CN117031528A - Reference radiation measurement method - Google Patents

Abstract

The application discloses a reference radiation measurement method, relates to the technical field of radiation measurement, and solves the problem of inaccurate measurement results in the related technology. The reference radiation measurement method comprises the steps of obtaining measurement configuration information, wherein the measurement configuration information comprises a first size parameter; adjusting the effective size of the receiving polar plate according to the first size parameter so as to enable the effective size of the receiving polar plate to be matched with the size of the radioactive source to be detected; and controlling the ionization chamber to measure the radioactive source to be measured, and obtaining a measurement result. The reference radiometric method of the present application is used to measure a radioactive source.

Description

Reference radiation measurement method

Technical Field

The present application relates to the field of, but is not limited to, radiometry, and in particular to a reference radiometry method.

Background

The accurate and reliable magnitude of the radiation dose metering device is an important link for guaranteeing radiation safety, and if the radiation dose metering device passes corresponding standard verification by means of a proper standard radiation source, the radiation dose metering device can be used for measuring the absorption dose rate of other radiation sources.

The ionization chamber may be considered a radiation dose metering apparatus. The ionization chamber is a detector that measures ionizing radiation using the ionization effect of the ionizing radiation. The ionization chamber is composed of electrodes at different potentials and a medium therebetween. The ionizing radiation generates ionized ion pairs in the medium, and under the action of an electric field, positive and negative ions drift to the negative electrode and the positive electrode respectively to form ionization current. Since the ionization current is proportional to the intensity of the radiation, measuring the ionization current can result in the intensity of the ionizing radiation.

The absorption dose for ionizing radiation can be determined from the ionization chamber itself parameters and environmental parameters by measuring the ionization current profile with the inter-electrode distance in the radiation field according to Bragg Lei Kongqiang theory (Bragg-Gray cavity theory). The extrapolated ionization chamber is the ionization chamber in which the distance between the electrodes can be varied.

However, the extrapolated ionization chamber provided by the related art does not measure ionization current of different sized radiation sources accurately enough.

Disclosure of Invention

The reference radiation measurement method provided by the embodiment of the application has the advantages of small error of measurement results and high accuracy.

In a first aspect, an embodiment of the present application provides a reference radiation measurement method, applied to a reference radiation measurement system, where the reference radiation measurement system includes an ionization chamber and a radiation source mechanism, the radiation source mechanism accommodates a radiation source to be measured, the ionization chamber includes a receiving polar plate, the receiving polar plate is used for receiving radiation emitted by the radiation source to be measured, and the test method includes:

acquiring measurement configuration information, wherein the measurement configuration information comprises a first size parameter;

adjusting the effective size of the receiving polar plate according to the first size parameter so as to enable the effective size of the receiving polar plate to be matched with the size of the radioactive source to be detected;

and controlling the ionization chamber to measure the radioactive source to be measured, and obtaining a measurement result.

According to the reference radiation measurement method provided by the embodiment of the application, the effective size of the receiving polar plate can be adjusted according to the first size parameter, so that the effective size of the receiving polar plate is matched with the size of the radioactive source to be measured, and the accuracy of a measurement result is improved.

In one possible implementation manner of the application, the receiving polar plate comprises a plurality of receiving areas, and each receiving area is respectively connected with a receiving switch;

in the step of adjusting the effective size of the receiving plate of the ionization chamber according to the first size parameter so that the effective size of the receiving plate matches the size of the radioactive source to be measured, the measuring method comprises:

determining an effective receiving area and an ineffective receiving area from a plurality of receiving areas according to the first size parameter, wherein the effective receiving area can receive rays emitted by a radioactive source to be detected;

and controlling the receiving switch corresponding to the effective receiving area to be switched to an on state and controlling the receiving switch corresponding to the ineffective receiving area to be switched to an off state, so that the effective receiving area receives the emitted rays of the radioactive source to be detected and outputs a measurement result.

In one possible implementation manner of the application, the outer contours of the plurality of receiving areas are all round, and the plurality of receiving areas form a concentric nested structure;

in the step of determining an effective reception area and an ineffective reception area from among the plurality of reception areas according to the first size parameter, the measurement method includes:

determining a boundary region in the plurality of receiving regions according to the first size parameter;

both the receiving area and the boundary area within the boundary area in the concentric nested structure are determined as effective receiving areas.

In one possible implementation of the present application, the first size parameter is a radius parameter, and in the step of determining the boundary region in the plurality of receiving regions according to the first size parameter, the measuring method includes:

comparing the outer radius of the receiving area with the radius parameter;

and determining a receiving area corresponding to the radius parameter with the outer radius larger than or equal to the radius parameter as a boundary area.

In one possible implementation of the present application, the ionization chamber further includes a high voltage polar film and a spacing adjustment assembly, the spacing adjustment assembly is used for adjusting a distance between the receiving polar plate and the high voltage polar film, and the measurement configuration information includes a first distance parameter;

in the step of controlling the ionization chamber to measure the radiation source to be measured and obtaining the measurement result, the measurement method includes:

controlling a spacing adjusting assembly according to the first distance parameter so that the spacing adjusting assembly adjusts the distance between the receiving polar plate and the high-voltage polar film;

and controlling the high-voltage electrode film to release voltage, and obtaining a measurement result.

In one possible implementation of the present application, the measurement configuration information further includes a positive voltage parameter and a negative voltage parameter, and the measurement result includes a positive deflection current and a negative deflection current;

in the step of controlling the high-voltage electrode film to release voltage and acquiring the measurement result, the measurement method further includes:

according to the positive voltage parameter, controlling the high-voltage polar film to release positive voltage, and acquiring forward deflection current output by the receiving polar plate;

and controlling the high-voltage polar film to release negative voltage according to the negative voltage parameter, and acquiring negative deflection current output by the receiving polar plate.

In one possible implementation of the present application, the measurement configuration information includes a plurality of parameter sets, and each parameter set includes a first distance parameter, a positive voltage parameter, and a negative voltage parameter;

in the step of controlling the ionization chamber to measure the radiation source to be measured and obtaining the measurement result, the measurement method includes:

controlling a spacing adjusting assembly according to the first distance parameter so that the spacing adjusting assembly adjusts the distance between the receiving polar plate and the high-voltage polar film;

according to the positive voltage parameter, controlling the high-voltage polar film to release positive voltage, and acquiring forward deflection current output by the receiving polar plate;

according to the negative voltage parameter, controlling the high-voltage electrode film to release negative voltage, and obtaining negative deflection current output by the receiving electrode plate;

judging whether the plurality of parameter sets are all used, switching to the next parameter set which is not measured when the parameter set is not used, and executing the step of controlling the distance adjusting component according to the first distance parameter so that the distance adjusting component adjusts the distance between the receiving polar plate and the high-voltage polar film.

In one possible implementation of the present application, before the step of controlling the pitch adjustment assembly according to the first distance parameter so that the pitch adjustment assembly adjusts the distance between the receiving electrode plate and the high voltage electrode film, the measurement method further includes:

the reference spacing between the receiver plate and the high voltage electrode film is calibrated.

In one possible implementation of the present application, the radiation source mechanism includes a switching assembly, the switching assembly accommodates a plurality of radiation sources to be measured, the measurement configuration information includes radiation source parameters, and the measurement method further includes:

determining a target radioactive source from a plurality of radioactive sources to be detected according to the radioactive source parameters;

the switching assembly is controlled to cause the target radiation source to emit radiation toward the receiving plate.

In one possible implementation of the application, the reference radiation measurement system further comprises a position adjustment mechanism for adjusting a distance between the ionization chamber and the radiation source mechanism, the measurement configuration information comprising a second distance parameter; after the step of acquiring measurement configuration information, the measurement method further includes:

the position adjustment mechanism is controlled in accordance with the second distance parameter such that the position adjustment mechanism adjusts the distance between the ionization chamber and the radiation source.

Drawings

FIG. 1 is a schematic diagram of a reference radiometric measurement system according to an embodiment of the present application;

FIG. 2 is a flowchart of a reference radiometric measurement method according to an embodiment of the present application;

FIG. 3 is a front view of a middle receiver plate of a reference radiometry system according to an embodiment of the present application;

FIG. 4 is a side view of a middle receiver plate of a reference radiometric measurement system provided by an embodiment of the present application;

FIG. 5 is a second flowchart of a reference radiometric measurement method according to an embodiment of the present application;

FIG. 6 is a flowchart III of a reference radiometric measurement method provided by an embodiment of the present application;

FIG. 7 is a flowchart of a reference radiometric measurement method according to an embodiment of the present application;

FIG. 8 is a flowchart fifth exemplary method for reference radiometric measurement according to an embodiment of the present application;

FIG. 9 is a flowchart sixth of a reference radiometric measurement method provided by an embodiment of the present application;

FIG. 10 is a flow chart seventh of a reference radiometric measurement method provided by an embodiment of the present application;

FIG. 11 is a flowchart eighth of a reference radiometric measurement method provided by an embodiment of the present application;

FIG. 12 is a flowchart of a reference radiometric measurement method according to an embodiment of the present application;

fig. 13 is a flowchart of a reference radiometric measurement method according to an embodiment of the present application.

Reference numerals:

100-ionization chamber; 110-receiving electrode plates; 111-receiving area; 111 a-a first region; 111 b-a second region; 111 c-a third region; 111 d-fourth region; 120-receiving switch; 130-high voltage electrode film; 140-pitch adjustment assembly; 150-a ranging assembly; 200-a radioactive source mechanism; 210-a switching component; 300-position adjustment mechanism; 400-remote host.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application more apparent, the specific technical solutions of the present application will be described in further detail below with reference to the accompanying drawings in the embodiments of the present application. The following examples are illustrative of the application and are not intended to limit the scope of the application.

In embodiments of the present application, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the embodiments of the present application, unless otherwise indicated, the meaning of "a plurality" is two or more.

Furthermore, in the embodiments of the present application, the terms "upper," "lower," "left," and "right," etc., are defined with respect to the orientation in which the components in the drawings are schematically disposed, and it should be understood that these directional terms are relative terms, which are used for descriptive and clarity with respect to each other, and which may vary accordingly with respect to the orientation in which the components in the drawings are disposed.

In embodiments of the present application, unless explicitly specified and limited otherwise, the term "connected" is to be construed broadly, and for example, "connected" may be either a fixed connection, a removable connection, or an integral unit; can be directly connected or indirectly connected through an intermediate medium.

In embodiments of the present application, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

In embodiments of the application, words such as "exemplary" or "such as" are used to mean serving as an example, instance, or illustration. Any embodiment or design described herein as "exemplary" or "e.g." in an embodiment of the present application is not to be taken as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "such as" is intended to present related concepts in a concrete fashion.

Referring to fig. 1, the reference radiation measurement system includes an ionization chamber 100 and a radiation source mechanism 200, the radiation source mechanism 200 accommodates a radiation source to be measured, the ionization chamber 100 includes a receiving polar plate 110, the receiving polar plate 110 is used for receiving radiation emitted by the radiation source to be measured, the reference radiation measurement system further includes a remote host 400, and the remote host 400 is used for executing the reference radiation measurement method of the present application so as to realize measurement of the radiation source to be measured.

The ionization chamber 100 may be an extrapolation ionization chamber, and the type of the radioactive source to be measured is not limited in the present application, and the radioactive source to be measured may be a radioactive source emitting β rays, γ rays, and the like.

Referring to fig. 2, in one possible embodiment of the present application, the measurement method includes:

s100: measurement configuration information is acquired, the measurement configuration information including a first dimension parameter.

The configuration information refers to working parameters required to be set during measurement, and the configuration information can comprise relevant characteristic information of the radioactive source, such as the type, the size, the type of emitted rays and the like of the radioactive source; the configuration information may also include the execution steps at the time of measurement; the configuration information may also include measured environmental conditions, such as temperature, pressure, etc., as well as, for example, parameters that the ionization chamber 100, the radiation source mechanism 200 needs to adjust at the time of measurement, etc., as the application is not limited in this regard.

It will be appreciated that remote host 400 includes a processor and memory, the configuration parameters being computer readable instructions stored in the memory, optionally with sets of configuration parameters pre-stored in the memory, each configuration parameter corresponding to a different measurement scheme, the reference radiation measurement system being executed by the processor executing a set of configuration parameters specified by a worker during measurement.

Alternatively, the configuration parameters are related information input by a worker through an interaction component such as a keyboard or a touch screen, and the processor generates the configuration parameters according to the input information to control the ionization chamber 100, the radioactive source mechanism 200, and the like.

Here, the first size parameter is a size parameter set according to a to-be-measured radiation source, the to-be-measured radiation source emits radiation, the radiation irradiates an irradiated area on the receiving polar plate 110, the first size parameter may be an area and a central position of the irradiated area, or, alternatively, the first size parameter may be a radius, a diameter, or the like according to different shapes of the irradiated area, for example, when the irradiated area is circular; when the illuminated area is square, the first dimension parameter is side length and the like.

S200: the effective size of the receiving plate 110 is adjusted according to the first size parameter so that the effective size of the receiving plate 110 matches the size of the radioactive source to be measured.

The effective size refers to the size of the area on the receiving plate 110 that can receive the radiation emitted by the radiation source to be measured. The size of the radiation source to be measured is the projection size corresponding to the radiation emitted by the radiation source to be measured when the radiation source irradiates the receiving electrode plate 110, and it can be understood that the effective size and the first size parameter are the same parameter type, for example, are both radius parameters.

Here, the effective size of the receiving plate 110 is matched with the size of the radioactive source to be measured, that is, the difference between the effective size and the size of the radioactive source to be measured is within a preset range, for example, the difference between the radius of the effective size and the radius of the size of the radioactive source to be measured is less than 2 mm, and the effective size of the receiving plate 110 is considered to be matched with the size of the radioactive source to be measured.

S300: the ionization chamber 100 is controlled to measure the radiation source to be measured and obtain the measurement result.

Wherein, controlling the measurement of the ionization chamber 100 refers to setting the relevant measurement parameters of the ionization chamber 100 according to the measurement configuration, and performing the measurement according to the execution steps provided by the measurement configuration information.

It will be appreciated that the ionization chamber 100 is provided with a sensor, and the measurement results are collected by the sensor and transmitted to the processor of the remote host 400, and are stored in the memory after being processed by the processor, and the type of measurement results are not limited in the present application, and for example, the sensor includes a response current sensor, and the measurement results are response current values.

According to the reference radiation measurement method provided by the embodiment of the application, the effective size of the receiving polar plate 110 can be adjusted according to the first size parameter, so that the effective size of the receiving polar plate 110 is matched with the size of the radioactive source to be measured, and the accuracy of a measurement result is improved.

Referring to fig. 3 and 4, in one possible implementation of the present application, the receiving plate 110 includes a plurality of receiving areas 111, and each receiving area 111 is connected with a receiving switch 120, respectively;

the receiving areas 111 are conductive areas, different receiving areas 111 are insulated from each other, and the receiving areas 111 can receive radiation emitted by the radiation source to be measured.

The receiving switch 120 is electrically coupled between the corresponding receiving area 111 and the sensor, and when the receiving switch 120 is in an on state, the corresponding receiving area 111 can transmit a response current to the sensor, and when the receiving switch 120 is in an off state, the corresponding receiving area 111 cannot transmit the response current to the sensor.

Referring to fig. 5, in step S200 of adjusting the effective size of the receiving plate 110 of the ionization chamber 100 according to the first size parameter so that the effective size of the receiving plate 110 matches the size of the radiation source to be measured, the measurement method includes:

s210: the effective reception area 111 and the ineffective reception area 111 are determined from the plurality of reception areas 111 according to the first size parameter.

The effective receiving area 111 refers to a receiving area 111 capable of receiving radiation emitted from the radiation source to be measured, that is, the receiving area 111 irradiated by radiation emitted from the radiation source to be measured.

Accordingly, the invalid receiving area 111 refers to an area which cannot be irradiated by the radiation emitted by the radiation source to be measured, that is, the area does not actually participate in measurement, and if the invalid receiving area 111 is connected to the sensor, the response current generated by the invalid receiving area is affected by the measurement result because the invalid receiving area is not actually irradiated by the radiation.

S220: the receiving switch 120 corresponding to the effective receiving area 111 is controlled to be switched to an on state, and the receiving switch 120 corresponding to the ineffective receiving area 111 is controlled to be switched to an off state, so that the effective receiving area 111 receives the emitted radiation of the radiation source to be measured and outputs a measurement result.

Here, by switching the receiving switch 120 corresponding to the effective receiving area 111 to the on state, the effective receiving area 111 can transmit the response current to the sensor, and the receiving switch 120 corresponding to the ineffective receiving area 111 is switched to the off state, so that the response current is not transmitted like the sensor, thereby reducing the influence of the ineffective receiving area 111 on the measurement result and improving the accuracy of the measurement result.

The structure of the receiving areas 111 is not limited by the present application, and referring to fig. 3, in one possible implementation of the present application, the outer contours of the plurality of receiving areas 111 are all circular, and the plurality of receiving areas 111 form a concentric nested structure.

Illustratively, the receiving plate 110 includes a first region 111a, a second region 111b, a third region 111c and a fourth region 111d sequentially arranged from inside to outside, the first region 111a is circular, the second region 111b, the third region 111c and the fourth region 111d are all annular, the second region 111b is sleeved outside the first region 111a, the third region 111c is sleeved outside the second region 111b, and the fourth region 111d is sleeved outside the third region 111 c.

Referring to fig. 6, in determining an effective reception area 111 and an ineffective reception area 111 from among a plurality of reception areas 111 according to a first size parameter, the measurement method includes:

s211: determining a boundary region in the plurality of receiving regions 111 according to the first size parameter;

the boundary region refers to a region closest to the first size parameter among the plurality of regions.

S212: both the receiving area 111 and the boundary area within the boundary area in the concentric nested structure are determined as effective receiving areas 111.

Illustratively, when the third region 111c is determined as the boundary region, the third region 111c and the second region 111b and the first region 111a inside thereof together are determined as the effective reception region 111.

Specifically, the first size parameter is a radius parameter, referring to fig. 7, in a possible implementation manner of the present application, in step S211 of determining a boundary region in the plurality of receiving regions 111 according to the first size parameter, the measurement method includes:

s211a: comparing the outer radius of the receiving area 111 with a radius parameter;

s211b: judging whether the outer radius of the receiving area is larger than or equal to a radius parameter;

the receiving area 111 corresponding to the outside radius greater than or equal to the radius parameter is determined as the boundary area.

Here, the receiving areas 111 may be sequentially compared in size with the radius parameters in order from inside to outside, and for example, the outer radius of the first area 111a is compared with the radius parameters first, and when the radius parameters are greater than the outer radius of the first area 111a, the outer radius of the second area 111b is compared with the radius parameters, and when the outer radius of the second area 111b is greater than the radius parameters, the second area 111b is determined as a boundary area, the second area 111b and the first area 111a are determined as effective receiving areas 111, and the third area 111c and the fourth area 111d are determined as ineffective receiving areas 111.

It should be noted that a protection area may also be set at the outermost side of the concentric nested structure, where the protection area is electrically connected to the sensor all the time to provide protection during the measurement process.

Referring to fig. 1, in one possible implementation of the present application, the ionization chamber 100 further includes a high voltage polar film 130 and a spacing adjustment assembly 140, the spacing adjustment assembly 140 being configured to adjust a distance between the receiving polar plate 110 and the high voltage polar film 130, the measurement configuration information including a first distance parameter;

the high voltage electrode film 130 is used for releasing high voltage electricity, specifically, the ionization chamber 100 is further connected with a high voltage power source, and the controller of the remote host 400 can control the high voltage power source to apply high voltage electricity to the high voltage electrode film 130.

The form of the spacing adjustment assembly 140 is not limited by the present application, the spacing adjustment assembly 140 may be driven by a first driving member such as an electric telescopic rod, a motor, etc., and the first driving member is connected to the receiving polar plate 110 through a transmission of a coupling, a rack and pinion, a worm and gear, a belt mechanism, a link mechanism, etc., so as to drive the receiving polar plate 110 to move toward or away from the high voltage polar film 130, and the remote host 400 is electrically coupled to the first driving member.

The first distance parameter is used to represent the vertical distance between the receiver plate 110 and the high voltage electrode film 130.

Referring to fig. 8, in step S300 of controlling the ionization chamber 100 to measure a radiation source to be measured and acquiring a measurement result, the measurement method includes:

s310: the spacing adjustment assembly 140 is controlled according to the first distance parameter such that the spacing adjustment assembly 140 adjusts the distance between the receiver plate 110 and the high voltage electrode film 130.

For example, the first distance parameter is 2 mm, and the remote host 400 controls the first driving member to start, and the first driving member drives the receiving electrode plate 110 to move to a position 1302 mm away from the high voltage electrode film.

To improve measurement accuracy, optionally, the ionization chamber 100 further includes a distance measuring assembly 150, where the distance measuring assembly 150 may measure a distance between the receiving electrode plate 110 and the high voltage electrode film 130, and the distance measuring assembly 150 may be a distance sensor, and the remote host 400 is further electrically connected to the distance sensor.

The distance sensor measures the distance between the receiving electrode plate 110 and the high-voltage electrode film 130 in real time and updates a distance parameter, the controller controls the first driving piece according to the distance parameter, when the distance parameter is larger than the first distance parameter, the controller controls the first driving piece to drive the receiving electrode plate 110 to move towards the high-voltage electrode film 130, when the distance parameter is smaller than the first distance parameter, the controller controls the first driving piece to drive the receiving electrode plate 110 to move away from the high-voltage electrode film 130, and when the distance parameter is equal to the first distance parameter, the controller judges that the receiving electrode plate 110 moves in place.

S320: the high voltage electrode film 130 is controlled to release the voltage, and the measurement result is obtained.

Here, the remote host 400 applies a voltage to the high voltage electrode film 130 by controlling the high voltage power source so that the high voltage electrode film 130 releases the voltage.

Referring to fig. 9, in one possible implementation of the present application, the measurement configuration information further includes a positive voltage parameter and a negative voltage parameter, and the measurement result includes a positive deflection current and a negative deflection current;

wherein the positive voltage parameter is distinguished from the negative voltage parameter by a reference voltage (e.g., 0 volts ground), the positive voltage parameter is higher than the reference voltage, e.g., +5 volts, +20 volts, etc., and the negative voltage parameter is lower than the reference voltage, e.g., -5 volts, -20 volts, etc.

The forward deflection current refers to the response current transmitted from the receiver plate 110 to the sensor when the high voltage electrode film 130 releases a positive voltage. Negative deflection current refers to the response current transmitted by the receiver plate 110 to the sensor when the high voltage electrode film 130 releases a negative voltage.

Referring to fig. 9, in step S320 of controlling the high voltage electrode film 130 to release voltage and acquiring a measurement result, the measurement method further includes:

s321: according to the positive voltage parameter, the high-voltage electrode film 130 is controlled to release positive voltage, and the forward deflection current output by the receiving electrode plate 110 is obtained;

s322: according to the negative voltage parameter, the high voltage electrode film 130 is controlled to release the negative voltage, and the negative deflection current output by the receiving electrode plate 110 is obtained.

Here, the remote host 400 controls the high voltage power supply to sequentially apply positive and negative voltages to the high voltage electrode film 130, and correspondingly obtains positive deflection current and negative deflection current through the sensor, so that experimental errors are further reduced, and experimental precision is improved.

It will be appreciated that during one measurement, different parameter conditions may be set to obtain more accurate data, and in one possible implementation of the present application, the measurement configuration information includes a plurality of parameter sets, and each parameter set includes a first distance parameter, a positive voltage parameter, and a negative voltage parameter. Illustratively, the measurement configuration information includes five parameter sets, wherein:

the first distance parameter in the first parameter set is 0.5 millimeter, the positive voltage parameter is +5 volts, and the negative voltage parameter is-5 volts;

the first distance parameter in the second parameter set is 1.0 millimeter, the positive voltage parameter is +10 volts, and the negative voltage parameter is-10 volts;

the first distance parameter in the third parameter set is 1.5 mm, the positive voltage parameter is +15 volts, and the negative voltage parameter is-15 volts;

the first distance parameter in the fourth parameter set is 2.0 millimeters, the positive voltage parameter is +20 volts, and the negative voltage parameter is-20 volts;

the first distance parameter in the fifth parameter set is 2.5 millimeters, the positive voltage parameter is +25 volts, and the negative voltage parameter is-25 volts.

Referring to fig. 10, in step S300 of controlling the ionization chamber 100 to measure a radiation source to be measured and acquiring a measurement result, the measurement method includes:

s310: controlling the spacing adjustment assembly 140 according to the first distance parameter such that the spacing adjustment assembly 140 adjusts the distance between the receiving plate 110 and the high voltage electrode film 130;

s321: according to the positive voltage parameter, the high-voltage electrode film 130 is controlled to generate positive voltage, and the forward deflection current output by the receiving electrode plate 110 is obtained;

s322: according to the negative voltage parameter, the high-voltage electrode film 130 is controlled to generate negative voltage, and negative deflection current output by the receiving electrode plate 110 is obtained;

s330: it is determined whether a plurality of parameter sets are all used.

For example, the measurement configuration information includes a number parameter, the controller sequentially uses the first parameter set to the fifth parameter set to measure, and each time a group of parameter sets is used to perform accumulation counting, when the value of the accumulation counting of the controller and the number parameter meet the equality condition, it is determined that the plurality of parameter sets are used.

When the controller determines that the plurality of parameter sets have been used, indicating that the measurement has been completed, the controller may perform subsequent steps of processing the measurement results, outputting the measurement results, and the like.

S340: when the parameter set is not used, switching to the next parameter set which is not measured, and performing the step S310 of controlling the spacing adjustment assembly 140 according to the first distance parameter so that the spacing adjustment assembly 140 adjusts the distance between the receiving electrode plate 110 and the high voltage electrode film 130.

For example, the controller performs steps S310, S321, and S322 using the first parameter set first, determines that the parameter set is not used after the measurement of the first parameter set is completed, and then performs steps S310, S321, and S322 using the second parameter set, and thus performs steps S310, S321, S322, S330, and S340 in a loop until it is determined that the plurality of parameter sets are all used.

In order to improve measurement accuracy and eliminate measurement accumulated errors, referring to fig. 11, in one possible implementation of the present application, before the step S310 of controlling the spacing adjustment assembly 140 according to the first distance parameter so that the spacing adjustment assembly 140 adjusts the distance between the receiving electrode plate 110 and the high voltage electrode film 130, the measurement method further includes:

s350: the reference spacing between the receiver plate 110 and the high voltage electrode film 130 is calibrated.

In step S350, the receiving plate 110 is moved to a position contacting the high-voltage electrode film 130, and the distance parameter measured by the distance measuring component 150 is changed accordingly, after the receiving plate 110 contacts the high-voltage electrode film 130, the distance parameter of the distance measuring component 150 is zeroed, and in the subsequent measurement, the distance parameter obtained by the distance measuring component 150 can be directly used as the actual distance between the receiving plate 110 and the high-voltage electrode film 130, i.e. the absolute position parameter of the receiving plate 110 is obtained by the distance measuring component 150, so that errors caused by indirectly obtaining the position of the receiving plate 110 through the distance adjusting component 140 can be avoided.

To facilitate measurement of a plurality of radiation sources to be measured, referring to fig. 1, in one possible implementation of the present application, the radiation source mechanism 200 includes a switching assembly 210, where the switching assembly 210 accommodates a plurality of radiation sources to be measured, and illustratively, the switching assembly 210 may include a turntable and a second driving member, where the second driving member may be a motor, and an output shaft of the second driving member is in transmission connection with the turntable, where an annular array of the turntable is provided with a plurality of accommodation positions, where each accommodation position accommodates one radiation source to be measured correspondingly, and where the radiation source mechanism 200 further includes an emission port.

On this basis, the measurement configuration information includes radiation source parameters, and referring to fig. 12, the measurement method further includes:

s400: and switching the radioactive source to be detected according to the radioactive source parameters.

The radiation source parameters can be parameters such as the number, the attribute and the like of the radiation source.

Specifically, in step S400 of switching the radiation source to be measured according to the radiation source parameters, the measurement method includes:

s410: determining a target radioactive source from a plurality of radioactive sources to be detected according to the radioactive source parameters;

the processor of the remote host 400 may compare the radiation source parameters with parameters of the radiation source to be measured in the radiation source mechanism 200, and determine that the radiation source to be measured is the target radiation source when the two parameters satisfy the equality condition.

S420: the switching assembly 210 is controlled to direct the radiation source of interest toward the receiver plate 110.

Here, the remote host 400 controls the second driving member, and drives the turntable to rotate through the second driving member, so that the receiving position where the target radiation source is located is aligned with the emission port, thereby enabling the target radiation source to emit radiation toward the receiving plate 110.

To improve the adaptability of the reference radiometric system, referring to fig. 1, in one possible implementation of the present application, the reference radiometric system further comprises a position adjustment mechanism 300, the position adjustment mechanism 300 being used to adjust the distance between the ionization chamber 100 and the radiation source mechanism 200.

Illustratively, the position adjustment mechanism 300 and the radiation source mechanism 200 are both fixed to a base, and the ionization chamber 100 is connected to the position adjustment mechanism 300. Alternatively, the position adjustment mechanism 300 includes a third drive member, which may be a motor, a telescopic rod, or the like, that drives the ionization chamber 100 toward or away from the radiation source mechanism 200.

On the basis, the measurement configuration information comprises a second distance parameter; referring to fig. 13, after the step S100 of acquiring measurement configuration information, the measurement method further includes:

s500: the position adjustment mechanism 300 is controlled in accordance with the second distance parameter such that the position adjustment mechanism 300 adjusts the distance between the ionization chamber 100 and the radiation source.

Here, different second distance parameters may be set corresponding to different radiation sources to be measured, so as to perform targeted distance adjustment, so as to improve adaptability to different radiation sources to be measured.

In the several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above described device embodiments are only illustrative, e.g. the division of units is only one logical function division, and there may be other divisions in actual implementation, such as: multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. In addition, the various components shown or discussed may be coupled or directly coupled or communicatively coupled to each other via some interface, whether indirectly coupled or communicatively coupled to devices or units, whether electrically, mechanically, or otherwise.

The units described above as separate components may or may not be physically separate, and components shown as units may or may not be physical units; can be located in one place or distributed to a plurality of network units; some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment. In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may be separately used as one unit, or two or more units may be integrated in one unit; the integrated units may be implemented in hardware or in hardware plus software functional units.

Those of ordinary skill in the art will appreciate that: all or part of the steps for implementing the above method embodiments may be implemented by hardware related to program instructions, and the foregoing program may be stored in a computer readable storage medium, where the program, when executed, performs steps including the above method embodiments; and the aforementioned storage medium includes: a mobile storage device, a Read Only Memory (ROM), a magnetic disk or an optical disk, or the like, which can store program codes.

Alternatively, the above-described integrated units of the present application may be stored in a computer-readable storage medium if implemented in the form of software functional modules and sold or used as separate products. Based on such understanding, the technical solution of the embodiments of the present application may be essentially or part of what contributes to the related art may be embodied in the form of a software product stored in a storage medium, including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the methods of the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a removable storage device, a ROM, a magnetic disk, or an optical disk.

The foregoing embodiment numbers of the present application are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments. The foregoing description is only of the preferred embodiments of the present application, and is not intended to limit the scope of the application, but rather is intended to cover any equivalents of the structures or equivalent processes disclosed herein or in the alternative, which may be employed directly or indirectly in other related arts.

Claims (10)

1. A reference radiometric measurement method applied to a reference radiometric measurement system comprising an ionization chamber and a radioactive source mechanism, said radioactive source mechanism housing a radioactive source to be measured, said ionization chamber comprising a receiving plate for receiving radiation emitted by said radioactive source to be measured, said measurement method comprising:

acquiring measurement configuration information, wherein the measurement configuration information comprises a first size parameter;

adjusting the effective size of the receiving polar plate according to the first size parameter so as to enable the effective size of the receiving polar plate to be matched with the size of the radioactive source to be detected;

and controlling the ionization chamber to measure the radioactive source to be measured, and obtaining a measurement result.

2. The reference radiometric measurement method of claim 1 wherein the receiver plate comprises a plurality of receiver regions, and each receiver region has a receiver switch connected thereto;

in the step of adjusting the receiving plate effective size of the ionization chamber according to the first size parameter so that the receiving plate effective size matches the size of the radiation source to be measured, the measuring method includes:

determining an effective receiving area and an ineffective receiving area from a plurality of receiving areas according to the first size parameter, wherein the effective receiving area can receive rays emitted by a radioactive source to be detected;

and controlling the receiving switch corresponding to the effective receiving area to be switched to an on state and controlling the receiving switch corresponding to the ineffective receiving area to be switched to an off state, so that the effective receiving area receives the emitted rays of the radioactive source to be measured and outputs a measurement result.

3. The reference radiometric measurement method of claim 2 wherein the outer contours of a plurality of said receiving areas are all circular and wherein a plurality of said receiving areas form a concentric nested structure;

in the step of determining an effective reception area and an ineffective reception area from among the plurality of reception areas according to the first size parameter, the measuring method includes:

determining a boundary region in a plurality of the receiving regions according to the first size parameter;

a receiving region within a boundary region of the concentric nest structure and the boundary region are both determined to be valid receiving regions.

4. A reference radiation measurement method according to claim 3, wherein said first dimension parameter is a radius parameter, and wherein in said step of determining a boundary region in a plurality of said receiving regions from said first dimension parameter, said measurement method comprises:

comparing the outer radius of the receiving area with the radius parameter;

and determining the receiving area corresponding to the radius parameter with the outer radius larger than or equal to the outer radius as a boundary area.

5. The reference radiometric measurement method of any one of claims 1 to 4, wherein the ionization chamber further comprises a high voltage polar film and a spacing adjustment assembly for adjusting a distance between the receiving polar plate and the high voltage polar film, measurement configuration information comprising a first distance parameter;

in the step of controlling the ionization chamber to measure the radiation source to be measured and acquiring a measurement result, the measurement method includes:

controlling the distance adjusting assembly according to the first distance parameter so that the distance between the receiving polar plate and the high-voltage polar film is adjusted by the distance adjusting assembly;

and controlling the release voltage of the high-voltage polar film, and obtaining a measurement result.

6. The reference radiometric measurement method of claim 5, wherein the measurement configuration information further includes positive and negative voltage parameters, the measurement results including positive and negative deflection currents;

in the step of controlling the high-voltage electrode film release voltage and obtaining a measurement result, the measurement method further includes:

according to the positive voltage parameter, controlling the high-voltage polar film to release positive voltage, and acquiring forward deflection current output by the receiving polar plate;

and controlling the high-voltage polar film to release negative voltage according to the negative voltage parameter, and acquiring negative deflection current output by the receiving polar plate.

7. The reference radiometric measurement method of claim 6 wherein the measurement configuration information comprises a plurality of parameter sets, and each of the parameter sets comprises the first distance parameter, the positive voltage parameter, and the negative voltage parameter;

in the step of controlling the ionization chamber to measure the radiation source to be measured and acquiring a measurement result, the measurement method includes:

controlling the distance adjusting assembly according to the first distance parameter so that the distance between the receiving polar plate and the high-voltage polar film is adjusted by the distance adjusting assembly;

according to the positive voltage parameter, controlling the high-voltage polar film to release the positive voltage, and acquiring the forward deflection current output by the receiving polar plate;

according to the negative voltage parameter, controlling the high-voltage polar film to release the negative voltage, and acquiring the negative deflection current output by the receiving polar plate;

judging whether a plurality of parameter sets are used or not, switching to the next parameter set which is not measured when the parameter sets are not used, and executing the step of controlling the interval adjusting component according to the first distance parameter so as to enable the interval adjusting component to adjust the distance between the receiving polar plate and the high-voltage polar film.

8. The reference radiometric measurement method of claim 5, wherein prior to the step of controlling the spacing adjustment assembly in accordance with the first distance parameter to cause the spacing adjustment assembly to adjust the distance between the receiver plate and the high voltage electrode film, the measurement method further comprises:

calibrating a reference spacing between the receiver plate and the high voltage electrode film.

9. The reference radiomeasurement method of any one of claims 1 to 4 wherein the radiation source mechanism includes a switching assembly having a plurality of the radiation sources to be measured received thereon, the measurement configuration information including radiation source parameters, the measurement method further comprising:

determining a target radioactive source from a plurality of radioactive sources to be detected according to the radioactive source parameters;

the switching assembly is controlled to cause the target radiation source to emit radiation toward the receiving plate.

10. The reference radiomeasurement method of any one of claims 1 to 4, wherein the reference radiomeasurement system further comprises a position adjustment mechanism for adjusting a distance between the ionization chamber and the radiation source mechanism, the measurement configuration information comprising a second distance parameter; after the step of acquiring measurement configuration information, the measurement method further includes:

and controlling the position adjusting mechanism according to the second distance parameter so that the position adjusting mechanism adjusts the distance between the ionization chamber and the radioactive source.