CN117055249A - Sampling quality inspection analysis system for liquid crystal display screen assembly processing line - Google Patents
Sampling quality inspection analysis system for liquid crystal display screen assembly processing line Download PDFInfo
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- 238000012545 processing Methods 0.000 title claims abstract description 91
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 86
- 238000005070 sampling Methods 0.000 title claims abstract description 84
- 238000007689 inspection Methods 0.000 title claims abstract description 51
- 238000004458 analytical method Methods 0.000 title claims abstract description 45
- 230000007547 defect Effects 0.000 claims abstract description 256
- 230000002950 deficient Effects 0.000 claims abstract description 85
- 238000012937 correction Methods 0.000 claims abstract description 56
- 238000001514 detection method Methods 0.000 claims abstract description 38
- 238000010191 image analysis Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- 238000004891 communication Methods 0.000 claims description 3
- 230000010354 integration Effects 0.000 claims description 3
- 238000004364 calculation method Methods 0.000 abstract description 12
- 238000001179 sorption measurement Methods 0.000 description 8
- 238000002372 labelling Methods 0.000 description 4
- 238000003672 processing method Methods 0.000 description 3
- 238000013475 authorization Methods 0.000 description 2
- OIGNJSKKLXVSLS-VWUMJDOOSA-N prednisolone Chemical compound O=C1C=C[C@]2(C)[C@H]3[C@@H](O)C[C@](C)([C@@](CC4)(O)C(=O)CO)[C@@H]4[C@@H]3CCC2=C1 OIGNJSKKLXVSLS-VWUMJDOOSA-N 0.000 description 2
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- 238000010586 diagram Methods 0.000 description 1
- 238000003708 edge detection Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 239000002994 raw material Substances 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The application discloses a sampling quality inspection analysis system of a liquid crystal display screen assembly processing line, which relates to the technical field of sampling quality inspection analysis systems, and comprises a sampling unit and a defect detection unit, wherein the sampling unit is used for randomly sampling a liquid crystal display screen conveyed on the processing line, and the defect detection unit is used for carrying out defect detection on a sampled liquid crystal display screen sample and counting the number of defects in the sample, and is characterized by further comprising the following steps: and the defect analysis unit is used for analyzing the types of the defects of the defective liquid crystal display screen and counting the number of the types of the defects. According to the application, the representative compensation coefficient calculation is carried out on the actually measured defect type data, and the representative correction value of the defective rate of each defect type is calculated through the compensation coefficient, so that the defective rate condition of each defect type obtained by calculation can better represent the overall characteristics of batch products, and the accuracy of estimating the quality of the whole batch products is improved.
Description
Technical Field
The application relates to the technical field of sampling quality inspection analysis systems, in particular to a sampling quality inspection analysis system for an assembly processing line of a liquid crystal display screen.
Background
As is known, the full inspection is to inspect each product in a batch of products one by one, and after picking out the defective products, consider all the remaining products to be the defective products. The quality inspection method is suitable for producing large-scale electromechanical equipment products with few batches, but most products with larger batches, such as electronic component products, are not suitable, the product yield is high, when inspection items are more or inspection is more complex, the full inspection is carried out with great manpower and material resources, meanwhile, the phenomena of false inspection and missing inspection are still unavoidable, and the sampling inspection is a statistical method and theory for randomly extracting a small number of products (samples) from a batch of products to carry out inspection so as to judge whether the batch of products are qualified or not. The liquid crystal display screen assembly processing line sampling quality inspection analysis system is used for sampling, detecting and analyzing the appearance defects of the assembled liquid crystal display screen.
If the authorization notice number is CN115219885B, the authorization notice date is 2022.12.02, and the name is a chip conveying sampling system, which comprises a conveying adsorption unit, an inlet end conveying belt and an outlet end conveying belt; wherein the entrance end conveyor belt has a first entrance and a first exit, the exit end conveyor belt has a second entrance and a second exit, the second entrance being disposed at a distal end of the first exit; the conveying and adsorbing unit comprises a conveying and adsorbing device and a movement control device; wherein the transport adsorption device is disposed between the first outlet and the second inlet; the conveying adsorption device is in a conveying state and can convey the chip from the first outlet end to the second inlet end when in the conveying state; the chip can be adsorbed on the surface of the adsorption device when the conveying adsorption device is in an adsorption state; the movement control device is connected with the conveying adsorption device and can drive the conveying adsorption device to move.
As the above application is the same, the existing sampling quality inspection system is mainly used for detecting and then judging the quality of the whole batch of products through random sampling, but when the appearance defects of the assembled and processed liquid crystal display screen are subjected to sampling detection analysis, the assembly and processing defects of the liquid crystal display screen mainly comprise a plurality of factors including screen fitting defects, shell fitting defects, assembly and processing defects and conveying and processing defects, and the quality data of the whole batch of products are directly calculated through single sampling detection by performing appearance defect inspection, so that the structural condition of each unit of the sample is insufficient to represent the overall characteristics to cause errors, and the accuracy is low.
Disclosure of Invention
The application aims to provide a sampling quality inspection analysis system of a liquid crystal display screen assembly processing line, which aims to solve the defects in the prior art.
In order to achieve the above object, the present application provides the following technical solutions: the utility model provides a liquid crystal display equipment processing line sampling quality inspection analysis system, its is used for carrying out sampling detection analysis to the liquid crystal display outward appearance defect after the equipment processing, including sampling unit and defect detection unit, sampling unit is used for carrying out random sampling to the liquid crystal display who carries on the processing line, defect detection unit is used for carrying out defect detection to the liquid crystal display sample of extraction and counting the quantity of defect in the sample, its characterized in that still includes:
the defect analysis unit is used for analyzing the types of the defects of the defective liquid crystal display screen and counting the number of each defect type, and the defect types comprise: screen fitting defects, shell fitting defects, assembly processing defects, and conveying processing defects;
a compensation analysis unit that calculates a representative compensation coefficient for each defect type, and calculates a representative correction value for each defect type defective rate based on the representative compensation coefficient;
and the integration processing unit integrates and calculates a defective rate correction coefficient G of the current batch of products, and invokes representative correction values of the number of each defect type to calculate the overall defective rate of the current quality inspection batch of products based on the correction coefficient.
As a further description of the above technical solution: the screen fitting defect representative compensation coefficient Wp is calculated in the following way:wherein K is P The defective rate of the screen fitting is calculated, P is the defect number of the screen fitting in the sample, and M is the number of the current quality inspection batch products;
the shell fitting defect representative compensation coefficient Wt is calculated by the following steps:wherein K is t The defective rate of the shell fittings is calculated, t is the defect number of the shell fittings in the sample, and M is the number of the current quality inspection batch products;
the assembly processing defect representative compensation coefficient Wz is calculated by the following steps:wherein K is Z For the defective rate of assembly processing, z is the number of assembly processing defects in a sample, and M is the number of current quality inspection batches of products;
the calculating mode of the representative compensation coefficient Ws of the conveying processing defect is as follows:wherein K is S For the defective rate of conveying processing, s is the quantity of conveying processing defects in a sample, and M is the quantity of products in the current quality inspection batch.
As a further description of the above technical solution: the calculation mode for calculating the defective rate representative correction value of each defect type based on the representative compensation coefficient is specifically as follows:
the screen fitting defect rate representative correction value Fp is calculated in the following manner:
the calculating mode of the representative correction value Ft of the defective rate of the shell fitting is as follows:
defective rate of the assembly processing defectThe calculation method of the tabular correction value Fz is as follows:
the calculating mode of the representative correction value Fs of the defective rate of the conveying processing defect is as follows:
as a further description of the above technical solution: the method for calculating the overall defective rate delta F of the current quality inspection batch product based on the correction coefficient G by calling the defective rate representative correction value of each defect type specifically comprises the following steps:
△F＝(Fp+Ft+Fz+Fs)×G。
as a further description of the above technical solution: the calculation mode of the correction coefficient G is as follows:
the method comprises the steps of calling the number Q of defects in a sample detected and counted in a defect detection unit;
the number of each defect type counted by the defect analysis unit is called, namely; the defect number P of the screen fitting, the defect number t of the shell fitting, the defect number z of the assembly processing, and the defect number s of the conveying processing;
a correction coefficient G is calculated and a correction coefficient,
as a further description of the above technical solution: the sampling unit comprises a sampling control module and a sampling robot; the output end of the sampling control module is in communication connection with the input end of the sampling robot;
the sampling control module is used for controlling the sampling robot to randomly sample the liquid crystal display screen conveyed on the assembly processing line and transferring the sampled samples to the defect detection unit.
As a further description of the above technical solution: when the sampling robot randomly samples the liquid crystal display screens conveyed on the assembly and processing line, the sampling robot samples a plurality of adjacent liquid crystal display screen samples at a time.
As a further description of the above technical solution: the defect detection unit comprises a machine vision detection terminal and an image analysis module, wherein the machine vision detection terminal is used for carrying out image acquisition on the appearance of the extracted liquid crystal display screen sample, transmitting the acquired image to the image analysis module, carrying out defect detection on the acquired sample image through the image analysis module, and marking the defect position on the liquid crystal display screen sample.
As a further description of the above technical solution: the defect analysis unit performs defect type analysis on the defective liquid crystal display screen, and the defect analysis unit includes:
the defect analysis unit is used for identifying the defect position mark on the image to obtain the defect position information of the defect mark point on the liquid crystal display screen sample;
dividing defect types into screen fitting defects, shell fitting defects, assembly processing defects and conveying processing defects based on defect position information, and carrying out statistics.
As a further description of the above technical solution: and when the liquid crystal display screen sample is provided with a plurality of defect position information, respectively carrying out defect type classification statistics.
In the technical scheme, the sampling quality inspection analysis system for the liquid crystal display screen assembly processing line provided by the application has the following beneficial effects:
when the liquid crystal display screen assembly processing line sampling quality inspection analysis system samples and detects appearance defects of the liquid crystal display screen, independent statistics is carried out on each defect type, representative compensation coefficient calculation is carried out on measured defect type data based on the defective rate of screen fittings, the defective rate of shell fittings, the defective rate of assembly processing and the defective rate of conveying processing, representative correction values of defective rates of each defect type are calculated through the compensation coefficients, the situation of the defective rates of each defect type obtained through calculation can better represent overall characteristics of batch products, accuracy of quality of the whole batch products is improved, meanwhile, sum of the defect type numbers is counted, defective rate correction coefficient G of the current batch products is calculated, defective rate of the current batch products is obtained based on the correction coefficient G, and error caused by the fact that a plurality of defect types exist in one liquid crystal display screen sample is reduced, and accuracy of quality of the whole batch products is further improved through sampling detection.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments described in the present application, and other drawings may be obtained according to these drawings for a person having ordinary skill in the art.
Fig. 1 is a schematic diagram of a sampling quality inspection analysis system of an assembly processing line for a liquid crystal display according to an embodiment of the present application.
Detailed Description
In order to make the technical scheme of the present application better understood by those skilled in the art, the present application will be further described in detail with reference to the accompanying drawings.
Referring to fig. 1, the embodiment of the application provides a technical scheme: the sampling quality inspection analysis system is used for sampling, detecting and analyzing appearance defects of the assembled liquid crystal display screen, and the liquid crystal display screen assembling and processing line is used for assembling screen body fittings and shell fittings of the liquid crystal display screen and then conveying and labeling the assembled liquid crystal display screen body and comprises a sampling unit and a defect detection unit;
the sampling unit is used for randomly sampling the liquid crystal display screen conveyed on the processing line, namely the sampling unit is arranged on the processing line and randomly samples the assembled and processed liquid crystal display screen to form a liquid crystal display screen sample, and the defect detection unit is used for carrying out defect detection on the extracted liquid crystal display screen sample and counting the number Q of defects in the sample and further comprises:
the defect analysis unit is used for analyzing the types of the defects of the defective liquid crystal display screen and counting the number of each defect type, and the defect types comprise:
the screen fitting defect is a screen fitting appearance defect of the liquid crystal display screen, (if the screen fitting appearance has a scratch defect);
a case accessory defect, which is a case accessory appearance defect of the liquid crystal display screen, (how the case accessory appearance has scratches and pit defects);
the assembly processing defect is an appearance defect of the screen body and the shell after assembly (such as a defect that the assembly fixing time gap is large or glue is exposed between the two defects);
conveying processing defects, namely conveying and labeling appearance defects (such as labeling position deviation, labeling folds and other appearance defects) of the assembled liquid crystal display screen;
a compensation analysis unit that calculates a representative compensation coefficient for each defect type, and calculates a representative correction value for each defect type defective rate based on the compensation coefficient; specifically, a representative error exists in the quality of the whole batch of products according to the inspection result of the products in the sample through sampling detection, and representative compensation coefficients are calculated on the actually measured defect type data through the defective rate information of the raw materials (namely the defective rate of the screen fitting and the defective rate of the shell fitting) and the defective rate information of the equipment processing (namely the defective rate of the assembly processing and the defective rate of the conveying processing), and representative correction values of the defective rates of the defect types are calculated through the compensation coefficients;
and the integration processing unit integrates and calculates a defective rate correction coefficient G of the current batch of products, and invokes representative correction values of the number of each defect type to calculate the overall defective rate of the current quality inspection batch of products based on the correction coefficient. Specifically, the number of defects in the liquid crystal display screen sample is obtained, the sum of the number of the defect types is counted, the defective rate correction coefficient G of the current batch of products is calculated, the defective rate of the current batch of products is obtained based on the correction coefficient G and the representative correction value of the number of the defect types in an integrated manner, and errors caused by the fact that one liquid crystal display screen sample exists in a plurality of defect types are reduced.
The embodiment provides a sampling quality inspection analysis system for an assembly processing line of a liquid crystal display screen, when sampling and detecting appearance defects of the liquid crystal display screen, each defect type is counted independently, representative compensation coefficient calculation is carried out on measured defect type data based on a defective rate of a screen fitting, a defective rate of a shell fitting, a defective rate of assembly processing and a defective rate of conveying processing, representative correction values of defective rates of all defect types are calculated through the compensation coefficients, the situation of the defective rates of all defect types obtained through calculation can better represent overall characteristics of batch products, accuracy of estimating quality of the whole batch products is improved, sum of the number of all defect types is counted, defective rate correction coefficient G of the current batch products is calculated, defective rate of the current batch products is obtained based on the correction coefficient G, error caused by the fact that a plurality of defect types exist in one liquid crystal display screen sample is reduced, and accuracy of estimating quality of the whole batch products through sampling and detecting is further improved.
The screen fitting defect representative compensation coefficient Wp is calculated in the following way:wherein K is P The defective rate of the screen fitting is one of fittings for assembling and processing the liquid crystal display screen body, defective rate information of the screen fitting is directly obtained through supply information, P is the number of screen fitting defects in a sample, wherein the number of screen fitting defects in the sample is greater than zero, and M is the number of products in a current quality inspection batch;
the shell fitting defect representative compensation coefficient Wt is calculated by the following steps:wherein K is t The defective rate of the shell parts is one of the parts for assembling and processing the liquid crystal display screen body, the defective rate information of the shell parts is directly obtained through the supply information, t is the defective number of the shell parts in the sample, wherein the defective number t of the shell parts is larger than zero, and M is the number of products in the current quality inspection batch;
the assembly processing defect representative compensation coefficient Wz is calculated by the following steps:wherein K is Z For the defective rate of assembly processing, namely the defective rate of products processed by the assembly processing equipment on the liquid crystal display screen, z is the number of assembly processing defects in a sample, wherein the number of the assembly processing defects z is greater than zero, and M is the number of products in the current quality inspection batch;
the calculating mode of the representative compensation coefficient Ws of the conveying processing defect is as follows:wherein K is S In order to convey the defective rate of processing, namely, the defective rate of processing products of conveying processing equipment for the liquid crystal display screen, s is the quantity of conveying processing defects in a sample, wherein the quantity s of conveying processing defects is greater than zero, and M is the quantity of products in the current quality inspection batch.
The calculation mode for calculating the defective rate representative correction value of each defect type based on the representative compensation coefficient is specifically as follows:
the screen fitting defect rate representative correction value Fp is calculated in the following manner:
the calculating mode of the representative correction value Ft of the defective rate of the shell fitting is as follows:
the calculating mode of the assembly processing defect defective rate representative correction value Fz is as follows:
the calculating mode of the representative correction value Fs of the defective rate of the conveying processing defect is as follows:
the representative correction value of the defective rate of each defect type is called, and the overall defective rate delta F of the current quality inspection batch product is calculated based on the correction coefficient G, specifically: Δf= (fp+ft+fz+fs) ×g.
The calculation mode of the correction coefficient G is as follows: the method comprises the steps of calling the number Q of defects in a sample detected and counted in a defect detection unit; the number of each defect type counted by the defect analysis unit is called, namely; the defect number P of the screen fitting, the defect number t of the shell fitting, the defect number z of the assembly processing, and the defect number s of the conveying processing; a correction coefficient G is calculated and a correction coefficient,wherein Q is less than or equal to 1; in order to improve the representativeness of the spot check data, when sampling and detecting the appearance defects of the liquid crystal display screen, the representative correction value of the defective rate of each defect type is calculated through the compensation coefficient, so that the total characteristics of the batch products can be better represented by the number of the defect types obtained through calculation, but as each defect type exists in one liquid crystal display screen sample, the accuracy is affected by errors when the integral defective rate of the batch products is calculated, when the defective rate of the batch products is calculated through integrating the defective rate of each defect, the defective rate of the current batch products is obtained through integrating and calculating the representative correction value of the number of the defect types based on the correction coefficient, the error caused by the fact that one liquid crystal display screen sample exists in a plurality of defect types is reduced, and the accuracy of the quality of the integral batch products inferred through sampling and detecting is improved.
The sampling unit comprises a sampling control module and a sampling robot; the output end of the sampling control module is in communication connection with the input end of the sampling robot; the sampling control module is used for controlling the sampling robot to randomly sample the liquid crystal display screen conveyed on the assembly processing line and transferring the sampled samples to the defect detection unit. The sampling control module is used for sending a sampling instruction to the sampling robot, the sampling robot is an executing component and is arranged on the assembly processing line, the sampling robot receives the sampling instruction and then samples the liquid crystal display screen conveyed on the assembly processing line, and when the sampling robot randomly samples the liquid crystal display screen conveyed on the assembly processing line, the sampling robot extracts a plurality of adjacent liquid crystal display screen samples at a time.
The defect detection unit comprises a machine vision detection terminal and an image analysis module, wherein the machine vision detection terminal is used for carrying out image acquisition on the appearance of the extracted liquid crystal display screen sample, transmitting the acquired image to the image analysis module, carrying out defect detection on the acquired sample image through the image analysis module, and marking the defect position on the liquid crystal display screen sample. Specifically, the image analysis module performs defect detection by adopting an image processing method, and optionally, obtains a target pixel point by adopting image edge detection to perform defect detection, and marks the target pixel point to determine a defect position.
The defect analysis unit performs defect type analysis on the defective liquid crystal display screen, and the defect analysis unit includes: the defect analysis unit is used for identifying the defect position mark on the image to obtain the defect position information of the defect mark point on the liquid crystal display screen sample; dividing the defect types into screen fitting defects, shell fitting defects, assembly processing defects and conveying processing defects based on the defect position information, carrying out statistics, and respectively carrying out defect type division statistics when the liquid crystal display screen sample is provided with a plurality of defect position information based on the defect position information. Specifically, when the appearance defect type of the liquid crystal display is identified by defect analysis, the defect type is identified by adopting a corresponding identification matching method because of the contrast intersection between the appearance defect and the background and the different defect forms, the defect characteristics are extracted with higher difficulty by adopting an image processing method in the prior art, meanwhile, effective characteristic parameters cannot be provided, the defect type is identified and understood by adopting a corresponding identification matching method, the system processing efficiency is low, the accuracy of defect type identification is affected, the defect position is marked when the appearance defect is assembled by using a defect detection unit based on the type characteristic of the liquid crystal display, then the defect type is matched based on the defect position, namely the defect position is matched to be a screen fitting defect when the defect position is on a screen fitting, the defect position is matched to be a shell fitting defect when the defect position is matched to be an assembly processing defect when the defect position is at a screen fitting position, the defect position is matched to be a conveying processing defect, the defect type is rapidly and accurately determined, the complex image processing method is omitted, and the defect detection efficiency and accuracy are remarkably improved.
While certain exemplary embodiments of the present application have been described above by way of illustration only, it will be apparent to those of ordinary skill in the art that modifications may be made to the described embodiments in various different ways without departing from the spirit and scope of the application. Accordingly, the drawings and description are to be regarded as illustrative in nature and not as restrictive of the scope of the application, which is defined by the appended claims.
Claims (10)
1. The sampling quality inspection analysis system for the liquid crystal display screen assembly processing line is used for sampling, detecting and analyzing the appearance defects of the assembled and processed liquid crystal display screen and comprises a sampling unit and a defect detection unit;
the sampling unit is used for randomly sampling the liquid crystal display screen conveyed on the processing line;
the defect detection unit is used for performing defect detection on the extracted liquid crystal display screen sample and counting the number of defects in the sample, and is characterized by further comprising:
the defect analysis unit is used for analyzing the types of the defects of the defective liquid crystal display screen and counting the number of each defect type, and the defect types comprise: screen fitting defects, shell fitting defects, assembly processing defects, and conveying processing defects;
a compensation analysis unit that calculates a representative compensation coefficient for each defect type, and calculates a representative correction value for each defect type defective rate based on the representative compensation coefficient;
and the integration processing unit integrates and calculates a defective rate correction coefficient G of the current batch of products, and invokes a representative correction value of defective rates of various defect types, and calculates the overall defective rate of the current quality inspection batch of products based on the correction coefficient.
2. The liquid crystal display assembly line sampling quality inspection analysis system of claim 1, wherein:
the screen fitting defect representative compensation coefficient Wp is calculated in the following way:wherein K is P The defective rate of the screen fitting is calculated, P is the defect number of the screen fitting in the sample, and M is the number of the current quality inspection batch products;
the shell fitting defect representative compensation coefficient Wt is calculated by the following steps:wherein K is t The defective rate of the shell fittings is calculated, t is the defect number of the shell fittings in the sample, and M is the number of the current quality inspection batch products;
the assembly processing defect representative compensation coefficient Wz is calculated by the following steps:wherein K is Z For the defective rate of assembly processing, z is the number of assembly processing defects in a sample, and M is the number of current quality inspection batches of products;
the calculating mode of the representative compensation coefficient Ws of the conveying processing defect is as follows:wherein K is S For the defective rate of conveying processing, s is the quantity of conveying processing defects in a sample, and M is the quantity of products in the current quality inspection batch.
3. The system for analyzing sampling quality of a liquid crystal display assembly line according to claim 2, wherein the method for calculating the representative correction value of the defective rate of each defect type based on the representative compensation coefficient is specifically as follows:
the screen body fittings are short ofThe method for calculating the defect rate representative correction value Fp is as follows:
the calculating mode of the representative correction value Ft of the defective rate of the shell fitting is as follows:
the calculating mode of the assembly processing defect defective rate representative correction value Fz is as follows:
the calculating mode of the representative correction value Fs of the defective rate of the conveying processing defect is as follows:
4. the liquid crystal display assembly line sampling quality inspection analysis system according to claim 3, wherein the step of extracting the defect rate representative correction value of each defect type and calculating the overall defect rate Δf of the current quality inspection batch product based on the correction coefficient G is specifically:
△F＝(Fp+Ft+Fz+Fs)×G。
5. the liquid crystal display assembly line sampling quality inspection analysis system according to claim 4, wherein the correction coefficient G is calculated by:
the method comprises the steps of calling the number Q of defects in a sample detected and counted in a defect detection unit;
the number of each defect type counted by the defect analysis unit is called, namely; the defect number P of the screen fitting, the defect number t of the shell fitting, the defect number z of the assembly processing, and the defect number s of the conveying processing;
a correction coefficient G is calculated and a correction coefficient,
6. the liquid crystal display assembly line sampling quality inspection analysis system of claim 1, wherein the sampling unit comprises a sampling control module and a sampling robot; the output end of the sampling control module is in communication connection with the input end of the sampling robot;
the sampling control module is used for controlling the sampling robot to randomly sample the liquid crystal display screen conveyed on the assembly processing line and transferring the sampled samples to the defect detection unit.
7. The liquid crystal display assembly line sampling quality inspection analysis system of claim 6, wherein the sampling robot samples adjacent liquid crystal display panels at a single time when the sampling robot randomly samples the liquid crystal display panels transported on the assembly line.
8. The system of claim 7, wherein the defect detection unit comprises a machine vision detection terminal and an image analysis module, the machine vision detection terminal is used for collecting images of the appearance of the extracted liquid crystal display samples, transmitting the collected images to the image analysis module, detecting defects of the collected sample images through the image analysis module, and marking defect positions on the liquid crystal display samples.
9. The liquid crystal display assembly line sampling quality inspection analysis system according to claim 1, wherein the defect analysis unit performs defect type analysis on the defective liquid crystal display, comprising:
the defect analysis unit is used for identifying the defect position mark on the image to obtain the defect position information of the defect mark point on the liquid crystal display screen sample;
dividing defect types into screen fitting defects, shell fitting defects, assembly processing defects and conveying processing defects based on defect position information, and carrying out statistics.
10. The system of claim 9, wherein when the sample of the liquid crystal display is classified into the defect types based on the defect position information, the defect type classification statistics are performed when the sample of the liquid crystal display has a plurality of defect position information.
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