CN117075458A - Method for measuring resolution of picosecond time interval measuring instrument - Google Patents
Method for measuring resolution of picosecond time interval measuring instrument Download PDFInfo
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- CN117075458A CN117075458A CN202311003019.7A CN202311003019A CN117075458A CN 117075458 A CN117075458 A CN 117075458A CN 202311003019 A CN202311003019 A CN 202311003019A CN 117075458 A CN117075458 A CN 117075458A
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Abstract
The invention relates to the technical field of time interval measurement, and discloses a method for measuring the resolution of a picosecond time interval measuring instrument, which firstly determines a method for measuring the resolution test by adopting programmable delay line equipment, and solves the problems that the resolution can not be tested in the past and the display resolution can only be given by visual inspection; the problems that the technical indexes given by partial manufacturers are high in deficiency, the use experience is affected and the like are avoided.
Description
Technical Field
The invention relates to the technical field of time interval measurement, in particular to a method for measuring resolution of a picosecond time interval measuring instrument.
Background
The high-precision time interval measurement technology plays an important role in fundamental research fields such as atomic physics research, earth dynamics research and the like, has wide application in various fields such as computer networks, mobile communication, electric power, finance, transportation, and national economy and national defense construction such as propagation and heavy engineering, has important influence even in national defense and military application fields such as laser ranging, satellite navigation, aerospace telemetry and the like, and has almost no difference in application in various aspects of life of deep people. In recent years, with the development of national science and technology and the implementation of important special matters such as manned aerospace, beidou navigation, lunar exploration engineering and the like, new challenges are presented to the time interval measurement technology, which is represented by further improving the precision requirement of a measuring instrument and increasing the requirement of the number of channels of the instrument.
Independent autonomous time-frequency systems are of national security and core interest. The time frequency system construction is very important for the mainly developed countries in the world, and the independent and complete national time frequency system is built in the Mei Rui. At present, china is building and perfecting a national time-frequency system which takes satellite navigation system time service as a dominant mode and is assisted by time service means such as wireless, network and the like, and the building of the time-frequency system comprises the contents of time conservation, time service, time consumption, metering calibration, monitoring and the like. This has a great need for time synchronized boards, modules, devices and systems, which will drive the rapid development of the overall time frequency industry.
The time interval measurement technology plays an extremely important role in the time frequency application and the supporting field, and scientific research, metering test and engineering application all need to use time interval measurement equipment, so the development of a high-precision multichannel time interval counter is hot in the time frequency field.
The time interval measurement resolution is a technical index which is very focused by a user, the definition of the effective resolution of the time interval measurement instrument is given in the national metrological verification procedure JJG238-2018 'time interval measurement instrument', the value of the effective resolution is directly quoted in the measurement characteristic of the maximum allowable error of the time interval measurement, however, a measurement method of the effective resolution is not given, and the effective resolution is a concept of displaying the resolution from the term definition and cannot be considered as the real measurement resolution of the time interval.
Aiming at the current situation that the user of the current high-precision time interval measuring instrument really measures the index requirement of the resolution of the instrument and has no relevant measuring basis, the invention provides a method for measuring the resolution of the picosecond time interval measuring instrument.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention provides a method for measuring the resolution of the picosecond time interval measuring instrument, which firstly determines a method for measuring the resolution test by adopting programmable delay line equipment, and solves the problems that the resolution can not be tested in the past and the display resolution can only be given by visual inspection; the problems that the technical indexes given by partial manufacturers are high in deficiency, the use experience is affected and the like are avoided.
The technical aim of the invention is realized by the following technical scheme: a method for measuring resolution of a picosecond time interval measurement instrument, comprising the steps of:
s1, starting a time interval measuring instrument, preheating, and confirming that the display of a relevant signal indicator lamp of the instrument is normal;
s2, setting the delay amount of the programmable delay line equipment to be 0;
s3, respectively accessing 1PPS output by a standard time frequency source and 1PPS output by programmable delay line equipment into a reference channel and a measurement channel of a time interval measuring instrument, starting measurement, recording measurement results by default 1 time per second, continuously measuring 100 seconds, taking an average value as a time interval measurement initial value, and recording as t 0 ；
S4, setting a programmable delay according to the measurement resolution index declared by the measured time interval measuring instrumentThe delay of the delay line equipment is the same as the measurement resolution declared by the time interval measuring instrument and is recorded as p 0 ；
S5, measuring the time interval between each channel and the reference channel, recording the measurement result by default according to 1 time per second, continuously measuring 100S, calculating the average value, and recording as t 1 The following formula is derived:
t 1 -t 0 ＝p 0 (1)
the following two cases are classified as the judgment criteria of the above formula (1):
a. if the formula (1) is satisfied, it can be determined that the measurement resolution of the measurement time interval measuring instrument is p 0 ；
b. If the formula (1) is not satisfied, gradually increasing the delay amount of the programmable delay line device by taking 1/10 of the measured resolution of the measured multi-channel time interval counter (if the value is smaller than the minimum adjustable step of the programmable delay line device, the minimum adjustable step of the programmable delay line device) as the step amount; each time the delay is changed, denoted as P 0 +ΔP, measuring the time interval between each channel and the reference channel, recording the measurement results by default at 1 time per second, continuously measuring for 100s, calculating the average value, and recording as t' 1 The following formula is derived:
t′ 1 -t 0 ＝P 0 +ΔP (2)
the above formula (2) is a judgment standard divided into the following two cases:
(1) if the formula (2) is satisfied, it can be determined that the measurement resolution of the measurement time interval measuring instrument is P 0 +ΔP；
(2) If the formula (2) is still not satisfied, continuing to increase the delay amount of the programmable delay line device by the step amount, and repeatedly measuring the time interval between each channel and the reference channel until the formula (2) is satisfied. And stopping measurement, wherein the delay adjustment amount is the measurement resolution of the time interval measuring instrument.
Further, the time interval measuring instrument adopts a two-channel time interval measuring instrument or a multi-channel time interval measuring instrument.
Further, the adjustable minimum step of the programmable delay line device is less than or equal to the measurement resolution of the measured time interval measurement instrument.
In summary, the invention has the following beneficial effects: the invention determines a method for measuring the resolution by adopting programmable delay line equipment for the first time, and solves the problems that the resolution can not be tested in the past and the display resolution can only be given by visual inspection; the problems that the technical indexes given by partial manufacturers are high in deficiency, the use experience is affected and the like are avoided.
Drawings
FIG. 1 is a block diagram showing the connection of a time interval measurement resolution instrument according to embodiment 2 of the present invention;
fig. 2 is a diagram of raw data of a measurement resolution test of the time interval measuring instrument in embodiment 2 of the present invention.
Detailed Description
The invention is described in further detail below with reference to fig. 1-2.
Example 1: a method for measuring resolution of a picosecond time interval measurement instrument, as shown in fig. 1 and 2, comprising the steps of:
s1, starting a time interval measuring instrument, preheating according to the instruction requirement, and confirming that the display of a relevant signal indicator lamp of the instrument is normal;
s2, setting the delay amount of the programmable delay line equipment to be 0;
s3, respectively accessing 1PPS output by a standard time frequency source and 1PPS output by programmable delay line equipment into a reference channel and a measurement channel of a time interval measuring instrument, starting measurement, recording measurement results by default 1 time per second, continuously measuring 100 seconds, taking an average value as a time interval measurement initial value, and recording as t 0 ；
S4, setting the delay quantity of the programmable delay line equipment to be the same as the measurement resolution of the measured time interval measuring instrument according to the measurement resolution index of the measured time interval measuring instrument, and recording as p 0 ；
S5, measuring the time interval between each channel and the reference channel, recording the measurement result by default according to 1 time per second, continuously measuring 100S, calculating the average value, and recording as t 1 The following formula is derived:
t 1 -t 0 ＝p 0 (1)
the following two cases are classified as the judgment criteria of the above formula (1):
a. if the formula (1) is satisfied, it can be determined that the measurement resolution of the measurement time interval measuring instrument is p 0 ；
b. If the formula (1) is not satisfied, gradually increasing the delay amount of the programmable delay line device by taking 1/10 of the measured resolution of the measured multi-channel time interval counter (if the value is smaller than the minimum adjustable step of the programmable delay line device, the minimum adjustable step of the programmable delay line device) as the step amount; each time the delay is changed, denoted as P 0 +ΔP, measuring the time interval between each channel and the reference channel, recording the measurement results by default at 1 time per second, continuously measuring for 100s, calculating the average value, and recording as t' 1 The following formula is derived:
t' 1 -t 0 ＝P 0 +ΔP (2)
the above formula (2) is a judgment standard divided into the following two cases:
(1) if the formula (2) is satisfied, it can be determined that the measurement resolution of the measurement time interval measuring instrument is P 0 +ΔP；
(2) If the formula (2) is still not satisfied, continuing to increase the delay amount of the programmable delay line device by the step amount, and repeatedly measuring the time interval between each channel and the reference channel until the formula (2) is satisfied. And stopping measurement, wherein the delay adjustment amount is the measurement resolution of the time interval measuring instrument.
The time interval measuring instrument can adopt a two-channel time interval measuring instrument or a multi-channel time interval measuring instrument, a certain channel is set as a reference channel, and the rest channels are measuring channels; the adjustable minimum step of the programmable delay line device is less than or equal to the measurement resolution of the measured time interval meter.
Example 2: and (3) experimental verification:
in this embodiment, a time interval measuring instrument with a measuring resolution of 10ps is taken as an example for test verification. The connection instrument device is shown in fig. 1, 1PPS power output by the standard time-frequency source is divided into two paths, one path is input into a reference channel of the time interval measuring instrument, the other path is input into the programmable delay line device, 1PPS signal output by the programmable delay line device is input into a measuring channel of the time interval measuring instrument, after preheating is carried out according to time specified by an instrument specification, measurement is carried out, the delay amount of the programmable delay line device is adjusted for 10ps each time, continuous measurement is carried out for 200s each time, the total adjustment is carried out for 5 times, the measured original data is shown in fig. 2, and the average value of each measurement is shown in the following table 1:
TABLE 1 time interval measurement data and calculated average value
The data in FIG. 2 and Table 1 can be combined to yield: the actual measurement resolution of the time interval measuring instrument is 10ps.
The present embodiment is only for explanation of the present invention and is not to be construed as limiting the present invention, and modifications to the present embodiment, which may not creatively contribute to the present invention as required by those skilled in the art after reading the present specification, are all protected by patent laws within the scope of claims of the present invention.
Claims (3)
1. A method for measuring resolution of a picosecond time interval measurement instrument, comprising the steps of:
s1, starting a time interval measuring instrument, preheating, and confirming that the display of a relevant signal indicator lamp of the instrument is normal;
s2, setting the delay amount of the programmable delay line equipment to be 0;
s3, respectively accessing 1PPS output by a standard time frequency source and 1PPS output by programmable delay line equipment into a reference channel and a measurement channel of a time interval measuring instrument, starting measurement, recording measurement results by default 1 time per second, continuously measuring 100 seconds, taking an average value as a time interval measurement initial value, and recording as t 0 ；
S4, setting the delay amount and the measured time interval of the programmable delay line equipment according to the measured resolution index stated by the measured time interval measuring instrumentThe measurement resolution of the statement of the measuring instrument is the same and is recorded as p 0 ；
S5, measuring the time interval between each channel and the reference channel, recording the measurement result by default according to 1 time per second, continuously measuring 100S, calculating the average value, and recording as t 1 The following formula is derived:
t 1 -t 0 ＝p 0 (1)
the following two cases are classified as the judgment criteria of the above formula (1):
a. if the formula (1) is satisfied, it can be determined that the measurement resolution of the measurement time interval measuring instrument is p 0 ；
b. If the formula (1) is not satisfied, gradually increasing the delay amount of the programmable delay line device by taking 1/10 of the measured resolution of the measured multi-channel time interval counter (if the value is smaller than the minimum adjustable step of the programmable delay line device, the minimum adjustable step of the programmable delay line device) as the step amount; each time the delay is changed, denoted as P 0 +ΔP, measuring the time interval between each channel and the reference channel, recording the measurement results by default at 1 time per second, continuously measuring for 100s, calculating the average value, and recording as t' 1 The following formula is derived:
t′ 1 -t 0 ＝P 0 +ΔP (2)
the above formula (2) is a judgment standard divided into the following two cases:
(1) if the formula (2) is satisfied, it can be determined that the measurement resolution of the measurement time interval measuring instrument is P 0 +ΔP；
(2) If the formula (2) is still not satisfied, continuing to increase the delay amount of the programmable delay line device by the step amount, and repeatedly measuring the time interval between each channel and the reference channel until the formula (2) is satisfied. And stopping measurement, wherein the delay adjustment amount is the measurement resolution of the time interval measuring instrument.
2. A method for measuring resolution of a picosecond-level time interval measurement instrument according to claim 1, characterized in that the time interval measurement instrument employs a two-channel time interval measurement instrument or a multi-channel time interval measurement instrument.
3. A method for measuring the resolution of a picosecond time interval measurement instrument according to claim 1, wherein the adjustable minimum step of the programmable delay line device is less than or equal to the measurement resolution of the measured time interval measurement instrument.
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| CN202311003019.7A CN117075458A (en) | 2023-08-10 | 2023-08-10 | Method for measuring resolution of picosecond time interval measuring instrument |
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