusting bolt (33) penetrate second support body (32) and are connected with screw hole (311) of first support body (31) through-hole (321) clearance, can dismantle on adjusting bolt (33) and connect holding ring (36), second support body (32) are located and form the axial spacing between adjusting bolt (33) head and holding ring (36), can make second support body (32) follow radial direction adjustment of convex guide rail (2) through rotatory adjusting bolt (33).
4. A circuit pin bend test apparatus according to claim 3, wherein: the arc-shaped guide rail (2) is an assembly and comprises two semicircular plates (21) which are arranged in parallel and at a certain distance, the two semicircular plates (21) are connected into a whole through a connecting plate (22), the adjacent side surfaces of each semicircular plate (21) are respectively connected with an arc-shaped plate (23), the arc-shaped surface of each arc-shaped plate (23) far away from the circle center side is the first arc-shaped track surface (231), and the arc-shaped surface close to the circle center side is the second arc-shaped track surface (232).
5. The circuit pin bending test apparatus according to claim 1 or 4, wherein: the workbench (4) comprises a bearing plate (41), positioning blocks (42) are respectively arranged on two adjacent side edges of the bearing plate (41), a pair of telescopic compressing devices (43) are further arranged on the bearing plate (41), the telescopic directions of the two telescopic compressing devices (43) are mutually perpendicular in a plane, and the telescopic directions of the telescopic compressing devices (43) respectively correspond to the positioning surfaces of the positioning blocks (42).
6. The circuit pin bending test device according to claim 5, wherein: the telescopic compressing device (43) comprises a telescopic screw rod (431), the telescopic screw rod (431) is in transmission fit with a nut seat (432) fixed on the bearing plate (41), and the end part of the telescopic screw rod (431) is rotatably connected with the compressing block (433).
7. The circuit pin bending test device of claim 6, wherein: the pressing surface of the pressing block (433) is provided with two convex first cambered surfaces (4331) and a second cambered surface (4332) which is arranged between the two first cambered surfaces (4331) and is connected smoothly and concavely.
8. The circuit pin bending test device according to claim 5, wherein: the bearing plates (41) are arranged on a pair of sliding tables (44) which are stacked and have mutually perpendicular moving directions, so that the bearing plates (41) have two movements in the perpendicular directions in a plane.
9. The circuit pin bending test device according to claim 1, wherein: the base (1) comprises a bottom plate (11), a supporting sleeve (12) is arranged on the bottom plate (11), an adjusting block (13) fixedly connected with the circular-arc-shaped guide rail (2) is in sliding fit with the supporting sleeve (12), the shape of the adjusting block (13) is matched with the shape of an inner hole of the supporting sleeve and can slide up and down, a locking bolt (14) in threaded connection penetrates into the side wall of the supporting sleeve (12), and the end head of the locking bolt is in pressing fit with the adjusting block (13) to realize locking and fixing of the circular-arc-shaped guide rail (2).
10. The circuit pin bending test device according to claim 1, wherein: the test clamp (5) comprises a first clamping plate (51) and a second clamping plate (52) which are hinged with each other, the first clamping plate (51) provides a positioning surface (54), the second clamping plate (52) provides a clamping surface (55), the tail of the first clamping plate (51) is fixedly connected with the movable frame (3), a threaded hole is formed in the tail of the second clamping plate (52), a pressing bolt (53) is connected to the threaded hole, the end of a threaded column of the pressing bolt (53) presses the first clamping plate (51), and the clamping force of the clamping ends of the first clamping plate and the second clamping plate can be changed by adjusting the relative position of the pressing bolt.
CN202310994425.8A 2023-08-09 2023-08-09 Circuit pin bending test device Pending CN117110100A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310994425.8A CN117110100A (en) 2023-08-09 2023-08-09 Circuit pin bending test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310994425.8A CN117110100A (en) 2023-08-09 2023-08-09 Circuit pin bending test device

Publications (1)

Publication Number Publication Date
CN117110100A true CN117110100A (en) 2023-11-24

Family

ID=88806665

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310994425.8A Pending CN117110100A (en) 2023-08-09 2023-08-09 Circuit pin bending test device

Country Status (1)

Country Link
CN (1) CN117110100A (en)

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